iso7710 high speed, robust emc reinforced single ...– low emissions • wide-soic (dw-16) and...

36
OUT GND2 GND1 IN VCC2 VCC1 Series Isolation Capacitors Copyright © 2019, Texas Instruments Incorporated Product Folder Order Now Technical Documents Tools & Software Support & Community An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. ISO7710 SLLSER9C – NOVEMBER 2016 – REVISED APRIL 2020 ISO7710 High Speed, Robust EMC Reinforced Single-Channel Digital Isolator 1 1 Features 1100 Mbps data rate Robust isolation barrier: >100-year projected lifetime at 1500 V RMS working voltage Up to 5000 V RMS isolation rating Up to 12.8 kV surge capability ±100 kV/μs typical CMTI Wide supply range: 2.25 V to 5.5 V 2.25 V to 5.5 V Level translation Default output high (ISO7710) and low (ISO7710F) options Wide temperature range: –55°C to 125°C Low power consumption, typical 1.7 mA at 1 Mbps Low propagation delay: 11 ns Typical (5-V Supplies) Robust electromagnetic compatibility (EMC) System-level ESD, EFT, and surge immunity ±8 kV IEC 61000-4-2 contact discharge protection across isolation barrier Low emissions Wide-SOIC (DW-16) and narrow-SOIC (D-8) package options Automotive version available: ISO7710-Q1 Safety-Related Certifications VDE reinforced insulation per DIN VDE V 0884-11:2017-01 UL 1577 component recognition program IEC 60950-1, IEC 62368-1, IEC 61010-1, IEC 60601-1 and GB 4943.1-2011 certifications 2 Applications Industrial automation Motor control Power supplies Solar inverters Medical equipment 3 Description The ISO7710 device is a high-performance, single- channel digital isolator with 5000 V RMS (DW package) and 3000 V RMS (D package) isolation ratings per UL 1577. This device is also certified by VDE, TUV, CSA, and CQC. The ISO7710 device provides high electromagnetic immunity and low emissions at low power consumption, while isolating CMOS or LVCMOS digital I/Os. The isolation channel has a logic input and output buffer separated by a double capacitive silicon dioxide (SiO 2 ) insulation barrier. In the event of input power or signal loss, default output is high for a device without suffix F and low for a device with suffix F. See the Device Functional Modes section for further details. Used in conjunction with isolated power supplies, the device helps prevent noise currents on data buses, such as RS-485, RS-232, and CAN, or other circuits from entering the local ground and interfering with or damaging sensitive circuitry. Through innovative chip design and layout techniques, the electromagnetic compatibility of the ISO7710 device has been significantly enhanced to ease system-level ESD, EFT, surge, and emissions compliance. The ISO7710 device is available in 16-pin SOIC wide-body (DW) and 8-pin SOIC narrow-body (D) packages. Device Information (1) PART NUMBER PACKAGE BODY SIZE (NOM) ISO7710 SOIC (D) 4.90 mm × 3.91 mm SOIC (DW) 10.30 mm × 7.50 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Simplified Schematic

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Page 1: ISO7710 High Speed, Robust EMC Reinforced Single ...– Low emissions • Wide-SOIC (DW-16) and narrow-SOIC (D-8) package options • Automotive version available: ISO7710-Q1 • Safety-Related

OUT

GND2GND1

IN

VCC2VCC1

Series Isolation Capacitors

Copyright © 2019, Texas Instruments Incorporated

Product

Folder

Order

Now

Technical

Documents

Tools &

Software

Support &Community

An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,intellectual property matters and other important disclaimers. PRODUCTION DATA.

ISO7710SLLSER9C –NOVEMBER 2016–REVISED APRIL 2020

ISO7710 High Speed, Robust EMC Reinforced Single-Channel Digital Isolator

1

1 Features1• 100 Mbps data rate• Robust isolation barrier:

– >100-year projected lifetime at 1500 VRMSworking voltage

– Up to 5000 VRMS isolation rating– Up to 12.8 kV surge capability– ±100 kV/μs typical CMTI

• Wide supply range: 2.25 V to 5.5 V• 2.25 V to 5.5 V Level translation• Default output high (ISO7710) and low

(ISO7710F) options• Wide temperature range: –55°C to 125°C• Low power consumption, typical 1.7 mA at

1 Mbps• Low propagation delay: 11 ns Typical

(5-V Supplies)• Robust electromagnetic compatibility (EMC)

– System-level ESD, EFT, and surge immunity– ±8 kV IEC 61000-4-2 contact discharge

protection across isolation barrier– Low emissions

• Wide-SOIC (DW-16) and narrow-SOIC (D-8)package options

• Automotive version available: ISO7710-Q1• Safety-Related Certifications

– VDE reinforced insulation per DIN VDE V0884-11:2017-01

– UL 1577 component recognition program– IEC 60950-1, IEC 62368-1, IEC 61010-1, IEC

60601-1 and GB 4943.1-2011 certifications

2 Applications• Industrial automation• Motor control• Power supplies• Solar inverters• Medical equipment

3 DescriptionThe ISO7710 device is a high-performance, single-channel digital isolator with 5000 VRMS (DW package)and 3000 VRMS (D package) isolation ratings per UL1577. This device is also certified by VDE, TUV,CSA, and CQC.

The ISO7710 device provides high electromagneticimmunity and low emissions at low powerconsumption, while isolating CMOS or LVCMOSdigital I/Os. The isolation channel has a logic inputand output buffer separated by a double capacitivesilicon dioxide (SiO2) insulation barrier. In the event ofinput power or signal loss, default output is high for adevice without suffix F and low for a device with suffixF. See the Device Functional Modes section forfurther details.

Used in conjunction with isolated power supplies, thedevice helps prevent noise currents on data buses,such as RS-485, RS-232, and CAN, or other circuitsfrom entering the local ground and interfering with ordamaging sensitive circuitry. Through innovative chipdesign and layout techniques, the electromagneticcompatibility of the ISO7710 device has beensignificantly enhanced to ease system-level ESD,EFT, surge, and emissions compliance. The ISO7710device is available in 16-pin SOIC wide-body (DW)and 8-pin SOIC narrow-body (D) packages.

Device Information(1)

PART NUMBER PACKAGE BODY SIZE (NOM)

ISO7710SOIC (D) 4.90 mm × 3.91 mm

SOIC (DW) 10.30 mm × 7.50 mm

(1) For all available packages, see the orderable addendum atthe end of the data sheet.

Simplified Schematic

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Table of Contents1 Features .................................................................. 12 Applications ........................................................... 13 Description ............................................................. 14 Revision History..................................................... 25 Pin Configuration and Functions ......................... 46 Specifications......................................................... 5

6.1 Absolute Maximum Ratings ..................................... 56.2 ESD Ratings.............................................................. 56.3 Recommended Operating Conditions....................... 56.4 Thermal Information .................................................. 66.5 Power Ratings........................................................... 66.6 Insulation Specifications .......................................... 76.7 Safety-Related Certifications..................................... 86.8 Safety Limiting Values .............................................. 86.9 Electrical Characteristics—5-V Supply ..................... 96.10 Supply Current Characteristics—5-V Supply .......... 96.11 Electrical Characteristics—3.3-V Supply .............. 106.12 Supply Current Characteristics—3.3-V Supply ..... 106.13 Electrical Characteristics—2.5-V Supply .............. 116.14 Supply Current Characteristics—2.5-V Supply ..... 116.15 Switching Characteristics—5-V Supply................. 126.16 Switching Characteristics—3.3-V Supply.............. 126.17 Switching Characteristics—2.5-V Supply.............. 126.18 Insulation Characteristics Curves ......................... 13

6.19 Typical Characteristics .......................................... 147 Parameter Measurement Information ................ 158 Detailed Description ............................................ 16

8.1 Overview ................................................................. 168.2 Functional Block Diagram ....................................... 168.3 Feature Description................................................. 178.4 Device Functional Modes........................................ 18

9 Application and Implementation ........................ 199.1 Application Information............................................ 199.2 Typical Application .................................................. 19

10 Power Supply Recommendations ..................... 2311 Layout................................................................... 23

