power-point presentation template · sample prep. drop on grid / grid on drop . coda-cerva on-grid...

AutoEM-toolbox

NanoDefine Outreach September 20th 2017

Brussels Toni Uusimäki, Ralf Kaegi

Eawag

Typical workflow

Sample prep. Image acquisition Image analysis

Image acquisition

Toni Uusimäki, Ralf Kaegi

Achievements of NanoDefine

Image analysis Thorsten Wagner

sample prep.

drop on grid / grid on drop

CODA-CERVA

on-grid centrifugation

USN e-depo. Electrospray

AutoEM-toolbox TEM mode

Main Tab Calibrations

User Interface

Camera parameters

AutoEM-toolbox TEM mode

UI

Live PSD Live view

ParticleSizer results

3D Segmenation 3D recorded images

AutoEM-toolbox TEM mode

TEM bright field image of Au/SiO2 NPs Pixel size: 2.95 nm FOV: 3 µm

A mosaic collection of TEM images (35x10, 1.4 gb) with FOV 0.11 mm x 0.3 mm

AutoEM-toolbox STEM mode

STEM HAADF image of SiO2 NPs (ERM-FD304) Pixel size: 1.17 nm FOV: 1.2 µm

A mosaic collection of STEM images (10x5, 0.2 gb) with FOV 12 µm x 6 µm

AutoEM-toolbox STEM EDS mode

- User chooses the elements and defines Cutoff values for the peaks - The EDS spectra integrated from the SI image is smoothed and an optimized Gaussian curve is fitted to the peak - If the peak is above the cutoff value, the feret min value will be added to the PSD

AutoEM-toolbox STEM EDS mode

Au/Si NPs (5x4) FOV 5 µm x 4 µm

PSD of Au NPs

PSD of Si NPs

AutoEM-toolbox TEM EFTEM mode Thickness Map

ZLP image Unfiltered image Thickness Map t/λ

𝑡𝑡λ = ln

𝐼𝐼𝐼𝐼0

, λ = 106𝐹𝐹 𝐸𝐸0

𝐸𝐸𝑀𝑀�

𝑙𝑙𝑙𝑙 2𝐸𝐸0𝛽𝛽𝐸𝐸𝑀𝑀�

=155.5 nm,

Ref: Egerton & Chang, Ultramicroscopy 21 (1987) 231-244

𝐹𝐹 = 1+𝐸𝐸0 1022�

1+ 𝐸𝐸0511�

2, 𝐸𝐸𝑀𝑀 = 7.6𝑍𝑍𝑒𝑒𝑒𝑒𝑒𝑒0.36

λ = 𝑚𝑚𝑚𝑚𝑚𝑚𝑚𝑚 𝑓𝑓𝑓𝑓𝑚𝑚𝑚𝑚 𝑝𝑝𝑚𝑚𝑡𝑡𝑝, 𝑡𝑡 = 𝑡𝑡𝑝𝑡𝑡𝑡𝑡𝑡𝑡𝑚𝑚𝑚𝑚𝑡𝑡𝑡𝑡, 𝐼𝐼 = 𝑢𝑢𝑚𝑚𝑓𝑓𝑡𝑡𝑢𝑢𝑡𝑡𝑚𝑚𝑓𝑓𝑚𝑚𝑢𝑢 𝑡𝑡𝑚𝑚𝑚𝑚𝑖𝑖𝑚𝑚, 𝐼𝐼0= 𝑍𝑍𝑍𝑍𝑍𝑍 𝑡𝑡𝑚𝑚𝑚𝑚𝑖𝑖𝑚𝑚 𝐸𝐸0 = 𝑡𝑡𝑚𝑚𝑡𝑡𝑡𝑡𝑢𝑢𝑚𝑚𝑚𝑚𝑡𝑡 𝑚𝑚𝑚𝑚𝑚𝑚𝑓𝑓𝑖𝑖𝑒𝑒 𝑜𝑜𝑓𝑓 𝑚𝑚𝑢𝑢𝑚𝑚𝑡𝑡𝑡𝑡𝑓𝑓𝑜𝑜𝑚𝑚𝑡𝑡

AutoEM-toolbox TEM: Thickness maps

Illite NPs 3D image extracted from the Thickness Map

AutoEM-toolbox TEM EFTEM mode

Illite NPs (10x12, 2 gb) FOV 47 µm x 57 µm

PSD XY analysis

PSD 3D analysis

AutoEM-toolbox

STEM TEM

EELS

EDS Core Loss Imaging

Thickness Map

Particle Sizer

Custom Tasks

Elemental composition

Elemental composition

Elemental composition

Thickness (Z)

Size (XY)

x50 = 180 nm

AutoEM-toolbox: A little treaser

BaSO4 – TiO2

AutoEM-toolbox

STEM TEM

EELS

EDS Core Loss Imaging

Thickness Map

Particle Sizer

Custom Tasks

Elemental composition

Elemental composition

Elemental composition

Thickness (Z)

Size (XY)

www.NanoDefine.eu

This project has received funding from the European Union’s Seventh Programme for research, technological development and demonstration under grant agreement No 604347