hot cathode gauges for uhv pressuresbibliothek.fzk.de/zb/berichte/fzka6886dateien... · indirect...

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Hot Cathode Gauges for UHV Pressures Harald Brinkmann Leybold Vacuum, Cologne, Germany [email protected] The most common gauges for UHV pressure measurements are Hot Cathode Gauges. These ionization gauges are known to be limited in the lower range due to x-ray and ESD (Electron Stimulated Desorption) effects. I will give a short review of the function of Bayard-Alpert and Extractor gauges as well as the influence of the limiting effects and ways to optimize the gauge design. Some information regarding calibration and accuracy are added.

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Page 1: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

Hot Cathode Gauges for UHV Pressures

Harald Brinkmann

Leybold Vacuum, Cologne, Germany

[email protected] The most common gauges for UHV pressure measurements are Hot Cathode Gauges. These ionization gauges are known to be limited in the lower range due to x-ray and ESD (Electron Stimulated Desorption) effects. I will give a short review of the function of Bayard-Alpert and Extractor gauges as well as the influence of the limiting effects and ways to optimize the gauge design. Some information regarding calibration and accuracy are added.

Page 2: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

1

Hot Cathode Gauges for UHV pressuresIndirect Vacuum Measurement

Ionization Gauges use the probability of gas ionization to

determine the particle number density.

The particle number density is related to the pressure.

Page 3: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

2

Hot Cathode Gauges for UHV pressuresPrinciple of Ionization

- +

=> Gas molecule

Ion +

Electron -

Page 4: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressuresPrinciple of Hot Cathode Ionization

Gas

Ion +

Electron -

Cathode Electron Source 50 Volt

Anode Electron Drain 200 Volt

Ion Collector Electron Source 0 Volt

Emission current Ion current

Page 5: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressuresBayard-Alpert

Hot cathode outsideAnode in spiral form Centric Ion CollectorMeasuring Range app.1x10-2 bis 1x10-11 mbar

Page 6: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

5

Hot Cathode Gauges for UHV pressuresHot Cathode Ionization Gauges

The hot cathode ionization gauges initiate a constant electron flow from the glowing cathode (electron

source) to the anode (electron drain). These electrons hit a pressure dependent quantity of gas molecules. The

gas molecules become positive ions, which cause a pressure related current on the ion collector.

Formula: p = i+ / ( i- . C)C = System-Sensitivity

Page 7: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressuresRelation Ion Current to Pressure

Pressure [mbar]

1,0E-10

1,0E-09

1,0E-08

1,0E-07

1,0E-06

1,0E-05

1,0E-04

1,0E-09 1,0E-08 1,0E-07 1,0E-06 1,0E-05 1,0E-04 1,0E-03 1,0E-02

Ion

Cur

rent

[am

p]

Page 8: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

7

Hot Cathode Gauges for UHV pressures

The measuring range of hot cathode ionization gauges is limited, when the particle number density becomes so high, that the

positive ions cannot reach the ion collector in a pressure dependent quantity. The ion current is reduced even when the

pressure increases. To extend the lifetime of the cathodes, a pressure dependent

emission start is requested.

Upper Limit

Page 9: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressures

The lower limit of hot cathode ionization gauges is caused by the X-ray effect.

Electrons emitted from the cathode impinge on the anode and release photons (soft X-rays) there.

These X-rays trigger electrons from ion collectors surface and causing an offset current.

Lower Limit

Page 10: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressuresX-Ray Limit

C A I

e-

e-

1,0E-12

1,0E-11

1,0E-10

1,0E-09

1,0E-08

1,0E-13 1,0E-12 1,0E-11 1,0E-10 1,0E-09 1,0E-08

Page 11: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressuresImproved Ionization Gauge

For measuring pressure in extreme high vacuum was a system developed which reduces the X-ray limited by

shielding the ion collector. To keep the ion current on an acceptable level, the positive ions are focussed by an

electrical system.

This Extractor system extends the measuring range down to 2x10-12 mbar. The upper limit is about 1x10 -4 mbar.

Page 12: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressuresExtractor System: Sectional Drawing

C- CathodeA- AnodeI- Ion CollectorR- Reflector

R=205 V

A=220 VC= 100 V

I= 0 V

Page 13: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressures

Another effect of hot cathode ionization gauges is called

Electron Stimulated Desorption (ESD).

Molecules on the anodes surface are desorped by electron

bombardment. Some are emitted as neutral molecules

others as positive ions.

