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TRANSCRIPT
, *1 .' •• \
CONSULTING ENGINEERS «od PLANNERS
m iif
; HYDROGEOLOCSIC,
fNVE3flGATION
-KEYSTONE SANITARY,
"... r" LANDFILL 1
-_tv--- -,•f '
i a, BUCHART-HORN
Consulting Engineers and Planners
. June 1S&5
lOQS I 2
INTRODUCTION
Thin Keystone Sanitation Company landfill is located in Union
Town 1=1 hip,, fltdama County, Pennsylvania. . An extensive geotechnical
investigation of the arc-!HI at the landfill as wall as adjacent to the
landfill or property owned by Keystone Sanitation Company has been
conducted over the past year. The investigation included an
ex: tens 1 ve geop hys i ca 1 / hydro geo 1 og 1 ca 1 su .r vey, on - si te m app i ng of
geologic structure,, pump testing of selected wells, an«ilysie of pump
test data,, and fracture trace analysis,. The purpose of this
investigation was to thoroughly define the geologic and
hydrogeologic environment in and adjacent to the Keyatone Landfill
in order to control the Limited Volatile Organic Compound (VOC)
contamination,, restrict such contamination to the landfill site, and
remediate the VOC contamination of the groundwater.,
AR I 006 II
GEOLOGY/GEOLOGIC STRUCTURE
The site is underlain by the Karburg Schist of the Winisahickon
Formation., At this locution,, the Marburg Schist is composed of
co in pi ex ly deform ed net amor ph i c ar g i 11 a ceous rocks r a ngi n g in
metsmorphic grade from phyllite to schist., Quartz veins are
abundant. Gently sloping hills and valleys make up the topography
which has been strongly influenced by the geologic structure,
The bedrock structure at the site is highly contorted with evidence
of several episodes of deformation present., It appears to have
strongly influenced! regional erosion, soil development, and both
s u b a i.i r f a c e a n d s u r f a c e h y d r o 1 o g y ,
The predominate structural feature is a slaty cleavage,. Bedrock
exposures have been mapped to provide structural orientation of
fracture and cleavage inf or nation., The cleavage is characterized by
a North SO degrees East strike and a dip of BO degrees South. This
correlates with similar orientation measurements taken at thin
landfill's Cell J excavation. Detailed mapping along roads,, streams
and in numerous test pit excavations indicates that the orientation
of the cleavage is very consist ant throughout the area.. (Sem
Appendix G)
I 0 0 6 I If
F R A C T U R E S A N D C L E A V A G E
Investigation of geologic structure at the site included field
mapping of joints and fracture trace analysis. The majority of the
fracturing occured after the slaty cleavage was developed as
evidenced by filled fractures which intersect the slaty cleavage,.
The excavation of Cell J at the landfill showed iron and manganese
stains on the open joint and cleavage planes. Many of the joints
were filled with quartz or clay. The bedrock exhibits only
s e c o n d a r y p e r m e a b i 1 i t y o r i g i n a t i n g f r o m t h e s t r o n g s 1 a t y c 1 e a v a g e
that is common to this bedrock unit. Fracturing in localized areas
produces additional secondary permeabi 1 ity ,. Fractures and cleavage
were characteristically closed with depth. In this area this depth
was believed to be quite shallow., A geophysical investigation
confirmed this„
Joints were measured by a team of geologists. The poles of the
joint planes have been plotted on stereo nets and concentrations
contoured and displayed in Figures 1 I!. 2., Four major joint sets
h a v e b e e n d e f i n e dl::
Strike Dip.
M20W to N3OW 7SE to 75W
N12W to N02E 75E to 78E
WOW to N18W 16E to 2OE
M62E 20W to SOW
R I 0 0 6 \ 5
JOINT SETS SLATY CLEAVAGEN 2Oe W TO N30°W, 75° E TO 75CW N 65° E , 8O* SNI2eW TO N02°E,75«E TO 78° EN - S TO N 18» W, I6°E TO 2O°EN62°E , 20° W TO 3O*W
SCHMIDT NET-INTERSECTION 212[t- BUCHART-HORN, INC.l>~ — J\ Consulting Engineers * PUnnem
• VOAK. I>A. WASHtVGTOI, 0 C. LFW1SWJWG, M.•ALTTMOW. MO MEMPHIS. TtNN HTW O«.tANS, 1-*. .
WlLLIAMSeUfK; VA. CHAW.ESTON. W VA
KEYSTONE SANITATION CO. LANDFILLUNION TOWNSHIP, ADAMS CO., PA.
POLES TO JOINT PLANES ikLO W
JOB NO.62209
6
JOINT SETS SLATY CLEAVAGEN 2O* W TO N30°W,75°E TO 75° W N65°E , 8O«SNI2eW TO NO2°E,75°E TO 78° EN - S TO N I8» W, 16° E TO 2OeEN62«E , 2O° W TO 3O°W
SCHMIDT NET-INTERSECTION*'IU= BUCHART-HORN, INC.f> — J\ Consulting Engineer! fc PUnnen
VOHK. CA WASHINGTON. D C LEW1S8UAG. PA•ALT1MOW, MO MEMPHIS, TtNh NCW OM-EANS. LA
W«O.IAMS8U«G. VA OUJWSTOW W VA
KEYSTONE SANITATION CO. LANDFILLUNION TOWNSHIP, ADAMS CO., PA.
POLES TO JOINT PLANES -fl<f£f.g Qlg
JOB NO.62209
17
A fracture trace analysis.was.performed in January, 1985 by Buchart-
Horn, Inc. No fracture traces were noted. These results concur with
the previous fracture trace analysis performed by Nassaux-Hemsley in
November, 1977.
Before the concept that tthe slaty cleavage is the principal source
of the secondary permeability characteristics of the bedrock was
used as a basic premise in our investigation, it had to be proven at
the site. A pump test was performed by Buchart-Horn, Inc. in
November 1983 at Monitoring Well No. 1. Three observation wells
had been constructedprior J:o the ttest in order to monitor the
development of the cone of depression.
Analysis of the test data shows that groundwater flow through the
bedrock is, indeed very strongly influenced by the slaty cleavage
which creates a /hydraulic conductivity flow tensor in the
Northeast-Southwest, direction.,, JThe data^also indicates as suspected
that joints and fractures allow groundwater, in localized areas, to
flow in the strike direction of those planes. This effect as a
component of secondary porosity is at a,minimal level when compared
with the influence of.jth slaty cleavage.• .r-
GEOPHYSICAL INVESTIGATION,r./
A geophysical survey was perforined by Buchart-Horn, Inc. in August. .- - *-:- ; • ..j ~-f ._:, --- *-' '' •-'•v-(UJ:*- /- -.'_; . -- ^ - : -- "-.7. ; •- "'"'
1984. The objective was to map the subsurface in the &Bckfii8i6
the landfill site. After a review of existing well drilling logs,
slug tests data, pump tests data, seismic refraction results,
chemical analyses of groundwater and other published and unpublished
literature concerning the site soils and geology, an Earth
Resistivity Survey was choosen as the most effective method to
investigate the subsurface.
METHODS AND PROCEDURE
The Bison Offset Sounding System (BOSS) Model 2365 combined with the
Bison Earth Resistivity Meter Model 235OB were used to peform
Vertical Electrical Soundings <VES). The VES stations were placed
at close intervals so horizontal profiles could also be constructed.
