icp test report certification packet/media/electronics... · 8/13/2012  · test report no. i...

63
1 ICP Test Report Certification Packet Company name: Littelfuse, Inc. Product Series: Lightning Surge Protection – TVS Diode arrays Product #: SP4061-04UTG, SP4062-04UTG Issue Date: August 13, 2012 It is hereby certified by Littelfuse, Inc. that there is neither RoHS (EU Directive 2002/95/EC, 2011/65/EU)-restricted substance nor such use, for materials to be used for unit parts, for packing/packaging materials, and for additives and the like in the manufacturing processes. In addition, it is hereby reported to you that the parts and sub-materials, the materials to be used for unit parts, the packing/packaging materials, and the additives and the like in the manufacturing processes, are all composed of the following components. Issued by: <Global EHS Engineer> (1) Parts, sub-materials and unit parts This document covers the Diode Array RoHS-Compliant series products manufactured by Littelfuse, Inc. Raw Materials Used Please see Table 1 (2) The ICP data on all measurable substances Please see appropriate pages as identifed in Table 1 Remarks. Form 585-047 Rev. A 2/21/06

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Page 1: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

1

ICP Test Report Certification Packet

Company name : Littelfuse, Inc. Product Series: Lightning Surge Protection – TVS Diode arrays Product #: SP4061-04UTG, SP4062-04UTG

Issue Date: August 13, 2012 It is hereby certified by Littelfuse, Inc. that there is neither RoHS (EU Directive 2002/95/EC, 2011/65/EU)-restricted substance nor such use, for materials to be used for unit parts, for packing/packaging materials, and for additives and the like in the manufacturing processes. In addition, it is hereby reported to you that the parts and sub-materials, the materials to be used for unit parts, the packing/packaging materials, and the additives and the like in the manufacturing processes, are all composed of the following components.

Issued by:

<Global EHS Engineer>

(1) Parts, sub-materials and unit parts This document covers the Diode Array RoHS-Compliant series products manufactured by Littelfuse, Inc. < Raw Materials Used

Please see Table 1 (2) The ICP data on all measurable substances Please see appropriate pages as identifed in Table 1

Remarks:.

Form 585-047 Rev. A 2/21/06

Page 2: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

2

Table 1: List of Raw Materials covered by this report

Total Parts Raw Material Part Number Raw Material Description Page(s) 1 N/A Wafer 1 3-6 2 N/A C194_PPF Plating Lead frame 7-37 3 N/A Adhesive 8600 – RoHS 38-47 4 N/A Copper Bonding Wire 48-55 5 N/A Epoxy Molding Compound 56-63

Page 3: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No. : CEl201z12U2 Date: 2012t01t18

EPISIL TECHNOLOGIES INC,NO. 3, INNOVATION ROAD 1, SCIENCE BASED INDUSTRIAL PARK, HSINCHU.

: As specified by ciient, with reference to RoHS Oircctivedetermine Cadmium, Lead, I\rercury, Cr(Vl) contenls in

: Please refer to next page(s)

Validit nownFor Ques-liPlease Co ith sGs

P a g e : 1 o f 4

2011/65/EU Annex ll tothe submitted 6ample.

ll []|llln||[I||lTAIWAN, R. O, C.

Thefollowing sample(s) was/were submitted and identified by/on b€halfofth€ client as:

IC WAFERALUI\,/lINUIU PROCESS2012101t112012/01 t1 1 TO 2012t01 t 1 I

To6t Requested

Test Result(s)

Sample DescriptionStyle/ltem No.Sample Receiving DateTesting Period

t{b.Cgmd forsGSIAIWA

{Nw4p

Page 4: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No.: CE|201Z12U2 Date :2012to1t18

EPISIL TECHNOLOGIES INC.NO. 3, INNOVATION ROAD 1, SCIENCE BASED INDUSTRIAL PARK,

Paget 2 ol 4

t [t! [t]||!fHSINCHU, TAIWAN, R. O. C.

Test Result(s)

PART NAME No.1 I,/]ULTICOLOR WAFER

reference to tEC 62321:7008-ind-

ith reference to tECG2giJ26dEEiled by ICP-AES.

reference to IEC 62321:7008cna-

Hexavalent ChromiuFT rence to IEC 62321i 2008 andperfomed by UV-VIS.

Note i1. mgikg = ppm : 0.1M% = loooppm2. n.d. = Not Detected3. iIDL = l4ethod Detection Lamit

i lF*f i" ^ : '*t" ' ' " 1* r" *1 '- ' ; :e e?erTlo"b.t*erq1" * ' :". . . : . t---

.r":.rni{.":: f.4-:|.li:,11';,"1",1*.l]:."":;1.""-%e-.'""*:e;6:":"rf$:ffii",..,j"".+;pf::B^rt ;e;*S;o;.,-".:; i"{"".f;:*T;;;!"-; ilE"" .'t;,;*fi;ly:t;fl:,;';:"s.;:f.";/,,39;3:i,.i,-";x.dr;r:;st :3h.s;;i:_i"; t';_1;;-*"1::: ll i:"iui.,;;.;1.]ii",T*:'"i9li.::t.'s"'".:;iJ"oiidt:x,?i;rf,,";:::";",;"*;:;j.-.,.#;"{,i":*",:h,r*j;i,';l;gjj::r_;{,pll}::

Page 5: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No. I CE|2012J 12342 Date :2012t01t18

EPISIL TECHNOLOGIES INC,NO. 3, INNOVATION ROAO 1, SCIENCE BASED INDUSTRIAL PARK, HSINCHU, TAIWAN, R.

ICP.AES

Sample Material DigestionAcidS'teel, copper, aluminum, solder Aqua regia, HNO3, HCl, HF, HrO,Glass HNO3/HF

Gold, platinum, palladium. ceramic Aqua regia

Silver HNO3

Plastic HrSO., HrOr, HNO3, HCI

Others Any acid to totat digestion

Page: 3 of 4

rr[[ t|| ]l|tI|o. c.

1) These samples were dissolved totally by pre-conditioning method according to below flow chart.( Cr"' test method excluded )Name of the per6on who made measuement: Climbgreat yangName of the person in charge of measurement: Troy Chang

2)s)

{rlii:fli'J: i:f '".i'iif iigl ii.T:ii:r 5H .:r:[:"]ri,:ii*ri'ji!' j.:e1i!i:,F.jr*" -*" * *.".

, . 4 "db a c€Tu , cdo i r o re d ,Nc o so .d " ; a .aadas rcqiq iFT,oLorrii.;.;j.,. _..,.".." ",."."

*,..Js"y_..%,.-.j... ?;l,ft;;

il#-i.rif lffilfl,li"rYiiil!.#. tri*L.,lliu,it?1tr3it;*r';t*-1?rtritii:lifi:*3;l*!|;:t"fJJa,"#j[f]m**"i,,*m*tf,n"*rl.*imee,tre o,hsdm,ns,,s uirarraian ft;J;;;t;i;$0@6,he,

--r,"'.]ri.?Jrrr r.' ],i;Li,i#,!; t.ti? g!#Tgj N.fi::!. ?^r".: : :1,,,,',.,,'

Sample Measurement

Acid dagestion by suitable aciddepended on different samplematerial (as below table)

Microwave digestion with

HNO3/HCVHFAdd appropri€te amount ofdige6tion reagent

Heat to appropriate

temperature to extract

Cool, filter digestate

through filter

Add diphenyl-carbazide for

color development

measure the absorbanceat 540 nm by UV-VIS

Page 6: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test ReportEPISIL TECHNOLOGIES INC.NO. 3, INNOVATION ROAD 1,

Page: 4 of4

|ltI |||| ll |lllc.

No.. CE12012J12342 Da['e :2OiZOr1a

SCIENCE BASED INDUSTRIAL PARK, HSINCHU, TAIWAN, R. O.

t The togted sample / part is marked by an afiow if il,s shown on the photo. ,

*' End of Report ".

i3fi:fi'rTiT:,jlT'f:f:):a}jij1if,1ii;i]Epf1,igg]l]f:hj.:-1,ej.J'|j:'g]lii1E1{.?M€mdbqd"edeii"i{iFl;ii',;#i:ilit"-.iPj":"1";:i{*l **{'.i;""::;r#;t#H.*f;3 ';:"'.r.",i":;Tasi;:"irirr.i"";;ts

'.'dr- ha , " d L . 's :"a;""":ii:.""::{e r:i::.:: iiiJ:T;" jT;:q T.: ;;':;"-*.fl'":,:,i ":.;g;i}e#;i"f**i.?,131;:i:;i;'"".,:;;JJi:,i.:3e,i:i"J":f:."";.,;ri"";$;r;;,.;aL;,.,;:i"{1r."}",,e:,:i;j;."tg"t,lr';:,.ii"iT^L::. ++, ,,r.,",r r;l,i.ti,.ii.|.il,i!,,1!l;1u;;*.|*i,,T1:1:,... " , : l_:*

.__ _

L2342

Page 7: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No. I CE12011t42129

SAMSUNG TECHWIN CO,, LTD,42, SUNGJU-DONG. CHANGWON. KOREA

Dale:201114120 Page: 1 of 31

Validi nownFor QueaPlease C ith scs

lll]tIltt]flllllll

The following sample(s)

Sample DescdptionMaterialStyle/ltem No.Buyer/Order No.Sample Receiving DateTesting Period

AYAU11-01607 (ONE SAMPLE OF LEAD FRAME)METALALLOYC194-UPPFLF_RoHS-1 1 040GE0(X2011t04t132011tMh3 70 2011n4t20

was/were submittod and identified by/on behalf of the client as:

T65t Result(s) : Please refer to next page(s).

Ch-dcd Lk brY-TdFd

p€(9 bied ris bn,eood €iior.acomranv i ' r ! 1 , i l r ' r r - 1 ' : r . r r r . " J i l n . l [ . t ; i l l i i l ] 1 . . , ! . J . r . r 3 ' ! 11 .

iygbjdlo6cene6fuiditonsdse0'6qidaddal5't'! ' 'deon€q

ont :nd vhn rh. ihrs or c ,6d s ns

chehke L{* nw!.hldiadwd L lr.FjlE;1,,:{1@60lre

lor|rSi|tldftrr|d

Page 8: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No. . CE12O11142129 Dale: 2O11l4l2O P a g e : 2 o f 3 1

SAMSUNG TECHWIN CO,. LTD,42, SUNGJU-OONG, CHANGWON, KOREA

SILVER COLORED METAL SHEET

lll ]|l! |l[] !

Test Resultls)

PART l.lAME No.1

Test ltem (s): Unit lrethod I'DLResultNo.l

Cadmium (Cd) mg/Kg With refe.enc€ to IEC 62321r 2008 andperfomed by ICP-AES.

2 n.o,

Lead (Pb) mg/Kg With reference to IEC 6232 1 : 2008 andperformed by ICP-AES.

2

Mercury (Hg) mg/Kg With referenc€ to IEC 62321: 2008 andperformed by ICP-AES.

2 n.d.

Hexavalent Chromium Cr(Vl) bySpot test / boiling water extraction

With referenc€ to IEC 6232 1 : 2008 andperformed by Spot test / boiling waterextraclion Method. (See Note 8)

0.02mg/kgwith 50 cm'z

surtace

Negative

Antamony (Sb) mgikg Wilh reference to US EPA Method30508 forAntimony Content. Anatysi6was performed by ICP-AES.

2 n.d.

Beryllium (Be) mgikg With reference to US EPA Method30508 for Beryllium Content. AnalysiswEs performed by |CP4ES.

2 n.d.

Bromochloromethane (CAS No.:74-97-5)

mgKg With reference to US EPA 502 1method. Analysis was performed byGC/MS.

1 n.d.

Sulfur Hexafluofide (SF6) (CASNo.:2551-62-4)

mg/kg With eference to US EPA 5021method. Analysis ! ras pedormed byGC/MS.

1 n.d.

2- (3,tui-ten-buty12-hydroxyphenyl)-2H-benzotriazole(CAS No.: 38,{+71-7)

mg/kg With reference to US EPA 3540Cmethod- Analysis was performed byGC/MS.

5 n.d.

PVC Analysis uras performed by FTIR andFLAME Te6t.

Negative

Bromomethane (CAS No.: 74-83-e)

mgikg With reference to US EPA 5021method. Analysis was performed byGC/MS.

1 n.d.

compant 4" .1 . i J l , - :R i r r r r j i l l n r j , i i , . ! I * f !1 r1r I I , r r lu l t l t rrh s dneil s ,su8d br be cohpany rqed b b &israr co.d ' ois dr s

- " 'o: " o "" dh. .-.r,o d si ,

o^t rnd v bn rh. rmis d c 6 s 'ns

! rds.dzo@ N4rriF.'rrdqio/! I Ir!!. !:a6j3,,,;t+s6olree

Me6bnd6e*s6relp66s5AJ

Page 9: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No.'.CE12011142129 Dai:e 2011t4t20 page: 3of 31

SAMSUNG TECHWIN CO., LTD.42, SUNGJU.DONG, CHANGWON, KOREA

itl tllt]lltNl

Test ltem (s): Unlt lrethod MDLResultNo.l

Polychlorinated Biphenyls (PCBS)(CAS No.: 1336-36-3)

mg/Kg With reference to US EPA 3540Cmethod. Analysis was pedormed byGC/l,,lS.

0.5 n.d.

Polychlorinated Terphenyls(PcTs)

mg/Kg With reference to US EPA 3540Cmethod. Analysis was pertormed byGC/MS.

0.5 n.d.

Alkanes, C1G13, chloro (ShodChain Chlorinated Paraffins) (CASNo.:85535-84-8)

With reference to US EPA 3540Cmethod. Analysis was performed byGC/MS.

0.01 n.o,

Polychlorinated Naphthalene(PCNS)

m9Kg With reference to LJS EPA 3540Cmethod. Analysis was pertormed byGC/MS.

5 n-d-

Perf I uorooctane sulf onate6(PFOS)PFOS - AcidPFOS - lletal SaltPFOS -Amide

mg/Kg With reference to US EPA 3540C:1996 method for PFOS Content.Analysis was perform€d by LC/MS.

