investigation into the strong residuals seen near the oxygen edge in mos spectra of

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XMM EPIC MOS Steve Sembay ([email protected]) Mallorca 08/04/08 estigation into the strong residuals se ear the Oxygen edge in MOS spectra of bright continuum sources. Rate Dependent CTI effect ? Steve Sembay

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Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of bright continuum sources. Rate Dependent CTI effect ? Steve Sembay. Event 1. Readout direction. Event 2. Trap. Emission timescales for filled traps (Holland et al. 1993, NIMS, A326, 335). - PowerPoint PPT Presentation

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Page 1: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

Investigation into the strong residuals seen

near the Oxygen edge in MOS spectra of

bright continuum sources.

Rate Dependent CTI effect ?

Steve Sembay

Page 2: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

Readout direction

Trap

Event 1

Event 2

Page 3: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

Emission timescales for filled traps

(Holland et al. 1993, NIMS, A326, 335)

kT

E

NXt

cthnne exp

1

σn electron capture cross section

Xn entropy factor

υth electron thermal velocity

Ncdensity of states in conduction band

E energy level of trap

T temperature

Page 4: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

Emission timescales for filled traps

(Holland et al. 1993, NIMS, A326, 335)

Level (eV)

te

(-90°C)

te

(-100°C)

te

(-120°C)0.17 0.07 µs 0.19 µs 1.1 µs

0.44 3.8 s 22.9 s 1.4 x 103 s

c.f. row transfer time of MOS = 15 µs

Page 5: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

Around O edge χ2 -> 3.90 – 2.13 with gain offset = 8.7±1.0 eV

Page 6: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

Around Si and Au edge: χ2 -> 1.025 – 0.998 Offset ~ 12.5 eV

Page 7: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

Page 8: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

MOS v RGS Line Energy: N line ~ 432 eV J. Carter (Mallorca 06)

SW Obs.

Most MOS Large Window Mode

Page 9: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

Closed Cal Al line in small window mode

Page 10: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

Closed Cal Al line in small window mode

Page 11: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

Is there a “possible” gain shift at O: CTI dependent on rate?

Method 1: Analyse spectra from different regions

Page 12: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

1) 3C 273 0094

2) MKN 421 0165

3) MKN 421 0171

4) 3C 273 0277

5) H1426+428 0278

6) PKS2155-304 0362

7) PKS2155-304 0450

8) ARK 120 0679

9) H1426+428 0852

10) PKS2155-304 1095

11) PKS2155-304 1266

12) 3C 273 1299

13) MKN 421 1357

Sample of bright AGN/BL Lacs: The “Usual Suspects”

Page 13: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

MOS1

Count Rate v Offset

In Boxes

Before/After Cooling

Page 14: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

MOS2

Count Rate v Offset

In Boxes

Before/After Cooling

Page 15: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

Is there a “possible” gain shift at O: CTI dependent on rate?

Method 2: Flag precursor events from event file

Page 16: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

Readout direction

Flag Bad

Flag Bad

Page 17: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

Flagged events

Page 18: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

Page 19: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

0

2

4

6

8

10

12

14

16

0 5 10 15 20

Offset All Events

Offs

et N

o Pr

ecur

sor

MOS1

MOS2

Page 20: Investigation into the strong residuals seen near the Oxygen edge in MOS spectra of

XMMEPICMOS

Steve Sembay ([email protected])Mallorca 08/04/08

|Summary:

Observed offset is not affected by removal of

precursor events in CCD RAWY direction

This suggests offset is not caused by incorrect

application of CTI measurement due to trap

filling in CCD.