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    ASTM A283 03 Low and Intermediate Tensile Strength Carbon Steel PlatesChemical Compositions % Tensile Test

    Si

    Thickness(t)mmElongation

    GradeC

    t38.10 t 38.10

    Mn P SYield Point

    ksi(N/mm)

    Tensile Strength

    ksi(N/mm) Test Piecein(mm)

    %min

    Grade A0.14max

    24(165)min

    45-60(310-415)

    GL 8(200)GL 2(50)

    2730

    Grade B0.17max

    27(185)min

    50-65(345-450)

    GL 8(200)GL 2(50)

    2528

    Grade C0.24max

    30(205)min

    55-75(380-515)

    GL 8(200)GL 2(50)

    2225

    Grade D0.27max

    0.40max

    0.15

    0.40

    0.90max

    0.035max

    0.04max

    33(230)min

    60-80(415-550)

    GL 8(200)GL 2(50)

    2023

    Remarks 1.When copper steel is specified, minimum Cu shall be 0.20%.2.For plates wider than 24 in.(600mm), the elongation requirement is reduced two percentage points.3.For nominal thickness under 5/16 in.(8mm), the deduction from the specified percentage of elongation in 8

    in.(200mm) shall be made for decreases of the nominal thickness below 5/16 in.(8mm). See elongationrequirement adjustments under the Tension Tests section of Specificatuon A6 for deduction values.

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    Recommended Test Procedure for High-Voltage Membrane Integrity Testing

    Carole Ceja Wiss, Janney, Elstner Associates, Inc.

    10 S. LaSalle, Ste. 2600, Chicago, IL 60603

    Phone: 312-372-0555 Fax: 312-372-0873 E-mail: [email protected]

    2 8 t h R C I I n te R n a t I o n a l C o n v e n tI o n a n d t R a d e S h o w M a R C h 1 4 - 1 9 , 2 0 1 3 Ce j a

    mailto:[email protected]:[email protected]
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    Abstract

    D sign s, bui ding wn s, c nt act s, and manufactu s a ik a c nstant y n thk ut f n w t chniqu s t c n m th qua ity f initia insta ati n c ntinu d viab

    ity f th ng and wat ng m mb an s t cting th i st uctu s. High-v tam mb an int g ity t sting (HVIT) vid s instant, accu at , and iab f dback n thwat tightn ss f many ng syst ms. With HVIT b ing a ativ y n w t chn gy in tU.S., c a guid in s hav y t t b stab ish d t standa diz th t chniqu . l a n thfundam nta inci s f HVIT, and disc v h w it c u d b us d t quick y id ntify vth sma st b ach n m st ng m mb an ty s.

    Speaker

    Carole Ceja Wiss, Janney, Elstner Associates, Inc. - Chicago, IL

    CArole CeJA has gain d ng and wat ng x i nc sinc j ining Wiss, Jann y, e stn Ass ciat s, Inc. in 2006. As a gist d a chit ct in I in is, C ja has

    a tici at d in th inv stigati n, ins cti n, ai , d sign, and c nst ucti n bs vati nf m than 100 ng j cts. Sh has s na y a tici at d in high-v tag t stn pVC, m di d-bitum n, and iquid-a i d m mb an s. H a tici ati n in th ASTM

    D08.22 subc mmitt is advancing th actic f ct ic-bas d n nd st uctiv inv stiga-

    ti n t chniqu s f ng and wat ng. C ja has vi us y auth d and s na tic s f th 2010 rCI Bui ding env Sym sium and th NrCA 2011 Int nati nar ng Sym sium.