1 0 n.d.

PFOA (CAS No.: 335€7-1) mg/Kg With reference to US EPA 3F!40C:1996 method for PFOA Content.Analy6is was performed by LC/MS.

1 0 n.d.

Organic-tln compoundsTributylTin (TBT) (CAS No.r 688-73-3)

mdks With reference to DIN 38407-13.An€lysis ,,r€s performed by GC/FPD.

0.03 n.d-

TriphenylTin (TphT) (CAS No.:66&34-S)

mg/kg With referenc€ to DIN 38407-13.Analysis wes performed by GC/FPD.

0.03 n.d.

Tributyl Tin Oxide (TBTO)"' (CASNo.: 56-35-9)

mg/Kg With reference to DIN 38407-13.Analysis\ ras performed by GC/FPD.

n.d.

HalonsHalon-1211 (CAS No.: 353-59-3) mg/Kg With reference to US EPA 5021

method. Analysis was performed byGC/MS.

'I n-d.

Halon-1301 (CAS No.: 75S3-8) msyKg With r€f€rence to US EPA 5021method. Analysis ',,€s performed byGC/MS.

1 n.d.

Halon-2402 (CAS No.: 124-7!2) mSikS With reference lo US EPA 5021method. Analysis \r/as performed byGC/MS.

1 n.d.

pstsli€$ed rhs Gn,eood e^idl becomp.ny i i r i : I l t . , ! -F ' r r r l , ' r l l i l r4 i r . t l i i i ! j t t - ! I 1 . r . l t j ) * .rhsdodhffrE sEdbyi[econpaiyslb]edb bG.iEE condloisd s

f r : r i r . i l , { : r , i t | i i ] r r l r46or rs

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Test Report No.:CE12011142129 Date:201114t2O pager4of 31

SAI,IISUNG TECHWIN CO., LTD.42. SUNGJU.DONG, CHANGWON. KOREA

tt []|| lttttlt

Test ltem (a): Unit l/lethod I/|DL ResultNo.l

Sum of PBBa

mg/Kg With reference to IEC 62321: 2008 andperfomed by GC/MS.

n.d.lllonobromobiphenyl 5 n.o.Dibromobiphenyl n.d.Tribromobiphenyl n.o.fetrabromobiphenyl n.o,Pentabromobiphenyl 5 n,o.Hexabromobiphenyl 5 n.o.Heptabromobiphenyl 5 n.o.Octabromobiphenyl n.d.Nonabromobiphenyl n.o.Decabromobiphenyl n.d.Sum of PBDE3 n_o.lVonobromodiphenyl ether n.d.Dibromodiphenyl ether 5 n-d.Tribromodiphenyl ether 5 n.d.Tetrabromodiphenyl ether 5 n-d.Pentabromodiphenyl ether n.d.HexabromodiDhenvl ether 5 n.d.Heptabromodiphenyl ether n.d.Octabromodiphenyl ether n.d-Nonabromodiphenyl ether 5 n.d.Decabromodiphenyl ether 5 n.d.AstrestosAclinolite {CAS No.: 77536S6-4) % With reference to NIOSH 9000 method.

Analysis wa6 perfomed by XRD.I Negative

Amqsite (CAS No.: 12172-73-5) % With reference to NIOSH 9000 method.Analy6js !€s pedormed by XRD-

'I Negative

Anthophyllite (CAS No.r 2536€7- With reference to NIOSH 9000 methodAnalysis was pertormed by XRD.

'I Negative

Chrysotife (CAS No.: 12@1-29-5) o/o With reference to NIOSH 9000 method.Analy6is was performed by XRD.

1 Negative

Crocidolite (CAS No.: 120U-2A4\ % With eference to NIOSH 9000 method-qnarysis wa6 performed by XRD.

1 Negative

a o m p a n y f i ' ! , r . r r l , i r i i i l i r r ] l r ' l r ' , i i : i . t f t t : . l \ . ' t . 4 I l r / j i r t .

ont 3nd wb'n rhs im k or c enr3,ftr@oB {ary rh. comp,ny 5 ero €srorsbrty F ro {s c sdandssdd

u idsrtdzoie N€vtdFi.l,rtrwr/ri_L,t:t- i::i4i+,,,tl86t0r)ree

Msb8iorrhe 56s6rcup(scs stu

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Test Report No. I CEnU1l42129 Dzd'e :20jI4nO page : O of 3.1

SAMSUNG TECHWIN CO., LTD.42, SUNGJU-DONG, CHANGWON, KOREA

[[||||mn||!ll]l

T.8t ltem (s): Unit Method MDL RerultNo.1

Tremolite (CAS No.: 77536-68S) With referenc€ to NIOSH 9000 method.Analysis was performed by XRD.

1 Negative

AZO1): 4-AMINODIPHENYL (CAS No.:9247-1)

mg/Kg With reference to LFGB 82.02-2.Analysis wEs performed by GC/MS.

3 n.d.

2): BENZIDINE (CAS No.: 92-87-s)

mg/Kg With referenc€ to LFGB 82.02-2.Analysis w€s perfomed by GC/MS.

3 n.d.

3): 4-CHLORO-O-TOLUIDINE(CAS No.: 95€9-2)

mg/Kg With reference to LFGB 82.02-2.Analysis wEs performed by GC/MS.

3 n.d.

4): 2-l.lAPHTHYLAl,illNE (CASNo.:91-59-8)

mg/Kg With reference to LFGB 82.02-2.Analysis wEs performed by GC/MS.

3 n.d.

5): O-AMTNOAZOTOLUENE (CASNo.: 97-5+3)

mg/Kg With reference to LFGB 82.02-2.Analysis wEs perfomed by GC/MS.

3 n.d.

6): 2-AMINO-4-NITROTOLUENE(CAS No.: 99-55-8)

mg/Kg With referenc€ to LFGB 82.02-2.Analysis was performed by GC/MS.

3 n.d.

7): PCHLOROANILINE (CAS No.:10647-8)

mg/Kg With reference to LFGB 82.02-2.Analysis wa6 performed by GC/MS.

3 n.cl.

8): 2,4-DIAMINOANISOLE (CASNo.:6'15-05-4)

mg/Kg With reference to LFGB 82.02-2.Analysis wa6 performed by cc/l!ls.

3 n.o.

g): 4,4-DIAMINODIPHENYLMETHANE(CAS No.:101-77-9)

mgKg With reference to LFGB 82.02-2.Analysis ',vas performed by GC/MS.

3 n.d.

10): 3,3-DICHLOROBENZIDINE(CAS No.:91-94-1)

mgftg With reference to LFGB 82.02-2.An€lysis was perfomed by GC/MS.

3 n.d.

1 1): 3,3'-DIMETHOXYBENZIDINE(CAS No.: 119-9G4)

mg/Kg With reference to LFGB 82.02-2.Analysis w€s performed by GC/MS-

3 n.d.

1 2): 3,3'-DIMETHYLBENZIDINE(CAS No.: 119-93-7)

mg/Kg With reference to LFGB 82.02-2.Analysi6 was performed by GC/MS.

3 n.d.

13): 3,3'-DIMETHYL-4,4!OIAMINODIPHENYLMETHANE(CAS No.: 838-88{)

mgKg With reference to LFGB 82.02-2-Analysis u/as performed by GC/IVS.

3 n.o.

14): P-CRESIDINE (2-METHOXY-tMETHYLANILINE) (CAS No.:12G71€)

mgftg With reference to LFGB 82.02-2.Analysis was performed by GC/MS.

3 n.d.

prals) r€d.d Tn 3 bd rsPod ennor bscompany ; r 1 , ! r ' l . r r _n ' : l , r i . r J ; i i l j l , l

' 1 , . , l l l ; l i i l r : r t , 1 . r i r ] r d l ! .

u Dd4(rzoiqN4rdF.[rTdwiD]!. tl r?r i::r.iitl..'t]s6(orre

rref, be, of 'he 9{9cdp 66s !Ar

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Test ReportSAMSUNG TECHWIN CO., LTD.42, SUNGJU.DONG, CHANGWON, KOREA

No. : CE12O11142129 Oale : 201114120 Page :6o f31

l [ | l I l t tIt]ul

Test lt6m (s): Unit Method MDLRgsultNo.1

15): 4,4'-METHYLENE-B|S- (2-CHLOROANILINE) (CAS No.:101-144)

mg/Kg With referenc€ to LFGB 82.02-2.Analysis was perfomed by GC/MS.

3 n.d.

16): 4,4'-OXYDIANILINE (CASNo.: | 01-80.4)

mg/Kg With reference to LFGB 82.02-2.Analysas was performed by GC/MS.

3 n.d.

'17)r 4,4'-THIODIANILINE (CASNo.: 139€5-1)

mg/Kg With reference to LFGB 82.02-2.Analysis wEs performed by GC/MS-

3 n.d.

'18): O-TOLUIDINE (CAS No.: 95-53-4)

mg/Kg With reference to LFGB 82.02-2.Analysis was perfomed by GC/MS.

3 n.d.

1 9): 2,4-TOLUYLENEDIAMINE(CAS No.: 95-80-7)

mg/Kg With reference to LFGB 82.02-2.Analy6i6 was per{ormed by GC/lvlS.

3 n.d.

20): 2,4,s-TRIMETHYLANILINE(CAS No.: 137-17-7)

mg/Kg With reference to LFGB 82.02-2.Analysis was pertormed by cC/l\IS.

3 n,o,

21): O{NISIDINE (CAS No.: 9G.04-0)

mg/Kg With reference to LFGB 82.02-2.Analysi6 was performed by GC/l S.

3 n.o.

22): P-AMINOAZOBENZENE(CAS No.:60-09-3)

mg/Kg With reference to LFGB 82.02-2.Analysis was pertormed by GC/lllS.

3 n.o.

23): 2,4-XYLIDINE (CAS No.: 95-68-1)

mg/kg With reference to LFGB 82.02-2.Analysis was performed by co/l\rs.

3 n.o.

24): 2,6-XYLIDINE (CAS No.:87-62-7)

mg/kg With reference to LFGB 82.02-2.Analysis was performed by GC/l\rS.

3 n,o,

HalogenHalogen-Fluodne (F) (CAS No.:14762-94-At

ms}/Kg v\/ith reference to BS EN 14582:2007.Analysis was performed by lC.

50 n.d.

Halogen-Chlorine (Cl) (CAS No.:22537 -15-1't

mgftg With reference to BS EN 14582:2007.Analysis ,l|€s performed by lC.

50 n.d-

Halogen-Bromine (80 (CAS No.:10097-32-21

mgftg With refer€nce to BS EN 145E2:2007 .Analysis was perfomed by lC.

50 n.d.

Halogen-lodine (l) (CAS No.:14 244-8)

mg/Kg With referenc€ to BS EN fl5A2:2OO7.Analysis wEs performed by lC.

50 n.d.

CFC's (Chlorofl uorocarbons)Group IChlorcf luorocarbon-1 1 (CAS No.:7s€94)

mg/Kg With reference to US EPA 5021method. Analysis was perfomed byGC/[,rS.

1 n.o.

c o m p a n y ; " ! r / r l r ' L _ i ' i 1 r r j J i i i j r i ^ i : ! . r r l r l u i t i

j t + €6 ronrec r^ r+ o6lorree ry @!je,@h

Page 13: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test ReportSAMSUNG TECHWIN CO., LTD.42. SUNGJU-DONG. CHANGWON, KOREA

No.: CE12011142129Da|e | 201114120 Page : 7 of 31

t l|t[ItlN]l

Test ltem (s): Unit Method MDLResultl{o.1

Chlorofluoroc€bon-12 (CAS No.:75-71-8)

mg/Kg With feference to US EPA 5021method. Analysis was performed byGC/MS.

1 n.d.

Chlorofluorocalbon- 1 13 (CAS No.;76-1!1)

mSikg With reference to uS EPA 5021method. Analysis was pertormed byGC/MS.

n-d.

(;htorof tuoaocarbon-1 14 (CAS No.:76-1+2t

msasWith reference to US EPA 5021method. Analysis was performed byGC/MS.

n.d.

Chlorofluorocarbon-1 15 (CAS No.:76-15-3)

mS/kS With reference to US EPA 5021method. Analysis was perfo.med byGC/MS.

n.d.

Group lllChlorofl uorocarbon-1 3 (CAS No.:75-72-9)

mgKg With reference to uS EPA 502 1method. Analysis wa6 pedormed byGC/MS.

n.o.

Chlorof luorocarbon-l 1 1 (CAS No.:3s+56-3)

mdks With reference to US EPA 5021method. Analybi6 was performed byGC/MS.

n.o.

Chlorof luorocarbon-l 12 (CAS No.:76-12-O)

mg/Kg With reference to US EPA 502 1mothod. Analysis was perfomed byGC/MS.

n.d.

Chlorof luorocarbon-21 1 (CAS No.:422-78-8)

mg/Kg With reference to US EPA 5021method. Analysis was pedomed byGC/MS,

n.o.

Chlorof luorocarbon-212 (CAS No.:3182-26-1)

mg/Kg With reference to US EPA 5021method. Analysis wtss performed byGC/MS,

n.o.

Chlorofluorocarbon-21 3 (CAS No.:2354{6-5)

mg/Kg With reference to US EPA 5021method. Analysis was performed byGC/MS.

n.d.

Chlorof luorocarbon-2 14 (CAS No.:29255-31-0)

mgftg With reference to uS EPA 5021method. Analysis was performed byGC/MS.

n.d.

c o m F i ) ; i r r t l j l i . j , F i , l r l i r , ! r i t r + i : i . I , r t i r 1 , : j , . 1 , 7 . E l l r r l l l .Th5dodne i lA ! skhy1h6companysb jedbG6e ie€ | cond loBds€

suted b rems aid condloi3 br E Ad€doi s dram ro rhe rm,ho d ,ah ry,

spss ib ' t y€ l obce i l , nds3dd

Page 14: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No. '. CE12011142129 Dal..e | 201114120 page:8of31

SAMSUNG TECHWIN CO., LTD,42, SUNGJU-DONG, CHANGWON, KOREA

tl] flttl uttt|l

Test ltem (s): Unit Method MDLR€€ultI'lo.l

Chlorof luorocalbon-21 5 (CAS No. :425943-2')

mgikg With reference to IJS EPA 502'1method. Analy6is was per{ormed byGC/MS.

