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A laser-cooled electron source for single-shot femtosecond X-ray and electron diffraction Luiten, O.J. Published in: Proceedings of the Paul Scherrer Instituut (PSI), 29 november 2010, Villingen, Switzerland Published: 01/01/2010 Document Version Publisher’s PDF, also known as Version of Record (includes final page, issue and volume numbers) Please check the document version of this publication: • A submitted manuscript is the author's version of the article upon submission and before peer-review. There can be important differences between the submitted version and the official published version of record. People interested in the research are advised to contact the author for the final version of the publication, or visit the DOI to the publisher's website. • The final author version and the galley proof are versions of the publication after peer review. • The final published version features the final layout of the paper including the volume, issue and page numbers. Link to publication General rights Copyright and moral rights for the publications made accessible in the public portal are retained by the authors and/or other copyright owners and it is a condition of accessing publications that users recognise and abide by the legal requirements associated with these rights. • Users may download and print one copy of any publication from the public portal for the purpose of private study or research. • You may not further distribute the material or use it for any profit-making activity or commercial gain • You may freely distribute the URL identifying the publication in the public portal ? Take down policy If you believe that this document breaches copyright please contact us providing details, and we will remove access to the work immediately and investigate your claim. Download date: 14. Jul. 2018

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A laser-cooled electron source for single-shotfemtosecond X-ray and electron diffractionLuiten, O.J.

Published in:Proceedings of the Paul Scherrer Instituut (PSI), 29 november 2010, Villingen, Switzerland

Published: 01/01/2010

Document VersionPublisher’s PDF, also known as Version of Record (includes final page, issue and volume numbers)

Please check the document version of this publication:

• A submitted manuscript is the author's version of the article upon submission and before peer-review. There can be important differencesbetween the submitted version and the official published version of record. People interested in the research are advised to contact theauthor for the final version of the publication, or visit the DOI to the publisher's website.• The final author version and the galley proof are versions of the publication after peer review.• The final published version features the final layout of the paper including the volume, issue and page numbers.

Link to publication

General rightsCopyright and moral rights for the publications made accessible in the public portal are retained by the authors and/or other copyright ownersand it is a condition of accessing publications that users recognise and abide by the legal requirements associated with these rights.

• Users may download and print one copy of any publication from the public portal for the purpose of private study or research. • You may not further distribute the material or use it for any profit-making activity or commercial gain • You may freely distribute the URL identifying the publication in the public portal ?

Take down policyIf you believe that this document breaches copyright please contact us providing details, and we will remove access to the work immediatelyand investigate your claim.

Download date: 14. Jul. 2018

I

GFA and SwissFEL Accelerator Seminar

A laser-cooled electron source for single-shot femtosecond X-ray

and electron diffraction

Monday, 29 November 2010, 16.00 h, WBGB/019 Dr. Jom Luiten Eindhoven University of Technology,

Eindhoven, Netherlands

In 2009 the first hard X-ray Free Electron Laser (XFEL) has become operational – LCLS at Stanford University – which enables recording the full diffraction pattern of a tiny protein crystal in a single, few-femtosecond shot. This is an enormously important development but it requires a large-scale facility and investments at the national, if not the international, level. For reasons of size, costs and accessibility of the setup a small-scale XFEL, affordable by a university laboratory, would be highly desirable. A promising route towards a small-scale XFEL is the development of low-emittance electron sources, which enable lasing at reduced electron energies. We have developed a new, ultracold pulsed electron source, based on near-threshold photo-ionization of a laser-cooled gas. The source is characterized by an effective electron temperature of ~10 K, almost three orders of magnitude lower than conventional sources. This should enable normalized RMS emittances 1-2 orders of magnitude lower than photocathode sources, at comparable bunch charge. I will discuss the properties of this new source and the possible implications for XFELs. Another route we are investigating is to use electrons directly. Electrons and X-rays both enable the study of structural dynamics at atomic length scales, yet the information that can be extracted by probing with either electrons or X-rays is quite different and, in fact, complementary. A pulsed electron source with the XFEL capability of performing single-shot, femtosecond diffraction would therefore be highly desirable as well. The primary obstacle facing the realization of such an electron source is the inevitable Coulomb expansion of the bunch, leading to loss of temporal resolution. We have developed a method, based on radio-frequency (RF) techniques, to invert the Coulomb expansion. We will report on the first experiments demonstrating RF compression of 0.25 pC, 100 keV electron bunches to sub-100 fs bunch lengths. We have used these bunches to produce high-quality, single-shot diffraction patterns of poly-crystalline gold. By combining the laser-cooled, ultracold electron source with RF acceleration and bunch compression techniques, single-shot, femtosecond studies of the structural dynamics of macromolecular crystals will become possible with electrons as well.

