electromagnetic field measurement system

6
Electromagnetic Field Measurement System Electromagnetic Field Measurement System Magnetic Near Field Probes Low-frequency (Active Probes) Low-frequency, High-current, Wideband High-frequency (GHz), Wideband Probe Amplifiers High-gain, Ultra-low noise High-gain, Ultra-wideband LF Active Antenna (Three axes) Three Axes Near Magnetic Field/ Far Electric Field Active Antenna Measurement Services A2LA Calibration Services Measurement Instruments Spectrum Analyzers EMI/ESD Visualization Systems High-precision Scanner System Compact Scanner System

Upload: others

Post on 30-Apr-2022

11 views

Category:

Documents


0 download

TRANSCRIPT

Page 1: Electromagnetic Field Measurement System

Electromagnetic Field Measurement System

Electromagnetic FieldMeasurement System

Magnetic Near Field Probes● Low-frequency (Active Probes)

● Low-frequency, High-current, Wideband

● High-frequency (GHz), Wideband

Probe Amplifiers● High-gain, Ultra-low noise

● High-gain, Ultra-wideband

LF Active Antenna (Three axes)● Three Axes Near Magnetic Field/ Far Electric Field Active Antenna

Measurement Services● A2LA Calibration Services

Measurement Instruments● Spectrum Analyzers

EMI/ESD Visualization Systems● High-precision Scanner System

● Compact Scanner System

 

Page 2: Electromagnetic Field Measurement System

Magnetic Near Field Probes

Frequency

Spa

ce R

eso

lutio

n

1.0mm

1.9mm

2.4mm2.5mm

0.50mm

0.25mm

150k 10M 30M100k9k3k 1G 18G

MP-10LA

AEMP002

ALMP001

AEKP001

AEKP002

AEKP003

CP-2SA

3G

AEKP001 AEKP002 AEKP003

Measurement Systemw/ALMP001 or AEMP002

Model

Frequency

Measurement range

Space resolution

Connector

Detector size

Attachment

DUTs

Compatible probes(products of NEC Platforms, Ltd.)

ALMP001 AEMP002

9 kHz - 30 MHz 3 kHz - 2 MHz

0.02 A - 14 A 0.002 A - 1.4 A 0.2 mA - 0.14 A

2.4 mm 2.5 mm1.9 mm

SMA (Jack)

9.0 mm x 3.5 mm

Not needed(Probe amplifier embedded)

DC 17 V - 22 V (AC adapter included)

N/A

N/A N/A

Compatible with the attachment for CP-2SA in 4EM500/4EM200U (NEC Platforms, Ltd.)

∙ Power circuits ∙ DC/DC converters∙ Power devices

100 kHz - 3 GHz

5 A (max.)

1.0 mm

SMA (Jack)

12.0 mm x 3.0 mm

AELA001, AEMA001

∙ Inverter equipment∙ Ferromagnetic field power equipment∙ Power equipment

10 MHz - 18 GHz

N/A

0.5 mm

SMA (Jack)

2.5 mm x 0.7 mm

AEWA001

∙ Boards with high speed digital devices (high speed FPGA, DSP, CPU)∙ High speed digital communication boards (PCI Express 2.0, USB3.0, HDM1.3, etc.)∙ Microwave circuit boards and components

∙ Model: MP-10LA∙ Frequency: 150 kHz - 1 GHz∙ Space Resolution: Approx. 1.0 mm∙ Connector: SMA (Jack)∙ Detector Size: 12.0 mm x 3.0 mm

∙ Model: CP-2SA∙ Frequency: 10 MHz - 3 GHz∙ Space Resolution: Approx.0.25 mm∙ Connector: SMA (Jack)∙ Detector Size: 2.0 mm x 1.0 mm

Measurement Systemw/AEKP001/AEKP002/AEKP003

∙ A series of AEKP comes with a bias adapter, AD adapter and a case.*Spectrum Analyzer is sold separately.

