holi spark voltage testing
TRANSCRIPT
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ASTM A283 03 Low and Intermediate Tensile Strength Carbon Steel PlatesChemical Compositions % Tensile Test
Si
Thickness(t)mmElongation
GradeC
t38.10 t 38.10
Mn P SYield Point
ksi(N/mm)
Tensile Strength
ksi(N/mm) Test Piecein(mm)
%min
Grade A0.14max
24(165)min
45-60(310-415)
GL 8(200)GL 2(50)
2730
Grade B0.17max
27(185)min
50-65(345-450)
GL 8(200)GL 2(50)
2528
Grade C0.24max
30(205)min
55-75(380-515)
GL 8(200)GL 2(50)
2225
Grade D0.27max
0.40max
0.15
0.40
0.90max
0.035max
0.04max
33(230)min
60-80(415-550)
GL 8(200)GL 2(50)
2023
Remarks 1.When copper steel is specified, minimum Cu shall be 0.20%.2.For plates wider than 24 in.(600mm), the elongation requirement is reduced two percentage points.3.For nominal thickness under 5/16 in.(8mm), the deduction from the specified percentage of elongation in 8
in.(200mm) shall be made for decreases of the nominal thickness below 5/16 in.(8mm). See elongationrequirement adjustments under the Tension Tests section of Specificatuon A6 for deduction values.
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Recommended Test Procedure for High-Voltage Membrane Integrity Testing
Carole Ceja Wiss, Janney, Elstner Associates, Inc.
10 S. LaSalle, Ste. 2600, Chicago, IL 60603
Phone: 312-372-0555 Fax: 312-372-0873 E-mail: [email protected]
2 8 t h R C I I n te R n a t I o n a l C o n v e n tI o n a n d t R a d e S h o w M a R C h 1 4 - 1 9 , 2 0 1 3 Ce j a
mailto:[email protected]:[email protected] -
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Abstract
D sign s, bui ding wn s, c nt act s, and manufactu s a ik a c nstant y n thk ut f n w t chniqu s t c n m th qua ity f initia insta ati n c ntinu d viab
ity f th ng and wat ng m mb an s t cting th i st uctu s. High-v tam mb an int g ity t sting (HVIT) vid s instant, accu at , and iab f dback n thwat tightn ss f many ng syst ms. With HVIT b ing a ativ y n w t chn gy in tU.S., c a guid in s hav y t t b stab ish d t standa diz th t chniqu . l a n thfundam nta inci s f HVIT, and disc v h w it c u d b us d t quick y id ntify vth sma st b ach n m st ng m mb an ty s.
Speaker
Carole Ceja Wiss, Janney, Elstner Associates, Inc. - Chicago, IL
CArole CeJA has gain d ng and wat ng x i nc sinc j ining Wiss, Jann y, e stn Ass ciat s, Inc. in 2006. As a gist d a chit ct in I in is, C ja has
a tici at d in th inv stigati n, ins cti n, ai , d sign, and c nst ucti n bs vati nf m than 100 ng j cts. Sh has s na y a tici at d in high-v tag t stn pVC, m di d-bitum n, and iquid-a i d m mb an s. H a tici ati n in th ASTM
D08.22 subc mmitt is advancing th actic f ct ic-bas d n nd st uctiv inv stiga-
ti n t chniqu s f ng and wat ng. C ja has vi us y auth d and s na tic s f th 2010 rCI Bui ding env Sym sium and th NrCA 2011 Int nati nar ng Sym sium.
