man-22060-us003 c00 ssmtt-27m1 jitter mmd
TRANSCRIPT
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SSMTT-27M1 1
MAN-22060-US003 Rev C00
302 Enzo Drive San Jose, CA 95138
Tel: 1-408-363-8000 Fax: 1-408-363-8313
Jitter/Wander Option
for the E1 ModulePart of the MTT and xDSL
Family of Products
Users Manual
SSMTT-27M1
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2 Jitter/Wander for the E1 Module
WarningUsing the supplied equipment in a manner not specified by Sunrise
Telecom may impair the protection provided by the equipment.
CAUTIONS! Do not remove or insert the module while the test set is on. Inserting or re-
moving a module with the power on may damage the module. Do not remove or insert the software cartridge while the test set is on. Oth-
erwise, damage could occur to the cartridge.
End of Life Recycling and Disposal InformationDO NOT dispose of Waste Electrical and Electronic Equipment(WEEE) as unsorted municipal waste. For proper disposal returnthe product to Sunrise Telecom. Please contact our local offices
or service centers for information on how to arrange the returnand recycling of any of our products.
EC Directive on Waste Electrical and Electronic Equip-
ment (WEEE)The Waste Electrical and Electronic Equipment Directive aims tominimize the impact of the disposal of electrical and electronic
equipment on the environment. It encourages and sets criteriafor the collection, treatment, recycling, recovery, and disposal of
waste electrical and electronic equipment.
2010 Sunrise Telecom Incorporated. All rights reserved.
Disclaimer: Contents subject to change without notice and arenot guaranteed for accuracy.
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SSMTT-27M1 3
Jitter/Wander for the E1 Module
1 Menu ...................................................................5
1.1 Jitter ...................................................................................5
1.1.1 Jitter Measurement .........................................................61.1.1.1 Configuration ...............................................................61.1.1.2 Output Jitter Measurement Result ...............................8
1.1.2 Jitter Generation ...........................................................101.1.3 Jitter Tolerance .............................................................11
1.1.4 Jitter Transfer ................................................................131.1.5 View Test Records ........................................................15
1.2 Wander ............................................................................17
1.2.1 TIE/MTIE Measurement................................................171.2.1.1 TIE Measurement Setup............................................171.2.1.2 Wander Results .........................................................18
1.2.2 View Test Records ........................................................19
2 PC Based MTIE/TDEV Analyzer ......................21
2.1 Introduction ......................................................................21
2.2 Analysis Procedure..........................................................212.2.1 Masks ...........................................................................23
2.3 Analysis Screen Feature Description ..............................33
3 Applications .....................................................37
3.1 Jitter Measurement ..........................................................37
3.2 Jitter Tolerance ................................................................38
3.3 Wander/TIE/MTIE Measurement .....................................40
4 Reference .........................................................41
4.1 Jitter .................................................................................41
4.2 Wander ............................................................................43
4.2.1 Time Interval Error (TIE) ..............................................44
4.3 Express Limited Warranty ................................................46
Index ......................................................................47
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4 Jitter/Wander for the E1 Module
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SSMTT-27M1 5
1 Menu
This Users Manual covers the optional Jitter/Wander feature of the
E1 Module that is found in the OTHER MEASUREMENT menu: JITTER (SWMTT-27JM and SWMTT-27JG) WANDER (SWMTT-27WM)
1.1 Jitter
ITU denes Jitter as Short-term variations of the signicant in -
stances of a digital signal from their ideal positions in time (whereshort-term implies these variations are of frequency greater than
or equal to 10 Hz).
Jitter is a natural and inevitable occurrence in telecommunicationsnetworks. However, excessive jitter can lead to transmission errorsand deterioration in network quality.
The Jitter feature quickly and accurately determines if a 2M signal
has excessive jitter.
From the E1 MODULE main menu, select OTHER MEASURE-MENT > JITTER. A Downloading... message will be displayed
as the feature loads. The test set must be in a E1 SINGLE TESTMODE to perform jitter measurements. After the feature loads,
the following items are available:
JITTER MEASUREMENT JITTER GENERATION JITTER TOLERANCE
JITTER TRANSFER VIEW TEST RECORDS
Note: The test set will require a second memory card installed in
the test sets outer slot to perform a jitter histogram. See the testsets Users Manual for more information.
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6 Jitter/Wander for the E1 Module
1.1.1 Jitter MeasurementAfter selecting JITTER MEASUREMENT from the JITTER menu,
the following conguration screen is displayed:
1.1.1.1 Configuration
11:50:45
JITTER TEST SETUP
FILTER : 20-100K HZ HzRX RATE : 2.048 MbpsTHRESHOLD : G.823B1 LIMIT : 1.5 UIppREF CLOCK : INTERNTEST DURATION: 000:01:00 H:M:S+P LIMIT : 0.50 UIp
-P LIMIT : 0.50 UIp
WIDEBND HIGHBND START
Figure 1 Jitter Test Setup Screen
Configure as required:
FILTEROptions: WIDEBND (F1), HIGHBND (F2)
Choose the band to filter.
WIDEBND: This is a wideband 20Hz100kHz lter and uses
the B1 (1.5 UIpp per ITU-T) Maximum Permissible Jitter speci-cation; B1 will appear in the THRESHOLD line.
HIGHBND: This is for a highband 18kHz100kHz lter anduses the B2 (0.2 UIpp per ITU-T) Maximum Permissible Jitter
specication; B2 will appear in the THRESHOLD item.
Note: ITU G.823 requires both a wideband, and then a highband
measurement be performed, in order to qualify the E1 link. SeeSection 4.1for information on the bands.
RX RATEThe signal receive rate is fixed at 2.048 Mbit/s.
THRESHOLDOptions: G.823 (F1), USER (F2)
Choose the band to filter.
G.823: This uses the jitter limit specied by ITU-T G.823.
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SSMTT-27M1 7
USER: Use this to manually determine the jitter limit. If used,
select the B1/B2 line, and enter the allowable peak-to-peakvalue, in unit intervals.
B1/B2 LIMITOptions: B1 (0 to 1.5), B2 (0 to 0.2)
Set the threshold, if using a USER configuration.
REF CLOCK
The reference clock is xed at INTERN.
TEST DURATION
Options: TIMED (F1), CONTINU (F2)
Determine the measurement duration.
TIMED: Measurements will run for a specied length of time.Enter the Hours, Minutes, and Seconds (H:M:S) the test will run.
