iec 61850 test equipment requirements - cepel€¦ · and its operating environment at the ......

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IEC 61850 Test Equipment IEC 61850 Test Equipment Requirements Requirements

Dr. Alexander Apostolov

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Intelligent Substation Automation SystemsIntelligent Substation Automation Systems

Protection IED

Protection IED

Advanced Merging Unit

Intelligent Sensor


StatusControl

Protection IED

Intelligent Sensor


StatusControl

LAN Switch

Communications Based Protection IED

Communications Based Protection IED

Communications Based Control IED

Communications Based Control IED

Communications Based Monitoring/Recording IED

Communications Based Monitoring/Recording IED

Analysis Tools

HMI

Configuration Tools

Comms Gateway

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Intelligent Substation Automation SystemsIntelligent Substation Automation Systems

Substation

ComputerSubstation

Computer

IMED

IMED

IMED

IMED

IMED

IMED IMED IMED

IMED

IMED

IMED

IMED

IMED

IMED

IEC 61850

Substation PCMR

Unit

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Intelligent Substation Automation Intelligent Substation Automation SystemsSystems

Substation Protection, Control, Monitoring & Recording (PCMR)

Device PCMR Device PCMR

Bay PCMR

Substation HMI

Device PCMR Device PCMR

Bay PCMR

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Substation Communications ArchitectureSubstation Communications Architecture

Ethernet Switch

Router

SCADA Master

WAN

Substation Computer

Substation HMI

MU IOU MU

IED IED IED IED

Ethernet Switch Process Bus

Substation Bus

IOU

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Quality ProcessQuality Process

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Type testType test

• The verification of correct behavior of the IEDs of the SAS by use of the system tested software under the environmental test conditions corresponding with the technical data.

• Marks the final stage of the hardware development and is the precondition for the start of the production.

• Type test must be carried out with IEDs that have been manufactured through the normal production cycle

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System testSystem test

• System test is used to check the correct behavior of the IEDs and of the overall SAS under various application conditions.

• The system test marks the final stage of the development of IEDs as part of a SAS product family

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Factory Acceptance Test (FAT)Factory Acceptance Test (FAT)

• The factory acceptance test (FAT) is a customer agreed functional tests of the specifically manufactured SAS-installation or its parts, using the parameter set for the planned application.

• This test should be carried out in the factory of the system integrator by the use of process simulating test equipment

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Site Acceptance Test (SAT)Site Acceptance Test (SAT)

• The site acceptance test (SAT) is the verification of each data and control point and the correct functionality inside the SAS and between the SAS and its operating environment at the whole installed plant by use of the final parameter set.

• The SAT is a precondition for the SAS being put into operation

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Test responsibilitiesTest responsibilities

• The manufacturer is responsible for the correct handling of type tests and system tests of his individual products and the SAS product family.

• Type tests and system tests are preconditions for starting the regular delivery.

• All IEDs have to pass device specific routine tests defined by the manufacturer to ensure quality before the products are handed over for delivery.

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Test responsibilitiesTest responsibilities• Customer specific verifications and

approvals may be required according to the customer’s philosophy and shall be negotiated between the system integrator and the customer.

• The system integrator is obliged to prepare and carry out these special investigations with individual products and the overall SAS.

• The system integrator is obliged to prove the fulfillment of the technical requirements, including performance criteria.

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Test responsibilitiesTest responsibilities• When introducing an SAS, the system

integrator is responsible for ensuring that all functions are jointly tested by the representatives of the system integrator and the customer

• The Factory Acceptance Test (FAT) is optional

• The Site Acceptance Test (SAT) is mandatory

• Both are performed with the specific configuration and parameter set of the customer.

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Test responsibilitiesTest responsibilities• The successful finishing of the FAT (if

required) is the precondition for the equipment delivery and the further site acceptance test at the customer’s premises.

• FAT and SAT, as well as their contents, shall be negotiated between the customer and the system integrator.

• The commissioning of the SAS on site is normally the responsibility of the system integrator.

• Commissioning is followed by a trial operation phase.

