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1W.Wang
Moiré Interferometry
Wei-Chih WangME557
Department of Mechanical Engineering University of Washington
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2W.Wang
Interference
When two or more optical waves are present simultaneously in the same region of space, the total wave function is the sum of the individual wave functions
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3W.Wang
Criteria for interferometer:(1) Mono Chromatic light source- narrow bandwidth(2) Coherent length: Most sources of light keep the same phase for only a few oscillations. After a few oscillations, the phasewill skip randomly. The distance between these skips is called the coherence length. normally, coherent length for a regular 5mW HeNe laser is
around few cm,lc = λ2/∆λ ,
(3) Collimate- Collimated light is unidirectional and originates from a single source optically located at an infinite distance so call plane wave(4) Polarization dependent
Optical Interferometer
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4W.Wang
Interference of two wavesWhen two monochromatic waves of complex amplitudes U1(r) andU2(r) are superposed, the result is a monochromatic wave of theSame frequency and complex amplitude,
U(r) = U1(r) + U2 (r) (1)
Let Intensity I1= |U1|2 and I2=| |U2|2 then the intensity of total waves is
I=|U|2 = |U1+U2|2 = |U1|2 +|U2|2 + U1* U2 + U1U2
* (2)
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5W.Wang
Basic Interference Equation
Let U1 = I10.5 e jφ1 and U2 = I2
0.5 e jφ2 Then
I= I1_+ I2 + 2(I1 I2)0.5COSφ (3)
Where φ = φ2 − φ1 (phase difference between two wave)
Ripple tank Interference patterncreated by phaseDifference φ
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6W.Wang
Interferometers
•Mach-Zehnder
•Michelson
•Sagnac Interferometer
•Fabry-Perot Interferometer
Interferometers is an optical instrument that splits a wave intotwo waves using a beam splitter and delays them by unequal distances, redirect them using mirrors, recombine them usinganother beam splitter and detect the intensity of their superposition
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7W.Wang
Intensity sensitive to phase change
φ = 2πnd/λ
Where n = index of refraction of medium wave travelsλ = operating wavelengthd = optical path length
Intensity change with n, d and λ
The phase change is converted into an intensity change using interferometric schemes (Mach-Zehnder, Michelson, Fabry-Perot or Sagnac forms).
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8W.Wang
Free Space Mach-ZehnderInterferometer
U2
U1
U
mirrormirror
Beam splitterstransmission
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9W.Wang
Suppose input beams 1 and 2 have unequal intensities I1 and I2 and Phase difference due to a small path difference S
I= I1_+ I2 + 2(I1 I2)0.5COS(2πS/λ)
S (m)
I
I1/ I2= 100I1/ I2= 10I1/ I2= 1
Impure Two-beam interference
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10W.Wang
Impure Two-beam interference with fix input intensity
I1 = 0.001*IoI2 = 0.1*Io
I1 = 0.01*IoI2 = 0.1*Io
I1 = 0.1*IoI2 = 0.1*Io
Contrast: max
minmax%I
II −= Where Imax = I1_+ I2 + 2(I1 I2)0.5
Imin = I1_+ I2
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11W.Wang
Interference by two beams at an angle θ
When two coherent beams of collimated light intersects at an Angle of 2θ, a volume of interference fringe planes is created.
G
G sinθ =λ/2
θ
θ
G
θλ/2
Peaks of interference
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12W.Wang
When two coherent beams of collimated light intersects at an Angle of θ1+θ2, a volume of interference fringe planes is created.
G
G (sinθ1+sinθ2) =λ
θ1
θ2
Interference by two beams at angles θ1 and θ2
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13W.Wang
Interference by two beams at angles θ1 and θ2
Complex amplitude:
Assume two waves have the same intensities
Here is the phase difference between two wavesat z=0;
*12
*21
22
21
21 )()()(
UUUUUUI
rUrUrU
+++=
+=
)exp())sincos(exp(
))sincos(exp(
02221
02
1121
01
φθθ
θθ
jxkzkjIU
xkzkjIU
+−=
−−=
0φ
)exp()sinexp(
)sinexp(
0221
02
121
01
φθ
θ
jxjkIU
xjkIU
−=
=
)])sin(sincos(1[2))sin(sincos(22
))])sin(sin(exp()))sin(sin([exp(2)exp()sinexp()sinexp()exp()sinexp()sinexp(
0210
02100
02102100
0210021000
φθθφθθ
φθθφθθφθθφθθ
−++=−++=
−+−+−++=−−+−++=
xkIIxkIII
xkjxkjIIIjxjkxjkIjxjkxjkIIII
The pattern varies sinusoidal with x.
