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ANALYTICAL ATOMIC SPECTROSCOPY WITH THE INDUCTIVELY COUPLED PLASMA
R. S. HOUK
ICP BASICS
ICP ATOMIC EMISSION SPECTROMETRY
ICP MASS SPECTROMETRY
LASER ABLATION
2
RAFAEL FERNANDESU. MINNESOTA
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IE
ATOMIC SPECTROSCOPY
M 0
M*
(M +)0
(M +)* ATOMIC LEVELS
NO VIB - ROT SUBLEVELSSHARP LINESHIGH SELECTIVITY(+)
ONLY DETERMINE ELEMENTNOT COMPOUND (-)
AAAE
PRODUCE FREE ATOMSFROM SAMPLE ?EXCITE EMISSION (AE)
4
ATOMIZE & EXCITE SAMPLE
MX (aq) → MX (aq, aerosol) → MX (s, aerosol) → MX (g)
M 0 (g) + X (g)
M*
(M +)0
(M +)*
M 0(M +)0
ION LINESM (II)Higher E,shorter λ than I lines
ATOMLINES M (I)
Nebulization Desolvation
Vaporization
Atom’nIonization
Excitationabsorption
Emission
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5ICP
NORMAL ANALYTICAL ZONE (blue )
INITIAL RAD. ZONE (red)
INDUCTION REGION
OUTER GAS FLOW
AEROSOL GAS FLOW INTO AXIAL CHANNEL
LOADCOIL
TORCH
6
Yttrium Emission Zones
Y+ LinesYO Bands
Y Neutral Lines
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Diffraction Gratings
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Winge
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MANY VALENCE ELECTRONSMANY ENERGY LEVELSCOMPLEX EMISSION SPECTRA
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SAMPLER SKIMMER
IONLENS
ION SAMPLING FOR ICP-MS
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15
16AT SPOT USUALLY USED IN ICP-MS:
Just off tip of initial radiation zone
Tgas = 6000 K ntotal = P/RTgas = 1.5 x 1018 cm-3
mostly Ar
ne = n+ = 1 x 1015 cm-3
Flow velocity ~ 25 m/s
Residence time ~ 2 ms
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17DISSOCIATION
MO+ M+ + O Kd = (nM+ nO)/nMO+
∆H = D0 (MO+)
20.274 Z
z z log
M
M M log 1.5
T
D 5040 - T log 1.5 )(cm K log
MO
Oelec
Melec
MO
oM
gas
0gas
3-d
+′
+
+=
+
+
+
+
nM+ / nMO+ INCREASES AS:D0 <Tgas >nO <
18IONIZATION SAHA EQUATION
M M+ + e- K ion = nM+ ne/nM
∆H = IE (M)
15.684 z
z log
T
IE 5040 - T log 1.5 )(cm K log
Melec
Melec
ionion
3-ion
++
=
+
SIMILAR RELATIONSHIP FORM+ M 2+ + e-
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19IONIZATION IN ICP
T = 7500 K ne = 1 x 1015 cm-3
Y Zr Nb
La Ta
Ac
Co Cu Zn
B C N O F
He
Ne
Al Si P S Cl Ar
Ga Ge As Se Br Kr
Mo Tc Ru Rh Pd Ag Cd In Sn Sb Te I Xe
W Re Os Ir Pt Au Hg Tl Pb Po At Rn
Cr Mn Fe Ni
Hf Bi
Fr Ra
Ce Pr Nd Pm Sm Eu Gd Tb Dy Ho Er Tm Yb Lu
Th Pa U Np Pu Am Cm Bk Cf Es Fm Md No Lw
H
Li Be
Na
K Ca
Rb Sr
Cs Ba
VSc Ti
0.1
100 75
100 98Mg
100 100 99 99 98 95 96 93 91 90 75 90
98
98
