invited session icarcv2014
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7/27/2019 Invited Session ICARCV2014
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Invited Session
Session Information
Title: Data-driven approaches to fault diagnosis and control
Summary of the session:
Modern technological systems rely on sophisticated control and monitoring schemes to meet growing
demands on reliability, system performance as well as economical operation of the overall processsubjected to malfunctions or faults. As a result, it is of utmost importance to design a supervision
system that can detect and identify potential abnormalities and faults as early as possible, andimplement fault-tolerant operation for minimizing any sort of performance degradation. However, due
to the possible unavailability of sufficient quantitative knowledge about the plant in real-time, the
design of this supervisory unit poses a great challenge.
This invited session is devoted to data-driven approaches applied to fault diagnosis and fault-tolerant
control. In an environment, where no model of the plant subject to faults is available, the data-driven
approaches making use of the information obtained from the plant data, maintain functional integrity,availability and performance using fault compensation/accommodation.
The prime objective of this session is to provide a platform for academic and industrial communities to
exchange their latest results and to identify vital issues and challenges for future investigation on fault
diagnosis and control in a data-driven environment. The papers to be published under this session areexpected to provide recent advances of data driven approaches, in particular, novel ideas and
algorithms with practical/experimental applications.
Topics include, but are not limited to, the following research areas:
Data-driven controller performance monitoring and assessment Data-driven controller design Stability and robustness issues for data-driven methods Model-free fault tolerant algorithms Data-driven reliability, fault diagnosis, fault predictability analysis and prognosis Data driven modelling and system identification for fault diagnosis and control
Submission details:
Prospective authors are requested to submit their full papers online at
http://www.icarcv.org/2014/loginSS.asp by 1 April, 2014. For the login ID and password, please
contact on the email mentioned below.
Organizers Information
Dr. Ir. Joseph J. Yam Dr. Tushar JainAssociate professor Research fellow
Universit de Lorraine, CRAN, CNRS Aalto University
BP 70239 - 54506 Vandoeuvre Cedex, France P. O. Box 16100, FI-00076 AALTO, FinlandTel: +33 (0)3 83 68 47 72 Tel: +358 (0)50 4382296Email:[email protected] Email:[email protected]
http://www.icarcv.org/2014/loginSS.asphttp://www.icarcv.org/2014/loginSS.aspmailto:[email protected]:[email protected]:[email protected]:[email protected]:[email protected]:[email protected]:[email protected]:[email protected]://www.icarcv.org/2014/loginSS.asp