outline (hibp) diagnostics in the mst-rfp relationship of equilibrium potential measurements with...
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Outline• (HIBP) diagnostics in the MST-RFP• Relationship of equilibrium potential measurements
with plasma parameters• Simulation with a finite-sized beam model
Description of the model and an example Applications of the finite-sized beam model
• Simulation of detector currents during a sawtooth cycle• Instrumental error analysis• Numerical experiments
• Sources of uncertainty in potential measurements Non-ideal fields in the energy analyzer Secondary electron emission Entrance angle of detected ions in the analyzer Plasma and UV loading Plasma density gradients Beam attenuation
• Conclusion
MST HIBP
• Cross over sweeps to accommodate small ports• Magnetic suppression structures to reduce plasma loading• Magnetic field largely plasma produced (reconstructed from MSTFit)
ion beam Na+ or K+
Na+ enters plasma
magetic field separates Na++ from Na+
Na++ detected in the energy analyzer
Na++ in the split plate detector
Heavy Ion Beam Probing
• Quantities measured in MST Potential Potential fluctuations Density fluctuations
Secondary Ion Currents
• Sources of uncertainty in potential measurements variations in beam attenuation factors Fp, Fs
variations in sample volume length lsv
Gradient in local electron density ne
C1
C3
C2
C4
Beam image on the split plates of the energy analyzer
)(0 svesvionspp
ss rnlFFI
q
qkI
Measurement of Electrostatic Potential
• Potential measurement is sensitive to Entrance angles of ions into the analyzer Calibration of the analyzer (XD, YD, d, w) Accuracy of analyzer voltages and detected current
signals
id WWe
gLU
LUIIa V
ii
iiFGV
}),(),({2
22 cossin4
tan),(
I
DIDI d
YXG
22 cossin8
)tancos(sin),(
I
IaaI d
wF
Discharges in MST
5 10 15 20 25200
400
I p (k
A)
S tandard Discharge
5 10 15 20 250.5
1
1.5
ne
(10
13cm
-3)
5 10 15 20 25-1
-0.5
0
F
5 10 15 20 250
50
v 6(k
m/s)
5 10 15 20 250
10
20
Bp
(Gs)
t(ms)
5 10 15 20 25-20
02040
Vtg
(kV)
t(ms)
5 10 15 20 25200
400
I p (k
A)
PPCD
5 10 15 20 250.5
1
1.5
ne
(10
13cm
-3)
5 10 15 20 25-1
-0.5
0
F
5 10 15 20 250
50
v 6(k
m/s)
5 10 15 20 250
10
20
Bp
(Gs)
t(ms)
5 10 15 20 25-20
02040
Vtg
(kV)
t(ms)
5 10 15 20 25200
400
I p (k
A)
Locked
5 10 15 20 250.5
1
1.5
ne
(10
13cm
-3)
5 10 15 20 25-1
-0.5
0
F
5 10 15 20 250
50v 6
(km/
s)
5 10 15 20 250
10
20
Bp
(Gs)
t(ms)
5 10 15 20 25-20
02040
Vtg
(kV)
t(ms)
HIBP Measurement ConditionsType of discharge Standard Locked PPCD
Current Ip (kA) 350-380 (high Ip)
270-290 (low Ip)
260-290 490-510 (high Ip)
370-400 (low Ip)
Density ne (1013 cm3) 0.8-1.2 (high Ip)
0.6-1.0 (low Ip)
0.5-1.0 0.8-1.2 (high Ip)
0.6-1.1 (low Ip)
Temperature Te(eV) ~ 300 ~ 350 ~<800
Reversal factor F ~ -0.22 0 ~ -1.0
Velocity vm/n=1/6(km/s)
(mode)
20-40 0 20-40(non-locked)0 (locked)
Potential (kV) 1.2-2.1(high Ip)
0.9-1.2(low Ip)
~ 0.5 ~1.0 (non-locked)~0 (locked)
Detected Currents During Standard 380kA Discharge
5 10 15 20 25 30 35 400
20
40
c 1(n
A)
24-Jun-2001
5 10 15 20 25 30 35 400
20
40
c 2 (
nA)
Shot No. =31
5 10 15 20 25 30 35 400
20
40
c 3 (
nA)
5 10 15 20 25 30 35 400
20
40
c 4 (
nA)
5 10 15 20 25 30 35 400
50
sum
(nA
)
5 10 15 20 25 30 35 40
1
2
c(KV
)
5 10 15 20 25 30 35 40250
300
350
400
I p (
KA
)
5 10 15 20 25 30 35 405
10
15
n 0(x
101
2/c
m3)
5 10 15 20 25 30 35 40-0.4
-0.3
-0.2
-0.1
F
t(ms)5 10 15 20 25 30 35 40
0
20
40
Mod
e sp
eed
(km
/s)
t(ms)
c1
c3
c2
c4
sum
Ip
F
Potential
ne
Mode Speed
Sources of Sum Signal Variations
• Variation of sample volume size and location• Variation of beam deflection due to evolution of
magnetic fields• Beam scrape-off• Variation of plasma parameters
Plasma Profile for Standard Discharge
0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 10
0.5
1
1.5
2
2.5
r/a
Sc
ale
d p
ote
nti
al (
kV
)
Sawtooth Cycle Potential Variation
18 19 20 21 22 23 24360
380
400I p
(k
A)
18 19 20 21 22 23 24
0.8
1
ne(
10
13c
m-3
)
18 19 20 21 22 23 24
-0.25
-0.2
F
18 19 20 21 22 23 240
40
v 6(k
m/s
)
18 19 20 21 22 23 240.5
2
c(k
V)
18 19 20 21 22 23 240
10
20
Bp(G
s)
t(ms)
Sources of Uncertainty in Potential Measurements
• Variations in plasma characteristics – rotation, density, current, etc.
