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www.iap.uni-jena.de
Metrology and Sensing
Lecture 6: Interferometry II
2017-11-23
Herbert Gross
Winter term 2017
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Preliminary Schedule
No Date Subject Detailed Content
1 19.10. Introduction Introduction, optical measurements, shape measurements, errors,
definition of the meter, sampling theorem
2 26.10. Wave optics Basics, polarization, wave aberrations, PSF, OTF
3 02.11. Sensors Introduction, basic properties, CCDs, filtering, noise
4 09.11. Fringe projection Moire principle, illumination coding, fringe projection, deflectometry
5 16.11. Interferometry I Introduction, interference, types of interferometers, miscellaneous
6 23.11. Interferometry II Examples, interferogram interpretation, fringe evaluation methods
7 30.11. Wavefront sensors Hartmann-Shack WFS, Hartmann method, miscellaneous methods
8 07.12. Geometrical methods Tactile measurement, photogrammetry, triangulation, time of flight,
Scheimpflug setup
9 14.12. Speckle methods Spatial and temporal coherence, speckle, properties, speckle metrology
10 21.12. Holography Introduction, holographic interferometry, applications, miscellaneous
11 11.01. Measurement of basic
system properties Bssic properties, knife edge, slit scan, MTF measurement
12 18.01. Phase retrieval Introduction, algorithms, practical aspects, accuracy
13 25.01. Metrology of aspheres
and freeforms Aspheres, null lens tests, CGH method, freeforms, metrology of freeforms
14 01.02. OCT Principle of OCT, tissue optics, Fourier domain OCT, miscellaneous
15 08.02. Confocal sensors Principle, resolution and PSF, microscopy, chromatical confocal method
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Content
Young interferometer
Axial coherence
Interferogram examples
Interpretation of interferograms
Fringe evaluation methods
Wave aberrations in optical systems
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2
2
0 cos4)(z
xDIxI
D
zx 2
screen with
pinholes
detector
source
z2
region of
interference
z2
x
D
Double Slit Experiment of Young
Young interference experiment:
Ideal case: point source with distance z1, ideal small pinholes with distance D
Interference on a screen in the distance z2 , intensity
Width of fringes
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Young Interferometer
Division of the light from a source by two pinholes or two slits
Ref: R. Kowarschik
P1
S
A B
Q
P2
s1
s2
x
y
z D
a
D
z1
z2
light source
screen with slits
distance D
detector
x
x
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Double Slit Experiment of Young
= 0 = 0.15 = 0.25 = 0.35 = 0.40 = 0.30
Partial coherent illumination of a double pinhole/double slit
Variation of the size of the source by coherence parameter
Decreasing contrast with growing
Example: pinhole diameter Dph = Dairy / distance of pinholes D = 4Dairy
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Coherence Measurement with Young Experiment
Typical result of a double-slit experiment according to Young for an Excimer laser to
characterize the coherence
Decay of the contrast with slit distance: direct determination of the transverse coherence
length Lc
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Typical contrast decay of Young double slit setup
Significant difference between the two orientations x/y
Perpendicular to slit window of laser cavity: sinc-type behaviour
Good agreement between Young contrast and Wigner measurement
0
0.2
0.4
0.6
0.8
1
1.2
0 200 400 600 800 1000 1200
pinhole spacing
co
ntr
ast
Young-horizontal
Young_vertical
H-Gauss-fit after WDF
V-Gauss-fit after WDF
Excimer Laser: Laterale Coherence
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Temporal Coherence
t
U(t)
c
duration of a
single train
Damping of light emission:
wave train of finite length
Starting times of wave trains: statistical
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Axial Coherence Length of Lightsources
Light source
lc
Incandescent lamp
2.5 m
Hg-high pressure lamp, line 546 nm
20 m
Hg-low pressure lamp, line 546 nm
6 cm
Kr-isotope lamp, line at 606 nm
70 cm
HeNe - laser with L = 1 m - resonator
20 cm
HeNe - laser, longitudinal monomode stabilized
5 m
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Axial Coherence
Contrast of a 193 nm excimer laser for axial shear
Red line: Fourier transform of spectrum
contrast
0
0,1
0,2
0,3
0,4
0,5
0,6
0,7
0,8
0,9
1
-0,8 -0,6 -0,4 -0,2 0 0,2 0,4 0,6 0,8
z-shift
in mm
measured
FFT-Data
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Michelson-Interferometer
receiverfirst mirrorfrom
source
signal
beam
reference
beam
beam
splitter
second
mirror
moving
overlap