9 4 C e j a 2 8 t h R C I I n te R n a t I o n a l C o n v e n tI o n a n d t R a d e S h o w M a R C h 1 4 - 1 9 , 2 0 1 3
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Recommended Test Procedure for High-Voltage Membrane Integrity Testing
High-v tag int g ity t sting (HVIT) isgaining u a ity in th U.S. ma k t. Th t chn gy a ws a ng t chnician( c nsu tant) t quick y and accu at yid ntify b ach s in ct ica y insu atingm mb an s. As m st ng and wat -
ng m mb an s a ct ica y insu at-ing, th t chn gy is a iat t v ifyth insta ati n f a wat tight syst m t
cat a kn wn d f ct. If n b ach s xistt a w th assag f ct ic cu nt,th n n b ach s xist t a w th n t a-ti n f wat in a iquid stat . Whi simi at chn gy has b n ada t d f iquid-a i d c ating va uati ns and g m m-b an s ams (ASTM D4787, ASTM D5162,ASTM G62, and ASTM D6365), a m th df fu -sca ng wat ng scanshas n t y t b n ad t d. A d aft d cum ntis in d v m nt cu nt y within ASTM td sc ib va i us ct ic c nductanc m th-
ds f ak d t cti n, but as f this w iting,th d cum nt has n t b n na iz d.
H in is a c mm nd d c duf high-v tag ct ic int g ity t sting asw as initia id as f fu th ab at y
s a ch n d d t n th t st m th d. T imit sc , ng m mb an s wib th f cus f this a tic . Th inci sc ntain d within a qua y a icab t
wat ng m mb an s, vid d simi act ic ti s f th m mb an and
subst at can b stab ish d. Th c nc t f HVIT is st aightf -
wa d. A t chnician a i s ct ic n gyt a ng syst m with an ct d . Th
ct ic n gy is ty ica y v nt d f mwing by a c ntinu us insu ating m m-
b an . At disc ntinuiti s b ach s in thm mb an , n gy can w in th f m fcu nt f m th ct d int th ct i-ca y c nductiv subst at cat d b wth m mb an . This subst at must bg und d, which a ws th n gy t dis-si at int th mass f th a th. e ct icitywi n y w if a c m t ci cuit xists. Th w f ct icity a ts th t chniciant th cis cati n f th ak.
THE EqUIPMENTHVIT qui m nt c nsists f th main
tab c m n nts: th w ack, thct d , and th g unding wi (s
Figure 1). Th f u th and fth n c ssa yc m n ntsg und and ac nductiv sub-st at smust b
s nt at tht sting sit .
Th w ack c ntains thand c nt s t adjust th v Th w ack a s c ntains a t th t chnician wh n cut w th ugh th syst m. Sfactu s duc w ac
qui d t a w th t chnicith s nsitivity f this a t f dt c nditi ns.
Th ct d is a xiba ay attach d t a hand t b
at d by th t chnician. Th s in a va i ty f siz s and mat idiff nt t chnicians and ngti ns. S v a c mm n xam
int, fan, and b m sty s (sFigure p int ct d s a v y
n gy t a sing int. This m st us fu f s am ch cking accu acy in cating th smawh n n visib a c is c at dt d s a y n gy t an a aa ximat y th siz f th hand. Th y a v y xib a
Figure 2 Several types of electrodes.
Figure 1 Portable components of HVIT equipment.
2 8 t h R C I I n te R n a t I o n a l C o n v e n tI o n a n d t R a d e S h o w M a R C h 1 4 - 1 9 , 2 0 1 3 Ce j a
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Figure 3 Complete electric circuit only exists at breach in the insulating membrane.
w ack, it is sist d by thm mb an its f, and n n gy
ws; th f , n cu nt isd t ct d. At a disc ntinuity b ach in th m mb an , n gyby ass s th m mb an and can
w th ugh c nductiv su fac sb w th m mb an t g und.As th w ack is a s c n-n ct d t g und th ugh thg unding wi , a c m t ci -cuit is f m d and n gy b ginst w in th f m f cu nt(see Figure 3 ). Th w ack
Figure 4 Electricity-to-water diagram for high-voltageintegrity testing.
us d a und ashings and th v ticasu fac s wh high v s f c nt an d d t saf y a y n gy and t nsu
v y inch f m mb an is t st d. B mct d s a th w kh s s f HVIT. Th y
can b duc d in a va i ty f widths andcan b us d with xt nsi n a ms t as-i y c v a g a as f m mb an mquick y. Th y c nsist f a g u f tight ys ac d wi s, ik b m b ist s, that canb ush d u d v th su fac f thm mb an .
