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    An accurate low current measurement circuit for heavy iron beam current monitor

    Chao-Yang Zhou a,b, Hong Su a,, Rui-Shi Mao a, Cheng-Fu Dong a, Yi Qian a, Jie Kong a

    a Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, Chinab Graduate University of the Chinese Academy of Sciences, Beijing 100049, China

    a r t i c l e i n f o

    Article history:

    Received 8 December 2011

    Received in revised form 19 January 2012

    Available online 16 March 2012

    Keywords:

    Faraday cup

    Low beam current monitor

    Picoammeter

    Gated integrator

    a b s t r a c t

    Heavy-ion beams at 106 particles per second have been applied to the treatment of deep-seated inoper-

    able tumors in the therapy terminal of the Heavy Ion Research Facility in Lanzhou (HIRFL) which islocated at the Institute of Modern Physics, Chinese Academy of Sciences (IMP, CAS). An accurate low cur-

    rent measurement circuit following a Faraday cup was developed to monitor the beam current at pA

    range. The circuit consisted of a picoammeter with a bandwidth of 1 kHz and a gated integrator (GI). A

    low input bias current precision amplifier and new guarding and shielding techniques were used in

    the picoammeter circuit which allowed as to measure current less than 1 pA with a current gain of

    0.22 V/pA and noise less than 10 fA. This paper will also describe a novel compensation approach which

    reduced the charge injection from switches in the GI to 1018 C, and a T-switch configuration which was

    used to eliminate leakage current in the reset switch.

    2012 Elsevier B.V. All rights reserved.

    1. Introduction

    Beams of heavy-charged particles like carbon ions have been

    applied to the treatment of deep-seated tumors[1]in the therapy

    terminal of the HIRFL at IMP, CAS [2]. A beam current monitor sys-

    tem was used in clinical experiments to ensure the treatment plan

    and patient safety. Detectors in the monitor system, which register

    a secondary signal induced by the beam, like scintillator or gas

    chambers, are sensitive to the released energy rather than the

    charge. A beam current monitor (BCM) was needed to calibrate

    these detectors.

    Beam current is normally measured by making use of an iso-

    lated Faraday cup (FC) as a beam dump [3,4]. Beams applied to

    the treatment are at 106 particles per second which equates to cur-

    rents less than 1 pA. Measurements of this low beam current usu-

    ally suffer from poor accuracy. Additionally, the beam current is

    modulated because of the operating modes of the accelerator. Thus

    there needs to be a balance between accuracy and bandwidth of

    the measurement electronics in order to accurately measure the

    beam current. Systems previously developed for measurement of

    currents in this order of magnitude are limited in their bandwidth

    to some ones of Hertz[5].

    This paper contains a description of an accurate low current

    measurement circuit for the BCM system. The circuit was imple-

    mented with two sections. The first was a picoammeter with a

    bandwidth of 1 kHz, and the other was a GI [6] with a variable inte-

    gration time. This paper will describe the structure of the picoam-meter based on noise analysis and introduction of guarding and

    shielding techniques used in sub-picoamp current measurement

    [7]. It also contains a description of the charge injection compensa-

    tion and leakage current elimination techniques which were used

    in the design of the GI.

    2. Low current measurement circuit in the beam monitor system

    Fig. 1shows the block of the heavy ion beam current monitor

    system. The accurate low current measurement circuit consists of

    a picoammeter and a GI. The current signal from the FC, which

    was pulsed for 3 s a period of 20 s, was converted into a voltage

    signal through a transimpedance amplifier, the output of which

    was integrated by the GI in order to measure the charge of the

    beam. Outputs of the two sections were acquired by a data acqui-

    sition system based on PXI. The signals were processed by the local

    computer, and the current from the FC and the beam charge were

    remotely monitored.

    Compared to conventional current integrators [8], which inte-

    grated the current from the FC by a GI directly, the two separated

    parts of this novel circuit avoided many disturbances like leakage

    current of the feedback capacitor and charge injection of switches.

    In practice, due to the high sensitivity of the picoammeter, the two

    parts of the circuit were implemented on two different printed cir-

    cuit boards and assembled in one metal box which was installed

    locally to the FC system.