98 94 93 93 8596
94 93 78 62 51 38 100
99 96 78 66 29 8.5
92
58 5 0.1 0.1 9e-4 6e-6
85 33 14 0.9 0.04
52 33 5 0.6
100
100
96,4
91,9
98
90,10
99,1
97,0.0196 95
96,2 90,10 99* 97,3 100* 93,7 99* 100*
100* 100*
99* 91,9 92,8
99 98
*These elements also make M+2
M+/(M+ + M) (%)
%M 2+
20
ICP + QUADRUPOLE MASS SPECTROMETER
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0
5000000
10000000
15000000
20000000
25000000
30000000
135 136 137 138 139 140 141 142 143 144
21
0
1E+09
2E+09
3E+09
4E+09
5E+09
6E+09
7E+09
8E+09
9E+09
135 136 137 138 139 140 141 142 143 144
140Ce+
8e6 c/s
138Ce+
2e4 c/s
0
20000000
40000000
60000000
80000000
100000000
120000000
140000000
160000000
180000000
150 151 152 153 154 155 156 157 158 159 160
140Ce16O+
1.3e5 c/s
140Ce2+
1.6e5 c/s
m/z RATIO
ION
SIG
NA
L10 ppb Ce
22ICP-MS CAPABILITIES
DETECTION LIMITS 0.1 - 10 ppt routine10 ppq SOME INSTS.USUALLY BLANK-LIMITED
TOTAL SOLUTES 0.1% USUALLY OK1% USUALLY PROBLEMSUNLESS USE FLOW INJECTION
PRECISION 3% RSD ROUTINE1% GOOD1% ROUTINE W. INT. STDS.
ACCURACY COMPARABLE TO PRECISION IFCOMPENSATE FOR INTERFERENCES
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23INTERFERENCES (REL. TO ICP-AES)
SPECTRAL LESS FREQUENTOVERLAP LESS SEVERE
MORE PREDICTABLEEASIER TO CORRECT
MATRIX WORSE ININTS. ICP-MS
- PLUGGING- CHANGE OF SIGNAL(usually loss)
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APPLICATION AREAS
1. ENVIRONMENTAL ANALYSISSTANDARD METHODS
2. GEOCHEMISTRYRARE EARTHSPROSPECTING, Pt GROUP ELEMENTSU-Th-Pb DATINGLASER ABLATION
3. SEMICONDUCTORSDIW, MINERAL ACIDSORGANIC SOLVENTSSURFACE LAYERS, VAPOR-PHASE DECOMP..
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Wafer Surface Preparation by VPDVapor Phase Decomposition
Wafer Surface Preparation by VPDVapor Phase Decomposition
• native oxide layer SiO2
• dissolve native oxide layer
• soluble contaminants in fluorosilicic acid
• integral wafer contamination can be collected in
one droplet
Si Wafer Analysis
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Wafer Preparation by VPD (1,2)Wafer Preparation by VPD (1,2)
Gaseous HF to SiO2 Deposition of HF(aq) film
a) b)
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Wafer Preparation by VPD (3,4)Wafer Preparation by VPD (3,4)
Etching of SiO2 Surface Scan for Collecting Contaminants
c) d)
28
Wafer Preparation by VPD Wafer Preparation by VPD
e) f)
adding scanning solutionand surface scan
ROLL AQUEOUS ACID DROPLETAROUND ETCHED SAMPLE SURFACE,COLLECT CONTAMINANTS
*Si SURFACE HYDROPHOBICACID DROPLET NOT DISPERSED OVER SURFACE!
