interconnect intermittency detection with sj bist™
TRANSCRIPT
![Page 1: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/1.jpg)
Interconnect Intermittency Detection withSJ BIST™
![Page 2: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/2.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 2
Agenda
What is SJ BIST? Interconnect Reliability – Background SJ BIST Basics SJ BIST Operation SJ BIST Application Summary & Conclusions
![Page 3: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/3.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 3
What is SJ BIST?
SJ BIST = Solder Joint Built-in Self-Test Original solution enabling the verification and
validation of solder joint interconnect reliability Originally developed for FPGA-BGA applications Can be applied to validate the integrity and reliability
of any type of interconnection
![Page 4: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/4.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 4
BGA – PCB Relationship: Die, package, wiring, pins
![Page 5: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/5.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 5
Defects: Location of Cracks/Fractures Corner pins likely to fail first
High stress areas, and corners of the BGA package and die
![Page 6: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/6.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 6
Solder Balls, Cracks and Fractures
![Page 7: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/7.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 7
Fatigue fractures (cracks) are caused by thermo-mechanical stress/strain
During periods of high stress, fractured bumps tend to momentarily open and cause intermittent faults of high resistance for periods of ns to µs
Over time, contamination and oxidation films occur on the fractured faces: the effective contact area becomes smaller and smaller
Transient opens can be detected by event detectors
Mechanisms of Failure
Oxide-covered
area
![Page 8: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/8.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 8
Mechanics of Failure
HALT results - Pulled FPGA – Damaged Solder Balls Undamaged
Damaged: Cracked Cracked, not detectable Fractured, detectable
![Page 9: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/9.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 9
Fractures and Intermittency
![Page 10: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/10.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 10
Defects: Fractures & Intermittency
![Page 11: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/11.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 11
Faults are intermittent: confirmed by CAVE, Auburn Univ., German automobile manufacturer, BAE Systems and other firms Occur during periods of increasing strain Multiple occurrences per cycle Industry standard: 200 ohms +, 200 ns +
Intermittent Faults
![Page 12: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/12.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 12
With present technology, reported electronic system problems in the field cannot be duplicated at the service point or in the lab
“Three/Four-letter” words (CND, NTF, RTOK) Could Not Duplicate (CND) No Trouble Found (NTF) Retest OK (RTOK)
50 to 80% of these CND/NTF/RTOK problem categories are reported by service personnel.
Major culprits – Solder joint intermittencies and NBTI effects in deep submicron ICs
Intermittencies
![Page 13: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/13.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 13
Objectives Detection of impending interconnect failures Unique in-situ testing in operating circuits Technology-independent
Feature and Benefits Detects ball fractures prior to catastrophic failure of
circuit Provides actionable maintenance data Independently tested and verified Endorsed by leading automotive and aerospace
customers
SJ BIST Objectives & Features
![Page 14: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/14.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 14
SJ BIST runs concurrently with host circuit SJ BIST requires dedicated I/0
SJ BIST Implementation
SJ BIST
Functional Circuitry
Functional I/O SJ BIST I/OSJ BIST Control
![Page 15: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/15.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 15
SJ BIST runs concurrently with host circuit SJ BIST requires dedicated I/0
SJ BIST Implementation
SJ BIST
Functional Circuitry
Functional I/O SJ BIST I/OSJ BIST Control
![Page 16: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/16.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 16
SJ BIST runs concurrently with host circuit SJ BIST requires dedicated I/0
SJ BIST Implementation
SJ BIST
Functional Circuitry
Functional I/O SJ BIST I/OSJ BIST Control
![Page 17: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/17.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 17
Similar to a simple memory test: W0 – R0; W1 – R1 Runs concurrently with host circuit Verilog/VHDL core (patent pending)
Each core tests two I/O pins Pins are externally wired together Small capacitor connected to the two pins
SJ BIST™ Operation
![Page 18: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/18.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 18
SJ BIST Operation
Writes a “1” and reads a “1”
Healthy Solder Joint
![Page 19: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/19.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 19
SJ BIST Operation
Writes a “1” butreads a “0”
Faulty Solder Joint
![Page 20: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/20.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 20
Function of operating frequency & desired sensitivity
SJ BIST Capacitor
100 Ohm
300 Ohm
10 Ohm
![Page 21: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/21.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 21
SJ BIST Application
SJ BIST
Inte
rcon
nect
pat
h
On-chip interconnects
Die to substrate (incl. bumps)
