background treatment in spectral analysis of low surface brightness sources alberto leccardi &...

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Background treatment Background treatment in spectral analysis in spectral analysis of low surface brightness of low surface brightness sources sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background working group meeting

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Page 1: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

Background treatmentBackground treatmentin spectral analysisin spectral analysis

of low surface brightness sources of low surface brightness sources

Alberto Leccardi & Silvano Molendi

Garching, 2nd May 2006

EPIC backgroundworking group meeting

Page 2: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

1. SPECTRAL ANALYSIS OF LOW

SURFACE BRIGHTNESS SOURCES

2. BACKGROUND MODELING IN

A HARD BAND (ABOVE 2 keV)

SUMMARYSUMMARY

Page 3: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

OUTER REGIONS OF CLUSTERSOUTER REGIONS OF CLUSTERS

Rmax

Rmax = 5’ 0.9 Mpc 30%

r180

A1689z = 0.183kT 9 keV

ObsID 0093030101Exposure time

36 ks (MOS)29 ks (pn)

Page 4: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

OUTER REGIONS OF CLUSTERSOUTER REGIONS OF CLUSTERS

Inner region

source >> background

Outer region

source background

Page 5: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

SYSTEMATIC

UNCERTAINTIES

STATISTICAL (RANDOM)

UNCERTAINTIES

Page 6: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

SYSTEMATIC

UNCERTAINTIES

STATISTICAL (RANDOM)

UNCERTAINTIES

Page 7: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

SYSTEMATIC

UNCERTAINTIES

• Cross-calibration MOS-pn

• Background knowledge

Page 8: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

SYSTEMATIC

UNCERTAINTIES

• Cross-calibration MOS-pn

relatively good in the hard band

2-10 keV

Page 9: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

SYSTEMATIC

UNCERTAINTIES

• Background knowledge

NXB – continuum + fluorescence lines

SP – highly variable component

hard & soft light curves

+ IN FOV / OUT FOV ratio

Page 10: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

SYSTEMATIC

UNCERTAINTIES

• Background knowledge

NXB – continuum + fluorescence lines

SP – highly variable component

hard & soft light curves

+ IN FOV / OUT FOV ratio

(De Luca & Molendi, 2004)

Page 11: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

IN FOV / OUT FOV DIAGNOSTICIN FOV / OUT FOV DIAGNOSTIC

MOS2

IN FOV OUT FOV

Instrument

In FoV Out FoV Band (keV)

MOS R > 10’ R > 14’40” 6-12

pn R > 10’ R > 15’50” 5-7.3 + 10-14

Page 12: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

IN FOV / OUT FOV DIAGNOSTICIN FOV / OUT FOV DIAGNOSTIC

NO SP contamination R ≈ 1

LOW SP contamination

R ≤ 1.3

HIGH SP contamination

R ≥ 1.3

RSB inFOV

SB outFOV

counts inFOV

time inFOV area inFOV

time outFOV area outFOV

counts outFOV

Page 13: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

SYSTEMATIC

UNCERTAINTIES

STATISTICAL (RANDOM)

UNCERTAINTIES

Page 14: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

What are the effectsof the pure statistical uncertainties

in determining interesting parameters, as temperature and density of the ICM, in the case of

few counts/binand a low S/N ratio, as in the outer

regions of clusters of galaxies?

Page 15: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

ANALYSIS

DIFFERENT METHODS

ACCUMULATES “REAL” SPECTRUM

THERMAL + POWER LAW as BACKGROUND

GENERATION

SIMULATIONSIMULATION

SIMULATES N≈1000 DIFFERENT MEASURES

PERTURBING REAL SPECTRUM

WITH A POISSONIAN DISTRIBUTION

Page 16: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

WEIGHTED AVERAGE OF SINGLE MEASURES

RENORMALIZED BACKGROUND SUBTRACTION

STANDARD

ANALYSIS METHODSANALYSIS METHODS

χ2 STATISTIC

Page 17: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

STANDARD METHODSTANDARD METHOD

TEMPERATURE NORMALIZATION

(keV) (arbitrary units)

REAL MEASURED REAL MEASURED

5.004.29 ± 0.02

5.505.27 ± 0.02

10.007.64 ± 0.06

5.505.38 ± 0.01

Normalization isUNDERESTIMATED

by few percent

Temperature isUNDERESTIMATED

by 15-25%

Page 18: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

WEIGHTED AVERAGE OF SINGLE MEASURES

BACKGROUND MODEL

CASH + MODEL

ANALYSIS METHODSANALYSIS METHODS

CASH STATISTIC

Page 19: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

CASH + MODEL METHODCASH + MODEL METHOD

TEMPERATURE NORMALIZATION

(keV) (arbitrary units)