TO NEBULIZER& ICP-MS
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APPLICATION AREAS
4. NUCLEAR INDUSTRYRADIONUCLIDESPURITY OF MATERIALS
5. BIOMEDICALFLUIDS & TISSUESMETALS IN PROTEINS & ENZYMES
6. FORENSICSMATCHING EVIDENCE BASED ON TRACE ELEMENT COMPOSITION
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Th SOLN 1000 ppmSUM OF 3 SPECTRA
Th SOLN.SUM OF 60 SPECTRA
BLANK
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SAMPLE INTROCONCENTRIC PNEUMATIC NEBULIZER
• 100% Teflon
• Self-aspiration:– 20 µL/min
– 50 µL/min
– 100 µL/min
– 400 µL/min
34ION EXTRACTION
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35COLOR SLIDES OF SAMPLER - SKIMMER REGIONCONDITIONS INSIDE SAMPLER
FLOW THROUGH SAMPLER = G 0 = 0.445 n0a0D02
a0 = speed of sound in source = (kTgas,0/m)1/2
D0 = orifice diam. n0 ~ P/RTgas
TYPICAL G 0 ~ 1021 atoms/s
DEBYE LENGTH = λD = (ε0kTe/e2ne)1/2
λD (cm) = 6.9 (Te/ne)1/2 Te in K ne in cm-3 (NEXT SLIDE)Te ~ 8000 K ne ~ 1015 cm-3
INSIDE SAMPLER λD ~ 10-4 mm << D0
SO PLASMA REMAINS QUASINEUTRALAS FLOWS THROUGH SAMPLER
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λD
Chen, Intro to Plasma Physics, 1984
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S. JET & SKIMMING PROCESS
Barrel shock
Skimmer
Directed flowin zone of silence
Collisions
ICPT ~ 6000 K
v (Ar)
IN JETT ~ 300 K
N(v)
N(v)
VELOCITY
VELOCITY
- 0 +
38
Sampler
Skimmer
Photo by A. L. Gray
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SAMPLERSKIMMER
ICP:Tion ~ 7000 KTgas~ 6000 K
AT SKIMMER:Tion ~ 7000 KTgas~ 155 KTIME ~ 3 µs ~250 colls with Ar
EXTRACTION PROCESSDouglas & French JAAS 1988
40CONDITIONS INSIDE SKIMMER TIP
FLOW THROUGH SKIMMER = G 1 = n(xs)v(xs)As
v = velocity ~ (5kT0/2m)1/2 As = area of skimmer
TYPICAL G 1 ~ 1 x 1019 atoms/s ~ 1% OF FLOW THROUGH SAMPLER
ALSO GOES THRU SKIMMER λD (cm) = 6.9 (Te/ne)1/2 ne NOW ~1012 cm-3
INSIDE SKIMMER λD ~ 10-2 mm << Ds
SO PLASMA ALSO REMAINS QUASINEUTRALAS FLOWS THROUGH SKIMMERALTHOUGH MAY BE SIGNIFICANT SHEATH INSIDE SKIMMER TIP
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42ION LENS
V1 V2
+
+
V1, V2 NOT DEP. ON m/z UNLESS:
- IE = f (m/z)-SPATIAL DIST. = f (m/z)
Equipotential contours
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43SIMION - EINZEL LENS
0 +110 0 volts
0 +140 0 volts
INITIAL ION KE= 200 eV
FOCAL POSITIONVARIES WITHAPPLIED VOLTAGE
44
EINZEL LENS
INITIAL KE=200 eV
230 eV
FOCAL POSITIONVARIES WITHINITIAL ION KE
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QUADRUPOLE MASS ANALYZER
y
x
U + V cos ωt
- (U + V cos ωt)
Thermo Elemental
BRUKER AURORA ELITE(now Analytik Jena)
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Quad lenses
Extraction lensesSkimmer
Sampler
Entranceslit
Magnet& flighttube
ESA
DetectorELEMENTSCANNING HIGH RESICP-MS DEVICE
ICP
Neb &Spray chamber
50
64Zn+
66Zn+
67Zn+
68Zn+
70Zn+
10 ppb ZnPFA 100
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Spectra
PEAK SHAPES LOW & HIGH RES.
52Photoresist Interferences on Cu
12C5H3+
12CH332S16O+
63Cu+
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MATRIX EFFECTOlivares & Houk, Anal. Chem 1986, 58, 20.
