bit error rate tester · title: bit error rate tester author: p. miedzik, p. koczon subject: gsi...

Bit Error Rate Tester P. Miedzik 1,2 and P. Koczo´ n 1 1 GSI, Darmstadt, Germany; 2 Politechnika Warszawska, Warsaw, Poland For electronic components which transmit digital data the bit error rate is the figure of merit which has to be con- trolled. Electronics which will be installed in the field of re- action products in future experiments at FAIR has to be ra- diation hard. At present, selected electronic parts undergo exhaustive tests with use of intense minimum ionising particles’ beams, mostly 3 GeV protons at J¨ ulich synchrotron facility. To monitor data transmitting components during irradiation a Bit Error Rate Tester (BERT) has been devel- oped. BERT requirements Randomly generated bit patterns are sent to the tested device and compared to the transmitted back bit series. In order to avoid spurious errors due to e.g. bit flips in the source or the receiver of the test data by ionising particles both of them have to be placed far away from the device under test. Moreover, the generated bit patterns have to be representative for the data to be collected in real high en- ergy experiment and transmitted in a form of future data transmission (8bit/10bit and 64b/66b line coding). Trans- mission lines based on copper wires as well as on glass fibers as different carriers have to be tested with transmission frequency as high as planned for coming experiments. Block diagram of the Bit Error Rate Tester is presented in Fig.1. In the following some details of the construction of the bit pattern tester and its performance is described. BERT construction Figure 1: Simplified block diagram of GTP Transceiver A standard PC as host (powering, programming envi- ronment) for the Spartan6 FPGA based card with GTP transceiver is used (Fig.2). Serial input and output of the card is using differential signalling via SFP interface or plane interface for transmission on copper line. Various pa- rameter such as driver swing, TX pre-emphasis or receiver equalization might be adjusted to adapt this device to different standards. A random bit sequence generator imple- mented in the FPGA delivers patterns 2 7 - 1 or 2 31 - 1 bit long according to polynomials x 7 + x 6 +1 (PRBS7) and x 31 + x 28 +1 (PRBS31) [1]. On receiver side incoming bits are stored into history shifting buffer and they are used to compute further expected incoming bits using the same PRBS algorithms. Figure 2: PC card with FPGA and I/Os. BERT test results An error-counter is incremented in case of discrepancy between sent and received patterns and monitoring soft- ware can display - apart of the test conditions - the error rate corresponding to certain transmission speed. Two lengths of transmission medium have been used (400 and 1000 m lines of glass fiber) for bit patterns generated with PRBS 31-bit with differential output swing of 200 mV and transmission speed of 2.5 Gbps In this particular configuration bit error rate was 1.42 * 10 -14 after almost 8 hours of run. Transmission line has been disturbed mechanically to test proper detection of the transmission errors what resulted immediately in drastically increase of the bit error rate. References [1] http://www.xilinx.com/support/documentation/ user_guides/ug386.pdf MU-NQM-CBM-56 GSI SCIENTIFIC REPORT 2014 94 DOI:10.15120/GR-2015-1-MU-NQM-CBM-56

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Bit Error Rate Tester

P. Miedzik1,2 and P. Koczón11GSI, Darmstadt, Germany;2Politechnika Warszawska, Warsaw, Poland

For electronic components which transmit digital datathe bit error rate is the figure of merit which has to be con-trolled. Electronics which will be installed in the field of re-action products in future experiments at FAIR has to be ra-diation hard. At present, selected electronic parts undergoexhaustive tests with use of intense minimum ionising par-ticles’ beams, mostly 3 GeV protons at Jülich synchrotronfacility. To monitor data transmitting components duringirradiation a Bit Error Rate Tester (BERT) has been devel-oped.

BERT requirements

Randomly generated bit patterns are sent to the testeddevice and compared to the transmitted back bit series. Inorder to avoid spurious errors due to e.g. bit flips in thesource or the receiver of the test data by ionising particlesboth of them have to be placed far away from the deviceunder test. Moreover, the generated bit patterns have to berepresentative for the data to be collected in real high en-ergy experiment and transmitted in a form of future datatransmission (8bit/10bit and 64b/66b line coding). Trans-mission lines based on copper wires as well as on glassfibers as different carriers have to be tested with transmis-sion frequency as high as planned for coming experiments.Block diagram of the Bit Error Rate Tester is presented inFig.1. In the following some details of the construction ofthe bit pattern tester and its performance is described.

BERT construction

Figure 1: Simplified block diagram of GTP Transceiver

A standard PC as host (powering, programming envi-ronment) for the Spartan6 FPGA based card with GTPtransceiver is used (Fig.2). Serial input and output of thecard is using differential signalling via SFP interface orplane interface for transmission on copper line. Various pa-rameter such as driver swing, TX pre-emphasis or receiverequalization might be adjusted to adapt this device to dif-ferent standards. A random bit sequence generator imple-mented in the FPGA delivers patterns27 − 1 or 231 − 1 bitlong according to polynomialsx7 + x6 + 1 (PRBS7) andx31 + x28 + 1 (PRBS31) [1]. On receiver side incomingbits are stored into history shifting buffer and they are usedto compute further expected incoming bits using the samePRBS algorithms.

Figure 2: PC card with FPGA and I/Os.

BERT test results

An error-counter is incremented in case of discrepancybetween sent and received patterns and monitoring soft-ware can display - apart of the test conditions - the error ratecorresponding to certain transmission speed. Two lengthsof transmission medium have been used (400 and 1000 mlines of glass fiber) for bit patterns generated with PRBS31-bit with differential output swing of 200 mV and trans-mission speed of 2.5 Gbps In this particular configurationbit error rate was1.42 ∗ 10−14 after almost 8 hours of run.Transmission line has been disturbed mechanically to testproper detection of the transmission errors what resultedimmediately in drastically increase of the bit error rate.

References

[1] http://www.xilinx.com/support/documentation/user_guides/ug386.pdf

MU-NQM-CBM-56 GSI SCIENTIFIC REPORT 2014

94 DOI:10.15120/GR-2015-1-MU-NQM-CBM-56