11.1 Layout Guidelines ................................................. 2311.2 Layout Example .................................................... 23

12 Device and Documentation Support ................. 2412.1 Documentation Support ........................................ 2412.2 Related Links ........................................................ 2412.3 Receiving Notification of Documentation Updates 2412.4 Community Resources.......................................... 2412.5 Trademarks ........................................................... 2412.6 Electrostatic Discharge Caution............................ 2412.7 Glossary ................................................................ 24

13 Mechanical, Packaging, and OrderableInformation ........................................................... 25

4 Revision HistoryNOTE: Page numbers for previous revisions may differ from page numbers in the current version.

Changes from Revision B (March 2017) to Revision C Page

• Made editorial and cosmetic changes throughout the document .......................................................................................... 1• Changed From: "Isolation Barrier Life: >40 Years" To: " >100-year projected lifetime at 1500 VRMS working voltage"

in Features.............................................................................................................................................................................. 1• Added "Up to 5000 VRMS isolation rating" in Features............................................................................................................ 1• Added "Up to 12.8 kV surge capability" in Features .............................................................................................................. 1• Added "±8 kV IEC 61000-4-2 contact discharge protection across isolation barrier" in Features ......................................... 1• Added "Automotive version available: ISO7710-Q1" in Features .......................................................................................... 1• Changed From: "VDE Reinforced Insulation per DIN V VDE V 0884-10 (VDE V 0884-10):2006-12" To: "VDE

reinforced insulation per DIN VDE V 0884-11:2017-01" in Features ..................................................................................... 1• Combined CSA, CQC, and TUV bullets into a single bullet with standard names in Features ............................................. 1• Deleted "VDE, UL, CSA, and TUV Certifications for DW-16 package complete; all other certifications planned" bullet

in Features.............................................................................................................................................................................. 1• Updated Simplified Schematic to show two isolation capacitors in series instead of a single isolation capacitor ................. 1• Added "Contact discharge per IEC 61000-4-2" specification of ±8000 V in ESD Ratings table ........................................... 5• Changed 'Signaling' rate to 'Data' rate and added table note to Data rate specification in Recommended Operating

Conditions table ..................................................................................................................................................................... 5• Changed VIORM Value for DW-16 package From: "1414 VPK" To: "2121 VPK" in Insulation Specifications table .................. 7• Changed VIOWM value for DW-16 package From: "1000 VRMS" and "1414 VDC" To: "1500 VRMS" and "2121 VDC" in

Insulation Specifications table ............................................................................................................................................... 7• Added 'see Figure 21" to TEST CONDITIONS of VIOWM specification .................................................................................. 7• Changed VIOTM TEST CONDITIONS for 100% production test From: "VTEST = VIOTM" To: "VTEST = 1.2 x VIOTM" in

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3

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Revision History (continued)Insulation Specifications table ............................................................................................................................................... 7

• Changed VIOSM TEST CONDITIONS From: "Test method per IEC 60065" To: "Test method per IEC 62368-1" inInsulation Specifications table ............................................................................................................................................... 7

• Changed qpd TEST CONDITIONS for method b1 test From: "Vini = VIOTM" To: "Vini = 1.2 x VIOTM" in InsulationSpecifications table................................................................................................................................................................. 7

• Corrected ground symbols for "Input (Devices with F suffix)" in Device I/O Schematics .................................................... 18• Fixed Figure 18 INPUT wire connection............................................................................................................................... 20• Added Insulation Lifetime sub-section under Application Curve section.............................................................................. 21• Added 'How to use isolation to improve ESD, EFT, and Surge immunity in industrial systems' to Documentation

Support section..................................................................................................................................................................... 24

Changes from Revision A (December 2016) to Revision B Page

• Added D-8 values for TUV in the Safety-Related Certifications table .................................................................................... 8• Changed the minimum CMTI value from 40 kV/µs to 85 kV/µs in all Electrical Characteristics tables ................................ 9• Changed the Electrostatic Discharge Caution statement .................................................................................................... 24

Changes from Original (November 2016) to Revision A Page

• Changed Feature From: IEC 60950-1, IEC 60601-1 and IEC 61010-1 End Equipment Standards To: IEC 60950-1and IEC 60601-1 End Equipment Standards ......................................................................................................................... 1

• Added Climatic category to the Insulation Specifications ...................................................................................................... 7• Changed the CSA column of Regulatory Information ........................................................................................................... 8• Changed DW package To: (DW-16) in the TUV column of Regulatory Information ............................................................. 8• Changed the tie TYP value From: 1.5 To 1 in Switching Characteristics—5-V Supply ........................................................ 12• Changed the tie TYP value From: 1.5 To 1 in Switching Characteristics—3.3-V Supply ..................................................... 12• Changed the tie TYP value From: 1.5 To 1 in Switching Characteristics—2.5-V Supply ..................................................... 12

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ISO

LA

TIO

N

NC GND298

GND1 NC107

NC NC116

NC NC125

IN OUT134

VCC1 VCC2143

NC NC152

GND1 GND2161

ISO

LA

TIO

N

GND1 GND254

VCC1 OUT63

IN NC72

VCC1 VCC281

4

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5 Pin Configuration and Functions

DW Package16-Pin SOIC

Top View

D Package8-Pin SOICTop View

Pin FunctionsPIN

I/O DESCRIPTIONNAME

NO.

DW D

VCC1 3 1, 3 — Power supply, VCC1

VCC2 14 8 — Power supply, VCC2

GND1 1, 7 4 — Ground connection for VCC1

GND2 9, 16 5 — Ground connection for VCC2

IN 4 2 I Input channel

OUT 13 6 O Output channel

NC 2, 5, 6, 8, 10 ,11,12, 15 7 — Not connect pin; it has no internal connection

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(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratingsonly, which do not imply functional operation of the device at these or any other conditions beyond those indicated under RecommendedOperating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2) All voltage values except differential I/O bus voltages are with respect to the local ground terminal (GND1 or GND2) and are peakvoltage values.

(3) Maximum voltage must not exceed 6 V.

6 Specifications

6.1 Absolute Maximum RatingsSee (1)

MIN MAX UNITVCC1, VCC2 Supply voltage (2) –0.5 6 VV Voltage at IN, OUT –0.5 VCC + 0.5 (3) VIO Output Current –15 15 mATJ Junction temperature 150 °CTstg Storage temperature –65 150 °C

(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.(3) IEC ESD strike is applied across the barrier with all pins on each side tied together creating a two-terminal device.(4) Testing is carried out in air or oil to determine the intrinsic contact discharge capability of the device.

6.2 ESD RatingsVALUE UNIT

VESD Electrostatic discharge

Human body model (HBM), per ANSI/ESDA/JEDEC JS-001, all pins(1) ±6000

VCharged device model (CDM), per JEDEC specification JESD22-C101, all pins (2) ±1500

Contact discharge per IEC 61000-4-2; Isolation barrier withstandtest (3) (4) ±8000

(1) 100 Mbps is the maximum specified data rate, although higher data rates are possible.

6.3 Recommended Operating ConditionsMIN NOM MAX UNIT

VCC1, VCC2 Supply voltage 2.25 5.5 VVCC(UVLO+) UVLO threshold when supply voltage is rising 2 2.25 VVCC(UVLO-) UVLO threshold when supply voltage is falling 1.7 1.8 VVHYS(UVLO) Supply voltage UVLO hysteresis 100 200 mV

IOH High-level output currentVCC2 = 5 V –4

mAVCC2 = 3.3 V –2VCC2 = 2.5 V –1

IOL Low-level output currentVCC2 = 5 V 4

mAVCC2 = 3.3 V 2VCC2 = 2.5 V 1

VIH High-level input voltage 0.7 × VCC1 VCC1 VVIL Low-level input voltage 0 0.3 × VCC1 VDR (1) Data rate 0 100 MbpsTA Ambient temperature –55 25 125 °C

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(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics applicationreport.