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56INTERNAL STANDARD
Co+
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57REMOVE POLYATOMIC IONS?
12C5H3+
12CH332S16O+
63Cu+
58GOOD IE BAD IE D 0GUYS/GALS (eV) GUYS (eV) (eV)S+ 10.36 O2
+ 12.063 6.663
Fe+ 7.87 ArO+ ~ 13 0.312ArN + ~14 1.866
Se+ 9.75 Ar2+ ~15 1.25
K+ 4.34 ArH+ ~10 4.00*
V+ 6.74 ClO+ 11.1 4.65
Ti + 6.82 SO+ 10.0 5.43
Zn+ 9.39 SO2+ 12.34
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BRUKER AURORA ELITE
ADD H2 &/or HeREMOVE
POLYATOMIC IONS?
60
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LASER ABLATION
Laser Ablation ICP-MS
CETAC LSX 500
Thermo Finnigan Elementwww.cetac.com
www.thermo.com
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Lasers
Laser Coherent Libra Cetac LSX-500
Lasing Medium Ti:Sapph Nd:YAG
Wavelength 800 nmTriple to 266 nm
1064 nmQuadruple to 266 nm
Pulse length ~100 fs ~6 ns
Repetition rate 1000 Hz 10 Hz
Pulse energy 0.20 mJ 9.0 mJ
Laser power ~76 W ~90 W
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65DEVELOPMENTS IN LASER ABLATION
GÜNTHER et al., ANAL. CHEM. 2003, 75, 341A; TrAC 2005, 24, 255.
UV LASERS (266 , 213, 193 nm)HOMOGENIZED BEAM PROFILEHELIUM TRANSPORT GAS
FRACTIONATION1. VARIATION OF SIGNAL RATIO vs TIME
AS DIG SINGLE PIT2. MEAS. SIGNAL RATIOS
DIFFER FROM THOSE IN SAMPLE
SOLUTIONS:FLAT BOTTOM CRATERSVERTICAL SIDESSHORT PULSE (fs) LASER(RUSSO et al., ANAL. CHEM. 2002, 74, 70A).
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Particles from Ablated Y2O3 Pellet
Track length →velocity ~ 27 m/s
70
Pressed pelletFernald soil blank
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COHERENT LIBRA100 fs 266 nm
72
fs LASER ns LASER
31 µm/s scan rate, NIST brass C1102
100 kHz Rep. Rate, ~ 50 µm spot size 20 Hz Rep. Rate, 50 µm spot size
0.0E+00
3.0E+05
6.0E+05
9.0E+05
1.2E+06
0 6 12 18
Time (s)
Sn
Sig
nal (
cps)
0.0E+00
6.0E+07
1.2E+08
1.8E+08
0 6 12 18
Time (s)
Zn S
igna
l (cp
s)
0.00E+00
6.00E+07
1.20E+08
1.80E+08
0 6 12 18
Time (s)
Zn S
igna
l (cp
s)
0.0E+00
3.0E+05
6.0E+05
9.0E+05
1.2E+06
0 6 12 18
Time (s)
Sn S
igna
l (cp
s)
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0.0 ms 0.1 ms 0.2 ms
0.3 ms 0.4 ms 0.5 ms
0.6 ms 0.7 ms 0.8 ms
fs argon 610
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CALIBRATE LASER ABLATION?
COMPENSATE FOR MATRIX DEPENDENCEOF ABLATION PROCESS
MATCHED STANDARDS
MEAS. ANALYTE REL. TO MINOR ISOTOPEOF ELEMENT AT KNOWN CONCENTRATION
CALIBRATE REL. TO SOLUTION AEROSOL?BECKER JAAS 2001, 16, 603-606.AESCHLIMAN JAAS 2003, 18, 872-877.