)sin(sin2
2)sin(sin
21
21
θθπ
πθθ
+==
=+
kxG
xk
21 sinsin θθλ+
=G
U1
U2
x
z
Grating period G:
G
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14W.Wang
Theoretical limit of the frequency of the interference patternproduced with the two intersecting beams is given by
fmax = 1/Gmin = 2/λ
Thus, the frequency depends on wavelength of the light source
HeNe (632nm) fmax = 3160 lines/mmArgon (488nm) fmax = 4098 lines/mmHeCd (325nm) fmax = 6154 lines/mm
However, it is impossible to form these patterns because θ = π/2!
Frequency limit
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15W.Wang
Optical Arrangement for grating construction
Two intersected beams are used to produce high frequencyGrating which are employed as the specimen gratingsIn Moiré interferometry.
shutter
Beamsplitter
mirror
mirror
Parabolic mirror
Parabolic mirror
laser
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16W.Wang
Glass (reduce the power)
BS
Mirror 4 is mounted on a rotational stage to adjust the angle
Specimen is mounted on a rotational and translational stage
Has to be perpendicular
Filter (reduce the power)
φ
φφβ
Mirror1
Mirror2
Mirror 3
HeCd laser (λ = 450nm)
Optical Setup for Two Beams Interference
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17W.Wang
Interference Lithography Setup
Light branching region Exposing region
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18W.Wang
φ
photosensitivepolymer
interferencepattern
mirror
monochromaticlight source
G = λ/(2sinφ) (grating spacing)
Lloyd's Mirror
z
x- Split beams without beam splitter-Less light loss (fewer mirrors)- Incident angle = reflected angle
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19W.Wang
Specimen Gratings
Frequency of gratings for moiré interference usually around 1000 to 2000 lines/mm (photoresist, molding, e-beam, etc.)
Frequency of gratings for geometric Moire usually rarely exceed 80 lines/mm (cutting with fine knife)
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20W.Wang
Transferring grating using molding process
Wet etchingof Chrome
photolithgraphy
Specimen with drop of adhesiveGlass plate
Cr +PR
Cured adhesivefilm with gratingstructure
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21W.Wang
Virtual Grating
Virtual grating can be formed either by diffraction grating linesOf a real grating or interference pattern from two coherent beams.
Diffraction by real gratingTwo coherent beams
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22W.Wang
Warped Wavefronts
When stress applied to initially flat surface, the resulting nonhomogenous deformation creates a warped wavefronts. A consequence of wavefront changes, each wall of interference has a continuous but warped shape, with its warpage systematically different from that of the neighboring wall. A photographic plate that cuts the walls at one location might record the fringe pattern but different location.That fringe pattern would be somewhat different.
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23W.Wang
Moiré Interference
Moiré interference combines concept of general geometric Moiré and optical interferometry.
Moiré interferometer is identical to mechanical moiré in the sense that a moiré image is formed by light passing through two gratings- one on the specimen and the other a reference grating.
For mechanical Moiré, the reference grating is real, with moiréinterfereometry, the grating is imaginary, consists of virtual image of an interference pattern produced with mirrors.
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24W.Wang
Mirror
Beam splitter
Incident beam
mirror
Specimengrating
To camera
α
Optical arrangement for Moiré Interferometry
specimenTwo coherent beams incident obliquely from angle +α and –α, which generates walls of constructive and destructive interference (i.e. virtual grating)in the zone of intersection; the virtual grating is cut by the plane of the specimen surface, where an array of parallel and very closely space fringes are formed. These fringes act like reference grating in geometricMoiré. The specimen grating and virtual reference grating interact to form a moiré pattern which is viewed by the camera.
A
B
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25W.Wang
camera
A
B
-1
-2
1
0
1
-3
23
α
α
A’ B’
A” B”
Linearly polarized light TE or TM
Specimen grating diffracts incident light into rays A’, B’ for the initial no-load condition of the specimenand A” and B” from nonhomogeneous deformation of the specimen, where these two wavefronts interfere and generate an interference pattern on the film plan of camera
Diffraction beams stemming from incident beams A and B
βm
0-1
βmx
z
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26W.Wang
Beams A and B intersects in the region of space immediately in front of the specimen grating. Beams A and B form a virtual grating whose pitch (G) is given by
G = λ/2 sinα
In the case of moiré interference, the angle of intersection (2α) is not arbitrary. Rather α is selected such that the we observe the m = + 1 diffracted beams emerge from the specimen grating and the corresponding diffracting angle (β+-1 = 0)General grating equation is
sinβm = mλ/g− sinα => sinα = +λ/g (β+-1 = 0)
Therefore the virtual grating which formed by the moiré interferometry has fringe spacing(G) given by,
G = λ/(2λ/g) = g/2
Frequency of virtual grating F is twice the pitch of the specimen gratings f
F = 1/G = 2f where f = 1/g = frequency of specimen grating (lines/mm)
When F = 2f and lines of specimen and reference gratings are parallel, light from A, diffracted in the first order of the specimen grating , emerge as β = 0 with plane wavefront A’ and light from B, diffracted in the -1 order also emerge as β = 0 with wavefront B’. If they are coherent and complete in phase, then we see a pattern of zero freuquency (0 Lines/mm) or so called null filed.
