niu trigger workshop ctt commissioning trigger workshop october 22, 1999 wbs 1.1.5.3 & 1.4.3.3...
TRANSCRIPT
DD
NIU Trigger Workshop
CTT CommissioningTrigger WorkshopOctober 22, 1999
WBS 1.1.5.3 & 1.4.3.3Presented by
Fred Borcherdingfor the
D0 Electronics Group
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 2
Charge for the Workshop
For each of the NIU sessions, we would like to have some preparedtalks to cover the following:
1. Schedule of completion of the hardware
2. Test program at the board level (who, where, when?)
3. Test/commissioning of the sub-detector trigger or frameworkprior to commissioning in the D0 environment in the D0 Hall.(who, where, when?)what other resources are needed (serial links, downloads, COOR,clocks, etc.)
4. Commissioning in D0.
What is the sequence, time estimate for the commissioning?How will cosmic ray studies be used?What interactions with other systems are required?Give an estimated schedule for commissioning.
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 3
CTT Project
Four separate installations
CFT Axial CFT Stereo CPS Axial CPS Stereo (FPS)
Several Steps Production Board Test System Test Installation ‘In Place’
Commissioning Run
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 4
System Size
CTT has three sets of boards.
CTT has a total of about 10 ‘boards’
CTT has very small signal Analog boards
target of 5 fC threshold
CTT has very high IO digital boards
each DFE has ~15Gbits/sec input
each MB has ~20Gbits/sec input & output
AFE Board
8-MCM board
12-MCM board
MCM daughter card
Analog Input board
DFE Board
Mother board
Transition board
Daughter Boards
Testing DB
Tracking ( & cluster finding)
collector (octant)
DB2
MB Mixing Box Board
Input board
Output board
MB Test Board
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 5
Schedule of completion of the hardware
CFT8* Boards Manufactured
2/1/00 AFE [8-MCM] (8)
12/1/99 Seq/SeqC/VRB/VRBC
1/3/00 DFE+TDB (4)
3/6/00 CDB (1)
3/22/00 DB2 (1)
3/6/00 MB (1set)
All Boards Manufactured
7/28/00 AFE [8-MCM]
12/1/99 Seq/SeqC/VRB/VRBC
5/1/00 DFE+TDB
7/3/00 CDB
7/14/00 DB2
7/10/00 MB
FPS8* Boards Manufactured
4/20/00 AFE [12-MCM] (4)
12/1/00 Seq/SeqC/VRB/VRBC
2/7/00 DFE+TDB (1)
4/3/00 CDB (1)
4/24/00 DB2 (1)
All Boards Manufactured
7/28/00 AFE [12-MCM]
12/1/00 Seq/SeqC/VRB/VRBC
6/5/00 DFE+TDB
7/28/00 CDB
7/28/00 DB2
CPS8* Boards Manufactured
4/20/00 AFE [12-MCM] (4)
12/1/00 Seq/SeqC/VRB/VRBC
2/7/00 DFE+TDB (1)
4/3/00 CDB (1)
4/24/00 DB2 (1)
All Boards Manufactured
7/28/00 AFE [12-MCM]
12/1/00 Seq/SeqC/VRB/VRBC
6/5/00 DFE+TDB
7/28/00 CDB
7/28/00 DB2
NOTE: All dates subject to change
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 6
Test program at the board level- WHO.
AFE Board
8-MCM board John A, Pat S, Paul R, Mike M, Stefan G;
12-MCM board John A, Pat S, Paul R, Mike M, Stefan G;
MCM daughter card John A, Pat S, Paul R, Mike M;
Analog Input board John A, Pat S,
DFE Board
Mother board J Olsen, Pat S,
Transition board J Olsen, Pat S,
Daughter Boards
Special Testing board J Olsen, Kin Y
Tracking ( & cluster finding) J Olsen, Kin Y, Stefan G,
collector (octant) J Olsen, Manuel M, Juan L, Brian
DB2 J Olsen, Manuel M, Juan L, Brian
MB Mixing Box Board
Input board J Olsen, M Vaz, Other?
Output board J Olsen, M Vaz, Other?