Die to board (incl. bumps & balls)
Requirement:Interconnect path dedicated for SJ BIST
![Page 22: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/22.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 22
SJ BIST Application
Testing On-chip Interconnect
Need for dedicated on-chip path between SJ BIST™ Observation pins
![Page 23: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/23.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 23
SJ BIST Application
Testing Die to Substrate
![Page 24: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/24.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 24
SJ BIST ApplicationTesting Die to Board
![Page 25: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/25.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 25
LVTTL − Low Voltage TTL
SJ BIST Simulation Results
InputLow
≤0.8V
High≥2.0V
OutputLow
≤0.4VHigh
≥2.4V
![Page 26: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/26.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 26
SJ BIST Simulation Results
Time
0s 20ns 40ns 60ns 80nsV(V1:+) V(C1:2)
0V
1.0V
2.0V
3.0V
Time
0s 20ns 40ns 60ns 80nsV(V1:+) V(C1:2)
0V
1.0V
2.0V
3.0V
Capacitor charging
Clock = 50 MHz Charge pulse t=20 ns C1=57 pF (47 pF capacitor)+(10 pF of the
I/O port and wires) The time constant =R1·C1 and t
determine the charge voltage In the prohibited zone (0.8 to 2.0 V) there
is guaranteed detection
R1=175Ω R1=700Ω
)( 1110CRt
eUUC
![Page 27: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/27.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 27
SJ BIST Simulation Results
Voltage across the test capacitor
One bump is connected with a 700 Ω
resistor. So the time constant =R1·C1 increases and the test capacitor is charged with only 0.8 V.
A logical ‘0‘ instead of a ‘1‘ is read, a fault is detected.
700 Ω Fault: Same as electrical model and PSPICE simulation
![Page 28: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/28.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 28
SJ BIST specifications Sensitivity: as least as low as 100 Ω Resolution: guaranteed two clock periods Detectable intermittency: as short as ½ of a clock period 50 MHz clock
40-ns guaranteed detection 10-ns detection possible
SJ BIST Application Results
100 Ω fault1 MHz clock
![Page 29: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/29.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 29
Independent test results by German automotive firm Confirmed the same results as obtained by Ridgetop Group No false alarms
SJ BIST Application Results
![Page 30: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/30.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 30
Input (Control) Clock, Enable & Reset
Test Pins 2 bidirectional I/O pins: TP0 & TP1
Output (to host) Failure Flags (fault was detected on TP0/TP1) Active fault flags (fault is active on TP0/TP1 at the
moment of interrogation of SJ BIST) Failure counts (2 8-bit values related to number of
faults detected on TP0 and TP1 respectively)
SJ BIST I/O
![Page 31: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/31.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 31
Available as: Verilog/VHDL core Microcontroller code
Requires dedicated I/O + capacitor Runs concurrently Interconnect reliability verification
Process qualification Lifetime observation
SJ BIST Summary
![Page 32: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/32.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 32
SJ BIST HALT for Process Qualification
![Page 33: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/33.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 33
Contact Information
Hans ManhaeveOffice: +32 50 [email protected]
Ridgetop Group, Inc.
3580 West Ina Rd.Tucson, AZ 85741
![Page 34: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/34.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com34
Ridgetop Products and Services
![Page 35: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/35.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com
Sentinel Silicon Prognostic CoresNBTITDDBHot CarrierRadiation Exposure
Ridgetop SPI Products & Services
InstaCell™ Mixed Signal CoresADC – Analog to Digital ConvertersDAC – Digital to Analog ConvertersOp Amps, References ,and
Comparators
nanoDFM Verification MonitorsPDKChek™ - Die-Level Process
MonitorsMismatch: ∆VT,∆I(on), ∆R, ∆C,
YieldMaxx™ - Die-Level Variation Visualization
InstaBIST™ Test CellsSJ-BIST BGA Solder Joint Built-in TestADC-BIST Self-testing Data Converters
ProChek Semiconductor Process Characterization System
- NBTI - PBTI- TDDB - Hot Carrier- Radiation - Stress Migration- VT Degradation - Electromigration
Q-Star Test™ Current MonitorsIDDQ
IDDT
ISSQ
On-chip & On-boardSingle- & multi-site
Design ServicesASICsCoresRadiation-hardeningMEMSCustom instruments
TopAct® Radiation TransportAnalysis Acceleration
![Page 36: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/36.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com
Advantages of PDKChek
DLPM
Scribe LineTransistor
PDKChek Scribe Line Transistors
Uses test structure on the host die
Requires additional test fixture
Testing can occur pre- and post-packaging
Lost when wafers are sliced
Performs quick production test
Delicate probe measurement: inaccurate and time-consuming
Measures parameters that are useful to the designer
May not directly measure important parameters; needs additional characterization
Data is application-specific
DUTs are extracted from the host designPDK models may not provide accurate predictions
36
![Page 37: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/37.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com
Example: Product Yield Analysis of 90nm Process
PDKChek embedded in the ADC
Example of GDSII Layout for the Ridgetop 14-bit Pipeline ADC
37
![Page 38: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/38.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com
Chip-Level Prognostic Solutions and Applications
Products described herein are covered by U.S. patents:
7,239,163 7,196,294 7,271,608.