Th g unding wi c nn cts th HVITqui m nt back t g und, which mits
a c m t ci cuit t f m. It is im tantthat th g unding wi main in c ntactwith g und du ing th t sting, s a c am
th d vic sh u d b inc ud d at thnd f th g unding wi t nsu sitiv
c nn cti n.
THE PRINCIPLES IN ACTIONWith th qui m nt ass mb d, th
basic inci f HVIT is as f ws:A s ci c v tag is a i d t th su -
fac f th m mb an th ugh di ct c ntactwith th ct d . As this n gy is ush dint th su fac f th m mb an by th
9 6 C e j a
s ns s this w f n gy ands unds an a a m t a t th t chnician thata b ach has b n nc unt d.
If a b ach xists that a ws cu nt tass, th n wat can ass as w .
Having n t giv n ct icity much s i-us c nsid ati n sinc high sch hysics
c ass, this auth nds th c mm n ana -gy f ct ic ci cuits as umbing mn ight ning. SFigure 4 f a diag am-
matic s ntati n f this wat -t - c-t icity ana gy. Th w ack s ntsa um that f ms w k. V tag isana g us t wat ssu caus d by th
um ; cu nt is wat w at . e ct icn gy m v s th ugh c nductiv substanc-s ik wat th ugh h s s and funn s,
and is st d by insu ating substanc ssuch as a ca at th nd f th h s . InHVIT, th ct d is ik th n nd fa h s h d tight against th m mb an .Insu ating m mb an s a ik c v s thatk th wat in th h s and, th f ,n t m ving. H w v , n ng m mb anis f ct at k ing a th wat (cu nt)in th h s . S m ng m mb an s ath ct ica quiva nt f ch s c th and
adi y a w cu nt t ass whi m stth ng m mb an s a m ik
a h avy f t wh , ifn ugh ssu (v t-
ag ) is in th h s , ncan f c wat (cu -
nt) t ass th ughwith s m ff t. Th am unt f cu -
nt assing th ughth m mb an is a sd nd nt n ththickn ss f th m m-b an in th sam way50 ay s f ch s -c th w u d h d backm wat than a sin-
2 8 t h R C I I n te R n a t I o n a l C o n v e n tI o n
g ay . F th ct ic nwing, th must b a c m t
ath back t th s u c f th w kIn high-v tag t sting, this c m tc at d th ugh th m st adi y c nductiv bj ct: g und. Th batt
ying th v tag must b c nn ct th g und and a c nductiv sub(i. ., a a y big funn ) must a stact with th g und. Th g und ba s v i f wat ( n gy) inand c s s th cyc .
wHICH SYSTEMS C AN BE TESTED?Giv n th ct ic inci s ab
ty s f ng syst ms can b G n a y, any ct ica y insub an insta d v a c nductiv that has s m c nn cti n t g undsu fac s in di ct c ntact with th a t st d. It is th f th s
f th t chnician t nsu v yinch f m mb an qui ing t stinin c ntact with th ct d . Th
f th m mb an t b t st d mub c a f c nductiv c nditi ns wat , ba ast, tc.
M st ng m mb an s m t tating qui m nt with th n tabf b ack epDM, which c ntains high
ca b n b ack, which c nducts Whit epDM is t ntia y t stabth qui m nt is ca fu y ca ib atfa s a a ms at th s ams wh thth b ack v s fac is x s d.
Th c nductiv su fac b w thb an can b ty ica c nst ucti n such as m ta c nc t d ckin
ng ay s that can h d v ns f m istu such as gy sum byw d can a s s v as c ndus, vid d th i m istu v
n ugh t ca y cu nt. r ng can a s b s ci ca y d sign d t
at additi na ay s f mat ia us as c nductiv ay s such as finsu ati n an s wi m sh s.