Five different electrode arrays were used with a maximum electrode
spread of 64 meters. The different arrays used to measure
resistance included: Dipole - Dipole, Overlapping Dipole, Modified
Schlumberger, and two different Wenner Arrays. By combining the
results from the different electrode configuration, a clear
understanding of the subsurface was developed. Data was collected,
potted and interpretated.
INTERPRETATION AND RESULTS
A computer program supplied by Bison Instruments, Incorporated
used for resistivity calculations and correlatQ.^n[ Q=g C tKfe data
obtained from the different electrode arrays. A second computer
program, by John Brodeur, Michigan Technological University, 1982,
was used to model the da|a. / Computer modeling allowed for direct
interpretations to be mac^e. .Indirect methods were used to check and
correlate the direct methods of data interpretation.
Vertical Electrical Soundings were resolved by computer modeling.••:"..,/;*:• .. *,£: — f."..1-1 *' "V •- , :-":_^ :-:~ :T-_--. -_t- v •' g,--: • - - . - . • '
Appendix A & I contain resolved models and station locations) The
depth to the water table and to the bottom of the saturated zone
were calculated us£ng the direct^ method of interpretation. Because
of the clarity with Bwhich. fchis .feature can be defined, the saturated
zone is viewed^ as a distinct^ aquifer . The aquifer has electrical
resistivity values that rpnge frqm\ 240 to 280 ohm-meters, while the
aquitard has value_of IppO to 9OOO ohm-meters. This electrical.-. • . \. •- '•-•*• Li- : :: ^ :> -~: -. '- '-- :-v - %-_ -•' , . '
contrast allows,,the subsurface interface between the aquifer and the
aquitard to be plotted. _ .. Elevations of the top and bottom of the
aquifer have been plotted and .contoured in map views. Cross
sections have also been developed to show the top and bottom of the
aquifer. CSee Appendix E)
Pseudosections pf ;the Wenner^pparent resistivity values were used
to create indirect methodsof interpretation. Resistivity values
were plotted directly into cross-section form and contoured. The
plotted depths of the resistivity values are equal to the "a"
spacing of the electrode configuration. This technique was used to
define and check anomalous hydrologic and geologic features such as:
suspected perched waiter table zones, thickened^ and 8i'nQJlSa%£kf er.
variable thickness of the unsaturated zone above the water table,
soil depth and changes in geology. (See Appendix F)
HYDROGEOLOGY
On a regional scale, the site can perhaps be considered isotropic
and homogenous in nature. This assumption is only feasible because
the anisotropic nature of the slaty cleavage tends to be canceled
out by the fracturing of the bedrock and metamorphic activity which
has occurred on a large scale. On the localized scale, the site
becomes very anisotropic as evidenced by the pump test peformed in
November, 1983. The combination of metamorphic grades found at the
site and the presence of quartz veins and differential weathering
creates heterogeneous conditions in the vicinity of the site.
The majority of the groundwater flow is either in the North 60 East
or South 6O West direction due to a hydraulic conductivity flow
tensor created by the slaty cleavage. Drainage expressions in the
topography are in direct corelation with either joint sets or slaty
cleavage. The groundwater flow direction has been mapped using
geophysics, topography, measurements from monitoring and observation
wells, and discharge zones. Due to fracturing, groundwater flow
directions may be contrary to the principal direction of anisotropy.
This occurs in several locations near the site where fracture
density in the bedrock allows the subsurface flow environment to
become more isotropic. This phenomenon occurs in the diaegtipns of«nl00621
the principal joint sets discussed earlier. It is important to
realize that the direction of groundwater flow is not necessarily
perpendicular to the^grqundwater^contours (Cherry and Freeze, P. 36,i «*»—?'- ' '-" --" " i°-'-!-- - •' —_-__-'_•_--^-" il" "- ~" ' '~- " ' '
1979). In an anisotropic environment, the groundwater flow
direction may at times bf^parallel to the water table contour line.
Groundwater flow divides at the site are influenced by topography
(gravity), slaty cleavage, principal joint sets, .and recharge.
Groundwater flow divides are not necessarily located on topographic
highs because the, groundwater tends to follow the path of least
resistance. Due to the ajiisptrppic nature of the site, groundwater
divides commonly occur where the groundwater flow direction is
parallel to the water table contour line. Several such divides occur
near the site. (See Appendix H). :-•-. -.< •*'_-..;_ T*% :- - M ,•-; . ...V I -_-.-.. '-!• -. •-:- -1 -"
Where groundwater flows coin verge, to form springs and streams at the
surface, the flow direction of the_groundwater is upward. This is
due in part to the hydraulic head frpm the recharge areas, the
anisotropic nature of the subsurface and the limited thickness of
the aquifer. Once .the grpundwatei\ has^reachfd the surface, it is
then free to flow perpendicular to the slaty cleavage and is not
constrained by the anisj>,trppic nature of the subsurface.
Perched water tables^ were delineated during geophysical/-: .,;;-,--' • - 'y i-- v --i--:- « .Ttse1--''^--"'--•-----••• - **- ' "^ "- - '
investigation. A review of, the soils map indicated soils which »ay
be susceptable to fragipan layers and development of perched water
tables. The perched systems are^ conjoined within the yeathered soil'., »i.- •- - - >'* "r--- ""==---'.-- -- - --- - --*- --"- ^
horizon in silts, and clays. This was confirmed w
excavations conducted in May, 1985. Excavations exposed saturated
zones above the aquifer in low lying areas.
Precipitation averaging 42 inches annually is the primary source of
groundwater recharge. Recharge occurs throughout the site, with a
downward flow component at the topographic highs. Due to the fact
that the aquifer is relatively thin, a horizontal component flows
toward the discharge areas. The discharge zones exhibit a vertical
or upward flow component. The anisotropic behavior of the
subsurface, the groundwater flow directions and the slope of the
aquifer base combine to create groundwater flow boundaries at
streams that form discharge areas. Perennial streams in the
vicinity of the site that form discharge areas function as
groundwater flow boundaries.
The fractured bedrock is the main aquifer in the region, with the
fractures closing at depths relatively shallow. The bottom of the
aquifer shows a contorted surface which resembles both the
topographic surface and the surface of the water table. (See
Appendix O From the topographic surface to the bottom of the
aquifer, depths range from 25 to 100 feet. The top of the aquifer
was mapped using information from the geophysical investigation and
confirmed with measurements from monitoring wells and streams and
springs. (See Appendix B)
CONCLUSIONS
The greatest lateral . tent of .potential groundwater contamination
originating frgm/thV.Keystone S.anitation^Cpmpany Landfill is shown
in Figure 3. >hia; site specific conclusion is based on the
following hydrologic and geologic factors:
1. Cleavage and^fracturesplp.se at shallow
2' V"? -^•P-«««t«d fractures present at the site°? 'C'- 9rOUndwter or s<~ve as conduits between £heof, cpncer^ and any deep-seated regional aquifers.
3 are groundwater discharge" s =i_ - -' ,'.-T *- •- • -;- -
5. Groundwater" ftow 'does not by-pass the discharge areas at
Consequently, the potential population that could be affected is
limited to the delineated| area;"shownin^Figure 3, which by actual
count numbers 22 houses or a population of 84 at 3.8 persons per
are
household .
If there is any conflict with the above facts or conclusion, we
requesting formal written r^sponse^shpwing evidence to the contrary.
