endcap modules for the atlas semiconductor trackersct/welcomeaux/papers/florenz... ·...
TRANSCRIPT
Endcap Modules for the ATLASSemiConductor Tracker
RD03, Firenze, September 29 th, 2003
Richard Nisius (MPI Munich)
(For the ATLAS-SCT Collaboration)
The plan of this presentation
Introduction
The forward modules
Mechanical performance
Electrical performance
Test beam results
Status of module production
Conclusions and Outlook
Endcap Modules for the ATLAS SemiConductor Tracker Firenze September 29th, 2003 Richard Nisius Page 2
The ATLAS inner detector
»»»»»»»»»:
»»»»»»»»»9
AAK
AAU
2.3 m
7 m
The Pixel Detector− Radius 4.8 − 16 cm.− 3 layers, 10 disks.− 1.4 · 108 read-out channels.− σ: 12 µm (RΦ) and ≈ 70 µm (z/R).
The Semi Conductor Tracker− Radius 27 − 52 cm.− 4 layers, 18 disks− 6.3 · 106 read-out channels.− 4088 modules, 61 m2 silicon− σ: 16 µm (RΦ) and 580 µm (z/R).
The Transition Radiation Tracker− Radius 56 − 107 cm.− 100 k / 320 k straws in barrel / end cap.− 420 k read-out channels.− Xe radiator for electron-detection.− σ: 170 µm / per straw.
In this presentation, only the SemiConductor Tracker will be discussed.
Endcap Modules for the ATLAS SemiConductor Tracker Firenze September 29th, 2003 Richard Nisius Page 3
The SCT forward part - how to build a module
Middle module
Support-structure (Spine)Thermal Pyrolytic Graphitethickness 500 µm, 1700 W/m/K
@@
@@I
¾¡
¡¡
¡ª
FixationsPrecision 20 µm
³³³³³³³1
@@
@@
@@
@@R
Si-wafersca. 6x6x0.285 cm3
768 single-sided p-typestrips on n-type substrate with50-90 µm pitch
»»»»»»»»»»:
XXXXXXXXXXz
HybridA 6-layer copper-polyimidflex on a carbon substrate
@@RRead-out chips6 ABCD3T chips per sidewith binary read-out
©©©©©¼Fan-ins4/module, glass with Al-stripsof 300 µm thickness
¾
Outer moduleInner module
Endcap Modules for the ATLAS SemiConductor Tracker Firenze September 29th, 2003 Richard Nisius Page 4
SCT forward modules - some design values
¾ -16 cm
6
?
8 cm
− Bias voltage: < 500 V.
− Produced heat: < 7 W per module.
− Gain: 50 mV/fC.
− Linearity: better than 5%.
− Peaking time: 20 ns.
− Signal charge: 3.3 fC, S/N > 10.
− Noise: < 1500(1900) e− ENC before (after) irradiation.
− Noise occupancy: < 5 · 10−4 .
− Hit efficiency: > 99%.
− Time walk: ≤ 16 ns, and bunch crossing resolution better than 99%.
− σ = 16(580) µm ⊥ (‖) to the strips.
− Two-track resolution: 200 µm.
The SCT modules are very delicate objects that have to be built with great care.
Endcap Modules for the ATLAS SemiConductor Tracker Firenze September 29th, 2003 Richard Nisius Page 5
The mechanical reproducibility
Results from 28 pre-series modules ( - - - tolerances)
0
2
4
6
8
10
12
14
-0.02 -0.01 0 0.01 0.02
∆detector distance / mm
N
0
2
4
6
8
10
-0.2 0 0.2
∆stereo angle / mrad
N
02.5
57.510
12.515
17.520
22.5
-0.02 -0.01 0 0.01 0.02
∆X-centre / mm
N
0
1
2
3
4
5
6
7
-0.01 -0.005 0 0.005 0.01
∆y-centre / mm
N
-
6
y
x
The modules can be built within specifications with high yield.
Endcap Modules for the ATLAS SemiConductor Tracker Firenze September 29th, 2003 Richard Nisius Page 6
An example of the electrical performance
Channel Number0 100 200 300 400 500 600 700
Vt5
0 (m
V
0
50
100
150
200
250Vt50 at 2.00fC Nent = 762 Vt50 at 2.00fC Nent = 762
Channel Number0 100 200 300 400 500 600 700
Gai
n (
mV
/fC
)
20
25
30
35
40
45
50
55
60
65
70Gain at 2.00fC Nent = 762 Gain at 2.00fC Nent = 762
Channel Number0 100 200 300 400 500 600 700
Ext
rap
ola
ted
Off
set
(mV
)
0
20
40
60
80
100
120
140
Extrapolated Offset Nent = 762 Extrapolated Offset Nent = 762
Channel Number0 100 200 300 400 500 600 700
Inp
ut
No
ise
(EN
C)
500
1000
1500
2000
2500
3000
Input Noise at 2.00fC Nent = 762 Input Noise at 2.00fC Nent = 762
0 . . . . . . . . . 768
− Test of a non perfect hybrid (dead
channels are visible as black lines).
Shown are the results for one side of
the hybrid (6 × 128 = 768 channels),
tested at 2 fC injected charge.
− The results are obtained by analyzing
the S-curves from threshold scans.
AA
AA
AA
AAAK
The output signal.
150 mV
@@
@@
@@I
The calculated gain.
55 mV/fC
XXXXyThe extrapolated offset for 0 fC.
40 mV
´´
´´́+
The noise in e−ENC.1500 e−ENC
The channel to channel varia-tions within a module are small.
