ISO 9001/14001 and VCA** approved
Tools and machinery listManufacturing
Brand/description Type Dimensions work piece [mm]
CNC Turning
Boehringer DUS 560 ti-2000 520 x 2000
Montforts KNC-5 450 x 1500
Montforts RNC-3 180 x 500
Schaublin 125 CCN 200 x 450
CNC Milling
Mikron VCE 1600 4-axis 1625 x 812 x 762
Mikron UCP 710 5-axis 710 x 650 x 500 x 360º (-30º +120º)
Deckel FP4NC T-500 4-axis 500 x 500 x 400 x 360º
Mikron VCP 600 600 x 400 x 350
Fehlmann PicoMax 54 3-axis 500 x 260 x 490
Wire Cut Electro Discharge Machining
Charmiles Robofil 310 250 x 400 x 400
Die-sinking Electro Discharge Machining
Agie Agietron Innovation II 350 x 250 x 350
Grinding
Studer S20-2 400 mm b.c.* and 100 mm c.h.**
Studer S30 700 mm b.c. and 125 mm c.h.
Jung JF520 MS NC 600 x 200 x 240
Jung JA600 CNC-E 600 x 250 x 240
Jung JP800 CNC A 800 x 500 x 500 max. 700 kg
Moor jig grinder 450 CPR - CNC 458 x 280 x 350 mm
Laser machining
Baasel BLS610 YAG-marking/engraving laser 150 x 150
Lasag kls 246-102 (040+046) YAG-cutting laser 600 x 400 x 300
Lasag sls 200C60 YAG-welding laser 600 x 400 x 300
Haas YAG-welding laser 400 x 600
Geometrical control
Mitutoyo Bright Strato 3D Measuring machine 1600 x 1000 x 600 mmE=1,7+3L/1000 µm
Talyrond 100 Roundness tester
Mahr Perthometerconcept Contour meter
Perthen PRK
Pertometerconcept Roughness meter
Rodenstock RM600-3D Optical roughness and contour meter
Mitutoyo Laserscan micrometer
ULM 01-600 C Universal length measuring machine 600 mm
Hewlett Packet Laser interferometer
* b.c. = between centers** c.h. = center height
ISO 9001/14001 and VCA** approved
Brand/description Type Work area
Pelt&Hooykaas Surface plate granite/00 2500 x 1250
Mahr Digimar DX1 Height gauge 600 mm
Zeiss Measuring microscope
Heat treatments
Vacuum or controlled Hethrington oven Vacuum: down to 10-5barsatmosphere Controlled atmosphere: Nitrogen,
Hydrogen, Helium, Argon, Argon/Hydrogen.Temperature: up to 1600°C(short time)Cold wall oven, suitable forhardening air hardening materials
Coating facilities
Electrical Wire spraying OSU-G30/2 SF-LD/42 Metallic and cermet coatings,applied using wire feedstockHigh deposition ratesØ 1,6mm, 3-6 kg/uur/100 Amp
Atmospheric Plasma Sulzer Metco MB9 Spraying of metallic, cermets andSpraying (APS) ceramic materials
High Velocity Oxygen Fuel Top Gun 2nd generation HVOF system.(HVOF) Metallic, cermets and some ceramic
materials
High Pressure High Tafa JP5000 Metallic and cermet materialsVelocity Oxygen Fuel(HP-HVOF)
Micro Plasma Spraying (MPS) Own development Metallic, cermets and ceramicmaterials.Local application of due to smallspot size down to 2 mm
EngineeringBrand/description Type Application
CoCreate One Space Modeler (7x) 3D CAD
Database Management Model ManagerSystem
ANSYS ANSYS Mechanical FEM
AutoDesk Acad (5x)
Bentley Autoplant P&ID
MathSoft MathCad Modelling
Norbert Schmitz SF Pressure Drop
CODECALC PED Calculation ASME VIII
Process Systems EngineeringBrand/description Type Application
MathWorks Matlab, Simulink, Control System,Real Time Workshop, Simulink control,Stateflow, SF coder,xPC, xPC embedded,Matlab Optimization, Matlab PDE,Matlab Statistics
Aspen Tech Aspen Plus, Aspen Dynamics, AspenCustom Modeler.
