hot electrons in thz quantum cascade lasers - monte verita · universitàdi bari cnr-infm...
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UniversitUniversitàà di Baridi Bari CNRCNR--INFM INFM RegionalRegional LabLab
Miriam S. Vitiello, Gaetano Scamarcio, Regional Laboratory LIT 3, CNR – INFM and Physics Dept.,University of Bari, Italy
Giacomo Scalari, Christoph Walther, Jerome FaistETH Zürich Switzerland
Harvey Beere, David RitchieCavendish Laboratory, University of Cambridge, Cambridge, UK
Hot electrons in THz quantum cascade Hot electrons in THz quantum cascade lasers lasers
OutlineOutline
Experimental evidence of hot-electron cooling associated with photon emission
Energy balance equation model in QCLs→ correlation of laser induced hot electron cooling with quantum efficiency
Assessment of:
• Internal quantum efficiency
• External differential efficiency
• Wall-plug efficiency
• Slope efficiency
• Electron-lattice energy relaxation times
• In Electronic and Photonic devices electrons release the excess energy gained from the applied electric field by:
• exciting other electrons • emitting phonons or photons
• Equilibrium condition between PP and the energy loss rate: average electron energies > crystal lattice one → hothot--electron populationselectron populations
• Electronic distributions: Fermi-Dirac functions characterized by temperatures Te >> TL
• Relevance of including hot-electron distributions in semiconductor laser modellingsemiconductor laser modelling →hot electron effects are directly correlated with physical parameters central in the laser theory
MotivationMotivation
Lattice TL
Heat sink TH
Input Power(P)
ττeLeL
ElectronsElectrons
Non equilibrium distributionThermalized by
e-e (∼ 0.1 ps above ∼ 1010 cm-2)e- LO phon scattering (∼ 0.1 ps)
• Energy relaxation channels in QCL:
-Inter and intra-subband e-e scattering
ττeeee ∝∝ ΔΔE/E/nnjj → scattering time is proportional to the energy separation between the initial and final states
-e - phonon scattering ττeLeL energy loss lifetime between each electronic subsystem and the lattice
- e-impurity-interface roughness
Interplay between above processes → different electron temperatures among subbands
-QCL ideal to study hot electron populations: Large P High thermal resistancesLimited e-lattice relaxation efficiency
Energy balance in Energy balance in QCLsQCLs
Lattice TL
Heat sink TH
ττeLeL
ττeeee 8
1,2
Input Power(P)
ττeLeL
6
InjectorInjector Active regionActive region
MM11
Quantum design:Quantum design:
• Bound-to-continuum scheme • Two-level injection/depletion module•• EE8686 = 7.4 = 7.4 meVmeV ; ; zz8686 = = 10.1 nm10.1 nm•• EE11--2,8 2,8 ~ 0.6 ~ 0.6 meVmeV
Two electronic subsystems can be identified:
• Active regionActive region: includes the upper laser level and the depletion miniband.
• The injectorThe injector: doublet of closely spaced lowest energy levels.
Low frequency THz Low frequency THz QCLsQCLs
Walther et al. APL 89, 231121
Distance (nm)
100 0
Ene
rgy
(eV
)
86
12
Injector Active
0.10
0.05
0
Experimental approachExperimental approach
8→k
1,21,2→ k
(1) (2)(3)(4)
ΔE = (E-EP) (eV)
PL
Inte
nsity
(arb
. un
its)
0.02 0.040
100
10-1
10-2
(1) 70A/cm2
(2) 93 A/cm2
(3) 118 A/cm2
(4) 140 A/cm2
• Photoluminescence spectroscopy on the laser front facets
• Extract local lattice and electronic temperaturesfrom PL analysis
Si CCD
Monochromator
Objective
Kr+ Laser
He-flow micro-cryostat
X-Y control (100nm)
(1) (1) →→ Low V; Below the threshold for carrier injection into the upper state → most of the electrons are sitting in the injector doubletinjector doublet
((22--33--44) →→ Higher V; the energy difference between the injector and the upper state is reduced → additional peaks on the high energy tail of the main PL bands shows that electrons are injected into level 8electrons are injected into level 8..
Electronic and Lattice temperaturesElectronic and Lattice temperatures
Measurement of the electron temperatures:
- Below threshold of alignment- After injection into the upper state- Above lasing threshold
50
100
150
0 0.2 0.4 0.6 0.8 1.0
50 100 150
50
100
150
0
4
8
0 0.2 0.4 0.6 0.8 1.00
40
80
a
b
Power (W)
Vol
tage
(V)
dV/d
I (Ω
)
Te
j(K
)
TL
(K)
I
IIIII
IV
Current density (A/cm2)
Four regionsFour regions, clearly correlated with features in the transport transport measurementsmeasurements can be identified.