6.4 Thermal Information

THERMAL METRIC (1)ISO7710

UNITDW (SOIC) D (SOIC)(16-Pin) (8-Pin)

RθJA Junction-to-ambient thermal resistance 94.4 146.1 °C/WRθJC(top) Junction-to-case(top) thermal resistance 57.3 63.1 °C/WRθJB Junction-to-board thermal resistance 57.1 80.0 °C/WψJT Junction-to-top characterization parameter 40.0 9.6 °C/WψJB Junction-to-board characterization parameter 56.8 79.0 °C/WRθJC(bottom) Junction-to-case(bottom) thermal resistance n/a n/a °C/W

6.5 Power RatingsPARAMETER TEST CONDITIONS MIN TYP MAX UNIT

PD Maximum power dissipation VCC1 = VCC2 = 5.5 V, TJ = 150°C, CL = 15 pF,input a 50 MHz 50% duty cycle square wave 50 mW

PD1 Maximum power dissipation by side-1 VCC1 = VCC2 = 5.5 V, TJ = 150°C, CL = 15 pF,input a 50 MHz 50% duty cycle square wave 12.5 mW

PD2 Maximum power dissipation by side-2 VCC1 = VCC2 = 5.5 V, TJ = 150°C, CL = 15 pF,input a 50 MHz 50% duty cycle square wave 37.5 mW

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(1) Creepage and clearance requirements should be applied according to the specific equipment isolation standards of an application. Careshould be taken to maintain the creepage and clearance distance of a board design to ensure that the mounting pads of the isolator onthe printed-circuit board do not reduce this distance. Creepage and clearance on a printed-circuit board become equal in certain cases.Techniques such as inserting grooves and/or ribs on a printed circuit board are used to help increase these specifications.

(2) This coupler is suitable for safe electrical insulation only within the safety ratings. Compliance with the safety ratings shall be ensured bymeans of suitable protective circuits.

(3) Testing is carried out in air or oil to determine the intrinsic surge immunity of the isolation barrier.(4) Apparent charge is electrical discharge caused by a partial discharge (pd).(5) All pins on each side of the barrier tied together creating a two-terminal device.

6.6 Insulation Specifications

PARAMETER TEST CONDITIONSVALUE

UNITDW-16 D-8

CLR External clearance (1) Shortest terminal-to-terminal distance through air 8 4 mm

CPG External creepage (1) Shortest terminal-to-terminal distance across thepackage surface 8 4 mm

DTI Distance through the insulation Minimum internal gap (internal clearance) 21 21 μmCTI Comparative tracking index DIN EN 60112 (VDE 0303-11); IEC 60112; UL 746A >600 >600 V

Material group According to IEC 60664-1 I I

Overvoltage category per IEC 60664-1

Rated mains voltage ≤ 150 VRMS I–IV I–IVRated mains voltage ≤ 300 VRMS I–IV I–IIIRated mains voltage ≤ 600 VRMS I–IV n/aRated mains voltage ≤ 1000 VRMS I–III n/a

DIN VDE V 0884-11:2017-01 (2)

VIORMMaximum repetitive peak isolationvoltage AC voltage (bipolar) 2121 637 VPK

VIOWM Maximum working isolation voltageAC voltage; Time dependent dielectric breakdown(TDDB) test; see Figure 21 1500 450 VRMS

DC voltage 2121 637 VDC

VIOTM Maximum transient isolation voltage VTEST = VIOTM, t = 60 s (qualification);VTEST = 1.2 x VIOTM, t = 1 s (100% production) 8000 4242 VPK

VIOSM Maximum surge isolation voltage (3) Test method per IEC 62368-1, 1.2/50 µs waveform,VTEST = 1.6 × VIOSM (qualification) 8000 5000 VPK

qpd Apparent charge (4)

Method a, After Input/Output safety test subgroup 2/3,Vini = VIOTM, tini = 60 s; Vpd(m) = 1.2 × VIORM, tm = 10 s ≤5 ≤5

pC

Method a, After environmental tests subgroup 1,Vini = VIOTM, tini = 60 s; Vpd(m) = 1.6 × VIORM, tm = 10 s ≤5 ≤5

Method b1; At routine test (100% production) andpreconditioning (type test)Vini = 1.2 x VIOTM, tini = 1 s;Vpd(m) = 1.875 × VIORM, tm = 1 s

≤5 ≤5

CIO Barrier capacitance, input to output (5) VIO = 0.4 × sin (2πft), f = 1 MHz ~0.4 ~0.4 pF

RIO Isolation resistance (5)

VIO = 500 V, TA = 25°C >1012 >1012

ΩVIO = 500 V, 100°C ≤ TA ≤ 125°C >1011 >1011

VIO = 500 V at TS = 150°C >109 >109

Pollution degree 2 2Climatic category 55/125/21 55/125/21

UL 1577

VISO Withstanding isolation voltage VTEST = VISO, t = 60 s (qualification);VTEST = 1.2 × VISO, t = 1 s (100% production) 5000 3000 VRMS

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6.7 Safety-Related CertificationsVDE CSA UL CQC TUV

Certified according toDIN VDE V 0884-11:2017-01 1

Certified according to IEC60950-1, IEC 62368-1 andIEC 60601-1

Certified according toUL 1577 ComponentRecognition Program

Certified according toGB4943.1-2011

Certified according to EN61010-1:2010/A1:2019,EN 60950-1:2006/A2:2013and EN 62368-1:2014

Maximum transientisolation voltage, 8000VPK (DW-16, Reinforced)and 4242 VPK (D-8);Maximum repetitive peakisolation voltage, 2121VPK (DW-16, Reinforced)and 637 VPK (D-8);Maximum surge isolationvoltage, 8000 VPK (DW-16, Reinforced) and5000 VPK (D-8)

Reinforced insulation perCSA 60950-1-07+A1+A2,IEC 60950-1 2ndEd.+A1+A2, CSA 62368-1-14 and IEC 62368-1:2014,800 VRMS (DW-16) and 400VRMS (D-8) max workingvoltage (pollution degree 2,material group I);2 MOPP (Means of PatientProtection) per CSA 60601-1:14 and IEC 60601-1 Ed.3.1, 250 VRMS (DW-16) maxworking voltage

DW-16: Singleprotection, 5000 VRMS ;D-8: Single protection,3000 VRMS

DW-16: ReinforcedInsulation, Altitude ≤ 5000m, Tropical Climate, 700VRMS maximum workingvoltage;D-8: Basic Insulation,Altitude ≤ 5000 m, TropicalClimate, 400 VRMSmaximum working voltage

5000 VRMS (DW-16) and3000 VRMS (D-8)Reinforced insulation perEN 61010-1:2010/A1:2019up to working voltage of600 VRMS (DW-16) and300 VRMS (D-8)5000 VRMS (DW-16) and3000 VRMS (D-8)Reinforced insulation perEN 60950-1:2006/A2:2013and EN 62368-1:2014 upto working voltage of 800VRMS (DW-16) and 400VRMS (D-8)

Certificate number:40040142

Master contract number:220991 File number: E181974

Certificate numbers:CQC15001121716 (DW-16)CQC15001121656 (D-8)

Client ID number: 77311

6.8 Safety Limiting ValuesSafety limiting intends to minimize potential damage to the isolation barrier upon failure of input or output circuitry. A failure ofthe I/O can allow low resistance to ground or the supply and, without current limiting, dissipate sufficient power to overheatthe die and damage the isolation barrier potentially leading to secondary system failures.