    9 4 C e j a 2 8 t h R C I I n te R n a t I o n a l C o n v e n tI o n a n d t R a d e S h o w M a R C h 1 4 - 1 9 , 2 0 1 3

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    Recommended Test Procedure for High-Voltage Membrane Integrity Testing

    High-v tag int g ity t sting (HVIT) isgaining u a ity in th U.S. ma k t. Th t chn gy a ws a ng t chnician( c nsu tant) t quick y and accu at yid ntify b ach s in ct ica y insu atingm mb an s. As m st ng and wat -

    ng m mb an s a ct ica y insu at-ing, th t chn gy is a iat t v ifyth insta ati n f a wat tight syst m t

    cat a kn wn d f ct. If n b ach s xistt a w th assag f ct ic cu nt,th n n b ach s xist t a w th n t a-ti n f wat in a iquid stat . Whi simi at chn gy has b n ada t d f iquid-a i d c ating va uati ns and g m m-b an s ams (ASTM D4787, ASTM D5162,ASTM G62, and ASTM D6365), a m th df fu -sca ng wat ng scanshas n t y t b n ad t d. A d aft d cum ntis in d v m nt cu nt y within ASTM td sc ib va i us ct ic c nductanc m th-

    ds f ak d t cti n, but as f this w iting,th d cum nt has n t b n na iz d.

    H in is a c mm nd d c duf high-v tag ct ic int g ity t sting asw as initia id as f fu th ab at y

    s a ch n d d t n th t st m th d. T imit sc , ng m mb an s wib th f cus f this a tic . Th inci sc ntain d within a qua y a icab t

    wat ng m mb an s, vid d simi act ic ti s f th m mb an and

    subst at can b stab ish d. Th c nc t f HVIT is st aightf -

    wa d. A t chnician a i s ct ic n gyt a ng syst m with an ct d . Th

    ct ic n gy is ty ica y v nt d f mwing by a c ntinu us insu ating m m-

    b an . At disc ntinuiti s b ach s in thm mb an , n gy can w in th f m fcu nt f m th ct d int th ct i-ca y c nductiv subst at cat d b wth m mb an . This subst at must bg und d, which a ws th n gy t dis-si at int th mass f th a th. e ct icitywi n y w if a c m t ci cuit xists. Th w f ct icity a ts th t chniciant th cis cati n f th ak.

    THE EqUIPMENTHVIT qui m nt c nsists f th main

    tab c m n nts: th w ack, thct d , and th g unding wi (s

    Figure 1). Th f u th and fth n c ssa yc m n ntsg und and ac nductiv sub-st at smust b

    s nt at tht sting sit .

    Th w ack c ntains thand c nt s t adjust th v Th w ack a s c ntains a t th t chnician wh n cut w th ugh th syst m. Sfactu s duc w ac

    qui d t a w th t chnicith s nsitivity f this a t f dt c nditi ns.

    Th ct d is a xiba ay attach d t a hand t b

    at d by th t chnician. Th s in a va i ty f siz s and mat idiff nt t chnicians and ngti ns. S v a c mm n xam

    int, fan, and b m sty s (sFigure p int ct d s a v y

    n gy t a sing int. This m st us fu f s am ch cking accu acy in cating th smawh n n visib a c is c at dt d s a y n gy t an a aa ximat y th siz f th hand. Th y a v y xib a

    Figure 2 Several types of electrodes.

    Figure 1 Portable components of HVIT equipment.

    2 8 t h R C I I n te R n a t I o n a l C o n v e n tI o n a n d t R a d e S h o w M a R C h 1 4 - 1 9 , 2 0 1 3 Ce j a

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    Figure 3 Complete electric circuit only exists at breach in the insulating membrane.

    w ack, it is sist d by thm mb an its f, and n n gy

    ws; th f , n cu nt isd t ct d. At a disc ntinuity b ach in th m mb an , n gyby ass s th m mb an and can

    w th ugh c nductiv su fac sb w th m mb an t g und.As th w ack is a s c n-n ct d t g und th ugh thg unding wi , a c m t ci -cuit is f m d and n gy b ginst w in th f m f cu nt(see Figure 3 ). Th w ack

    Figure 4 Electricity-to-water diagram for high-voltageintegrity testing.

    us d a und ashings and th v ticasu fac s wh high v s f c nt an d d t saf y a y n gy and t nsu

    v y inch f m mb an is t st d. B mct d s a th w kh s s f HVIT. Th y

    can b duc d in a va i ty f widths andcan b us d with xt nsi n a ms t as-i y c v a g a as f m mb an mquick y. Th y c nsist f a g u f tight ys ac d wi s, ik b m b ist s, that canb ush d u d v th su fac f thm mb an .