The default is one minute, as recommended by the ITU-T. CONTINU: The measurement will run until STOP (F4) ispressed.
+P LIMITOptions: Depends on the THRESHOLD B1/B2 limit.
Determine the positive phase hit limit; a positive phase hit above
this entry will count in the Results screen.
-P LIMIT
Options: Depends on the THRESHOLD B1/B2 limit.
Determine the negative phase hit limit; a negative phase hit be-yond this entry will count in the Results screen.
When ready, press START (F4) and a NV Histogram Data
Would be Erased!!! message appears. Press ENTER to start themeasurements with a Conguring... message as the test set
recongures itself, then the result screen will appear.
Note: The Jitter histogram uses the same memory location on theinternal memory as the basic E1 histogram. Starting Jitter mea-
surements will erase the E1 histogram record. Save any recordsyou want to keep to an optional second memory card.
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8 Jitter/Wander for the E1 Module
1.1.1.2 Output Jitter Measurement ResultFigure 2 presents a sample Jitter Results screen.
11:50:45
ET- 000:02:30 RT- CONTINU
OUTPUT JITTER RESULT
FILTER : 20-100kHz
LIMIT : 1.50 UI PASS CURRENT MAXIMUM
JITTER : 0.002 0.004
RMS : 0.001 0.001
+PEAK : 0.002 0.000
-PEAK : 0.000 0.000
PHASE HIT: +0
PHASE HIT: -0
PRINT STOP
Figure 2 Output Jitter Results Screen
If the chassis is equipped with an extra memory card, this screen
will then feature a scroll bar on the right side of the screen. It indi-cates that there is additional information available, in this case a
Histogram screen. To access, press , to return to the first screenpress . The first screen contains:
ET: Elapsed Time since START (F4) was pressed.
RT: Remaining Time left to the test, CONTIN will be displayed if
continuous was selected in the previous setup screen.FILTER: Frequency band filter in use.
LIMIT: Jitter limit used.
Banner: The overall result is displayed: PASS (jitter maximum islower than G.823) or FAILED (jitter maximum exceeds G.823).
Below the banner, Jitter measurements are given for the CUR-RENT and MAXIMUM values for the following:
JITTER: This is Jitter peak-to-peak in unit intervals.
RMS: This is Jitter Route Mean Squared in unit intervals.
PEAK +/-: Positive and negative jitter peak values.
PHASE HIT +/-: Number of occasions the jitter peak-to-peak valuewas above/below the THRESHOLD value.
The following F-keys are available:
PRINT(F1): Press to send the results to the serial port.
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SSMTT-27M1 9
STOP/START(F4): Press to stop the test, press again to start
the measurement and reset all counters.
Press to access the screen shown in Figure 3. Histogram analy-
sis automatically starts when a jitter measurement is started. Thehistogram presents data for each measurement over time.
PRINT STOPZOOMTYPE
11:50:45ET- 000:02:30 RT- CONTINU JITTER HISTOGRAMTYPE:PEAK-PEAKCURSOR:0.939 03/04/03 11:30:40
2.0
UI 1.0
0.0 0 15 30 45 60 SEC
Cursor
Threshold
Measurement
Zoom levelSeconds,Minutes,or Hours
Figure 3 Jitter Histogram Screen
This screen contains the following:
Threshold: Indicates the ITU jitter threshold.
Cursor: Move the vertical cursor by pressing to select aparticular area and get results for that area. The CURSOR line
indicates the jitter value at that area with its date and time.
Measurement: Value of the jitter measurement being performed.
The X axis (seconds, minutes, or hours) indicates the duration/progress of the test. The Y axis indicates the jitter value in UI
(Unit Intervals).
The following additional F-keys are now available:
TYPE(F2): Press to choose a measurement type as indicatedat TYPE. They are:
PEAK-PEAK: Peak-to-Peak PEAK-BASE Peak positive
BASE-PEAK: Peak negative RMS: With RMS results, the threshold line is not displayed, as
jitter limit is determined by the peak-to-peak value.
ZOOM (F3): Press to change the resolution in seconds, minutes,or hours centered at the cursor.
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10 Jitter/Wander for the E1 Module
1.1.2 Jitter GenerationUse the following screen to setup and generate jitter.
START
11:50:45
JITTER GENERATION SETUP
FREQUENCY(Hz): 10PP UI : 00.00
Figure 4 Jitter Generation Setup Screen
FREQUENCY
Options: 1099999 kHz
Enter the frequency of the transmitted jitter.
PP UIEnter the amplitude at which peak-to-peak jitter generation will
begin.
See O.172 for the ITU recommendation on minimum jittergeneration.
Press F4 to start generating jitter. Press again to stop generat-
ing jitter.
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SSMTT-27M1 11
1.1.3 Jitter ToleranceJitter Tolerance (accommodation) is defined in terms of the si-
nusoidal jitter amplitude which causes a designated error, when
applied to the input of digital equipment. Jitter tolerance is a func-tion of amplitude and frequency of the applied jitter. Equipmentmust pass the lower limit of maximum jitter tolerance, which is
specified in G.823. This jitter tolerance template is used to qualifythe performance of digital network equipment.
Select JITTER TOLERANCE from the JITTER menu to have thetest set generate jitter, and then measure the looped back signal
from the EUT (equipment under test).
The test set will transmit jitter from point-to-point, from low fre-quency to high frequency, at different amplitudes, to determine
where errors occur (maximum jitter tolerance).
STOPTABLE PRINT SAVE
Tolerance
Indicators
: at least
+: maximum
tolerated
Y: Tx Jitter
Peak-to-Peak
amplitude
X: Tx Jitter
Frequency
11:50:45 Meas
JITTER TOLERANCE TESTUIpp IN PROGRESS
2010
1.0
0.1 kHz .01 .1 1 10 100
Figure 5 Jitter Tolerance Test, In Progress Screen
The following is reported:
kHz: The X axis shows the frequency of the generated jitter.
UIpp: The Y axis shows the generated jitters peak-to-peak am-plitude (UI).
:Indicates the lowest value of the maximum tolerable jitter ateach frequency point.
+: Indicates the maximum jitter value tolerated at the frequency
(not shown).
The following F-keys are available:
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12 Jitter/Wander for the E1 Module
TABLE/GRAPH(F1): Press to see the results in the table formatshown in Figure 6, press again to return to the graph view.
PRINT(F2): Press to send the results to the serial port.
SAVE(F3): Press to save the results. A second memory card mustbe installed in the chassis to save results. See Section 1.1.5.