PARAMETER TEST CONDITIONS MIN TYP MAX UNITDW-16 Package

ISSafety input, output, orsupply current

RθJA = 94.4 °C/W, VI = 5.5 V, TJ = 150°C, TA = 25°C, see Figure 1 241

mARθJA = 94.4 °C/W, VI = 3.6 V, TJ = 150°C, TA = 25°C, see Figure 1 368RθJA = 94.4 °C/W, VI = 2.75 V, TJ = 150°C, TA = 25°C,see Figure 1 482

PSSafety input, output, ortotal power RθJA = 94.4 °C/W, TJ = 150°C, TA = 25°C, see Figure 2 1324 mW

TSMaximum safetytemperature 150 °C

D-8 Package

ISSafety input, output, orsupply current

RθJA = 146.1 °C/W, VI = 5.5 V, TJ = 150°C, TA = 25°C, see Figure 3 156

mARθJA = 146.1 °C/W, VI = 3.6 V, TJ = 150°C, TA = 25°C,see Figure 3 238

RθJA = 146.1 °C/W, VI = 2.75 V, TJ = 150°C, TA = 25°C, see Figure 3 311

PSSafety input, output, ortotal power RθJA = 146.1 °C/W, TJ = 150°C, TA = 25°C, see Figure 4 856 mW

TSMaximum safetytemperature 150 °C

The maximum safety temperature is the maximum junction temperature specified for the device. The powerdissipation and junction-to-air thermal impedance of the device installed in the application hardware determinesthe junction temperature. The assumed junction-to-air thermal resistance in the Thermal Information table is thatof a device installed on a High-K test board for leaded surface mount packages. The power is the recommendedmaximum input voltage times the current. The junction temperature is then the ambient temperature plus thepower times the junction-to-air thermal resistance.

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(1) Measured from input pin to ground.

6.9 Electrical Characteristics—5-V SupplyVCC1 = VCC2 = 5 V ± 10% (over recommended operating conditions unless otherwise noted)

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT

VOH High-level output voltage IOH = –4 mA; see Figure 11 VCC2 – 0.4 4.8 V

VOL Low-level output voltage IOL = 4 mA; see Figure 11 0.2 0.4 V

VIT+(IN) Rising input threshold voltage 0.6 x VCC1 0.7 x VCC1 V

VIT-(IN) Falling input threshold voltage 0.3 x VCC1 0.4 x VCC1 V

VI(HYS) Input threshold voltage hysteresis 0.1 × VCC1 0.2 × VCC1 V

IIH High-level input current VIH = VCC1 at IN 10 μA

IIL Low-level input current VIL = 0 V at IN –10 μA

CMTI Common-mode transient immunity VI = VCC1 or 0 V, VCM = 1200 V; see Figure 13 85 100 kV/μs

CI Input Capacitance (1) VI = VCC/ 2 + 0.4×sin(2πft), f = 1 MHz, VCC = 5 V 2 pF

6.10 Supply Current Characteristics—5-V SupplyVCC1 = VCC2 = 5 V ± 10% (over recommended operating conditions unless otherwise noted)

PARAMETER TEST CONDITIONS SUPPLYCURRENT MIN TYP MAX UNIT

Supply current - DC signal

VI = VCC1 (ISO7710), VI = 0 V (ISO7710 with F suffix)ICC1 0.5 0.8

mA

ICC2 0.6 1

VI = 0 V (ISO7710), VI = VCC1 (ISO7710 with F suffix)ICC1 1.6 2.5

ICC2 0.6 1

Supply current - AC signal All channels switching with squarewave clock input; CL = 15 pF

1 MbpsICC1 1.1 1.5

ICC2 0.6 1.1

10 MbpsICC1 1.1 1.6

ICC2 1.1 1.6

100 MbpsICC1 1.4 2

ICC2 5.9 7

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6.11 Electrical Characteristics—3.3-V SupplyVCC1 = VCC2 = 3.3 V ± 10% (over recommended operating conditions unless otherwise noted)

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT

VOH High-level output voltage IOH = –2 mA; see Figure 11 VCC2 – 0.3 3.2 V

VOL Low-level output voltage IOL = 2 mA; see Figure 11 0.1 0.3 V

VIT+(IN) Rising input voltage threshold 0.6 x VCC1 0.7 x VCC1 V

VIT-(IN) Falling input voltage threshold 0.3 x VCC1 0.4 x VCC1 V

VI(HYS) Input threshold voltage hysteresis 0.1 × VCC1 0.2 × VCC1 V

IIH High-level input current VIH = VCC1 at IN 10 μA

IIL Low-level input current VIL = 0 V at IN –10 μA

CMTI Common-mode transient immunity VI = VCC1 or 0 V, VCM = 1200 V; see Figure 13 85 100 kV/μs

6.12 Supply Current Characteristics—3.3-V SupplyVCC1 = VCC2 = 3.3 V ± 10% (over recommended operating conditions unless otherwise noted)

PARAMETER TEST CONDITIONS SUPPLYCURRENT MIN TYP MAX UNIT

Supply current - DC signal

VI = VCC1 (ISO7710), VI = 0 V (ISO7710 with F suffix)ICC1 0.5 0.8

mA

ICC2 0.6 1

VI = 0 V (ISO7710), VI = VCC1 (ISO7710 with F suffix)ICC1 1.6 2.5

ICC2 0.6 1

Supply current - AC signal All channels switching with squarewave clock input; CL = 15 pF

1 MbpsICC1 1.1 1.5

ICC2 0.6 1

10 MbpsICC1 1 1.6

ICC2 1.1 1.4

100 MbpsICC1 1.3 1.8

ICC2 4.3 5.3

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6.13 Electrical Characteristics—2.5-V SupplyVCC1 = VCC2 = 2.5 V ± 10% (over recommended operating conditions unless otherwise noted)

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT

VOH High-level output voltage IOH = –1 mA; see Figure 11 VCC2 – 0.2 2.45 V

VOL Low-level output voltage IOL = 1 mA; see Figure 11 0.05 0.2 V

VIT+(IN) Rising input voltage threshold 0.6 x VCC1 0.7 x VCC1 V

VIT-(IN) Falling input voltage threshold 0.3 x VCC1 0.4 x VCC1 V

VI(HYS) Input threshold voltage hysteresis 0.1 × VCC1 0.2 × VCC1 V

IIH High-level input current VIH = VCC1 at IN 10 μA

IIL Low-level input current VIL = 0 V at IN –10 μA

CMTI Common-mode transientimmunity VI = VCC1 or 0 V, VCM = 1200 V; see Figure 13 85 100 kV/μs

6.14 Supply Current Characteristics—2.5-V SupplyVCC1 = VCC2 = 2.5 V ± 10% (over recommended operating conditions unless otherwise noted)

PARAMETER TEST CONDITIONS SUPPLYCURRENT MIN TYP MAX UNIT

Supply current - DC signal

VI = VCC1 (ISO7710), VI = 0 V (ISO7710 with F suffix)ICC1 0.5 0.8

mA

ICC2 0.6 1

VI = 0 V (ISO7710), VI = VCC1 (ISO7710 with F suffix)ICC1 1.6 2.5

ICC2 0.6 1

Supply current - AC signal All channels switching with squarewave clock input; CL = 15 pF

1 MbpsICC1 1.1 1.5

ICC2 0.6 1

10 MbpsICC1 1.1 1.5

ICC2 0.9 1.4

100 MbpsICC1 1.2 1.6

ICC2 3.4 4.4

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(1) Also known as pulse skew.(2) tsk(pp) is the magnitude of the difference in propagation delay times between terminals of different devices switching in the same

direction while operating at identical supply voltages, temperature, input signals and loads.

6.15 Switching Characteristics—5-V SupplyVCC1 = VCC2 = 5 V ± 10% (over recommended operating conditions unless otherwise noted)

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT

tPLH, tPHL Propagation delay timeSee Figure 11

6 11 16 ns

PWD Pulse width distortion (1) |tPHL – tPLH| 0.6 4.9 ns

tsk(pp) Part-to-part skew time (2) 4.5 ns

tr Output signal rise timeSee Figure 11

1.8 3.9 ns

tf Output signal fall time 1.9 3.9 ns

tDO Default output delay time from input power loss Measured from the time VCC1 goes below 1.7 V.See Figure 12 0.1 0.3 μs

tie Time interval error 216 – 1 PRBS data at 100 Mbps 1 ns

(1) Also known as pulse skew.(2) tsk(pp) is the magnitude of the difference in propagation delay times between terminals of different devices switching in the same

direction while operating at identical supply voltages, temperature, input signals and loads.

