device interface board for wireless lan testing

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Device Interface Board for Wireless LAN Testing Team May 06-15 Client ECpE Department Faculty Advisor Dr. Weber Team Members Matthew Dahms – EE Justine Skibbe – EE Joseph Chongo – EE Srisarath Patneedi – CprE December 06, 2005

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Device Interface Board for Wireless LAN Testing. Team May 06-15 Client ECpE Department. Faculty Advisor Dr. Weber Team Members Matthew Dahms – EE Justine Skibbe – EE Joseph Chongo – EE Srisarath Patneedi – CprE. December 06, 2005. Presentation Outline. Project Activities - PowerPoint PPT Presentation

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Page 1: Device Interface Board for Wireless LAN Testing

Device Interface Board for Wireless LAN Testing

TeamMay 06-15

ClientECpE Department

Faculty AdvisorDr. Weber

Team MembersMatthew Dahms – EEJustine Skibbe – EEJoseph Chongo – EESrisarath Patneedi – CprE

December 06, 2005

Page 2: Device Interface Board for Wireless LAN Testing

Presentation Outline Project Overview

Introduction Problem Statement Assumptions and Limitations

System Considerations User Considerations

End-Product Description

Overview of Existing Work May 05-29 Team’s

Accomplishments Parallel-Serial Conversion Transmitters and Receivers FPGA

Project Activities Technology Considerations Present Accomplishments

Hardware Software

Planned Activities Design

Closure Materials Schedule Closing Summary

Page 3: Device Interface Board for Wireless LAN Testing

Definitions ASK modulation – Amplitude shift keying. In this modulation scheme the

amplitude is varied to indicate logic 0’s and 1’s DUT – Device under test (positive edge D flip-flop) Header – Preamble bits sent prior to the sending of information in a data packet

time

1 0 1 0 D3 D2 D1 D0

Data Packet

Header

voltage

Data Packet and Header

Page 4: Device Interface Board for Wireless LAN Testing

Definitions (cont.) NRZ – Non-return to zero. Using NRZ, a logic 1 bit is

sent as a high value and a logic 0 bit is sent as a low value.

PLL – Phase-locked loop RZ – Return to zero. This is the opposite of NRZ data.

The signal state is determined by the voltage during the first half of each data binary digit.  The signal returns to a resting state (called zero) during the second half of each bit.

Page 5: Device Interface Board for Wireless LAN Testing

Project Overview

Page 6: Device Interface Board for Wireless LAN Testing

Acknowledgement

Dr. Weber Nathaniel Gibbs (GibbaHertz) Jason Boyd

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Introduction

Teradyne Integra J750Digital TesterDonated to Iowa State

Desire to test wireless chips using J750 May 05 project was first step toward that goal

Created send/receive network to test digital device remotely

Programmed FPGA for simple tests

Teradyne Integra J750

Page 8: Device Interface Board for Wireless LAN Testing

Project Overview Problem Statement

S/R network exists but no method is available for clock recovery

Must develop a clock recovering circuit and integrate it with current system

Investigate realistic range of operation for the wireless interface

Page 9: Device Interface Board for Wireless LAN Testing

Project Overview System Constraints

The Teradyne J750 must operate within +/- 3° C of calibrated temperature (30° C).

The maximum rate at which data may be sent is at 115.2 Kbps.

The Tx and Rx networks communicate at 916.5 & 916MHz. Nearby wireless signals at similar frequencies may disrupt the setup.

The IG-XL software shall be used in writing the test data sets for the Teradyne J750.

Only one FPGA will be provided.

Page 10: Device Interface Board for Wireless LAN Testing

Project Overview Users Assumptions

The user has knowledge in electrical and/or computer engineering.

The user has previous experience testing circuits with the Teradyne J750.

The user has read the Teradyne J750 instruction manual and will observe all necessary safety precautions as prescribed in that manual.

Intended Uses Functional test of a digital device (Future) Wireless chipset test

Page 11: Device Interface Board for Wireless LAN Testing

Project Overview End-Product and Other Deliverables

Wireless interface with clock recovery circuit Demonstration of wireless test Update the manual for wireless test operation

Cover page of wireless manual

Page 12: Device Interface Board for Wireless LAN Testing

Overview of Existing Work

Page 13: Device Interface Board for Wireless LAN Testing

Overview of Existing Work May 05-29 Accomplishments

Parallel-Serial Conversion Transmitters and Receivers Processing Device

Page 14: Device Interface Board for Wireless LAN Testing

Overview of Existing Work

Parallel-Serial Conversion Needed to convert parallel test data into serial test

data Chose to use a shift register

Shift Register attached to daughterboard

Page 15: Device Interface Board for Wireless LAN Testing

Overview of Existing Work

Transmitters and Receivers

TRM1

TRM2

RCV1

RCV2

Page 16: Device Interface Board for Wireless LAN Testing

Overview of Existing Work

FPGAUsed to recognize header signal Identifies test dataPresents test data to DUTPresents reply to S/R network

