electrical diagnostics for pulsed power
TRANSCRIPT
ELECTRICAL DIAGNOSTICS FOR PULSED POWER
Rishi Verma, R. S. Rawat, P. Lee, S. V. Springham, T. L. Tan
NSSE, NIE, Nanyang Technological University
1 Nanyang Walk, 637616, Singapore
M. Krishnan
Alameda Applied Sciences Corporation, San Leandro, CA 94577, USA
Abstract
Pulsed power systems are integral part of any pulsed plasma radiation device
and hence the associated electrical diagnostics plays vital role in investigating the
overall device performance and its characteristics. The typical diagnostic
parameters of interest in any pulsed power system are linked with the measurement
of high frequency, high voltages and currents. There is wide range of available
diagnostics being used by practicing researchers for the measurement of mentioned
parameters but even though they operate on simple laws of electromagnetics and
the conceptual understanding is clear; the bandwidth response of such diagnostics
is often limited by various parasitic effects that impairs the factual measurement of
parameters. The scope of the paper is to introduce various invasive and non-
invasive electrical diagnostics used in pulsed power systems and highlight the
concealed causes that affect their behavioral response.
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
Purpose
This talk is meant to provide an overview of standard electrical
diagnostic techniques used in pulsed power systems driving pulsed
plasma devices. …….. Impulse Measurements!
The main focus will be on pulsed electric and magnetic field (Voltage
& Current) measurement techniques having bandwidth response in ns
to ms regimes.
Parasitic effects that impairs the factual measurement of parameters
will be discussed.
Overview of design methodology.
Noise and Shielding.
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
Categorization
Pulsed Power Electrical Diagnostic Tools
Current measuring devices Voltage measuring devices
Non-intrusive Intrusive Non-intrusive Intrusive
Rogowski Coils
Current Transformers
Current Shunt
Simple resistive dividers
Compensated dividers
Capacitive Voltage dividers
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
Rogowski Coils
“most effective, economic and extensively
used diagnostic”
∫= ldHirr
. Amperes Law
Faraday’s Law
It is an air-cored toroidal coil
that surrounds the conductor
carrying the current to be
measured.
dt
dnVcoil
φ×=
# Gennadiy Frolov et al., Microbridge Technologies; EE Times-India, December 2007
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
Sensitivity of Rogowski Coil
The current to be measured is related to the induced
voltage by a proportionality constant i.e. the mutual
inductance of the coil.
dt
diMVcoil ×−= 21
nAM 0µ=
M = Coil Sensitivity (Vs/A)
(depends on the coil winding design)
di/dt = rate of change of current (A/s)
n & A = design and geometry parameters
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
Sensitivities for different cross-sections
Rectangular
Cross-section
Circular
Cross-section
Oval
Cross-section
# Jan Hlavacek et al., 16th IMEKO TC4 Symposium, Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements, Sept. 22-24, 2008, Florence, Italy
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
Time response consideration
Differentiating / Integrating !
Differentiating
- depends on circuit parameters
R
I
dt
dIL
dt
d cc +=φ
cc I
dt
dI
R
L
dt
d
R+=
φ1
cc I
dt
dI
R
L<< LR ω>>
dt
dIc
φα c
c Idt
dI
R
L>> RL >>ω φαcI
Self-Integrating
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
Realistic lumped circuit model
High frequency response (bandwidth) is determined by :
Coil inductance (Lc)
Coil resistance (Rc)
Stray capacitance of winding (Cc)
Termination impedance (Z)
I(t)
- solution is complex !# M. Argueso et al., www.aedie.org/9CHLIE-paper-send/252-argueso.pdf
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
High bandwidth issues
1. The rise time (tr) of the
measuring pulse is
limited by the wave
transit time (T) in the
coil winding.
tr >T always
2. Role of termination
impedance (Z) is very
important.
LR ω>> RL >>ω
20 ns/div
5 ns/div
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
High bandwidth issues
3. Highest frequency
measurement limited by
resonant frequency (LC)
of the coil.
“distributed capacitance
due large no. of turns”
4. Non-uniform excitation
due to dislocation of
current centroid may lead
to strong oscillations in
the sensor signal
# http://www.pemuk.com
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
High bandwidth issues
5. High voltage
consideration
6. Shielding - is placing the
Rogowski coil inside the
slotted metallic housing.
“Some times coupling capacitance b/w the winding
and shielding may affect the signal response”
# http://www.pearsonelectronics.com
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
Design methodology for differentiating Rogowski
Step 1: Estimate the di/dt in the circuit.
pkITdt
di×=
π2
Step 2: Fix the max. limit for the induced voltage (Vcoil).
Step 3: Use the basic equation:
# John Anderson, RSI 42,7,1971
Step 4: Choose optimum values for –
a,b, R and N.
dt
di
RNAVcoil ××=
π
µ
2
0
baA ×=
L
CVI chpk =LCT π2=
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
Current Monitors
- are similar to self integrating Rogowski Coils in
response but utilize high permeability magnetic
core for coil winding.
- the presence of high permeability core is important
for the extension of flat response to low frequency.
- Usage: CT’s – Universal / Rogowski Coil - Customized.