Based on the ^results pf^ pur _. geotechnical investigation, the
contamination that has been fpyn^d p^ reported outs$c£ |
- ••••' '.- -;."•:-:• fe- -:^'.:'-~" .:':~Jr „. •. -^-; , -. • . y-r
described in this report cannot be originating from Keystone
Sanitary Landfill. Furthermore, the verifiable extent of VOC
contamination is limited to an area in the vicinity of MonitoringPe^vp^eWell No.l and does not appear to p-geviae the entire landfill site.
flRI00625. .
FIGURE 3
LIMITS OF MAXIMUM POTENTIAL GPOUNDWATER IMPACT
|t- l BUCHART-HORN, INC.iV> — Consulting Engineers & Planneni
VOW*. PA WASHINGTON. O C IFW1S8UWG. PABAiTIMOftt. MO MEMPHIS. TENN New O«l.f ASS, LA,
WlUIAWa»U«G VA CHARlfSTOM. W VA
KEYSTONE LANDFILLA R i n n r, ? £
"" ^— —JOB NO.
07-<ii<J9
« -
A P P E N D I X
A VERTICAL ELECTRICAL SOUNDING LOCATIONS
B WATER TABLE MAP
C BOTTOM OF AQUIFER
D SECTION LOCATIONS A - G
E CROSS SECTION A - G, DIRECT METHOD
F PSEUDOSECTIONS A - G, INDIRECT METHOD
G FIELD STRUCTURES
H GROUNDWATER FLOW MAP
I GEOPHYSICAL MODELS
J PUMP TEST DATA
K POPULATION DENSITIES
^D:APPENDIX I
-GEOPHYSICAL. .MODELS
•-•'.' " ,™_ -aa'~- -i-i.:. , ,1... •
I 00628
KEYSTONE SANITATION COMPANYRESULTS OF EARTH RESISTIVITY SURVEY
DIRECT INTERPRETATIONBH #07-62209
STATION TOP OF AQUIFER BOTTOM OF AQUIFER
NUMBER ELEVATION P.IPTH ELEVATION DEPT.H E.LE.VATIQN
6-2 783 41.3 742 57.6 725
6-4 741 26.O 715 43.9 697
7-1 746 12.0 734 3O.2 716
7-2 723 26.3 718 47.9 697
7-3 736 21.1 715 4O.3 696
7-4 723 16.2 707 41.9 681
7-5 716 10.4 706 36.4 68O
7-6 754 28.3 726 47.8 706
7-7 749 25.4 724 47.4 702
8-1 740 21.45 719 41.6 698
8-2 715 15.7 699 28.7 686
8-3 707 10.3 697 24.3 682
9-1 72O 24.5 695 59.9 660
9-2 74O 29.9 710 6O.8 679
9-3 748 27.7 720 56.0 692
9-4 744 20.3 724 58.3 686
9-5 771 35.75 735 58.75 712
9-6 756 21.45 735 50.45 7O5
9-7 754 29.3 725 58.2 696
9-8 740 28.05 712 54.6 685
1O-1 713 9.75 703 36.75 676
ARI00629
KEYSTONE SANITATION COMPANYRESULTS OF gARTH RESISTIVITY SURVEY
DIRECT INTERPRETATIONBH #07-62209(Cont'd.)
STATION , .( TOP OF AQUIFER, , .. ., BOTTOM OF AQUIFER
NUMBER ELEVATION DEPJH ELEVATION DEPTH ELEVATION
15-1 718 12'03 706 . , 37.4 681
15-2 780^ /":/|o:6 : 7 749 56 6 723
15'3 759 ,_ 28.2 /./731 52 . 2 707
6 7167 680
15"6 7°5 .35.8 669
. --...,-,- 40.4 669
74° 23.4 717 55.3 685
- - - 74'3 65221"3 704 .., _-lS-3 688 , .68.3 636
2 -A " . . . . 737 J__ / ...45". 5
3f-6 689
41-3 707
717
. - .
22"5 771 - 31-?":" 740 , '. ^ 52.3
698
699
719
?83 ,,: ^2-3 741 65.4 718
006 30
KEYSTONE SANITATION COMPANYRESULTS OF EARTH RESISTIVITY SURVEY
DIRECT INTERPRETATIONBH #07-62209(Cont'd.>
STATION TOP OF AQUIFER BOTTOM OF AQUIFER
NUMBER ELEVATION DEPTH ELEVATION DEPTH ELEVATION
1O-2 752 3O.2 722 52.2 7OO
1O-3 699 1O.O 689 30.4 669
1O-4 712 12.4 700 25.4 687
1O-5 721 13.6 707 33.0 688
10-6 759 21.1 738 36.7 759
13-1 747 54.3 693 100.4 647
13-2 756 50.0 7O6 92.3 756
13.3 764 42.5 722 67.2 697
13.4 751 32.5 718 61.8 689
13.5 741 45.5 696 65.7 675
13-6 746 31.7 714 47.0 699
13-7 728 21.1 707 36.1 692
13.8 74O 15.6 719 73.1 667
14.1 741 23.1 718 53.0 688
14-2 726 33.0 693 55.0 671
14-3 729 35.8 693 52.6 676
14-4 732 38.0 694 53.6 678
14-5 714 33.47 680 39.7 664
14.6 734 17.9 716 51.7 682
14.7 735 18.8 716 4O.2 695
A R I 0 0 6 3 I
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I
0 0 6 3 2
***************************************************************** **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 7-2COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 160 D( 1 )= .7R( 2 )= 280 D( 2 )= 2.6R( 3 )= 500 D( 3 )= 4.8R( 4 )= 250 D( 4 )= 6.4R( 5 )= 1400 D( 5 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 168.004X( 2 )= 1 P( 2 )= 192.754X( 3 )= 1.5 P( 3 )= 216.895X( 4 )= 2 P( 4 )= 236.527X( 5 )= 3 P( 5 )= 266.765X( 6 )= 4 P( 6 )= 290.574X( 7 )= 6 P( 7 )= 327.251X( 8 )= 8 P( 8 )== 353.844X( 9 •> 12 P( 9 )= 393.345X( LO )= 16 ' P( 10 )= 431.03X( 11 )= 24 P( 11 )= 516.06X( 12 )= 32 P( 12 )= 603.241X( 13 )= 48 P( 13 )= 753.15X( 14 )- 64 P( 14 )= 866.918
ARI00633
X«*•»'
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***************************************************************** , **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 7-4COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 200 D( 1 )= .67R( 2 )= 800 D( 2 )= .6R( 3 )= 400 D( 3 )= 3.4R( 4 )= 260 D( 4 )= 8.3R( 5 )= 1500 D( 5 )= 1E+09
D A T A P R I N T O U T
'A1 SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 223.757X( 2 )- 1 P( 2 )= 288.941X( 3 )= 1.5 P( 3 )= 341.19X( 4 )= 2 P( 4 )= 372.715X( 5 )= 3 P( 5 )= 397.523X( 6 )= 4 P( 6 )= 399.3X( 7 )= 6 P( 7 )= 386.439 jX( 8 )= 8 P( 8 )= 377.098X( 9 )= 12 P( 9 )= 388.894 ,X( 10 )= 16 P( 10 )= 429.525 |X( 11 )= 24 P( 11 )= 537.53X( 12 )= 32 P( 12 )= 641.939X( 13 )= 48 P( 13 )= 809.721 1X( 14 )= 64 P( 14 )= 933.119 J
j
flRI00635
***************************************************************** **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 7-5COMPUTED BY : Greg A. Johnson JOB* : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 225 D( 1 )= .9R( 2 )= 420 D( 2 )= 2.3R( 3 )= 260 D( 3 )= 8R( 4 )= 1550 D( 4 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 231.421X( 2 )= 1 P( 2 )= 256.777X( 3 )= 1.5 P( 3 )= 284.44X( 4 )= 2 P( 4 )= 305.471X( 5 )= 3 P( 5 )= 327.853X( 6 )= 4 P( 6 )= 334.983X( 7 )= 6 P( 7 )= 337.221X( 8 )= 8 P( 8 )= 344.131X( 9 )= 12 P( 9 )= 384.821X( 10 )= 16 P( 10 )= 445.594X( 11 )= 24 P( 11 )= 574.671X( 12 )= 32 P( 12 )= 688.525X( 13 )= 48 P( 13 )= 865.041X( 14 )- 64 P( 14 )= 992.584
AR100637
