on-chip reliability monitor for measuring frequency degradation of digital circuits
DESCRIPTION
On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits. Department of Electrical and Computer Engineering. By Han Lin Jiun-Yi Lin. Overview. Introduction Principle and background Proposed reliability monitor circuit Circuit Blocks and Simulation Result : - PowerPoint PPT PresentationTRANSCRIPT
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On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits
Department of Electrical and Computer Engineering
ByHan Lin
Jiun-Yi Lin
05/14/2014
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Overview Introduction Principle and background Proposed reliability monitor circuit Circuit Blocks and Simulation Result:
Ring Oscillator Phase Comparator Majority Voting Circuit Beat Frequency Detector 8 Bit Counter Circuit Total Circuit
Conclusion05/14/2014 1
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Abstract
Precise measurement of digital circuit degradation caused by agingReliability monitor using beat frequency of two ring oscillators to get a high sensing resolution1V, 32nm CMOS technology, up to 0.02% sensing resolution
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Overview Introduction Principle and background Proposed reliability monitor circuit Circuit Blocks and Simulation Result:
Ring Oscillator Phase Comparator Majority Voting Circuit Beat Frequency Detector 8 Bit Counter Circuit Total Circuit
Conclusion05/14/2014 1
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Types of reliability issues
BTI (bias temperature instability)HCI (hot carrier injection)TDDB (time-dependent dielectric breakdown)NBTI (negative bias temperature instability)NBTI effect is among the most pressing issues among all of them
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Cause of NBTI effect
Structural mismatch at the Si-SiO2 interface cause dangling bondsSi-H bonds is transformed by hydrogen passivation process of dangling Si bonds which is made by oxidation of Si-SiO2
Broken bonds from Si-H degrade the driving current of pMOS threshold voltagePositive shift in absolute value of pMOS threshold voltage |Vtp| in stress phaseBroken Si-H bonds is annealed in recovery phase, and Vtp is reduced
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Cross section of pMOS device and pMOS Vth degradation
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Constraints of typical measurement
Device probing, on-chip ring oscillator frequency monitoringLimitations in sensing resolution, cannot get large number of data points
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Simulation platformMicrosoft WindowsHSPICE 2009CosmosScope
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Overview Introduction Principle and background Proposed reliability monitor circuit Circuit Blocks and Simulation Result:
Ring Oscillator Phase Comparator Majority Voting Circuit Beat Frequency Detector 8 Bit Counter Circuit Total Circuit
Conclusion05/14/2014 1
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Beat frequency detection circuit
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Measuring difference in frequency between Stressed and Reference ROSCWhen there is exactly one in the pulse difference between two ROSC, we can get the value of N before stress, and we use this method to get N’ which is detected after stress period.
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Beat frequency detection scheme
Using difference between stressed and reference ROSCBefore stress: N/fref=(N-1)/fstress After stress: N’/fref=(N’-1)/f’stress
Percent of frequency degradation:(f’stress-fstress)/fstress=(N’-N)/(N’(N-1))
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Change in counter output by frequency degradation
(f’stress-fstress)/fstress
=(N’-N)/(N’(N-1))When there is 1% degradation, N will decrease half compared with 1% for convention method
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Architecture of silicon odometer
Two ring oscillators, identical structure, different VddPhase comparator will show frequency difference between two ROSC.5-bit majority voting circuit can erase the bubbles caused by jitter effect from phase comparatorBeat frequency detector can produce a DETECT signal to reset the counter, and get the output from the register
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Block diagram
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Overview Introduction Principle and background Proposed reliability monitor circuit Circuit Blocks and Simulation Result:
Ring Oscillator Phase Comparator Majority Voting Circuit Beat Frequency Detector 8 Bit Counter Circuit Total Circuit
Conclusion05/14/2014 1
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Ring Oscillator
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Simulation Result of Ring Oscillator Circuit
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The ring oscillator has a period of 4 ns
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Phase Comparator
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CLK=0 Pre charge
CLK=1 Evaluate(Compare the phase of A
and B)
CLK=1A’&&B=1PC_OUT=1
CLK=1A’&&B=0PC_OUT=0
CLK=0PC_OUT keepthe same value
X: Pre charge Switch open Switch closeSwitch close
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Simulation Result of Phase Comparator Circuit
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CLK=1A’&&B=1PC_OUT=1
CLK=0PC_OUT keepthe same value
CLK=1A’&&B=0PC_OUT=0
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Majority Voting Circuit
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Majority Voting circuit (Continue)
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Simulation Result of Majority Voting Circuit
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PC_OUT10111010
VOTE_OUT11111100
10111011
111111 00
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Beat Frequency Detector
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Simulation Result of Beat Frequency Detector Circuit
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Beat Frequency
Latency
10111 011
111111 00
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8 Bit Counter Circuit
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Simulation Result of 8 Bit Counter
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Simulation Result of Total Circuit
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15
CONCLUSION
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1605/14/2014
THANK YOU!