Artist’s impression of a laser-cooled RF photogun.

Contact: Romain Ganter (5279)

29 Nov 2010 PSI - SwissFEL 1

A laser-cooled electron source for

single-shot femtosecond

X-ray and electron diffraction

Jom Luiten

29 Nov 2010 PSI - SwissFEL 2

Thijs van Oudheusden – PhD student

Peter Pasmans – PhD student

Wouter Engelen – PhD student

Adam Lassise – PhD student

Marloes van der Heijden – Master student

Joris Kanters – Master student

Bas van der Geer, Marieke de Loos – Pulsar Physics (GPT)

Peter Mutsaers

Edgar Vredenbregt

Netherlands Technology

Foundation

NL Foundation for Fundamental

Research on Matter

FEI Company

Technical support

Louis van Moll

Jolanda van de Ven

Eddie Rietman

Ad Kemper

Harry van Doorn

29 Nov 2010 PSI - SwissFEL 3

resolve atomic length and time scales:

Structural dynamics...

CeO2 catalyst nanoparticle Myoglobin

1 Å @ 100 fs

29 Nov 2010 PSI - SwissFEL 4

X-ray or electron pulse

ultrafast diffraction

X-ray or electron pulse

29 Nov 2010 PSI - SwissFEL 5

radiation damage, repeatability → single-shot!

ultrafast diffraction

29 Nov 2010 PSI - SwissFEL 6

Linac Coherent Light Source at SLACX-FEL based on last 1-km of existing linac

1.5-15 Å Free Electron Laser

OPERATIONAL

29 Nov 2010 PSI - SwissFEL 7

Coherent Diffractive Imaging of Biomolecules

29 Nov 2010 PSI - SwissFEL 8

29 Nov 2010 PSI - SwissFEL 9LCLS…

29 Nov 2010 PSI - SwissFEL 10

Modern day cathedrals…

X-ray light sources: modern day cathedrals…

29 Nov 2010 PSI - SwissFEL 11

…how about small chapels?

29 Nov 2010 PSI - SwissFEL 12

5 cmu

undulator

1 0 G e V1 0

21 0 m

2

u

ra d

Single-pass X-ray FEL

~ k Ap ea k

I

→ single-pass gain

29 Nov 2010 PSI - SwissFEL 13

Electron beam emittance:

Why ultracold?

xx p

n x

m c

~4

n ra d

x

Single-pass gain →

Overlap between electron and X-ray beam…

29 Nov 2010 PSI - SwissFEL 14

Electron beam emittance:

Why ultracold?

xx p

n x

m c

~4

n ra d

x

Single-pass gain →

…lower normalized emittance → less acceleration.

29 Nov 2010 PSI - SwissFEL 15

Electron beam emittance:

Why ultracold?

xx p

n x

m c

~4

n ra d

x

Single-pass gain →

s o u rc e 2

e

n

kT

m c

…lower normalized emittance → less acceleration.

29 Nov 2010 PSI - SwissFEL 16

Electron beam emittance:

Why ultracold?

xx p

n x

m c

~4

n ra d

x

s o u rc e 2

e

n

kT

m c

Single-pass gain →

cannot be reduced

very much

(bunch charge)

29 Nov 2010 PSI - SwissFEL 17

so u rce 2

e

n

kT

m c

Electron beam emittance:

Why ultracold?

xx p

n x

m c

~4

n ra d

x

500× lower!!

Single-pass gain →

cannot be reduced

very much

(bunch charge)

29 Nov 2010 PSI - SwissFEL 18

so u rce 2

e

n

kT

m c

Electron beam emittance:

Why ultracold?

xx p

n x

m c

~4

n ra d

x

500× lower!!

Single-pass gain →

Cold source → compact X-FEL!

cannot be reduced

very much

(bunch charge)

29 Nov 2010 PSI - SwissFEL 19

Laser-cooled charged particle source

29 Nov 2010 PSI - SwissFEL 20

I I

Magneto-Optical Trap (MOT)

N ≤ 1010 Rb atoms,

R = 1 mm, n ≤ 1018 m-3

T < 0.001 K

29 Nov 2010 PSI - SwissFEL 21

Te

Ultracold Plasma

I I Electron temperature

Killian et al., PRL 83, 4776 (1999)

ekT

1 p s 1 0 Ke

T

29 Nov 2010 PSI - SwissFEL 22

V

Rb+ e-

V

I I

Ultracold beams!