Electron Stimulated Desorption

Page 14: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressuresElectron Stimulated Desorption

Anode

Particles leave the surface as molecules and cause an increasing pressure.

Others become ions and will cause a non pressure related ion current.

Both influence the pressure indication.

Page 15: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressuresElectron Stimulated Desorption

Anode

Hot ion gauges are equipped with a “degas” function.

The anode is switched to a higher electrical potential and the emission

current is increased. The anodes temperature is increased and particles

are desorped.

Page 16: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressuresElectron Stimulated Desorption

Anode

The quantity of particles on the surface is reduced after degassing, but adsorption and

desorption is an ongoing process.

The ESD effect still remains, but the value can be influenced by the gauge design:

size of anode, material of anode and emission current .

Page 17: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressuresDegas of BA and Extractor

Pressure Indication

Time

Degas p = constant

Extractor

BA

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LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressuresOutgassing Effects

The hot cathode produces outgassing effects:

• from the hot filament itself

• from heated surfaces of the gauge head

• from surrounding walls, heated by radiation

Page 19: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressuresReduced Outgassing

The outgassing can be reduced by:• low temperature filament (Yttriumoxid coated Iridium)• material of electrodes (low gas adsorption)• material of flange and walls (high heat conductance and low emissivity)

Page 20: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressuresSummary

An extractor gauge is a better choice for UHV measurement compared to a BA gauge not only because the lower x-ray

limit. Also less ESD effects and the lowest thermaloutgassing of all available hot cathode gauges recommend it

for measurements lower 10 –10 mbar.

Page 21: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressures

During the final inspection the system sensetivity of each gauge head is measured and documented.

This also called calibration factor at a specific emission current is measured in HV. The reference is, depending

on ISO 9000, traceable to national standards.

Together with the knowledge about the electronics a specification can be given:

Uncertainty 10% in a range from x to y.

Accuracy

Page 22: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressuresRelation Ion Current to Pressure

Pressure [mbar]

1,0E-10

1,0E-09

1,0E-08

1,0E-07

1,0E-06

1,0E-05

1,0E-04

1,0E-09 1,0E-08 1,0E-07 1,0E-06 1,0E-05 1,0E-04 1,0E-03 1,0E-02

Ion

Cur

rent

[am

p]

Page 23: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

LEYBOLD VACUUM

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Hot Cathode Gauges for UHV pressures

The calibration in a certified calibration laboratory allows to improve the information regarding traceability to

national standards. The complete gauge is compared to qualified references over a wide pressure range.

Calibrations down to 1E-9 mbar are possible.

Calibration

Page 24: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

Quadrupole Mass Spectrometers under UHV/XHV Conditions

Norbert Müller

INFICON AG, 9496 Balzers, Liechtenstein

[email protected]

Quadrupole mass spectrometers are widely used as Residual Gas Analysis in various pressure regimes to determine the partial pressures of the gases present.

For gas analysis in UHV / XHV special care has to be taken to obtain high sensitivity and low degassing rates. Specific ion source, and detector designs have to be used to analyze partial pressures at these low total pressures, and special vacuum treatment has to be applied to reduce the outgassing rate, especially that of Hydrogen.

A special design of the quadrupole mass spectrometer allows for high resolution measurements in the low mass range. For this the mass spectrometer is operated in the so-called "second stability region", where a higher DC / RF ratio is applied to the rod system. Mass resolution in the order of 400 at mass 4 m/e can be achieved, which allows for the separation of Helium and Deuterium. Due to technical reasons the mass range of such instrument is limited to <20 m/e.

Page 25: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

Monday, May 05, 2003

distributed by

International Workshop on Extreme High Vacuum - Application and Technology

(X-VAT)

Quadrupole Mass Spectrometers under UHV / XHV conditions

Norbert Müller, INFICON AG, LI-9496 Balzers

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May-03 X-VAT Workshop 2

In Situ Analysis

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Content

Requirement for KATRIN:Partial pressure measurements from E-3 mbar to E-11 mbar with determination of Hydrogen isotopy

n Quadrupole Mass Spectrometry under UHV conditionsn High resolution Quadrupole Mass Spectrometryn Alternatives (?)