    Th g unding wi c nn cts th HVITqui m nt back t g und, which mits

    a c m t ci cuit t f m. It is im tantthat th g unding wi main in c ntactwith g und du ing th t sting, s a c am

    th d vic sh u d b inc ud d at thnd f th g unding wi t nsu sitiv

    c nn cti n.

    THE PRINCIPLES IN ACTIONWith th qui m nt ass mb d, th

    basic inci f HVIT is as f ws:A s ci c v tag is a i d t th su -

    fac f th m mb an th ugh di ct c ntactwith th ct d . As this n gy is ush dint th su fac f th m mb an by th

    9 6 C e j a

    s ns s this w f n gy ands unds an a a m t a t th t chnician thata b ach has b n nc unt d.

    If a b ach xists that a ws cu nt tass, th n wat can ass as w .

    Having n t giv n ct icity much s i-us c nsid ati n sinc high sch hysics

    c ass, this auth nds th c mm n ana -gy f ct ic ci cuits as umbing mn ight ning. SFigure 4 f a diag am-

    matic s ntati n f this wat -t - c-t icity ana gy. Th w ack s ntsa um that f ms w k. V tag isana g us t wat ssu caus d by th

    um ; cu nt is wat w at . e ct icn gy m v s th ugh c nductiv substanc-s ik wat th ugh h s s and funn s,

    and is st d by insu ating substanc ssuch as a ca at th nd f th h s . InHVIT, th ct d is ik th n nd fa h s h d tight against th m mb an .Insu ating m mb an s a ik c v s thatk th wat in th h s and, th f ,n t m ving. H w v , n ng m mb anis f ct at k ing a th wat (cu nt)in th h s . S m ng m mb an s ath ct ica quiva nt f ch s c th and

    adi y a w cu nt t ass whi m stth ng m mb an s a m ik

    a h avy f t wh , ifn ugh ssu (v t-

    ag ) is in th h s , ncan f c wat (cu -

    nt) t ass th ughwith s m ff t. Th am unt f cu -

    nt assing th ughth m mb an is a sd nd nt n ththickn ss f th m m-b an in th sam way50 ay s f ch s -c th w u d h d backm wat than a sin-

    2 8 t h R C I I n te R n a t I o n a l C o n v e n tI o n

    g ay . F th ct ic nwing, th must b a c m t

    ath back t th s u c f th w kIn high-v tag t sting, this c m tc at d th ugh th m st adi y c nductiv bj ct: g und. Th batt

    ying th v tag must b c nn ct th g und and a c nductiv sub(i. ., a a y big funn ) must a stact with th g und. Th g und ba s v i f wat ( n gy) inand c s s th cyc .

    wHICH SYSTEMS C AN BE TESTED?Giv n th ct ic inci s ab

    ty s f ng syst ms can b G n a y, any ct ica y insub an insta d v a c nductiv that has s m c nn cti n t g undsu fac s in di ct c ntact with th a t st d. It is th f th s

    f th t chnician t nsu v yinch f m mb an qui ing t stinin c ntact with th ct d . Th

    f th m mb an t b t st d mub c a f c nductiv c nditi ns wat , ba ast, tc.

    M st ng m mb an s m t tating qui m nt with th n tabf b ack epDM, which c ntains high

    ca b n b ack, which c nducts Whit epDM is t ntia y t stabth qui m nt is ca fu y ca ib atfa s a a ms at th s ams wh thth b ack v s fac is x s d.

    Th c nductiv su fac b w thb an can b ty ica c nst ucti n such as m ta c nc t d ckin

    ng ay s that can h d v ns f m istu such as gy sum byw d can a s s v as c ndus, vid d th i m istu v

    n ugh t ca y cu nt. r ng can a s b s ci ca y d sign d t

    at additi na ay s f mat ia us as c nductiv ay s such as finsu ati n an s wi m sh s.