Te≈ 5000 K (0.5 eV) → 10 K

conventional

photo & field

emission sources

Claessens et al., PRL 95, 164801 (2005)

Emittance ~n e

T

~20× lower than

conventional sources

29 Nov 2010 PSI - SwissFEL 23

Moreover...

• Each shot a new source – no cathode problems;

• Up to 10 nA average current: 10 pC @ 1kHz;

• Ionization volume fully controlled by laser beam

overlap;

• ultracold ion bunches → model system for space

charge dynamics.

29 Nov 2010 PSI - SwissFEL 24

Ultracold electron beams

• photo-ionization experiments

• implications for compact X-FEL

Outline

Single-shot, femtosecond electron diffraction

• RF bunch compression

• ultracold electron source

29 Nov 2010 PSI - SwissFEL 25

Ultracold beam experiments

29 Nov 2010 PSI - SwissFEL 26

Ultracold beam experiments

Claessens et al., PRL 95, 164801 (2005);

Claessens et al., Phys. Plasmas 14, 093101 2007;

Taban et al., PRSTAB 11, 050102 (2008);

Reijnders et al., PRL 102, 034802 (2009);

Taban et al., EPL91, 46004 (2010);

Reijnders et al., PRL 105, 034802, (2010).

29 Nov 2010 PSI - SwissFEL 27

Ultracold beam experiments

2 cm

cathode

UHV

UHV

laser beams

(trapping, ionization)

-30 kV

300 pse-

29 Nov 2010 PSI - SwissFEL 28

z = 50 mm

Accelerator

VA ≤ 30 kV

y

z

1 m

MCP

Ultracold beam experiments

Solenoidal lens

y = 50 mm

Phosphorscreen

29 Nov 2010 PSI - SwissFEL 29

2928-01-2010

σxi = 30 μm

U = 2.1 keV

F = 1.13 kV/cm

λ = 474 nm

T = 405 ± 43 K

Solenoid Current (A)

RM

S b

ea

m s

ize

(m

m)

Photo-ionization experiment:

beam waist scans @ fixed energy

Te=35 K

29 Nov 2010 PSI - SwissFEL 30

0 0

1 14

e x c

FE h c R y

F

Excess energy

0

1 1h c

0

4F

R yF

0

0

0

0F 0F

3 / 25 P

1 / 25 S

R b

→ Stark shift0F

Electric field strength F

29 Nov 2010 PSI - SwissFEL 31

29 Nov 2010 PSI - SwissFEL 32

Te≈10 K

29 Nov 2010 PSI - SwissFEL 33

Implications for X-FEL: GPT simulations

RF cavity

• 2-cell

• S-band

• 50 MV/m

• with laser ports

29 Nov 2010 PSI - SwissFEL 34

rf-i

nco

up

ler

RF cavity

• 2-cell

• S-band

• 50 MV/m

• with laser ports

Implications for X-FEL: GPT simulations

29 Nov 2010 PSI - SwissFEL 35

rf-i

nco

up

ler

MOT coils

RF cavity

• 2-cell

• S-band

• 50 MV/m

• with laser ports

Implications for X-FEL: GPT simulations

29 Nov 2010 PSI - SwissFEL 36

rf-i

nco

up

ler

MOT coils

Lasers:

• Excitation

• Ionization RF cavity

• 2-cell

• S-band

• 50 MV/m

• with laser ports

Implications for X-FEL: GPT simulations

29 Nov 2010 37PSI - SwissFEL

Initial conditions

Charge 1-100 pC

MOT Density 1018/m3

Ionizaton volume Uniform in r

Parabolic in z

Aspect ratio (R/L) 1:10

Ionization time 1 ps

Initial temperature 10 K

Cavity parameters

Maximum field 50 MV/m

Field-balance 1:1

2 R

1½ L

Implications for X-FEL: GPT simulations

1 p C 5 8 mQ R m

1 0 0 p C 2 7 0 mQ R m

29 Nov 2010 PSI - SwissFEL 38

-20 0 20 40 60 80 100

GPT z [mm]

0.01

0.1

1

cente

r 10%

slice

-20 0 20 40 60 80 100

GPT z [mm]

0.01

0.1

1

rms e

mitta

nce [m

icro

n] rms-emittance

center 10%

Acceleration of 100 pC to 2 MeV

?

Implications for X-FEL: GPT simulations

Er, color coded on z

electronsions

Emittance compensation schemes?