Endcap Modules for the ATLAS SemiConductor Tracker Firenze September 29th, 2003 Richard Nisius Page 7
Some properties of non-irradiated modules
Chip number0 2 4 6 8 10
No
ise
[e-
EN
C]
0
500
1000
1500
2000
2500
3000
〈Noise〉 = 1450 e− (Outer)1350 e− (Middle)1000 e− (Inner)
Chip number0 2 4 6 8 10
Gai
n [
mV
/fC
]
0
20
40
60
80
100
〈Gain〉 = 50 mV/fC
Efficiency vs. Noise Occupancy
Threshold (fC)0.7 0.8 0.9 1 1.1 1.2 1.3 1.4 1.5
Eff
icie
ncy
0.9
0.91
0.92
0.93
0.94
0.95
0.96
0.97
0.98
0.99
1
No
ise
Occ
up
ancy
10-6
10-5
10-4
10-3
10-2
10-1
1
1 fC =̂ 6250 e−
Noise =̂ 0.24 fC
Signal =̂ 3.3 fCSignal =̂ 3.3 fC
6 6 6
? ?design ?
The non-irradiated modules are well within the design limits.
Endcap Modules for the ATLAS SemiConductor Tracker Firenze September 29th, 2003 Richard Nisius Page 8
Performance degradation for irradiated modules
¡¡µ3.3 · 1014 p/cm2
Threshold (fC)0.7 0.8 0.9 1 1.1 1.2 1.3 1.4 1.5
Eff
icie
ncy
0.9
0.91
0.92
0.93
0.94
0.95
0.96
0.97
0.98
0.99
1
No
ise
Occ
up
ancy
10-6
10-5
10-4
10-3
10-2
10-1
1A module after full dose
− Gain: 50 → 30 mV/fC ⇒ Smaller signals.
− Noise: 1500 → 2100 − 2400 e−ENC ⇒ Worse S/N ratio.
− Temperature dependence: 6 → 20 e−ENC/◦C ⇒ Higher temperature sensitivity.
− Threshold spread: 160 → 600 e−ENC ⇒ Increased noise.
The operation margin for irradiated modules is rather narrow.
Endcap Modules for the ATLAS SemiConductor Tracker Firenze September 29th, 2003 Richard Nisius Page 9
Lets do the time walk
¾ time
− Efficiency vs. timing of clock and trigger signal at
1 fC threshold. The width corresponds to 25 ns.
¾ti
me
− Timing per chip vs. injected charge. The timewalk
is defined as the maximum difference in timing at
1 fC threshold for 1.25 to 10 fC injected charges.
− The chips get slower after irradiation.
Peaking time: 20 → 30 ns.
− The threshold will be crossed later after irradiation.
Timewalk: 10 → more than 16 ns
− By increasing the Voltage for the analog part of the
chip from 3.5 to 3.8 V, the timewalk can be brought
within specifications for most of the channels.
The chips get slower and the timewalk increases.
Endcap Modules for the ATLAS SemiConductor Tracker Firenze September 29th, 2003 Richard Nisius Page 10
Tracking performance from test beam measurements
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. . . . . . . . .
. . . . . . . . .
/ / / / / / / // / / / / / / // / / / / / / // / / / / / / // / / / / / / // / / / / / / // / / / / / / // / / / / / / // / / / / / / /
Light tight, thermally insulating box
Scintillator Trigger
180 GeV pions
TelescopesTelescopes
0044
*
KB
105
0026
0034
*
0097
0007
*
K5
310*
0047
*
K5
303
K5
308*
KB
104
K5
312*
− Several fully irradiated modules, are placed at about the distances they will have in ATLAS.
− The tracking performance is studied, varying the noise occupancy via the threshold.
− The observed residuals of the space points per module are according to expectation
from the geometry, about 17 (800) µm perpendicular (parallel) to the strips.
− For a track reconstructed from three modules, and at 1.2 fC threshold, an efficiency of
more than 97% at about 10−3 fake rate is achieved. For four modules the efficiency is
still larger than 97%, however at lower fake rate, which is compatible with zero.
The fully irradiated modules still allow for tracking with high efficiency and low fake rate.
Endcap Modules for the ATLAS SemiConductor Tracker Firenze September 29th, 2003 Richard Nisius Page 11
Status of the production - the barrel part
− Module production is distributed over the world.
Production centers are at various institutes in
Japan, Scandinavia, UK and the US. This
means a complex logistics is needed.
− The module production is about 1/3 completed.
− Module to barrel mounting is done
in the UK.
− Lots of services (cooling, cables,
sensors for monitoring, . . .) have
to be installed.
There is still much work ahead.
Endcap Modules for the ATLAS SemiConductor Tracker Firenze September 29th, 2003 Richard Nisius Page 12
Status of the production - the forward part
− The module production is distributed
over various institutes in Europe
and Australia. The existence of three
different module types makes the
logistics even more complex.
− Module production is about to start.
− Module to disk mounting is done
at NIKHEF and Liverpool.
− Lots of services (cooling, cables,
sensors for monitoring, . . .) have
to be installed.
The time schedule to complete the forward SCT is tight.
Endcap Modules for the ATLAS SemiConductor Tracker Firenze September 29th, 2003 Richard Nisius Page 13
Conclusions ...
− A part of the ATLAS inner detector will be equipped with silicon microstripdetectors, the SCT.
− A number of prototype forward modules demonstrate that the mechanicalrequirements can be met with sufficient yield.
− The electrical performance of non-irradiated modules is according to the design.
− The electrical performance of irradiated modules only allows for a marginaloperating flexibility after receiving the full LHC dose, i.e. in the year 2017.
− The series production is underway for barrel modules and about to start for forwardmodules.
... and Outlook− In december 2004 the barrel part is expected to be ready for integration.
− In may 2005 the forward part is expected to be ready for integration.
Endcap Modules for the ATLAS SemiConductor Tracker Firenze September 29th, 2003 Richard Nisius Page 14