Hand-Held X-ray Fluorescence Materials Analyzer

Al Kandziorski & Jamie Blowers (TD)

07-Feb-2011 All Experimenters’ Meeting

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Outline

• Purpose/background• Details• X-rays and ES&H• Example use cases• Demo

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Purpose/background

• In the business of fabricating HEP devices we have found a need for being able to perform material identification

• Analytical equipment historically has been very expensive (e.g. SEM)

• Historically we’ve had to rely primarily upon certifications, visual, and indirect measurements (e.g. permeability)

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Purpose/background

• We recently found that handheld technology has become more affordable, so in FY10 we set aside some $

• We reviewed three bids (Oxford, Thermo-Fisher, Bruker). Bruker met all our requirements and was by far the most competitive for price and warranty.

• Took delivery of a “S1 Turbo LE” XRF Alloy Analyzer in October 2010

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Details

• The unit has a 4-watt X-ray source– Voltage ranges from 10 – 40 kV– Current ranges from 0.05 – 60 µA

• Silicon Drift Detector (has its roots in HEP)• Capable of measuring elements as light as Mg

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Radiation Safety

• A RWP is required• Radiation profile:

Recall that the average annual dose is 360 mrem, and the Fermilab-imposed annual limit for Rad Workers is 1500 mrem.

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Example use cases

• Looking for lead in paint on a SCRF cryomodule

• Verifying that a weldment is made of the correct grade of SS

• Identifying materials which were mislabeled (and all look the same but they are different alloys)

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Demo

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Contact information

• Ted Beale x4396, beale@fnal.gov• Al Kandziorski x4190, kandzior@fnal.gov• Jamie Blowers x2800, blowers@fnal.gov

(We make house calls)