76
pump
CETAC LASER ABLATION SYSTEM TSI PIEZOBALANCE
FINNIGAN
ICP-MS
ESI NEBULIZER
Nd:YAG laser (266 nm)
camera
translation stage
argon inlet
zoom lens
impactorelectrostatic precipitator
calibration solution
waste90%
10%
20%
80%
ICP
ESA
magnet
argon inlet
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0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
0 100 200 300 400 500 600 700
Time (s)
Sig
nal (
coun
ts s-1
) / 1
06
60Ni+
51V+52Cr+
NIST STEEL
Solution
Ablatedsolid
NIST 612 Glass (13 Elements, 5 Replicates)• Particle transport from the LA cell was measured using a piezoelectric microbalance• Each replicate was generated by firing 50 laser shots per localized spot on the sample• A two-point calibration plot for each replicate was prepared and an average calculated• All elements were measured in medium resolution (R = m/∆m = 4000)
CONCENTRATION (ppm)MEASURED CERTIFIED Relative Diff. (%)
Mn (55Mn+) 40.8 ± 7.9 (39.6) 3.0Fe (56Fe+) 51.6 ± 6.1 51 1.2Co (59Co+) 36.0 ± 4.7 (35.5) 1.4Ni (60Ni+) 39.2 ± 4.7 38.8 1.0Cu (63Cu+) 38.5 ± 6.7 (37.7) 2.1Ba (138Ba+) 41.6 ± 5.5 (41) 1.5Nd (146Nd+) 36.2 ± 2.6 (36) 0.56Sm (147Sm+) 39.5 ± 4.7 (39) 1.3Eu (151Eu+) 36.5 ± 4.7 (36) 1.4Dy (161Dy+) 35.1 ± 2.5 (35) 0.29Er (166Er+) 39.3 ± 4.2 (39) 0.77Tl (205Tl+) 15.8 ± 1.6 (15.7) 0.64Pb (208Pb+) 39.2 ± 5.8 38.57 1.6
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79NIST 1264a Steel (8 Elements)• 266 nm QUAD. Nd:YAG LASER, CETAC LSX-100• AVG. 30 SPOTS, TWO-POINT STD. ADDNS.• 50 SHOTS PER SPOT, MED. RES.• PARTICLE TRANSPORT MEAS. WITH MICROBALANCE
CONCENTRATION (wt %)MEAS. CERT. (INFO)
V (51V+) 0.119± 0.029 0.106Cr (52Cr+) 0.073± 0.012 0.066Co (59Co+) 0.156± 0.017 0.150Ni (60Ni+) 0.143± 0.017 0.142Cu (63Cu+) 0.248± 0.040 0.250W (184W+) 0.107± 0.027 0.102Pb (208Pb+) 0.056± 0.055 0.024Bi (209Bi+) 0.0016± 0.0032 (0.0009)
80NIST 1264a Steel (8 Elements)• 193 nm ArF LASER• AVG. 3 SPOTS, TWO-POINT STD. ADDNS.• 50 SHOTS PER SPOT, MED. RES.• PARTICLE TRANSPORT MEAS. WITH MICROBALANCE
CONCENTRATION (wt %)MEAS. CERT. (INFO)
V (51V+) 0.115± 0.011 0.106Cr (52Cr+) 0.078± 0.036 0.066Co (59Co+) 0.137± 0.035 0.150Ni (60Ni+) 0.139± 0.108 0.142Cu (63Cu+) 0.277± 0.201 0.250W (184W+) 0.108± 0.013 0.102Pb (208Pb+) 0.021± 0.004 0.024Bi (209Bi+) 0.0006± 0.0001 (0.0009)
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81
82COLLISION CELLS
Rowan & Houk, Appl. Spectrosc. 1989, 43, 976.Douglas, Canad. J. Spectrosc. 1989, 34, 38.King & Harrison, Int. J. Mass Spectrom. Ion Processes1989, 89, 171.
Turner, Speakman et al., Plasma Source MS, Developments & Applications, Royal Society, 1997, p. 28.
Baranov & Tanner, JAAS 1999, 14, 1133JASMS 1999, 10, 1083.