6.16 Switching Characteristics—3.3-V SupplyVCC1 = VCC2 = 3.3 V ± 10% (over recommended operating conditions unless otherwise noted)

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT

tPLH, tPHL Propagation delay timeSee Figure 11

6 11 16 ns

PWD Pulse width distortion (1) |tPHL – tPLH| 0.1 5 ns

tsk(pp) Part-to-part skew time (2) 4.5 ns

tr Output signal rise timeSee Figure 11

0.7 3 ns

tf Output signal fall time 0.7 3 ns

tDO Default output delay time from input power loss Measured from the time VCC1 goes below 1.7 V.See Figure 12 0.1 0.3 μs

tie Time interval error 216 – 1 PRBS data at 100 Mbps 1 ns

(1) Also known as pulse skew.(2) tsk(pp) is the magnitude of the difference in propagation delay times between terminals of different devices switching in the same

direction while operating at identical supply voltages, temperature, input signals and loads.

6.17 Switching Characteristics—2.5-V SupplyVCC1 = VCC2 = 2.5 V ± 10% (over recommended operating conditions unless otherwise noted)

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT

tPLH, tPHL Propagation delay timeSee Figure 11

7.5 12 18.5 ns

PWD Pulse width distortion (1) |tPHL – tPLH| 0.2 5.1 ns

tsk(pp) Part-to-part skew time (2) 4.6 ns

tr Output signal rise timeSee Figure 11

1 3.5 ns

tf Output signal fall time 1 3.5 ns

tDO Default output delay time from input power loss Measured from the time VCC1 goes below 1.7 V.See Figure 12 0.1 0.3 μs

tie Time interval error 216 – 1 PRBS data at 100 Mbps 1 ns

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Ambient Temperature (qC)

Safe

ty L

imitin

g C

urr

ent (m

A)

0 20 40 60 80 100 120 140 1600

50

100

150

200

250

300

350

D003

VCC1 = VCC2 = 2.75 VVCC1 = VCC2 = 3.6 VVCC1 = VCC2 = 5.5 V

Ambient Temperature (qC)

Safe

ty L

imitin

g P

ow

er

(mW

)

0 50 100 150 2000

100

200

300

400

500

600

700

800

900

D004

Ambient Temperature (qC)

Safe

ty L

imitin

g C

urr

ent (m

A)

0 50 100 150 2000

100

200

300

400

500

600

D001

VCC1 = VCC2 = 2.75 VVCC1 = VCC2 = 3.6 VVCC1 = VCC2 = 5.5 V

Ambient Temperature (qC)

Safe

ty L

imitin

g P

ow

er

(mW

)

0 50 100 150 2000

200

400

600

800

1000

1200

1400

D002

13

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6.18 Insulation Characteristics Curves

Figure 1. Thermal Derating Curve for Limiting Current perVDE for DW-16 Package

Figure 2. Thermal Derating Curve for Limiting Power perVDE for DW-16 Package

Figure 3. Thermal Derating Curve for Limiting Current perVDE for D-8 Package

Figure 4. Thermal Derating Curve for Limiting Power perVDE for D-8 Package

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Free-Air Temperature (qC)

Pow

er

Supply

UV

LO

Thre

shold

(V

)

-55 -40 -25 -10 5 20 35 50 65 80 95 110 1251.60

1.65

1.70

1.75

1.80

1.85

1.90

1.95

2.00

2.05

2.10

D009

VCC1 RisingVCC1 FallingVCC2 RisingVCC2 Falling

Free Air Temperature (qC)

Pro

pagation D

ela

y T

ime (

ns)

-55 -25 5 35 65 95 1258

9

10

11

12

13

14

D010

tPLH at 2.5 VtPHL at 2.5 VtPLH at 3.3 V

tPHL at 3.3 VtPLH at 5 VtPHL at 5 V

High-Level Output Current (mA)

Hig

h-L

evel O

utp

ut V

oltage (

V)

-15 -10 -5 00

1

2

3

4

5

6

D011

VCC at 2.5 VVCC at 3.3 VVCC at 5 V

Low-Level Output Current (mA)

Low

-Level O

utp

ut

Voltage (

V)

0 5 10 150

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

0.9

D012

VCC at 2.5 VVCC at 3.3 VVCC at 5 V

Data Rate (Mbps)

Supply

Curr

ent (m

A)

0 25 50 75 1000

1

2

3

4

5

6

7

D005

ICC1 at 2.5 VICC2 at 2.5 VICC1 at 3.3 V

ICC2 at 3.3 VICC1 at 5 VICC2 at 5 V

Data Rate (Mbps)

Supply

Curr

ent

(mA

)

0 25 50 75 1000

0.5

1

1.5

2

2.5

D006

ICC1 at 2.5 VICC2 at 2.5 VICC1 at 3.3 V

ICC2 at 3.3 VICC1 at 5 VICC2 at 5 V

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6.19 Typical Characteristics

TA = 25°C CL = 15 pF

Figure 5. ISO7710 Supply Current vs Data Rate(With 15 pF Load)

TA = 25°C CL = No Load

Figure 6. ISO7710 Supply Current vs Data Rate(With No Load)

TA = 25°C

Figure 7. High-Level Output Voltage vs High-levelOutput Current

TA = 25°C

Figure 8. Low-Level Output Voltage vs Low-LevelOutput Current

Figure 9. Power Supply Undervoltage Threshold vsFree-Air Temperature

Figure 10. Propagation Delay Time vs Free-Air Temperature

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IN OUT

Iso

lati

on

Ba

rrie

r

EN

VCC1

CL

See Note A

S1

GND2GND1 + ±VCM

+

±

VOH or VOL

C = 0.1 µF ±1% C = 0.1 µF ±1%

VCC1

Pass-fail criteria: The output must remain stable.

VI

VCC

IN OUTVO

CL

See Note A

IN = 0 V (Devices without suffix F)

IN = VCC (Devices with suffix F)

VO

VI

VOL

VOH

VCC

0 V

1.7 V

50%

tDOdefault high

default low

Iso

lati

on

Ba

rrie

r

See Note B

IN OUT

CL

See Note B

VO

VI

VOL

VOH

VCC1

0 V

trIs

ola

tio

n B

arr

ier

50

Input Generator

(See Note A) VI VO

tf

tPLH tPHL

50% 50%

50% 50%90%

10%

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7 Parameter Measurement Information

A. The input pulse is supplied by a generator having the following characteristics: PRR ≤ 50 kHz, 50% duty cycle, tr ≤ 3ns, tf ≤ 3ns, ZO = 50 Ω. At the input, 50 Ω resistor is required to terminate Input Generator signal. It is not needed inactual application.

B. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.

Figure 11. Switching Characteristics Test Circuit and Voltage Waveforms

A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.B. Power Supply Ramp Rate = 10 mV/ns

Figure 12. Default Output Delay Time Test Circuit and Voltage Waveforms

A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.

Figure 13. Common-Mode Transient Immunity Test Circuit

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TX IN

RX OUT

Carrier signal through

isolation barrier

TX IN

Oscillator

OOK

Modulation

Transmitter

Emissions

Reduction

Techniques

TX Signal

Conditioning

Envelope

Detection

RX Signal

Conditioning

Receiver

RX OUTSiO2 based

Capacitive

Isolation

Barrier

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8 Detailed Description

8.1 OverviewThe ISO7710 device has an ON-OFF keying (OOK) modulation scheme to transmit the digital data across asilicon dioxide based isolation barrier. The transmitter sends a high frequency carrier across the barrier torepresent one digital state and sends no signal to represent the other digital state. The receiver demodulates thesignal after advanced signal conditioning and produces the output through a buffer stage. The device alsoincorporates advanced circuit techniques to maximize the CMTI performance and minimize the radiatedemissions due the high frequency carrier and IO buffer switching. The conceptual block diagram of a digitalcapacitive isolator, Figure 14, shows a functional block diagram of a typical channel.

8.2 Functional Block Diagram

Figure 14. Conceptual Block Diagram of a Digital Capacitive Isolator

Figure 15 shows a conceptual detail of how the OOK scheme works.

Figure 15. On-Off Keying (OOK) Based Modulation Scheme

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(1) See the Safety-Related Certifications section for detailed isolation ratings.

8.3 Feature DescriptionThe ISO7710 device is available in two default output state options to enable a variety of application uses.Table 1 lists the device features.