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***************************************************************** **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION: 8-1COMPUTED BY : Gregory A. Johnson JOB* : BH 07-62209CHECKED BY: MYRON H BERRY ON: APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )s 160 D( 1 )= .72R( 2 )= 280 D( 2 )= 2.1R( 3 )= 400 D( 3 )= 3.78R( 4 )= 240 D( 4 )= 6.2R( 5 )= 1500 D( 5 )= 1E+09
A1 SPACING APPARENT RESISTIVITY OHM-M
*( 1 >= -5 p( 1 )= 167.478*( 2 )= 1 p( 2 )= 191.406*< 3 )= 1.5 p( 3 )= 215.105*( 4 )= 2 p( 4 )= 234.132x( 5 )= 3 p( 5 )= 261.807x( 6 )= 4 p( 6 )= 281.503x( 7 )= 6 p( 7 )= 308.817*( 8 )- 8 p( 8 )= 328.709*< 9 )= 12 p( 9 )= 367.113x( 10 )= 16 p( 10 )= 413.249x< 11 >s 24 p( n )= 517.931*( 12 )= 32 p( 12 )= 618.607*< 13 )= 48 p( 13 )= 783.717x( 14 )= 64 p( 14 )= 907.139
AR100639 J
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***************************************************************** **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 9-3COMPUTED BY : Gregory A. Johnson JOB* : BH 07-26609CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 210 D( 1 )= .64R( 2 )= 480 D( 2 )= .98R( 3 )= 820 D( 3 )= 7.2R( 4 )= 280 D( 4 )= 10.8R( 5 )= 1400 D( 5 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 229.804X( 2 )•= 1 P( 2 )= 289.704X( 3 )= 1.5 P( 3 )= 350.302X( 4 )= 2 P( 4 )= 402.369X( 5 )= 3 P( 5 )= 482.595X( 6 )= 4 P( 6 )= 537.755X( 7 )= 6 P( 7 )= 597.929X( 8 )«= 8 P( 8 )= 617.977X( 9 )= 12 P( 9 )= 607.169X( 10 )= 16 P( 10 )= 584.033X( 11 )= 24 P( 11 )= 577.889X( 12 )= 32 P( 12 )= 618.575X( 13 )= 48 P( 13 )= 738.182X( 14 )- 64 P( 14 )= 846.431
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JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 9-5COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 240 D( 1 )= .4R( 2 )= 130 D( 2 )= .5R( 3 )= 280 D( 3 )= 2.7R( 4 )= 760 D( 4 )= 7.4R( 5 )= 270 D( 5 )= 7R( 6 )= 2300 D( 6 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 209.559X( 2 )= 1 P( 2 )= 192.169X( 3 )= 1.5 P( 3 )= 204.735X( 4 )= 2 P( 4 )= 224.076X( 5 )= 3 P( 5 )= 262.373X( 6 )= 4 P( 6 )= 297.391X( 7 )= 6 P( 7 )= 358.199X( 8 )= 8 P( 8 )= 406.65X( 9 )= 12 P( 9 )= 474.999X( 10 )= 16 P( 10 )= 523.689X( 11 )= 24 P( 11 )= 611.407X( 12 )= 32 P( 12 )= 705.373X( 13 )= 48 P( 13 )= 895.934X( 14 )= 64 P( 14 )= 1065.18
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***************************************************************** **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** **
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 9-6COMPUTED BY : Gregory A. Johnson . JOB* : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 180 D( 1 )= 1.6R( 2 )= 900 D( 2 )= 5R( 3 )= 270 D( 3 )= 912R( 4 )= 1300 D( 4 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 181.829X( 2 )= 1 P( 2 )= 196.424X( 3 )= 1.5 P( 3 )= 223.908X( 4 )= 2 P( 4 )= 257.774X( 5 )= 3 P( 5 )= 325.25X( 6 )= 4 P( 6 )= 380.84X( 7 )= 6 P( 7 )= 453.961X( 8 )= 8 P( 8 )= 491.547X( 9 )= 12 P( 9 )= 516.973X( 10 )= 16 P( 10 )= 525.309X( 11 )= 24 P( 11 )= 559.693X( 12 )- 32 P( 12 )= 617.702X( 13 )= 48 P( 13 )= 741.909X( 14 )= 64 P( 14 ) = 843.335
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JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 9-7COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY -THICKNESS
R( 1 )= 150 D( 1 )= .5R( 2 )= 320 D( 2 )= 2.3R( 3 )= 720 D( 3 )= 6.2R( 4 )= 280 D( 4 )= 8.9R( 5 )= 1500 D( 5 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 171.58X( 2 )= 1 P( 2 )= 216.542X( 3 )= 1.5 P( 3 )= 252.106X( 4 )= 2 P( 4 )= 280.126X( 5 )= 3 P( 5 )= 325.851X( 6 )= 4 P( 6 )= 364X( 7 )= 6 P( 7 )= 421.696X( 8 )= 8 P( 8 )= 458.591X( 9 )= 12 P( 9 )= 495.82X( 10 )= 16 P( 10 )= 516.212X( 11 )= 24 P( 11 )= 564.589X( 12 )= 32 P( 12 )= 630.559X( 13 )= 48 P( 13 )= 769.741X( 14 )= 64 P( 14 )= 887.298
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JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 10-2COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 170 D( 1 )= .85R( 2 )= 400 D( 2 )= .55R( 3 )= 920 D( 3 )= 7.9R( 4 )= 240 D( 4 )= 6.7R( 5 )= 1100 D( 5 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 179.223X( 2 )= 1 P( 2 )= 220.059X( 3 )= 1.5 P( 3 )= 273.877X( 4 )= 2 P( 4 )= 326.815X( 5 )= 3 P( 5 )= 416.698X( 6 )= 4 P( 6 )= 484.653X( 7 )= 6 P( 7 )= 571.637X( 8 )= 8 P( 8 )= 616.083X( 9 )= 12 P( 9 )= 640.519X( 10 )= 16 P( 10 )= 634.786X( 11 )= 24 P( 11 )= 631.042X( 12 )= 32 P( 12 )= 657.123X( 13 )= 48 P( 13 )= 739.841X( 14 )= 64 P( 14 )= 813.933
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***************************************************************** **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 10-3COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 240 D( 1 )= .55R( 2 )= 320 D( 2 )= 2.4R( 3 )= 240 D( 3 )= 6.3R( 4 )= 4300 D( 4 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 250.612X( 2 )= 1 P( 2 )= 272.822X( 3 )= 1.5 P( 3 )= 286.793X( 4 )= 2 P( 4 )= 293.572X( 5 )= 3 P( 5 )= 297.442X( 6 )= 4 P( 6 )= 298.759X( 7 )= 6 P( 7 )= 310.971X( 8 )= 8 P( 8 )= 340.385X( 9 )= 12 P( 9 )= 433.272X( 10 )= 16 P( 10 )= 543.729X( 11 )= 24 P( 11 )= 765.027X( 12 )= 32 P( 12 )= 969.117X( 13 )= 48 p( 13 )= 1324.96X( 14 )= 64 P( 14 )= 1624.33