lc
z z
relative
moving
I(z)
wave trains
with finite
length
Michelson interferometer: interference of finite size wave trains
Contrast of interference pattern allows to measure the axial coherence length/time
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Young Experiment with broad Band Source
Realization with movable triple mirror
beam
splitter0
0,1
0,2
0,3
0,4
0,5
0,6
0,7
0,8
0,9
1
-400 -300 -200 -100 0 100 200 300 400
x
contrast
laser
reference
mirror
movable
triple mirror
detector
scan
x
contrast
curve
interferogram
x
y
I(x,y)
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Interferograms of Primary Aberrations
Spherical aberration 1
-1 -0.5 0 +0.5 +1
Defocussing in
Astigmatism 1
Coma 1
14
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Real Measured Interferogram
Problems in real world measurement:
Edge effects
Definition of boundary
Perturbation by coherent
stray light
Local surface error are not
well described by Zernike
expansion
Convolution with motion blur
Ref: B. Dörband
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Interferogram - Definition of Boundary
Critical definition of the interferogram boundary and the Zernike normalization
radius in reality
16
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Interferometry
Color fringes of a broadband interfergram
Ref: B. Dörband
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Interferogram
Example Interferogram of a plate with step
Ref.: H. Naumann
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Interferometric measurement with angles 0°and 90°
Layered structure confirmed
Interferometry 90°- Rotation of Sample
axial
50mm
shadow image
transverse
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Coherent Superposition of Perturbations
Twyman-Green interferometer
Coherent defects on sample surface
(scratches, dots,...)
Very sensitive amplitude superpostion
Problems in fringe evaluation
Strong dependence on size of source:
relaxed problem for partial coherence
due to finite source size
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
0 0.5 1 1.5 2 2.5 3 3.5
RM
S d
es D
iffe
renzf
eld
es [
nm
]
Lichtquellengröße [mm]size of lightsource in [mm]
rms of
field
difference
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Coherent Superposition of Perturbations
Coherent defects on sample surface
(scratches, dots,...)
Superposition creates error in phase
Optimization of source size to suppress perturbations
without creates too large errors of the signal
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Shearing Interferograms
Typical shearing interferograms
of some simple aberrations
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d
xz
2
Interpretation of Interferograms
xd
Distance between fringes: d
Bending of fringes: x
Relation of surface error z
accross diameter
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Typical Interferometer Output
Digital output
Ref: R. Kowarschik
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Intensity of fringes
I(x,y,t) intensity of fringes
V(x,y) contrast of pattern
W(x,y) phase function to be found
j(x,y,t) reference phase
Rs(x,y) multiplicative speckle noise
IR(x,y,t) additive noise
Tracing of fringes:
- time consuming method, interpolation, indexing of fringes, missing lines
Fourier method:
-wavelet method
- FFT Method
- gradient method
- fit of modal functions
Evaluation of Fringes
),,(),(),,(),(cos),(1),(),,( 0 tyxIyxRtyxyxWyxVyxItyxI RS j
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Interferometry
General description of the measurement quantity:
superpostion of spatially modulated signal and noise
Io: basic intensity, source
T: transmission of the system, including speckle
j: phase, to be found
IN: noise, sensor, electronics, digitization
Signal processing, SNR improvement:
- filtering
- background subtraction
Ref: W. Osten
0( , ) ( , ) ( , ) cos ( , ) ( , )NI x y I x y T x y x y I x yj
original signal
filtered signal
background
processed signal
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Interferometry
perfect interferogram
reduced contrast due
to background intensity
with speckle
with noise
Ref: W. Osten
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Basic configuration
Test surface rotated by 180°
Cats eye configuration
Calibration
plane
mirror
1. Basic configuration
2. Surface rotated by 180°
3. Cats eye position
surface
under test
condenser
1 Re( , ) ( , ) ( , ) 2 ( , )f KondW x y W x y W x y S x y
2 Re( , ) ( , ) ( , ) 2 ( , )f KondW x y W x y W x y S x y
3 Re
( , ) ( , )( , ) ( , )
2
Kond Kondf
W x y W x yW x y W x y
1 2 3 3
1( , ) ( , ) ( , ) ( , ) ( , )
4S x y W x y W x y W x y W x y
Absolute Calibration of Interferometer