Table 1. Device Features

PART NUMBER MAXIMUM DATARATE

CHANNELDIRECTION

DEFAULT OUTPUTSTATE PACKAGE RATED ISOLATION (1)

ISO7710 100 Mbps 1 Forward, 0 Reverse HighDW-16 5000 VRMS / 8000 VPK

D-8 3000 VRMS / 4242 VPK

ISO7710F 100 Mbps 1 Forward, 0 Reverse LowDW-16 5000 VRMS / 8000 VPK

D-8 3000 VRMS / 4242 VPK

8.3.1 Electromagnetic Compatibility (EMC) ConsiderationsMany applications in harsh industrial environment are sensitive to disturbances such as electrostatic discharge(ESD), electrical fast transient (EFT), surge and electromagnetic emissions. These electromagnetic disturbancesare regulated by international standards such as IEC 61000-4-x and CISPR 22. Although system-levelperformance and reliability depends, to a large extent, on the application board design and layout, the ISO7710device incorporates many chip-level design improvements for overall system robustness. Some of theseimprovements include:• Robust ESD protection cells for input and output signal pins and inter-chip bond pads.• Low-resistance connectivity of ESD cells to supply and ground pins.• Enhanced performance of high voltage isolation capacitor for better tolerance of ESD, EFT and surge events.• Bigger on-chip decoupling capacitors to bypass undesirable high energy signals through a low impedance

path.• PMOS and NMOS devices isolated from each other by using guard rings to avoid triggering of parasitic

SCRs.• Reduced common mode currents across the isolation barrier by ensuring purely differential internal operation.

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Output

985

1.5 M

INx

VCCI VCCI VCCI

Input (Devices without F suffix)

985

1.5 M

INx

VCCI VCCI VCCI VCCI

Input (Devices with F suffix)

VCCO

~20

OUTx

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(1) PU = Powered up (VCC ≥ 2.25 V); PD = Powered down (VCC ≤ 1.7 V); X = Irrelevant; H = High level; L = Low level(2) A strongly driven input signal can weakly power the floating VCC via an internal protection diode and cause undetermined output.(3) The outputs are in undetermined state when 1.7 V < VCC1, VCC2 < 2.25 V.

8.4 Device Functional ModesTable 2 lists the functional modes of ISO7710 device.

Table 2. Function Table (1)

VCC1 VCC2INPUT(IN) (2)

OUTPUT(OUT) COMMENTS

PU PU

H H Normal Operation:A channel output assumes the logic state of its input.L L

Open Default Default mode: When IN is open, the corresponding channel output goes to itsdefault logic state. Default is High for ISO7710 and Low for ISO7710F.

PD PU X Default

Default mode: When VCC1 is unpowered, a channel output assumes the logicstate based on the selected default option. Default is High for ISO7710 andLow for ISO7710F.When VCC1 transitions from unpowered to powered-up, a channel outputassumes the logic state of its input.When VCC1 transitions from powered-up to unpowered, channel outputassumes the selected default state.

X PD X UndeterminedWhen VCC2 is unpowered, a channel output is undetermined (3).When VCC2 transitions from unpowered to powered-up, a channel outputassumes the logic state of its input

8.4.1 Device I/O Schematics

Figure 16. Device I/O Schematics

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0.1 F

VS

10 F

MBR0520L

MBR0520L

1:1.33

10 F

3

1

D2

SN6501

D1

5

2

GND GND

4

3.3 V

IN

EN GND

OUT1 5

23

TPS7633310 F

ISO 3.3V

VCC RS

GND Vref

CANH

CANL

7

6

4

R

D

1,3

2

1,3

0.1 F

0.1 F

SN65HVD231

ISO Barrier

4.7 nF /

2 kV

SM712

10 (optional)

10 (optional)

Vcc

0.1 F

25

26

VCC1 VCC2

GND1 GND2

VCC1

IN OUT

INOUT

GND2

VCC2

GND1

ISO7710

ISO7710

5

6

4

2

0.1 F

0.1 F

8

5

8

6

1

3

4

2

0.1 F

8

5TMS320F28035PAG

CANRXA

6,28

29,57

VSS

VDDIO

CANTXA

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9 Application and Implementation

NOTEInformation in the following applications sections is not part of the TI componentspecification, and TI does not warrant its accuracy or completeness. TI’s customers areresponsible for determining suitability of components for their purposes. Customers shouldvalidate and test their design implementation to confirm system functionality.

9.1 Application InformationThe ISO7710 device is a high-performance, single-channel digital isolator. The device uses single-ended CMOS-logic switching technology. The supply voltage range is from 2.25 V to 5.5 V for both supplies, VCC1 and VCC2.When designing with digital isolators, keep in mind that because of the single-ended design structure, digitalisolators do not conform to any specific interface standard and are only intended for isolating single-endedCMOS or TTL digital signal lines. The isolator is typically placed between the data controller (that is, μC orUART), and a data converter or a line transceiver, regardless of the interface type or standard.

9.2 Typical ApplicationThe ISO7710 device can be used with Texas Instruments' mixed signal microcontroller, CAN transceiver,transformer driver, and low-dropout voltage regulator to create an Isolated CAN Interface as shown below.

Figure 17. Isolated CAN Interface

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1 V

/ d

iv

Time = 3.5 ns / div

0.1 F

2 mm

maximum

from VCC1 0.1 F

2 mm

maximum

from VCC2

VCC1 VCC2

GND1 GND2

1

2

3

4

8

7

6

5

OUT

ININPUT

OUTPUT

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Typical Application (continued)9.2.1 Design RequirementsTo design with this device, use the parameters listed in Table 3.

Table 3. Design ParametersPARAMETER VALUE

Supply voltage, VCC1 and VCC2 2.25 V to 5.5 VDecoupling capacitor between VCC1 and GND1 0.1 µF

Decoupling capacitor from VCC2 and GND2 0.1 µF

9.2.2 Detailed Design ProcedureUnlike optocouplers, which require components to improve performance, provide bias, or limit current, theISO7710 device only requires two external bypass capacitors to operate.

Figure 18. Typical ISO7710 Circuit Hook-up

9.2.3 Application CurveThe following typical eye diagram of the ISO7710 device indicates low jitter and wide open eye at the maximumdata rate of 100 Mbps.

Figure 19. ISO7710 Eye Diagram at 100 Mbps PRBS, 5-V Supplies and 25°C

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DUT

Vcc 2Vcc 1

GND 1 GND 2

A

Oven at 150 °C

Time Counter

> 1 mA

VS

21

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9.2.3.1 Insulation LifetimeInsulation lifetime projection data is collected by using industry-standard Time Dependent Dielectric Breakdown(TDDB) test method. In this test, all pins on each side of the barrier are tied together creating a two-terminaldevice and high voltage applied between the two sides; See Figure 20 for TDDB test setup. The insulationbreakdown data is collected at various high voltages switching at 60 Hz over temperature. For reinforcedinsulation, VDE standard requires the use of TDDB projection line with failure rate of less than 1 part per million(ppm). Even though the expected minimum insulation lifetime is 20 years at the specified working isolationvoltage, VDE reinforced certification requires additional safety margin of 20% for working voltage and 87.5% forlifetime which translates into minimum required insulation lifetime of 37.5 years at a working voltage that's 20%higher than the specified value.

Figure 21 shows the intrinsic capability of the isolation barrier to withstand high voltage stress over its lifetime.Based on the TDDB data, the intrinsic capability of the insulation is 1500 VRMS with a lifetime of 135 years. Otherfactors, such as package size, pollution degree, material group, etc. can further limit the working voltage of thecomponent. The working voltage of DW-16 package is specified up to 1500 VRMS and D-8 package up to 450VRMS. At the lower working voltages, the corresponding insulation lifetime is much longer than 135 years.

