FB-DIMM SERIAL DATA COMPLIANCE ANDANALYSIS SOFTWARE

An Extensive Design andValidation ToolThe SDA-FBDIMM compliance andanalysis software solution for theSDA 11000 High-performance SerialData Analyzer provides an extensiveset of validation/verification and debugtools written in accordance with JointElectron Device Engineering Council(JEDEC) AMB point-to-point electricalspecification. Covered test functionsinclude Transmitter, Receiver, andReference Clock (RefClk) Tests.

In addition to standard eye patternand jitter tests, the SDA-FBDIMMsolution provides a complete set of amplitude and timing measure-ments, as defined in the JEDECspecification. This combination

of measurements available in

SDA-FBDIMM constitutes a truly

automated test suite that meets

the Fully Buffered DIMM (FBDIMM)

requirements for point-to-point

serial data links.

The SDA-FBDIMM software takesadvantage of all the advanced testand measurement tools available inLeCroy’s instruments:

• D11000PS High Bandwidth

Probing System

Available in dual-SMA input orSolder-In configurations give theuser a choice between versatilityand the highest signal integritywith the lowest probe loadingacross the entire bandwidth range.

• Jitter Wizard Tool

Standard in the SDA 11000, ensurescorrect jitter measurement setup,with data, clock or a combinationof data and clock signal inputs.

Leading Features• Built for X-Replay™ Automated

Software – compatible with all LeCroy High-performanceReal-time oscilloscopes

• Test and Validation for FB-DIMM configurations from 3.2 Gb/s to 4.8 Gb/s

• Test Suite conforms with JC-45 Validation andVerification Task Groupspecification – updated toRevision 0.85

• Built-in support for upcoming 4.8 Gb/s data rates and beyond

• Amplitude,Timing, Jitter,and Eye Measurements

• Custom Clock recoverysupports Filtered Jittermeasurements

• Supports all industry standard test fixtures

Eye diagram of FB-DIMM

“The AdvancedMemory Buffer (AMB)

Point-to-PointCompliance Test

Solution For LeadingMemory Module

Designers”

FB-DIMM COMPLIANCE AND ANALYSIS SOFTWARE SOLUTION

• Filtered Jitter measurements and

Custom PLL configurations

Allow users to understand thebehavior of circuits by selectivelyapplying custom PLL bandwidthand cutoff frequencies.

• Industry-leading, deep acquisi-

tion memory (Available up to 100 Mpts/Ch in 2 channel mode)enables true characterization ofSpread Spectrum Clock (SSC)measurements required by FB-DIMM specification.

X-Replay: A New Generationof Software Tools for FB-DIMMAs hardware designers are quick to recognize, measurement resultsoften need to be summarized andtabulated for quick specificationverification. SDA-FBDIMM goes a step beyond by incorporating a unique application framework,

where every experimental result issaved to a Open Database Connectivity(ODBC)-compatible database via theExport to XML utility. Sample applica-tions that stand to benefit the mostfrom the new software frameworkinclude, but are not limited to:

• Memory module developers whorequire comprehensive wafer/diecharacterization to define parametricperformance and establish deviceperformance capability.

• Device development teams workingin parallel development cycles whoneed to combine, study, and interpretperformance data and correlate testresults with prior design runs.

• Manufacturing/Production test envi-ronments where key performanceparameters are monitored, usingcontrol charts or other in-processindicators of device performance.

Powerful Debugging ToolsEnsuring backward-compatibility with legacy Double Data Rate (DDR)designs such as DDR-2 or DDR-3requires the use of advanced probingtools. LeCroy provides connectivity toDDR test scenarios through LeCroy’sfamily of WaveLink active differentialprobes, all compatible with SDA 11000.

Similarly, the use of SDA-FBDIMM in conjunction with the deep memoryand powerful analysis library of theSDA instrument family greatlysimplifies the verification process.

Clock recovery circuitry and clockextraction via Phase-Locked Loops(PLLs) is another significant design

X-Replay user interface for FB-DIMM application

FB-DIMM Limits can be modifed to account for the effect of test fixtures2

consideration. The flexible numericalclock recovery options in the SDAallow for the simulation of virtuallyany real receiver PLL configurationthus allowing the simulation of“what if” scenarios. Jitter resultscan be measured exactly as thereceiver would see them.

Comprehensive and Easy to Read Test ReportsAs hardware designers are quick to recognize, measurement resultsoften need to be summarized andtabulated for quick specificationverification. These test results,together with instrument and signalacquisition/test condition setups,create a fully documented record.SDA-FBDIMM incorporates a choiceof automatic HTML, PDF, or RTFreport generation formats. The testreports contain tabulated numericalvalues for each individual test resultincluding PASS/FAIL and specificationlimit columns.