USE COLLISION - INDUCED DISSOCIATION (CID) &/OR CHEMICAL REACTION TO REMOVE POLY. IONS
RETAIN ATOMIC ANALYTE IONSREDUCE KE & SPREAD OF KE OF M+ IONS
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83
ions from source
conversion of reactive ions
mass analysis of transmitted ions
ions to detector
isobaranalyteother m/z
reaction gas inreaction cellmass analyzer
DYNAMIC REACTION CELL (DRC)
84
0.05 0.15 0.25 0.35 0.45 0.55 0.65 0.75 0.85 0.95
CH4 FLOW RATE (L/min)
1
10
100
1000
1e4
1e5
1e6
1e7
m/z = 801 ppb Se80Se+ + CH4 → no rxn.
m/z = 781 ppb Se
m/z = 821 ppb Sem/z = 80 blank
40Ar2+ + CH4 → prods
m/z = 78 blank38Ar40Ar+ + CH4
→ products
REACTION PROFILES
m/z = 80 1 ppb Se40Ar2
+ + CH4 → products
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85
m/z = 75
ION
SIG
NA
L
1 ppb As750 c/s
1 ppb As+ 1000 ppm NaCl
1000 ppm NaCl25 c/s
DIW
DEATH TO ArCl + !
86
OCTOPOLE COLLISION CELL
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87KINETIC ENERGY DISCRIMINATION
COLL CELL LENGTH L = 10 cmGAS DENSITY n
ION HAS CROSS SECTION Ω (cm2)
NUMBER OF COLLISIONS = L/ λ = L n Ωλ = mean free path (cm)
EXPECT ~ 5 TO 10 COLLISIONS
POLY ION IS LARGERLARGER ΩMORE COLLISIONS IN SAME LENGTH L
88
( )
( ) He with ArO and Fe of collfor 0.88 56 4
56 4~
m m
m m ~ collper remaining KE ofFraction
TIONDISCRIMINA KE & LOSSES KE
2
22
2iongas coll
2ion
2gas coll
++=++
++
=
α
α
SAY Fe+ HAS 5 COLLS ArO + HAS 10 COLLS
Fe+ HAS α5 = 0.885 = 0.52 OF INITIAL KE REMAINING ArO + HAS α10 = 0.8810 = 0.28 OF INITIAL KE
Covey & Douglas JASMS 1993 p 616
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89
0
100
200
300
400
500
600
00.4
0.8
1.2
1.6 2
Analyte
Interferent
KE
N
KINETIC ENERGY DISCRIMINATION
NO COLL. GAS
90
0
100
200
300
400
500
600
00.4
0.8
1.2
1.6 2
Analyte
Interferent
KE
N
POLY. ION HAS LARGER CROSS SECTION FOR KE LOSS
POTENTIAL BARRIERON QUADRUPOLESTOPS POLY. IONS
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91
Unspiked 5% HNO3 + 5% HCl + 1% H2SO4 + 1% IPA Matrix
2E5cps
92
All polyatomic interferences are removed in He Mode
Unspiked 5% HNO3 + 5% HCl + 1% H2SO4 + 1% IPA MatrixALL polyatomic interferences are removed in He Mode (same cell conditions)
2E5cps
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93
94
Gillson, Tanner, Douglas
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95
Co+
Trajectories
80% Ar+
20% O+
80% Ar+
19% O+
1% U+
96IONS IN ARGON FLOW
ICP
SAMPLER
SKIMMER
SHOCK WAVES
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97IONS ENTRAINED IN Ar FLOWACCELERATED TO SAME VELOCITY AS Ar
AVG. KE OF Ar = AVG. KE IN ICP = 2.5 kT gas
= 0.5 mArvAr2
ALL IONS (i) ACHIEVE SAME VELOCITYvi = vAr
KE i = 0.5 mivi2
IONS OF DIFFERENT MASSHAVE DIFFERENT KINETIC ENERGIES
98ION ENERGY MEASUREMENTSTOPPING POTENTIAL ON QUAD
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99
ION ENERGY vs m/zM
AX
. IO
N K
E (
eV)
m/z
100Winge, ICP-AES, An Atlas of Spectral Lines
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101
STRONGEST LINES FROM GIVEN ELEMENT?