∙ ALMP001 and AEMP002 come with a case.*Prove Amplifier and Spectrum Analyzer are sold separately.

■ Specifications

Power supply

RecommendedProbe Amplifier

2

AEKP001 ∙ Low-frequency∙ Built-in amplifier

AEKP002 ∙ Low-frequency∙ Built-in amplifier

AEKP003 ∙ Low-frequency∙ Built-in amplifier

ALMP001∙ Low-frequency∙ High-current∙ Wideband

AEMP002 ∙ High-frequency (GHz)∙ Wideband

Probe

Probe Amplifier*

Probe

Spectrum Analyzer* Spectrum Analyzer*

DC bias adapter

Page 3: Electromagnetic Field Measurement System

Probe Amplifiers

AELA001Model

Frequency

Noise figure

Gain

1 dB compression

Max. output power

Typical performanceat 25°C

SWR

AEMA001 AEWA001

≤5 dB

100 kHz - 1 GHz

≥50 dB

≤-43 dBm

≥5.5 dBm

≤2

10 MHz - 6 GHz

≤5 dB

10 MHz - 1 GHz: ≥40 dB1 GHz - 6 GHz : ≥30 dB

10 MHz - 1 GHz: ≤-28 dBm1 GHz - 6 GHz : ≤-18 dBm

≥8 dBm

10 MHz - 1 GHz: ≤21 GHz - 6 GHz : ≤3

10 MHz - 20 GHz

10 MHz - 250 MHz: ≤15.0 dB250 MHz - 13 GHz : ≤5.0 dB13 GHz - 20 GHz : ≤7.5 dB

10 MHz - 6 GHz : ≥40 dB6 GHz - 16 GHz : ≥30 dB16 GHz - 20 GHz: ≥25 dB

10 MHz - 6 GHz : ≤-24 dBm6 GHz - 16 GHz : ≤-18 dBm16 GHz - 20 GHz: ≤-17 dBm

10 MHz - 6 GHz : ≥12 dBm6 GHz - 16 GHz : ≥10 dBm16 GHz - 20 GHz: ≥8 dBm

10 MHz - 10 GHz: ≤210 GHz - 20 GHz : ≤4

Input level +5 dBm (max.) +13 dBm (max.) +18 dBm (max.)

Dimensions W100 mm x D330 mm x H90 mm

Weight Approximately 1 kg

Recommended probes ALMP001, AEMP002, CP-2SA, MP-10LA *Please see the probe specifications for details.

Accessories Calibration data, AC adapter

Impedance

Power supply

SMA (Jack)50 Ω

17 V - 22 V DC≤150 mA

15 V - 22 V DC≤110 mA

12 V, 330 mA DC(16.5 V in max.)

SMA (Jack)50 Ω

K (Jack)50 Ω

1 dB comp. (dBm)Gain (dB)

Max. output power (dBm)NF (dB)

AELA001・High-gain・Ultra-low noise

AEMA001・High-gain・Ultra-wideband

AEWA001・High-gain・Ultra-wideband

■ Specifications

3

Page 4: Electromagnetic Field Measurement System

LF Active Antenna (Three axes)

AALF001Model

Directivity

Frequency

Impedance

VSWR

Minimum receptionfield strength

Output connector

Power supply

Operatingtemperature range

Weight

Size

Applications

Each axis and composition of X, Y, and Z

9 kHz - 3 MHz

50 Ω

≤1.2

80dB μV/m (9 kHz)

220 g

∙ Antenna radome Φ67 x 90 mm ∙ Grip Φ38 x 130 mm

∙ Noise measurement by power inverter ∙ Noise measurement by switching regulator ∙ LF, MF Transmitting antenna field measurement

BNC (Jack)

DC 17 V - DC 22 V, 60 mA

0°C - +50°C (No condensation)

*Spectrum Analyzer and cable are sold separately. *AC adapter is included. *Antenna stand is not included. *A2LA calibration data sheet is available (optional). *Cert. #3606.01 is the certification number to OHTAMA Calibration Service Co., Ltd.