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Test EquipmentTest Equipment

• Test equipment: all tools and instruments which simulate and verify the input/outputs of the operating environment of the SAS such as switchgear, transformers, network control centers or connected telecommunication units on the one side, and the communication channels between the IEDs of the SAS on the other

• The test equipment shall support:• normal process simulation• transient and fault process simulation• communication check and simulation

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Normal Process Test EquipmentNormal Process Test Equipment

• Basic Process test equipment must be able to provide:

• all alarms and position indications for the substation control system

• enable the simulation of measured values (including overrange)

• be able to display all commands from the SAS.

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Normal Process Test EquipmentNormal Process Test Equipment• More complex test equipment must be

able to simulate reactions of the switchgear in real time.

• There is a need to be able to generate various conditions for the reactions, such as to simulate an earth fault on one busbar section during a switching sequence.

• Test equipment should also be capable of generating a large quantity of data traffic in a short time or intermittent data traffic on a regular basis.

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Transient and Fault Test Transient and Fault Test EquipmentEquipment

• This test equipment should be capable of injecting programmable transients of voltages and currents in a three-phase power system. It shall allow the simulation of many kinds of faults or other abnormal conditions such as:

• Short circuit faults• Power swing• Saturation of current transformers • Others

• The test equipment should be capable of producing simulated faults, thus producing disturbance records.

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Communications Test Communications Test EquipmentEquipment

• This test equipment is used for performing tests at all communication channels for:

• internal links of the SAS• telecommunication

• The communication test system should be a convenient and efficient tool which enables the performance of the following functions at all required levels (network control center, substation, bay and process level):

• simulation of a server, simulation of a client, monitoring of the data traffic;

• quality analysis of the data traffic (for example, the quality of electrical signals, time breaks, etc.).

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Basic Test RequirementsBasic Test Requirements• The manufacturer should provide a test concept that

covers all activities beginning with prototype functional tests in the development state to the final type and system tests.

• The scope and object of tests, the test procedures and the passing criteria must be specified.

• All tests shall be documented in such a way that the results are reproducible.

• All tests should be performed by an internal part of the manufacturer’s organization that is qualified for performing the tests and has the organizational independence to state whether a product has passed the tests or not.

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System Test RequirementsSystem Test Requirements• The system test is the proof of correct functionality

and the performance of each IED under different application conditions (different configuration and parameters) and in co-operation with other IEDs of the overall SAS product family including all tools.

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Type Test RequirementsType Test Requirements

• The “fitness for use” of a newly designed product shall be proven by a type test.

• The type test shall be performed using samples from the manufacturing process.

• The type test is the verification of the product against the technical data which are specified, such as:

• mechanical withstandability• electromagnetic compatibility• climatic influences• functional correctness and completeness

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Routine Test RequirementsRoutine Test Requirements

• The routine test consists of special hardware and functionality tests

• The routine tests should be carried out for each product before leaving the manufacturer.

• Routine tests include:• Function tests• Insulation test• Burn-in test

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Conformance TestConformance Test

• The conformance tests are performed on the communication channels of IEDs.

• They include the verification of the communication procedure in accordance with the standard or its parts.

• Conformance Testing is defined in IEC 61850 -10.

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Required documentationRequired documentation

• Model Implementation Conformance Statement (MICS): details the standard data object model elements supported by the system or device

• The Protocol Implementation Conformance Statement (PICS) is a summary of the capabilities of the system to be tested.

• Protocol Implementation eXtra Information for Testing (PIXIT) contains system specific information regarding the capabilities of the system to be tested and which are outside the scope of the 61850 standard. The PIXIT shall not be subject to standardisation.

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Conformance Test ProcessConformance Test Process

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Conventional Multifunctional Conventional Multifunctional IED PerformanceIED Performance

Analog Sensor

Sensor Module

Function Module

Outputs Module

Status Sensor

Input Module

Process

Process

ProcessControl

MultifunctionalIED

Process

tSM tFM tOM tPC

tEVT

Event Start Event End

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IEC 61850 Based Hybrid IEC 61850 Based Hybrid Function PerformanceFunction Performance

Analog Sensor

Sensor Module

Interface Module

LANSwitch

Interface Module

Function Module

Outputs Module

Status Sensor

Input Module

Interface Module

Process

Process

ProcessControl

Process

Merging Unit Protection IED

Input/Output Unit

tSM tIM1 tLAN tIM2 tPM tOM tPC

tEVT


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IEC 61850 IEC 61850 BasedBased Hybrid Function PerformanceHybrid Function Performance

