2d chalcogenide epitaxy by gas source chemical vapor ... 24 webinar.pdfapr 24, 2018 · 2d...
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2D Chalcogenide Epitaxy by Gas Source Chemical Vapor Deposition
Tanushree H. Choudhury
Research Associate, Thin Films MOCVD2D Crystal Consortium – Materials Innovation Platform
2018 2DCC Webinar
April 24, 2018
2DCC Framework2DCC Framework…… where we fit in!
Gas Source Chalcogenide
CVD
EllipsometryRaman
SpectroscopyPhotoluminescence
mip.psu.edu
Thin Film - MOCVD PersonnelFaculty
Joan Redwing Joshua Robinson
Postdoctoral Scholar
Mikhail Chubarov
Graduate Students
Natalie BriggsGaSe
Azimkhan KozhakhmetovNbS2, Epi-graphene
Xiaotian ZhangWSe2
Jeffrey KronzCVD Graphene
Kehao ZhangPowder Vaporization MoS2
Research Associate
Tanushree Choudhury
F. Xia, et al. Nature Photonics 27 (2014) 899
Layered materials….beyond graphene
Covalent bonds within layer
Layers held together by van der Waals forces
Can form stable monolayer and few layer films
Bulk CrystalsFilms
Wide range of electronic properties
Transition metal dichalcogenides
(TMDs)MoS2, WSe2, WS2, MoSe2, WTe2, etc.
Layer number-dependent properties
A.K. Geim and I.V. GrigorievaNature 499 (2013) 419
Heterostructures without lattice matching
Interlayer exciton coupling
P. Rivera et al.Nature Comm. 6 (2015) 6242
2D TMDs – Intriguing Properties & Physics
Valley polarization
Linyou CaoMRS Bulletin 40 (2015) p. 592.
Xiao, et al. Phys. Rev. Lett. 108 (2012) 196802
Coulomb engineering
A. Raja, et al.Nature Comm. 6 (2017) 15251
A. Splendiani, et al.Nano Lett 10 (2010) 1271
2D tunnel diodes and transistors
T. Roy, et al. ACS Nano 9 (2015) 2071.
Flexible electronicsTom Jackson (PSU)
2D TMDs – Promising Applications
Exciton-based photonics
Linyou CaoMRS Bulletin 40 (2015) p. 592. D. Jariwala, et al.
ACS Photonics 4 (2017) 2962.
Thin film photovoltaics
Excitonic transistorsSaptarshi Das (PSU)
Chem/bio sensors
F. Perkins, et al.Nano Lett. 13 (2013) 668.
2D TMDs – How to get monolayers?
J. Wang et al. in “2D Materials – Synthesis, Characterization and Potential Application,” (2016)
15 x 22 mm MoS2 ($300) – 2dsemiconductors.com
+ =
Exfoliation of bulk crystals
Powder vapor transport
F. Zhang, et al. 2D Materials 4 (2017) 025029
CVD/MOCVD Equipment Basics
Sources (liquid and solid) are outside chamber in temperature and pressure-controlled “bubblers” to precisely control source vapor pressure.
Hydride gases (SiH4, NH3, AsH3, H2Se, H2S, etc.) used to minimize carbon incorporation.
Vent/run assembly –used to establish steady state gas flows and switching.
Reaction chamber –typically cold wall to prevent source pre-reaction.
Pressure control of chamber –typically from milliTorr to atmospheric pressure.Image: Wikipedia
Highly toxic!
Pyrophoric!
Ventilated enclosure with toxic gas & flame detectors2016 2DCC Webinar: MOCVD Growth of 2D Chalcogenides: Challenges and Opportunities
Substrate
H2 Carrier Gas
W, Mo, S, Se Precursors
Gas Source CVD/Metalorganic CVD
• Cold wall vertical and horizontal reactor designs
• CFD simulations used to model fluid, heat and mass transport
Tungsten W(CO)6, WCl6Molybdenum Mo(CO)6Niobium NbCl5Selenium (CH3)2Se, H2SeSulfur (C2H5)2S, H2S
• Focused on understanding impact of precursor chemistry on growth and properties of TMD films
Substrates for TMD “Epitaxy”
D. Dumcenco, et al. ACS Nano (2015)
MoS2 on (0001) sapphireSubstrate/Film a (Å)
Sapphire 0.476SiC 0.307GaN 0.319hBN 0.250MoS2 0.316WS2 0.316WSe2 0.332
Mismatch~-0.4%(3x3) MoS2/(2x2)Al2O3
Mismatch~13%
D. Ruzmetov, et al. ACS Nano (2015)MoS2 on (0001) GaN
Epitaxial growth of large area TMD monolayers
• Growth of large area, single crystal TMD monolayers and heterostructures needed to advance device technologies
• Transition metals and chalcogens have very different vapor pressures
• Suitable substrate needed to provide template for “epitaxy”
• Growth conditions must promote lateral growth of domain edges with minimal bilayer nucleation
Challenges/requirements:
epitaxial orientation lateral domain growth coalescence
Three Step Process for WSe2 Monolayers
Nucleation Stage Ripening Stage Lateral Growth Stage30 s 5 min 45 min
Substrate temperature: 800˚C, H2Se flow rate 7 sccm (Se/W~26,000), Reactor pressure: 700 Torr
Nucleation Stage: • High initial partial pressure of W(CO)6 to
drive nucleation.