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Fringe Evaluation
1. Fringe Tracking
2. Fourier-Transform Method
3. Spatial Phase Shifting
4. Phase Sampling Technique
5. Heterodyne Technique
6. Phase-Locking Method
7. Ellipse-Fitting Technique
Ref: R. Kowarschik
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Evaluation of Fringe Pattern
Ref: R. Kowarschik
Static Methods Dynamic Methods
Fringe Tracking Phase Shifting Methods
Fourier-Transform Heterodyne Technique
Spatial-Carrier Frequency Phase-Locking Method
Spatial Phase Shifting
+ Only 1 interferogram Very variable + No specific components Accuracy better /100
- Difficult to automatize Calibration
- Accuracy below /100 Additional components
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Evaluation of Fringe Pattern
Ref: R. Kowarschik
Static Methods Dynamic Methods
Fringe Tracking Phase Shifting Methods
Fourier-Transform Heterodyne Technique
Spatial-Carrier Frequency Phase-Locking Method
Spatial Phase Shifting
+ Only 1 interferogram Very variable + No specific components Accuracy better /100
- Difficult to automatize Calibration
- Accuracy below /100 Additional components
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Fringe Tracking for Fringe Evaluation
Ref: R. Kowarschik
Fringe Tracking (fringe skeletonizing)
- Intensity distribution 1. Identification of local extrema
2. Fringe sampling points for interpolation
- determination of points with integer or half-integer order of interference
- absolute order has to be identified additionally
- relatively low accuracy of phase measurements
Processing:
- improvement of SNR by spatial and temporal filtering
- creation of the skeleton (segmentation)
- Improvement of the skeleton shape
- numbering the fringes
- reconstruction of the phase by interpolation
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Fringe Tracking for Fringe Evaluation
Skeletonizing method
Ref: W. Osten
interferogram segmentation
improved
segment skeleton
phase map
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Method of carrier frequency
- tilt creates carrier frequency
- essential signal: deviation from linearity
Evaluation in frequency space:
carrier frequency eliminated by filtering of the Fourtier method
Carrier Method of Fringe Evaluation
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Fourier Method of Fringe Evaluation
Intensity in interferogram
Substitution
gives
Fourier transform
interpretation:
A: low frequencies, background
C, C* : same information
Filtering with bandpass:
elimination of A and C*:
Inverse Fourier transform
Pointwise calculation of phase
Unwrapping of the phase for 2
for a smooth surface
Ref: W. Osten
( , ) ( , ) ( , ) cos ( , )I x y a x y b x y x y
( , )1( , ) ( , )
2
i x yc x y b x y e
*( , ) ( , ) ( , ) ( , )I x y a x y c x y c x y
*J( , ) ( , ) ( , ) ( , )A C C
J( , ) ( , )C
( , )1( , ) ( , ) ( , ) ( , )
2
i x yI x y F J c x y b x y e
Im ( , )( , )
Re ( , )
c x yx y
c x y
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Fourier method:
- representation in frequency domain
- A: noise
- filtering of noise and asymmetrical contribution
Phase information
),(),(),(),( * vuCvuCvuAvuI
),(Re
),(Imarctan
yxC
yxCj
| I(u,v) |
spatial
frequency
u
A(u,v)
C (u,v)* C (u,v)
filter-
function
H(u,v)
Fourier Method of Fringe Evaluation
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Fourier Method of Fringe Evaluation
Fourier method
Ref: W. Osten
interferogram amplitude filtered amplitude
wrapped phase phase mapunwrapped phase
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Carrier Method of Fringe Evaluation
Ref: W. Osten
interferogram
interferogram
with carrier
amplitude
spectrum
spectrum filtered
and shifted
unwrapped
phaseunwrapped phase
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Carrier Method of Fringe Evaluation
Fourier spatial demodulation technique
Overlay of carrier frequency
Filtering of the spectrum: only one order
Inverse transform
Ref: G. Kaufmann
Interferogram Interferogram with carrier spectrum reconstructed phase
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40
Phase Sampling
Diversification
Various possibilities for changes
Ref: R. Kowarschik
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Phase shifting method TPMI
( temporal phase measuring interferometry )
- additional phase term a
- three different phases aj sequencially
measured (at least 3)
- elimination of phase values
background
contrast
- alternatively 4 frame method
- more phase values increase accuracy
aj ),(cos),(),(),( yxyxbyxayxI
3/2/13/2/1 cos aj baI
321231132
321231132
sinsinsin
coscoscosarctan
aaa
aaaj
IIIIII
IIIIII
2
3,,
2,0 4321
aa
aa
31
24arctanII
