department of computer engineering tallinn university of technology estonia 8 th european workshop...
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Department of Computer EngineeringTallinn University of Technology
Estonia
8th European Workshop on Microelectronics Education – EWME‘2010Darmstadt, May 10-12, 2010
E-Learning Environment for WEB-Based Study of Testing E-Learning Environment for WEB-Based Study of Testing
R.Ubar1, A.Jutman1, J.Raik1,
S.Kostin1, H.-D.Wuttke2
1Dept. of Computer EngineeringTallinn University of Technology
Estonia
2Dept. of Technical InformaticsTechnical University of IlmenauGermany
E-Learning Environment for WEB-Based Study of TestingEWME May 10–12, 2010 2
MotivationMotivation
ITRS: semiconductor test is already one of key problems in current generation of VLSI chips and its importance will be growing
There is a strong demand for well-educated specialists in the area of IC and microelectronics testing
Interactive training tools as addendum to LMS are needed to facilitate teaching process
TUT has a 15 years tradition in developing training tools in microelectronic testing
Students develop the software themselves under supervision of graduate students and senior personnel
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Motivation
Cutting Edge Research−Needs custom developed algorithms
and/or tools
PhD Students−Need to run their experiments
Undergraduate Students−Need introduction to the topic
Department−Needs training materials and research
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Outline
Different layers of the platform
HW tools
PC-based tools
Web interface
E-Learning tools
Conclusions and discussion
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Different layers of the platform
Web
Tools
PC
Tools
Hardware
Tools
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Main components of the platform
DefSim - an integrated measurement environment for physical defect study in CMOS circuits.
TurboTester – a research and training toolkit with extensive set of tools for digital test and design for testability
Web-based runtime interface for remote access to our tools
Java applets – illustrative e-learning software written specifically for the web
Other tools
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Different layers of the platform
Web
Tools
PC
Tools
Hardware
Tools
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Defect Study using DefSim
DefSim is an integrated circuit (ASIC) and a measurement equipmrnt for experimental study of CMOS defects.
The central element of the DefSim equipment is an educational IC with a large variety of shorts and opens physically inserted into a set of simple digital circuits.
The IC is attached to a dedicated measurement box serving as an interface to the computer. The box supports two measurement modes - voltage and IDDQ testing.
http://www.defsim.com
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− Standard industrial CMOS technology
− Area 19.90 mm2
− Approx. 48000 transistors− 62 pins− JLCC68 package
A built-in current A built-in current monitor for monitor for IIDDQDDQ testing testing is implemented in each is implemented in each block.block.
DefSim IC details
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NAND2 cell with floating gate NAND2 cell with floating gate
VDD
GND
QA
B
X
Implementation of defects
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VDD
GND
QA
B
NAND2 cell with D-S short (missing NAND2 cell with D-S short (missing poly) poly)
• Altogether there are over 500 different defects on the chip
• Implemented defects are shorts and opens in metal and poly layers
• To be close to the silicon reality each cell is loaded and driven by standard non-inverting buffers
Implementation of defects
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DefSim in the classroom
With DefSim you can
Observe the truth table of correct circuit Observe the truth table of defective circuit Obtain defect/fault tables for all specific
defects Define test patterns automatically or manually Activate IDDQ and voltage measurements Study behavior of bridging and open faults Study and compare different fault models
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“Plug and Play” – dedicated hardware and software
DefSim lab environment
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Different layers of the platform
Web
Tools
PC
Tools
Hardware
Tools
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Design ErrorDiagnosis
TestGenerators
BISTEmulator
Design TestSet
FaultTable
Test SetOptimizer
FaultyArea
LogicSimulator
Defect Library
HazardAnalysis
Data
Specifi-cation
MultivaluedSimulator
FaultSimulator
http://www.pld.ttu.ee/tt
PC-Based Toolkit – Turbo Tester
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Design ErrorDiagnosis
TestGenerators
BISTEmulator
Design TestSet
Levels:GateMacroRTL
FaultTable
Test SetOptimizer
Methods:BILBOCSTPHybrid
FaultyArea
Circuits:CombinationalSequential
LogicSimulator
Formats:EDIFAGM
Defect Library
HazardAnalysis
Data
Specifi-cation
Algorithms:DeterministicRandomGenetic Multivalued
Simulator
Fault models:Stuck-at faultsPhysical defects
FaultSimulator
http://www.pld.ttu.ee/tt
PC-Based Toolkit – Turbo Tester
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FreewareFreewareDownloadable via the WebDownloadable via the WebWindows, Linux, UNIX/SolarisWindows, Linux, UNIX/SolarisEDIF design interfaceEDIF design interfaceATPGs, BIST, simulators, test ATPGs, BIST, simulators, test
compactioncompactionProvides homogeneous environment Provides homogeneous environment
for research and trainingfor research and training
Turbo Tester: Basic Facts
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Different layers of the platform
Web
Tools
PC
Tools
Hardware
Tools
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BIST Analyzer: covered topics
Test Pattern Generators (PRPG):−LFSR−Modular LFSR −Cellular Automata−GLFSR−Weighted TPG−etc.
Combined Techniques (PRPG + Memory):
−Reseeding−Multiple polynomial BIST−Hybrid BIST−Bit-Flipping BIST−Column matching BIST−etc.