Ripening Stage:• Annealing in H2Se to promote surface
diffusion and uniform WSe2 domain size.
Lateral Growth Stage:• Lower partial pressure of W(CO)6 to enable
lateral domain growth without additional nucleation.
X. Zhang, et al. Nano Lett. 18 (2018) 1049
1 μm
Ripening of WSe2 islandsNucleation stage: 30 sec at W(CO)6=1.2x10-3 sccm, H2Se=7 sccm, 800oC, 700 TorrRipening stage: 0 to 45 mins at H2Se=7 sccm only
Ripening and Surface Diffusion
𝑟𝑟 𝑡𝑡 = 𝑟𝑟 0 1 +𝑡𝑡𝜏𝜏
1/3𝜌𝜌 𝑟𝑟 = 0, 𝑡𝑡 = 𝜌𝜌 𝑟𝑟 = 0,0
1
1 + 𝑡𝑡𝜏𝜏
2D Ripening Model:
Domain size (r): Cluster density (ρ):
Estimate of surface diffusion coefficient:
• Diffusing species may be adatoms or small clusters
LD ≈ ⁄1 2 Lav where Lav ≈ ⁄1 𝜌𝜌LD = 2 𝐷𝐷𝑡𝑡
𝜌𝜌 ≈1
16𝐷𝐷𝑡𝑡 𝐷𝐷 ≈ 1.2x10−14 ⁄𝑐𝑐𝑐𝑐2 𝑠𝑠𝑠𝑠𝑐𝑐
*similar to Pt cluster diffusivity on sapphire at 600oC (P. Wynblatt, et al. Prog. Solid State Chem 9, 21 (1975)).
Lateral Growth of WSe2 Islands
Coalescence of monolayer in < 1 hour Bilayer growth rate increases after
~50% monolayer coverage
Preferred direction Commensurability
Nucleation stage: 30 sec at W(CO)6=1.2x10-3 sccm, H2Se=7 sccm, 800oC, 700 TorrRipening stage: 10 mins at H2Se=7 sccm onlyLateral growth stage: 5-45 mins at W(CO)6=2.7x10-4 sccm, H2Se=7 sccm, 800oC, 700 Torr
Coalesced film
1L
2L
Lateral Growth – Effect of Substrate Temperature
Lateral growth rate independent of temperature from ~700-900oC
Suggests growth limited by mass transport of W-precursor to surface
Shape evolution related to Se:W ratio
Increase H2Se to 10 sccm
S. Wang, Chem. Mater. 2014, 26 (22), 6371–6379
Nucleation stage: 30 sec at W(CO)6=1.2x10-3 sccm, H2Se=7 sccm, 800oC, 700 TorrRipening stage: 10 mins at H2Se=7 sccm only, 800oC, 700 TorrLateral growth stage: 10 mins at W(CO)6=2.7x10-4 sccm, H2Se=7 sccm, 600-900oC, 700 Torr
Epitaxial Orientation – In-Plane XRD• Conventional Bragg-Brentano XRD challenging for 2D monolayers
Epitaxial Relationship: (11�20)WSe2 // (11�20)sapphire
ω-2θBragg-Brentano
In-Plane XRDφ-scan FWHM=0.28o
M. Chubarov, et al. Nanotech. 29 (2018) 055706.
TEM Characterization of WSe2
• Water-based transfer process used to remove WSe2 from sapphire
(developed by Fu Zhang and Nasim Alem at Penn State)
anti-phase boundary
• Anti-phase boundaries in WSe2 due to coalescence of 0o and 60o domains
F. Zhang, et al. Nanotech. 29 (2017) 025602
Grain boundaries in TMD monolayers
H. Yu et al. Small 2017, 13, 1603005
0° + 60° → anti-phase grain boundary (metallic)0° + 0° → perfect crystal
0° + 0°
0° + 60°
Epitaxy of WSe2 on hBN flakes
0 50 100 150 200 250
Cou
nts
Angle (degree)
Three-step growth: 60 sec. nucleation, 10 mins ripening, 45 mins lateral growth at 800oC, 7 sccm H2Se
fully coalesced region
2 µm
Add TEM from Fu
~80% preferred orientation
2 nm2 nmReduced number of anti-phasegrain boundaries for WSe2 on hBN
Fu Zhang and Nasim Alem
Anti-phase boundary No grain boundary
0o + 60o 0o + 0o
1.45 1.50 1.55 1.60 1.65 1.70 1.75
Inte
nsity
(a.u
.)
