a 1.25-gb/s digitally-controlled dual-loop clock and data recovery circuit with improved effective...
TRANSCRIPT
A 1.25-Gb/s Digitally-Controlled Dual-Loop Clock and Data Recovery Circuit with Improved Effective Phase Resolution
Chang-Kyung Seong1), Seung-Woo Lee2), and Woo-Young Choi1)
1)Department of Electronic and Electrical EngineeringYonsei University
2)Switching Technology TeamElectronics and Telecommunications Research Institute
High-Speed Circuits and Systems Lab. Yonsei Univ.
Contents
Introduction Conventional Dual-Loop CDR and Problems Proposed Dual-Loop CDR Simulation and Experimental Results Chip summary Conclusion
High-Speed Circuits and Systems Lab. Yonsei Univ.
Introduction (1)
Multi-channel application (e.g. Switch) Dozens ~ Hundreds of CDRs integrated in single die
Requirements for CDR Small die area Low power consumption Robustness to noise coupled from adjacent blocks
Switch Core Logics
Tx / Rx for each channel
Switch Core Logics
High-Speed Circuits and Systems Lab. Yonsei Univ.
Introduction (2)
CDR #1
Padexternal reference clock
Data#1
Data#2
Data#3
Data#4Retimed Data #4
Recovered Clock #4
Retimed Data #3Recovered Clock #3
Retimed Data #2Recovered Clock #2
Retimed Data #1Recovered Clock #1
Synthesized Reference Clock
CDR #2
CDR #3
CDR #4
Ref. PLL
Dual-loop CDR Shared Reference PLL Each CDR cores using phase interpolator
• No jitter accumulation• Digital control - no loop filter, robustness to noise
High-Speed Circuits and Systems Lab. Yonsei Univ.
Conventional Digitally-Controlled Dual-Loop Structure
Phase Controller
Bang-BangPhase Detector
Phase Selection
Phase Interpolator
Multi-Phase Reference Clock from PLL
Data in.
PFD CP
VCO
LF
/M
External Reference ClockRef. PLL
CDR core
Two Selected Phases
High-Speed Circuits and Systems Lab. Yonsei Univ.
Reference Clock from PLL
Conventional Digitally-Controlled Dual-Loop Structure
Phase Controller
Bang-BangPhase Detector
Phase Selection
Phase Interpolator
Data in.
PFD CP
VCO
LF
/M
External Reference ClockRef. PLL
CDR core
Two Selected Phases
Phase Selection
Phase Interpolator
PhaseInterpolated
High-Speed Circuits and Systems Lab. Yonsei Univ.
Conventional Digitally-Controlled Dual-Loop Structure
RetimedData
RecoveredClock
UP/DN
Phase Controller
Bang-BangPhase Detector
Phase Selection
Phase Interpolator
Reference Clock from PLL
Data in.
PFD CP
VCO
LF
/M
External Reference ClockRef. PLL
CDR core
Two Selected Phases
Bang-BangPhase Detector
UP
DN
High-Speed Circuits and Systems Lab. Yonsei Univ.
Effect of Phase Resolution
Jitter Generation Quantization error
• Digitally-Controlled CDR generates “discontinuous phase”
Jitter generation 1 / Phase Resolution∝
< Behavioral Simulation using CPPSIM* >
Quantization error
* M. H. Perrott, “Fast and accurate behavioral simulation of fractional-N synthesizers and other PLL/DLL circuits,” Design Automation Conference, pp.498-503, Jun. 2002.
High-Speed Circuits and Systems Lab. Yonsei Univ.
Effect of Phase Resolution
Jitter Suppression and Frequency Offset Tracking Higher (more fine) phase resolution
• Smaller phase steps
• Narrower Loop Bandwidth
• More jitter rejection and Slower offset tracking
Phase resolution
Jitter generation
Jitter suppression
Frequency offset tolerance
∴
High-Speed Circuits and Systems Lab. Yonsei Univ.
Limit of Phase Resolution in Phase Interpolator
Two control methods Binary-weighted code
• 2N levels, Simple but Phase overshoot
Thermometer code• N+1 levels, Complex but no Phase overshoot
,where N = bit width of control word
< Phase overshoot when large current sources are instantly turned on>
Difficult to increase phase resolution of PI higher than 16-level, or 4-bit.∴
High-Speed Circuits and Systems Lab. Yonsei Univ.
Design Goals
Achieving sufficiently high phase resolution with little additional power consumption and die area
By using only 4-phase reference clocks and 16-level thermometer coded PI
High-Speed Circuits and Systems Lab. Yonsei Univ.