    0168-583X/$ - see front matter 2012 Elsevier B.V. All rights reserved.http://dx.doi.org/10.1016/j.nimb.2012.01.033

    Corresponding author. Tel.: +86 9314969365.

    E-mail address:[email protected](H. Su).

    Nuclear Instruments and Methods in Physics Research B 280 (2012) 8487

    Contents lists available at SciVerse ScienceDirect

    Nuclear Instruments and Methods in Physics Research B

    j o u r n a l h o m e p a g e : w w w . e l s e v i e r . c o m / l o c a t e / n i m b

    http://dx.doi.org/10.1016/j.nimb.2012.01.033mailto:[email protected]://dx.doi.org/10.1016/j.nimb.2012.01.033http://www.sciencedirect.com/science/journal/0168583Xhttp://www.elsevier.com/locate/nimbhttp://www.elsevier.com/locate/nimbhttp://www.sciencedirect.com/science/journal/0168583Xhttp://dx.doi.org/10.1016/j.nimb.2012.01.033mailto:[email protected]://dx.doi.org/10.1016/j.nimb.2012.01.033
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    3. The design of the picoammeter with ultra low noise

    3.1. Noise analysis of the picoammeter

    Since the ammeter with an active I/V converter does not have

    the shortcomings of the ammeter with a passive I/V converter

    (i.e. too large input resistance and a shunt voltage), a feedback

    structure was selected for this picoammeter.

    The most sensitive range of the picoammeter depends on the

    minimal value of the current, which can be transformed into thestandard voltage with acceptable accuracy. To determine this min-

    imal value, noise produced by the electrometric amplifier, scaling

    resistor, circuit of the measured current, structural elements of

    the picoammeter and cables were analyzed in this paper. A sche-

    matic of the picoammeter circuit with indicated sources of the

    most important noise sources is shown inFig. 2.

    If we take into consideration disturbances shown inFig. 2, the

    output voltage of the picoammeter can be described by Eq.(1)

    Uo IsRf It Ina IbRf 1 Rf=RsUoa Una UnR 1

    where: Ibis the input bias current of the amplifier; Ina is the instan-

    taneous value of the input noise current of the amplifier; It is the

    current coming from constructing and circuit elements (i.e. leakage

    of insulators, cables; printed circuit board) in transmission; UnR isthe instantaneous value of thermal noise voltage of the scaling

    resistor; Una is the instantaneous value of input noise voltage of

    the amplifier; alsoUoa is the input offset voltage of the amplifier.

    3.2. Structure of the picoammeter

    As can be seen inEq.(1), a low bias current, a low noise current,

    a low noise voltage and a low offset voltage are needed in order to

    minimize the noise figure of the picoammeter. In order to address

    those issues, we developed a novel picoammeter whose block dia-

    gram is shown inFig. 3.

    Fig. 3 shows an I/Vconverter with two cascaded stages that pro-

    vides a total open-loop gainA 400. A new precision amplifier

    with guaranteed bias current smaller than 20 fA and typical value

    3 fA was used as the input stage, A1, to meet the tight design spec-

    ification related to the input bias current. For the second stage, A2,

    a wide bandwidth (145 MHz) amplifier was used.

    Due to the stable open-loop gain of this two-stage circuit, an

    offset voltage compensation circuit which introduced an offset to

    the inverting input of A1 worked well. Such a circuit would have

    been difficult to implement in single stage DC coupled amplifier.

    With this circuit, the output offset voltage could be adjusted to less

    than 2 mV. The guard generator amplifier, A3, was used to drive

    the input guard ring.

    The two-stage I/Vconverter was followed by A4 which includedstages of gain, filter and buffer. The precision OPA, A1, had a very

    low voltage noise, but a current noise up to 10 fA=ffiffiffiffiffiffi

    Hzp

    . The filter

    limited the bandwidth of the circuit to 1 kHz to reduce the current

    noise. The last stage was a buffer amplifier. It generated an output

    signal that was split into two paths. One was fed into DAQ system

    for current curve display, and the other was fed into GI for

    integration.