    If any additi na insu ating main th ng syst m f ms a cs a ati n b tw n th m mb anc nductiv su fac , HVIT wi n ttiv . Va ta d s and t ming against th d ck a th m st chind anc t ff ctiv HVIT. In am st insu ati n ducts us d f a ct ica y insu ating, with tht int f with t sting. Thankfu

    ng insu ati n is n t c ntinu u

    a n d t R a d e S h o w M a R C h 1 4 - 1 9 , 2 0 1 3

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    j ints b tw n th b a ds and a fac scan b c m satu at d with wat (v y c n-ductiv ), viding a ath f n gy t w.M chanica y fast n d insu ati n t ntia y

    vid s additi na c nductiv athways(m ta sc ws) th ugh insu ati n int ac nductiv subst at .

    Ai is g n a y ct ica y insu atingas w and can int f with HVIT. T ac tain xt nt, n gy can jum th ughai ga s with ut a subst at s nt, as th

    n gy can f w wat va h d in th ai .Ai ga s b w a m mb an such as t nt dfast n s wid insu ati n b a d ga s may

    may n t mit n gy t w f m thct d t th c nductiv subst at b w

    wh n a b ach is s nt in th m mb an .H w v , if th distanc s f th s ai jum sa sma and th humidity f th ai in thga is high n ugh, sitiv su ts at m m-b an b ach s can b f und.

    A SIDEBAR ON SAFETYHigh-v tag t sting g ts its nam by

    d niti n f t st v tag s high than 1,000v ts, 1 kV. With t st qui m nt st ngthf f int g ity t sting anging f m 1 t30 kV, th is a t ntia f damag t thm mb an b ing t st d. A mat ia s hav a

    imit wh ct ic t ntia b gins t b akd wn th mat ia n a m cu a v .A ying v s f ct ic n gy that a tg at wi c at b ach s in th m mb an

    ath than assist in th i d t cti n. Ttu n t th wat f ct icity ana gy,

    n ugh wat ssu a i d t v n thath avy f t can damag it v tim . As ct ic

    n gy a cs th ugh ai , th visib st ak fight is acc m ani d by v y int ns v sf h at, a b it in a v y sma a a, that may

    a s bu n th m mb an . Simi a y t thng m mb an , human skin can suff

    th sam n gativ c ns qu nc s if x s dt high v tag s. A i d ct ic cha gcan a s t ntia y aff ct musc and n vb havi d in th human b dy, and ths cia c du s qui d f t chnician

    saf ty b a s s m discussi n.M st individua s hav x i nc d s mf m f ct ic sh ck in th s nc fstatic ct icity n a d kn b th ughan inadv t nt b ush against an ct i df nc . Th ff cts f c ntact with s u c s

    f ct ic cha g n th human b dy ad nd nt u n b th cu nt and v tag(th v um f n gy and h w ha d it is

    ush d). Di ct c ntact with th s u cf th ct ic n gy is n t n c ssa y t

    in ict damag . In av ag c nditi ns, anct ic a c can f m within an ai ga f 1

    mi im t wh n su i d with 2 kV f s-su . That is th v tag v f a ty icadai y c w f nc and is n a th w nd ft sting v tag s us d du ing HVIT f f-ing m mb an s. D nding n a s nss nsitivity, a 2-kV sh ck may ba y b

    c iv d. An int ns static ct ic sh ck( f th d kn b suasi n) und timac nditi ns c u d gist as much as 30 kV. This is th u b unda y f m st high-v tag t sting qui m nt.

    Th a ff ct f this ang f v tagn th t chnicians b dy is m c s y ti d

    t th cu nt (am ag ). Th 1-10-100am ag u f thumb d sc ib s th ff ct

    f s ci c am ag n . 1 mA (0.001am ) can b f t, 10 mA can caus g i -

    ing musc s asms, and 100 mA can stth human h a t. Giv tak , d y humanskin induc s a sistanc b tw n 500,000ohms and 2,000,000 ohms.1