STOP/START(F4): Press to stop the test, press again to startthe measurement resetting all counters.
The message will change from IN PROGRESS to COMPLET-ED when the test is done.
Jitter Tolerance Table ResultsThis screen features a scroll bar on the right side of the screen. It
indicates that there is additional information available. To accessthis information, press , to return to the first screen press .
STOPGRAPH PRINT SAVE
11:50:45 Meas JITTER TOLERANCE TEST IN PROGRESS
FREQ(kHz) MTJ(UI-pp) MASK(UI-pp) 0.020 >20.00(PASS) 1.50 0.036 >20.00(PASS) 1.50 0.066 >20.00(PASS) 1.50 0.120 >20.00(PASS) 1.50 0.220 >20.00(PASS) 1.50 0.400 >20.00(PASS) 1.50 0.730 >20.00(PASS) 1.50 1.300 >20.00(PASS) 1.50 2.400 >20.00(PASS) 1.50
3.400 XXXXXXXXXXXX 1.06
Figure 6 Jitter Tolerance Test-Table Screen
Table view lets you see all of the specic frequencies and ampli-
tudes at which jitter was tested. The following is reported:
FREQ (kHz): Frequency tested.
MTJ (UI-pp): Maximum Tolerable Jitter (Unit Interval) and PASS/FAIL status.
MASK (UI-pp): Unit Interval Peak-to-peak jitter limit as dened
by the ITU standard. To pass, the jitter tolerance must exceedthe mask.
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SSMTT-27M1 13
1.1.4 Jitter TransferThis is the ratio of output jitter to input jitter amplitude versus jitter
frequency for a given bit rate. Often, a portion of received jitter is
transmitted at a piece of equipments output.To perform the test, the rst step is to perform a calibration. You willsee a CONNECT LINE 1 TX TO RX PRESS ENTER TO STARTCALIBRATE message to remind you to loop the unit. The test
set must be calibrated before conducting jitter transfer in order tocompensate for jitter, other than from the equipment under test.
The message will change to COMPLETED when the calibrationprocess is done. A Before Starting The Test Connect Equipment
Under Test message will appear as a reminder.Connect the test set to a looped back EUT and press START(F4) to begin the test. The test set starts transmitting jitter at a
low frequency, then increases it. Results are displayed in dB.Results allow you to calculate how much jitter was added by the
EUT. The test set transmits jitter, then receives the signal backfrom the EUT, and compares the measurements to see the gain
or loss in jitter from the EUT.
STOPTABLE PRINT SAVE
ITU Jitter
Mask
Jitter
Transfer
Values
Green: OK
Red: not OK
11:50:45
JITTER TRANSFER TEST
dB IN PROGRESS
10
0
-10
-20 kHz
.01 .1 1 10 100
x x x x x xx x xx xx x x
Figure 7 Jitter Transfer Test, In Progress Screen
The following is reported:
kHz: The X axis shows the frequency of the generated jitter ateach sampling point.
10 -20:The Y axis shows the ratio of jitter in to jitter out in dB.Progress bar: The bar at the is a representation of the testsprogress.
X: These represent the jitter transfer value. indicates that the
transfer value was below the ITU maximum limit (exceeds stan-
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14 Jitter/Wander for the E1 Module
dards). Values below the mask pass, values above it fail. The line
above the Xs represent the ITU jitter mask.
The following F-keys are available:TABLE/GRAPH(F1): Press to see the results in a table format
(Figure 8), press again to return to the graph view.
PRINT(F2): Press to send the results to the serial port.
SAVE(F3): Press to save the results. A second memory card mustbe installed in the chassis to save results. See Section 1.1.5.
STOP/START(F4): Press to stop the test, press again to startthe measurement (this will reset the test).
Jitter Transfer Table Results
This screen features a scroll bar on the right side of the screen. Itindicates that there is additional information available. To access
this information, press . To return to the first screen press .
STOPGRAPH PRINT SAVE
11:50:45JITTER TRANSFER TEST
IN PROGRESS
FREQ(kHz) TRANSFER(dB) MASK(dB) 0.020 0.001(PASS) 0.500 0.036 -0.000(PASS) 0.500 0.066 -0.000(PASS) 0.500 0.120 -0.011(PASS) 0.500 0.220 0.012(PASS) 0.500 0.400 0.000(PASS) 0.500 0.730 -0.004(PASS) 0.500
1.300 -0.020(PASS) 0.500 2.400 -0.005(PASS) 0.500 3.400 -0.005(PASS) 0.500
Figure 8 Jitter Transfer Test-Table Screen
In Table view you can easily see all of the specic frequenciesand amplitudes at which jitter was tested, and the correspondingPASS or FAIL status. Jitter out (transmitted by the test set) is
divided by the jitter in (from the EUT), and the results shown indB. The following is reported:
FREQ (kHz): Measured Frequency.
TRANSFER (dB): Jitter in divided by jitter out value, in dB, andthe PASS/FAIL status.
MASK (dB): Maximum jitter transfer limit dened by the ITU.
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SSMTT-27M1 15
1.1.5 View Test RecordsA total of ten records may be stored via this menu (an additional
memory card is required), including the current results (record 01;
stored in the test sets memory). Records are stored by pressingSAVE in any jitter results screen or by pressing STOP from anywander results screen. The test set rewrites record 01 each time
a test is run. The record numbers are shown in accordance withthe jitter/wander results that are in memory.
For wander measurement there are two types of records in eachmeasurement. The rst wander measurement and histogram is
stored in the SRAM card and is mentioned in the previous para-graph. In the second the raw data is stored in the MMC card.
This data is used by the MTIE/TDEV analyzer for post analysisas discussed in Section 2.
MOREEDIT PAGE-UP PAGE-DN
11:50:45
VIEW TEST RECORDS
REC NAME TYPE STATUS
1. WAN-00 TIE UNLOCKED
CARD START 2004-11-24 22:46:58
STOP 2004-11-24 22:47:09
2. JITRES01 TRANS. UNLOCKED
CARD START 2004-11-24 22:47:16
STOP 2004-11-24 22:59:37
MOREVIEW LOCK UNLOCK
MORECLR CLR-ALL
Figure 9 View Test Records Screen
The following F-keys are available:
EDIT(F1): Relabel and save a record. See Editing a Label.
PAGE-UP(F2), PAGE-DN(F3): Scroll through the records.
VIEW(more, F1): Press to view the saved Results screens (thesecontain a PRINT F-key). Press ESC when nished.