■ Specifications

This is designed and developed to measure near magnetic field strength of power electronics (e.g. cars, medical equipment, and robots), as well as to monitor a transmitting antenna for long and medium wavebands.

Three Axes Near Magnetic Field/Far Electric Field Active AntennaAALF001 (Directional/Non-directional selectable)

4

AC adapter, the manual, and thecarrying case are included.

Measurement Instruments

Spectrum AnalyzersAET, Inc. is a Solution Partner in Japan of Keysight Technologies, Inc. For further information, please contact us.

Page 5: Electromagnetic Field Measurement System

EMI/ESD Visualization Systems

4EM500Model

DUTs

Measurement method

Measurement range

Stepping motion

4EM200U

Four-axis stage operates a probe.

Equipment, PCBs, LSIs, Modules, Components, etc.

X, Y, Z = 500 x 500 x 210 (mm), θ = +/- 90 deg.

X, Y, Z = 0.01 mm, θ = 1 deg.

W860 x D862 x H840 (mm), excluding protruding parts

Approximately 110 kg

AC 100-240 V, 50/60 Hz

Motor Control Board (USB or PCI-Express®), GPIB-USB

Spectrum Analyzer

RF cables

X, Y, Z = 200 x 200 x 100 (mm), θ = 0 and 90 deg. (Two positions)

X, Y, Z = 0.1 mm

W297 x D420 x H500 (mm), excluding protruding parts

Approximately 15 kg

Motor Control Card (USB), GRIP-USB

Rotary joint

Equipment, PCBs, LSIs, Modules, Components, etc.

*Options and customization are available. *For further information, refer to the product catalog of NEC Platforms, Ltd. *PCI Express® is the trademark of PCI-SIG.

■ Specifications

■ Options

Dimensions

Weight

Power supply

Control interface

Measurementinstruments

Accessories

Compact Scanner System4EM200U is the compact type of the High-precision Scanner System 4EM500.

4EM200U (NEC Platforms, Ltd.)

High-precision Scanner System4EM500 (NEC Platforms, Ltd.)

4EM500 measures and displays the magnetic field intensity distribution of various DUTs.

Optional Function (4EM500) Measurement and Simulation

With the laser height measurement function, 4EM500 can measure EMI distribution with a probe non-contact tracking according to a DUT height.

3D graph display screenMain display screen

Superposition of measurement results Data link from EMIStream® to CST MICROWAVE STUDIO®

CST MICROWAVESTUDIO®

PCB Data EMD Viewer System EMIStream®

5

*Optional

*High-precision Scanner System, Compact Scanner System and EMD Viewer System are the products of NEC Platforms, Ltd. *EMIStream is the trademark or the registered trademark of NEC Solution Innovators, Ltd. in the United States and/or other countries.*CST MICROWAVE STUDIO is the trademark or the registered trademark of CST in North America, the European Union, and other countries.

Page 6: Electromagnetic Field Measurement System

Measurement Services

A2LA Calibration ServicesThis is A2LA accredited calibration services to ISO/IEC17025 for LF Magnetic Field Sensor and High-sensitivity Low-frequency Active Antenna.

Calibration measurement of LF Active Antenna (Three axes)

Measurement Standard

*The measurement is provided byOHTAMA Calibration Service Co., Ltd.

20326 Via Volante, Cupertino, CA 95014, U.S.A. Tel : +1-408-996-1760e-mail : [email protected]

AET Associates, Inc. http://www.aetassociates.com

2-7-6 Kurigi, Asaoku, Kawasaki-city, Kanagawa, JapanTel : +81-44-980-0505 Fax : +81-44-980-1515 e-mail : [email protected]

http://www.aetjapan.com

©2019 AET, Inc. All rights reserved

Specifications and/or appearance are subject to changewithout prior notice for further improvement.

C-HA136EN-007