    Actua sistanc f ach s nd nds n a s i s f va iab s t a gt d n h . l king back t high sch

    hysics and th basic quati n V tag =Cu nt x r sistanc , a tw -hand d g ab

    f th ct d s t at 30 kV c u d sub- j ct a t chnician t s m thing b tw n a15-mA and 60-mA sh ck, d nding n his

    h s na v f sistanc . That iss m wh b tw n unc nt ab muscs asm and a aching d ath. With this inmind, cauti ns sh u d b tak nwith qui m nt and s na t ctiv

    qui m nt. D y g v s and ng s v s andants ( f ab y mad f m c tt n mat i-

    a s) wi inc as th sistanc f th skinagainst accid nta c ntact. M sistanc

    qua s ss cu nt and ss inju y t tht chnician, giv n accid nta c ntact.

    each t chnician sh u d a s b awaf th w f th qui m nt h sh is

    using. Cu i sity ab ut th st ngth f thsh ck sh u d b disc u ag d. A s , with kn wn h a t c nditi ns mb dd d

    ct ic h a th qui m nt (i. ., ac mak s,tc.) sh u d ta k with th i d ct s b ff ming t sting.

    wHY USE THIS TOOL?Giv n th t ntia t ha m th m m-

    b an th t chnician if n t y -f m d, why sh u d HVIT b f m d ata ? p y f m d, HVIT can d nitiv -

    y sh w wh v n inh -siz b ach sxist in th d, at ashings, and at s ams

    f th m st c mm n ng mcan v n d t ct s m d f cts inb an that hav n t y t d vd th b ach s. It vid s instd cisiv vid nc f cati ns can n t at . Th t st c dtiv y quick, st aightf wa d, anas n c ssa y. In sh t, HVIT shb caus it is ff ctiv , and th mat ia isks can b n a y t chniqu .

    SO wHAT IS PROPER TECHNIqUEB f f ming any scan

    ing s a ch sh u d b fan und standing f th ngb t st d:

    1. D t min th d sign fing syst m. C nst ucti n dsuch as d awings and s cimay b h fu f n wti n j cts. As ng c

    ft n chang aft initiaa v d submitta s, actst ucti n ts, hmay b m accu at t imat ia s inc ud d. In s

    f c s may b n c st sting t nsu iabA s , ng wa anty

    ft n c ntains a d sc ith mat ia s insta d aan th s u c f initensu th ng m mb t st d is an insu ating and that th is a c nductst at mat ia that is c nng und d su fac .

    2. C ntact th manufactu syst m. This st is hif th f wa anty hasManufactu s can ft ninf mati n ab ut s ciaucts and th i ct ic S m manufactu s mayhigh-v tag t sting, basinc m t inaccu a

    dg f th t sting c dv tag t sting by nam as m intimidating, dangd st uctiv .

    3. obtain a sam f th min ac f ca ib ati n m nt. As n xt nsiv has b n und tak n t d

    v tag , s ttings m mb an ty s, and man

    s, s m t ia and

    2 8 t h R C I I n te R n a t I o n a l C o n v e n tI o n a n d t R a d e S h o w M a R C h 1 4 - 1 9 , 2 0 1 3 Ce j a

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    Figure 5 Sweep the entire surface of the clear roof membrane to be tested.

    ab , inc ud n t ati ns and m m-b an s ams th a a divid st im v th accu acy f dd cum ntati n.

    ON SITE TESTING8. U n a iva at th t sting sit ,

    th f su fac sh u d b visua yxamin d f saf ty haza ds. Th s

    inc ud th s haza ds ty ica t anykind f ng ins cti n, such ast i ing haza ds, v h ad j c-ti ns, adi ant nnas, tc. Fa inghaza ds at f dg s and maj

    n t ati ns such as sky ightssh u d a s b n t d.

    9. Additi na saf ty c nsid ati ns s -ci c t HVIT sh u d b id nti dsuch as acc ss t g und, ch mica

    xhaust ( t ntia y c mbustib inth s nc f a cs), and ct ica ys nsitiv qui m nt b w adja-c nt t f v s such as m dica

    qui m nt maj c m ut hubs.HVIT wi c at ct ic ds thatmay int f with this ty f qui -m nt. A g n a u f thumb is tc nsid that if a c w ding w u d b

    mitt d, HVIT w u d b mitt d.10. D t min th ast tim th f

    was w t. Wat is ft n th g at stc nductiv su fac . If th m mb anhas n v b n w t, it may t st dif-f nt y.