If any additi na insu ating main th ng syst m f ms a cs a ati n b tw n th m mb anc nductiv su fac , HVIT wi n ttiv . Va ta d s and t ming against th d ck a th m st chind anc t ff ctiv HVIT. In am st insu ati n ducts us d f a ct ica y insu ating, with tht int f with t sting. Thankfu
ng insu ati n is n t c ntinu u
a n d t R a d e S h o w M a R C h 1 4 - 1 9 , 2 0 1 3
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j ints b tw n th b a ds and a fac scan b c m satu at d with wat (v y c n-ductiv ), viding a ath f n gy t w.M chanica y fast n d insu ati n t ntia y
vid s additi na c nductiv athways(m ta sc ws) th ugh insu ati n int ac nductiv subst at .
Ai is g n a y ct ica y insu atingas w and can int f with HVIT. T ac tain xt nt, n gy can jum th ughai ga s with ut a subst at s nt, as th
n gy can f w wat va h d in th ai .Ai ga s b w a m mb an such as t nt dfast n s wid insu ati n b a d ga s may
may n t mit n gy t w f m thct d t th c nductiv subst at b w
wh n a b ach is s nt in th m mb an .H w v , if th distanc s f th s ai jum sa sma and th humidity f th ai in thga is high n ugh, sitiv su ts at m m-b an b ach s can b f und.
A SIDEBAR ON SAFETYHigh-v tag t sting g ts its nam by
d niti n f t st v tag s high than 1,000v ts, 1 kV. With t st qui m nt st ngthf f int g ity t sting anging f m 1 t30 kV, th is a t ntia f damag t thm mb an b ing t st d. A mat ia s hav a
imit wh ct ic t ntia b gins t b akd wn th mat ia n a m cu a v .A ying v s f ct ic n gy that a tg at wi c at b ach s in th m mb an
ath than assist in th i d t cti n. Ttu n t th wat f ct icity ana gy,
n ugh wat ssu a i d t v n thath avy f t can damag it v tim . As ct ic
n gy a cs th ugh ai , th visib st ak fight is acc m ani d by v y int ns v sf h at, a b it in a v y sma a a, that may
a s bu n th m mb an . Simi a y t thng m mb an , human skin can suff
th sam n gativ c ns qu nc s if x s dt high v tag s. A i d ct ic cha gcan a s t ntia y aff ct musc and n vb havi d in th human b dy, and ths cia c du s qui d f t chnician
saf ty b a s s m discussi n.M st individua s hav x i nc d s mf m f ct ic sh ck in th s nc fstatic ct icity n a d kn b th ughan inadv t nt b ush against an ct i df nc . Th ff cts f c ntact with s u c s
f ct ic cha g n th human b dy ad nd nt u n b th cu nt and v tag(th v um f n gy and h w ha d it is
ush d). Di ct c ntact with th s u cf th ct ic n gy is n t n c ssa y t
in ict damag . In av ag c nditi ns, anct ic a c can f m within an ai ga f 1
mi im t wh n su i d with 2 kV f s-su . That is th v tag v f a ty icadai y c w f nc and is n a th w nd ft sting v tag s us d du ing HVIT f f-ing m mb an s. D nding n a s nss nsitivity, a 2-kV sh ck may ba y b
c iv d. An int ns static ct ic sh ck( f th d kn b suasi n) und timac nditi ns c u d gist as much as 30 kV. This is th u b unda y f m st high-v tag t sting qui m nt.