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27W.Wang
When specimen subject to forces that stretch it uniformly in the x direction such that theUniform normal strain εxx is a constant, the frequency of the specimen grating is therebyDecrease to
xx
ffε+
=′1
Corresponding frequency in virtual grating is xx
FFε+
=′1
With new frequency, New diffraction angle at m = +1 and sinα =Fλ/2, sinβ’+1 = +λf’− sinα
= +λF’/2− sinα = +λF’/2 –Fλ/2= +λ (F/(1+εxx))−Fλ/2
If εxx ~ small, sinβ’+1 = +λFεxx/2
Νοω β +1 not zero anymore and because of the angle difference, we create interference
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28W.Wang
If β’ ~ small, sinβ’ ~ β’, then β’+ = +λFεxx/2
This angle is similar to the interference pattern with two beams separated by angle of θ .
The fringe gradient is same as the frequency Fmof this interference (moiré) pattern that is given as
xN ∂∂ /
λβ ′
==∂∂ sin2
mFxN
Since β’ ~ small, sinβ’ ~ β’, λβ ′
=∂∂ 2
xN
Sub β’+ = +λFεxx/2
We get m
mxx G
GFF
xN
F===
∂∂ ε1 Where G = pitch of the virtual grating
Gm = distance between two adjacentfringes with orders m and m+1
Strain along x direction proportional to frequency change or pitch change
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29W.Wang
During the development of moiré interferometry, it was empirically established that fringe order and displacement u in primary diffraction direction (m=+1) were related according to:
u = Ng
Above equation is similar to the Geometric Moiré’s displacement equation:
δ = p N where N = fringe numberp = pitch of periodic referemce gating
Moiré interferometer is identical to mechanical moiré in the sense that a moiré image is formed by light passing through two gratings- one on the specimen and the other a reference grating. (Post, chap 7 handbook of experiential mechanics, p 314 1993)
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30W.Wang
Example
In practice, angle β is very small. For example, with λ = 488nm,g = 2000lines/mm, εxx=0.002, based on β’+ = +λFεxx/2 ,
It gives |β’+ | = 0.0559o
The correspnding fringe pattern frequency is 4 lines/mm
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31W.Wang
Optical arrangement for Moiré Interferometry
Page 324-5 kobayashi
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32W.Wang
Two dimensional displacement field
Both u and v dispplacement fields are needed to determine the complete strain fields εxx(x,y), εyy(x,y) and γxy(x,y)
Page 324-5 kobayashi
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33W.Wang
Example of Two Dimensional Displacement Measurement
Page 324-5 kobayashi
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34W.Wang
Applications
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35W.Wang
Achromatic System
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36W.Wang
Optical Setup for two beams and four beams
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37W.Wang
Lab 3 Moiré InterferometeryHeNe Laser (632.8nm)
Loading frame
CCD Camera
Pin hole(aperture)
Mirror 1
Mirror 2
Mirror 3
Beam expander
specimen
The experiment is to use moiré interferometry technique to generate a stress-strain curve from the tensile test of a dog bone specimen. The dog bone specimen is made of 76075-T7351 aluminum.
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38W.Wang
Metal Specimen
2”
1”3”
.4”
Dog bone specimen of 7075-T7351 aluminum with a sharp notch
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39W.Wang
Polish from 9 to ¼ microns to mirror quality
Spin coat AZ1400 series photoresist (1 to 5µm)
Expose grating pattern 40lines/mm using UV light
After developing, cross grating patternFormed on the +PR
Grating Replication Process
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40W.Wang
Lab 3Things to turn in:
1. Moire interference pattern at load = 100lbs2. Generates the displacement field (y) as a function of distance
(x) behind the notch at 400lbs (take data every 0.2”)3. Generate a stress-strain curve based on the observed moiré
interference pattern (take at every 100lbs until the sample breaks)
2
3
1.8”
y
x
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41W.Wang
Actual Setup
HeNe Laser (632.8nm)
Mirror 1
Mirror 2pinhole
Beam expanderMirror 3 and 4
Spatial filters
Loading framePower supplymeters
CCD cameraPC with DAQ