Proposed Structure
Digitally-Controlled Delay Buffer (DCDB) is inserted for higher phase resolution
Phase Controller
Bang-BangPhase Detector
Phase Interpolator
Digitally-ControlledDelay Buffer
Up/DownFilter
4-Phase Reference Clock from PLL
Data in.
RecoveredClock
RetimedData 2:1 MUX 2:1 MUX
High-Speed Circuits and Systems Lab. Yonsei Univ.
Digitally-Controlled Delay Buffer
Current-starved inverter, or buffer Linearly variable delay for control codes
Digitally-ControlledDelay Buffer
Control Code (2-bit)
InputClock
DelayedClock
Input Clock
Delayed Clock
Adjacent interpolated phases
High-Speed Circuits and Systems Lab. Yonsei Univ.
Digitally-Controlled Delay Buffer
Current-starved inverter, or buffer Linearly variable delay for control codes
Digitally-ControlledDelay Buffer
Control Code (2-bit)
InputClock
DelayedClock
Input Clock
Delayed Clock
Adjacent interpolated phases
High-Speed Circuits and Systems Lab. Yonsei Univ.
Enhancement of Phase Resolution
4X higher phase resolution by combining PI and DCDB
Ntotal phase = Nreference phase × NPI resolution × NDCDB resolution
= 4-level × 16-level × 4-level = 256-level (8-bit)
Interpolatedphase
Delayedphase
Interpolated phases
High-Speed Circuits and Systems Lab. Yonsei Univ.
Enhancement of Phase Resolution
4X higher phase resolution by combining PI and DCDB
Interpolatedphase
Delayedphase
Ntotal phase = Nreference phase × NPI resolution × NDCDB resolution
= 4-level × 16-level × 4-level = 256-level (8-bit)
Interpolated phases
High-Speed Circuits and Systems Lab. Yonsei Univ.
Delay Error of DCDB
Interpolatedphase
Delayedphase
Interpolatedphase
Delayedphase
Negative error (shorter delay than desired one)
Positive error (longer delay than desired one)
High-Speed Circuits and Systems Lab. Yonsei Univ.
Delay Error of DCDB
Interpolatedphase
Delayedphase
Interpolatedphase
Delayedphase
Negative error (shorter delay than desired one)
Positive error (longer delay than desired one)
High-Speed Circuits and Systems Lab. Yonsei Univ.
Delay Error of DCDB
Interpolatedphase
Delayedphase
Interpolatedphase
Delayedphase
Negative error (Shorter delay than desired one)
Positive error (Longer delay than desired one)
High-Speed Circuits and Systems Lab. Yonsei Univ.
Sensitivity - Jitter Generation vs. Delay Error of DCDB
Behavioral simulation - CPPSIM, Circuit-level simulation - HSPICE Relatively flat jitter generation for wide range of DCDB error Why?
Effect of enhanced phase resolution > Effect of locally wrong phase movements
High-Speed Circuits and Systems Lab. Yonsei Univ.
Die Photo
< Die Photo >
255㎛
165㎛
High-Speed Circuits and Systems Lab. Yonsei Univ.
Experiment – Jitter vs. Delay error of DCDB
DCDB error = -50% DCDB error = 0% DCDB error = +50%
Measured waveform of recovered clock at 200ppm frequency offset
(-50%) (0%) (+50%)
High-Speed Circuits and Systems Lab. Yonsei Univ.
Experiment - Jitter Suppression
27-1 PRBS transmitted through 2m PCB trace and 3.5m cable. In 200ppm frequency offset
< Transmitted eye pattern > < Retimed data of CDR >
114.3psP-P
424psRMS
38.89 psP-P
212 psRMS
High-Speed Circuits and Systems Lab. Yonsei Univ.
Summary of Prototype Chip
Process
Supply
Data Rate
Offset Tolerance
Power Consumption
0.18 ㎛ CMOS
17.8mW (CDR core)
2.0V
1.25-Gb/s
±400ppm
Die Area (CDR core) 255×165 ㎛ 2
High-Speed Circuits and Systems Lab. Yonsei Univ.
Conclusion
A novel method to enhance phase resolution is proposed.
By combining PI and DCDB, phase resolution can be enhanced with little additional power consumption and die area.
In both simulations and chip measurement, jitter performance is not sensitive to delay error of DCDB.
High-Speed Circuits and Systems Lab. Yonsei Univ.
Thank You !!