1 n.d.

Chlorof luorocarbon-216 (CAS No.:661-97-2)

mgftg With reference to uS EPA 5021method. Analysis was pedormed byGC/MS.

'I n.d.

Chlorofluo.ocarbon-21 7 (CAS No.:422-6-6)

mg/Kg With reference to US EPA 5021method. Analysis was pertormed byGC/MS.

1 n.o.

HCFCs(Hydrochlorofl uorocaJbons)HCFC-21 (CAS No.: 75-43-4) mg/Kg With reference to uS EPA 5021

method. Analysis v/as performed byGC/MS.

1 n.o,

HCFC-22 (CAS No.: 75-456) mgftg With reference to uS EPA 502'1method. Analysis was perform€d byGC/MS.

1 n.d.

HCFC-31 (CAS No.: 593-704) mSI(g With reference to uS EPA 5021method. Analy6i6 was performed byGC/MS.

'I n,d,

HCFC-121 (CAS No.: 354-1+3) mg/Kg With reference to US EPA 5021method. Analysis was perfomed byGC/MS.

1 n.d.

HCFC-122 (CAS No.: 354-21-2) mg/Kg With r€ference to US EPA 5021method. Analysis was pertomed byGC/MS.

I n.o.

HCFC-I23 (CAS No.: 306-83-2) mgKg With reference to US EPA 5021method. Analy6i6 was performed byGC/MS.

1 n.o.

HCFCI24 (CAS No.: 2837-89-0) mg/Kg With reference to US EPA 5021method. Analysis wa6 pedormed byGC/MS.

'| n.o.

HCFCI3l (CAS No.: 3s9-284) mdkg With reference to US EPA 5021method. Analysis was pertormed byGC/MS.

1 n.d.

hrrs(s) bi€d rh s led epdd eind bc o m p a n y f : " , 1 , i r l , a t i l , ' r i i t j | i i : i . t : u , i t ' , l t i i n r l r . r ! t l ] n . 'Th s @m6d 3 'ged by 6e cmpa

h€rm€dc derud6n

h* nghb 3nd obr9aiom u^der lis ra

i . : r i t , - 1 r r d r " , , : l l s6 iD8

M!nerdhes.s €,oup 11695a)

Page 15: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No.: CE12O11142129 Oale | 2O11|4DO paqe : 9 of 31

SAMSUNG TECHWIN CO., LTD.42, SUNGJU-DONG, CHANGWON. KOREA

It|tIm |ltt I

Test ltem (s): Unit Method MDLR€aultNo.l

HCFCj32b (CAS No.: 1649-08-7) mg/kg With reference to US EPA 5021method. Analysis was performed byGC/MS.

n-d.

HCFC-133a (CAS No.: 75-88-7) mg/Kg With reference to US EPA 5021method. Analysis was performed byGC/MS.

n.d.

HCFC-141b (CAS No.: 1717-005) mg/kg With reference to US EPA 5021method. Analysis \ /as performed byGC/MS.

n-d.

HCFCI42b (CAS No.i 75S8-3) mgikg With reference to uS EPA 5021method. Analysis \/as pedormed byGCiMS.

n.d.

HCFG221 (CAS No.: 422-26.4) m9/Kg With reference to US EPA 5021method- Analysis $ras performed byGC/t\rs.

1 n.d.

HCFG222 (CAS No.: 422-491) mg/K(l With reference to US EPA 502'tmethod. Analysis was peformed byGC/MS.

'l n-d-

HCFC-223 (CAS No.: 422-52€) mg/Kg With reference to US EPA 5021method. Analysis $/as performed byGC/MS.

'l n.d.

HCFC-224 (CAS No.: 422-54-8) mg/Kg With reference to Us EPA 5021method. Analysis M€s pedormed byGC/MS.

'| n.d-

HCFC-22sca (CAS No.: 422-56-0) mg/Kg With reference to uS EPA 5021method. Analysis v€s pedormed byGC/MS.

I n.d.

HCFG22scb (CAS No.: 507-55-'1) mg/Kg With reference to US EPA 5021method. Analysis was performed byGC/trs.

1 n.d.

HCFC-220 (CAS No.r 431€7-8) mg/K9 With referenc€ to US EPA 502 1method. Analysis wEs performed byGC/LilS.

1 n.d.

HCFC-231 (CAS No.r 421-94-3) mg/Kg With reference to US EPA 5021method. Analysis wtss perforned byGC/MS.

1 n.d.

c o m p a n y i t i , 1 , j : r r . - i r i i r . ' , r . l i : r l r r i i i . t l i j i a r \ . t . ! 1 , ! j , t i r : { .Th s @funi s 's!ed by 6e conp.

$bjed b rems sd coiddons tor E A&iloi 3 daw^ ro ss mraron oi riab iry

on | y3 |dw 'b ' n l h6 lmcdc6 i , 3ns

":-irin rr:r..ntt ,:t + e6(or),s * i+ s6 iirrre rr @ws<on

Membe dd€3636,oup6c!sA)

Page 16: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No.: CEJ2o11t4212s Date | 2o11t4DOSAMSUNG TECHWIN CO., LTD.42, SUNGJU-DONG. CHANGWON, KORE}.

P a g e : ' l 0 o f 3 1

I] |l|t]|l] ]tI| u

Test ltem (s): Unit Method MDLRe6ultNo.1

HCFC-232 (CAS No.: 460-89-9) mg/Kg With reference to US EPA 5021method. Analysis vr€s pedormed byGC/[,|S.

n.d.

HCFC-233 (CAS No.: 7125-84-0) mg/kg With refer€nce lo US EPA 502'lmethod. Analysis was performed byGC/MS.

n.d.

HCFC-234 (CAS No.: 425-94-5) mgks With reference to US EPA 5021method. Analysis was perlormed byGC/MS.

n.d.

HCFC-235 (CAS No.r 460-92-4) mg./Kg With reference to US EPA 5021method. Analysis was perfomed byGC/MS.

n.d.

Hgl-g-241 (GAS No.: 666-27-3) mg/Kg With reference to US EPA 502'1method. Analy6i6 was performed byGC/MS.

n.d.

H9t-g-242 (CAS No.: 46063-9) mg/Kg With reference to US EPA 5021method. Analysis wEs perfomed byGC/MS.

n.d.

HCFC-243 (CAS No.: 46049-5) mg/Kg With reference to US EPA 502 1method. Analysis wEs performed byGC/[rlS.

n.d.

HCFC-244 mg/Kg With reference to US EPA 5021method. Analysis $/as performed byGC/MS.

n.d.

HCFC-251 (CAS No.: 421-41-0) mg/Kg Wath reference lo US EPA 5021method. Analysis vr€s pedormed byGC/MS.

n-d.

HCFC-252 (CAS No.: 819-001) mg/kg With reference to US EPA 502'1method. Analysis was performed byGC/MS.

n.d.

HCFC-253 (CAS No.: 460-35-5) msikg With reference to US EPA 5021method. Analysis was peformed byGC/MS.

n.d.

HCFC-261 (CAS No.: 420-97-3) mgft9 With reference to US EPA 502'1method. Analysis was performed byGC/MS.

n.d.

conp . i i r i l r l l j r r ' j : L i ' i r . , i _ r r - 1 r j r i i r . t l i l : l j r l i r t I ! ! i r : l .r[ s dfuheil 5 'su.d bi be conp'

aqed b rems aid coid{o.s ror E aredon 3 d€". ro he Lmraroi or ,ab,,

tu r isia 5id od'qdioN under b0 r'

r:-rrlr!1 r:irrr :t1s6lo,rrerD ias6101pner, ___a*",

Page 17: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No. . CE12011142129 D e 201114120 Page: 11 of 31

SAIVSUNG TECHWIN CO,, LTD.42. SUNGJU-DONG, CHANGWON, KOREA

flrlr[ttflm rl

Test ltem (s): Unit Method MDLR€aultNo.'l

HCFC-262 (CAS No.: 421-02-03) mg/K9 With reference to US EPA 502 1method. Analysis wEs performed byGC/|VS.

1 n.d.

HCFC-271 (CAS No.: 430-55-7) mg/Kg With refercnce to US EPA 5021method. Analysis was performed byGC/MS.

'I n.d.

HBFCs(Hydrcbromof luo.ocarbona)HBFC-2182 (CHFBr2) (CAS No.:186&53-7)

mg./Kg With reference to US EPA 502 1method. Analysis wa6 perfomed byGC/MS.

'I n.d.

HBFo-2281 (CHF2Br) (CAS No.:1511{,2-2]-

m!/Kg With reference to US EPA 502 1method. Analysis \,vas pertormed byGC/MS,

I n.o.

HBFC-3181 (CH2FBr) (CAS No.:3735241

mS/kg With reference to US EPA 5021method. Analysis was performed byGC/MS.

1 n.d.

HBFC-12184 (C2HFB14) mg/Kg With reference to US EPA 5021method. Analysis wEs perfonned byGC/MS.

I n.d.

HBFC-12283 /c2HF2BI3) mg/Kg With reference to US EPA 5021method. Analysis was perfomed byGC/t\4S.

1 n.d.

HBFC-12382 (C2HF3812) mg/kg With refefence to US EPA 5021method, Analysis wEs performed byGC/t S.

1 n.d.

HBFC-12481 (C2HF4Bt\ mg/Kg With referenc€ to US EPA 5021method. Analysis was performed byGC/[rS.

1 n.d.

HBFC-'13183 (C2H2FBr3) mg/Kg With reference to US EPA 5021method. Analysis vras performed byGC/MS.

1 n.d.

tlEF C- l 3282 lC2H2F2Br2\ mgikg With reference to US EPA 502 1method. Analysis was performed byGC/MS.

1 n.d.

Ij'-etll,tY""! b1 T.9T1.'sadv6d'ha ddnab;@ddmdh-6 hahsdrsmroNod;i

! L I t t : . { t r . r i : i , , . i +$6Fnxe

M€obsof ihe 6s6@p6G5 r1)

Page 18: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test ReportSAMSUNG TECHWIN CO,, LTD.42. SUNGJU-DONG. CHANGWON, KOREA

No.: CE12O11142129Dale :201114120 Page | 12 of 31

r|tfl||t||[||r||l

Test ltem (s): Unit Method MDL RosultNo.l

HBFC-13381 (C2H2F3Br) mgikg With reference to US EPA 5021method. Analysis was performed byGC/MS.

n.o.

HBFC-l4182 (C2H3FBr2\ mdkg With ref€rence to uS EPA 5021method. Analysis we6 pedormed byGC/MS.

n.d.

HBFC-14281 (C2H3F2Br) mgxg With reference to US EPA 5021method. Analy6i6 was performod byGC/MS.

n.d.

HBFC-15181 (C2H4FBr) mgKg With reference to LJS EPA 502 1method. Analysis was performed byoc/MS.

n.d.

HBFC-22186 (C3HFB6) mg/Kg with reference to us EPA 5021method. Analysis wEs performed byGC/MS.

n.d.

HBFC-22285 (C3HF2B15) mg/Kg With reference to uS EPA 5021method. Analysis was perfomed byGC/MS.

n.d.

HBFC-22384 (C3HF3814) mg/kg With reference to US EPA 5021method. Analysis was peafomed byGC/MS.

n.d.

HBFC-22483 (C3HF4B13) mg/kg With reference to US EPA 5021method. Analysis was performed byGC/MS.

n.d.

HBFC-22582 (C3HF582) mg/Kg With reference to US EPA 5021method. Analysis was perfomed byGC/MS.

n.d.

HBFC-22681 (C3HF6Br) mg/Kg With reference to US EPA 5021method. Analysis was perfomed byGC/MS.

n.d.

HBFC-23185 (C3H2FB15) mg/Kg With r€ference to US EPA 5021method. Analysis was pertomed byGC/MS.

n.d.

tlBF C-23284 IC3H2F zBt 4) mdks With reference to US EPA 5021method. Analysis was performed byGC/MS.

n,o.

c o m F i y i i : , l 1 r r . j - F ' i , ! 1 i : . r i r r i f i . ! t i r i 1 . : t i l , 4 n L r t t ! , { .rhA dddnsl € 3ssd by he comp,

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Test Report No.: CE12011142129 Date 201114120 Page: 13 of 31

SAMSUNG TECHWIN CO,. LTD.42, SUNGJU-DONG, CHANGWON, KOREA

I||||lrlt tI|ttll

T€€t ltem (s): Unit Method MDLResultNo.l

HBFC-23383 (C3H2F3Br3) mg/Kg With reference to t_JS EPA 5021method. Analysis was perform€d byGC/MS.

1 n.o.

HBFC-23482 (C3H2F4Bi2) m9/Kg With reference to US EPA 5021method. Analysis was performed byGC/t S.

1 n.d.

HBFC-2358,| (C3H2F58r) mg/Kg With reference to US EPA 5021method. Analysis was perfomed byGC/MS.

1 n.d.

HBFC-24184 (C3H3FB14) mg/Kg With reference to US EPA 5021method. Analysis was performed byGC/MS.

'I n.d.

HBFC-24283 (C3H3F2B13) mSikS With r€ference to US EPA 5021method. Analysis was pertormed byGC/MS.

'I n.cl.

HBFC-24382 (C3H3F3B12) mgikg With reference to IJS EPA 502 1method. Analysis was performed byGC/MS.

1 n,o.

HBFC-24481 (C3H3F4Br) mg/Kg With reference to Us EPA 5021method. Analysis was performed byGC/t\rs.

'I n.d.

HBFC.251B3 (C3H4FB€) mg/Kg With referenc€ io US EPA 5021method. Analysis \a€s performed byGC/t\4S.

1 n.d.

HBFC-25282 rc3H4F2BE\ mg/Kg With reference to US EPA 502 1method. Analysis wEs performed byGC/MS.