Other patents are pending.
Prognostic Cell Library Some Target Applications
NBTI Cell Flash memory, SRAM
HCI CellADCs, biasing circuits, analog, and slow-speed switching circuits
TDDB Cell Flash memory
Metal Migration Cell Damascene process stress, high current density application
![Page 39: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/39.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com
What is ProChek?
ProChek is an innovative low-cost technique to very rapidly characterize the intrinsic reliability of deep submicron nanotechnology CMOS processes (bulk CMOS, SOI and SiGe)
39
![Page 40: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/40.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com
Characteristics of ProChek
Targets bulk CMOS, SOI, SiGe reliability concerns NBTI / PBTI, TDDB, HC, EM, SM, TID
Test Coupon As little as 1 * 1 mm chip area MPW for lower cost 32 – 1024 devices can be tested in parallel for maximum throughput On-chip per transistor heaters to 325 °C, greatly reducing test time Synthesizable (except for on-chip heaters) to speed deployment
Benchtop Tester Fully programmable test conditions cover DC and AC stress cases Portable and compact ATE not needed
Host Controller Easy-to-use software GUI Rich suite of built-in reliability test templates Data processing capabilities
40
![Page 41: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/41.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 41
The cores provided by Ridgetop are "Silicon Proven" and have documented reports available. Ridgetop has designed cores for use in the IBM, TSMC, and AMI processes.
Analog-to-Digital Converter (ADC) Cores Digital-to-Analog Converter (DAC) Cores Bandgap Reference (BGR) Core Op-amp Core
InstaCell™ IP Core Library
![Page 42: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/42.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 42
Ridgetop maintains a complete Cadence design flow, and has designed circuitry down to the 45 nm process node. Ridgetop also has a line of predesigned and characterized IP blocks that can be used to accelerate the time-to-market for your systems. Examples include precision bandgap references, op-amps, comparators, ADCs, DACs and test structures.Our design services include:
Analog/mixed-signal and gate array integrated circuits with varying process nodes of 0.5 μm down to 45 nm
High-speed, high performance, high linearity ADC and DAC design Fuel Cell and Battery Management System components FPGA-based designs, from basic specification to gate level, with timing analysis and
programming IP blocks of specialized functionality Modeling and simulation Completion of back-end design from existing EDIF/SPICE to GDSII layout Rescaling “legacy” designs to smaller process geometries Radiation-hardened/foundry-specific designs
Design Services
![Page 43: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/43.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com
Q-Star Test
IDDQ ,IDDT, ISSQ and other precision current measurement instruments for characterization and test
On-board modules and on-chip sensors
Test and DFT consulting and training services
70 semiconductor companies and 700 instruments installed
Developed by Ridgetop Europe
![Page 44: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/44.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com
44
Q-Star Test Measurement Solutions
Static (Quiescent) Current Measurement Instruments (IDDQ/ISSQ) Standard and advanced IDDQ tests Stand-by current measurements Power-down current measurements Bias current measurements Average current measurements Analog DC and low frequency current measurements ….
Dynamic Current Measurement Instruments (IDDT) Dynamic and transient (IDDT) current tests Power profiling of circuits and systems Active current consumption E-fuse programming validation …
![Page 45: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/45.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com
Why Ridgetop?
World Class Engineering Staff
(All project contributors PhD or advanced degree)
World Leaders in Electronic Prognostics(Awarded most gov’t
contracts)
Domain Expertise(Expansive portfolio
of electronic prognostic solutions)
IP Easily Configured to Target Applications (Seamless integration
and porting)
Customer Service(Dedicated service and support personnel for
on demand assistance)
Commitment to Innovation(Strive to
improve/upgrade existing IP)
![Page 46: Interconnect Intermittency Detection with SJ BIST™](https://reader038.vdocuments.mx/reader038/viewer/2022103004/56649c755503460f949281cd/html5/thumbnails/46.jpg)
3580 West Ina Road | Tucson AZ | 85741 | 520-742-3300 | ridgetopgroup.com 46
For more information about Ridgetop’s products and capabilities please visit:
www.RidgetopGroup.com