Test board J Olsen, M Vaz
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 7
Test program at the board level- WHERE and WHEN.
AFE Board
8-MCM board DAB3 Analog Test Stand Mar-Jun
12-MCM board DAB3 Analog Test Stand May-Aug
MCM daughter card DAB3 Analog Test Stand May-Aug
DFE Board
Mother board DAB3 Digital Test Stand Dec-Mar
Transition board DAB3 Digital Test StandDec-Mar
Daughter Boards
Tracking ( & cluster finding) DAB3 Digital Test Stand Jan-Apr
collector (octant) DAB3 Digital Test Stand Mar-Jun
DB2 & others DAB3 Digital Test Stand Apr-Jul
MB Mixing Box Board
Input board DAB3 Digital Test Stand Jul-Aug
Output board DAB3 Digital Test Stand Jul-Aug
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 8
Board Testing
AFE > 8 MCM bench test - AnTS (on cassette in lab 3)
AFE > 12 MCM bench test - AnTs (on cassette in lab 3)
DFE bench test - DTS
Mixing Box bench test - DTS
The AFE testing @ lab3 requires
working cassettes light pulser system w
VTBG Seq/SeqC/VRB/VRBC trigger generation
logic 1553 links PC / bit3
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 9
Board Testing cont.
The DFE testing requires input pattern generator
test patterns tracks
output pattern analyzer download link 1553 link PC / Bit3
The MB testing requires input pattern generator
test patterns tracks
DFE for output analysis PC / Bit3
The AFE testing requires input pattern generator DFE for output analysis download link SASEQ VTBG system 1553 links Bit3 / PC
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 10
AFE Board Testing
Some AFE production boards will be tested @ lab3 stand
Test with ‘real’ inputs Test with more
realistic grounding and noise environment
Test cryo and bias supply functions
Note: [MCM are tested prior to mounting on AFE]
Bench test requires development of analog input method
Low amplitude charge injection
VTBG System Input conversion
HD connection that can survive 200 boards
FLEX type cable mated to VTBG
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 11
DFE Board Testing
Special Test Daughter board produced
High speed “Data Pump” db generates patterns and fake event data, and checks the output of the DFE
Each of the different Daughter board types will require different test firmware/PC software
Mother board, Transition board, and daughter board sets are tested.
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 12
MB Board Testing
The ‘Mixing Box Test Board’ serves as input pattern generator and output analyzer
high rate input source provides high speed
and high bandwidth lvds loopback testing
Share PC and test stand with DFE
Bench test requires
Test pattern input board
Test pattern receiver board
Test generation software
Test analysis software
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 13
Test/commissioning of the sub-detector
3. Test/commissioning of the sub-detector trigger ..prior to commissioning in the D0 environment in the D0 Hall.(who, where, when?)what other resources are needed (serial links, downloads, COOR,clocks, etc.)
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 14
Sub-Detector
The CTT systems test/commission in THREE stages1 - Analog + L3 Readout 2 - Digital (trigger)
2.1 - DFE alone2.2 - DFE + L1MUON [CFT]2.3 - DFE + Collector2.4 - DFE + … + L2pp & L1MTM2.5 - MB + DFE
3 - Complete System[+ MB for CFT]
Stage 1 and Stage 2 can be concurrent!
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 15
Stage 1
Test AFE and L3 Readout chain Test lvds links - test fixture is DFE+DB with special firmware
CTT SystemAFE
AFE
Sequencer L3 ReadoutVRB
Stage 1Electronic Pulser
Test
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 16
Stage 1 - AFE
Hardware Test Stand Dummy Cassette VTBG, Input Brd (pulser) AFE Boards Sequencer, Crate, Cont. VRB, Crate, Cont. DFE + daughter
Software PC Software for control [a
la MCM test software] AFE board firmware special DFE board based
test firmware
Procedure Download to SVX on AFE Read SVX cal-inj patterns Read ‘pulser’ inputs
Milestones successful download see all input channels in
SVX data see all input channels on
DFE board with special test firmware
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 17
Stage 2
Work in the trigger end of the system Test Generator / Receiver is MB test board Actual MB inserted before DFE for stage 2.5
LALA
L1MUON
L1MUON
DFE L1 & L2BroadcasterSystem
Stage 2
Test Generator / Receiver
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 18
Stage 2 - DFE
Hardware DFE Boards L1 MUON cables L1 MUON ‘test’ receiver Test Generator /
Receiver
Software Test Generator
firmware Need Track Loader
software (person) here Download DFE 1553 I/O to DFE PC control and analysis
Procedure Download to DFE
crate and boards Run Test Generator Monitor DFE output Monitor Collector etc. Monitor L1 Muon
Milestones successful download Data seen from DFE Data seen at L1Muon Data seen from
collector etc.
