The Eighth International Conference on Electronic Measurement and Instruments ICEMI’2007

Experimental Investigation on Electromagnetic Radiation

Effects to an Electronic System Through EMP Source Tan Zhiliang Zhang Rongqi Xie PengHao

(Key Laboratory of Defense Science And Technology, Mechanical Engineering College, Shijiazhuang 050003, China)

Abstract: The radiation effect experiment to a complicated electronic system by using of GW ultra-wide band (UWB) radiation source has been carried out. In cases of opening or closing the door of device under test DUT , the responses of test points on combination No.04 and No.08 of DUT have been measured. The response characteristicsof test points on combination No.02 have been tested at different orientations of antenna of EUT. And spectrum analysis has been performed for response waveforms. The results have shown that the response voltage on internal circuits of EUT may reach about 1.6kV at condition of opening door of DUT when radiated by UWB source with 2.0 104V/m of field strength (rise time is 0.3ns and pulse width is 3~4ns). The maximum response voltage on combination No.02 is about 1.6kV under condition of optimum coupling of antenna. In this case, some of the electronic components which are sensitive to electromagnetic field may be damaged. Keywords: Ultra-wide band (UWB); Electromagnetic

radiation; Response;

1 Induction

The radiation experiment is an important part to study the electromagnetic pulse effects to an electronic system. Since the 70's of 20th centuries, the abroad research organizations [ 1~3 ], such as Harry Diamond laboratory and U.S.A army weapon research laboratory, have studied, on the one hand, the injury of components and the system with the complicated wave ( including square wave, triangle wave, two index waves, saw tooth wave and attenuation sine wave etc ) injection; On the other hand, they have done the research of electromagnetic irradiation effects and protection [ 4~7 ] to tanks, guided missile systems and the

communication systems and planes etc. Many organizations[8~10] have done the research on electromagnetic effects in China. Yet, in view of that our country now does not have clear and definite requirements and standards to the electromagnetic protection capability in the strength electromagnetic environment for large-scale electronics system, and many electronics systems particularly weapon systems have not been tested in this aspect, then electromagnetic protection problems are found in the course of their services.Face with the complicated electromagnetic environment in modern battle-field, how to ensure our weapon system properly operation with high survivability, the research is needed and is to be strengthened. Considering the real battlefield environment, the threat to an electronic system from electromagnetic pulse field is generally caused by the way of radiation. The attentions for UWB EMP with high power short pulse and wide frequency spectrum has been taking. The upset or damage effects to electronic systems by UWB EMP is becoming hot-point in research field. However alittle research work has been done in combining high power UWB EMP with concrete system so far. This paper is a report based on the damage threshold values of electronic components and injection damage effects of subsystems and analyze the radiation effects of the whole electronic system. The purpose is to assess the electromagnetic vulnerability and survivability of the system by way of a comprehensive study.

2 Experiment Principle and Method

A fully open place is selected to fix the UWB EMP source. The radiation antenna axis of UWB

1-4981-4244-1135-1/07/$25.00 ©2007 IEEE.

The Eighth International Conference on Electronic Measurement and Instruments ICEMI’2007

EMP source is aimed at the electronic system, and its control box is connected to UWB device through the cable. Then, making full use of the length of the cable and let the control box far away from the radiation antenna of the device in order to avoid radiation harm to personnel. The test instrument which is placed in the inner of electronic system, is used for recording the response waveform at each tested point. Once UWB EMP source radiates an EMP, the respond waveform and maximum voltage at the tested point of electronic system will be recorded. The electromagnetic energy is mainly coupling to the system by antenna when radiated. It is found that the influence of opening or closing the door plays great role in the experiment. In fact, opening and closing the door are needed in the use such as maintaining and service. So the situations of opening and closing door are selected in the experiment. The radiation principle scheme is shown in figure 1.

