cc2000 computerized chip quality monitoring systemcc2000 computerized chip quality monitoring system...

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CC2000 Computerized The brands comprising TerraSource Global are wholly-owned subsidiaries of Hillenbrand, Inc. (NYSE: HI), which is based in Indiana. © 2014 TerraSource Global. All Rights Reserved. Provides reliable monitoring and tracking over time of the chip quality processing equipment and/or purchased chip quality. Operator selectable chip thickness sizing from 2mm to 24mm. Unlike conventional classifiers, not labor intensive. System provides instantaneous data with documentation for each classification. Classification settings can be modified by the computer instead of replacing hardware. Systems provides an additional computer work station when classifier is not in use. Superior sample repeatability and accurate chip fraction separation (± 0.25mm accuracy). All functions, including safety switches, elapsed time per fraction and weight deviations are controlled and monitored by the computer. CC2000 Computerized Chip Quality Monitoring System The Jeffrey Rader CC2000 is a fully automated chip thickness classification system that classifies, monitors and controls all of its function by computer. This handy machine brings time savings, labor savings and cost savings to pulp mills that want to establish an investment in the overall knowledge and control of their chip quality and its production. Features/Advantages Unique, patented bar configuration in a rotating drum approximates the individual micrometer measurement of each chip. With computer optimization, the completion of chip size classification is accomplished in less time. A much larger sample can be classified relative to other classifiers on the market today. More reliable chip quality data is provided as a function of larger samples, more accurately processed in less time. Sample test results can be easily saved and retrieved to compare established chip quality parameters. Efficient classification and evaluation of chip quality with programmable thickness size selection. www.terrasource.com [email protected] Chip Quality Monitoring System

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Page 1: CC2000 Computerized Chip Quality Monitoring SystemCC2000 Computerized Chip Quality Monitoring System The Jeffrey Rader CC2000 is a fully automated chip thickness classification system

CC2000 Computerized

The brands comprising TerraSource Global are wholly-owned subsidiaries of Hillenbrand, Inc. (NYSE: HI), which is based in Indiana. © 2014 TerraSource Global. All Rights Reserved.

• Provides reliable monitoring and tracking over time of the chip quality processing equipment and/or purchased chip quality.

• Operator selectable chip thickness sizing from 2mm to 24mm.

• Unlike conventional classifiers, not labor intensive.

• System provides instantaneous data with documentation for each classification.

• Classification settings can be modified by the computer instead of replacing hardware.

• Systems provides an additional computer work station when classifier is not in use.

• Superior sample repeatability and accurate chip fraction separation (± 0.25mm accuracy).

• All functions, including safety switches, elapsed time per fraction and weight deviations are controlled and monitored by the computer.

CC

20

00

Com

puterized Chip Q

uality Monitoring S

ystem

The Jeffrey Rader CC2000 is a fully automated chip thickness classification system that classifies, monitors and controls all of its function by computer. This handy machine brings time savings, labor savings and cost savings to pulp mills that want to establish an investment in the overall knowledge and control of their chip quality and its production.

Features/Advantages • Unique, patented bar configuration in a rotating

drum approximates the individual micrometer measurement of each chip.

• With computer optimization, the completion of chip size classification is accomplished in less time.

• A much larger sample can be classified relative to other classifiers on the market today.

• More reliable chip quality data is provided as a function of larger samples, more accurately processed in less time.

• Sample test results can be easily saved and retrieved to compare established chip quality parameters.

Efficient classification and evaluation of chip qualitywith programmable thickness size selection.

www.terrasource.com ■ [email protected]

Chip Quality Monitoring System

Page 2: CC2000 Computerized Chip Quality Monitoring SystemCC2000 Computerized Chip Quality Monitoring System The Jeffrey Rader CC2000 is a fully automated chip thickness classification system

CC2000 Computerized

The brands comprising TerraSource Global are wholly-owned subsidiaries of Hillenbrand, Inc. (NYSE: HI), which is based in Indiana. © 2014 TerraSource Global. All Rights Reserved.

www.terrasource.com ■ [email protected]

CC

20

00

Com

puterized Chip Q

uality Monitoring S

ystem

CRUSH. FEED. PROCESS. CONVEY. STORE.

APPROXIMATE LAYOUT DIMENSIONS* AND SHIPPING WEIGHTS IN. (MM) MODEL CAPACITY DRUM SIZE ELECTRICAL HEIGHT WIDTH DEPTH LBS (KG) CC2000 1 cu. ft. (approx. 20 lbs.) 24" X 24" (610 x 610) 2 — 120/1/60, 20A lines 66.5" (1689) 53" (1346) 31" (787) 1,260 (572)

*Certifieddrawingswillbefurnishedforinstallation.Installationsupervisionisrecommended.

Dimensions and Weights

H

W D

Chip Quality Monitoring System