LOCK(more, F2): Press to lock the record, so it cannot be deleted.Press UNLOCK(more, F3) so it can be deleted.
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16 Jitter/Wander for the E1 Module
CLR(more, F1): Press to delete a selected unlocked record. If
10 records are already stored, a record will need to be deletedbefore storing a new one.
CLR-ALL(more, F2): Deletes all unlocked records, except thecurrent record.
Editing a Label
1. Select a record in the VIEW TEST RECORDS screen andpress EDIT (F1) and a character entry screen is displayed.
2. At this point the cursor is on the first character of the label,and three F-keys are available:- INSERT (F1): Use to insert characters.
- DELETE (F2): Use to remove characters.- TOGGLE (F3): Use to access characters.
- : Use to position the cursor in the LABEL line.
3. Once nished with step 2, press TOGGLE (F3) to access thecharacter grid and the A will be selected.
4. Use to select a desired character. Press SELECT(F4) and the character is inserted into the LABEL line at thecursor point. Repeat until the label is finished.
If a mistake in the label is made, press TOGGLE (F3) andmove the cursor to the incorrect character, then press
either:- DELETE (F2): Use to remove characters.
- INSERT (F1): Use to insert characters.
Press TOGGLE (F3) to reenter the character grid and continuewith your label.
5. When finished, press TOGGLE (F3), then ENTER and yourrecord is saved with a new name in the VIEW TEST RECORDSscreen.
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SSMTT-27M1 17
1.2 Wander
From the E1 module main menu, select OTHER MEASUREMENT> WANDER. You will see a Downloading... message while the
feature loads. You must be in a E1 SINGLE TEST MODE to per -form wander measurements. After the feature loads, the following
items are available:
TIE/MTIE MEASUREMENT VIEW TEST RECORDS
1.2.1 TIE/MTIE MeasurementThe long-term variation (less than 10 Hz) of a digital signal is
called Wander. To measure select TIE MEASUREMENT and theWander Test Setup screen is displayed as shown in Figure 10.
1.2.1.1 TIE Measurement Setup
11:50:45
WANDER TEST SETUP
FILTER :
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18 Jitter/Wander for the E1 Module
TEST DURATION
Options: TIMED (F1) CONTINU (F2)
Select whether to perform a timed or continuous test. If TIMED
is selected, press SHIFT and use the numeric keypad to enterfrom 1 second up to 999 hours, 59 minutes, 59 seconds (Oneminute is recommended by the ITU-T). If CONTINU is selected,
press F4 to stop the test.
When finished, press START (F4) and refer to Figure 11.
1.2.1.2 Wander Results
11:50:45
ET-000:02:36 RT- 003:17:04
WANDER RESULTS
TIE : -0.971 ns
MTIE : 11.228 ns
+TIE Max : 0.981 ns
-TIE Max : -6.617 ns
PRINT STOP
Figure 11 Wander Result Screen
The following is reported:
TIE: Time Interval Error, dened as: The difference between the
measure of a time interval as provided by a clock and the measureof the same interval as provided by a reference clock (per ITU-TG.810) in nanoseconds measured in a one-second interval.
MTIE: Maximum time interval error, maximum TIE during a speci-fied observation period of time.
+TIE Max: Maximum TIE peak during a measurement period.
-TIE Max: Lowest TIE peak during a measurement period.
The following F-keys are available:
PRINT(F1): Press to send the results to the serial port.
STOP/START (F4): Press to stop taking measurements, pressagain to restart your measurement. Pressing STOP automatically
saves your test measurement in VIEW TEST RECORDS.
Press to view the next screen:
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SSMTT-27M1 19
PRINT STOP
11:50:45ET-000:02:36 RT- 003:17:04 WANDER HISTOGRAM
TYPE: TIE: 0.9/-6.9 nsDATE: 11/24/04 11:50:45 10
5
ns 0
- 5 -10 0 15 30 45 60 SEC
JUMP ZOOM
Figure 12 Wander Histogram Screen
Note: The test set will require a second memory card installed in
the test sets outer card slot in the inner slot to perform a wanderhistogram. See the test sets Users Manual for more informa-
tion.
This screen presents a visual representation of the wander re -ceived. It contains the following:
PRINT(F1): Press to send the results to the serial port.
JUMP(F2): Moves the cursor in 15 unit intervals, press to
move the cursor in 1 unit intervals.
ZOOM (F3) Change the time view of the display; seconds, min-utes, or hours.
STOP/START (F4): Press to stop taking measurements, pressagain to restart your measurement. Pressing STOP automatically
saves your test measurement in VIEW TEST RECORDS.
: Press to switch between the WANDER HISTOGRAM andthe WANDER RESULT screens.
: Press to move the cursor to the previous /next point and the
TIE value will be updated accordingly at the point.
ESC: Press to return to the WANDER TEST SETUP screen.
1.2.2 View Test RecordsSee Section 1.1.5.
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20 Jitter/Wander for the E1 Module
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SSMTT-27M1 21
2 PC Based MTIE/TDEV Analyzer
2.1 Introduction
The MTIE/TDEV Analysis option for the SSMTT-27 moduleextends the wander analysis capabilities of the test set to a PC
environment where the MTIE/TDEV calculation can be donequickly and efficiently.
This clear diagnostic tool helps you determine whether the
collected measurements meet ITU-T requirements. It retrievesstandard TIE measurements and displays them graphically. Once
they are stored on your PC, the software will calculate MTIE/TDEV conforming to ITU-T recommendations O.171 and O.172.The pass/fail report will be based on predened masks dened
by ITU-T recommendations G.811, G.812, G.813, and G.823.
2.2 Analysis Procedure
MTIE/TDEV analysis is based on TIE measurements which havealready been collected and stored in the chassis MMC card under
RESULTS > WANDER folder. The TIE data must be transferredto a PC. Once transferred, the MTIE TDEV Analyzer software will
calculate MTIE and TDEV per ITU-T, and display them graphi-cally; for up to 100,000 seconds. Finally, ITU-T masks for MTIEand TDEV may be displayed, to determine if the device under
tests meets ITU-T requirements. Follow this procedure to performMTIE/TDEV analysis:
1. If not done previously, install the MTIE TDEV Analyzer software
on your PC. Open the MTIE_xx.xxx.exe le, and follow theon screen instructions.2. Perform Jitter/Wander measurements with the SunSet MTT
test set, according to the procedures in Section 3.3and savethe measurement results.
3. Shut down the test set and remove its MMC card. Insert it intoany commercially available MMC card adaptor connected to
a PC, then copy the WANDER folder on the card to the PC.