Equipment and the instruments used in the experiment includes: radiation source

kilo-megawatts UWB EMP radiation devicevertical polarized 400 MHz of center frequency, 1GW of maximum radiation power pulse, 0.3ns of rise time, 4ns of pulse duration voltage detector (PHILIPS PM8931/09 20M /2.4pF 100 1Max4kVpk) and current detector (Tektronix CT-1 Current Trans 5mV/mA 1.5GHz 8GS a/s INTO 50 ) Oscilloscope (Agilent Infiniium Oscilloscope). The radiation field of UWB EMP may be calculated as following

: 21SS

)()( tftE

Where, is the radiation field intensity at the

location of tested equipment, and the unit is V /

cm;

( )E t

( )f t is the waveform tested on the wideband

oscilloscope at the location, the unit is V; is sensitivity of measured antenna, the unit is cm;

SS

is the average value of coaxial transmission line S21

among 10M~2GHz frequency.

3 Results and Analysis

3.1 response results and analyses of assembly under radiation.

The tested system is made up of 16 assemblies and 3 subsystems. The test points at No.04 assembly (timed and range finder assembly) and No. 08 assembly (frequency-jumping assembly) are

respectively. Figure 2 and 3 shows the maximum values of the response on the oscilloscope at different points when the electronic system is at the conditions of opening and closing door respectively and the field intensity of UWB is 2.0

10

EMP source

Radiationantenna

EMP to DUT DUT

Controlbox Oscilloscop

Connecting probes to internal testpoints on DUT

Fig1 Radiation principle scheme

chosen to test the radiation response of the system

4V / m.

0 5 10 15 200

20040060080010001200140016001800

Fig2 maximum response voltage on test

points of assembly 04

1-499

The Eighth International Conference on Electronic Measurement and Instruments ICEMI’2007

In the figures, abscissa axis represents the code n

he figures that the response te

umbers of tested points, and ordinate represents the average value of the max respond voltage which tested at every point. The tested points from 1 to 20 corresponds to in assembly No.04: 1-I touch-off, 2- rough touch-off, 3-II touch-off, 4-II drive, 5-electricity-aiming, 6-Gate 1, 7- Gate 2, 8-Gate 3, 9-2km frontier, 10-the begging of the frequency-jumping,11- the sampling of Interference, 12- continuous frequency-jumping, 13- 5MHz signal, 14-according-pulse, 15- standard pulse, 16- 1MHz signal, 17- monitoring wave-door, 18-dealing of the respond wave, 19-D/T, 20-the grounding. The tested points from 1 to 7 corresponds to in assembly No.08: 1- grounding, 2-VCO, 3-the source of 15V, 4- I touch-off pulse, 5-the control-pulse II of frequency-jumping, 6- the control-pulse I of frequency-jumping, 7- the control-pulse III of frequency-jumping.

It can be seen in tsted at different points is different to some extent.

The experimental results indicate that the response voltage of test points No.6, 7, 8, 9, 18, 19 20 on assembly 04 and 2, 3, 5, 6 7 on assembly 08 are clearly higher than that of other tested points. It means that the parts may be damaged in these circuits when the electric over-stress exceeds damage thresholds of the most sensitive parts. Then the system will break down or may not operate properly. Supposing the tested system acts as a linear system, looking electric field near the system

as input (F), and the response (R) on system as output. Then, the transmitting function (G) between the system response and field is as following

1 2 3 4 5 6 7600

800

1000

1200

1400

1600

( )F S( )( )

G SR S

Where, F S and S are Laplace transformation

ts and analyses of radiation effects

oint on assembly 02 is selected to study th

se of circuit inside the te

Rof input and output time-domain function respectively. Once the tested system is fixed, it means that the transmitting function is fixed too. It also means that, only if known the input, the response can be calculated according to the transmitting function. Based on the above functionit is convenient to make simulation by computer and to evaluate the system vulnerability and survivability. 3.2 The resul

Fig3 maximum response voltage on test

points of assembly 08

to electronic system under the condition of receiving antenna in different directions and positions.