Th a ff ct f this ang f v tagn th t chnicians b dy is m c s y ti d
t th cu nt (am ag ). Th 1-10-100am ag u f thumb d sc ib s th ff ct
f s ci c am ag n . 1 mA (0.001am ) can b f t, 10 mA can caus g i -
ing musc s asms, and 100 mA can stth human h a t. Giv tak , d y humanskin induc s a sistanc b tw n 500,000ohms and 2,000,000 ohms.1
Actua sistanc f ach s nd nds n a s i s f va iab s t a gt d n h . l king back t high sch
hysics and th basic quati n V tag =Cu nt x r sistanc , a tw -hand d g ab
f th ct d s t at 30 kV c u d sub- j ct a t chnician t s m thing b tw n a15-mA and 60-mA sh ck, d nding n his
h s na v f sistanc . That iss m wh b tw n unc nt ab muscs asm and a aching d ath. With this inmind, cauti ns sh u d b tak nwith qui m nt and s na t ctiv
qui m nt. D y g v s and ng s v s andants ( f ab y mad f m c tt n mat i-
a s) wi inc as th sistanc f th skinagainst accid nta c ntact. M sistanc
qua s ss cu nt and ss inju y t tht chnician, giv n accid nta c ntact.
each t chnician sh u d a s b awaf th w f th qui m nt h sh is
using. Cu i sity ab ut th st ngth f thsh ck sh u d b disc u ag d. A s , with kn wn h a t c nditi ns mb dd d
ct ic h a th qui m nt (i. ., ac mak s,tc.) sh u d ta k with th i d ct s b ff ming t sting.
wHY USE THIS TOOL?Giv n th t ntia t ha m th m m-
b an th t chnician if n t y -f m d, why sh u d HVIT b f m d ata ? p y f m d, HVIT can d nitiv -
y sh w wh v n inh -siz b ach sxist in th d, at ashings, and at s ams
f th m st c mm n ng mcan v n d t ct s m d f cts inb an that hav n t y t d vd th b ach s. It vid s instd cisiv vid nc f cati ns can n t at . Th t st c dtiv y quick, st aightf wa d, anas n c ssa y. In sh t, HVIT shb caus it is ff ctiv , and th mat ia isks can b n a y t chniqu .
SO wHAT IS PROPER TECHNIqUEB f f ming any scan
ing s a ch sh u d b fan und standing f th ngb t st d:
1. D t min th d sign fing syst m. C nst ucti n dsuch as d awings and s cimay b h fu f n wti n j cts. As ng c
ft n chang aft initiaa v d submitta s, actst ucti n ts, hmay b m accu at t imat ia s inc ud d. In s
f c s may b n c st sting t nsu iabA s , ng wa anty
ft n c ntains a d sc ith mat ia s insta d aan th s u c f initensu th ng m mb t st d is an insu ating and that th is a c nductst at mat ia that is c nng und d su fac .
2. C ntact th manufactu syst m. This st is hif th f wa anty hasManufactu s can ft ninf mati n ab ut s ciaucts and th i ct ic S m manufactu s mayhigh-v tag t sting, basinc m t inaccu a
dg f th t sting c dv tag t sting by nam as m intimidating, dangd st uctiv .
3. obtain a sam f th min ac f ca ib ati n m nt. As n xt nsiv has b n und tak n t d
v tag , s ttings m mb an ty s, and man
s, s m t ia and
2 8 t h R C I I n te R n a t I o n a l C o n v e n tI o n a n d t R a d e S h o w M a R C h 1 4 - 1 9 , 2 0 1 3 Ce j a
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Figure 5 Sweep the entire surface of the clear roof membrane to be tested.
ab , inc ud n t ati ns and m m-b an s ams th a a divid st im v th accu acy f dd cum ntati n.
ON SITE TESTING8. U n a iva at th t sting sit ,
th f su fac sh u d b visua yxamin d f saf ty haza ds. Th s
inc ud th s haza ds ty ica t anykind f ng ins cti n, such ast i ing haza ds, v h ad j c-ti ns, adi ant nnas, tc. Fa inghaza ds at f dg s and maj
n t ati ns such as sky ightssh u d a s b n t d.
9. Additi na saf ty c nsid ati ns s -ci c t HVIT sh u d b id nti dsuch as acc ss t g und, ch mica
xhaust ( t ntia y c mbustib inth s nc f a cs), and ct ica ys nsitiv qui m nt b w adja-c nt t f v s such as m dica
qui m nt maj c m ut hubs.HVIT wi c at ct ic ds thatmay int f with this ty f qui -m nt. A g n a u f thumb is tc nsid that if a c w ding w u d b
mitt d, HVIT w u d b mitt d.10. D t min th ast tim th f
was w t. Wat is ft n th g at stc nductiv su fac . If th m mb anhas n v b n w t, it may t st dif-f nt y.