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JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 13-1COMPUTED BY : Greg A. Johnson JOB* : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
" S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 135 D( 1 )= .5R( 2 )= 190 D( 2 )= .5R( 3 )= 420 D( 3 )= 2.5R( 4 )= 980 D( 4 ) = 1.1R( 5 )= 1800 D( 5 )= 12.1R( 6 )= 240 D( 6 )= 14.2R( 7 )= 1100 D( 7 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 147.529X( 2 )= 1 P( 2 ) = 183.29X( 3 )= 1.5 P( 3 )= 222.123X( 4 )= 2 P( 4 )= 258.876X( 5 )= 3 P( 5 )= 326.077X( 6 )= 4 P( 6 ) = 388.303X( 7 )= 6 P( 7 )= 502.028X( 8 )= 8 P( 8 )= 599.158X( 9 )= 12 P( 9 )= 740.404X( 10 )= 16 P( 10 )= 822.375X( 11 )= 24 P( 11 ) = 874.684X( 12 )= 32 P( 12 )= 857.072X( 13 )= 48 P( 13 )= 792.697X( 14 )<= 64 P( 14 )= 765.484
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********************************************* **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 13-3COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 190 D( 1 )= .72R( 2 )= 330 D( 2 )= 1.25R( 3 )= 1000 D( 3 )= 3R( 4 )= 1900 D( 4 )= 8.1R( 5 )= 270 D( 5 )= 7.6R( 6 )~ 1900 D( 6 )= 1E+09
D A T A P R I N T O U T
'A1 SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 199.405X( 2 )= 1 P( 2 )= 234.194X( 3 )= 1.5 P( 3 )= 277.157X( 4 )= 2 P( 4 )= 321.447X( 5 )= 3 P( 5 )= 408.236X( 6 )= 4 P( 6 )= 488.559X( 7 )= 6 P( 7 )= 624.391X( 8 )= 8 P( 8 )= 728.899X( 9 )= 12 P( 9 )= 864.232X( 10 )= 16 P( 10 )= 932.818X( 11 )= 24 P( 11 )= 977.526X( 12 )= 32 P( 12 )= 992.565X( 13 )= 48 P( 13 )= 1053X( 14 )= 64 P( 14 )= 1146.06
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***************************************************************** **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 13-5COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 80 D( 1 )= .5R( 2 )= 200 D( 2 )= .9R( 3 )= 530 D( 3 )= 5.6R( 4 )= 1900 D( 4 )= 7R( 5 )= 260 D( 5 )= 6.2R( 6 )= 1900 D( 6 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 94.7292X( 2 )= 1 P( 2 )= 130.391X( 3 )= 1.5 P( 3 )= 165.099X( 4 )= 2 PC 4 )= 196.844X( 5 )= 3 P( 5 )= 252.712X( 6 )= 4 P( 6 )= 300.629X( 7 )= 6 P( 7 )= 380.922X( 8 )= 8 P( 8 )= 448.291X( 9 )= 12 P( 9 )= 557.212X( 10 )= 16 P( 10 )= 639.114X( 11 )= 24 PC 11 )= 750.317X( 12 )= 32 P( 12 )= 827.883X( 13 )= 48 PC 13 )= 956.19X( 14 )= 64 P( 14 )= 1072.08
AR100657
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***************************************************************** **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 13-6COMPUTED BY : Greg A. Johnson JOB* : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 100 DC 1 )= -69R( 2 )= 230 D( 2 )= .86R( 3 )= 1200 DC 3 )= 8.2R( 4 )= 290 D( 4 )= 4.7R( 5 )- 2000 DC 5 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
XC 1 )= .5 PC 1 )- 108.751X( 2 )= 1 ' P( 2 )= 141.609X( 3 )= 1.5 PC 3 )= 182.968X( 4 )= 2 PC 4 )= 225.405XC 5 )= 3 PC 5 )= 305.351X( 6 )= 4 PC 6 )= 375.316X( 7 )= 6 PC 7 )= 486.702XC 8 )= 8 PC 8 )= 568.537X( 9 )= 12 - PC 9 )= 676.49X( 10 )= 16 PC 10 )= 745.276X( 11 )= 24 PC 11 )= 847.244X( 12 )= 32 P( 12 )= 942.02X( 13 )= 48 PC 13 )= 1121.37X( 14 )= 64 PC 14 )= 1270.88
ARI00659
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***************************************************************** **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** **********************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 13-7COMPUTED BY : Greg A. Johnson JOB* : BH 07-62209CHECKED BY: Myron H. Berry ON CDATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 260 DC 1 )= .6R( 2 )= 370 . D( 2 )= .9R( 3 )= 560 D( 3 )= 2.6R( 4 )= 850 D( 4 )= 2.4R( 5 )= 280 D( 5 )= 4.6R( 6 )= 1100 D( 6 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 272.813XC 2 )= 1 P( 2 )= 309.575XC 3 )= 1.5 PC 3 )= 346.461X( 4 )= 2 PC 4 )= 378.591X( 5 )= 3 PC 5 )= 428.804XC 6 )= 4 PC 6 )= 464.395X( 7 )= 6 PC 7 )= 507.329X( 8 )= 8 P( 8 )= 529.23X( 9 )= 12 PC 9 )= 555.79XC 10 )= 16 PC 10 )= 586.231XC 11 )= 24 PC 11 )= 662.373XC 12 )= 32 PC 12 )= 735.525XC 13 )- 48 PC 13 )= 843.491XC 14 )= 64 PC 14 )= 911.556
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*** -.A-************************************************************ **** D C - R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 13-8COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON CDATE) : APRIL 1985
S U M M A R Y . O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 140 DC 1 )= .61R( 2 )= 250 D( 2 )= .9R( 3 )= 190 DC 3 )= 1.4R( 4 )= 320 DC 4 )= 3.4R( 5 )= 240 DC 5 )= 16R( 6 )= 1200 D( 6 )= 1E+09 ^
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 149.681X( 2 )= 1 P( 2 )= 173.156X( 3 )= 1.5 P( 3 )= 190.874X( 4 )= 2 P( 4 )= 202.326X( 5 )= 3 P( 5 )= 216.739X( 6 )= 4 P( 6 )= 227.2X( 7 )= 6 P( 7 )= 242.828X( 8 )= 8 P( 8 )= 253.327X( 9 )= 12 P( 9 )= 267.947X( 10 )= 16 P( 10 )= 283.327X( 11 )= 24 P( 11 )= 326.237X( 12 )= 32 P( 12 )= 378.884X( 13 )= 48 P( 13 )= 484.285X( 14 )= 64 P( 14 )= 575.002
AR100663
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** **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** **
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 14-2COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 120 D( 1 )= .64R( 2 )= 300 D( 2 )= 1.66R( 3 )= 150 D( 3 )= 2.1R( 4 )= 500 D( 4 )= 5.65R( 5 )= 260 D( 5 )= 6.9R( 6 )= 1000 D( 6 )= 1E+09
D A T A P R I N T O U T