128MB
SUNRISE TELECOM
SA728
Model
S/N
Folders X
MMC Card
PROFILE
RESULT
BIN
WANDER
Figure 13 WANDER Folder in the MMC Card
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22 Jitter/Wander for the E1 Module
4. Open the MTIE TDEV Analysis software by going to the Win-dows Start button, and select Programs > Sunrise Telecom >
MTIE Analysis. After the program starts up, the MTIE TDEV
Analysis window will appear.5. Click File > Open and in the File Open dialog box navigate to thele that was copied to the PC. The following gure is a sample:
Figure 14 Sample TIE Plot Screen
6. Click MTIE/TDEV > Start MTIE/TDEV Analysis to perform bothanalyses on the le. It will take some time for the process to
complete. When it has, you will see the results at the bottomof the window. Basic analysis is complete.
7. To perform further analysis, click Mask to display a list of specifica-tion masks, as shown in Figure 15, which may be imposed. The
active mask is marked by a check mark. Click a mask to selectit; the analysis will be performed. The name of the mask in use
is shown in the title bar near the bottom of the plot/graph.
Figure 15 ITU-T Mask Selection
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SSMTT-27M1 23
2.2.1 MasksFor MTIE and TDEV related masks, see G.811, G.812, G.813,
and G.823 for details. Here is a series of mask analysis on the
same original data file.
ObservationIntervalinSeconds
G823NetworkInterfacePrimaryReferenceClock
10000
1000
100 10 1 0.1
MTIEMask
TDEVMask
MTIEAnalysisData
TDEVAnalysisData
nsec
0.1
1
10
100
1000
10000
100000
Figure 16 G.823 Primary Reference Clock Mask
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24 Jitter/Wander for the E1 Module
ObservationIntervalinSeconds
G823PDHSynchronizationInterface
1000
0
100
0
10
0
1
0 1
0.
1 0.1
1
10
100
1000
10000
100000
MTIEMas
k
TDEVMas
k
MTIEAnalysisData
TDEVAnalysisData
nsec
Figure 17 G.823 Synchronization Supply Unit Mask
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SSMTT-27M1 25
ObservationIntervalinSeconds
G.82
3SDHNetworkInterfaceEquipment
SlaveClock
1000
0
100
0
10
0
1
0 1
0.
1 0.1
1
10
100
1000
10000
100000
MTIEMas
k
TDEVMas
k
MTIEAnalysisData
TDEVAnalysisData
nsec
Figure 18 NI Equipment Slave Clock Mask
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26 Jitter/Wander for the E1 Module
ObservationIntervalinSeconds
G823PDHSynchronizationInterface
1000
0
100
0
10
0
1
0 1
0.
1 0.1
1
10
100
1000
10000
100000
MTIEMas
k
TDEVMas
k
MTIEAnalysisData
TDEVAnalysisData
nsec
Figure 19 PDH Synchronous Interface Mask
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SSMTT-27M1 27
ObservationIntervalinSeconds
G.8
11PrimaryReferenceClock
1000000
100000
10000
1000
100
10 1 0
.1
1
10
100
1000
10000
MTIEMas
k
TDEVMas
k
nsec
MTIEAnalysisData
TDEVAnalysisData
Figure 20 G.811 Primary Interface Clock
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28 Jitter/Wander for the E1 Module
ObservationIntervalinSeconds
G.8
12SynchronizationSupplyUnitTypeI
100000
10000
1000
100
10 1
0.1
1
10
100
1000
10000
MTIEMask
TDEVMask
nsec
MTIEAnalysisData
TDEVAnalysisData
Figure 21 G.812 Synchronization Supply Unit I Mask
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SSMTT-27M1 29
ObservationIntervalinSeconds
G.8
12SynchronizationSupplyUnitT
ypeII
100000
10000
1000
100
10 1 0
.1
1
10
100
1000
10000
MTIEMask
TDEVMask
nsec
MTIEAnalysisData
TDEVAnalysisData
Figure 22 G.812 Synchronization Supply Unit II Mask
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30 Jitter/Wander for the E1 Module
ObservationIntervalinSeconds
G.8
12SynchronizationSupplyUnitT
ypeIII
100000
10000
1000
100
10 1
0.1
1
10
100
1000
10000
MTIEMask
TDEVMask
nsec
MTIEAnalysisData
TDEVAnalysisData
Figure 23 G.812 Synchronization Supply Unit III Mask
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SSMTT-27M1 31
ObservationIntervalinSeconds
G
.813SDHSynchronizationSlaveCloc
k1Mask
1000
100
10 1
0
.1
0.01
0.0
010
.1
1
10
100
1000
MTIEMas
k
TDEVMask
nsec
MTIEAnalysisData
TDEVAnalysisData
Figure 24 G.813 SDH Synchronization Slave Clock 1 Mask
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32 Jitter/Wander for the E1 Module
ObservationIntervalinSeconds
G.8
13SDHEquipmentSlaveClockO
ptionII
100
10 1
MTIEMask
TDEVMask
nsec
MTIEAnalysisData
TDEVAnalysisData
0.1
1
10
100
1000
10000
Figure 25 G.813 Synchronization Slave Clock 2 Mask
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SSMTT-27M1 33
2.3 Analysis Screen Feature Description
FileO
penS
ave
StartM
TIEAnaly
sis
StartT
DEVAnalys
is
StartB
othMTIE
andTD
EVAnalys
is
Stop
Any
Analys
is
ViewTIEPl
otDataOn
ly
ViewMTIE
Plot
DataO
nly
View
MTIEM
askO
nly
ViewBo
thMTIE
Plot
and
Mask
ViewTD
EVPlot
DataO
nly
View
TDE
VM
askO
nly
ViewBo
thTDE
VPl
otandM
ask
View
AllM
TIE
andTD
EVPlot
and
Mask
View
Serie
sData
...
About
ToolBarDetails
ToolBar
MenuBar
MaskInUse
PlotKey
PlotArea
StatusBar
Figure 26 MTIE/TDEV Screen with Tool Bar Details
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34 Jitter/Wander for the E1 Module
The features are:Menu Bar: Access the programs features, including starting andstopping analysis, applying different ITU-T masks, and savingresults.
File- Open: Select a file to open from the Open dialog box.
- Save: Store the analysis as a .plt (plot), .txt (text) or .jpeg(graphic) file.
- Save As: Save an analysis under a new name.- Download Wizard: Not applicable to this application.- Print: Print the window through a windows printer.