    For measurement of currents less than 1 pA, the transimped-

    ance, G, which was equal to the feedback resistor, Rf, at low fre-

    quency, must be in the range of 1012 X. Resistors with high

    resistance value and at the same time with small temperature

    resistance coefficient and voltage resistance coefficient are difficult

    to obtain and very expensive. For this reason the single feedback

    resistor,Rf, was replaced by a T-resistor configuration which could

    achieve a current gain as high as 0.22 V/pA with 100 MX resistors.

    3.3. Guarding and shielding techniques

    Noise coupled by external sources could be reduced with guard-

    ing and shielding techniques. Guarding is an important technique

    in sub-picoamp current designs. A guard is a low impedance point

    in the circuit that is at nearly the samepotential as the high imped-

    ance lead being guarded. On the PCB layout in Fig. 4, the guard cre-

    ates an equal potential zone around the input pins, preventing

    external leakage currents from coupling into the input circuit.

    Fig. 4shows the general configuration of the input traces. All

    the sensitive feedback components were located within the perim-

    eter of the guard ring. Pin 2 and 7, which were non-connected pinsof the amplifier, A1, were connected to the guard traces to insulate

    Fig. 1. Block diagram of the heavy ion beam monitor system.

    Fig. 2. Schematic diagram of the picoammeter including the dominant sources ofnoise.

    Fig. 3. Block diagram of a picoammeter with a two-stageI/Vconverter.

    C.-Y. Zhou et al. / Nuclear Instruments and Methods in Physics Research B 280 (2012) 8487 85

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    the input terminals from the other pins. The solder mask was also

    removed from this area to reduce surface charge accumulation. The

    guard generator was a buffer amplifier which drove the input

    guard traces to the same potential as the inverting input node.

    In order to shield the circuit from electromagnetic interference,

    the entire circuit was enclosed within a metal shield box and the

    input signal was connected to the FC using a triax cable. The inside

    shield of the triax cable was connected to the guard terminal of the

    picoammeter circuit so that the signal conduct and the inside

    shield were at the same potential. This approach eliminates theconsiderable charge injected by traditional coaxial-cables.

    4. The design of the new GI

    To get the total charge of the beam, the output of the picoam-

    meter was fed into the GI, the schematic of which is shown in

    Fig. 5.

    The input signal voltage Vi is converted into current via the

    resistorRSand integrated by the feedback capacitor Cf. The output

    voltageVo is given by

    Vo 1

    CfRs

    Z T0

    Vitdt V0 2

    Since the input voltage Vi, is proportional to the current fromthe FC, the GI output Vo, represents the total charge of the beam

    for a given duration T. In practice, because the 3 s beam on time

    was too long for such a circuit, the beam current was integrated

    with intervals varied from 100 ls to 1 ms.

    The charge injection compensation and leakage current elimi-

    nation techniques were implemented in the GI section.

    4.1. Charge injection compensation

    DMOS switches SD5400 were chosen as switches in the GI.

    When a transient voltage excursion appears at the gate, there will

    be an injection of electric charge into analog path via the gate-to-

    drain and the gate-to-source capacitances. This will cause errors to

    the output. The network indicated by the dotted line inFig. 5wasused to compensate this charge injection.

    When the state of switches used in the GI is changed, certain

    quantity of charge will be injected into the inverting input via

    the capacitor, CC, by the compensation network. This is opposite

    to the charge injected by switches. Since it is known that the

    amount of charge injected is equal to the product of the voltage

    excursion amplitude on the component and its capacitance, gener-

    ating a product equal but opposite to each other can make a perfect

    compensation between the capacitorCC

    and switches in the GI.CCwas chosen to be 10 pF. Thus by changing the amplitude of the

    voltage excursion on CC, the error of the output voltage caused

    by charge injection was reduced to less than 2 mV.

    4.2. T-switch configuration for leakage current elimination

    While the GI is in integration or hold state, the reset switch

    has to be kept off. However the effect of leakage current in the GI

    reset switch will cause errors to the output in the long duration of

    these states. To eliminate this effect, the single reset switch was re-

    placed by a T-switch configuration shown in Fig. 6.