# http://www.pearsonelectronics.com# Chris Waters, PCIM Article 86; http://www.pearsonelectronics.com
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
Major limitation with CT’s
“Core Saturation i.e. ”
dt
dnVcoil
φ×= φ∫ ∆= ndttV )(
- is the change in flux in the coreφ∆
Since the max. flux is limited by core saturation there is
a corresponding limit on : TI ×
In terms of design parameters :R
ABndttI max
2
)( ≤∫
“Core may also get saturated by the DC component of the
current being measured, Biasing overcomes this problem”
TI ×
# Chris Waters, PCIM Article 86; http://www.pearsonelectronics.com
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
Important time domain parameters
- current – time product rating must not exceed ( )maxTI ×
- highest measurable current (related with )maxI ( )maxTI ×
%)9010( −rt - Useable rise time (<10% overshoot)
Sensitivity(Volt/Ampere) - typical range 0.001 - 0.01V/A
Droop – it’s the distortion in
the pulse shape of longer
duration current pulses
(ms to 100’s of ms)
# http://www.pemuk.com
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
Current Shunts/ CVR’s
“Use of shunt is based on measurement of the
voltage drop across the resistance of known value”
Current shunts/ CVR’s have:
High peak power
High frequency response
Large pulse energy handling capacity
“Ideally – Ohmic (Non-Inductive)”
dtIRE CVRCVR ∫= 2
max
# Mark E. Savage, Pulsed Power Electrical Diagnostics, IEEE Pulsed Power-Plasma Science Mini-course, June 23 2007
# Hansjoachim Bluhm, Pulsed Power Systems; ISBN-10 3-540-26137-0, ISBN-13 978-3-540-26137-7 Springer Verlag Berlin Heidelberg 2006
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
CVR’s from T & M Research, USA
Hi-Wattage (225W - R Series) CVR’s
Sub-milliohms
Up to 100’s of MHz
Up to sub-nanosecond
Up to 10’s of kJ’s# http://www.tandmresearch.com
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
High voltage impulse measurements
1. Simple resistive dividers
Limitation:
(R1)
Copper casing(grounded to chamber frame)
51 ΩBNCConnector
Insulator
Resistor chain (10×510 Ω )
To positive flange
HV Arm
(R2)
LV Arm
(HV)
GND
+=
21
2
RR
RVV inout
“Measurement of fast signals with
large division ratio”
inV
# E. Kuffel et al., High Voltage Engineering Fundamentals, ISBN 0 7506 3634 3
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
High voltage impulse measurements
2. RC compensated dividers
L = 30nH , C = 534 fF
It is necessary to balance the time
constants of both the arms
Shunt capacitance and inductance of Resistor
For R = 1 kΩ
RC ≈ 500ps
L/R ≈ 30ps
Equivalent circuit of Resistor
2211 CRCR =# Mark E. Savage, Pulsed Power Electrical Diagnostics, IEEE Pulsed Power-Plasma Science Mini-course, June 23 2007
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
High voltage impulse measurements
3. Capacitive voltage dividers
Equivalent circuit
( )( )
dt
dV
C
CC
CRR
V
dt
dV 2
1
21
121
11 ++
+=
Differentiating Integrating
( ) ( ) rtCCRR <<++ 2121
( )dt
dVCRRV 1
1212 +=
( ) ( ) rtCCRR >>++ 2121
+
+=
2
21
1
21
1
2.R
RR
C
CC
V
VRatioAttn
2
21
12 V
CC
CV
+=
# Hansjoachim Bluhm, Pulsed Power Systems; ISBN-10 3-540-26137-0, ISBN-13 978-3-540-26137-7 Springer Verlag Berlin Heidelberg 2006
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
Safe practices for maintaining wave shape fidelity
When long length cables are used it is advisable to use 50Ωtermination at scope end. Noise travels faster in air than cables.
The instrument grounds must be isolated from the equipment
ground for avoiding ground loop noise.
Noise reduction by ferrite cores. Enhances Shield Inductance.
Spurious ringing is produced
due to high frequency currents
flowing out side the cable shield
Using differential probes giving (Ch1 – Ch2):
– Ch1: +Vreal+Vparasite
– Ch2: -Vreal+Vparasite
# http://www.pearsonelectronics.com
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
Conclusion
Awareness of data quality is an important issue and it can only be
improved by proper understanding of response of the diagnostic tools
and the factors limiting their bandwidths.
Noise problems are often challenging and shield currents are the main
cause. Good cabling and grounding practices solve most noise
problems (e.g. use of double shield cables)
High bandwidth response of data acquisition system i.e. oscilloscopes/
fast digitizers is equally important for good data quality for e.g. –
r
signalt
BW4.0
=signalscope BWnBW ×=
tr – rise time
BW - bandwidth
For n = 3, 5GHz/80ps 1.66GHz/240ps 1/50ps ~20GS/s
(# http://www2.tek.com/cmsreplive/pirep/3802/55W_18024_2_2009.04.07.10.03.56_3802_EN.pdf)(# http://cp.literature.agilent.com/litweb/pdf/5989-5733EN.pdf)
International Workshop on Plasma Diagnostics and Applications, Singapore July 2 – 3, 2009
Thanks