- Exit: Close the program.
View: Hide or display the Tool Bar and Status Bar. MTIE/TDEV: Perform or view MTIE and/or TDEV analysis and
view the data in a table as shown in Figure 27.- Start MTIE Analysis
- Start TDEV Analysis- Start MTIE/TDEV Analysis- Stop Any Analysis
- View TIE Plot- View MTIE Plot
View MTIE Plot Only View MTIE Mask Only
View MTIE Plot and Mask
- View TDEV Plot View TDEV Plot Only
View TDEV Mask Only View TDEV Plot and Mask
- View MTIE/TDEV Plot- View Data Grid, shown in the following gure.Data Display
sec MTIE Data (nsec) MTIE Mask (nsec) TDEV Data (nsec) TDEV
1
2
3
4
5
6
7
8
9
10
20
30
40
50
6070
80
17.04
17.83
17.83
17.83
17.83
17.88
17.88
17.88
18.47
18.47
18.47
18.47
18.98
18.98
18.9818.98
18.98
20.00
20.00
27.89
33.89
43.40
47.27
50.90
54.26
57.42
60.00
60.00
60.00
60.00
60.00
60.0060.00
60.00
0.79
0.70
0.40
0.31
0.31
0.34
0.29
0.25
0.24
0.25
0.20
0.22
0.23
0.25
0.260.28
0.29
OK Cancel
Figure 27 View Data Series
Mask: Impose an ITU-T standard mask by clicking on a mask
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SSMTT-27M1 35
from the drop down list. A check mark will appear next to the
active mask. Figure 15 shows the drop down list and Figures16 through 25 show a sample of each mask.
Help: View the About MTIE window.
Plot Area: As shown in Figure 26, this presents the actual analysis.As an analysis proceeds, watch the plot update in the Plot Area
and Status Bar.
Key shows the plot colors associated with each analysis andmask.
MTIE mask and data are displayed in red; TDEV mask anddata are displayed in blue.
The orange title bar shows the currently applied mask.
Status Bar presents the overall analysis results, including thecurrent activity state of the analysis, the Passed or Failed
result, and how long the analysis process took.
Tool Bar: Shortcuts to commonly used functions. Initially, onlythe analysis buttons are available (such as Start MTIE); after an
analysis has been performed, the remaining buttons becomeavailable, allowing you to view the data in the desired format andfor a particular analysis. Refer to Figure 26.
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36 Jitter/Wander for the E1 Module
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SSMTT-27M1 37
3 Applications
3.1 Jitter Measurement
Jitter can be measured in two ways by using an undened quasi-random trafc signal, when the line is in use, or by using specic
test sequences when the line is not in use.
EUT
RX
TX
E1-TX1
E1-RX1
Intrinsic Jitter Measurement
EUT
RX
TX
E1-RX1
Network Jitter Measurement
EUT
TX
RX
Figure 28 Jitter Measurement Setup
1. Connect the equipment for intrinsic or network jitter measure-
ments, as shown in Figure 28.2. From the E1 module main menu, select OTHER MEASURE-
MENT > JITTER > JITTER MEASUREMENT and congure
as required.3. Press START (F4). Measure the filtered output jitter and record
the true peak-to-peak jitter amplitude. Perform a widebandmeasurement, followed by a highband measurement.
4. Look at the results and the Histogram for an overview of themeasurement. Press TYPE (F2) to see each result; peak-to-
peak, base-to-peak, peak-to-base, and RMS (a good averagingmeasurement). Use ZOOM (F3) to look at the values over time.Conrm that the measurement is within limits.
5. Repeat measurements for all desired settings.
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38 Jitter/Wander for the E1 Module
3.2 Jitter Tolerance
Equipment must be able to tolerate a certain level of jitter, asdened by ITU-T G.823. One way to test jitter tolerance is by
checking for the onset of errors. The onset of errors criterion isdefined as the maximum amplitude of jitter at a specified frequency
that causes more than two errored seconds during 30 secondmeasurement intervals.
To perform this test, connect the test set to the EUT and gener-ate a pseudorandom test sequence at a specific frequency. The
EUT should loop the signal and send it back to the test set, whichwill measure any errors that occur. The test set will increase and
decrease the jitter amplitude. Look at the results to determinewhere maximum jitter tolerance was reached.
EUT
RX
TX
E1-TX1
E1-RX1
Loop aTest Pattern
Figure 29 Jitter Tolerance Setup
1. Connect the test set to the equipment under test (EUT). TheEUT should be in a received clocking mode, and have a loop-back in place to loop back the test pattern.
2. From the E1 module main menu, select OTHER MEASURE-MENT > JITTER > JITTER TOLERANCE and the test will startimmediately. The test set will transmit jitter at each frequency,
at varying amplitudes.3. You may watch the test in progress or look at it when it has
completed. The bar at the top of the screen indicates the testsprogress. See Figure 30 for an explanation of the screen.
Confirm that the jitter measurement passes tolerances andor requirements.
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SSMTT-27M1 39
STOPTABLE PRINT SAVE
Tolerance
Indicators
: at least+: maximum
tolerated
Y: Tx Jitter
Peak-to-Peak
amplitude
X: Tx Jitter
Frequency
11:50:45 Meas JITTER TOLERANCE TESTUIpp IN PROGRESS
2010
1.0
0.1 kHz .01 .1 1 10 100
Figure 30 Tolerance Test in Progress Screen
An indicates the EUT has met (or exceeded) the ITU speci-
fication for that frequency. A + shows where the EUT hit its maximum jitter tolerance. A
+ above the ITU mask line indicates a pass for that frequency;a + below the mask line, indicates a fail for that frequency (not
shown). Press TABLE (F1) to see the results as a table (Figure 6).
- FREQ (kHz): Frequency tested.
- MTJ (UI-pp): Peak-to-peak Maximum Jitter Tolerance (inUnit Intervals), and PASS/FAIL status. PASS is declared
when the EUT added less than the maximum allowablejitter.
- MASK (UI-pp): Peak-to-peak jitter limit (in UI) as denedby the ITU standard. The mask values are for your informa-tion.
4. Repeat measurements for all desired settings.
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40 Jitter/Wander for the E1 Module
3.3 Wander/TIE/MTIE Measurement
1. Connect the equipment for wander measurements, as shownin Figure 31. Note the presence of an synchronization clock,
which is normally used to synchronize the network.