Page 17: Device Interface Board for Wireless LAN Testing

Final System Setup

Page 18: Device Interface Board for Wireless LAN Testing

Project Activities

Page 19: Device Interface Board for Wireless LAN Testing

Project Activities Project Definition

Part of the May 05 team’s project definition was to include a clock recovery circuit, but due to timing constraints was unable to do so.

May 06 goal is to integrate a PLL for clock recovery with the existing network.

Page 20: Device Interface Board for Wireless LAN Testing

Project Activities

Design

Page 21: Device Interface Board for Wireless LAN Testing

Project Activities

Technology ConsiderationsManchester vs. PLLNRZ to RZ ConversionSoftware

Page 22: Device Interface Board for Wireless LAN Testing

Project Activities

Original Signal Value SentLogic 0 0 to 1 (upward transition at

bit centre)

Logic 1 1 to 0 (downward transition at bit centre)

The waveform for a Manchester encoded bit stream carrying the sequence of bits 110100

Manchester Encoding

Page 23: Device Interface Board for Wireless LAN Testing

Manchester EncodingVery easy to implementClock phase and frequency are both present Too fast for current transmitters and

receivers!

Project Activities

Page 24: Device Interface Board for Wireless LAN Testing

Project Activities

Phase Locked LoopMust be “trained” Test data must follow a training signalMore difficult to implementDon’t have to build new transmitters and

receivers

Page 25: Device Interface Board for Wireless LAN Testing

Project Activities

Present AccomplishmentsHardware

Previous team’s project setup and tested PLL Monostable Multivibrators

Software Prototype control software for FPGA written IG-XL test template written

Page 26: Device Interface Board for Wireless LAN Testing

Project Activities

Internal Components of a PLL

Page 27: Device Interface Board for Wireless LAN Testing

Project Activities

Phase DetectorType I – XOR *Type II – Generates lead or lag pulses

Voltage Controlled Oscillator (VCO)Centered at 115.2 KHzFrequencies too far off of center frequency

will not lock

Page 28: Device Interface Board for Wireless LAN Testing

Project Activities

Page 29: Device Interface Board for Wireless LAN Testing

Project Activities

Monostable MultivibratorsChosen to convert NRZ data to RZ dataMust use an external RC combination to

specify pulse widths

Page 30: Device Interface Board for Wireless LAN Testing

Project Activities

NRZ to RZ converter circuit with I/O waveforms

Page 31: Device Interface Board for Wireless LAN Testing

Project Activities

SoftwareFPGA serves as “brains” of systemVerilog chosen to program FPGAPrototype code complete

Page 32: Device Interface Board for Wireless LAN Testing

Project Activities

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Project Activities Planned Design/Test Activities

Build and Test NRZ to RZ Converter Build and Test PLL Circuitry Integrate Clock Recovering Circuitry Modify FPGA Code as Necessary Test Functional Range of Wireless Interface

Page 38: Device Interface Board for Wireless LAN Testing

NRZ/RZ

PLL

Page 39: Device Interface Board for Wireless LAN Testing

Closure Materials

Page 40: Device Interface Board for Wireless LAN Testing

Closure MaterialsSchedule

Expected

Actual

Updated

Page 41: Device Interface Board for Wireless LAN Testing

Closure Materials

Expected

Actual

Updated

Schedule (cont.)

Page 42: Device Interface Board for Wireless LAN Testing

Closing Materials Lessons Learned

What technical knowledge was gained? FPGA implementation Teradyne Integra J750 usage Clock recovery methods System integration

Page 43: Device Interface Board for Wireless LAN Testing

Closing Materials

Lessons Learned What went well?

May05 System still works! Teamwork Learned to work in arctic environments

(19 degrees C inside Teradyne lab)

What did not go well? Locating May05 equipment Initial Teradyne J750 setup and test Uploading program to FPGA FPGA inputs pins

Page 44: Device Interface Board for Wireless LAN Testing

Closing Materials Closing Summary

Problem – Integrate clock recovery circuitry into current system

Solution Use PLL for clock recovery Modify FPGA program to incorporate new

components

Page 45: Device Interface Board for Wireless LAN Testing

Questions?Questions???Questions???

Page 46: Device Interface Board for Wireless LAN Testing

Thank You