• Evolution and fluctuations of magnetic and electric fields – affects location, size and orientation of sample volume
• Instrumental Effects Beam scrape-off on apertures, sweep plates, etc. Analyzer geometry Detector noise due to plasma Beam attenuation
Variation of Potential with Plasma Parameters
• Strongest correlation is with mode speed• Only weakly dependent on other parameters
15 20 25 30 35
0.8
0.9
1
1.1
n e ( 1
013cm
-3)
15 20 25 30 35
-0.24
-0.23
-0.22
F
15 20 25 30 35
5
10
15
20B
p(G
s)
15 20 25 30 35
360
370
380
I p(k
A)
v6(km/s)
1
1.5 (kV)
2
15 20 25 30 35
0.2
0.4
0.6
0.8
t saw
too
th
v6(km/s)
Density
Bp
Sawtooth
Cycle Time
Mode Speed
Mode Speed
F
Ip
Description of the Model
• 8 secondary ion trajectories are generated to map the outer boundary of the probing ion beam
• A circular beam cross-section is assumed with either a uniform or Gaussian current profile
• Trajectories are followed until they intersect physical objects such as apertures, etc. to address scrape-off.
• Typical conditions 1.5cm diameter and Gaussian profile Constant electron density and temperature profiles 380kA standard discharge
Sample Volume
to centerline of the entrance aperture
to bottom edge of the entrance aperture
to top edge of the entrance aperture
d
sample volume
27 Trajectories are evaluated to represent the secondary ions originating in the sample volume.
Example – 380kA Standard Discharge
200
250
300
3500
2040
6080
0
20
40
60
80
Y (cm)
3D beam trajectories view
X (cm)
Z (
cm)
148150
152154 8
10
1214
15
16
17
18
19
20
21
MST Y axis (cm)
MST major radius X(cm)
3D sample volume view
MS
T Z
axi
s (c
m)
Secondary Trajectories Sample Volume
Example – 380kA Standard Discharge
-6 -4 -2 0 2 4 6
-5
-4
-3
-2
-1
0
1
2
3
4
5
Outer Exit Port
Y (cm) (toroidal)
Z (
cm)
(rad
ial) magnetic strcture
-15 -10 -5 0 5 10 15-0.5
0
0.5Secondary impact at entrance aperture
Yellow: Effective region
entrance slit length (cm)
entr
ance
slit
wid
th (
cm)
0
2
4
6
8
-8 -6 -4 -2 0 2 4 6 8-0.4
-0.2
0
0.2
0.4
entrance slit length (cm)
entr
ance
slit
wid
th (
cm)
current density profile
Secondary Beams at the Exit Port (Magnetic Aperture)
Secondary Beams at the Analyzer Entrance Aperture
Example – 380kA Standard Discharge
-15 -10 -5 0 5 10 15-1.5
-1
-0.5
0
0.5
1
1.5Secondary impact at detector & current density profile
Yellow: Effective region
detector length (cm)
dete
ctor
wid
th (
cm)
0
1
2
3
4
5
-8 -6 -4 -2 0 2 4 6 8-0.5
0
0.5
detector length (cm)
dete
ctor
wid
th (
cm)
0 10 20 30 40 50 60 70
-25
-20
-15
-10
-5
0
5
10
15
20
25
grids at the energy analyzer ground plates
toro
idal
Y(c
m)
radial X (cm)
ground plate of the analyzer
grids
Secondary Beams at the Analyzer Ground Plane
Secondary Beams at the Analyzer Detector Plates
About half of secondary beam has been scraped-off largely by the sweep plates during the last half phase of a sawtooth cycle
Simulation of Secondary Currents During a 380kA Standard Discharge Sawtooth Cycle
15 20 25 300
20
40
c 1(n
A)
24-Jun-2001
15 20 25 300
20
40
c 2 (
nA)
Shot No. =31
15 20 25 300
20
40c 3
(nA
)
15 20 25 300
20
40
c 4 (
nA)
15 20 25 300
50
sum
(nA
)
15 20 25 30
1
2
c(KV
)
15 20 25 30360
370
380
390
I p (
KA
)
15 20 25 305
10
15
n 0(x
101
2/c
m3)
15 20 25 30-0.4
-0.3
-0.2
-0.1
F
t(ms)15 20 25 30
0
20
40
Mod
e sp
eed
(km
/s)
t(ms)
Typical secondary ion currents on the four plates of the center detector (c1 - c4), sum
signal, and the measured plasma potential c, during a 380 kA standard discharge with
plasma current Ip, electron density n0, reversal factor F and dominant mode velocity.