BISTControl
Unit
Circuit Under Test (CUT)
Test Pattern Generator (PRPG) ........
........
Output ResponseAnalyzer (MISR)
BIST
Memory
Typical BIST Architecture
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•Embedded generators (PRPG) and their properties
•PRPG optimization methodologies and algorithms
•Combined BIST solutions (PRPG+memory)
•Fault detection and diagnosis in BIST
BIST Analyzer: covered topics
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BIST Analyzer
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Different layers of the platform
Web
Tools
PC
Tools
Hardware
Tools
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Web Interface
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Different layers of the platform
Web
Tools
PC
Tools
Hardware
Tools
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E-Learning software on DFT
http://www.pld.ttu.ee/applets
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Essential supplement to the university lectures
Accessibility over InternetVisual content (“Living Pictures”)Comprehensive examplesBetter organization of teaching materialsBased on free educational softwareDistance learning & computer aided
teachingEasy to implement in other universitiesConstantly updated
Benefits of e-learning software
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Test Generation
ErrorDiagnosis
Built-InSelf-Test
Design forTestability
Test andDiagnostics
RTL Designand Test
BoundaryScan
Applet on Basics of Test &
Diagnostics
Applet on RTL Design and
Test
Applet on Boundary Scan
Standard
Schematic& DD Editor
TurboTester
Group of Applets on Control Part Decomposition
E-Learning SoftwareJava
AppletsTurboTester
Scenario 4Scenario 4Design forDesign forTestabilityTestability
Scenario 3Scenario 3Built-InBuilt-In
Self-TestSelf-Test
Scenario 2Scenario 2ErrorError
DiagnosisDiagnosis
Scenario 1Scenario 1Test Test
GenerationGeneration
Scenario 4Scenario 4Design forDesign forTestabilityTestability
Scenario 3Scenario 3Built-InBuilt-In
Self-TestSelf-Test
Scenario 2Scenario 2ErrorError
DiagnosisDiagnosis
Scenario 1Scenario 1Test Test
GenerationGeneration
SupportingMaterials
Learning Scenarios
Web based tools for classroom, home and exams
Tools for laboratory research
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E-Learning Software
Logic level diagnostics System level test & DfT
Software for classroom, home, labs and exams:
http://www.pld.ttu.ee/applets
Boundary Scan
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• manual test pattern generation assisted by the applet• generation of pseudo-random test vectors by LFSR• fault simulation & study of fault table• combinational fault diagnosis using fault tables• sequential fault diagnosis by guided probing
Applet on basics of test
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• design of a data path and control path (microprogram) on RT level• investigation of tradeoffs between speed of the system & HW cost• RT-level simulation and validation• gate-level deterministic test generation and functional testing• fault simulation• logic and circular BIST, functional BIST, etc.• design for testability
Applet on RT-level design and test
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• Simulation of operation of TAP Controller Simulation of operation of TAP Controller • Illustration of work of BS registersIllustration of work of BS registers• Insertion and diagnosis of interconnection faultsInsertion and diagnosis of interconnection faults• Design/editing of BS structures using the BSDL languageDesign/editing of BS structures using the BSDL language• Design/description of the target board using several Design/description of the target board using several
chipschips
Applet on Boundary Scan
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An applet targetedAn applet targetedat binding all the at binding all the applets and the applets and the
Turbo TesterTurbo Tester
Supported Supported interface interface formats are:formats are:AGMAGMDWGDWGVHDLVHDLGIFGIFEDIF?EDIF?PostScript?PostScript?
Design forDesign forTestabilityTestability
Applet onApplet onBasics of Test Basics of Test & Diagnostics& Diagnostics
Applet onApplet onRTL DesignRTL Design
and Testand Test
Applet onApplet onBoundary ScanBoundary Scan
StandardStandard
SchematicSchematic& DD Editor& DD Editor
AGM, DWGAGM, DWG
AGM, GIFAGM, GIF
AGMAGM
AGM,AGM,GIFGIF
Main functions of the applet are:Main functions of the applet are:• gate-level schematic editorgate-level schematic editor• SSBDD editorSSBDD editor• schematic schematic ↔ SSBDD on-the-fly ↔ SSBDD on-the-fly converterconverter• different format reader/converterdifferent format reader/converter
Schematic and DD editor
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Design Specification
Design Implementation
Test Vector File
Test Vector File
Verification Results
XTimport Tool
ATPG
Circuit Schematic
Human Being
Diagnostic Vectors
Report File
Prediag Tool
Verification Tool
Circuit Netlist
Intermediate Diagnosis
Vecmanager ToolFinal
Diagnosis
Turbo Tester tools and formats
Other
Example of a lab work scenario
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Conclusions
The main features of the platform:
•Research engine + training software
•Layered structure
•HW and SW components
•Remote access
•Distance learning and e-learning
•Computer-aided teaching
•Freeware
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Conclusions
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Our Tools on the Web
The Turbo Tester home page
http://www.pld.ttu.ee/tt/
The Turbo Tester web-server page
http://www.pld.ttu.ee/webtt/
DefSim home page
http://www.defsim.com
Java applets home page
http://www.pld.ttu.ee/applets/