1 n.d.

HBFC-25381 (C3H4F3Bd mg/Kg With r€ference to US EPA 5021method. Analysis was perfomed byGC/MS.

I n.d.

HBFC-26'1 82 (C3H5FB12) m!/Kg With reference to US EPA 5021method. Analysis was performed byGC/MS.

1 n.d.

HBFG262Bl (C3H5F2Br) mg/kg With reference to US EPA 5021method. Analysis was performed byGC/MS.

1 n.d.

p€1e) r€d.d tt bn cpod €nioi bec o m p a n y f / r , : t r l . L _ i ' i r | r J r l i j : t i r ' L l i i l | l , 1 . . r . , i r r t l ! .

o n | y 3 n d w ' b [ l b ! m b d c 6 i l 3 ' n s

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TestReport No.:cEt2o11t4212s Date:2011t4t20SAMSUNG TECHWIN CO., LTD.42, SUNGJU-DONG, CHANGWON, KOREA

Page : 14 of 31

llr tlt t lr

Test ltem (s): Unit Method MDL ResultNo,l

HBFC-27181 (C3H6FB0 mg/kg With referenc€ to US EPA 5021method. Analysis wEs perfomed byGC/|VS.

1 n.d.

HFCa (Hydrofl uorocaJbon)HFC-23 (cHF3) (CAS No.:7546-7')

mg/Kg With reference to US EPA 5021method. Analysis was performed byGC/MS.

1 n.d.

HFC-32 (cH2F2) (CAS No.: 75-1G5)

mg/kg With reference to US EPA 5021method. Analy6i6 was performed byGC/MS.

1 n.d.

HFC41 (CH3F) (CAS No.: 593-s3-3)

mgftg With reference to US EPA 5021method. Analysis was pertormed byGC/MS.

1 n.o.

HFC43l0mee (C5H2F10) mgftg With reference to US EPA 5021method. Analysis was performed byGC/MS.

1 n.o.

HFC-125 (C2HF5) mg/(g With reference to US EPA 5021method. Analysis was performed byGC/MS.

1 n.d.

HFC-134 (C2H2F4) mg/Kg With reference to US EPA 502'tmethod. Analysis was performed byGC/t S.

1 n-d.

HFCI34a (CH2FCF3) (CAS No.:811-97-2)

mg/Kg With reference to US EPA 5021method. Analysis was performed byGC/t\rs.

,l n.d.

HFC-143 (CH3F3) mg/Kg With reference to US EPA 5021method. Analysis was perfomed byGC/MS.

1 n.d.

HFC-143a (CH3F3) mg/Kg With reference to uS EPA 5021method. Analysis wEs perfomed byGC/tVlS.

1 n.d.

HFC-152a (C2H4F2) (CAS No.:75-376)

mg/Kg With reference to US EPA 5021method. Analysis wEs performed byGC/MS.

1 n.d.

HFC-227ea (C3HF7) (CAS No.:431-89-0)

mg/Kg With reference to uS EPA 5021method. Analysis was performed byGC/MS.

1 n.d.

mprec) bn€d rh e €3r '€pod €nnd *conF i y + r r 1 i , l . . 1 1 ' i , r l ] j , t : i i r ' i i : i . I l l i i . i t lrh s dotun6i1 s i$ud b) be comp'ny eled b ft c$srar cod i ois of setu € pinrd ov.dest avaiade on €qf o l e b . n o n c l o m a l d o d m s t s $ b l b h a L m l a l o n o i l a b ' t y

'.1r,:!? r: iilarr:...t + s6 {oare

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Test Report No. I CE12O11142129 Dale. 2011t4t20 Page : 15 of 31

SAMSUNG TECHWIN CO., LTD.42, SUNGJU.DONG, CHANGWON, KOREA

[r] rIla tmflll

Test ltem (s): Unit Meihod MDLResultNo.l

HFc-236fa (C3H2F6) mg/Kg With reference to US EPA 5021method. Analy6is was performed byGC/MS.

'I n.d.

HFC-236ea (C3H2FG) (CAS No.:43163-0)

mg/Kg With reference to US EPA 5021method. Analysis \ /as performed byGC/[rS.

1 n-d.

HFC-24sca (C3H3F5) mg/Kg With reference to US EPA 5021method. Analysis was perfomed byGC/r\4S.

1 n.d-

HFC-24sfa (C3H3F5) mg/Kg With reference to US EPA 5021method. Analysis wa6 perfomed byGC/MS.

1 n.d.

HFC-365mfc (C4H5F5) mg/Kg With reference to US EPA 502 1method. Analysis wEs performed byGC/MS.

'I n.d.

PFCS (Perfluorocadon)F14 (CAS No. 75-73-0) mgKg With reference to US EPA 502 1

method. Analysis was performed byGC/MS,

1 n.d.

Fluorocabon 116 (CAS No.: 76-164)

mg/kg With reference to US EPA 5021method. Analysis was performed byGC/MS.

1 n.d.

Freon 218 (CAS No.: 7619-7) m9/Kg With feference to US EPA 5021method. Analysis ,.,ras performed byGC/t\rs.

1 n.d.

Decafluorobutane (CAS No.: 35t25-9)

mg/kg With reference to US EPA 5021method. Analysis vras pedormed byGC/[IS,

1 n.d.

Freon C318 (CAS No.: 115-25-3) mg/Kg With referenc€ to US EPA 5021method. Analysis w€s performed byGC/|VS.

I n.d.

Perfluor-l-butene (CAS No.: 357-26€)

mg/Kg With reference to US EPA 5021method. Analysis was performed byGC/MS.

I n.d.

perfluorisobutene (CAS No.: 382-21 { )

mS/kS With reference to US EPA 502 1method. Analysis was pedormed byGC/MS.

I n.d.

p3G)€srad rh s red €poneiiorsc m p . d y + i l r l i t . r r l ' i , i i . r ! i t l r r i r . I t i , l r r ! { 1 : . , r , r , , r l f r l .rh,3dodrem rs sued br'he cdhi,

a F . o . 1 6 - t " 6 l a b m d € d j

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Test Report No. I CU2011142129 Date:2011t4t20 page:.t6of 3.1

SAII,TSUNG TECHWIN CO., LTD.42, SUNGJU-DONG, CHANGWON, KOREA

t l | ft lrrltt] l

Test ltem (s): Unit lrlethod MDLResultNo.1

1,4-dihydrooclaf luorobutane (CASNo.:377-36€)

mg/Kg With reference to US EPA 5021method. Analysis w€s perfomed byGC/[rS.

n.d.

Nonaf luorr- (trif luoomethyl)butane (CAS No.: 594-91-2)

mg/Kg With reforence to US EPA 5021method. Analysis was performed byGC/[rS.

n.d.

Perf luoron-pentane (CAS No. :678-26-2)

mg/Kg With reference to US EPA 5021method. Analysis M€s pedormed byGC/MS.

n.d.

2-pertluoromethylpentane (CASNo.:355-04-4)

mg/Kg With reference to US EPA 5021method- Analysis was performed byGC/MS.

n.d.

Perfluorohexane (CAS No.: 35S42-O)

mg/Kg With reference to US EPA 5021method. Analysis was pedormed byGC/[IS.

n.d.

CHCS (Chlorinate hydrocarbon)1 , 1 ,'1 ,2-Tetrachloroethane (CASNo.:630-206)

mg/Kg With reference to US EPA 5021method. Analysis $/es performed byGC/[IS.

n-d.

1 ,1 ,1-Trichloroethane (CAS No.:71-556)

mg/Kg With reference to US EPA 5021method- Analysis was performed byGC/MS.

n-d.

1 ,'1 ,2,2-Tetrachloroethane (CASNo.:79-34-5)

mg/Kg With reference to US EPA 5021method. Analysis was performed byGC/[rS.

n.d.

1, 1,2-Trichloroethane (CAS No.:79-00-5)

mg/Kg With reference to US EPA 5021method. Analysis w€s performed byGC/MS.

n.d.

1,1-Dichloroethane (CAS No.: 7+34n)

mg./Kg With reference to US EPA 502 1method. Analysis was perfomed byGC/MS.

n.d.

'1,l-Dichloroethene (CAS No-: 75-354)

mgikg With reference to uS EPA 5021method. Analy6is was pedormed byGC/MS.

n.d.

1 ,1-Dichloropropene (CAS No.:563-586)

mgikg With reference to l-JS EPA 5021method. Analysis wa6 pedormed byGC/MS.

n-d.

pelst €sied rhKGd BpdeniolbEr , . r r _ l . n L l t r : . ! . i r : i t , l i r r . i 1 _ r r { a .

r:.ir i::r:+ti r +s61orPren,

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Test Report No. : CE12011142129 Date 20'1114t20 Paoe: 17of 3i

SAMSUNG TECHWIN CO., LTD.42, SUNGJU-DONG, CHANGWON, KOREA

tl]ltltl] r!tttt

Test ltem (s): Unit Method MDLRe3ultNo.l

'1,2,3-Trichloropropane (CAS No.:96-184)

mg/Kg With reference to US EPA 5021method. AnalFis $/as performed byGC/MS.

1 n.d.

1,2-Dichloroethane (CAS No.:107-06-2)

mg/Kg With reference to US EPA 5021method. Analysis wEs performed byGC/t\4S.

1 n.d.

1,2-Dichloropropane (CAS No.:78€7-5)

mg/Kg With reference to US EPA 5021melhod. Analysis wE6 performed byGC/MS.

1 n.d.

1,&Dichloropropane (CAS No.:142-28-9')

m9Kg With reference to US EPA 5021method. Analysis was performed byGC/MS.

I n.d.

2,2-Dichloropropane (CAS No.:594-20-7)

mS/kg With reference to US EPA 5021method. Analysis was performed byGC/MS.

'I n.d.

Cabon tetrachloride (CAS No.:56-23-5)

mg/Kg With reference to US EPA 5021method. Analysis was performed byGC/MS.

1 n.d.

Chloroethane (CAS No.: 7t0G3) mS/kg With reference to US EPA 5021method. Analysis was performed byGC/MS.

I n.o.

Chloroform (CAS No.: 67-66-3) mg/Kg With reference to US EPA 502 1method. Analy6is was performed byGC/MS.

'I n.o.

Chloromethane (CAS No.: 74-87-3)

mg/(g With reference to uS EPA 502 1method. Analysis \ ras peformed byGC/MS.

'I n.d.

cis-1,2-Dichloroethene (CAS No. :156-59-2)

mg/K(l With rcference to US EPA 502'lmethod. Analysis was performed byGC/MS.

1 n.o,

cis-1,3-Dichloropropene (CAS No.:10061-01-s)

mg/(g With refer€nce to US EPA 502'1method. Analysis was porformed byGC/MS.

1 n.o.

Hexachlorobutadiene (CAS No.l87€8-3)

mg/Kg With reference to US EPA 5021fiethod. Analysis u/as pedormed byGC/MS.

1 n.d.

con?zny . ; ) i , ) t ) + ,N i , r : r . ! l t i i i . I I 1 i ! 1 , - r i n , 4 ! r ] r l r , { .rhs6aftnE sEdbyrdcom@iysqedb G cei€..r cond i ois or s

r.o,,9hcaidob,earn3lido.irera iidrbarprdu@dereprdru pay Ailmalihorz.dajb€ioiroae,y o, rasrdrdn ofihe codenrd e i, d €nsi;r$e aw

rr ri,lt r:1,!{!!! :t rd6{0r)2B rD r+ s6lor)rs * w!sqrom

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Test Report No.: CE12011142129Oale : 2011 l4l2\ Page :18o f3 ' t

SAMSUNG TECHWIN CO., LTD.42, SUNGJU.DONG, CHANGWON, KOREA

l|| |lIl| ttmlr

Test ltem (8): Unit Method I/|DL ResultNo.1

Methylene Chloride (CAS No.: 7t09-2)

mg./Kg With referenc€ to US EPA 5021method. Analysjs was performed byGC/MS.

n.d.

Tetrachloroethene (CAS No.: 127-18-4)

mg./r$ With reference to US EPA 5021method. Analysis was performed byGC/MS.

n.d.

t€n91,2-Dichloroethene (CASNo.: 1566G5)

mgKg With reference to Us EPA 5021method. Analysis wa6 performed byGC/MS.

n.d.

trans-1,lDichloropropene (CASNo.: 10061-02€)

mS/kS With .eference to US EPA 5021method. Analysi6 was performed byGC/MS.

n.d.

Tdchloroethylene (CAS No.: 79-01s)

mS/kg With reference to LJS EPA 5021method. Analysis was pedormed byGC/MS.

n.d.

PFOS Referenco Information : Dircctive 2005/12ZEC(1) May not be placed on the maakel or used as a substance or constituent of preparations in a concentrationequalto or higherthan 0.005 % by mass.(2) [,,lay not be placed on the market in semi-finished prodlcls or adictes, or parts thereof, if the concenkation ofPFOS is equalto o. higher than 0.1 7o by mass calculated with reference to the mass of skuctura y ormiqostructurally distinct parts that contain PFOS or, for textiles or other coated materials, if the amount of PFOSis equalto or higherthan 1lg/m'?ofthe coated materiat.

:3fiTi"#iTil ,5ir.rl.:,:l.".".fi:gjrr:p1,lxe"l,iili:rl.e,,:r:llfil.-**""",,"."

s p o n j b l l y A b l s c L € d a n d s 3 d f u

Fry Any m,,,MEd dbcrionor*r*e"iirre a"

Page 25: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No.: CEnOlll42129 Dale 2O1 4t2O page: 19 of 31

SAI'SUNG TECHWIN CO., LTD,42, SUNGJU-DONG, CHANGWON, KOREF.

Note :1. mg/kg = ppm | o.1wtyo = lOOOppm2. n.d. = Not Detected3. MDL = Method Detection Limit4 . " - "=No tRegu la ted5. " = Qualitative anatysis (No Unit)6. Negative = Unde,tectabte / Positive = Detectabte7. Asbestos : Negative = "< 1.0 0/6", Positive =.'> 1.0 %,,8. Spot-test:

rmlit[ tttt]!

