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BEGeBEGe Detector studies updateDetector studies update
Performance and analysisPerformance and analysis
DušanDušan BudjášBudjáš • • StefanStefan Schönert • Schönert • Mikael Hult*Mikael Hult*
MPI für Kernphysik • MPI für Kernphysik • HeidelbergHeidelberg* IRMM • Geel* IRMM • Geel
MMAXAX--PPLANCKLANCK--IINSTITUTNSTITUT
FFÜÜR R KKERNPHYSIKERNPHYSIK
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OutlineOutline
1.1. BEGe publicationBEGe publication
2.2. BEGe pulseBEGe pulse--shape discrimination methodshape discrimination method
3.3. Update on recent resultsUpdate on recent results
4.4. Summary/OutlookSummary/Outlook
2
Dušan BudjášDušan BudjášDušan Budjáš
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3
BEGe publicationBEGe publicationMPIK HeidelbergMPIK HeidelbergMPIK HeidelbergDušan BudjášDušan BudjášDušan Budjáš
� submitted to JINST
� accepted for publication after some minor corrections
� ArXiv: 0909.4044 [nucl-ex]
� Contents:• charge collection
performance and stability
• PSD method and its calibration
• validation via coincident SCS and collimated 2.6 MeV beam
• experimental PSD results
� also: proceedings from CIPANP 2009 (4 pages, submitted to AIP)
� previously: IEEE 2008 proceedings arXiv: 0812.1735v1[nucl-ex]
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0
0.2
0.4
0.6
0.8
1
0 0.2 0.4 0.6 0.8 1
distance from the read-out electrode, x [cm]
W
0
2
4
6
8
10
12
14
16
|Ew| [c
m-1
]
W(x)
|Ew(x)|
0
0.2
0.4
0.6
0.8
1
0.5 1 1.5 2 2.5 3 3.5 4
r [cm]
W
0
0.1
0.2
0.3
0.4
0.5
|Ew| [c
m-1
]
W(r)
|Ew(r)|
4
MPIK HeidelbergMPIK HeidelbergMPIK HeidelbergDušan BudjášDušan BudjášDušan Budjáš
BEGe pulse shape discrimination methodBEGe pulse shape discrimination method
BEGe (hypothetical)
True coaxial
( ) ( ) ( ) vtxEqvtxEqtI h
W
he
W
e ⋅⋅+⋅⋅−= )()(
ee−−
hh++
+HV
read-out
Ramo's theorem ⇒
ref: Knoll
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0
0.2
0.4
0.6
0.8
1
0 0.2 0.4 0.6 0.8 1
distance from the read-out electrode, x [cm]
W
0
2
4
6
8
10
12
14
16
|Ew| [c
m-1
]
W(x)
|Ew(x)|
5
MPIK HeidelbergMPIK HeidelbergMPIK HeidelbergDušan BudjášDušan BudjášDušan Budjáš
BEGe pulse shape discrimination methodBEGe pulse shape discrimination method
BEGe (hypothetical)
( ) ( ) ( ) vtxEqvtxEqtI h
W
he
W
e ⋅⋅+⋅⋅−= )()(
-1000 -500 0 500 1000 1500 20000
200
400
600
800
Time after trigger [ns]
Am
plit
ud
e [a.u
.]
Interaction point distance from read-out electrode [mm]:
0
0.03
0.06
0.09
0.12
0.15
0.18
0 10 20 30 40 50 60 70 80 90 100
Time [ns]
Cu
rre
nt [a
. u
.]
0.4 1 2.5 4.5 6.5 8.2 9.7
ee−−
hh++
+HV
read-out
Ramo's theorem ⇒
simplified 1-dimensional calculation real recorded signal
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0
0.2
0.4
0.6
0.8
1
0 0.2 0.4 0.6 0.8 1
distance from the read-out electrode, x [cm]
W
0
2
4
6
8
10
12
14
16
|Ew| [c
m-1
]
W(x)
|Ew(x)|
6
MPIK HeidelbergMPIK HeidelbergMPIK HeidelbergDušan BudjášDušan BudjášDušan Budjáš
BEGe pulse shape discrimination methodBEGe pulse shape discrimination method
BEGe (hypothetical)
( ) ( ) ( ) vtxEqvtxEqtI h
W
he
W
e ⋅⋅+⋅⋅−= )()(
-1000 -500 0 500 1000 1500 20000
200
400
600
800
Time after trigger [ns]
Am
plit
ud
e [a.u
.]