Comsol Multiphysics (voorheen Femlab),incl. Chemical Engineering Module,Control Script
ISO 9001/14001 and VCA** approved
Materials characterisation and consultancyBrand/description Type Application
Microscopy
Field Emission Gun- JEOL 6330F Magnification up to x250.000Scanning Electron Lateral resolution (practical): 5 nmMicroscope (FEG-SEM) High signal/noise ratio at 0.5keV,
low electrical conductive materialscan be analysed without pre-coating
Element analyses by Energy Noran Vantage Quantative Element analyses with anDispersive X-ray analyses accuracy of ±0.5wt% starting at
sodium (Na) Qualitative Elementanalyses down to Boor (B)Automated analyses and particlerecognitionParticles to be analysed can bedown to 1µm3 in size
Atomic Force Microscopy Nanoscope III Full contact mode(AFM) Horizontal and Lateral resolution
down to 2 nm
Optical macroscope Wild M3Z Magnification up to X64
Optical microscope Leica MeF-4 Magnification up to X1500Bright fieldDark fieldNomarski interference contrastPolarised light
Image analyses and storage SIS Image storageImage analysesCoupled to optical macroscopeand microscope
Mechanical testing
Tensile testing Comprision Instron 4501-series 9 Up to 100kN loadInstron 4502-series 9 Three and four point bendingInstron 4505-series 9 Room temperature
(access to test load up to 2500kN)
Rotating fatigue Wöhler machine Room temperature fatigue testing onstandard test pieces. Testing ofmaterials and coatings
Hardness measurements Frank-Finotest 38542 Macro-Vickers, up to 30kg loadLeica-Durimet Brinell, 1mm ball up to 30kg
Micro-Vickers, down to 0.05gKnoop hardness
Residual stress Hole Drillingmeasurements
Physical characterisation
Partical size analyes Malvern Mastersizer 2000 Particle sizes 20nm to 2mmStatic light scattering
Pore size analyses Mercury Micromeritics-Autopore II Up to 150 µmmethod
Pore size analyes-gas Coulter Omnisorb Down to 0.3 nmabsorption
Determination of specific BET-Sorbty 1750surface area Coulter Omnisorb
Dilatometry (thermal Netzsch-DIL402 C/4/G Temperature: up to 1650°Cexpension coefficient Atmospheres: standard: air, helium,determination) Ar/5%H2, oxygen. Other
atmospheres on requestRate Controlled Sintering softwareAccuracy: 1.25 nm over 25 mmmeasuring length
ISO 9001/14001 and VCA** approved
Brand/description Type Application
Simultaneous Thermal Netzsch STA409C DTA/TG (Differential ThermalAnalyses (STA) Analyes/Thermographimetry) up tot
1650°CAtmospheres: standard: air, helium,Ar/5%H2, oxygen
Brand/description Type Dimensions workpiece [mm]
Preparation facilities
Grinding Struers Knuth rotor 2 SiC grinding paper grit P150-P4000
Polishing Struers-Pedemax-2 6 samples at a time, maximum,different sizes possible
Struers-PdM-Force 6 samples, standard size up to25mm diameter
Struers-Rotopol 3 + Rotoforce-4 6 samples, standard size up to25mm diameter
Embedding Struers embedding press 25 mm samples
Struers embedding press 12,5 mm samples
UV-hardening-Kulzer variable sample size
Cold embedding masses Variable sample size, 24h curingat roomtemperature
Cutting Struers Discotom-2 For cutting metallic, ceramic andplastic samples
Struers Accutom 5 Precision cutting, µm precision