Negative = Absence of Cr(Vl) coating / surface tayer; positive = presence of C(Vl) coating / surface tayer;(The tested sample should be fu(hervedfied by boiling-water-extraction method ifthe spot test result cannotbe confirmed.)

Boiling-u€ter-extraction:Negative = Absence of Cr(Vl) coating / surface layer; posilive = presence of C(Vl) coating / sudace layer;The detected concentralion in boiling-wster-extraction sotutaon is equal or greater than O.O2 rng/kg with 50 cm,sample Sudace area.

9. "*r The substance was calculated by the test re6utt of Tributyt Tin. The I\,DL was evatuated for Tributyt Tin.

ld(s) b3rd rh e bd €pon €n^or e Icmpany i i : r r i rL . r : t ; r , r l , j r l ,n r1 , . r i1 11 ! .L :1 4 -4 r l ! ,1 .

i , g 6 i e d b t G . i f t l c o n d l o i 3 d *

3 p s s b l t y 6 l o $ c | € d a n d h € d 6 u

L r Lr:- r: r r;Ji.,'l I s6 (oaree

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Test ReportSAMSUNG TECHWIN CO., LTD,42, SUNGJU-DONG, CHANGWON, KOREr'.

No.: CEnOl142129 Dale:201114120 Page | 20 of 31

ll][tt fltNl||]]

1) Thes€ samples were d|ssotved totatly by preconditioning method according to betow flow cnan.( Cf'test method excluded )

2) N€me of the person who made measurement: Ctimbgreat yang3) Name of the pecon in aharge of measufement: Troy Chang

ICP.AES

Sample lvlaterial DigestionAcid

$ed, copper, aluminum, solder Aqua regia, HNO3, HCl, HF, H,O,

Glass HNO3/HF

Gold, platinum, palladium, ceramic Aqua regia

Silver HNO]

Pla€tic HrSO1, HrOr, HNO3, HCI

Others Any acid to total digestion

pralsr€scd ha re$ cpod €nioi becompany 4 r ! r / . r l l l , ! - n i l . r r ] , l i l l r t i I . L [ i i i i l , ] r I 1 . r t i L l ! .

Cutting / Preparation

Sample lVeasurement

Acid digestjon by suitable aciddepencled on different samplematerial (as b€low table)

Microwave digestion with

HNO3iHCt/FtFAdd appropdate amount otclageslion reagent

Heat to appropriate

temperalure to extract

Cool, filter digestate

through filterAlkali FusionHClto dissolve

measure the absorbance

at 540 nm by uV-VlS

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Test ReportSAMSUNG TECHWIN CO.. LTD.42, SUNGJU-DONG, CHANGWON, KORE/'

No.: CE12011142129Dale | 201114120 Page: 21 of 31

Iftl t] fl]I] u

Analylical flow chart1) Name of the pe6on who made measurement Roman Wong2) Name of the pe6on in charge of measurement Troy Chang

I TesI Items: PBB/PBDE, TBBP-A-bis

Firsttesling process -----' Optionat screen proc€ss ,--. Confrmation process -.>

Screen analy6is

Sample extraction method

Concentrate/Dilute Extracled solution

Filter

Analy6is by GC/MS

lssue Report

p s(s) bsied rhsbd Epodeinorbcohpaiy .i l | 1 nr ' j_ l i i ,r l i t l r irri r. .r rt f. i i1i,] n , .,

"lrr!,! .

r& 6onsr E s@ byhecompa.yrqedb b csarcr cddd I ois d sslted b rems and coidioos ror E

6@ie'ashacofiFrysindnqsas p o ^ s b I l y s l o i s c e n l a d $ " d @nndbeGFduedei.eplmlu].wbou

! I rs _e"i i,r r. .*l : , F ' . r i - 6 p T r a e n n r + su idGfrr zoE, M!! Lhd cr, tu,({ 4r._

Page 28: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No.: CEnOl142129 Date:20l|l4n1 Page.22 ol 31

SAMSUNG TECHWIN CO., LTD,42, SUNGJU-DONG, CHANGWON, KOREA

|l] [tfl tfitl|t

Analysis flow chart for determination of PVC in material1) Name of the person who made measuemenl Ginny Chen2) Name ofthe person in charge of measurement Shinjyh Chen

cmpany r ; r , r r l r ' i r :_F ' i , ! r i | ! /n j i , r i r . . r ,1 . r .? r . t l l

for sisdroi c ,oma1 do@ nants slt 5 d.m ro rhe Lmibid d ,rbL ly.

m r y a d w ' b i n , h 6 i n c d c € d s n s m a d d e . d € x s e a ; e a i 6 b a 1 6iid ba €Fdued exep,niu, v,set prcr

",hs:pp-€ dri,s compaiy Any m,,,MEd dbcrion

f r : r r r f l r * 1 r

Sample pre{reatment

Sample analyzed by FTIR

Check wav6number of C-Cl bonding

Page 29: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No. : CE12011142129Dale : 2O11l4l2O

SAMSUNG TECHWIN CO., LTD.42. SUNGJU-DONG, CHANGWON. KORE'.

Page : 23 of 31

lllIll[l[][]I I|

Analytical flow chart of Soxhlet extraction (GC/MS) procedure

1) Name of the person who made measurement Roman Wong

2) Name oflhe per6on in charge ofmeasurement Shinjyh Chen

Data

mpre(n bid rh s red €Fon$iiorbc o h @ i l i ' , : . . 1 i r l . . l i i , , l ; ; i n f J + i i . l i i , L i l r l j . ' r ' \ l l .

r h s d o f u n s l A s s E d b y h e c o m p a . y s ! b ] e d b c G e H d c o . d l o | s d s

I Test ltems: Phthalate ' Benzotriazole ' HBCDD . NP ' DBBT '

Organic phosphorus compounds

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Test Report No. : CEn011142129 Da'e: 201114120 Page'.24 d 31

SAMSUNG TECHWIN CO., LTD.42, SUNGJU-DONG, CHANGWON, KOREA

flt ]ttr ||ttr ]

Analylical flow chart of Soxhlet extraction (LC/MS) procedure

1) Name of the perSon who made measurement: Roman Wong

2) Name ofthe person in charge of measurement: Shinjyh Chen

rTest ltems: PFOS/PFOA . Benzotriazole

Sample pretreatmenvseparation

+

Data

ps(s)rsded rh s Gd ,epd eiidl becompany 4 j r !1 , r1 | b_ i ' ! { , r t J i tn l rh r . l r i i ; { t i : r I . r r . i r r l t { .

.. i-.1. *:IFt4..:;!+s6lorrxeer7e t r s6lorrrer rr wweiion

Membsdrhescscrolp15c5sAr

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Test ReportSANISUNG TECHWIN CO,, LTD.42 SUNGJU-OONG. CHANGWON. KOREA

No. : CE12011142129Dale:201114120 Page: 25 of 31

Ill[ ||[l t!flr

Analytical flow charl of volatile organic compounds (VOCS)

1) Reference method : US EPA 50212) Name ofthe oerson who made measurement : DalkiYen3) Name of the person in charge of measurement : Shinjyh Chen

: t ii irrrr,t, l

3uba4 'o lems aod coid{ons ior E

Sample pretreatment

Take sample and put it intoheadspace glassware.

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Test Report No. I CE2011142129 Dale | 201114120 Paae ; 26 of 31

SAMSUNG TECHWIN CO., LTD-42, SUNGJU-DONG, CHANGWON, KOREA

tl]|l|tt|l|||t[t ]

Analysis flow chart for determination of Asbestos

1) Name of f|e oerson who made measurement Victor Kao2) Name of the person in charge of measuremenl: wendy w€i

Not containing Asbestos/Negative

mprels) EsEd frs re. codd €nnor b, - 1 i ! r , . , , r ' r , , , , : r . d f i n r t - \ r , . i . . , j t , , : .

Th s dofumenl 6 's!ed by 6e c dmpa$!ed ro rens aid cdiddoG iof E

.I j:rr !:I4i!! :,r+tr6i02)2FrDi+s6rcr)rrerr *-!*-,

;ffi""ti"" p -f __l

a6be6tos is present IDiffraction peak ofasbestos is absent

_ _ _ _ _ _ _ _ _ _ _ _ _ _ _ -

Asbestos identification byopticalmicroscopy

Asbestos fiber is oresent Asbestos fiber is absent

Containing Asbestos/Positive

Page 33: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test ReportSAMSUNG TECHWIN CO., LTD,42. SUNGJU-DONG. CHANGWON. KOREA

1 )

2\3)

No.'. CEn011142129 Dale:201114n0 Page:27 ot 3'l

|:] [ttl [!l||lll

These samples were dissolved totally by pre-conditioning method according to b€lowflowchan.Name ofthe person who made measurement: climbgreatYangName of the person in charge of measurement: Troy Chang

FlowChaft ofdigestion for the elements analysb pe.formed by ICP-AES

S'teel, copper, aluminum, solder Aqua regia, HNO3, HCl, HF, HrO,

Glass HNO3/HF

Gold, platinum, palladium, ceramic Aqua regia

Silver HNO3

Plastic HrSO4, HrOr, HNO3, HCI

Others Any acid to lolaldigestion

. r i ; r ' l J i i i ! . : , r , i . r , i . n t , l r ! r t r l

poisbr t sb c c €d 5nd rh s doam

,.t I t-|| f:l:r*;4.iiias610r)r!

Cuting / Preparation

Acid digeslion by suitable acid d€pended ondifferent sample matedal(a6 below table)

'1) Alkal iFusion2) HClto dissolve

Page 34: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test ReportSAMSUNG TECHWIN CO,, LTD.42, SUNGJU-DONG, CHANGWON, KOREA

No. . CE12011142129Date :2O1114n0 Page : 28 of 31

r|rr[ttl] tl||tl

Analytical flow chart of halogen content1) Name of the oerson who made measurement: Rita Chen2) Name of the person in charge of measu@menl Troy chang

r . , r l h l n i l ; i L . x r i i . ! 1 , L1 ]ftBd@msl6 s€dbyhecomp3

spssb i r y6b bsen , . d l r sdo tumm'dcsm, *oe€ repa ; l sbs rErhetr nq[b aid ob 0dDn3 und rhe ra w hdi pr o. Mrdn.pprcva d be comp,^y hy **h-*d

" b,"i."

Sample pretreatment / Separation

Weighting and putting sample in cell

Oxygen Bomb Combustion / Absorption

Dilution to fixed volume

Analysis w€6 performed by lC

Page 35: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test ReportSAI\4SUNG TECHWIN CO., LTD.42, SUNGJU.DONG, CHANGWON, KOREA

No.'. CE12O11142129Date 201114120 Page : 29 of 31

|l|| [t!] ltNrll

Analytical flow chart of Organic-Tin content

1) Name of lhe person who made measurement Ginny Chen2) Name of the person in charge of measurement Troy Chang

Data

pe(s)€jed rh s rad Gpod6iiolbec o m p a n y l ; r 1 l l l r ' r r _ i ' f , r r , h r r t i . . ! i r i r t r I t . - . L i 4 ! j !

s p . N b ' l i A l o 6 c | € d a n d h s d o c u

F^y Any*a!hm6ddbd;ntuaeryorias6Groidhe6^Gdorap!€.ranedrhsdoonenrsunas he tured 6nani;r $e bw

! i d s . r zoFN* ra iF r . v rawd / ! i t l eo r ) r ee rD r+s6 (01 rsn ,4_ * ' a , ,

Menerof ihe rsc@p rs6s sA)

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Test Report No. : Ce2011142129

SAMSUNG TECHWIN CO-, LTD-42, SUNGJU-DONG. CHANGWON. KOREA

Dale | 201114n0 Page : 30 of 3 l

ut[ta|||||lrllll

Chlorinated Flame retardant analytical flow chart'1) Name of the person who made measurement Bary Tseng2) Name of the person in charge of mea6uremenl Troy Chang

r Reference method: US EPA 8270D, US EPA 3540r Test ltems: PCBS, PCNS, PCTS, Mirex, CP, |CCP

Data

p 6(s) reied rh s rd .+od €nnd bc m p a i y ; i r r I j l r ' j - l l ' r : ! - , r L r r r t t r r -r h " d d o r s l 6 $ s d b y h a c o m p a ^ y o b l e a b G c s e € | c o d l o i 3 o f s

F n , M t m s l l f u l z d d k € | d n

l1886€nnsrr f +tr6ror)rarr *-,q,--

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Test Report No. : CEn011142129 Oa'e | 201114120

SAMSUNG TECHWIN CO., LTD.42, SUNGJU.DONG, CHANGWON. KOREA

" End of Report "

Page : 31 of 31

l tt |l[

p6(s)bbd rh s bd r.pd eiio, bec o n o a n v + ! r ! r , r ! _ 1 1 r , , r r r , ' J t l n N A i r : . r ; i l r l r r r i ^ . r l n l q . [ .

! rd4(rzoiqN4rdie.rrrrw,./tri i 146 i.rrf ID r l s610rPre tt w!se!@n

M€nba or se rs G&p rscs sA)

Page 38: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

ValidFor QuPlease

HENKEL CORPORATIONHENKEL ADHESIVES-ELECTRONICS l\rAlN OFFICE: 14000cALtFORNtA, 92606 U.S.A.

Test Report

The following sampl.(s)

Sample DescdptionStyle/ltem No.Sample Receiving DateTesting Period

Te3t Roquested

Test R€8ult(s)

No. : CE2011lA2967 Oale | 2011h0124

JAIIIBOREE ROAD, IRVINE,

Page :1o f6

[|| lf,t Itt!!

was/were submitted and ldentified by/on bohalf of the client asl

ADHESIVE86002011t1U18201 1 I 1U18't O 2011 I 10t24

p6(3)rssrad rhs r6d €oon €nid sc o m p . n y n ; . r r l , l , ; - ! i ' : l . r r i r i r : j t i , r ! i ; l l l i 1 ' l r ' l r r i l l l ( 'ii" ii.i.*r "

,-'i,a u, n"c".p"t" tJn"i . t , .ao*i . -"gJq"iroi .*"*oconao*te"oe."

i-r* "r

e*oa o ,**";F |gb ' t yNbcc |odand lbsdom

""1""ne -o;""".* **,t. *ie6m ds;sds h;6;ms' €

. * " " , ns ' - i " - "

: ln accodance with the RoHS Directive 201'1/65/EU Annex ll.