11. (If ssib :) T fu th c n m thca ib ati n f th qui m nt, s t thv tag and a a m v s as d t -min d vi us y f th s ci c fc n gu ati n (av ag f maximumand minimum at fan-sty ct d ).If ssib , c at a sma unctuth ugh th insta d m mb an tb t st d. This additi na ca ib ati nt st sh u d n y b f m d if aqua i d ng c nt act is avai -ab t mak ai s th sam day.pass th b m-ty ct d v
th kn wn b ach t ch ck that tha a m s unds. If it d s n t, ais thv tag (with ut xc ding th ub unda y stab ish d du ing initiaca ib ati n t sting) in sma inc -m nts and t st th kn wn b achunti suitab a a ms a nc un-t d. Mak n t f th v tag v s
qui d t id ntify th b ach.(oth wis ): If n ng c nt ac-
t is avai ab t f m ai s
2 8 t h R C I I n te R n a t I o n a l C o n v e n tI o n a n d t R a d e
and th qui m nt dis ays cu -nt f dback, ass th b m c-
t d v a ty ica a a f ngand bs v th v s f cu nt aking th ugh th syst m. N
ng mat ia is 100% ff ctivat sisting a ct ic n gy. T
vid s m assu anc that suf-ci nt v tag is in us t d t ct
a b ach in th ng ass mb y,inc as v tag by sma inc m ntsunti th ty ica cu nt f dback is20 mic am s. D n t xc d thmaximum v tag stab ish d fth m mb an ty , h w v . Makn t f th v tag v s qui d t
vid s m cu nt f dback. Thw st v tag that duc s sitivsu ts sh u d b uti iz d du ing
t sting f th saf ty f th t chni-cian and th m mb an .
12. onc a saf ty and ca ib ati nch cks a c m t d, th fu -sca
f scanning can c mm nc . It isim tant t c d in a gica at-t n t nsu a th ng is t st-
d. HVIT n y t sts th ti n f thm mb an in di ct c ntact with th
ct d . B ginning with th a g st
a iat ct d m st ft nth b m sty b ush th d fth f (sFigure 5 ). F wingsh t s ams is a g d t chniqu t
nsu c m t c v ag f tht st. M n ithic m mb an s v y
a g sh ts may qui s m addi-ti na m th d f su fac ma king t
nsu th t st is c m t .Wh ssib , th t chnician
sh u d ush th b m-sty c-
S h o w M a R C h 1 4 - 1 9 , 2 0 1 3
t d ah ad f him n t wa k backwa ds n A t nating b tw n u
u ing can t igg fa sw . A s w wa king aa y suf ci nt t catch b
y ca ib at d qu13. Wh n an a a m is nc un
f wa d g ss and m mb an in th a a t visib ct ic a c. N t wi duc a visib S m f c nditi ns, suwhit m mb an in fumak any a c c nsid abdif cu t t s . If an a c it wi ccu di ct y at
cati n. If n a c is visibth m mb an at 90 d g
igina ath t h nath a a wh th a a mp w d wn th t sting and chang t a sma
ct d f v n mti n f th a a m/b achFan-ty ct d s sh uac ss th m mb an a
ush d. Ma k n d di ct y n th m mb an
ti n f th b ach. ph t gb ach (sFigure 6 ).C ntinu ac ss th
m mb an in this fashi nwa k backwa ds du ing th
14. r ch ck th g und d c nu s y c ntacting a
m ta su fac d ain ach shutd wn and sta
HVIT qui m nt.15. Aft d f cts in th d
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id nti d, ashing can b t st d. Th siz f m st ashings mak st sting with th b m-sty c-t d cumb s m . Th fan-sty
ct d is ft n th m st c n-v ni nt (s Figure 7 ). M chanica
qui m nt may b s nsitiv t v t-ag and sh u d n t b c ntact d byth ct d .