0
4
8
0 0.2 0.4 0.6 0.8 1.00
40
80
50
100
150
0 0.2 0.4 0.6 0.8 1.0
50 100 150
50
100
150
Electronic and Lattice temperaturesElectronic and Lattice temperatures
Efficient electron-lattice scattering Rate equation:Rate equation:
[ ] ps..)RR(NkN LeBeeL 250220 −=−=τ
I I Below injection into level 8Below injection into level 8
M1
8
61,2
• Efficient (τee≈100 fs) energy redistribution process between the injector and M1 → Te
inj ≈ Teactive
• )( Lej
eL
jj TTkn
Ρdt
dE−−=
τ
L
einj
e RP
TR ≈=ExperimentalExperimental
a
b
Power (W)
Vol
tage
(V)
dV/d
I (Ω
)
Te
j(K
)
TL
(K)
I
IIIII
IV
Current density (A/cm2)
Electronic and Lattice temperaturesElectronic and Lattice temperatures
II II AboveAbove alignmentalignment
• The measured electronic temperature corresponds to Te
active
– Injection in level 8 → confirmed by new PL peaks
– Subband populations in the same quantum wells equilibrate quickly (100-200 fs) to a common Te
– Experiments in BTC THz QCLs demonstrate that the miniband and the upper subbandshare a common Te
Vitiello et al. APL APL 89, 021111, (2006).89, 021111, (2006).
50
100
150
0 0.2 0.4 0.6 0.8 1.0
50 100 150
50
100
150
0
4
8
0 0.2 0.4 0.6 0.8 1.00
40
80
a
b
Power (W)
Vol
tage
(V)
dV/d
I (Ω
)
Te
j(K
)
TL
(K)
I
IIIII
IV
Current density (A/cm2)
Electronic and Lattice temperaturesElectronic and Lattice temperatures
• Cold electrons progressively populate level 8
• electrons are scattered elastically or quasi-elastically with a large excess energy to a lower state
• electrons thermalize within their respective subbands at a temperature Te
active > Teinj
M1
861,2
II II AboveAbove alignmentalignment
HeatingHeating of the upper laser of the upper laser levellevel::• A comparable amount of injected electrical power is distributed between the two subsystems• But nactive << ninj
50
100
150
0 0.2 0.4 0.6 0.8 1.0
50 100 150
50
100
150
0
4
8
0 0.2 0.4 0.6 0.8 1.00
40
80
a
b
Power (W)
Vol
tage
(V)
dV/d
I (Ω
)
Te
j(K
)
TL
(K)
I
IIIII
IV
Current density (A/cm2)
Electronic and Lattice temperaturesElectronic and Lattice temperatures
LasingLasing regionregion
50
100
150
0 0.2 0.4 0.6 0.8 1.0
50 100 150
50
100
150
0
4
8
0 0.2 0.4 0.6 0.8 1.00
40
80
a
b
Power (W)
Vol
tage
(V)
dV/d
I (Ω
)
Te
j(K
)
TL
(K)
I
IIIII
IV
Current density (A/cm2)
Efficient hot electron cooling hot electron cooling by photon emission →Photon emission extracts part of the input power
Further proof: Lasers vs mesas
0
50
100
150
80 100 120 140 160 180
(Te ac
tive-
TL)
(K)
Current density (A/cm2)
laser
mesa
• Mesa device → No evidence of change in the slope
• Change in the slope at the onset of lasing
( )dJ
TTd Le
active −
( )dJ
TTd Le
active −
Electronic and Lattice temperaturesElectronic and Lattice temperatures
Sample A (50 Sample A (50 µµmm ×× 1mm)1mm) Sample B (140 Sample B (140 µµmm ×× 1mm)1mm)
50
100
150
0 0.2 0.4 0.6 0.8 1.050
100
1500
4
8
1250 100 150
0
40
80
120
Tej
(K)
TL
(K)
Power (W)
V (
Vol
t)
dV/d
I (Ω
)
J (A/cm2)
(a)
(b)
50
100
150
0 1 2 350
100
1500
4
8
12
50 100 150
0
20
40(a)
(b)
Tej
(K)
TL
(K)
Power (W)
V (
Vol
t)
dV/d
I (Ω
)
J (A/cm2)
Energy balance in Energy balance in QCLsQCLs
thotot PPP
dt
dE −−=
Electrical ThermalOptical
)TT(kn
)kTkT(q
J
dt
dEL
einj
eL
injeinj
eactive
inj −−+−=τ
Δ1
ντ
nShgTTkn
EkTkTq
J
dt
dEL
eactive
eL
activemb
eactive
einj
active Δ−−−Δ+Δ+−= )()( 86
86EkTkT mbe
inje
active Δ+Δ<<−Present case
Lattice TL
Heat sink TH
ττeLeL
ττeeee 8
1,2
Input Power(P)
ττeLeL
6
Injector Active region
MM11
Hot electron cooling Hot electron cooling →→ probe of the laser probe of the laser efficiencyefficiency
• Cooling of hot electrons in the active region is correlated with the internal quantum efficiency of a laser
S=S= 00
SS≠≠ 00
qdJ
dStotint ⋅⋅=
+⎟⎟⎠
⎞⎜⎜⎝
⎛−
⎟⎟⎠
⎞⎜⎜⎝
⎛−
= ατ
τττ
τττ
η
686
68
86
68
1
1
InternalInternal quantum quantum efficiencyefficiency
( )mbactive
eLLe
active EkqndJ
TTd Δ+Δ≈−68
)( τ
( )intmbactive
eLLe
active hhkqndJ
)TT(dνηΔν