: Please refer to next page(s).

f r : i t i ] 1 . r i _ . *h ] f i +s61o rD

glndfor|nd

Ch.lrLJ a..Dor.t .t -TCFI

Page 39: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No. : CE/2011/A2967

SILVER COLORED PASTE

Ddre'.2011110124 Page: 2 of 6

|||lflttl]||tltttlHENKEL CORPORATIONHENKEL ADHESIVES-ELECTRONICS MAIN OFFICE: 14000 JAMBOREE ROAD, lRVlNE,CALIFORNIA, 92606 U,S.A.

Test Resulil3)PART I.IAME No,1

Test ltem (sll Unit irethod l,loLRo€ultNo.l

oadmium (Cd) mgKg With reference to IEC 6232'1: 2008 andperforned by ICP-AES.

n.d.

Lead (Pb) mgikg With reference to IEC 62321: 2008 andpeformed by |CPAES.

n.d.

[,,!€rcury (Hg) mg/Kg With reference to IEC 62321: 2008 andperformed by ICP-AES.

2 n.o.

Hexavalent Chromium Cr(Vl) mlyKg With reference to IEC 62321: 2008 andperfom€d by UV-VS.

2 n.d.

Sum of PBBS mg/kg

with reference to lEc 62321: 2008 andperformed by GC/l\rS.

n.d.Monobromobiphenyl mg/Kg n . d .Dibromobiphenyl mg/Kg 5 n.d.Tribomobiphenyl mlyKg n.d.Tetrabromobiphenyl mdkg 5 n.d.

Pentabromobaphenyl mg/kS n.d.Hexabromobiphenyl mg/Kg 5 n.d.Heptabromobiphenyl mg/Kg 5 n .d .Octabromobiphenyl mg/kg 5 n.d.

Nonabromobiphenyl m9Kg n.o.Decebromobiphenyl mgikg 5 n.d.

Sum of PBDES mg/Kg n.d.

Monobrcmodiphenyl ether mg/Kg 5 n.d.

Dibromodiphenyl ether m9Kg 5 n.d.

Tdbromodiph6nyl ether mgftg 5 n.d.

fetrabromodiphenyl ether mg/Kg 5 n.d.

Pentabromodiphenyl ether mg/Kg n.d.Hexabrcmodiphenyl ether mdkg n.o,Hepiabromodiphenyl ether mgikg n.d.

Octabromodiphenyl ether mg/Kg 5 n .d .Nonabromodiphenyl ether mg/Kg 5 n.d.

Decabromodiphenyl ether mgKg n.o.

mpL€15) b$sd th6 ra{ repod €irol b

c o F p s i y . i : r r , 1 i i r . . d i l i r , ' ! i - i j r i - r ' i r . , 1 ' 1 1 i i r . l l r i , . \ l i , r ' ! ! l 'r b " ; ; . d 6 $ @ b y h . c " ' p " n y e F d b b c s i e € | c o d l o i 5 o l s e N B p n n E d o v e d e l ' , ! a ' ' d e o n c cbr.6doi,.6md ddmmb

- i - d * h ' h . i , . 6 o l c s d " * p o i g b l ' € b b c | € d . ^ d s 3 d f u mh.;

",hb a"d d,qe*" *d- s. t.

l : I d f t , - , 1+e60 r rq r7e ,+s6oa ree t t {w {5@n

Page 40: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No. : CE/2011/A2967 Dde:2011hO124

JAMBOREE ROAD, IRVINE,

Page: 3 of 6

tm ||Il| tlllHENKEL CORPORATIONHENKEL ADHESIVES-ELECTRONICS MAIN OFFICE: 14000cALtFORN|A, 92606 U.S.A.

Note :1- mg/kg = ppm : 0.1wt% = 1000ppm2. n.d. = Not Detected3. MDL = Method Detection Limit4 . " - "=No lRegu la ted

ps(sJ bGd rh s bd rspdn €inor bc o m F i y i i , I i r l , . - l ' i l . r j l l i : l ' i l i r . { l f i , l n l l l 1 " ' ' . r l l l q * 'ii* il",f i"' ",*,!o u'n"c"'rlor€drcn'ciod31d@me$sub]ia"i"'iili"^ .io ei,a'a - **';" " y - a " m m i , . o o c " a t * s p m g b i r r t s o l s c L e n a n d h ] . d mi*i.

"sns .a

"u',a-' *o, o" t,

b F , d ' a . . d , a c - - d ? d

u oduiirr.qe,Nc'L FL.'!,tutu{/i,i.: l l t +::Lli;t r,i r s6lDr,,4tx t I s6{02r"4r'?3' wW$'on

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Test Report No. : CEl2011/A2967 Ds'.e : 20 11h0124

ICP-AES

Sample Material DigestionAcid

Steel, copper, aluminum, solder Aqua regia, HNO3, HCl, HF. HrO,

Gless HNO3/HF

Gold, plalinum, palladium, ceramic Aqua €gia

Silver HNO3

Plastic HrSO1, HrOr, HNO3, HCI

Others Any acid to total digeslion

Page: 4 of 6

|ll][t! |IttlltlHENKEL CORPORATIONHENKEL ADHESIVES-ELECTRONICS [rAlN OFFICE: 14000 JAMBOREE ROAD, lRVlNE,CALIFORNIA, 92606 U,S,A.

1) These sampleswere dissolved totally by prsconditioning method according to belowflow chart.( Cr& test method exclud€d )

2) Name of the person who made measurement Climbgroat Yang3) Name of the person in charge of measurement Troy Chang

c o m o , n y r , r l ' 1 L i r i - . l ' i . I | r , ' l : n t l D i . r ' t l i l $ t l \ i , 4 . 1 ' l l J i l t l _iy $qed 'o c Ge^e,a coiddoB d s

Acid digestion by suitable aciddepended on different samplematedal (as belon table)

Microweve digestion with

HNO3/HCVHF

Add appropriate amount of

digestion reagent

Heat to appropriate

tempefature to extract

Cool, filter digestate

through filter1) Ajkali Fusion2) HClto dissolve

measure the absorbance

at 540 nm by UV-VIS

,:-i i ri I ir- rr6ri,,:,1+s61ort,

Mem*' or desc9 crolp 66s sA)

Page 42: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No. : CEl2011/A2967 DaL :2011110124

HENKEL CORPORATIONHENKEL ADHESIVES-ELECTRONICS MAIN OFFICE: 14000 JA|I|BOREE ROAD, tRVtNE,cALtFORNtA, 92606 U.S.A.

PBB/PBDE analytical FLOW CHART

I Name ofthe person who made measurement Roman Wongr Name of the person in charge of measureftent Troy Chang

Page: 5 of 6

lllrrIlrl||||ttl|ll

Fhst testing process ------)

Optional screen process --...

Confirmation pfoces6 - .>

Screen analysis

Sample extraclion/Soxhlet method

Concenkate/DiluteExfacted solution

Ft|Ier

V

Analysis by GC/lrS

V

c o m o a n v ; r i i r l r : l , r ' ! - l ' : . r i l j n ) r i i . r . i l . l i l r i i l i . ' . r ' r l ! l ! ! l '

l p o i 9 b ' l } s l o G c l a n l a o d l h 3 d o o

'x,'-",,," ' ',, . i:lr::i.l:r::: ::r:i:111:1ty'lT *:'1111 "*"''""'' _:15'it:11":i'l::l:lll:

Page 43: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No. : CE/2011/A2967 Oate :2011110124

HENKEL CORPORATIONHENKEL ADHESIVES-ELECTRONICS MAtN OFFTCE: 14000 JAMBOREE ROAD, tRVtNE,cALtFORNtA, 92606 U.S.A.

" End of Repon ."

Page: 6 ofo

I[||||Il||||||lItItl

p€(s)r$rad th6 bd repd eiior bec o m o , i r i t ; . 1 . : 1 , f " r ' i r . r i l ; : i : : l , i ! ; ; : j \ : l I 1 r ' r r . l l t i l r t '

A t e n t o | s d r a w i l o l h . l n ' b l s d ] a b i }

. ' r , , l ; i1 , . . , " : : . - , . , ' ' . , " " 'f _ . '

Page 44: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No. : cE/2011/A2e64Datr'e :2011110124

Thefollowing sample(s) was/were submitted and identified by/on behalf ofthe client as :

Validi nownFOr (.lUeSt|Please Co ith sGE

P a g e : 1 o f 4

HENKEL CORPORATTON lllllll lll llllllllllHENKEL ADHESIVES-ELECTRONICS MAIN OFFICE: 14000 JAMBOREE ROAD, IRVINECALTFORN|A, 92606 U.S.A.

Sample De6criptionStyie/ltem No.Sample Receiving DateTesling Period

ADHESIVE86002011t1U182011 tlu 18 rO 201 1 t10t24

Test Result(s) Please refer to next page(s).

$t"-9 ottnSgn d llor

Chq €l lrbarto.t - T.iFa

p€ls) r€d.d frt Gn rspod €niol b'

comp, iy 4 , , i r , r i r l , r5n ' i I ' r r j ' l i r r r i l i : i l ! .6 f ' l i i l r r l I i i 1 ! , , 1 " l r , r ! * 'in"o"i'in ',*,eo by o. c.'p,jor srsdton c romsl dodneits sut rei . D;ummb d 'w $ 6mbm e d"q' ro iha I miat 0i dr riah it

* i *a ; t " m i . tocon. *

d @ ; " b k - . i , - . - " - "

. d

! idrrizone No!raiFic[rr:iw,.rdi]l-riii L:il*g! il]46(0r)2$t, r+$6(0r)r$tt w*4r@m

Mnbdorrhe s6s6rcup(scs 5A)

Page 45: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No. : CE/2011/42964 Date'.201th0124

: SILVER COLORED PASTE

Page:2 ol 4

Il][lIltllttll|lIRVINE,

HENKEL CORPORATIONHENKEL ADHESIVES-ELECTRONICS IVAIN OFFICE: '14000 JAITBOREE ROAD,CALTFORNTA, 92606 U.S.A.

Tost Resultlsl

PART I.IAME No.1

Test ltem (s): Unlt method MDLR€6ultNo.t

HalogenHalogen-Fluorine (F)(CAS No.: 14762-94-8)

mg/KgWith reference to Bs EN'14582:2007. Analysi6 waspedormed by lC.

50 n.d.

Halogen-Chlorine (Cl)(CAS No.: 2253715-1)

50 n.o,

Halogen-Bromine (Br)(CAS No.: 10097-32-2)

50 n.d.

Halogeniodine (l)(CAS No.: 14362-44-8)

50 n.d.

Noto :

1. mg/kg = ppm; 0.1wto/o = 1000ppm2. n.d. = Not Detected

3. IVDL = Method Detection Limit

ps (s )b i ' d r hs€d€pon€n rc r6cmp ,ny * . j r l r I r ] , f - . i ' t " 1 ' r i J ; ! n | j i l r r r , :

l l i r : d l j ] \ r . . f r l l i l t t u l { 'h";d.*, ' $*dbys"c*Fto, €efui,c tomd doajmsib. &br Abtuon 6 dawn ro ft nl3ridn d' rditv

on|y $d *s,n lh. fi b d c sn13,.s

-L , r - r t - * : |F ;1" : i+s6Pa,e

Page 46: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No. : CE/2011/42964 DaIe :2011/10124

l4OOO JAITBOREE ROAD, IRVINE.

Page: 3 of 4

HENKEL CORPORATIONHENKEL ADHESIVES-ELECTRONICS ['AIN OFFICE:CAL|FORN|A, 92606 U.S.A.

Analytical flow chart of halogen content'1) Mrne of the rrson who nEde nEasurenEnt: Rita Chen2) Narne of the person in charge of rEasurefiEnl Troy Chang

r3G) tssrd rh s led ietod €nnor b Icmeany . ; l l r l i L L f r , r r ' r i i l l n t 14 r l i . { l L }41 ,1 -1 r i . ' i l t l l i ! '

ny suhted 10 c Gei€6 condloBd swlo l 6 fun t i omde ]msb .sb ] * t bT . f tmdcmd6Bb ]E ld

-r l,,r!.'r j:lri€tu.r* 'sroartt

Sarple pretreatnEnt / Separ€tion

Weighting and putting sanple in cell

Oxygen Bomb Cornbustion / Absorption

Dilution to 6x€d volufiE

Analy6i6 wa6 perforred by lC

Page 47: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No. : CEl2011/A2964 Da[e:201U1On4

' The tested sample / pad is ma*ed by an arow if it's shown on the photo. *

*' End of Report *

Page: 4 of 4

t|| t!I|t ||ttl|lIRVINE,

HENKEL CORPORATIONHENKEL ADHESIVES-ELECTRONICS MAIN OFFICE: 14000 JAI'jBOREE ROAD.cALtFORN|A, 92606 U.S.A.

pe(3) bsied thsradGpdeiiolbec o m o , . v t ; , 1 r j l l , ! : r i l ! i . ' r t l ; ! , 1 : . r i i

' r : . | i r : t r t L 1 I i . r 1 : t r ! { .

'hsihi,menls'sUedbyh6cdpgiy$bredloi6Genemconddon5olsafo'e/deddele,ts!aLadeoncq

..|y aid *,b.. ths m b oi c si13hshl,, sh6 md ob €a ms m6. bB rd

LfiLl:- i:ll ir,,,,:ia $. orrxee

Page 48: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

T€st Report No. SHAEC1101630401 Date:23 Feb 2011 Page 1of 8

Heraeus (Zhaoyuan )Metal lraterials Co.,Ltd/Heraeus zhaoyuan (Changshu) El€ctronic lvaterials Co., Ltd.