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 19
Stage 3 - Final Stage
CFT/CPS Axial version with mixing box FPS/CPS Stereo without
LALA
L1MUON
L1MUON
DFE
40
96
L1 & L2BroadcasterSystem
AFE
75
Ca
sse
tte
AFE
10*
Ca
sse
tte
Mixing Box
20
Sequencer L3 ReadoutVRB
Stage 3Final Stage
CR or VTBG
LALA
DFE
40
L1 & L2BroadcasterSystem
AFE
75
Ca
sse
tte
AFE
10*
Ca
sse
tte
Sequencer L3 ReadoutVRB
Stage 3Final Stage
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 20
Stage 3 - Final Stage
Hardware Combine AnTS to DTS
Software Same functionality as
at Test Stand PCs But now link the two
Procedure Same as Stage 2
Milestones See all Stage 1 and 2
milestones on the combined system
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 21
Commissioning in D0.
4. Commissioning in D0.
What is the sequence, time estimate for the commissioning?How will cosmic ray studies be used?What interactions with other systems are required?Give an estimated schedule for commissioning.
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 22
Cosmic Ray Trigger
Trigger on CR that penetrates to center of CFT
require MUON on inward track require track through beam
pipe with CFT
Can trigger down to ~0.5GeV in tracker(?)
Trigger elements uScintOctant CFT A-layer-back-
to-back other CFT layers to
fine-tune rate Timing
run at 396-132 live for CFT
window - 80of396ns or 20%
Tests L3 track finding L2 trigger L1 trigger
Similar Trigger forward with FPS & Forward Muon?
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 23
‘In Place’ Commissioning
Four Separate Systems can proceed independently
Each of the systems is commissioned in 3 Stages -
same as sub-system commissioning outlined earlier Each stage adds more hardware Each stage requires more software
A 4th stage - CR running - added with no special hardware
NOW Host software is ON-LINE Can start with ‘one crate’ Can finish within one month after last crate
or about 3-4 months total time (whichever is longer)
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 24
Overall Software Needs
KISS Applies keep it simple
Have different types of users
technicians engineers physicists
Have different environments
Stand alone bench tests
sub-dectector as part of full detector possible CR running
Have different goals test/fix/maintain
individual boards develop system
expertise test/fix/maintain full
system
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 25
Software cont.
Bench Tests traditionally used PC,
bit3 and windows /excel based software
need users (technicians & engineers) to be able to understand and modify software
Full system tests want to run within
full D0 system run Examine’s and
Calib’s with ON-LINE
Partial systems gray area between
bench and full system
in use / development at lab 3
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 26
Infrastructure Required
Bench Tests PC Trigger / clock generator Input generator Output capture Group will provide
software / firmware test fixtures procedures
Need - Physicists for system design / data analysis PC based software help
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 27
Infrastructure Required
* Need new bodies for these outside of present group
Full system tests trigger generation SCL (clock and control) DAQ Online Group will provide
special trigger generator hardware
test fixtures D0 provides
online system and software examine and calib shells
Need* MC Track generation
software MC Cluster generation
software (for CR) found-tracks to
survey to new trigger-equations
Examine & calib software
help with special firmware
DD
NIU Trigger WorkshopFred B. - Oct 22, 1999 28
Summary
Hardware will arrive relatively late Much work between production of
hardware and running A lot of support and fixture hardware
needs to be designed and built - Schedules will suffer without needed EE
support.
A lot of support software needs to be written, and shaken out - Schedules will suffer without needed PH
support.