II
j
Phase Shifting Method of Fringe Evaluation
2 2
1 3 2 4
0
1
2C I I I I
I
1,4
1
4B j
j
I I
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Phase Shifting
Errors of phase shifting, calibration:
- Nonlinearities of the detector
- Modulo 2
- Other systematic errors
- non-ideal reference surfaces
- aberrations of optical elements
- diffraction, ghosts
- digitization
- air turbulence
- mechanical vibrations
- detector noise
- frequency shift
Ref: R. Kowarschik
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TPMI method variants
- 3-frame
- 4-frame
- 5-frame
Carre method:
- only phase differences essential
- higher accuracy
Comparison of accuracies:
larger number of frames is
more precise
PV-phase
error in
phase
error
a
0.05
10
in %
200-10-20
0.015-Frame
3- , 4-Frame
Carre
Phase Sifting Method
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Phase Shifting Method for Fringe Evaluation
Ref: W. Osten
I2(90)
unwrapped
phase
I4(270)
I3(180) I1(0)
wrapped phase
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Wave Aberrations in Optical Systems
Wave aberration in optical systems
Definition in exit pupil
Reference on chief ray and ideal sphere
Only for one object point and one wavelength
Raytrace into image plane
Backpropagation onto reference sphere
exit
aperture
phase front
reference
sphere
wave
aberration
pv-value
of wave
aberration
image
plane
y'p
x'p
yp
xp x'
y'
z
yo
xo
object plane:
one point
one wavelength
entrance pupil
equidistant gridexit pupil
transferred grid
image planeoptical
system
surface of equal phase:
reference sphere
wave aberration
reference point
raytraceback to reference sphere
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Zernike Polynomials
+ 6
+ 7
- 8
m = + 8
0 5 8764321n =
cosj
sinj
+ 5
+ 4
+ 3
+ 2
+ 1
0
- 1
- 2
- 3
- 4
- 5
- 6
- 7
Expansion of wave aberration surface into elementary functions / shapes
Zernike functions are defined in circular coordinates r, j
Ordering of the Zernike polynomials by indices:
n : radial
m : azimuthal, sin/cos
Mathematically orthonormal function on unit circle for a constant weighting function
Direct relation to primary aberration types
n
n
nm
m
nnm rZcrW ),(),( jj
01
0)(cos
0)(sin
)(),(
mfor
mform
mform
rRrZ m
n
m
n j
j
j
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Performance Description by Zernike Expansion
Vector of cj
linear sequence with runnin g index
Sorting by symmetry
0 1 2 3 4 -1 -2 -3 -4
-0.2
-0.1
0
0.1
0.2
0.3
0.4
0.5
circular
symmetric
m = 0cos terms
m > 0
sin terms
m < 0
cj
m
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Changes of z-distance changes Zernikes
Relevant applications: 1. Human eye, iris pupil not accessible 2. Microscopic lens, exit pupil not accessible
Possible solution to determine the exact pupil phase front: 1. Calculation of Zernike changes by numerical propagation 2. Pupil transfer relay optical system
For a phase preserving transfer, a well corrected 4f-system is necessary A simple one-lens imaging generates a quadratic phase in the image plane
Zernike Coefficients in Different z-Planes
48
chief
ray
exit
pupil
rear
stopobject
plane
pupil
retina
fovea
cornea
iris
optical disc
blind spotcrystalline lens
lens capsule
anterior
chamber
posterior
chamber
vitreous
humor
temporal
nasal
final
plane
starting
plane
f1
f1
f2
f2
d'd
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Conventional calculation of the
Zernikes:
equidistant grid in the entrance
pupil
Real systems:
Pupil aberrations and distorted
grid in the exit pupil
Deviating positions of phase
gives errors in the Zernike
calculation
Additional effect:
re-normalization of maximum
radius
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Zernike Calculation on distorted grids
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Zernike Expansion of Local Deviations
Small Gaussian bump in
the topology of a surface
Spectrum of coefficients
for the last case
model
error
N = 36 N = 64 N = 100 N = 144 N = 225 N = 324 N = 625
original
Rms = 0.0237 0.0193 0.0149 0.0109 0.00624 0.00322 0.00047
PV = 0.378 0.307 0.235 0.170 0.0954 0.0475 0.0063
0 100 200 300 400 500 6000
0.01
0.02
0.03
0.04
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Deviation in the radius of normalization of the pupil size:
1. wrong coefficients
2. mixing of lower orders during fit-calculation, symmetry-dependent
Example primary spherical aberration:
polynomial:
Stretching factor of the radius
New Zernike expansion on basis of r
166)( 24
9 Z
r
14
24
44
2
949
23
)(13
)(1
Z
rZrZZ
0.9 0.91 0.92 0.93 0.94 0.95 0.96 0.97 0.98 0.99 10
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
c4
c1
c9 / c
9
Zernike Coefficients for Wrong Normalization
51