    11. (If ssib :) T fu th c n m thca ib ati n f th qui m nt, s t thv tag and a a m v s as d t -min d vi us y f th s ci c fc n gu ati n (av ag f maximumand minimum at fan-sty ct d ).If ssib , c at a sma unctuth ugh th insta d m mb an tb t st d. This additi na ca ib ati nt st sh u d n y b f m d if aqua i d ng c nt act is avai -ab t mak ai s th sam day.pass th b m-ty ct d v

    th kn wn b ach t ch ck that tha a m s unds. If it d s n t, ais thv tag (with ut xc ding th ub unda y stab ish d du ing initiaca ib ati n t sting) in sma inc -m nts and t st th kn wn b achunti suitab a a ms a nc un-t d. Mak n t f th v tag v s

    qui d t id ntify th b ach.(oth wis ): If n ng c nt ac-

    t is avai ab t f m ai s

    2 8 t h R C I I n te R n a t I o n a l C o n v e n tI o n a n d t R a d e

    and th qui m nt dis ays cu -nt f dback, ass th b m c-

    t d v a ty ica a a f ngand bs v th v s f cu nt aking th ugh th syst m. N

    ng mat ia is 100% ff ctivat sisting a ct ic n gy. T

    vid s m assu anc that suf-ci nt v tag is in us t d t ct

    a b ach in th ng ass mb y,inc as v tag by sma inc m ntsunti th ty ica cu nt f dback is20 mic am s. D n t xc d thmaximum v tag stab ish d fth m mb an ty , h w v . Makn t f th v tag v s qui d t

    vid s m cu nt f dback. Thw st v tag that duc s sitivsu ts sh u d b uti iz d du ing

    t sting f th saf ty f th t chni-cian and th m mb an .

    12. onc a saf ty and ca ib ati nch cks a c m t d, th fu -sca

    f scanning can c mm nc . It isim tant t c d in a gica at-t n t nsu a th ng is t st-

    d. HVIT n y t sts th ti n f thm mb an in di ct c ntact with th

    ct d . B ginning with th a g st

    a iat ct d m st ft nth b m sty b ush th d fth f (sFigure 5 ). F wingsh t s ams is a g d t chniqu t

    nsu c m t c v ag f tht st. M n ithic m mb an s v y

    a g sh ts may qui s m addi-ti na m th d f su fac ma king t

    nsu th t st is c m t .Wh ssib , th t chnician

    sh u d ush th b m-sty c-

    S h o w M a R C h 1 4 - 1 9 , 2 0 1 3

    t d ah ad f him n t wa k backwa ds n A t nating b tw n u

    u ing can t igg fa sw . A s w wa king aa y suf ci nt t catch b

    y ca ib at d qu13. Wh n an a a m is nc un

    f wa d g ss and m mb an in th a a t visib ct ic a c. N t wi duc a visib S m f c nditi ns, suwhit m mb an in fumak any a c c nsid abdif cu t t s . If an a c it wi ccu di ct y at

    cati n. If n a c is visibth m mb an at 90 d g

    igina ath t h nath a a wh th a a mp w d wn th t sting and chang t a sma

    ct d f v n mti n f th a a m/b achFan-ty ct d s sh uac ss th m mb an a

    ush d. Ma k n d di ct y n th m mb an

    ti n f th b ach. ph t gb ach (sFigure 6 ).C ntinu ac ss th

    m mb an in this fashi nwa k backwa ds du ing th

    14. r ch ck th g und d c nu s y c ntacting a

    m ta su fac d ain ach shutd wn and sta

    HVIT qui m nt.15. Aft d f cts in th d

    Ce j a

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    id nti d, ashing can b t st d. Th siz f m st ashings mak st sting with th b m-sty c-t d cumb s m . Th fan-sty

    ct d is ft n th m st c n-v ni nt (s Figure 7 ). M chanica

    qui m nt may b s nsitiv t v t-ag and sh u d n t b c ntact d byth ct d .