Figure 20. Test Setup for Insulation Lifetime Measurement

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Figure 21. Insulation Lifetime Projection Data

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10 mils

10 mils

40 milsFR-4

0r ~ 4.5

Keep this

space free

from planes,

traces, pads,

and vias

Ground plane

Power plane

Low-speed traces

High-speed traces

23

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10 Power Supply RecommendationsTo help ensure reliable operation at data rates and supply voltages, a 0.1-μF bypass capacitor is recommendedat the input and output supply pins (VCC1 and VCC2). The capacitors should be placed as close to the supply pinsas possible. If only a single primary-side power supply is available in an application, isolated power can begenerated for the secondary-side with the help of a transformer driver such as Texas Instruments' SN6501 orSN6505A. For such applications, detailed power supply design and transformer selection recommendations areavailable in SN6501 Transformer Driver for Isolated Power Supplies or SN6505 Low-Noise 1-A TransformerDrivers for Isolated Power Supplies.

11 Layout

11.1 Layout GuidelinesA minimum of four layers is required to accomplish a low EMI PCB design (see Figure 22). Layer stacking shouldbe in the following order (top-to-bottom): high-speed signal layer, ground plane, power plane and low-frequencysignal layer.• Routing the high-speed traces on the top layer avoids the use of vias (and the introduction of their

inductances) and allows for clean interconnects between the isolator and the transmitter and receiver circuitsof the data link.

• Placing a solid ground plane next to the high-speed signal layer establishes controlled impedance fortransmission line interconnects and provides an excellent low-inductance path for the return current flow.

• Placing the power plane next to the ground plane creates additional high-frequency bypass capacitance ofapproximately 100 pF/in2.

• Routing the slower speed control signals on the bottom layer allows for greater flexibility as these signal linksusually have margin to tolerate discontinuities such as vias.

If an additional supply voltage plane or signal layer is needed, add a second power or ground plane system tothe stack to keep it symmetrical. This makes the stack mechanically stable and prevents it from warping. Also thepower and ground plane of each power system can be placed closer together, thus increasing the high-frequencybypass capacitance significantly.

For detailed layout recommendations, refer to the Digital Isolator Design Guide.

11.1.1 PCB MaterialFor digital circuit boards operating at less than 150 Mbps, (or rise and fall times greater than 1 ns), and tracelengths of up to 10 inches, use standard FR-4 UL94V-0 printed circuit board. This PCB is preferred over cheaperalternatives because of lower dielectric losses at high frequencies, less moisture absorption, greater strength andstiffness, and the self-extinguishing flammability-characteristics.

11.2 Layout Example

Figure 22. Layout Example

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12 Device and Documentation Support

12.1 Documentation Support

12.1.1 Related DocumentationFor related documentation, see the following:• Digital Isolator Design Guide• Isolation Glossary• How to use isolation to improve ESD, EFT, and Surge immunity in industrial systems•• SN6501 Transformer Driver for Isolated Power Supplies• SN65HVD23x 3.3-V CAN Bus Transceivers• TMS320F28035 Piccolo™ Microcontrollers• TPS76333 Low-Power 150-mA Low-Dropout Linear Regulators

12.2 Related LinksThe table below lists quick access links. Categories include technical documents, support and communityresources, tools and software, and quick access to sample or buy.

Table 4. Related Links

PARTS PRODUCT FOLDER ORDER NOW TECHNICALDOCUMENTS

TOOLS &SOFTWARE

SUPPORT &COMMUNITY

ISO7710 Click here Click here Click here Click here Click here

12.3 Receiving Notification of Documentation UpdatesTo receive notification of documentation updates, navigate to the device product folder on ti.com. In the upperright corner, click on Alert me to register and receive a weekly digest of any product information that haschanged. For change details, review the revision history included in any revised document.

12.4 Community ResourcesTI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straightfrom the experts. Search existing answers or ask your own question to get the quick design help you need.

Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and donot necessarily reflect TI's views; see TI's Terms of Use.

12.5 TrademarksPiccolo, E2E are trademarks of Texas Instruments.All other trademarks are the property of their respective owners.

12.6 Electrostatic Discharge CautionThis integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled withappropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be moresusceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

12.7 GlossarySLYZ022 — TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.

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13 Mechanical, Packaging, and Orderable InformationThe following pages include mechanical, packaging, and orderable information. This information is the mostcurrent data available for the designated devices. This data is subject to change without notice and revision ofthis document. For browser-based versions of this data sheet, refer to the left-hand navigation.

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www.ti.com

PACKAGE OUTLINE

C

.228-.244 TYP[5.80-6.19]

.069 MAX[1.75]

6X .050[1.27]

8X .012-.020[0.31-0.51]

2X

.150[3.81]

.005-.010 TYP[0.13-0.25]

0 - 8.004-.010[0.11-0.25]

.010[0.25]

.016-.050[0.41-1.27]

.041[1.04]

4X (0 -15 )

A

.189-.197[4.81-5.00]

NOTE 3

B .150-.157[3.81-3.98]

NOTE 4

4X (0 -15 )

SOIC - 1.75 mm max heightD0008BSMALL OUTLINE INTEGRATED CIRCUIT

4221445/C 02/2019

NOTES:

1. Linear dimensions are in inches [millimeters]. Dimensions in parenthesis are for reference only. Controlling dimensions are in inches.Dimensioning and tolerancing per ASME Y14.5M.

2. This drawing is subject to change without notice.3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not

exceed .006 [0.15], per side.4. This dimension does not include interlead flash.5. Reference JEDEC registration MS-012, variation AA.

18

.010 [0.25] C A B

5

4

PIN 1 ID AREA

SEATING PLANE

.004 [0.1] C

SEE DETAIL A

TYPICALDETAIL A

SCALE 2.800

26

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www.ti.com

EXAMPLE BOARD LAYOUT

.0028 MAX[0.07]ALL AROUND

.0028 MIN[0.07]ALL AROUND

(.213)[5.4]

6X (.050 )[1.27]

(.217)[5.5]

8X (.061 )[1.55]

8X (.024)[0.6]

(R.002 ) TYP[0.05]

8X (.055)[1.4]

8X (.024)[0.6]

6X (.050 )[1.27]

(R.002 )[0.05]

TYP

SOIC - 1.75 mm max heightD0008BSMALL OUTLINE INTEGRATED CIRCUIT

4221445/C 02/2019

NOTES: (continued)

6. Publication IPC-7351 may have alternate designs.7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.

METALSOLDER MASKOPENING

NON SOLDER MASKDEFINED

SOLDER MASK DETAILS

EXPOSDEMETAL

OPENINGSOLDER MASK METAL UNDER

SOLDER MASK

SOLDER MASKDEFINED

EXPOSEDMETAL

EXPOSED METAL SHOWNLAND PATTERN EXAMPLE

SCALE:6X

SYMM

1

45

8

SEEDETAILS

IPC-7351 NOMINAL.150 [3.85] CLEARANCE / CREEPAGE

SYMM

HV / ISOLATION OPTION.162 [4.1] CLEARANCE / CREEPAGE

SYMM

1

45

8

SEEDETAILS

SYMM

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www.ti.com

EXAMPLE STENCIL DESIGN

8X (.061 )[1.55]

8X (.024)[0.6]

6X (.050 )[1.27]

(.213)[5.4]

(R.002 ) TYP[0.05]

8X (.055)[1.4]

8X (.024)[0.6]

6X (.050 )[1.27]

(.217)[5.5]

(R.002 )[0.05]

TYP

SOIC - 1.75 mm max heightD0008BSMALL OUTLINE INTEGRATED CIRCUIT

4221445/C 02/2019

NOTES: (continued)

8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternatedesign recommendations.

9. Board assembly site may have different recommendations for stencil design.

HV / ISOLATION OPTION.162 [4.1] CLEARANCE / CREEPAGE

BASED ON .005 INCH [0.127 MM] THICK STENCILSOLDER PASTE EXAMPLE

SCALE:6X

SYMM

SYMM

1

45

8

IPC-7351 NOMINAL.150 [3.85] CLEARANCE / CREEPAGE

SYMM

SYMM

1

45

8

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www.ti.com

PACKAGE OUTLINE

C

TYP10.639.97

2.65 MAX

14X 1.27

16X0.510.31

2X

8.89

TYP0.330.10

0 - 80.30.1

(1.4)

0.25

GAGE PLANE

1.270.40

A

NOTE 3

10.510.1

B

NOTE 4

7.67.4

4221009/B 07/2016

SOIC - 2.65 mm max heightDW0016BSOIC

NOTES:

1. All linear dimensions are in millimeters. Dimensions in parenthesis are for reference only. Dimensioning and tolerancingper ASME Y14.5M.