The vertical lines bracket the sawtooth cycle. A 10 kHz low-pass filter has been applied to the potential and mode velocity to remove the tearing mode fluctuations.
Detected Signals during Sawtooth Cycle
• Agreement between measured and simulated signals• There is significant scrape off • Sample volume position varies by up to 3.5cm
18 20 22 240
10
20
30
c 1
HIBPsimu-insimu-out
18 20 22 240
10
20
30
c 2
18 20 22 240
10
20
30
c 3
t (ms)18 20 22 24
0
10
20
30c 4
t (ms)
18 19 20 21 22 23 24
16
17
18
19
20
21
22
t (ms)
rad
ial p
os
itio
n r
(cm
)
Sample volume position
HIBP: measurement
Simu_in: simulation
Simu_out: simulation after potential adjustment
Potential During Sawtooth Cycle
18 19 20 21 22 23 240
0.2
0.4
0.6
0.8
1
1.2
1.4
1.6
1.8
2
t (ms)
Pot
c (kV
)
HIBPsimu
output pot
calculated currents consistentwith measured HIBP signals?
secondary beam energy = primary beam energy+ potential measured
run finite-sized beam simulation
calculate secondary currents on four slit plates of detector
N
adjust potential
Y
Simu_in
Simu_out
Signal scrape-off does not make a significant contribution to potential measurements because the up-down balance of the beam image on the detector is not affected.
Error Sources: Analyzer Characteristics
-6 -4 -2 0 2 4 62.955
2.96
2.965
2.97
2.975
2.98
2.985
Entrance angle -30( )
Ga
in
center detector (calibrated)bottom detector (calibrated)fitted to equation (XD=654.03 mm, YD=124.96 mm)
-6 -4 -2 0 2 4 60.012
0.014
0.016
0.018
0.02
0.022
0.024
Entrance angle -30( )
F
center detector (calibrated)bottom detector (calibrated)fitted to equation (slit width = 2.4 mm)
Agreement between ideal and measured analyzer characteristics is excellent, but not perfect. Shown are characteristics for both bottom and center detectors. Non-ideal characteristics are typically non-uniform electric fields and slight variations in dimensions. G is more critical to potential measurements than F.
Error Sources: Analyzer Entrance Angle
• The variations of entrance angle are 0.45 ( )and 2.6 ()• The potential uncertainty due to variations of G and F are 0.095 kV.• Errors from simulation (due to scrape off and angles) 0.06 kV.
17 18 19 20 21 22 23 24 2529.8
30
30.2
30.4
30.6
in-p
lan
e a
ng
le
()
17 18 19 20 21 22 23 24 250
1
2
3
ou
t-o
f-p
lan
e a
ng
le
()
t (ms)
17 18 19 20 21 22 23 24 2571.1
71.15
71.2
71.25
71.3
71.35
t (ms)
2*V
a*G
ain
17 18 19 20 21 22 23 24 250.62
0.64
0.66
0.68
t (ms)
2*V
a*F
entrance angle of beam in radial direction and in toroidal direction
Potential variation due to the variation of beam angle
Error Sources: Density Gradient
The Electron density profile obtained from MSTFit over the sawtooth cycle during a typical 380 kA standard discharge.
The thick lines along the density profiles show the simulated HIBP sample volume length when projected onto the horizontal axis.
The potential uncertainty caused by the plasma density gradient in the sample volume is small ( < 0.01 kV ) in the interior of the plasma during a high current standard discharge, and becomes significant (0.05 - 0.11 kV) when the sample volume is moving to the outer area of the plasma.