Energy (eV)
1.65
1.45 1.50 1.55 1.60 1.65 1.70 1.75
Energy (eV)
Nor
mal
ized
Inte
nsity
(a.u
.)
1.64
1.62
1.60
0 1 2 3 40
1
2
3
4
5
x-axis (µm)
y-ax
is (µ
m)
1.58
1.60
1.62
1.64
1.66
0 1 2 3 4 50
1
2
3
4
5
x-axis (µm)y-
axis
( µm
)
1.58
1.60
1.62
1.64
1.66FWHM ≈ 55 meV
PL peak = 1.606 ± 0.017 eV
FWHM ≈ 90-130 meV
Photoluminescence
PL peak = 1.656 ± 0.002 eV
WSe2 on sapphire
1L
2L
1L2L
WSe2 on hBN
Promising approach but limited by lack of large area hBN substrates or templates
Process scale-upUpgraded III-V MOCVD system - Converted to chalcogenides
Glove box for sample loading/unloading
Integrated toxic gas detection system
Gas panel with vent/run manifolds, 6 bubblers for liquid/solid sources, 4 gas source lines (H2Se, H2S)
Cold wall reactor for 2” diameter substrates with rotation
WS2 on 2” sapphire
Material capabilities: WS2, MoS2, NbS2
WSe2, MoSe2, NbSe2
WTe2, MoTe2
Doping, alloys, heterostructures
1L
2L
Room temperature PL
WS2 epitaxy on sapphire
750°C
800°C
850°C
Pressure: 50 Torr, Duration: 60 min, W(CO)6 = 5.7x 10-4 sccm, H2S = 160 sccm, S:W = 270000
M. Chubarov, et al. Nanotech. 29 (2018) 055706.
900°C
950°C
1000
°C
Pressure: 50 Torr, Duration: 60 min, W(CO)6 = 5.7x 10-4 sccm, H2S = 160-320 sccm
1L
2L
The chalcogen concentrations plays an important role in obtaining epitaxy.
(3030) α – Al2O3
(1010) WS2
(1010) WS2
H2S= 320 sccm
H2S= 160 sccm
Edge
Center
Edge
Center
Edge
1L
2L
(Mo,W)S2 monolayers, alloys and heterostructures
Photoluminescence: (Mo,W)S2
850oC
In-Plane XRD: WS2 on sapphire
1L
2L
sapp
hire
λ = 532 nm
WS2
MoS2
(Mo,W)S2 alloysAFM: WS2 on sapphire
MoS2/WS2 heterostructures
Growth temperature: 850-1000°C, Reactor Pressure: 50 Torr,W(CO)6 = 10-4-10-5 sccm, Mo(CO)6 = 10-3-10-2 sccm H2S = 400 sccm, H2 carrier gas
ADF-STEM image (S. Bachu, D. Hickey and N. Alem)
Mo (dark)
WS2
Defect mediated growth
Growth of TMDPlasma treatment to
induce defects
Pristine Plasma treatedPressure: 50 Torr, Duration: 20 min, W(CO)6 = 5.7x 10-4 sccm, H2S = 400 sccm
Epitaxial graphene
In collaboration with Prof. Joshua Robinson, Prof. Adri van Duin and Prof. Eric Hudson (PSU)
Study interaction of defects with precursors to control nucleation sites.
Reactor modelling and simulations
ReaxFF calculations of gas phase kinetics – Prof. Adri van DuinCFD simulations Prof. Yuan Xuan (PSU)
Modelling of gas phase chemistry and flow dynamics to develop predictive capacity
In-situ Characterization
Features
• Cold wall stainless steel chamber• 2 inch wafer growth with mechanical wafer rotation• Transfer chamber with robot arm to transfer sanple between chambers• Ellipsometer for in-situ growth monitoring• Additional analysis chamber for Raman/PL without ambient exposure
Tungsten W(CO)6, WCl6Molybdenum Mo(CO)6Niobium NbCl5Selenium (CH3)2Se, H2SeSulfur (C2H5)2S, H2S
Installation Mid 2018
A national user facility focused on advancing the synthesis of 2D chalcogenides2D chalcogenide monolayers, surfaces and interfaces are emerging as a compelling class of systems with transformative new science that can be harnessed for novel device technologies in next-generation electronics.
An NSF user facility with broad access:
• Open calls for user proposals,• No user fees for U.S. academic or government use• Access to a team of local experts • Webinars, workshops, website resources• Partnership opportunities with PUI, MSI
For more information: mip.psu.edu
State-of-the-art synthesis and in-situ characterization equipment
External user requests: Mono/Bilayer WS2, MoS2, WSe2.
Research proposals: Te based TMDs will be explored.