29 Nov 2010 PSI - SwissFEL 39

4

radn

21

2

2

2

Ku

rad

g

u

FEL

L

34

1

rad

u

g

IeK

mcL

m

2

32

2342

3

1

FELI

e

mcP

2

e

mcFEL

W

2

2

Wz

QI

/max

Basic FEL equations:

29 Nov 2010 PSI - SwissFEL 40

Charge 100 1 pC

Maximum field 50 20 MV/m

Slice emittance 0.1 0.02 micron

Assumed peak current 1 0.1 kA

Wavelength 0.5 0.1 nm

Energy 1.3 1.3 GeV

ρFEL 0.005 0.0016

λU 4 0.8 mm

Gain Length 37 23 mm

Power (1D) 6 0.2 GW

Repetition rate (1011/s) 0.1 10 kHz

Two scenarios: high and low charge

29 Nov 2010 PSI - SwissFEL 41

Single-shot femtosecond

electron diffraction

29 Nov 2010 PSI - SwissFEL 42

SINGLE SHOT

polycrystalline Au foil

0.1 pC (106 e) , 100 keV

29 Nov 2010 PSI - SwissFEL 43

average of 20 single shot pictures

polycrystalline Au foil

29 Nov 2010 PSI - SwissFEL 44

SINGLE SHOT

polycrystalline Au foil

0.1 pC (106 e) , 100 keV

(200) (311)

(111) (220)

29 Nov 2010 PSI - SwissFEL 45

9 nm Au foil

U = 95 keV

Q = 0.2 pC

Van Oudheusden et al.,

PRL (2010)

29 Nov 2010 PSI - SwissFEL 46

Why use electrons?

29 Nov 2010 PSI - SwissFEL 47

X-rays:Thomson scattering

Electrons:Rutherford scattering

Complementary information!

high density, bulk gas phase, surfaces

2 9 26 .6 1 0 m

T

2 4 21 0 m

R

29 Nov 2010 PSI - SwissFEL 48

Electrons vs X-rays

Property Electrons (100 keV) Hard X-rays (10 keV)

Wavelength / Å 0.04 1.2

Mechanism radiation

damage

Secondary electron

emission

Photoelectric effect

Ratio (inelastic/elastic)

scattering

3 10

Energy deposited per

elastic event

1 >1000

Elastic mean free path 1 105-106

29 Nov 2010 PSI - SwissFEL 49

Electrons vs X-rays

Property Electrons (100 keV) Hard X-rays (10 keV)

Wavelength / Å 0.04 1.2

Mechanism radiation

damage

Secondary electron

emission

Photoelectric effect

Ratio (inelastic/elastic)

scattering

3 10

Energy deposited per

elastic event

1 >1000

Elastic mean free path 1 105-106

1000× less radiation damage per count!

29 Nov 2010 PSI - SwissFEL 50

Electrons vs X-rays

Property Electrons (100 keV) Hard X-rays (10 keV)

Wavelength / Å 0.04 1.2

Mechanism radiation

damage

Secondary electron

emission

Photoelectric effect

Ratio (inelastic/elastic)

scattering

3 10

Energy deposited per

elastic event

1 >1000

Elastic mean free path 1 105-106

106 electrons sufficient for single-shot diffraction!

29 Nov 2010 PSI - SwissFEL 51

Electrons – why not?

29 Nov 2010 PSI - SwissFEL 52

Electrons – why not?

Source brightness & Coulomb forces

29 Nov 2010 PSI - SwissFEL 53

femtosecond laser photoemission...

100 μm

106 electrons from 100 μm spot

29 Nov 2010 PSI - SwissFEL 54

...electron bunch acceleration...

E = 10 MV/m

100 μm

106 electrons from 100 μm spot & 10 MV/m

29 Nov 2010 PSI - SwissFEL 55

...electron bunch acceleration...

100 μm

E = 10 MV/m

29 Nov 2010 PSI - SwissFEL 56

...electron bunch acceleration...

100 μm

E = 10 MV/m

29 Nov 2010 PSI - SwissFEL 57

... and irreversible space-charge blow-up!

...electron bunch acceleration...

100 μm

E = 10 MV/m

29 Nov 2010 PSI - SwissFEL 58

100 μmx

y

Laser

intensity

Luiten et al., PRL 93, 094802 (2004)

Shaped fs laser pulse...

29 Nov 2010 PSI - SwissFEL 59

...evolution into uniform ellipsoid.