EUT
RX
TX
E1-RX1
EUT
TX
RX
Synchronization Clock
2.048 Mbit/s or 2 MHz
REF CLKE1
Terminal
Equip.
E1-RX1
GPS or Cesium
Reference Clock
REF CLKE1 Terminal
Equip.
Or
Figure 31 Wander Measurement Setups
2. From the E1 module main menu, select OTHER MEASURE-
MENT > WANDER > TIE MEASUREMENT and congure asrequired.
3. When ready, press START (F4) and the test set will startmeasuring TIE, MTIE, +TIE MAX and -TIE MAX.
4. Observe the results by pressing to switch between theWANDER HISTOGRAM and the WANDER RESULT screens.Press ZOOM (F3) to look at the values over time.
5. Press STOP (F4) and the results are stored.
Post-processing analysis of TIE measurements is availableas a PC software option. It calculates MTIE/TDEV per ITU-TO.171/O.172, and display the results graphically with a clear
pass/fail indication using your Windows based PC. Refer toSection 2for more information.
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SSMTT-27M1 41
4 Reference
4.1 Jitter
Jitter affects both digital (generation of bit errors, uncontrolledslips) and analog signals (unwanted phase modulation of thetransmitted signal). Essentially, jitter is an unwanted phase modu-
lation of the digital signal. Jitter may cause errors or bit slips in adigital circuit, and deteriorate the performance of a transmission
network (which is why you look for bit and other errors when test-ing jitter tolerance).
Jitter is classified as systematic and random jitter:
Systematic jitter is pattern-dependent. In lower-rate digitalsystems, systematic jitter is dominant.
Random jitter is independent of the transmitted pattern. Inhigher-rate systems, the random jitter may become more
important.Test environment parameters which affect jitter performance aretest sequences, bit rate, pulse shape, cable characteristics, tem-perature, cross-talk, and noise. Network equipment must be able
to operate in the presence of some jitter (tolerance).
Output jitter measurement can be classied into two categories:
Network output jitter (at hierarchical interface) Intrinsic jitter (generated by individual digital equipment)
Table 1 shows the maximum allowable jitter at 2.048 Mbit/s, as
dened by ITU-T G.823.
Bit Rate
Network Limit
Measurement Filter
Bandwidth
B1 UnitIntervalPeak-to-
B2 UnitIntervalPeak-to-
Cut-off Frequency
Lowerf1
Lowerf3
Higherf4
2.048
Mbit/s
1.5 0.2 20 Hz 18 kHz
700 Hz
100
kHz
Table 1 Maximum Jitter Allowed for 2.048 Mbit/s
Figure 32 shows how jitter should be measured per ITU G.823.
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42 Jitter/Wander for the E1 Module
Band
pass filtercut-off &
f1& f
4
Band
pass filtercut-off &
f3& f
4
Jitter Detector
HierarchicalInterface or
Equipment
Output Port
B1Unit Intervals B
2Unit Intervals
Measured Jitter Amplitude
Figure 32 Measuring Jitter
Note the Wideband and Highband lters. Each has a lower fre-quency cutoff value (f
1or f
3) and a higher frequency cutoff value
(f4). The B
1and B
2peak-to-peak unit intervals correspond to the
measurements. Refer to G.823 for details on jitter tolerances.
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SSMTT-27M1 43
4.2 Wander
Phase deviations with a frequency content of less than 10 Hz arereferred to as wander. If a signal with a lot of wander is examined
using an oscilloscope, you will perceive a sharp clock signal,which gradually moves back and forth, compared to the Exact
Clock as in Figure 33.
Exact
Clock
Clock
with
Wander
Figure 33 Clock Wander
ITU-T O.172 also species some requirements for wander mea-suring equipment. O.172 says that TIE can be interpreted as
the time difference between the signal being measured and thereference clock. It is typically measured in nanoseconds and set tozero at the start of the measurement period. Therefore, TIE gives
the timing change since the measurement began. The referenceclock can be 2.048 MHz or a 2.048 Mbit/s.
The test set currently measures real time TIE. It requires a refer-
ence clock connected to the REF CLK port (2.048 MHz) or a 2.048Mbit/s signal connected to the receiver of the second line (L2-RX).The test set wont run the measurements without external clock,
as opposed to jitter measurements which can be performed usingthe internal clock as reference.
Other wander measurements such as MTIE (Maximum Time
Interval Error) and TDEV (Time Deviations) are used to comparethe status of the network clock sources against standard ITU-T
masks and determine whether the signal passes or fails the limitsestablished by ITU.
ITU-T recommends performing real-time TIE measurements forat least 100,000 seconds to collect sufficient information about
the presence of wander in the network. MTIE/TDEV calculationis based on this data, and is normally done ofine with additional
software that processes the information according to ITU.
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44 Jitter/Wander for the E1 Module
4.2.1 Time Interval Error (TIE)TIE is dened by ITU-T G.810 as the time difference between the
measure if a time interval as provided by a clock (as recovered
from a data signal) and the measure of that same time as providedby a reference clock. This reference clock can be a 2.048 MHz ora 2.048 Mbit/s signal. TIE is normally measured in ns.
Maximum Time Interval Error (MTIE)MTIE is dened by ITU-T G.810 as the maximum peak-to-peakdelay variation of a given timing signal within an observation time,
for all observation times of that length within the measurementperiod (T).
This is a useful tool for identifying phase transients in the synchro-
nization network. MTIE is an ofine measurement that is normallyperformed by ofine software packages and high-speed proces-
sors, to calculate the value for all the time observation intervals
(from 1 second up to 100,000 seconds).The following procedure is used to calculate MTIE:
1. Examine all of the one-second intervals.2. Find the maximum time deviation within those intervals and
display it in a table as the one second MTIE value.3. Examine all of the two-second intervals.
4. Find the maximum time deviation within those intervals anddisplay it in a table as the two second MTIE value.
5. Repeat for all other intervals (3, 4, 5 to 9).6. From 10 to 100, the procedure is the same. The only difference
is that the intervals calculation will be made in steps of 10
seconds. Start with all 10 seconds intervals, and the maximum
value will be assigned to the 10-second value in the table. Thenext intervals to be evaluated will be 20 seconds, 30 seconds,and so forth.
7. Once it reaches 100 seconds, the intervals will be evaluated insteps of 100 up to 1,000, in steps of 1,000 up to 10,000 sec-onds, and in steps of 10,000 seconds up to 100,000 seconds
(as recommended by ITU-T O.172).