τ−+=
−
020406080
100
80 100 120 140 160
020406080
100
80 100 120 140 1600
20406080
100
80 100 120 140 160
020406080
100
80 100 120 140 160
J (A/cm2) J (A/cm2)
J (A/cm2) J (A/cm2)
40K 60K
50K 70K
(Tac
tivee-
TL)(
K)
(Tac
tive
e-T
L)(
K)
(Tac
tive
e-T
L)(
K)
(Tac
tivee-
TL)(
K)
Temperature dependence of Temperature dependence of TTeeactiveactive
At increasing TH, the slope the slope d(Td(Tactiveactiveee--TTLL)/dJ)/dJ above lasing threshold above lasing threshold increases → laser cooling
less effective
Internal quantum efficiency ηint
0
1
2
3
4
5
0 20 40 60 80 100
TH (K)η d
(%
)
Differential external Differential external quantum efficiency quantum efficiency
per stageper stage
0
20
40
60
80
100
0 20 40 60 80 100
TH (K)
η in
t(%
)
tot
mintd α
αη=η
( )( )
υΔυ
Δυτη
h
h
h
kqn
dJ
)TT(d mb
mbeL
activeLactive
eint
+⎟⎟⎠
⎞⎜⎜⎝
⎛
+−−= 1
Internal quantum efficiencyInternal quantum efficiency
Comparison with alternative experimental approachesComparison with alternative experimental approaches
• The measured efficiency values are a factor ≈ 4.5 larger than those obtained by conventional optical measurements
• Optical testing → inherently limited by:– the small collection efficiencies of the optical set-ups – the high optical beam divergence of metal-metal waveguides
•• Alternative approachesAlternative approaches → relative change in the differential resistance above and below threshold
⎟⎠
⎞⎜⎝
⎛ −=R
Rint
Δη 1
- Due to residual resistances in the device understimation of ≈40% in the internal quantum efficiency have been obtained
WallWall--plug efficiencyplug efficiency
0
0.1
0.2
0.3
0 20 40 60 80 100
TH (K)
η wM
AX
(%)
⎟⎠
⎞⎜⎝
⎛ −=J
J
Ve
Nh th
tot
mw 1
1int
νααηη
η w (%
)
64
2
0
(TL
-T
H –
RL
×P
) (K
)
Power (W)
(d)
(e)
01
-1-2
0 2 4 6
Our thermal selfOur thermal self--calibrated approach in calibrated approach in surface surface plasmonplasmon THz THz QCLsQCLs
• Deviations from the thermal resistance trend in the lasing range Pthermal ηW
ηηw w = 1= 1-- ΔΔT/(PT/(Pinin ×× RRLL))
Sensitivity:Sensitivity: ηW > 1%
Hot electron probe → Higher sensitivityHigher sensitivity, particularly useful in the characterization of terahertz sources with highly diverging beams like doubledouble--metal metal QCLsQCLs.
M.S.Vitiello, et al.APL 90, 191115 (2007)
Alternative gain mediaAlternative gain media
• The processes observed in the terahertz QCLs are quite general and can be conveniently extended also to other gain media
•• DoubleDouble--heterostructureheterostructure interbandinterband laserslasers → carrier heating by Auger recombination plays a very fundamental role
– The hot carrier cooling rate may be much slower than the energy loss rate by phonon emission
– The excited level temperature increase well above the one of the lattice or the carrier reservoir
– Less abrupt change of the heating rate at threshold is expected → a significant amount of power is extracted from the laser via spontaneous emission processes even below threshold.
SummarySummary
• Experimental evidence of a new physical phenomenon characteristic of semiconductor lasers: the cooling of the electrons above the laser threshold for stimulated emission
• Correlation between the hot electron cooling and the internal quantum efficiency of a laser
• Self-calibrated approach to extract the internal quantum efficiency and the wall-plug efficiency in a QCL
•• ImplicationsImplications →→
–– Inclusion of the electronic temperature in the general theory ofInclusion of the electronic temperature in the general theory of semiconductor semiconductor laserslasers
–– HotHot--electron effects must be fully understood in THz QCL to explore electron effects must be fully understood in THz QCL to explore the device the device physical limits in terms of maximum temperature, wavelength and physical limits in terms of maximum temperature, wavelength and quantum quantum efficiencies.efficiencies.