Analog Sensor

Sensor Module

Interface Module

LANSwitch

SAV Interface Module

Function Modules

Outputs Module

Process

ProcessControl

Process

Merging Unit

Protection IEDGOOSE Interface Module

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IEC 61850 IEC 61850 BasedBased Function PerformanceFunction Performance

Analog Sensor

Sensor Module

Interface Module

LANSwitch

Interface Module

Function Module

Outputs Module

Status Sensor

Input Module

Interface Module

Process

Process

ProcessControl

Merging Unit Protection IED

Control Interface Unit

tSM tIM1 tLAN1 tIM2 tFM tOM tPC

tEVT


tIM3 tIM4tLAN2

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FunctionalityFunctionality

• Protection• Control• Monitoring• Recording• Analysis• Metering• Remote interface

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Conventional Functional Test Conventional Functional Test SetupSetup

Multifunctional IED

Laptop Computer

V I Trip

Test Device

52a

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Test setupTest setup

IEC 61850 Based IED

V I

Ethernet

Ethernet Switch

Laptop Computer

Ethernet

GOOSE or GSSE

GOOSE or GSSE

Trip

IEC 61850 Based Test

Device

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IEC 61850 Based IED

V I

Ethernet

Ethernet Switch

Laptop Computer

Ethernet

GOOSE or GSSE

GOOSE or GSSE

Trip

IEC 61850 Based Test Device

IEC 61850 Based MU

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Protection TestingProtection TestingConventional HardConventional Hard--WiredWired

Hard-wiredAnalog Signals

Hard-wiredbinary outputs to binary inputs

ProtectionRelay Test Set

GSE

Sampled Values

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The Vision: Fully Networked The Vision: Fully Networked Protection TestingProtection Testing

GOOSE, GSSE

SV (Sampled Values)

Test Set Protection Relay

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GOOSE Module FunctionsGOOSE Module Functions

• Configuration of the CMC 256 + NET-1• Subscriptions• Simulations (Publishing GOOSE)

• Editing GOOSE Data• GOOSE Parameters• Datasets

• Mapping• To / from binary Inputs / Outputs

• Importing GOOSE Data from SCL

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OMICRON's LayeringOMICRON's Layering

Binary Inputs Binary Outputs

GOOSESubscriptions

GOOSESimulations

Test Modules

Network

Mappings

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Getting the GOOSE DataGetting the GOOSE Data

• Import SCL File• File | Import Configuration• SCL File (*.icd, *.cid, *.scd)

• All GOOSE Data are imported• Both for Subscription and Simulation• Delete what is not needed / wanted• New Import adds Data again

• Eventually Edit GOOSE Data

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Virtual WiringVirtual Wiring

• GOOSE Configuration is another Type of HCC

• Binary I/Os of Test Set are assigned

• Fully Automatic• Totally virtual• No changing of Wires• No User Interaction

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Multiple GOOSE MappingsMultiple GOOSE Mappings

• Map only Dataneeded for a Specific Test

• Re-Assign Binary I/Os of the Test Set as needed

• Fully automatic

• Use Standard Assignments• Bin In 1 = Trip• Bin In 2 = Start• Minimal Setup Work• Re-use of Existing Test Plans

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The IEC 61850 Functional System TestThe IEC 61850 Functional System Test

Scheme Testing Tool

IED Simulator

Test Device

IEC 61850Standard System

Configuration Tool

SCDFile

IEC 61850Standard Test Configuration

Tool

NetworkSystem

Simulator Other Test Modules

MU Simulator MU

Simulator MU Simulator

IED Simulator

IED Simulator

ICDFile

ICDFile

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The IEC 61850 Functional System TestThe IEC 61850 Functional System Test

IEC 61850Standard IED Configuration

Tool

CIDFile

Scheme Testing Tool

IED Simulator

Test Device

IEC 61850Standard System

Configuration Tool

SCDFile

IEC 61850Standard Test Configuration

Tool

NetworkSystem

Simulator Other Test Modules

MU Simulator

CIDFileCID

File

Test Device Test Device

MU Simulator MU

Simulator

IED Simulator

IED Simulator

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