0
0.02
0.04
0.06
0.08
0.1
0.12
0.14
0.16
0 10 20 30 40 50 60 70 80 90 100
Time [ns]
Cu
rre
nt [a
. u
.]
single site
multi site
energy normalised ~equal event energy
A A
ee−−
hh++
+HV
read-out
Ramo's theorem ⇒
simplified 1-dimensional calculation real recorded signal
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MPIK HeidelbergMPIK HeidelbergMPIK HeidelbergDušan BudjášDušan BudjášDušan Budjáš
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PSD parameter distributionPSD parameter distribution
DEP events accepted
rejected
SSE band
MSE regionFEP
1620.7 keV
FEP
2614.5 keVSEP
FEP
1620.7 keV
DEP
1592.5 keVSEP
2103.5 keV
FEP
2614.5 keV
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1400 1500 1600 1700 1800 1900 2000 2100 2200 2300
0.33
0.333
0.336
0.339
Energy [keV]
m
fitted curve
1400 1500 1600 1700 1800 1900 2000 2100 2200 2300
-5
-2.5
0
2.5
5x 10
-4
Energy [keV]
fit re
sid
uals
<A
/E>
SS
E
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MPIK HeidelbergMPIK HeidelbergMPIK HeidelbergDušan BudjášDušan BudjášDušan Budjáš
PSD calibrationPSD calibration
Compton 1425 ± 25 keV
Compton 2245 ± 25 keV
DEP ± 1 σ
exponential tail
Gaussian
fit function
A/E [a.u.]
Nu
mber
of
cou
nts
<A
/E>
SS
E
DEPMSE
SSE
228Th
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1400 1500 1600 1700 1800 1900 2000 2100 2200 2300
0.33
0.333
0.336
0.339
Energy [keV]
m
fitted curve
1400 1500 1600 1700 1800 1900 2000 2100 2200 2300
-5
-2.5
0
2.5
5x 10
-4
Energy [keV]
fit re
sid
uals
<A
/E>
SS
E
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MPIK HeidelbergMPIK HeidelbergMPIK HeidelbergDušan BudjášDušan BudjášDušan Budjáš
PSD calibrationPSD calibration
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PSD calibrationPSD calibration
Assuming gaussian distribution (resolution dominated by noise):2 σ ⇒ 97.7% SSE acceptancearbitrary choice of "SSE identification probability"
SSE defined as events with charge cluster extent so small that the electric field doesn't change significantly across it's width
2 σ
228Th
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Updated experimental results Updated experimental results
� cut at 2 σ from the SSE band mean
� simplified MC estimation of 0νββ acceptance: (89.4 ± 1.4)%
γ-lines
CC = Compton continuum (2039 ± 35 keV)
100%
10%
1%
0.1%
0νββ
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PSD validation via coincident singlePSD validation via coincident single--Compton scatteringCompton scattering
SCS
⇒ double-escape peak (DEP) is a good representation of ββ events
⇒ validated our PSD calibration using DEP and Compton continuum events
A/E parameter histograms:
no effect ofevent topologyor spatial distribution
corrected forenergy depen-dence from Compton cont.
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SSE line
MSE region
102
101.5
101
100.5
accepted
rejected
SSE band near-electrode events
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PSD performance in dependence on spatial event distribution PSD performance in dependence on spatial event distribution
ee−−
hh++
Interaction point distance from read-out electrode [mm]:
0
0.03
0.06
0.09
0.12
0.15
0.18
0 10 20 30 40 50 60 70 80 90 100
Time [ns]
Cu
rre
nt [a
. u
.]