16A. If a ng c nt act is avai abt mak ai s as th t st -c ds, it is ssib t ai an t d b ach s and t st th aia as t nsu a aths t thb ach hav b n st d. This is,
f c u s , vid d that th aimat ia is qua y insu ating as thbas m mb an .
16B. If ai s t th m mb an a n tca i d ut as b ach s a id nti-
d, d sh ts and h t g a hicd cum ntati n sh u d b vid dt th c i nt s that ai s can b
x cut d in th futu .
It sh u d a s b c nsid d g d ac-tic t m y tw t chnicians du ing asu v y. Tw s ts f y s can b tt watch t
nsu a ng su fac s a ch ck d. r fdg and ct ic saf ty may b inc as d as
th ima y t st can hav a t nd ncy t
f cus n th task at hand ath than his h su undings.
COMMON FALSE POSITIVES Th t ta s a k is th b st indicati n
f a b ach in th m mb an . As x ma ksth s t, th itt b ast f ight intsdi ct y t th h ga in th s am.H w v , th a s v a instanc s wh
qui m nt can vid a fa s indicati n fa b ach wh n th a a m v is ach d
Figure 6 Document any breaches in the membrane.
with ut a visuaa c:
1. S u d d nchang s ind i c t i n
s df th c-
t d ath can ad t unint nd df dback and an a a m.
2. A chang in th m mb an thick-n ss, such as s v a stack d atch-
s, may qui high v tag s inca iz d a as.
3. A chang in th subst at mat ia siti n f th c nductiv sub-
st at ativ t th m mb an fxam , mb dd d m ta such as
ad c a s at stack v nts d ainanc u d c at fa s a a ms.
4. Unint nti na c ntact b tw n thct d and a g und d su fac ,
such as c ntact with d ain c am ingings b m y-aways at im-t ashings, can ccu .
5. Unn tic d c ntact with a c nductivay n th su fac f th m mb an ,
such as wat at s ams c s t ad ain m istu c inging t a g an-u -su fac d ca sh t, is ssib .
A gitimat b ach v a c nductiv
su fac wi a a m with ss v tag than us df th fu f t st as sh wn du ing th ini-tia ca ib ati n (st 6B b f g ing n sit ).Wh n in d ubt, duc v tag and t st tha a a und sus ct d fa s a a ms.
wHERE TO GO NEXT?S ci c ab at y and d s a ch
sh u d b c nduct d t b gin t answ thf wing:
H w ft n sh u d qui m nt b ca i-
Figure 7 Fan-style electrode usedto check vertical ashings is most
convenient for hand-held small areas.
b at d? What v tag s sh u d b us
s ci c m mb an ty s and c n gu ati ns?
Is th an u imit n thn ss f insu ati n that wi
iab su ts? D s th siz f th b a d
th stacking/stagg ing f matt in th d t cti n f b
C u d humidity aff ct th t st du ?
CONCLUSIONGiv n an ct ica y suitab
syst m and f wing th t sting d sc ib d ab v , a ng t chnic
vid c n d nt su ts that ain an a a f t st d m mb an havid nti d. Th us f this t in md t minati n f wat tightn ss ti n f th s u c f wat akaga d. HVIT can int ut a singti n d f ct in a v tica s am a t
inh s ac ss a w-s hai damag f t t af c. This t sh u d c ntinu t g w in and us as th ng indust y ad
n d and atab m th ds fing a icati ns.
REFERENCES1. htt ://www.a ab utci cuits./
v _1/ch t_3/4.htm ), t Jun 5, 2012.
1 0 0 Ce j a 2 8 t h R C I I n te R n a t I o n a l C o n v e n tI o n a n d t R a d e S h o w M a R C h 1 4 - 1 9 , 2 0 1 3
http:///reader/full/http://www.allaboutcircuits.comhttp:///reader/full/http://www.allaboutcircuits.com