Page 27: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 3

In Situ Analysis

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RGA under UHV conditions

n Specific analyzer design for UHV applications– High conductance to the vacuum chamber

• Open structure ion source

– Low outgassing rate• Selection of material• Pretreatment of all components• Degas function of the ion source for conditioning• Minimization of stray ions

– High sensitivity• Use of Secondary Electron Multiplier

– Minimum sensitivity to background effects• Special detector geometry (90° off axis)• Ion counting

Page 28: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 4

In Situ Analysis

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RGA under UHV conditions

Grid ion source

n Open designn Two filaments (W)n Low degassing rate

– mimimum amount of material

– Pt-Ir wires for formation chamber

– Molybdenum filament holders

n Easy to degas via electron bombardment

n Filaments on positive potential

Page 29: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 5

In Situ Analysis

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RGA under UHV conditions

Filament

e-

- +

Ionisation

e-

e-

e-

e -

Ions

-

Filament

e-

Ionisation

e-

Ions

+90V +150V +145V

e -

Electrons can impact onto the chamberwalls --> electron impact desorption

Emissioncurrent about 1 mA

Electrons only can impact onto the anode,if there is electron impact desorption, then only from welldefined surfaces

commonly used technique advantage of a biased system

Voltages

Page 30: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 6

In Situ Analysis

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RGA under UHV conditions

Cathode always positive with respect to ground

Page 31: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 7

In Situ Analysis

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Grid IonsourceQ

uadr

upol

e ro

d sy

stem

Ent

ranc

e ap

ertu

re

Form

atio

n ch

ambe

r

Fila

men

t

Flight paths of electrons

Page 32: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 8

In Situ Analysis

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Grid IonsourceFlight paths of electrons

Page 33: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 9

In Situ Analysis

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Grid IonsourceFlight paths of positive ions

Qua

drup

ole

rod

syst

em

Ent

ranc

e ap

ertu

re

Fila

men

t

Form

atio

n ch

ambe

r

Page 34: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 10

In Situ Analysis

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Grid IonsourceFlight paths of positive ions

Page 35: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 11

In Situ Analysis

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RGA under UHV conditions

90° off axis arrangement

efficient suppression of– photons– fast neutral particles– stray ions

Page 36: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 12

In Situ Analysis

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RGA under UHV conditions

n Ion Detection– Discrete Dynode SEM– Bakeable to 400°C– for analog amplification

and for pulse counting– Low noise (< 0.1 cps)

Page 37: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 13

In Situ Analysis

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RGA under UHV conditions

n Vacuum annealed analyzers– Material: Stainless Steel 1.4429 ESU– Degassing under vacuum

• p< 1E-5 mbar• T : 900 - 925 °C• t > 3h

– Weld in of feedthroughs– Bakeout

• Total pressure < 1E-7 mbar• PP Hydrocarbons < 1E-11 mbar• T = 400°C• t > 10h

n Resulting outgassing rate: < 1E-10 mbar*l / s(with filament on)

Page 38: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 14

In Situ Analysis

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RGA under UHV conditions

Typical UHV spectrum

W.K. Huber, N. Müller, and G.Rettinghaus, Vacuum, 41, 2103 (1990)

p = 2E-12 mbar

Page 39: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 15

In Situ Analysis

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RGA under UHV conditions

Conditions as in previous figure, more sensitive amplifier setting

⇒ Detection limits in the E-15 mbar- range

P = 2E-12 mbar

Page 40: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 16

In Situ Analysis

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RGA under UHV conditions

Most frequently observed Surface Ion Peaks

Mass (m/e) Component– 1 H+– 16 O+– 19 F+– 23 Na+– 28 CO+– 35,37 Cl+– 39 K+

after P.A. Redhead, JVST A, Vol 10(4), 1992

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May-03 X-VAT Workshop 17

In Situ Analysis

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Grid Ionsource

98 V

100 V

Flight paths of positive ions desorbed from the surface of the ion formation chamber

Page 42: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 18

In Situ Analysis

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RGA under UHV conditions

Specially designed Quadrupole Mass Spectrometers are

capable of reliably analyzing gas compositions in the

UHV / XHV

Page 43: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 19

In Situ Analysis

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High Resolution MSSpecific requirements for KATRIN

⇒ Separation of Hydrogen components

Mass Component Exact mass value [u]

1 H+ 1.0078252

2 D+ 2.014102H2+ 2.01565

3 3He+ 3.016030T+ 3.016050HD+ 3.021825H3+ 3.023475

4 4He+ 4.002600HT+ 4.023875D2+ 4.028204H2D+ 4.029650

5 DT+ 5.03005H2T+ 5.03170D2H+ 5.035825

6 T2+ 6.032D3+ 6.042

12C++ 5.999

Page 44: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 20

In Situ Analysis

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High Resolution MS

QMA 410 with Cross Beam ion source and 90° off axis SEM

30 cm ruler for comparison

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May-03 X-VAT Workshop 21

In Situ Analysis

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High Resolution MS

16 mm rod system for highestresolution, stability and transmission(e.g. He/D2 separation)