Summary of Error SourcesSource Uncertainties Potential Uncertainty (V)
Calibration of F Measurement of entrance aperture width
< 54
Beam angle, position and beam scrape-off
Variation of beam entrance angles< 0.45, < 2.6 throughout a sawtooth cycle
< 60 (simulation with finite-sized beam model)< 95 (calculated from equation)
Plasma and UV loading
~ 0.9 nA (rms) of secondary currents noise loading, 1.7 V loading on Vg
0.1 V loading on Va
< 30.3
Plasma density gradient
Varies with sample volume positions 0.1 ~ 10 ( r / a ~ 0.35)50 ~ 110 ( r / a ~ 0.77)
Beam attenuation Varies with sample volume positions < -0.43 ( r / a ~ 0.35) < -24.6 ( r / a ~ 0.77)
Secondary electron emission
Asymmetric electron currents due to magnetic fields in the analyzer
Hard to quantify, but small – additional experiment required
Sum of sources that may cause potential variation
(1) – (3) < 144 (simulation)< 180 (w/o simulation)( r / a ~ 0.35)
Numerical Experimentsimulation of variation of secondary currents
due to magnetic fluctuations
0 5 10 15 20 25 30 35 40 45 50
-40
-30
-20
-10
0
10
20
30
40
t (s)
Ma
gn
eti
c f
luc
tua
tio
ns
(G
au
ss
)
Br
BB
Magnetic fluctuations are modeled as a small m / n = 1 / 6 mode in the plasma
)cos(~
rrr tnmBB
)cos(~
tnmBB
)cos(~
tnmBB
Simulation assumptions and parameters
Only m / n = 1 / 6 mode exists.
No potential and density gradients
Frequency is 20 kHz.
Perturbation amplitudes Br = 30 Gs, B = 20 Gs, B = 30 Gs.
Perturbation phases r = 0, = /2, = 3/2.
Movement of the sample volumes during a rotation cycle
150150.5
151151.5
152 99.5
1010.5
1116
16.5
17
17.5
18
18.5
19
MST toroidal Y(cm)MST major radius X(cm)
MS
T m
ino
r ra
diu
s Z
(cm
)
0 5 10 15 20 25 30 35 40 45 5016.8
17
17.2
17.4
17.6
17.8
18
18.2
t (s)S
am
ple
vo
lum
e r
ad
ial
po
sit
ion
r(c
m)
w/o B with B
Excursion of the center of sample volumes
Radial movements of the sample volume
The sample volume length remains relatively constant (~ 0.21 cm) during the cycle.
Secondary beam position and currents on the detector
0 5 10 15 20 25 30 35 40 45 50-7
-6.5
-6
-5.5
-5
-4.5
-4
t (s)
Be
am
po
sit
ion
(c
m)
Toroidal posistion of beam center on detector
w/o Bwith B
0 20 400
5
10
15
c1
0 20 400
5
10
15
c2
w/o Bwith B
0 20 400
5
10
15
c3
t (s)0 20 40
0
5
10
15
c4
t (s)
The toroidal position of the secondary beam center on the detector
Secondary currents on the center split plates
The width of the secondary beam fan on the detector is ~12 cm.
The toroidal oscillations of the beam on the detector due the magnetic perturbation are within 2 cm and are correlated with Br and B.
The simulation shows the about half of the secondary beam has been scraped-off by sweep plates.
The sum current, normalized top – bottom and normalized left – right signals on the center detector
0 5 10 15 20 25 30 35 40 45 50
10
20
30
su
m
w/o Bwith B
0 5 10 15 20 25 30 35 40 45 500
0.5
1
(to
p-b
ot)
/su
m
0 5 10 15 20 25 30 35 40 45 500
0.5
1
(le
ft-r
igh
t)/s
um
t (s)
The variation of secondary current is produced by both magnetic fluctuation and beam scrape-off
The insignificant variations of top – bottom signal (< 1% potential variation) are largely due to the variations of the beam angle onto the entrance aperture of the analyzer and to limitations in the simulation
The left minus right signal demonstrates the correlation with the magnetic perturbation
If we assume the potential profile is reasonably flat but becomes smaller at larger radii (as is almost always the case), the radial excursion of the sample volume would result in a potential fluctuation which is about 180 degrees out of phase with the density fluctuation.
Conclusion
• A new simulation tool is available to determine the quality of potential measurements
• Simulation shows that potential is determined with good accuracy – errors less than 10-15%
• Simulation can demonstrate the validity of the traditional (and much faster) data analysis method
• Simulation can be used to perform numerical experiments to predict signals for planned experiments