0.4 1 2.5 4.5 6.5 8.2 9.7
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acceptance: DEP 1621 keV
uncollimated: 89% 10%
collimated (centre): 88% 23%
DEP
amplified current amplitude A
reject accept
228Th source
ee−−
hh++
∅ 6 mm collimated beam
PSD performance in dependence on spatial event distribution PSD performance in dependence on spatial event distribution
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0%
5%
10%
15%
20%
25%
30%
35%
0 5 10 15 20
Collimator distance from centre [mm]
Fra
ction o
f events
above S
SE
band
.
4000V 3s
4250V 3s
4500V 3s
3750V 3s
15
HV dependence of PSD performanceHV dependence of PSD performanceMPIK HeidelbergMPIK HeidelbergMPIK HeidelbergDušan BudjášDušan BudjášDušan Budjáš
< 3% of total volume PSD ineffectiveComplementary PSD techniques effectivealso in this region (e.g. rise-time based)
� the extent of the insensitive region grows with HV
ee−−
hh++
electrode extent
beam size
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� PSD tested on ∅ 6 cm BEGe (at IRMM Geel, Belgium)
� results: SEP survival 9.2% (∅ 8 cm: 7.1%)FEP survival 13.5% (∅ 8 cm: 10.2%)at 89% DEP acceptance
8000
7000
6000
5000
4000
3000
2000
1000
01560 1580 1600 1620 1640
232-Th spectrum
after 2 σ PSD cut
γ 1588 keV DEP
γ 1621 keV
16
PSD performance in dependence on crystal sizePSD performance in dependence on crystal size
MPIK HeidelbergMPIK HeidelbergMPIK HeidelbergDušan BudjášDušan BudjášDušan Budjáš
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1%
10%
100%
1500 1700 1900 2100 2300 2500 2700
Energy [keV]
surv
iva
l pro
bab
ility
228-Th with MPIK BEGe (8 cm); 3.8 kV
232-Th with IRMM BEGe (6 cm); 3.5 kV
232-Th with IRMM BEGe (6 cm); 3.1 kV
DEP
γ 1588 keV
γ 1621 keVγ 2615 keV
SEP
� PSD tested on ∅ 6 cm BEGe (at IRMM Geel, Belgium)
� results: SEP survival 9.2% (∅ 8 cm: 7.1%)FEP survival 13.5% (∅ 8 cm: 10.2%)at 89% DEP acceptance
17
PSD performance in dependence on crystal sizePSD performance in dependence on crystal size
MPIK HeidelbergMPIK HeidelbergMPIK HeidelbergDušan BudjášDušan BudjášDušan Budjáš
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� PSD validated with SSE events of different topology (DEP vs. SCS), spatial distribution, and energy
� discovered < 3% loss of MSE rejection sensitivity near the read-out electrode (specific to our PSD method)
� no spatial dependence of SSE acceptance found
� no change of PSD sensitivity in dependence on HV (except for a slight growth of the MSE-insensitive volume)
� PSD performance in smaller crystals likely different only due to lower γ-ray absorption efficiency
Summary and conclusionsSummary and conclusions
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� tests of FE electronics for bare BEGe operation in LAr
� optimisation of the PSD procedure and coordination with LNGS BEGe team in advance of acceptance testing of new BEGe's from depGe
� coordination with Zürich group (Francis) on definition of the Phase 2 calibration source from the point of view of PSD calibration requirements
OutlookOutlook
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Backup slidesBackup slides
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FWHM
1.5
1.6
1.7
1.8
1.9
2
2.1
2.2
2.3
2.4
2.5
3500 3700 3900 4100 4300 4500
HV
keV
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MPIK HeidelbergMPIK HeidelbergMPIK HeidelbergDušan BudjášDušan BudjášDušan Budjáš
HV scanHV scan
0
2
4
6
8
10
12
14
16