1. DOMINANT IONIZATION STAGE (neutral atom or +1 ion)
2. RESONANCE LINES (involve ground state) (esp. absorption!)
3. UPPER LEVEL CORRESPONDS TO LOWEST ENERGY ALLOWED TRANSITIONTO GROUND STATE
Some elements only a few strong lines (Ca, Mg)Other elements many lines (Fe, U)
102
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103
PARTICLE SIZE EFFECTS IN LASER ABLATION
GÜNTHER & GUILLONGJAAS 2002, 17, 831
AESCHLIMAN et al.JAAS 2003, 18, 1008
104SINGLE SPOT ABLATION
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105
106
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107
108
Calibration of LA-ICP-MS with Dried Solution Aerosols
• Simultaneous introduction of particles from a LA cell and desolvated aerosol particles from a micro-flow nebulizer
Stotal = Ssolid + Ssolution
= RX,solid TLAt[X] solid + RX,soln VTneb[X] soln
RX isotope-specific response factor (signal/ng X)TLA transport from LA cell (ng solid/s)t time of ablation transient (s)[X] solid concentration of isotope in solid (ng X/ng solid)V volume of solution injected to ICP (L)Tneb nebulizer efficiency[X] soln isotopic concentration in solution standard (ng X/L)
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109SPACE CHARGE EFFECTS
OLIVARES & HOUK, ANAL. CHEM. 1985, 57, 2674.
GILLSON et al, ANAL. CHEM. 1988, 60, 1472.
TANNER, SPECTROCHIM. ACTA B 1992, 47B, 809.
PLASMA SOURCE MASS SPECTROMETRY, DEVELOPMENTS & APPLICATIONS, Holland & Tanner, Eds., Royal Society, Cambridge, 1997.
110EXPECT SPACE CHARGE PROBLEM WHEN:
Imax (µA) > 0.9(z/m)1/2(D/L)2V3/2
Imax is current of major bkg. ions
m/z rel. to 12C = 12 V in volts
FOR ICP-MS
Imax ~ 0.4 µA
Actual Imax ~ 1019 atoms/s (nions/natoms)
~ 1019 (1015/1018) ~ 1.5 mA !!
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111EINZEL LENS – EFFECT OF SPACE CHARGE
BEAMCURRENT
0
1 µA
112
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113OVERALL EFFICIENCY
1e5 ATOMSINTO ICP
1e5 IONSINTO SAMPLER
1e3 IONSTHRU SKIMMER
1 IONTO DETECTOR!
114
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115
MATRIX EFFECTS
116
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117DVS CY-TOFICP-TOFMS
118SURFACE MARKERS IN LEUKEMIA CELL LINES
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119
120
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1211 ppb V, Cr, Mn, Ni, Co, Cu, Zn, As500 ppm each C, Na, S, Cl, Ca
122ION EXTRACTION
FUNDAMENTAL ASPECTS OF ION EXTRACTION IN ICP-MSHOUK & NIU, SPECTROCHIM. ACTA B 1996, 51, 779.
GAS DYNAMICS OF THE ICP-MS INTERFACEDOUGLAS & FRENCH, JAAS 1988, 3, 743.
IMPROVED INTERFACE FOR ICP-MSDOUGLAS & FRENCH, SPECTROCHIM. ACTA B 1986, 41, 197.
ION EXTRACTION IN ICP-MSOLIVARES & HOUK, ANAL. CHEM. 1985, 57, 2674.
CHAP. IN MONTASER ICP-MS BOOK
RECENT PAPERS BY PAUL FARNSWORTHBRIGHAM YOUNG UNIV.
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124