REAL MEASURED REAL MEASURED

5.004.45 ± 0.03

5.505.30 ± 0.02

10.007.97 ± 0.07

5.505.46 ± 0.01

Normalization isUNDERESTIMATED

by few percent

Temperature isUNDERESTIMATED

by 10-20%

Page 20: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

JOINED PROBABILITY DISTRIBUTION

BACKGROUND MODEL

BEST

ANALYSIS METHODSANALYSIS METHODS

CASH STATISTIC

WEIGHTED AVERAGE OF “TRIPLETS”

Page 21: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

ANALYSIS METHODSANALYSIS METHODS

P(T)

Temperature (keV)

Peak = 7.1Med = 8.4

Mean = 9.3

Peak = 14.1

Med = 17.1

Mean = 21.1

Probability distributions of the temperatureare strongly ASYMMETRIC

Page 22: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

P1(T)

P2(T)

P3(T)

Ptot(T)= P1+P2+P3

ANALYSIS METHODSANALYSIS METHODS

Median

68%

Page 23: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

BEST METHODBEST METHOD

TEMPERATURE NORMALIZATION

(keV) (arbitrary units)

REAL MEASURED REAL MEASURED

5.004.99 ± 0.04

5.505.48 ± 0.02

10.009.96 ± 0.11

5.505.55 ± 0.01Normalization is

nearly correct (≈1%)

Temperature isREMARKABLY

correct (<0.5%)

Page 24: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

SUMMARIZING... SUMMARIZING...

T T

N N

T = 5 keV T = 10 keV

best

C + M

standard

Page 25: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

•Background has to be modeled

•Cash statistic has to be used

•Probability distributions have to

be joined in a particular way

SUMMARIZING... SUMMARIZING...

Page 26: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

FURTHER ADVANTAGES INFURTHER ADVANTAGES INMODELING BACKGROUND MODELING BACKGROUND

•NO pn OoT subtraction

•NO errors propagation

•MORE information about BKG

Page 27: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

1. SPECTRAL ANALYSIS OF LOW

SURFACE BRIGHTNESS SOURCES

2. BACKGROUND MODELING IN

A HARD BAND (ABOVE 2 keV)

SUMMARYSUMMARY

Page 28: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

1. SPECTRAL ANALYSIS OF LOW

SURFACE BRIGHTNESS SOURCES

2. BACKGROUND MODELING IN

A HARD BAND (ABOVE 2 keV)