    The leakage current of DMOS switch is composed of the source/

    body reverse leakage current and the drain/source subthreshold

    current. Since the source/body reverse leakage current can be neg-ligible in SD5400, the drain to source subthreshold current be-

    comes the main factor of the off current. If the source and

    body are at the same potential, the drain/source of a MOS transis-

    tor in the deep subthreshold region of operation is given by

    IDS IDOW

    L eVGS=nVT1 eVDS=VT 3

    In Eq.(3),IDSis the drain to source current of the transistor, IDOis the saturation current, VGSis the gate to source voltage, VDSis the

    drain to source voltage, W/L is the ratio of width and length of the

    transistor, andVTis the threshold voltage of the transistor. As Eq.

    (3)shows, even forVGS= 0, the only way to establish a zero switch

    leakage current is to set VDS to 0 V. To maintain the VDS of the

    DMOS switch at virtual ground, a T-switch configuration shown

    inFig. 6was used to replace the single reset switch. The T-switch

    configuration was composed by two DMOS switches, S1, S2, in ser-

    ies and a grounded DMOS switch, S3, attached to the node between

    the two switches. When the two DMOS switches in parallel with

    the integration capacitor are off, the third switch, S3, is on. In this

    configuration, VDSof the switch connected to the inverting input of

    the GI is maintained at 0 V, and very little leakage current flows

    through this switch.

    5. Measurements

    A complete set of measurements was performed in the lab in or-

    der to characterize AC and DC performances of the circuit. Addi-

    tionally, the long-term stability was evaluated. The 100fA-resolution AC and DC Current Source, Keithley Model 6221,

    Fig. 4. PCB layout of the input guard traces.

    Fig. 5. The schematic of the GI with a network for charge injection compensation.

    Fig. 6. A T-switch configuration as the reset switch.

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    was selected to supply input current signal to the picoammeter

    with a model 7078 triax cable. The outputs of the two sections of

    the circuit were both fed into a 14-bit NI PXI-6133 ADC card which

    was controlled by the DAQ software developed using LabWindows/

    CVI.

    Specifications of the picoammeter and the GI are shown in

    Tables 1 and 2. Parameters such as conversion gain, linearity error

    and noise were measured when the current source was in DC mode

    and filtered. The sample interval of the ADC was 100 ls. All DC test

    results presented here, including linearity of the two sections

    shown inFigs. 7 and 8, were based on the average of more than

    100 K points which were more than 10 s. In the measurement of

    the GI, the charge integrated each sample was equal to the productof the source current and the integration time, which was a bit less

    than the sample interval. The 3 db bandwidth of the picoamme-ter was obtained when the current source operated in AC mode.

    6. Summary

    The results of a laboratory test of a low current measurement

    circuit which demonstrate that it had a high accuracy and long-

    term stability were presented. Because of the circuit design tech-

    niques used when implementing the guard and shield circuit de-

    signs, the performance of the two sections should work very well

    when it is used as part of a BCM system.

    Acknowledgements

    This work was supported by National Program on Key Basic Re-

    search Project of China (973 Program) (No. 2010CB834204), the

    National Natural Science Foundation of China (No. 10735060)

    and Important Direction Project of the CAS Knowledge Innovation

    Program (No. KJCX2-YW-N27).

    References

    [1] G. Kraft, Nucl. Instrum. Meth. Phys. Res. A 454 (2000) 110.

    [2] Qiang Li, Lembit Sihver, Nucl. Instrum. Meth. Phys. Res. B 269 (2011) 664670.

    [3] L.M. Redondo et al., Nucl. Instrum. Meth. Phys. Res. B 265 (2007) 576580.

    [4] M. Hori, K. Hanke, Nucl. Instrum. Meth. Phys. Res. A 588 (2008) 359374.

    [5] V. Auzelyte et al., Nucl. Instrum. Meth. Phys. Res. B 249 (2006) 760763.

    [6] Jie Kong et al., Nucl. Instrum. Meth. Phys. Res. A 622 (2010) 215218.

    [7] Keithley Instruments Inc., Leakage currents and guarding, in: Low LevelMeasurements Handbook, Ohio, 2004, pp.14-19. Available from:

    .

    [8] A. Cadorna, et al., Proceedings of the 2003 Particle Accelerator Conference, p.

    23482350.

    Table 1

    Specifications of the picoammeter.

    Parameter Value

    Full scale output 2.5 V

    Current conversion gain 0.22 V/pA

    Linearity error