Brand/description Type Application
Non-destructive analyses
Non-destructive Grindo Sonic Homogeneous metalic and ceramicdetermination of E-module materials
Room temperature
Determination of ferrite content Fischer Ferritescope-EN8D2-FE Ferrite content up to 100% ferriteFischer Ferritescope-MP3-GAB1.3 FED Can be modified for layer thickness
measurements
Materials TestingBrand/description Application Measurement
ICP-AES (Spectro, Vista) Q Solid fuels, ash, sludge, biomass, water Al As B Ba Ca Cd Co Cr Cu Fe K Lisamples, eluates Mg Mn Mo Na Ni P Pb S Sb Se Si
Sn Sr Ti V Zn
ICP-AES, (Spectro, Vista) Q Waste water Al As B Ba Ca Cd Co Cr Cu Fe K LiMg Mn Mo Na Ni P Pb S Sb Se SiSn Sr Ti V Zn
ICP-AES, (Spectro, Vista) Q Catalysts, fuel cel components, solar On requestcel products, nuclear products
Hydride AFS QSolid fuels, ash, sludge, biomass, water As Se Sb
samples, eluatesCV-AFS Q Hg
Proximate Solid fossil fuels, solid biofuels, solid Ash, moisture, volatile
recovered fuels, sludges, biomassCaloric value Q UHV LHV
Biomass content by SRF, waste products, liquid fuels % Biogenic14C method
Titrimetry Q Rainwater Alkalinity
Membrane diffusion Rain water samples, eluates Ammonia Kjeldahl N
Fotometry Q (Dr. Lange) Water samples, eluates, samples COD
Ionchromatography from gasifiers Cl NO3 SO4 Br Q
(Dionex, Metrohm)
Flow Injection Analysis F, CN
ISO 9001/14001 and VCA** approved
Brand/description Application Measurement
Element analyser Fossil fuels, biofuels, solid recovered C H N O(Interscience) Q fuelsorganic compounds
Titrimetry (Metrohm) Fuel cell components, catalysts, High precision elementnuclear products determination
EOX analyser, coulometry Q Waste water Non-volatile halogen compounds
Coulometry Q Solid fuels Halogen content (Cl Br I)
TOC analyser (Shimadzu) Waste water Organic and inorganic carbon
HPLC (DAD FLD) (Agilent) Air, soil, water 16 PAH EPA
GC-FID (GC-MS) Tar extracts 16 PAH EPA and 19 other common(Shimadzu, Interscience) Q tar compounds
Micro-GC Syngas, biogas, emission, proces gas H2 N2 O2 CO CO2 CH4 H2S COSNDIR spectroscopy CO CO2 CH4 N2OChemolumniscence NOx
Physical characterisation
Partical size analyes Malvern Mastersizer 2000 Particle sizes 20nm to 2mmStatic light scattering
Pore size analyses Micromeritics-Autopore II Up to 150 µmMercury method
Pore size analyes-gas Coulter Omnisorb Down to 0.3 nmabsorption
Determination of specific BET-Sorbty 1750surface area Coulter Omnisorb
Dilatometry (thermal Netzsch-DIL402 C/4/G Temperature: up to 1650°Cexpension coefficient Atmospheres: standard: air, helium,determination) Ar/5%H2, oxygen. Other
atmospheres on requestRate Controlled Sintering softwareAccuracy: 1.25 nm over 25 mmmeasuring length
Simultaneous Thermal Netzsch STA409C DTA/TG (Differential ThermalAnalyses (STA) Analyes/Thermographimetry) up tot
1650°CAtmospheres: standard: air, helium,Ar/5%H2, oxygen
Software & Electrical EngineeringBrand/description Type Application
Compilers
Microsoft Visual Studio 2003, .NET C#
Microsoft Visual Studio 2003, C, VB
Microsoft Windows CE V5.0, C++
Borland Delphi
GNU gcc 3.3.5
Libraries
ComponentOne ComponentOne Studio ASP.NET Charts/graphs
Web development