500 1000 1500 2000 2500 3000 3500 4000 4500
High voltage [V]
FW
HM
[keV
]
1.33 MeV (Co-60)
1.39 MeV (pulser)
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0
5
10
15
20
25
30
35
40
45
50
2600 3100 3600 4100 4600
V
co
un
ts
0
1000
2000
3000
4000
5000
6000
7000
8000
ch
an
nel
peak intensity
peak position
22
MPIK HeidelbergMPIK HeidelbergMPIK HeidelbergDušan BudjášDušan BudjášDušan Budjáš
HV scanHV scan
0
2000
4000
6000
8000
10000
12000
500 1000 1500 2000 2500 3000 3500 4000 4500
High voltage [V]
Num
ber
of
counts
0
1000
2000
3000
4000
5000
6000
7000
8000
Peak p
ositio
n [
channel]
1.33 MeV peak intensity
1.33 MeV peak position
Nu
mbe
r o
f co
un
ts [
pe
r 60
0 s
]
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Charge collection characterisationCharge collection characterisation
59.4
59.42
59.44
59.46
59.48
59.5
59.52
59.54
-50 -40 -30 -20 -10 0 10 20 30 40 50
distance from center [mm]
pe
ak
po
sit
ion
[k
eV
]
0.4
0.5
0.6
0.7
0.8
0.9
1
FW
HM
[k
eV
]
peak position
FWHM
collimated 241
Am scan
59.3
59.35
59.4
59.45
59.5
59.55
59.6
0 5 10 15 20 25 30 35
distance from the top of crystal, d [mm]
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
FW
HM
[keV
]
peak position
FWHM
pe
ak p
ositio
n [ke
V]
gain variation: ≤ 0.055%
gain variation: ≤ 0.075%
� active mass: 836 g (95 % of total mass)
� dead layer:0.43 mm
59.5 keV
d
d
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Energy [keV]
Co-60 (high rate)
Co-60 (high rate+pile-up reject)
Co-60 (low rate)
Num
ber
of
cou
nts
24
MPIK HeidelbergMPIK HeidelbergMPIK HeidelbergDušan BudjášDušan BudjášDušan Budjáš
Charge collection losses: peak tailsCharge collection losses: peak tails
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MPIK HeidelbergMPIK HeidelbergMPIK HeidelbergDušan BudjášDušan BudjášDušan Budjáš
Charge collection stabilityCharge collection stability
-0.020%
-0.015%
-0.010%
-0.005%
0.000%
0.005%
0.010%
0.015%
22.12.08 29.12.08 5.1.09 12.1.09 19.1.09 26.1.09 2.2.09 9.2.09
Date
1333 keV
1174 keV
LN refilling
weekends
Re
lative p
eak p
ositio
n c
orr
ecte
d
for
puls
er
fluctu
ation
Setu
p
rearr
angem
ent
1st set 2nd set
Maximal variation: ≤ 0.015% ≈ 0.2 keV @ 1332.5 keV
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Charge collection stability: count rateCharge collection stability: count rate
2.60
2.75
2.90
3.05
3.20
0 7 14 21 28 35 42 49
Days since 22.12.2008
2.0
2.1
2.2
2.3
2.4
59.5 keV
1333 keV
Co
un
ts p
er
3 h
r
Co
un
ts p
er
3 h
r (c
orr
ecte
d)
×104
×104
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Coincident recordingCoincident recording
Struck SIS 3301
flash- ADC
14- bit, 100 MHz
pulse recording,
digital shaping
(τshaping = 10 µs)
1.6 µs
coincidence
window
software gate
Amplified raw signal
Canberra2002CSL
MPIKno shaping
TFACanberra2111
Time- filtered signal (10 ns differentiation and
10 ns integration time)
Amplified raw signal
Preamp
no shapingMPIK
228Th source(no collimator)
Pb/Cu shieldsolid
angle:~ 10°
25 c
m -
80 c
m
23.6 cm
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HV dependence of PSD performanceHV dependence of PSD performanceMPIK HeidelbergMPIK HeidelbergMPIK HeidelbergDušan BudjášDušan BudjášDušan Budjáš
� current signal amplitude grows with HV => weighing field shape changes
� (the width of the SSE band seems to slightly increase with HV)
0.2
0.22
0.24
0.26
0.28
0.3
0.32
3500 3750 4000 4250 4500
V
<A
/E>
sse
0.005
0.0055
0.006
0.0065
0.007
sig
ma(A
/E_sse)