No.238 Linglong Road Zhaoyuan Shandong/Huangpujiang Road, Changshu Southeast Economic DevelopmentZone, Changshu, Jiangsu

The following sample(s) was/were submitted and identifed on b€half of the dients as : Copper Wke Maxsoft

SGS Job No. :

Date ofSample Received :

Testing Period :

Test Requested :

Test Method :

Test Results :

Conclusion :

sP11-003272 - SH

17 Feb 2011' 1 7 F e b 2 0 1 1 - 2 3 F e b 2 0 1 1

Selected test(s) as requ€sted by client.

Please rcfer to next page(s).

Please refer to next page(s).

Bas€d on the performed tests on submitted samples, the results comply with theRoHS Directive 2002/95/EC and its subsequent amendments.

Signed fo. and on behalf ofSG$CSTC Ltd.

7QvFan Jingjie, JJApproved Signatory

Itb tu $tb(.|ds

b .e.d rr rh c.iF,rr.!l.d bb crsr ordx,r.l !Gl6 Ftu .|*,it|;;bi;;.i ibi;'lil.jaiid; llfi m' @di@a eidb &*'diS;;; fr6-.ii;id.i;;;;;;;;d;iibs;;;ij;|;h.EElidF6dEEE.*n@ft!a44! 1!!!lI'3:-1:-1;fr;-.;Jd ;; ;;;d;iibs;;;rii;|;h.EEffi;6iiFiEi.iitF

turdbdchiir r'l&dd. ar._;a,itibi6ii iadt bi i.'iatuilen6ti rr- c.llNn sd b. DtEdud.trDt h tur.{rttEdr.i.' {frs DrMr d!i' kitsry

@6td'brsdb.fu'd

t"AI adY|!to d)dilrfi,$.trorr [email protected]'l.liE8lll|l33er3"l ||rzo@3

r€!E{64r}O40aAlE!€F-aperyO r*.r!a.cotirlL(E-21)!la@t Hli(E-a)6adlm ..s.dftOs.6

M.mb.r or th€ SGS Omup Fsg 3A)

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Test Report

Test Results :

T€st Part Descriotion :

Spgdm6n No.1

Rema*s :(1) 1 mgikg= 1 PPm=00001%(2) MDL = Method Detection Limit

(3) ND = Not Detecled ( < [rDL )(4) '-" = Not Regulaied

RoHS DllEcrn e 2002/95iEC

No. SHAECl101630401 Date: 23 Feb 2011 Page 2 of8

SGS Samplo lDsHAl'1-016304.001

D€6diptionCopper metal wire

Test Method : With reference to lEc 62321:2008(1) Detemination of Cadmium by ICP-OES.(2) Determination of Lead by ICP-OES.(3) Determination of lllercury by ICP-OES.(4) Determination of Hexavalent Chromium by Spot test / Colorimetdc Method using Uv-vis.(5) Determin€tion of PBEIS / PBDES by GC-MS.

Test ltem(s)Cadmium (Cd)Lead (Pb)Melolry (Hs)

Hexavalent Chromium (CrVl)

Sum of PBBSMonobromobiphenylDibrcmobiphenylTdbromobiphenylTetrabrcmobiph€nylPentabromobiphenylHexabromobiphenylHeptabromobiphenylOctabromobiphenylNonabromobiphenylDecabromobiphenylSum of PBDESMonobromodiphenyl ether

tht't00

1,0001,000

0aNDNDND

NegativeNDNDNDN DNDNDN DNDNDN D

NDNDND

ud! MDtmdkS 2mS/kg 2mSftS 2

1,000 mg/kg- mg/kg 5- mdkg 5- ms/ks 5- mS/kS 5- mS/kS 5- mdks 5- mS/kg 5- mg/kg 5- mdkS 5- mg/kg 5

1,000 mg/Kg- mS/kS 5

j !i rb bE !d$c b D o'arc.duMr d I'rls pi{'d dl.j..tra|.d Dqld *-[r* { hAJthar/r**rl r4!44-!!4-e!!!!!!

c@yle|.dhd!|riy

!!!isEi!dr@!!lssut4!E

rrbtu rmrr.(.) r..hd

Mom!€r ol tho SgA Orolr ISOS &{)

t'Etsrtelaiiidx'r eqsfitffOrr 20@+t..tt. ciEattlsseit3tt t* 2M3

rElE&q)6 g63lElE(EgF4SS',tS wsr..!rdrcoO+t)GlOagl Nii6-a)!m ..!rd'dEr*6d

Page 50: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test ReportTest ltem{s)

Dibromodiphenyl elherTribromodiphenyl etherTetrabromodiphenyl etherPentabromodiphenyl elherHexabromodiphenyl etherHeptabromodiphenyl etherOclabromodiphenyl elherNonabromodiphenyl etherD€cabrcnodiphenyl ether

Test ltem(s)

Fluorine (F)Chlodne (Cl)Bromine (Br)lodine (l)

No. SHAECl101630401

!d

Date: 23 Feb 201 1

Ulit MDt P01mdkS s NDmS/kS 5 NDmg/kg 5 NDmS/kS 5 NDmSftS 5 NDmS/kS 5 NDmS/kS 5 NDmS/kS 5 NDmSftS 5 ND

Page 3 of 8

Noles :(1) The maximum permissible limit is quoted from the document 2005/6'18i/EC €mending RoHSdireclive 2002/95/EC(2) o spottest:Negative = Absence of CrVl coating, Positive = Presence of CfVl coating;The tested sampl€ should be fudher vedfied by boiling-water-extr€Gtion method if the spot test result isNegative or c€nnot be confirmed.o Boiling-wateFextrac{ion:Negative = Absence of CrVl coatng; Positive = Presence of CrVl coatingThe detected concentration in boiling-wateFextraction solution is equal or greater than 0 02 mg/kg with50 cm' samole surfac€ area,For corosion prcteclion coatings on metals: lnformation on storage conditions and production date ofthe tested sample is unavailable and thus resultrs of Cr(Vl) represent status of the sample at the lime ottesting

Haloosl

Test l\rethod : With reference to EN 14582: 2007, analysis was performed by lon Chromatograph (lC).

ud!mg/KgmS/kSmg/lrgm9KS

MS! 0p150 ND50 ND50 ND50 ND

PFOS (Perfrbrco.tane SufiorEb) and PFOA Poribrcodenolc A.jd)

Test Method : With reference to US EPA 3550C: 2007, analysis was perfomed by HPLC-IVS.

rl'6l b hl bd n..n htu n rb ih Inrr.(.) Gbc

ryil|db!. oj...r coridud..r 3tu redtld. ihr!l!t4rlE@4!!!l4e!!!4q'''iri @,iF.il! G brmr $! coidr@ to E.dimio oown d s.F trn.m .<oedilrh .nq't'd r. dnn io !r |rt{,bi d,.mtrereh{a&ftdtum h6ds Fd/{d h.rm dr6s.c$tf t. idht dhbdoafi m rir qcr|'tt ralle{. t h. Tlr clldrl r. r.r.5dtNdljJor'dbrffldd'ix'.i..dolidN'rn|t'n|tc.ffi1'oifirb.Morfu.i'dqptlnhj'{$!i'ioldf,.-l.|tmdffiio^dtuo

| .'d oltbardr udt0x hn ..lbi ddn.nlt,

tlt$S8llshd)|hrlbi4tndjor! 2(@'F!.Il.*f,glt.le|s9t! l*r@a

rE!€(6?1)61102$r lEr€6-A)64tS679 lfio.r{sdHlj(&-2 161.&50. ilj{16-2lFa5arE3 0 4.d*r€|!.d

M.n'!or or rh€ SOS Ord4 (SOS SA)

Page 51: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No. SHAEC1101630401

.iM ri l|r. bi4d rb nrrb h |Dpr.(.)brd .

DaIe: 23 F eb 2011 Page 4 of I

Test ltem{s)Perfluoroocrane Sulfonates (PFOS) and relatedAcid,Metal Salt and AmidePerfl uorooclyl Acjd (PFoA)

00.1ND

N D

ud!mS/kS

mgKg

MA!1 0

1 0

Notes :(1) PFOS Reference Infomation: Entry 53 of Regulation (EC) No 5522009 emending Annex XVll of

REACH Regulation (EC) No 1 907/2006 (previously restdcted under Directive 200611221EC)(i) May not be placed on the market or used as a substan@ or constituent of preparations in a

concentration equalto or higher than 0.005 % by meis.(ii) May not be placed on the ma*et in semFfnished prcducls or articles, or parts thereof, if the

concentration of PFOS is equal to or higher than 0.1 % by mass calculated with reference to themass of structurally or microstructurally distinct parb that coniain PFOS or, for textiles or othercoated materials, if the amount of PFOS is equal to or higher than l pg /m'? of the coated matedal.

Please refer to Regulation (EC) No 5522009 to get more detail information

It ' |ddftdIblnby0' rft crir ood{qror&'nFrdi {*h a!4r&!l$!.99!4!s!-t4.e4ry4.m. Do&ns d E!rrljs!&r4!!j!s4ttl!4!l

{ | f u d , n r h r c d s . v Mblltr r.b r1r clLd sc !|b do.Ldt i..d'q lqnoi. rib d.ffii, si.r F qD'bd r6tr h tun,*qD&*d16'1|ifu|| '*[h.J9dd

40 tEddnoi dtr dd d

M.nD6l ot th. scg o.o{r lscs &t)

t'lhlbeYasidd&nio||.d,Si.dioft i0@+t .Il.*icgiltlio8orxr.ril l|: 2o@s

rE|EFA)fllq$lEl€(&-2r)6l8Slt m.o4.mr(j(6-atfl{ErF tlj{s-tl)gdnB, . ledtug *d

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T€st Report No. SHAECl101630401

rrbturDPbhlh'bd

Date: 23 Feb 2011 Page 5 of 8

ATTACHMENTS

RoHS Testing Flow Chart

1) Name of the person who made testing: Allen Xiad Even Xu / Andy Zhao /Elim Lin2) Name of ih€ person in charge of testin$ Jeff Zhang/Georce XdTracy Yue3l These samplls were dissolied totally 5y pr6condiiioning-m€thod a;ording to below flow chad (cf*

and PBBS/PBDES test method exclud€d)

Sample Prep€ration

Sample Measurement

Acid digestion withmicrowav€/ hotplate

'1) Alkali Fusion /DryAshing

2) Acid to dissolve Adding 1,5-diphenylcalbazide

for colordevelopment

Adding 1,5-diphenylcarbazide

for colordeveloPment

A red colorindicates the

presence ofCr6*. lfne@ssary,

PbrcdrHg PBBs/PBDE5

M d.h, .bo!d diin &{B!n ni'td b 16r rd cdnh & Chrb Do@t a !!t!Etqtr|!.'l!!3aqs!!!:!4;d;i-:ar:4 .;;dd;i;;dii; i;h&d'Mddmdh.dwxdl|1E;nF-affin*dh'rco4.i,/r idh9. .'tut{d

.uqd b t od cddlror. ot Iwlc

:;;tui.d;-;i6h;6 ;;bb';'h'd;;ni.d"xdlnidiffi6ffiii.-E;i'rco4',/r idhr dtutnd;6i;iia|i*.do.dr hdMrdr. ,Jn ft.coqnvt m,. dFn rbftv.,orrcx.ddhr.@m,,d'r.dudnb'nh!.ri'|dhl$;riiarmdi'o|Fednuo*llah"i$it.d"in6 rihedn.n sDi dd*nbi.rrd.rdq.6no.ntqt..ro!.rydlddddrbo.d

tlEBhAltr-todnituoitnshddol! r0(BB$E.It.llE8t|llft3e93+l ll:rc4a!

iEEts-2D514@ lElE|6-n'6ae50t''! hd..!.Mru(6-21161a@4 rt16-e1)!r5B ..!:d'ar€g.M

Men&r ollne SGS Group (SOg sA)

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Test Reoort No. SHAEC1101630401 Dater 23 Feb 2011

PFOS/PFOA Testing Flow Chart

Page 6 of8

eaaFdio-''d $. c@i!/

1) Name of the person who made testing:Judy Li2) Name of the person in charge of testing: Nancy Du

tri o! |r@n d sr& t !drr@*]-!El4!4!Er-!!!-e!44!1hi tum,nqd b rmr &

.h*nh6Ld-edniidrrbrh.bir.(.)lri.d.

Sample cutting/preparation

Sample measur€ment

3'bt|,taGrru to dxt ijoSiAgrvCcrd d@+l'.t'l.eiE8f [r889+3.1i ll: ro@3

r FrF (6-2r)614u5! rElEl6-a)6rOS?9 mc..c.MH!@e1l6r4r4${ lii(6-A)g.0d5l .€rd*r&tdd

M€mberolinosGgoloup (sossA)

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Test Report No. SHAEC1101630401 Date: 23 Feb 2011 Page 7 of I

Halogen Testing Flow Chart

1) Name of the person who made testing: Daisy Gong

2) Name ofthe person in charge of testing:Alex Jiang

rhbtumd..sd ber\.c6D4!u.d b t. cddr c.ddloi sd .16r *dsrbr. ii!p!4ilg!!4bM d,tu .t.br. h;i &@tu,slr.d b rnr f{ cd!@ E adMr. ftatu! d !4rrr.*@!!9!e!4!!4+4Mlff | 4r iEn-a

;i;;tr;'6'fiar ;";; n';. nacmyr,r.r6.ttly'.bracdodn6d"*tddrduo"* n'r"q,-odE;d''dnflihdl'hf.i@D'i.wrq.'ri|.c.@r{'m.|b.$f.!.dEdhn,|'t!E'npdd,toEatffiraidhddoDdtrl lMdfi d6.dinf srrbibt.hr.(.)bbd

ft&lrlo.0YrsRodx'r|,0..d,9rtior. [email protected]|B!}l l|:t[sts

rErE(6-r)6r.04460 rErE(&r1F4053gtg eo.r.mli.,{S-21l61al!S4 rt(6?1)SlE6il ..95dit€4:6i

6^-6fr;iiitd;i dd=$..a

Sample cutting/preparation

Sample measurement

Combustion in oxygen bomb

Dis6olved in an absorptionsolution

Analyzed by ionchf omatography. Double confi rm

by other instruments, if

Msrnbor ol lh€ sos oloup (sGS SA)

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Test Report

Sample photol

[email protected]!nbyft

SGS authenticate the photo on ofiginal report only'*' End of Report "'

@md' b!- by rE htsry '!.Fd b 'r'-$.d a!dqd.d3.e Di idsMPl^d4'f#ffi?HffiTii;;n

"kr* h;r dd;.iir rik b 16r d cord.ft b ed

;;l:#;;;;;L;,;;;;e;;ie;. i;iob'dB"*i{r|frdtFtGffi6 iiDnnlllbs.conprry'r id'F nhtmdilli#,Y$i*,t-"?l'f ff trltffi,Jiff;L'ffiT:il#,l$XiJi*f;'f; Slii,:llllti?i.':il:lili;iffi ffi #ffi ffifi;;;l:#;;;;;L;,;;;;e;;ie;. i;iob'dB!6i{r|frdtFtGffi6 iiDnnlllbs.conprry'r id'F nhtmd

ffi'rgs##i"f"m**;l.:l*;,*rs;;*T"s,#"|,Rhj:*stti':iftril"',il,il;ffi?';i'illiii""JmtrilSffiiiiiidn.niN;.rwao o;'ghdtii orh6tu'd rp'{l

No. SHAECl10163CM01 Date: 23 Feb 2011 Page 8 of 8

sHA11-016304.001

th.ht..ld|.illh.tudl.n''|$'rn.co@dn ob|hsdN undd rh. hfldron !6n{ld.