Apache Apache 2.0/54
TYPO3 TYPO3 Content Management Systeem3.8.0
Q. = ISO 17025 approved
ISO 9001/14001 and VCA** approved
Brand/description Type Application
Databases
Microsoft SQL-server
MySQL AB MySQL 4.0.24
PostgreSQL PostgreSQL 7.4
Proces control development
Exeda Wizcon SCADA Process control
National Instruments Labview Data-acquisition & control
Beckhoff TwinCat SoftPLC Process control
Embedded system tools
Echelon Lonbuilder C
MicroChip PIC processors C
Keil GMBH Intel 8051-series C
Microsoft Embedded XP
Microsoft Platform Builder Windows CE
Altera FPGA’s VHDL/schematic design
Modeling
MathWorks Matlab, SimulinkAspen
Documentation
Adobe Photoshop
Adobe Acrobat 6.0
GNU gimp 2.2.6 Image manipulationLATEX 2å Desktop publishing
Power Quality Measurement
Harmonic analyser PM 300 Voltech Residual mains / grid utility
Power monitor Nanovip Distribution stations & cabinets400….750VAC @ 200….1000A.
Power and Energy datalogger MFT 300 Distribution cabinetsUp to 12 fields yielding400….750VAC @ 100A.
Memory oscilloscoop Tektronix TDS 3014 DC BushbarsTektronix 2221A Power convertorsTektronix 2225 Rectifiers
Power transformersWideband Current Tektronix AM503BProbes + Amplifier Tektronix A6302
Tektronix A6303
3x Differential Probes Tektronix P5200 Grid coupled 3-phase measurements
Instrumentation
Calibration of field Burster signal conversion Transducers: flow, pressure, force,instruments generator/calibrator temperature, humidity, conductivity,
Digistant 4421 volts, amps, power etc.
Knick Voltage source 14621
Knick Voltage reference 273591
Trending & signal monitoring Hydra datalogger 2620A Transducer outputsHewlett Packard 34970ADatalogger & Software
b-0
5-0
55
Energieonderzoek Centrum NederlandEngineering & ServicesPostbus 11755 ZG Petten
Tel.: 0224 - 564661Fax: 0224 - 568407www.ecn.nl/[email protected]
Brand/description Type Application
Insulation testing
Inspection & test of electric PAD tester Nieaff Smitt Electric tools: household & industrialequipment acc. to NEN 3140 according to NEN-EN 3140
Earth & circuit tester Combitester Gossen M5020 Grid utility & experimentalapplications
Power performance tests
Power source/sinking Digatron EVT 350-300 DUT 0-300V @ 350A bidirectional
Power source/sinking Digatron EVT 410-540 DUT 10- 540V @ 400A bidirectional
Power supply Delta SMD 30-100 DUT 0-30V @ 100A unidirectional
Power supply Delta SMD 30-10 DUT 0-30V @ 10A unidirectional
Power supply Delta SMD 70-20 DUT 0- 70V @ 20A unidirectional
Power supply Delta SMD 120-4x25 (1)master @ (3)slaves DUT 0- 120V @ 100A unidirectional
Power supply Delta E300-0.1-L DUT 0- 300V @ 0,1A unidirectional
Computer & Communication Testing
CPU and periferie testing Logic analyser Computer equipment
Testing physical link layer RS232 Data analyser Communications, protocol
Hardware
Sweep generator Hewlett Packard 2849-G07566 Laboratory test: EUT & DUT
Scope Hewlett Packard 54645D Idem
Digital Multimeter Fluke 87 III Idem
Digital Multimeter Keithley 0626177 Idem
Digital Multimeter Keithley 2000
Frequency counter Hewlett Packard 3416A Idem
Frequency counter Hewlett Packard 53131A (1Ghz) Idem
Arbritary Waveform Generator Hewlett Packard 33120A Idem