MTIE analysis must meet ITU-T requirements by comparing theanalyzed data against predefined masks according to recommen-
dations ITU-T G.811, G.812, G.813, G.823, and G.825.
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SSMTT-27M1 45
ObservationIntervalinSeconds
G.8
23PDHSynchronizationInterf
ace
1000
0
100
0
10
0
1
0 1
0.
1 0.1
1
10
100
1000
10000
100000
MTIEMas
k
TDEVMas
k
MTIEAnalysisData
TDEVAnalysisData
nsec
Figure 34 MTIE/TDEV Plots by MTIE/TDEV Analyzer
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46 Jitter/Wander for the E1 Module
The following procedure is used to calculate off-line TDEV:
1. Examine all of the one second intervals.
2. Find the standard deviation within those intervals and display
it in a table as the one second TDEV value.3. Examine all of the two-second intervals.
4. Find the standard deviation within those intervals and displayit in a table as the two second TDEV value.
5. Repeat for other intervals (3, 4, 5 to 9).6. From 10 to 100, the procedure is the same. The only difference
is that the intervals calculation will be made in steps of 10seconds. Start with all 10 seconds intervals, and the maximumvalue will be assigned to the 10-second value in the table. The
next interval to be evaluated will be 20 seconds, 30 seconds,and so forth.
7. Once it reaches 100 seconds, the intervals will be evaluated insteps of 100 up to 1,000, in steps of 1,000 up to 10,000 sec-
onds, and in steps of 10,000 seconds up to 100,000 seconds(as recommended by ITU-T O.172).
MTIE measurement ranges also apply to TDEV analysis, andthe TDEV is dened by ITU-T G.811, G.812, G.813, G.823, and
G.825.
See Figure 34 for a MTIE and TDEV plot example.
4.3 Express Limited Warranty
This Sunrise Telecom product is warranted against defects in
materials and workmanship during its warranty period. The war-ranty period for this product is contained in the warranty page on
http://www.sunrisetelecom.com.
Sunrise Telecom agrees to repair or replace any assembly or
component found to be defective under normal use during thisperiod. The obligation under this warranty is limited solely to re-
pairing or replacing the product that proves to be defective withinthe scope of the warranty when returned to the factory. This war-ranty does not apply under certain conditions, as set forth on the
warranty page on http://www.sunrisetelecom.com.
Please refer to the website for specic details.THIS IS A LIMITED WARRANTY AND THE ONLY WARRANTY
MADE BY SUNRISE TELECOM. SUNRISE TELECOM MAKESNO OTHER WARRANTY, REPR SENTATION OR CONDITION,
EXPRESS OR IMPLIED, AND EXPRESSLY DISCLAIMS THEIMPLIED WARRANTIES OF MERCHANTABILITY, FITNESSFOR A PARTICULAR PURPOSE AND NON-INFRINGEMENT
OF THIRD PARTY RIGHTS.
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SSMTT-27M1 47
Index
A
ApplicationsJitter Measurement; 37
Jitter Tolerance; 38Wander/TIE/MTIE Measurement; 40
CCautions; 2
F
Figures01 Jitter Test Setup Screen; 6
02 Output Jitter Results Screen; 803 Jitter Histogram Screen; 9
04 Jitter Generation Setup Screen; 1005 Jitter Tolerance Test, In Progress Screen; 11
06 Jitter Tolerance Test-Table Screen; 1207 Jitter Transfer Test, In Progress Screen; 1308 Jitter Transfer Test-Table Screen; 14
09 View Test Records Screen; 1510 Wander Test Setup Screen; 17
11 Wander Result Screen; 1812 Wander Histogram Screen; 19
13 WANDER Folder in the MMC Card; 2114 Sample TIE Plot Screen; 2215 ITU-T Mask Selection; 22
16 G.823 Primary Reference Clock Mask; 23
17 G.823 Synchronization Supply Unit Mask; 2418 NI Equipment Slave Clock Mask; 2519 PDH Synchronous Interface Mask; 26
20 G.811 Primary Interface Clock; 2721 G.812 Synchronization Supply Unit I Mask; 2822 G.812 Synchronization Supply Unit II Mask; 29
23 G.812 Synchronization Supply Unit III Mask; 3024 G.813 SDH Synchronization Slave Clock 1 Mask; 31
25 G.813 Synchronization Slave Clock 2 Mask; 3226 MTIE/TDEV Screen with Tool Bar Details; 33
27 View Data Series; 3428 Jitter Measurement; 3729 Jitter Tolerance Testing; 38
30 Tolerance Test in Progress Screen; 3931 Wander Measurement Setups; 40
32 Measuring Jitter; 4233 Clock Wander; 43
34 MTIE/TDEV Plots by MTIE/TDEV Analyzer; 45
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48 Jitter/Wander for the E1 Module
J
Jitter; 41Jitter Generation; 10
Jitter Generation Setup ScreenFREQUENCY; 10PP UI; 10
Jitter Results ScreenBanner; 8
ET; 8FILTER; 8JITTER; 8
LIMIT; 8PEAK +/-; 8
PHASE HIT +/-; 8RMS; 8
RT; 8
Jitter Test Setup Screen+P LIMIT; 7-P LIMIT; 7B1/B2 LIMIT; 7
FILTERHIGHBND; 6
WIDEBND; 6REF CLOCK; 7
RX RATE; 6TEST DURATION; 7THRESHOLD
G.823; 6USER; 7
Jitter Tolerance; 11Jitter Tolerance Test-Table Screen
FREQ (kHz); 12MASK (UI-pp); 12MTJ (UI-pp); 12
Jitter Transfer; 13Jitter Transfer Test-Table Screen
FREQ (kHz); 14MASK (dB); 14
TRANSFER (dB); 14Jitter Transfer Test Screen
10 -20; 13
kHz; 13X; 13
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SSMTT-27M1 49
P
PC MTIE/TDEV AnalyzerAnalysis Procedure; 21
Masks; 23Screen Feature Description; 33
R
ResultsHistogram screen; 9
TTables
01 Maximum Jitter Allowed for 2.048 Mbit/s; 41
V
View Test Records Screen; 15Editing a Label; 16
WWander; 43Wander Result Screen
+TIE Max; 18-TIE Max; 18
MTIE; 18TIE; 18
Wander Test Setup Screen
FILTER; 17REF CLOCK
L2-RX & TTL-L2; 17RX RATE; 17
TEST DURATION; 18Warnings; 2
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8/14/2019 Man-22060-Us003 c00 Ssmtt-27m1 Jitter Mmd
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