    16A. If a ng c nt act is avai abt mak ai s as th t st -c ds, it is ssib t ai an t d b ach s and t st th aia as t nsu a aths t thb ach hav b n st d. This is,

    f c u s , vid d that th aimat ia is qua y insu ating as thbas m mb an .

    16B. If ai s t th m mb an a n tca i d ut as b ach s a id nti-

    d, d sh ts and h t g a hicd cum ntati n sh u d b vid dt th c i nt s that ai s can b

    x cut d in th futu .

    It sh u d a s b c nsid d g d ac-tic t m y tw t chnicians du ing asu v y. Tw s ts f y s can b tt watch t

    nsu a ng su fac s a ch ck d. r fdg and ct ic saf ty may b inc as d as

    th ima y t st can hav a t nd ncy t

    f cus n th task at hand ath than his h su undings.

    COMMON FALSE POSITIVES Th t ta s a k is th b st indicati n

    f a b ach in th m mb an . As x ma ksth s t, th itt b ast f ight intsdi ct y t th h ga in th s am.H w v , th a s v a instanc s wh

    qui m nt can vid a fa s indicati n fa b ach wh n th a a m v is ach d

    Figure 6 Document any breaches in the membrane.

    with ut a visuaa c:

    1. S u d d nchang s ind i c t i n

    s df th c-

    t d ath can ad t unint nd df dback and an a a m.

    2. A chang in th m mb an thick-n ss, such as s v a stack d atch-

    s, may qui high v tag s inca iz d a as.

    3. A chang in th subst at mat ia siti n f th c nductiv sub-

    st at ativ t th m mb an fxam , mb dd d m ta such as

    ad c a s at stack v nts d ainanc u d c at fa s a a ms.

    4. Unint nti na c ntact b tw n thct d and a g und d su fac ,

    such as c ntact with d ain c am ingings b m y-aways at im-t ashings, can ccu .

    5. Unn tic d c ntact with a c nductivay n th su fac f th m mb an ,

    such as wat at s ams c s t ad ain m istu c inging t a g an-u -su fac d ca sh t, is ssib .

    A gitimat b ach v a c nductiv

    su fac wi a a m with ss v tag than us df th fu f t st as sh wn du ing th ini-tia ca ib ati n (st 6B b f g ing n sit ).Wh n in d ubt, duc v tag and t st tha a a und sus ct d fa s a a ms.

    wHERE TO GO NEXT?S ci c ab at y and d s a ch

    sh u d b c nduct d t b gin t answ thf wing:

    H w ft n sh u d qui m nt b ca i-

    Figure 7 Fan-style electrode usedto check vertical ashings is most

    convenient for hand-held small areas.

    b at d? What v tag s sh u d b us

    s ci c m mb an ty s and c n gu ati ns?

    Is th an u imit n thn ss f insu ati n that wi

    iab su ts? D s th siz f th b a d

    th stacking/stagg ing f matt in th d t cti n f b

    C u d humidity aff ct th t st du ?

    CONCLUSIONGiv n an ct ica y suitab

    syst m and f wing th t sting d sc ib d ab v , a ng t chnic

    vid c n d nt su ts that ain an a a f t st d m mb an havid nti d. Th us f this t in md t minati n f wat tightn ss ti n f th s u c f wat akaga d. HVIT can int ut a singti n d f ct in a v tica s am a t

    inh s ac ss a w-s hai damag f t t af c. This t sh u d c ntinu t g w in and us as th ng indust y ad

    n d and atab m th ds fing a icati ns.

    REFERENCES1. htt ://www.a ab utci cuits./

    v _1/ch t_3/4.htm ), t Jun 5, 2012.

    1 0 0 Ce j a 2 8 t h R C I I n te R n a t I o n a l C o n v e n tI o n a n d t R a d e S h o w M a R C h 1 4 - 1 9 , 2 0 1 3

    http:///reader/full/http://www.allaboutcircuits.comhttp:///reader/full/http://www.allaboutcircuits.com