Advanced Real-time Jitterand Eye Pattern AnalysisWhile the SDA instrument familyadds the ability to measure jitter and eye patterns in real time, theSDA-FBDIMM package leverages the Advanced Serial Data AnalysisLibrary, which provides the mostextensive choice of jitter measure-ment conditions for reference clockor data signals, and in accordancewith JEDEC specification. The SDAprovides pinpoint accuracy for eyemask violation locator, even in thepresence of Spread SpectrumClocking (SSC).

Fixtures Supported:• FB-DIMM Parametric test fixture

(Agilent N4236A or equivalent) for Transmitter tests

• FB-DIMM Slot test fixture (Agilent N4238A or equivalent) for Receiver tests

• Channel Test Card (CTC) fixture or Certified Motherboard forReference Clock tests

• AMB Parametric Test Fixture (Ball Grid Array) Agilent N4235A or equivalent.

FB-DIMM RefClock Jitter

FB-DIMM reports generator

FBDIMM Measurements

3

Specifications and Ordering Information

Local sales offices are located throughout the world.To find the most convenient one visit www.lecroy.com

SDAFBDIMMDS_W1_19July06

© 2006 by LeCroy Corporation. All rights reserved. Specifications, prices, availability,and delivery subject to change without notice. Product or brand names are trademarksor requested trademarks of their respective holders.

1-800-5-LeCroy www.lecroy.com

Reference Clock TestsTest Number DescriptionTest 1.1 Reference Clock Frequency Tests 1.2, 1.3 Single-ended Maximum and

Minimum Clock Voltages Test 1.4 Absolute Crossing Point Test 1.5 Voltage Crossing Variation Tests 1.6, 1.7, 1.8 Rising and Falling Edge Rate

Variation and Mismatch Test 1.9 Duty Cycle of Reference Clock Test 1.10 Deterministic Jitter of

Reference Clock

Transmitter TestsTest Number DescriptionTests 2.1, 2.2, 2.3 Differential Peak-to-Peak Output

Voltage for Small Regular and LargeVoltage Swing

Tests 2.4, 2.5 DC Common Mode Output Voltage for Small and Large Voltage Swing

Test 2.6 De-emphasized Differential OutputVoltage Ratio for –3.5 and –6 dB

Tests 2.7, 2.8, 2.9 AC Peak-to-Peak Common ModeOutput Voltage Ratio for Small,Regular and Large Voltage Swings

Test 2.10 Maximum Single-ended Voltage in EI(Electrical Idle) Condition, DC+AC

Specifications

SDA-FBDIMM Package Configurations include all the software, required to run AMB point-to-point on the SDA 9000* and higher bandwidth real-time oscilloscopes.

Product Description Product CodeFB-DIMM Solution Analysis Software SDA-FBDIMMPackage for the SDA Family of Serial Data Analyzers

*SDA 9000 for FB-DIMM data rates up to 4.0 Gb/s, SDA 11000 for datarates up to 4.8 Gb/s.

Product Description Product Code

System Configuration for FB-DIMM 3.2–4.8 Gb/s4 Ch, 11/6 GHz Serial Data Analyzer; SDA 1100011 GHz, 40 GS/s 16 Mpts in 2 Ch mode; 6 GHz, 20 GS/s 8 Mpts in 4 Ch modeDifferential Probe System D11000PSFB-DIMM Solution Analysis Software SDA-FBDIMMPackage for the SDA Family of Serial Data Analyzers

Customer ServiceLeCroy oscilloscopes and probes are designed, built, andtested to ensure high reliability. In the unlikely event youexperience difficulties, our digital oscilloscopes are fullywarranted for three years and our probes are warranted for one year.

This warranty includes:

• No charge for return shipping • Long-term 7-year support• Upgrade to latest software at no charge

Ordering Information

Transmitter Tests (continued)Test Number DescriptionTest 2.11 Maximum Single-ended voltage in EI

(Electrical Idle) Condition, DC Only Test 2.12 Maximum Peak-to-Peak Differential Voltage

in EI ConditionTest 2.13 Single-ended Voltage in D+/D– Test 2.14 Minimum TX Eye Width Test 2.15 Maximum TX Deterministic Jitter (2.15) Test 2.16 Instantaneous Pulse Width Tests 2.17, 2.18 Differential TX Output Rise/Fall Time Test 2.19 Mismatch between Rise/Fall Times

Receiver TestsTest Number DescriptionTest 3.1 Differential Peak-to-Peak Input Voltage Test 3.2 Maximum Single-ended Voltage for

EI Condition, DC+AC Test 3.3 Maximum Peak-to-Peak Differential Voltage

for EI Condition Test 3.4 Single-ended Voltage on D+/D–Test 3.5 Maximum Rx Inherent Deterministic

Timing ErrorTest 3.6 DC Common Mode of the Input Voltage Test 3.7 AC Peak-to-Peak Common Mode of the

Input Voltage Test 3.8 Ratio of VRX-CM-ACp-p to Minimum

VRX-DIFFp-p (3.8)