built-in self test (bist). 1. introduction 2. pattern generation 3. signature analysis 4. bist...
TRANSCRIPT
Built-In Self Test (BIST)
Built-In Self Test (BIST)
1. Introduction
2. Pattern Generation
3. Signature Analysis
4. BIST Architectures
5. Summary
Outline
Built-In Self Test (BIST)
1. Introduction
2. Pattern Generation
3. Signature Analysis
4. BIST Architectures
5. Summary
Built-In Self Test (BIST)
1. Introduction
Built-In Self Test (BIST)
1. Introduction
General Structure
Built-In Self Test (BIST)
General Structure
UnitUnder
Test
DataCompressor
DataGenerator
Comparator
Display
Reference
BIST ControllerStart/Stop Ready
Electronic System
1. Introduction
Built-In Self Test (BIST)
1. Introduction
Built-In Self Test (BIST)
1. Introduction
Built-In Self Test (BIST)
1. Introduction
Built-In Self Test (BIST)
1. Introduction
2. Pattern Generation
3. Signature Analysis
4. BIST Architectures
5. Summary
Built-In Self Test (BIST)
2. Pattern Generation
Built-In Self Test (BIST)
2. Pattern Generation
Built-In Self Test (BIST)
2. Pattern Generation
Built-In Self Test (BIST)
2. Pattern Generation
Built-In Self Test (BIST)
2. Pattern Generation
A fixed set of “optimal” test patterns, usually derived from fault simulation, is used.
Built-In Self Test (BIST)
2. Pattern Generation
Built-In Self Test (BIST)
2. Pattern Generation
Built-In Self Test (BIST)
2. Pattern Generation
Built-In Self Test (BIST)
2. Pattern Generation
Built-In Self Test (BIST)
Pseudo-Random Generation using LFSR
2. Pattern Generation
Built-In Self Test (BIST)
Example of a 4-bit LFSR as a Pattern Generator.
Pseudorandom states generated by the LFSR.
Pseudo-Random Generation using LFSR
2. Pattern Generation
Built-In Self Test (BIST)
1. Introduction
2. Pattern Generation
3. Signature Analysis
4. BIST Architectures
5. Summary
3. Signature Analysis
Built-In Self Test (BIST)
3. Signature Analysis
Built-In Self Test (BIST)
Methods for Response Evaluation
Steps for Response Evaluation:
1
23
r-Bit (Internal XOR) Signature Generator.
The content of the LFSR is the remainder of the division operation.
3. Signature Analysis
Serial
Built-In Self Test (BIST)
Built-In Self Test (BIST)
r-Bit (External XOR) Signature Generator. The content of the LFSR is not the remainder of the division operation.
Serial
3. Signature Analysis
Serial
Example of a 4-bit (External) Signature Generator.
Built-In Self Test (BIST)
3. Signature Analysis
r-Bit (Internal XOR)
Parallel Signature Generator.
r-Bit (External XOR)
Parallel Signature Generator.
Parallel
Built-In Self Test (BIST)
3. Signature Analysis
Problem: Problem: When compacting results, there is a probability of fault maskingfault masking !
Probability of failing to detect an error in the response sequence:Probability of failing to detect an error in the response sequence:
Serial input Parallel input
Where: K: length of the sequence (# of bits)r: length of the LFRS (# of bits)
2mL- r
– 1
2mL
– 1
2k-r
– 1
2k – 1
Where: L: length of the sequence (# of test vectors)m: length of a vector (# of bits) r: length of the LFRS (# of bits)
Built-In Self Test (BIST)
3. Signature Analysis
Built-In Self Test (BIST)
3. Signature Analysis
Modular LFSR Serial Compacter Example
Built-In Self Test (BIST)
3. Signature Analysis
Modular LFSR Parallel Compacter Example
Built-In Self Test (BIST)
1. Introduction
2. Pattern Generation
3. Signature Analysis
4. BIST Architectures
5. Summary
Built-In Self Test (BIST)
4. BIST Architectures
Built-In Logic Block Observer (BILBO)
4. BIST Architectures
Built-In Self Test (BIST)
Modular Bus-Oriented Design with “BILBO”.
Built-In Self Test (BIST)
4. BIST Architectures
Built-In Logic Block Observer (BILBO)
4. BIST Architectures
Built-In Self Test (BIST)
Built-In Self Test (BIST)
4. BIST Architectures
General Form of a BILBO
B1 = 1, B2 = 1: S.A.B1 = 1, B2 = 0: Normal Op.B1 = 0, B2 = 0: ScanB1 = 0, B2 = 1: P.G.
MUX:B2 = 1: Out = Q1.B2 = 0: Out = Sin.
Example: 8-bit-Length Datapath
Built-In Self Test (BIST)
4. BIST Architectures
B1 = 1, B2 = 0: S.A.B1 = 1, B2 = 1: Normal Op.B1 = 0, B2 = 0: ScanB1 = 0, B2 = 1: Not Ap.
MUX:B1 = 1: Out = Q1.B1 = 0: Out = Sin.
Built-In Self Test (BIST)
Example: 8-bit-Length Datapath
4. BIST Architectures
Built-In Self Test (BIST)
Example: 8-bit-Length Datapath
4. BIST Architectures
Built-In Self Test (BIST)
1. Introduction
2. Pattern Generation
3. Signature Analysis
4. BIST Architectures
5. Summary
Built-In Self Test (BIST)