8 mm rod system for High-End RGA and analytical applications

6 mm rod system for common RGA

Page 46: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 22

In Situ Analysis

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High Resolution MS

Cross Beam ion source with magnets

n Two filamentsn Easy to degasn Good ion focussingn Bakeable to 300°C

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May-03 X-VAT Workshop 23

In Situ Analysis

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Cross Beam IonsourceFlight paths of electrons

Qua

drup

ole

rod

syst

em

Ent

ranc

e ap

ertu

re

Focu

s

Gro

unde

d el

ectro

de

Ext

ract

ion

Form

atio

n ch

ambe

r

Fila

men

t

Weh

nelt

Page 48: Hot Cathode Gauges for UHV Pressuresbibliothek.fzk.de/zb/berichte/FZKA6886Dateien... · Indirect Vacuum Measurement Ionization Gauges use the probability of gas ionization to

May-03 X-VAT Workshop 24

In Situ Analysis

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Cross Beam IonsourceQ

uadr

upol

e ro

d sy

stem

Ent

ranc

e ap

ertu

re

Focu

s

Gro

unde

d el

ectro

de

Ext

ract

ion

Form

atio

n ch

ambe

r

Fila

men

t

Weh

nelt

Flight paths of positive ions

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May-03 X-VAT Workshop 25

In Situ Analysis

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Cross Beam IonsourceFlight paths of positive ions

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May-03 X-VAT Workshop 26

In Situ Analysis

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High Resolution MS

Attainable resolution using „standard operation parameters“

Contribution He to D2 approx. 100 ppm

Sensitivity approx.1E-4 A/mbar

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May-03 X-VAT Workshop 27

In Situ Analysis

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High Resolution MS

220

8ωmr

eUa =

220

4ωmr

eVq =

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May-03 X-VAT Workshop 28

In Situ Analysis

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High Resolution MS

Abscissa: Mass * 100

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May-03 X-VAT Workshop 29

In Situ Analysis

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High Resolution MS

Contribution D2 to He < 1ppm

Sensitivity approx. 5E-6 A/mbar

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May-03 X-VAT Workshop 30

In Situ Analysis

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High Resolution MS

Attainable resolution at mass 3 m/e

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High Resolution MS

Resolution (barely) sufficient to resolve all possible components on mass 3 m/e

1.00E-13

1.00E-12

1.00E-11

1.00E-10

1.00E-09

1.00E-08

2.98 2.99 3.00 3.01 3.02 3.03 3.04 3.05 3.06 3.07

Mass [m/e]

Intensity [A]

3He

HD

H3

+

+

+

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High Resolution MS

Specially designed Quadrupole Mass Spectrometers are

capable of resolving overlapping components in the

low mass range, but show reduced sensitivity

⇒ still sufficient for KATRIN?

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Alternative (?)

Proposal from R. Dobrozemsky and G.W. Schwarzinger

Use of different Electron Energies and different Ion Energies to create a multidimensional matrix

R. Dobrozemsky and G.W. SchwarzingerJ. Vac. Sc. Technol. A 10(4), Jul/Aug 1992,pp 2661

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Alternative (?)

Ionization cross sections of different species

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Alternative (?)

Deuterium 2 m/e : 1.5 %4 m/e : 100 %

from: Wiley library of Mass Spectral Data

Ratio strongly depends on electron energy

⇒ Literature data are taken at electron energies of 70 eV

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Alternative (?)

⇒ Double ionization / fragmentation dependence on electron energy

R. Dobrozemsky and G.W. Schwarzinger

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Alternative (?)

⇒ Fragment ions get additional starting energy

R. Dobrozemsky and G.W. Schwarzinger

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Alternative (?)

Definition of Ion Energy by potential V4 (Field Axis potential)

Variation of Electron Energy by potential V2 (Cathode potential)

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Alternative (?)

Modern Quadrupole Mass Spectrometers allow for computer-

controlled, fast adjustment of all mass spectrometer voltages, matrix

calculations can be done easily

⇒ how stable are calibration factors?

⇒ how to perform in-situ calibrations?

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Summary

Specially designed Quadrupole Mass Spectrometers :

n are capable of reliably analyzing gas compositions in the UHV / XHV

n have sufficient resolving power to separate overlapping gas components

n special setting / variation of parameters could resolve sensitivity problem in high resolution mode