'A1 SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 PC 1 )= 131.803X( 2 )= 1 PC 2 )= 163.506X( 3 )= 1.5 P( 3 )= 189.339X( 4 )= 2 P( 4 )= 206.137X( 5 )= 3 P( 5 )= 223.69X( 6 )= 4 PC 6 )= 233.298X( 7 )= 6 P( 7 )= 251.698XC 8 )*= 8 P( 8 )= 273.02X( 9 )= 12 P( 9 )= 314.486X( 10 )= 16 P( 10 )= 350.59X( 11 )= 24 P( 11 )= 415.254X( 12 )= 32 P( 12 )= 475.098X( 13 )= 48 P( 13 )= 577.303X( 14 )= 64 P( 14 )= 655.358
ARI00665
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*********************************** ****************************** **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 14-5COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 100 D( 1 )= .46R( 2 )= 1200 D( 2 )= .24R( 3 )= 120 DC 3 )= 1.3R( 4 )= 800 D( 4 )= 8.3R( 5 )= 240 D( 5 )= 5R( 6 )= 5500 DC 6 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= -.5 PC 1 )= 135.196XC 2 )= 1 PC 2 )= 189.883XC 3 )= 1.5 PC 3 )= 218.61X( 4 )= 2 PC 4 )= 233.952X( 5 )= 3 PC 5 )= 257.213XC 6 )= 4 PC 6 )= 284.301X( 7 )= 6 PC 7 )= 344.584X( 8 )= 8 PC 8 )= 399.705X( 9 )= 12 PC 9 )= 486.948X( 10 )= 16 PC 10 )= 558.189X( 11 )= 24 PC 11 )= 697.097X( 12 )= 32 P( 12 )= 846.362X( 13 )= 48 P( 13 )= 1153.25X( 14 )= 64 P( 14 )= 1442.15
ARI00667
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***** ************************************************************ **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 14-6COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON CDATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 130 D( 1 )= .62R( 2 )= 200 D( 2 )= 2.2R( 3 )= 730 D( 3 )= 2.7R( 4 )= 240 D( 4 )= 10.4R( 5 )= 1100 D( 5 )= 1E+09
D A T A P R I N T O U T
'A1 SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 136.775X( 2 )= 1 PC 2 )= 155.714X( 3 )= 1.5 P( 3 )= 174.504X( 4 )= 2 P( 4 )= 191.665X( 5 )= 3 P( 5 )= 223.483X( 6 )- 4 P( 6 )= 251.853X( 7 )= 6 P( 7 )= 294.389X( 8 )= 8 P( 8 )= 320.336X( 9 )= 12 PC 9 )= 347.798X( 10 )= 16 P( 10 )= 368.438X( 11 )= 24 P( 11 )= 420.416X( 12 )= 32 P( 12 )= 481.201X( 13 )= 48 P( 13 )= 593.782X( 14 )= 64 P( 14 )= 681.939
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** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** **
JOB DESCRIPTION : Keystone ' DATE : JAN 1985STATION: 15-1COMPUTED BY : Gregory A. Johnson JOB# : BH 07-62209CHECKED BY: MYRON H BERRY ON: APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
RC 1 )= 180 DC 1 )= .66RC 2 )- 450 DC 2 )= 3.04RC 3 )- 260 DC 3 )= 7.8RC 4 )= 1200 DC 4 )= 1E+09
A1 SPACING APPARENT RESISTIVITY OHM-M
x( 1 )= .5 p( 1 )= 196.634x( 2 )= 1 p( 2 )= 244.508x( 3 )- 1.5 p( 3 )= 286.746x( 4 )= 2 p( 4 )= 316.214x( 5 )= 3 p( 5 )= 347.768x( 6 )= 4 p( 6 )= 359.153x( 7 )= 6 p( 7 )= 361.223xC 8 )= 8 pC 8 )= 361.764xC 9 )= 12 pC 9 )= 385.471xC 10 )= 16 PC 10 )= 430.698xC 11 )- 24 pC 11 )= 534.243xC 12 )= 32 pC 12 )= 625.976xC 13 )= 48 pC 13 )= 763.073xC 14 )- 64 PC 14 )- 856.94
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***************************************************************** **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *********************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 15-2COMPUTED BY : Greg A. Johnson JOB* : BH 07-62209CHECKED BY: Myron H. Berry ON CDATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
RC 1 )= 650 DC 1 )= 1.3RC 2 )= 1500 DC 2 )= 3R( 3 )= 650 DC 3 )= 5.1RC 4 )= 240 DC 4 )= 8R( 5 )= 7000 DC 5 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
XC 1 )= .5 PC 1 )= 658.015XC 2 )= 1 PC 2 )= 705.87XC 3 )= 1.5 PC 3 )= 778.668XC 4 )= 2 PC 4 )= 850.935XC 5 )= 3 PC 5 )= 953.501XC 6 )= 4 PC 6 )= 997.062XC 7 )= 6 PC 7 )= 976.691XC 8 )= 8 PC 8 )= 900.312XC 9 )= 12 PC 9 )= 754.485XC 10 )= 16 PC 10 )= 686.33XC 11 )- 24 PC 11 )= 730.509XC 12 )= 32 PC 12 )= 877.892XC 13 )= 48 PC 13 )= 1223.77X( 14 )= 64 PC 14 )= 1551.22
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***************************************************************** **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 15-5COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON CDATE) : APRIL 1985
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S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 86 DC 1 )= .6R( 2 )= 220 DC 2 )= .4RC 3 )= 110 DC 3 )= 1.9RC 4 )= 500 D( 4 )= 3.5RC 5 )- 260 DC 5 )= 5.5RC 6 )= 1000 DC 6 )= lE-t-09
D A T A P R I N T O U T
'A1 SPACING APPARENT RESISTIVITY OHM-M
XC 1 )= .5 P( 1 )= 94.2669XC 2 )= 1 PC 2 )= 111.909X( 3 )= 1.5 P( 3 )= 123.988XC 4 )= 2 PC 4 )= 132.602XC 5 )= 3 P( 5 )= 149.174XC 6 )= 4 PC 6 )= 167.905XC 7 )= 6 PC 7 )= 206.047XC 8 )= 8 PC 8 )= 239.706XC 9 )= 12 PC 9 )= 295.064XC 10 )= 16 PC 10 )= 342.614XC 11 )= 24 PC 11 )= 427.032XC 12 )= 32 PC 12 )= 499.281XC 13 )= 48 PC 13 )= 610.894XC 14 )= 64 PC 14 )= 689.922
&R100675
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** **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** ********************l/Ht**********
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 15-7COMPUTED BY : Greg A. Johnson JOB* : BH 07-62209CHECKED BY: Myron H. Berry ON CDATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 130 D( 1 )= .8RC 2 )= 320 D( 2 )= .4RC 3 )= 110 DC 3 )= 1.7RC 4 )= 1000 DC 4 )= 4.6RC 5 )= 280 DC 5 )= 4.9RC 6 )= 4000 D( 6 )= 1E+09
D A T A P R I N T O U T
'A1 SPACING APPARENT RESISTIVITY OHM-M