Dub rhM ii 6r nr qd rnf.irrit h 'stL.(.) r6!.c

J'itpa!.gfi{iodx'r'lDift,51biCroli l0(@+l -l't.*iEEtt*83sS3tl ln 2M3

rEEEl6?r)81,(8553 lElEls-a54€S6t9 tq4.@HJ($-2rl6r'(!s9{ rrlj {6-aFastxEt . asdtr&96

MembBr ol tho 8os coup {SGs SA}

Page 56: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

Test Report No. : CEl2O12l428O4 Oate:2012104125 Page : 1 of I

HITACHI CHEMICAL CO., LTD.1772-1 KAMKUBO YUUKI-SHI IBARAKI, 307-0015, JAPAN

Validit nownFor QuesfiPlease Co ith scs

il|lflt lfiI|Il fl

The following sample(s) was./were submitted and identified by/on behalf oflhe client aa:

Sample DesciptionStyldltem No.Sample Receiving DateTesting Period

EPOXY [/|OLDING COMPOUNOCEL-922OHF2012t04t16201 2 I O4t 1 6 r O 20 1 2t 04 n5

Test Result(s) : Please refer to next page(s)-

own'nihhiesieeod6ibroirvrorheemoe6rFned rh srsdrcponenn

i r i sa i , on iens , * ' . " r ydc "Dd ; ' ' ' o ' cdbBLmdd 'o6 l f sds " f u ' " pnn [email protected] |avo |obhsfq b eredonrc bManamds *o&rGTemsand .oldior.to | fti.;d;liiJiiN'i"d;;;di.n;nij;icnonidesdeimdir€cnfu'hddero|hsdeUmed'iadv9d6ah " ; ; " i 6 ; I ; n ; " i ' " * i ; ' , d ; i f $ ; ] i i i 6 ' c i 6d !hsec | i os ' i i ] ^ ! l h comFa '$e ram€b ! ';a;;A dn rcm a;L'm . mndo do e i -i .oLm"i' r'{;od rpad eddcdp l i!o pa-y +y ..u ro' /;o Jr.ano oq-y o' " fr6to o 1" ,rt1r o

(rtw

g![rGd for {d

€lEfiLd Ldor.t ry-T.lp€l

Page 57: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

SGSTest Report No. : CEJ2O12142804 Dale :2012104125 P a g e : 2 o f 8

HITACHI CHEMICAL CO,, LTD.,!772-1 KANAKUBO YUUKI-SHI

Test ReSUII{S}

PART I{AME No.l

Test ltem(s) Unit M€thod MDL ResultNo.l

Cadmium (Cd) mgikg Vvith reference to IEC 62321: 2008 andperformed by ICP-AES.

2 n.d.

Lead (Pb) mgKg With reference to IEC 62321r 2008 andperformed by ICP-AES.

2 n.d.

Mercury (Hg) mg/Kg With reference to lEc 62321r 2008 andperformed by |CP4ES.

2 n.d.

Hexavalent Chromium Cr(Vl) mg/Kg With reference to IEC 62321: 2008 andperfonned by UV-VIS.

2 n.d.

Antimony (Sb) mg/Kg With reference to US EPA Method3052 for Antimony Content. Analysiswas performed by ICP-AES.

2 n.d.

HaloqenHalogen-Fluorine (F) (CAS No.:14762444\

mg/Kg

With reference to BS EN 1458212007.Analysis was performed bY lC.

50 n . d .

Halogen-Chlorine (Cl) (CAs No.:22537-15-1]

mg/Kg 50 n . d .

Halogen-Bromine (Br) (cAS No.:10097-32-21

mg/kg 50 n . d .

Halogen-lodine (l) (CAS No.:1436244-A)

mgKg 50 n.d.

Sum of PBBS

mdkg With reference to IEC 62321: 2008 andpertormed by GC/IMS.

n.d.

Monobfomobiphenyl 5 n.d.

Dibromobiphenyl 5 n.d.

Tribromobiphenyl 5 n.d.

Tetrabromobiphenyl 5 n.d.

Pentabromobiphenyl 5 n.d.

Hexabromobiphenyl 5 n.d.

Heptabromobiphenyl 5 n.d.

OctabromobiPhenYl 5 n,o.5 n.d.Nonabromobiphenyl

Decabromobiphenyln.d.

fld:""lii*iti;I",rtj';iii'*1*ft-i"""n#iillisttllii*ri:lX*;"i*:i"i:l;#;fft*"iip; '"'i*,r,*;*r anaoftnoesmat be PrcFared ro

]ttI |||ll I|llllllIBARAKI. 307-OO1 5. JAPAN

DARK GRAY LUI'P

, , sbr l r ranD i .&0r r@ r t d^s '

conpan'Anyunauiro0zeda]le.a!on.bfgelyol

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Test Report No.:CE/2012l42804 Dale:2012104125 Page: 3 of 8

HiTACHI CHEMICAL CO., LTD.1772.1 KANAKUBO YUUKI-SHI IBARAKI, 307-0015, JAPAN

NoG :1. mg/kg = ppm I 0.1wgo = '1000PPm

2. n.d. = Not Detected3. MDL = Method Deteclion Limit4 . " - "=No tRegu la ted

flr|iIlrl0 mt !t1

ffAi:,ffi#;1ffi:$,ffi;i-=ii'iE#;':l:i;5ii':i:'rr"":e1ir'!i11'"s':@fr--de@'d*'d"*''i''*-'^'**^-*'*"'*hffi-}h:#t;{"}.T,*$?3,|nfi$iE$tr..:$H:$j*!#i,1!F;'sjtr#.j$*{flt$3.ififf#*u$T,;ffi[hffi,t1ffi$jffi

Te3t ltem(s) Unit Ilethod MDL ResultNo.1

Sum of PBDES

mg/kg With reference to IEC 62321: 2008 andperfomed by GC/[,]S.

n.d.

lVonobromodiphenyl ether 5 n-d-

Dibromodiphenyl ether 5 n . d .

Tribromodiphenyl ether 5 n.d.

Tetrabromodiphenyl ether 5 n.o.Pentabromodiphenyl ether 5 n.d.Hexabromodiphenyl ether 5 n.d.

Heptabromodiphenyl ether n.o.Octabromodiphenyl ether n.d.

Nonabromodiphenyl ether 5 n.d.

Decabromodiphenyl ether 5 n.d.

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Test Report No. : CEl2012l42aa4 Oale :2012104125

HITACHI CHEMICAL CO., LTD.'1772-1 KANAKUBO YUUKI-SHI IBARAKI, 307-0015. JAPAN

1 )

P a g e : 4 o f 8

Sample Material DigestionAcid

S-teel, copper, aluminum, solder Aqua regia, HNo3, HCl, HF, Hro,

Glass HNOy'HF

Gold, platinum, palladium, oeramic Aqua regra

Silver HNOs

Plastic H,SO{, H,Or, HNO3, HCI

others Any acid to total digestion

l n I ||lmll$llll

2',13)

These sampleswere dissolved totally by pre_conditioning method acc.rding to belowflow chart( Cr6* test method excluded )

Name oflhe pe6on who made measurement: ClimbgreatYangName of the person in chafge of measurement: Troy Chang

ICP-AES

Cutting / Preparation

Sample Measurement

Add appropriate amount of

digestion reagem

Microv/ave dige6tion with

HNq/HCVHF

Acid digestion by suitable aciddepended on different samPlematerial (as below table)

Heat to appropriate

temperature to eratract

Cool, filier digestate

th.oughfilterAlkali FusionHClto dissolve

Add diphenyl-c€rbazide for

color development

measure the €bsorbance

at 540 nm by UV-VIS

Cr5.

r a s r o - t r e t 7 4 - i ! 9 5 4

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scqTest Report No. :CEl2O12l428O4 Date:2012104125 Page: 5of I

HITACHI CHEMICAL CO., LTD.1772-1 KAMKUBO YUUKI-sHI IBARAKI, 307.0015, JAPAN

1) These sampleswere dissolved totally by pre-conditioning method accotding to below ffow

2) Name oflhe person who made measurement climbgrcatYang3) Name of the person in charge of measuremen! Troy Chang

Flow Chan ofdigestion for th€ elements analysis p€rformed by ICP-AES

Seel, coppef, aluminum, solder Aqua regia, HNO3, Hcl, HF, HrO2

Glass HNOs/HF

Gotd, platinum, palladium, ceramic

Silver HNO3

Plastic HrSO{, H,O,, HNO3, HCI

Others Any aoo to lolaldigestron

yp-t:ll-";, .,.. - ^ "";1,";" .,",.:." *

""*.! -1,;lt:"t;;:;::*:".""f, ffi *,;;'^l* ,"?!1.:;,c""Ti.:t: :,jA o*"i".1,i,*';",i...,"::i:F ""1"a n d | o r e d r c m i o m a l d o c u m e d s s l b F d ] o T m s a n d c o n d i 6 s. : ; ; . d | h l | ' h " " " . ' f ' * . J d u E d q * G ' o a T o I ' ; ; ' ; : ; d o , | ' d ' f i d j d ' * d

.;:'m:li:,1{.."'*;rrfi$:d,,i;ll"r#.*;,";"r.i fii;;"#i-"*i:*';!Jra#1i;:r;"tir:ir':t'ffi":rri;'r'g;;

r!fltu [lllLi:

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Test Report No.:CE1201?J42804 Dale 2112tc/.125 Paoe:6of 8

HITACHI CHEMICAL CO., LTD.1772-1 KANAKUBO YUUKI-SHI IBAMKI, 307-0015, JAPAN

llllt [tll| r[ul tt

Analyticalflow chart

r Name oflhe peEon who made measurement Roman WorLgI Name oflhe person in charge of measurement Troy Chang

( Test ltems: PBB/PBDE, TABP-A.bls )Firsltesling prccess -----.> Oplionals@en prccess ..!t Conlimation process - .>

Scrc€n analysis

Sample extraction method

ConcentratdDiluE Eliracled solution

vI Analvsis bv GC/MS I

v

pany subjed io ib GeneJa condtuib l { r ' o - q , d r c . o d r " o " T . . o n , . - - | s ; o - o o d f l . o T

miratoiorrabiit 'ndemficaron and y horder oftt i s de'nad iaadv sdd rhr:, iy rhe comp3iy! $re respodtb i 'ry s 10 ib c enr.id rh! d@ment does nor eroieEG padi.tro.

qaned on irm e,eEs ns a Ldnscto,i dodmenG li6 dcmenr 6id ha .ep6du€d er@pr i tur wbou pior Mr6n aprioyaLor rhee lu erene o1$e e

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Test Report No. : CFJ20'12i42804 Oale | 2UAU|25 Page: 7 of 8

HITACHI CHEMICAL CO., LTD.,1772-1 KANAKUBO YUUKI-SHI IBAMKI, 307-0015, JAPAN

Analytical flow chart of halogen content

1) Name ofthe oeBon $to made measurcment Rita Chen2) Name of the percon in charge of measurement Troy Chang

rfll|[ll|| lu[ ||t

Weighting and putting sarnple in cell

Oxygen Bomb Combustion / Absorption

DilLrtion to ixed volume

Analysis was performed by lC

| l . r " : ' , . j ' ' ' , ' ' ' . "^ ; " ;e" ' ' . . " " ; ' " ' : . . l . i i . " " . , i " . ." : d ; : ; ; ; n ; b ; ; ; o l F 1 ' * b 1 - | 6 - e r u f d . o ' d ] mh h ; d ; . i b l ' i N : f d . m I i l i € b n a i d ' t d d m i s c s d € f i m d I h g ; n r i i ' a ' d b 6 d @ u r e d , i d , * d h

[;;{i;til'n::;'"';*'#i$,iiifiii*i+:';iitif:"s:}l:,-'J'"ir:llqx.lirir:3J}'*i"""-"ji"tjil:i:"jjtj {i:i1'";ri"';j:t"'j

Page 63: ICP Test Report Certification Packet/media/electronics... · 8/13/2012  · Test Report No. I CE12011t42129 SAMSUNG TECHWIN CO,, LTD, 42, SUNGJU-DONG. CHANGWON. KOREA Dale:201114120

IscsI

Test Report No. I CE|2O1A42804 Dale 2O12lUn5 Page:8of8

HITACHI CHEIVICAL CO,, LTD.1772-1 KANAKUBO YUUKI.SHI IBAMKI, 307-0015' JAPAN

' The test€d sample / pad i6 ma*ed by an arrow if ifs shown on the photo '

" End of Report -

ffihffiffimNffiffft-,,ffiemmiffiffi

rlfl||[||l[[llll

42804