SUMMARYSUMMARY

Page 29: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

OUR BACKGROUND MODELOUR BACKGROUND MODEL

•NXB continuum

•NXB fluorescence emission lines

•Cosmic extragalactic background

Page 30: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

OUR BACKGROUND MODELOUR BACKGROUND MODEL

Page 31: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

OUR BACKGROUND MODELOUR BACKGROUND MODEL

NXB continuum + fluorescence lines

Cosmic X-ray background

Page 32: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

OUR BACKGROUND MODELOUR BACKGROUND MODEL

NXB continuum + fluorescence lines

Cosmic X-ray background

Page 33: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

OUR BACKGROUND MODELOUR BACKGROUND MODEL

NXBNXBEPIC - MOS1

N σN

EPIC – MOS2 N σN

EPIC - pn N σN

Closed 57.7 1.7 57.3 1.7 97.5 3.9

Blank fields

57.5 ± 1.4 4.3 57.2 ± 1.7 5.1 95.1 ± 2.4 7.1

Clusters 60.9 ± 1.4 8.0 60.9 ± 1.2 6.6 100.1 ± 2.5 14.1

CXBEPIC - MOS1

N σN

EPIC – MOS2 N σN

EPIC - pn N σN

Expected 7.82 1.8 7.84 1.8 4.58 1.3

Blank fields 7.65 ± 0.47 1.4 7.26 ± 0.52 1.6 4.38 ± 0.48 1.4

Clusters 10.17 ± 0.42 2.4 9.72 ± 0.43 2.4 6.54 ± 0.29 1.7

Page 34: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

OUR BACKGROUND MODELOUR BACKGROUND MODEL

NXBEPIC - MOS1

N σN

EPIC – MOS2 N σN

EPIC - pn N σN

Closed 57.7 1.7 57.3 1.7 97.5 3.9

Blank fields 57.5 ± 1.4 4.3 57.2 ± 1.7 5.1 95.1 ± 2.4 7.1

Clusters 60.9 ± 1.4 8.0 60.9 ± 1.2 6.6 100.1 ± 2.5 14.1

CXBCXBEPIC - MOS1

N σN

EPIC – MOS2 N σN

EPIC - pn N σN

Expected 7.82 1.8 7.84 1.8 4.58 1.3

Blank fields

7.65 ± 0.47 1.4 7.26 ± 0.52 1.6 4.38 ± 0.48 1.4

Clusters10.17 ±

0.422.4 9.72 ± 0.43 2.4 6.54 ± 0.29 1.7

Page 35: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

OUR BACKGROUND MODELOUR BACKGROUND MODEL

NXB continuum + fluorescence lines

Cosmic X-ray background

Page 36: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

NXB continuum + fluorescence lines

Cosmic X-ray background

OUR BACKGROUND MODELOUR BACKGROUND MODEL

NXB continuum + fluorescence lines

Cosmic X-ray background

Cluster residual thermal component

Page 37: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

OUR BACKGROUND MODELOUR BACKGROUND MODEL

NXBEPIC - MOS1

N σN

EPIC – MOS2 N σN

EPIC - pn N σN

Closed 57.7 1.7 57.3 1.7 97.5 3.9

Blank fields 57.5 ± 1.4 4.3 57.2 ± 1.7 5.1 95.1 ± 2.4 7.1

Clusters 60.9 ± 1.4 8.0 60.9 ± 1.2 6.6 100.1 ± 2.5 14.1

CXBCXBEPIC - MOS1

N σN

EPIC – MOS2 N σN

EPIC - pn N σN

Expected 7.82 1.8 7.84 1.8 4.58 1.3

Blank fields

7.65 ± 0.47 1.4 7.26 ± 0.52 1.6 4.38 ± 0.48 1.4

Clusters10.17 ±

0.422.4 9.72 ± 0.43 2.4 6.54 ± 0.29 1.7

Page 38: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

OUR BACKGROUND MODELOUR BACKGROUND MODEL

NXBEPIC - MOS1

N σN

EPIC – MOS2 N σN

EPIC - pn N σN

Closed 57.7 1.7 57.3 1.7 97.5 3.9

Blank fields 57.5 ± 1.4 4.3 57.2 ± 1.7 5.1 95.1 ± 2.4 7.1

Clusters 60.9 ± 1.4 8.0 60.9 ± 1.2 6.6 100.1 ± 2.5 14.1

CXBCXBEPIC - MOS1

N σN

EPIC – MOS2 N σN

EPIC - pn N σN

Expected 7.82 1.8 7.84 1.8 4.58 1.3

Blank fields

7.65 ± 0.47 1.4 7.26 ± 0.52 1.6 4.38 ± 0.48 1.4

Clusters 8.51 ± 0.58 3.3 7.71 ± 0.57 3.2 4.76 ± 0.41 2.5

Page 39: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

OUR BACKGROUND MODELOUR BACKGROUND MODEL

EPIC – MOS1 EPIC – MOS2 EPIC - pn

CL BF SO CL BF SO CL BF SO

Cr 8.510.4

12.2

3.8 9.210.4

6.811.0

10.6

Mn 6.6 7.610.4

8.5 7.5 6.2 --- --- ---

Fe 9.3 8.2 7.6 7.9 9.3 7.5 9.012.4

11.7

Ni 4.0 4.1 3.6 7.9 6.1 5.1126

.128

.126

.

Cu 4.6 5.0 5.5 2.2 4.5 3.9883

.887

.877

.

Zn 9.3 3.6 6.9 3.4 4.1 5.497.9

97.1

93.9

Au10.3

10.6

12.4

12.2

8.9 7.9 --- --- ---

NXB FLUORESCENCE LINES

CL = closed – BF = blank fields – SO = sources (clusters)

Page 40: Background treatment in spectral analysis of low surface brightness sources Alberto Leccardi & Silvano Molendi Garching, 2 nd May 2006 EPIC background

•Background has to be modeled

•Cash statistic has to be used

•Probability distributions have to

be joined in a particular way

SUMMARY SUMMARY