100 μm

Luiten et al., PRL 93, 094802 (2004)

→ linear & reversible Coulomb expansion

29 Nov 2010 PSI - SwissFEL 60

U = 95 keV, Q = 0.2 pC

hard-edged, uniform ellipsoids

Thijs van Oudheusden, TU/e:

Phosphor screen image integrated

over y-direction

phosphor screen image

x →

y →

29 Nov 2010 PSI - SwissFEL 61

hard-edged, uniform ellipsoids

Thijs van Oudheusden, TU/e:

Phosphor screen image integrated

over y-direction

Parabola

phosphor screen image

x →

y →

U = 95 keV, Q = 0.2 pC

29 Nov 2010 PSI - SwissFEL 62

Bunch compression with 3 GHz RF cavity in TM010 mode

Ez-field BF-field Ez-field

x

yz

29 Nov 2010 PSI - SwissFEL 63

TM010 : Ez-field TM010 : BF-field

x

y

Ez

Bunch compression with 3 GHz RF cavity in TM010 mode

29 Nov 2010 PSI - SwissFEL 64

RF cavity

Bunch compression with 3 GHz RF cavity in TM010 mode

F e E x

yz

29 Nov 2010 PSI - SwissFEL 65

RF cavity

Bunch compression with 3 GHz RF cavity in TM010 mode

F e E x

yz

29 Nov 2010 PSI - SwissFEL 66

RF cavity

Bunch compression with 3 GHz RF cavity in TM010 mode

F e E x

yz

29 Nov 2010 PSI - SwissFEL 67

RF cavity

Bunch compression with 3 GHz RF cavity in TM010 mode

F e E x

yz

29 Nov 2010 PSI - SwissFEL 68

RF cavity

Bunch compression with 3 GHz RF cavity in TM010 mode

F e E x

yz

29 Nov 2010 PSI - SwissFEL 69

RF cavity

Bunch compression with 3 GHz RF cavity in TM010 mode

F e E x

yz

29 Nov 2010 PSI - SwissFEL 70

3 GHz RF cavity

longitudinal E-field

50 fs

100 kV

Van Oudheusden et al., JAP 102, 093501 (2007)

The setup

29 Nov 2010 PSI - SwissFEL 71

The setup

29 Nov 2010 PSI - SwissFEL 72

TM110 : Ez-field TM110 : Bx,By-field

x

y

Ez

RF cavity TM110 mode

Bunch length measurement with RF streak cavity

29 Nov 2010 PSI - SwissFEL

v

B

Bunch length measurement with RF streak cavity

x,ty

z

RF cavity in TM110 mode

transverse B field

73

F ev B

29 Nov 2010 PSI - SwissFEL 74

Cavity off

x,ty

z

RF cavity in TM110 mode

transverse B field

Limitation temporal resolution:

v

29 Nov 2010 PSI - SwissFEL 75

Cavity off

x,ty

z

RF cavity in TM110 mode

transverse B field

10 µm slit to improve temporal resolution

v

29 Nov 2010 PSI - SwissFEL 76

10 µm slit to improve temporal resolution

Cavity on

x,ty

zB

F e v B

RF cavity in TM110 mode

transverse B field

v

29 Nov 2010 PSI - SwissFEL 77

Streak image on screen

Streak cavity on cavity off

29 Nov 2010 PSI - SwissFEL 78

RF bunch compression

Van Oudheusden et al.,

PRL (2010)

29 Nov 2010 PSI - SwissFEL 79

RF bunch compression

67 fs!

Van Oudheusden et al.,

PRL (2010)

29 Nov 2010 PSI - SwissFEL 80

10 μm slit

100 fs fit

67 fs fit

streak

Van Oudheusden et al.,

PRL (2010)

29 Nov 2010 PSI - SwissFEL 81

10 μm slit

100 fs fit

67 fs fit

streak

Van Oudheusden et al.,

PRL (2010)

Limited by streak cavity!

29 Nov 2010 PSI - SwissFEL 82

coherence length ≤ 1nm sufficient

→ conventional photocathode source OK!

Crystals of atoms or small molecules:

29 Nov 2010 PSI - SwissFEL 83

Crystals of biomolecules…

a = 5-10 nm

coherence length ≥ 10 nm required

→ ultracold electron source!

29 Nov 2010 PSI - SwissFEL 84

Summary

• Ultracold laser-cooled electron source:Te ≈ 10 K;

• Ultracold source interesting for compact X-FEL;

• Single-shot, sub-ps electron diffraction demonstrated;

• RF compression of 100 keV, 0.1 pC bunches: 10 ps →100 fs;

• Ultracold source & RF bunch compression → single-shot,

femtosecond electron diffraction of biomolecules.