XC 1 )= .5 PC 1 )= 134.914XC 2 )= 1 PC 2 )= 148.446XC 3 )= 1.5 PC 3 )= 159.411X( 4 )= 2 PC 4 )= 167.765XC 5 )= 3 PC 5 )= 186.766XC 6 )= 4 P( 6 )= 212.163XC 7 )= 6 PC 7 )= 269.909XC 8 )= 8 PC 8 )= 324.545XC 9 )= 12 PC 9 )= 418.181XC 10 )= 16 PC 10 )= 501.331XC 11 )= 24 PC 11 )= 661.82XC 12 )= 32 P( 12 )= 819.798XC 13 )= 48 PC 13 )= 1114.55XC 14 )= 64 PC 14 )= 1372.87
AR100677
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** **** DC R E S I S T I V I T Y V E R T I C A L **** E L E C T R I C A L S O U N D I N G P R O G R A M **** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *********************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 21-1COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON CDATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
RC 1 )= 170 DC 1 )= .51RC 2 )= 800 DC 2 )= 6.7RC 3 )= 280 DC 3 )= 9.8RC 4 )= 1400 DC 4 )= 1E+09
D A T A P R I N T O U T
'A1 SPACING APPARENT RESISTIVITY OHM-M
XC 1 )= -5 PC 1 )= 214.767X( 2 )= 1 P( 2 )= 316.774XC 3 )= 1.5 PC 3 )= 401.847X( 4 )= 2 PC 4 )= 465.986X( 5 )= 3 PC 5 )= 550.621XC 6 )= 4 PC 6 )= 598.127XC 7 )= 6 PC 7 )= 633.152XC 8 )= 8 PC 8 )= 628.727X( 9 )= 12 PC 9 )= 588.924XC 10 )= 16 PC 10 )= 562.158X( 11 )= 24 PC 11 )= 578.504XC 12 )= 32 PC 12 )= 641.576XC 13 )= 48 PC 13 )= 780.848XC 14 )= 64 PC 14 )= 892.485
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** **** DC R E S I S T I V I T Y V E R T I C A L **** E L E C T R I C A L S O U N D I N G P R O G R A M **** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** **
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 21-2COMPUTED BY : Greg A. Johnson JOB* : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 200 D( 1 )= .6R( 2 )= 500 D( 2 )= 3.4RO )= 1500 D( 3 )= 4.1R( 4 )= 270 D( 4 )= 14.8R( 5 )= 1200 D( 5 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 223.183X( 2 )= 1 P( 2 )= 283.94X( 3 )= 1.5 P( 3 )= 337.571X( 4 )= 2 P( 4 )= 379.776X( 5 )= 3 P( 5 )= 443.928X( 6 )*= 4 P( 6 )= 494.061X( 7 )= 6 P( 7 )= 568.294X( 8 )= 8 P( 8 )= 612.268X( 9 )= 12 P( 9 )= 634.501X( 10 )= 16 P( 10 )= 614.859X( 11 )= 24 P( 11 )= 569.52X( 12 )= 32 P( 12 )= 562.915X( 13 )= 48 P( 13 )= 622.366X( 14 )= 64 P( 14 )= 702.537
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** DC R E S I S T I V I T Y V E R T I C A L **** E L E C T R I C A L S O U N D I N G P R O G R A M **** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *******************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 21-3COMPUTED BY : Greg A. Johnson JOB* : BH 07-62209CHECKED BY: .Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 280 D( 1 )= .6R( 2 )= 520 D( 2 )= .3R( 3 )= 240 D( 3 )= 1.7R( 4 )= 440 D( 4 )= 2.4R( 5 )= 250 D( 5 )= 16R( 6 )*= 6000 D( 6 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 292.413X( 2 )= 1 P( 2 )= 308.624X( 3 )= 1.5 P( 3 )= 309.103X( 4 )- 2 P( 4 )= 305.004X( 5 )= 3 P( 5 )= 301.899X( 6 )= 4 P( 6 )= 304.823X( 7 )= 6 P( 7 )= 310.927X( 8 )= 8 P( 8 )= 312.772X( 9 )- 12 P( 9 )= 318.464X( 10 )= 16 P( 10 )= 338.406
X( 11 )= 24 P( 11 )= 415.687X( 12 )- 32 P( 12 )= 517.379X( 13 )= 48 p( 13 ) = 734.379X( 14 )= 64 P( 14 )= 943.583
ARI00683
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**x*******c ******************************************************* **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 21-5COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 310 D( 1 )= .45R( 2 )= 390 D( 2 )= 2.35R( 3 )= 780 D( 3 )= 5.3R( 4 )= 280 D( 4 )= 4.6R( 5 )= 1700 D( 5 )= 1E+09
D A T A P R I N T O U T
'A1 SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 326.496X( 2 )= 1 P( 2 )= 355.279X( 3 )= 1.5 P( 3 )= 377.113X( 4 )= 2 P( 4 )= 396.168X( 5 )= 3 P( 5 )= 433.126X( 6 )= 4 P( 6 )= 467.842X( 7 )= 6 P( 7 )= 522.389X( 8 )= 8 P( 8 )= 557.992X( 9 > 12 P( 9 )= 604.056X( 10 )= 16 P( 10 )= 648.455X( 11 )= 24 P( 11 )= 756.004X( 12 )= 32 P( 12 )= 867.49X( 13 )= 48 P( 13 )= 1052.66X( 14 )= 64 P( 14 )= 1185.74
ARI00685
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***************************************************************** **** DC R E S I S T I V I T Y V E R T I C A L **** E L E C T R I C A L S O U N D I N G P R O G R A M **** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 21-6COMPUTED BY : Greg A. Johnson JOB* : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 280 DC 1 )= .5R( 2 )= 460 D( 2 )= 2.55R( 3 )= 940 D( 3 )= 5R( 4 )= 270 D( 4 )= 6R( 5 )= 1800 D( 5 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 306.409X( 2 )= 1 P( 2 )= 359.391X( 3 )= 1.5 P( 3 )= 399.11X( 4 )= 2 P( 4 )= 429.193XC 5 )= 3 P( 5 )= 477.213XC 6 )= 4 P( 6 )= 516.831X( 7 )= 6 P( 7 )= 574.23X( 8 )- 8 P( 8 )= 606.49X( 9 )= 12 P( 9 )= 633.682X( 10 )= 16 P( 10 )= 655.02X( 11 )= 24 P( 11 )= 730.438X( 12 )= 32 P( 12 )= 829.609X( 13 )= 48 P( 13 )= 1016.42X( 14 )= 64 P( 14 )= 1160.63
ARI00687
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***************************************************************** **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 22-1COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 180 D( 1 )= .9R( 2 )= 210 DC 2 )= 2.6RC 3 )= 450 DC 3 )= 2RC 4 )= 260 DC 4 )= 7.3RC 5 )= 1600 DC 5 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
XC 1 )= .5 PC 1 )= 181.318XC 2 )= 1 PC 2 )= 186.999X( 3 )= 1.5 PC 3 )= 194.598XC 4 )= 2 PC 4 )= 202.441X( 5 )= 3 PC 5 )= 218.067XC 6 )= 4 PC 6 )= 233.553XC 7 )= 6 P( 7 )= 262.261XC 8 )= 8 P( 8 )= 287.777XC 9 )= 12 PC 9 )= 337.393XC 10 )= 16 P( 10 )= 390.926XC 11 )= 24 PC 11 )= 502.797XC 12 )= 32 PC 12 )= 607.305XC 13 )= 48 PC 13 )= 779.598XC 14 )= 64 PC 14 )= 910.954