2. This drawing is subject to change without notice.3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not

exceed 0.15 mm, per side.4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm, per side.5. Reference JEDEC registration MS-013.

116

0.25 C A B

98

PIN 1 IDAREA

SEATING PLANE

0.1 C

SEE DETAIL A

TYPICALDETAIL A

SCALE 1.500

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www.ti.com

EXAMPLE BOARD LAYOUT

(9.75)R0.05 TYP

0.07 MAXALL AROUND

0.07 MINALL AROUND

(9.3)

14X (1.27)

R0.05 TYP

16X (1.65)

16X (0.6)

14X (1.27)

16X (2)

16X (0.6)

4221009/B 07/2016

SYMM

SOIC - 2.65 mm max heightDW0016BSOIC

SYMM

SEEDETAILS

1

8 9

16

SYMM

HV / ISOLATION OPTION8.1 mm CLEARANCE/CREEPAGE

NOTES: (continued)

6. Publication IPC-7351 may have alternate designs.7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.

METALSOLDER MASKOPENING

NON SOLDER MASKDEFINED

SOLDER MASK DETAILS

OPENINGSOLDER MASK METAL

SOLDER MASKDEFINED

SCALE:4XLAND PATTERN EXAMPLE

SYMM

1

8 9

16

IPC-7351 NOMINAL7.3 mm CLEARANCE/CREEPAGE

SEEDETAILS

30

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www.ti.com

EXAMPLE STENCIL DESIGN

R0.05 TYPR0.05 TYP

16X (1.65)

16X (0.6)

14X (1.27)

(9.75)

16X (2)

16X (0.6)

14X (1.27)

(9.3)

4221009/B 07/2016

SOIC - 2.65 mm max heightDW0016BSOIC

NOTES: (continued)

8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternatedesign recommendations.

9. Board assembly site may have different recommendations for stencil design.

SYMM

SYMM

1

8 9

16

HV / ISOLATION OPTION8.1 mm CLEARANCE/CREEPAGE

BASED ON 0.125 mm THICK STENCILSOLDER PASTE EXAMPLE

SCALE:4X

SYMM

SYMM

1

8 9

16

IPC-7351 NOMINAL7.3 mm CLEARANCE/CREEPAGE

31

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PACKAGE OPTION ADDENDUM

www.ti.com 10-Dec-2020

Addendum-Page 1

PACKAGING INFORMATION

Orderable Device Status(1)

Package Type PackageDrawing

Pins PackageQty

Eco Plan(2)

Lead finish/Ball material

(6)

MSL Peak Temp(3)

Op Temp (°C) Device Marking(4/5)

Samples

ISO7710D ACTIVE SOIC D 8 75 RoHS & Green NIPDAU Level-2-260C-1 YEAR -55 to 125 7710

ISO7710DR ACTIVE SOIC D 8 2500 RoHS & Green NIPDAU Level-2-260C-1 YEAR -55 to 125 7710

ISO7710DW ACTIVE SOIC DW 16 40 RoHS & Green NIPDAU Level-2-260C-1 YEAR -55 to 125 ISO7710

ISO7710DWR ACTIVE SOIC DW 16 2000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -55 to 125 ISO7710

ISO7710FD ACTIVE SOIC D 8 75 RoHS & Green NIPDAU Level-2-260C-1 YEAR -55 to 125 7710F

ISO7710FDR ACTIVE SOIC D 8 2500 RoHS & Green NIPDAU Level-2-260C-1 YEAR -55 to 125 7710F

ISO7710FDW ACTIVE SOIC DW 16 40 RoHS & Green NIPDAU Level-2-260C-1 YEAR -55 to 125 ISO7710F

ISO7710FDWR ACTIVE SOIC DW 16 2000 RoHS & Green NIPDAU Level-2-260C-1 YEAR -55 to 125 ISO7710F

(1) The marketing status values are defined as follows:ACTIVE: Product device recommended for new designs.LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.PREVIEW: Device has been announced but is not in production. Samples may or may not be available.OBSOLETE: TI has discontinued the production of the device.

(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substancedo not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI mayreference these types of products as "Pb-Free".RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide basedflame retardants must also meet the <=1000ppm threshold requirement.

(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.

(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.

(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuationof the previous line and the two combined represent the entire Device Marking for that device.

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PACKAGE OPTION ADDENDUM

www.ti.com 10-Dec-2020

Addendum-Page 2

(6) Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to twolines if the finish value exceeds the maximum column width.

Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on informationprovided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken andcontinues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.

In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.

OTHER QUALIFIED VERSIONS OF ISO7710 :

• Automotive: ISO7710-Q1

NOTE: Qualified Version Definitions:

• Automotive - Q100 devices qualified for high-reliability automotive applications targeting zero defects

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TAPE AND REEL INFORMATION

*All dimensions are nominal

Device PackageType

PackageDrawing

Pins SPQ ReelDiameter

(mm)

ReelWidth

W1 (mm)

A0(mm)

B0(mm)

K0(mm)

P1(mm)

W(mm)

Pin1Quadrant

ISO7710DR SOIC D 8 2500 330.0 12.4 6.4 5.2 2.1 8.0 12.0 Q1

ISO7710DWR SOIC DW 16 2000 330.0 16.4 10.75 10.7 2.7 12.0 16.0 Q1

ISO7710FDR SOIC D 8 2500 330.0 12.4 6.4 5.2 2.1 8.0 12.0 Q1

ISO7710FDWR SOIC DW 16 2000 330.0 16.4 10.75 10.7 2.7 12.0 16.0 Q1

PACKAGE MATERIALS INFORMATION

www.ti.com 26-Feb-2019

Pack Materials-Page 1

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*All dimensions are nominal

Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm)

ISO7710DR SOIC D 8 2500 350.0 350.0 43.0

ISO7710DWR SOIC DW 16 2000 350.0 350.0 43.0

ISO7710FDR SOIC D 8 2500 350.0 350.0 43.0

ISO7710FDWR SOIC DW 16 2000 350.0 350.0 43.0

PACKAGE MATERIALS INFORMATION

www.ti.com 26-Feb-2019

Pack Materials-Page 2

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IMPORTANT NOTICE AND DISCLAIMER

TI PROVIDES TECHNICAL AND RELIABILITY DATA (INCLUDING DATASHEETS), DESIGN RESOURCES (INCLUDING REFERENCE DESIGNS), APPLICATION OR OTHER DESIGN ADVICE, WEB TOOLS, SAFETY INFORMATION, AND OTHER RESOURCES “AS IS” AND WITH ALL FAULTS, AND DISCLAIMS ALL WARRANTIES, EXPRESS AND IMPLIED, INCLUDING WITHOUT LIMITATION ANY IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE OR NON-INFRINGEMENT OF THIRD PARTY INTELLECTUAL PROPERTY RIGHTS.These resources are intended for skilled developers designing with TI products. You are solely responsible for (1) selecting the appropriate TI products for your application, (2) designing, validating and testing your application, and (3) ensuring your application meets applicable standards, and any other safety, security, or other requirements. These resources are subject to change without notice. TI grants you permission to use these resources only for development of an application that uses the TI products described in the resource. Other reproduction and display of these resources is prohibited. No license is granted to any other TI intellectual property right or to any third party intellectual property right. TI disclaims responsibility for, and you will fully indemnify TI and its representatives against, any claims, damages, costs, losses, and liabilities arising out of your use of these resources.TI’s products are provided subject to TI’s Terms of Sale (www.ti.com/legal/termsofsale.html) or other applicable terms available either on ti.com or provided in conjunction with such TI products. TI’s provision of these resources does not expand or otherwise alter TI’s applicable warranties or warranty disclaimers for TI products.

Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265Copyright © 2020, Texas Instruments Incorporated