A tested pe radiation effects of the system’s receiving

antenna which is in different directions and positions. The initial direction of receiving antenna is the same to the direction of the UWB source (the intersection angle is 0), the rotation’s step length of receiving antenna is at angle 450. When the direction of the receiving antenna rotates to opposite to that of the radiation source’s antenna (the intersection angle is Angle 180), the antenna is in optimum coupling state.

Figure 4 shows the responsted system with the antenna at different

directions and positions. It is found that the response voltage increases with the increasing of rotation angle, no matter the tested system is in opened or closed door. The peak response voltage at tested point on CZ12 (Response wave I) is 99 to222.2V when the door is closed and is 594.5~1562V(when the door is opened). The response voltage in the best coupling state is 2 to 3 times more than that of the worst coupling state. It means that the receiving antenna is an main receiving source of electromagnetic pulse. There is

1-500

The Eighth International Conference on Electronic Measurement and Instruments ICEMI’2007

great effect on the characteristics of the system in its electromagnetic protection ability.

4 Conclusions Experimental research and analysis indicate that

re

. Component damage from electromagnetic

[2] n R. Paul. A SPICE model for multi-conductor

[3]

[4] y

[5] Bruno M.K. Damage characterization of semiconductor

[6] grated circuit electromagnetic

[7]

[8] W W. Effects and effecting

[9] eoretical solution of transient radiation

[10]

sponse voltage of circuit inside system may reach 1.6kV under condition of UWB EMP source radiation (:field intensity is 2.0 104V/m, pulse rise time is 0.3ns, pulse width is 3 to 4 ns). And electromagnetic sensitive electronic components may be damaged while operating in this environment for long time. The response voltage in circuit on assembly 02 of system under test sometime also reaches 1.6kV when the antenna is in optimum coupling. The response voltage is generally 0.1 to 0.8 kV when the door of the tested system opened. This indicates that the electromagnetic energy coupling ability is fairly strong through the holes windows doors etc. on electronic system. This means that the effective measures should be taken in electromagnetic protection when electronic system is under powerful EMP environmental conditions. The response band width of EUT is between 0 to 500 MHZ and the main frequency is about 70 MHZ whenever the system is in open or close door situations after spectrum analysis. The main frequency is far lower

than the operating frequency of this system. So, the frequency of UWB EMP field is not the main factor to disturb system. The above results are the base to assess the electromagnetic vulnerability and susceptibility of the system and it is of meaning in improving protection and hardening measures.

References

-20 0 20 40 60 80 1001201401601802000

2004006008001000120014001600

[1] Miletta J.R

pulse (EMP) induced transients[R]. AD-A053899, Oct

1977.

Clayto

Fig 4 maximum response voltage when antenna is at transmission lines excited by an incident

electromagnetic field[J]. IEEE Trans. on

electromagnetic compatibility, 1994, 36 4 342~354.

Standler R.B. Equations for some transient

different directions and positions.

over-voltage test waveform [J]. IEEE Trans. on

electromagnetic compatibility, 1988, 30 1 :69~70.

Andrew A., Cuneo.Jr. XM-1 tank EMP susceptibilit

and survivability test program[R]. AD-A094627,

1989.

devices for the AN/TRC-145 EMP study[R].

AD-A095021, 1980.

Roe. J.M. Inte

susceptibility investigation[R]. AD-A043776, 1977.

Seregelyi J.S., Gardner C, Walsh J.A. EMP hardening

investigation of the PRC-77 radio set[R].

AD-A266412, Feb 1993.

ei G H, Chen Y Z, Sun Y

mechanism of microwave irradiation on the radio fuse.

High Power Laser and Particle Beams,2005,

17(1):88—92.

Chen Z.Q. Th

from traveling-wave linear antennas[J]. IEEE Trans. on

electromagnetic compatibility, 1988, 30 1 : 80~83.

Chen Y Q, Liu S H, Wu Z C, et al. Experimental study

on EMP fields radiated by ESD. High Power Laser and

Particle Beams,2005, 11(3):359—362.

1-501