ARI00689
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***************************************************************** **** DC R E S I S T I V I T Y V E R T I C A L **** E L E C T R I C A L S O U N D I N G P R O G R A M **** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** ************************************** * * * A ***********************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 22-2COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 160 DC 1 )= 1.2RC 2 )= 210 D( 2 )= 1RC 3 )= 400 DC 3 )= 4.8RC 4 )= 250 D( 4 )= 5.7RC 5 )= 3000 DC 5 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 PC 1 )= 161.078XC 2 )= 1 PC 2 )= 168.267XC 3 )= 1.5 PC 3 )= 180.806XC 4 )= 2 PC 4 )= 195.695XC 5 )= 3 PC 5 )= 225.53XC 6 )= 4 PC 6 )= 251.45XC 7 )= 6 PC 7 )= 291.428XC 8 )= 8 PC 8 )= 322.518XC 9 )= 12 PC 9 )= 380.958XC 10 )= 16 PC 10 )= 446.378X( 11 )= 24 PC 11 )= 591.835XC 12 )= 32 P( 12 )= 736.859X( 13 )= 48 PC 13 )= 995.534X( 14 )= 64 PC 14 )= 1211.8
AR100691
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***************************************************************** **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE :.JAN 1985STATION: 22-3COMPUTED BY : Gregory A. Johnson JOB* : BH 07-62209CHECKED BY: MYRON H BERRY ON: APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
RC 1 )- 215 DC 1 )= 1.2RC 2 )= 360 D( 2 )= .2RC 3 )= 450 DC 3 )= 5.4RC 4 )s 245 DC 4 )= 6.1RC 5 )= 1500 D( 5 )= 1E+09
A1 SPACING APPARENT RESISTIVITY OHM-M
xC 1 )- .5 p( 1 )= 217.732xC 2 )= 1 p( 2 )= 233.443xC 3 )= 1.5 pC 3 )= 257.302x( 4 )= 2 p( 4 )= 281.697xC 5 )= 3 p( 5 )= 320.898xC 6 )= 4 pC 6 )= 346.825xC 7 > 6 p( 7 )= 374.911xC 8 )= 8 PC 8 )*= 389.574xC 9 )= 12 p( 9 )^ 416.897xC 10 )= 16 PC 10 )= 456.664x( 11 )= 24 pC 11 )= 558.242xC 12 )= 32 PC 12 )= 659.912x( 13 )= 48 pC 13 )= 826.708x( 14 )= 64 pC 14 )= 949.494
RR100693
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***************************************************************** **** DC R E S I S T I V I T Y V E R T I C A L **** E L E C T R I C A L S O U N D I N G P R O G R A M **** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 22-4COMPUTED BY : Greg A. Johnson JOB* : BH 07-62209CHECKED BY: Myron H. Berry ON CDATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
RC 1 )= 160 DC 1 )= 1.1RC 2 )= 280 DC 2 )= 1.3RC 3 )= 600 DC 3 )= 5.2RC 4 )=* 240 . DC 4 )= 5.5RC 5 )= ,2600 DC 5 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 PC 1 )= 162.481X( 2 )= 1 PC 2 )= 176.373XC 3 )= 1.5 PC 3 )= 198.045XC 4 )= 2 PC 4 )= 221.843XC 5 )= 3 PC 5 )= 266.888XC 6 )= 4 PC 6 )= 304.826XC 7 )= 6 PC 7 )= 360.881XC 8 )= 8 PC 8 )= 399.3XC 9 )= 12 PC 9 )= 455.989XC 10 )= 16 PC 10 )= 511.566XC 11 )- 24 PC 11 )= 639.698XC 12 )= 32 PC 12 )= 774.658XC 13 )= 48 PC 13 )= 1019.49XC 14 )= 64 PC 14 )= 1220.46
ARI00695
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***************************************************************** **** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 22-5COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 340 DC 1 )= 1.4R( 2 )= 480 D( 2 )= 1.4R( 3 )= 1800 D( 3 )= 6.8R( 4 )= 250 D( 4 )= 6.5R( 5 )= 1400 D( 5 )= 1E+09
D A T A P R I N T O U T
'A' SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 341.691X( 2 )= 1 P( 2 )= 355.42X( 3 )= 1.5 P( 3 )= 383.341X( 4 )= 2 P( 4 )= 420.681X( 5 )= 3 P( 5 )= 507.046XC 6 )= 4 P( 6 )= 592.532X( 7 )= 6 P( 7 )= 731.157XC 8 )= 8 PC 8 )= 821.879XC 9 )= 12 PC 9 )= 900.812XC 10 )= 16 PC 10 )= 908.812XC 11 )= 24 PC 11 )= 880.174X( 12 )= 32 P( 12 )= 874.779XC 13 )= 48 PC 13 )= 933.811X( 14 )= 64 PC 14 )= 1014.07
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** DC R E S I S T I V I T Y V E R T I C A L *** * E L E C T R I C A L S O U N D I N G P R O G R A M * *** **** Program By: J.R. Brodeur - October 1982 **** Modified By: Buchart-Horn, Inc. - August 1984 **** *****************************************************************
JOB DESCRIPTION : Keystone DATE : JAN 1985STATION 22-6COMPUTED BY : Greg A. Johnson JOB# : BH 07-62209CHECKED BY: Myron H. Berry ON (DATE) : APRIL 1985
S U M M A R Y O F I N P U T P A R A M E T E R S
RESISTIVITY THICKNESS
R( 1 )= 1100 D( 1 )= .8R( 2 )= 700 D( 2 )= 2.4R( 3 )= 2250 D( 3 )= 9.8R( 4 )= 270 D( 4 )= 7.1R( 5 )= 2600 D( 5 )= 1E+09
D A T A P R I N T O U T
'A1 SPACING APPARENT RESISTIVITY OHM-M
X( 1 )= .5 P( 1 )= 1070.38X( 2 )= 1 P( 2 )= 978.381X( 3 )= 1.5 P( 3 )= 906.684X( 4 )= 2 P( 4 )= 877.859X( 5 )= 3 P( 5 )= 908.595X( 6 )= 4 P( 6 )= 990.139X( 7 )= 6 P( 7 )= 1160.93X( 8 )= 8 P( 8 )= 1282.76X( 9 )= 12 P( 9 )= 1386.04X( 10 )= 16 P( 10 )= 1380.42X( 11 )= 24 P( 11 )= 1286.77X( 12 )= 32 P( 12 )= 1233.61X( 13 )= 48 P( 13 )<= 1292.65X( 14 )= 64 P( 14 )= 1437.14
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i, ,~'.£ APPENDIX
KEYSTONE SANITATION COMPANYDENSITIES
#07-62209
Adams County, Union Township, Penns_ylvania
Population - 1978 Persons.-- t' -y-!*'." ;- --~ r:T_.-.-l-r--v.-T.-. T-- - .:_ - .-^
^•V .-^Housing - 663 Units
Average Persons/Unit = 2.98
Carroll County, Myers Election District, Maryland- - ..- i- =4^ i-3> =.-^« -•-, i - - -- *- -s-. • • ,r , . „ . .
--•-• 'Population - 4000 Persons
Housing - 1247 Units
Average Persons/Unit = 3.21
Based on 1980 Census Advanced Counts,
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