ASECL Qualification

Oroya2Z PMMA5148LCW

Matt Parker SSD PE

TM

Confidential and Proprietary

J u n e 1 , 2 0 1 5

Matt Parker SSD PE

Table of Contents - Oroya2X ASECL Qualification

Reliability Test Slides

Temp Cycle 2 - 5

UHAST 6 - 9

THB 10 - 13

HTOL 14 - 17

HTSL 18 - 21

THS 22 - 25

Drop Test 26 - 29

VVF 30 - 33

Mechanical Shock - Unpowered 34 - 37

Mechanical Shock - Powered 38 - 41

TM

Confidential and Proprietary 1

Mechanical Shock - Powered 38 - 41

ELFR 42 - 45

Temp Cycle

TM

Confidential and Proprietary 2

Offset (10 bit) - Oroya2X (240 g)Variability Chart for Offset (10 bit)

Offset (10 bit)

-50

-40

-30

-20

-10

0

10

20

30

40

50

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 3

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

0

2

4

6

8

10

12

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

SelfTest (10 bit) - Oroya2X (240 g)Variability Chart for SelfTest (10 bit)

SelfTest (10 bit)

0

10

20

30

40

50

60

70

80

90

100

110

120

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 4

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

-0.1

0.0

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Sensitivity (10 bit - LSB/g) - Oroya2X (240 g)Variability Chart for Sensitivity (10 bit LSB/g)

Sensitivity (10 bit LSB/g)

0.92

0.94

0.96

0.98

1

1.02

1.04

1.06

1.08

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 5

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

-0.002

0.000

0.002

0.004

0.006

0.008

0.010

0.012

0.014

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

1_Baseline

2_Pre_Con

3_650_Cycles

4_1300_Cycles

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

UHAST

TM

Confidential and Proprietary 6

Offset (10 bit) - Oroya2X (240 g)Variability Chart for Offset (10 bit)

Offset (10 bit)

-50

-40

-30

-20

-10

0

10

20

30

40

50

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 7

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

0

2

4

6

8

10

12

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

SelfTest (10 bit) - Oroya2X (240 g)Variability Chart for SelfTest (10 bit)

SelfTest (10 bit)

0

10

20

30

40

50

60

70

80

90

100

110

120

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 8

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

-0.1

0.0

0.1

0.2

0.3

0.4

0.5

0.6

0.7

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Sensitivity (10 bit - LSB/g) - Oroya2X (240 g)Variability Chart for Sensitivity (10 bit LSB/g)

Sensitivity (10 bit LSB/g)

0.92

0.94

0.96

0.98

1

1.02

1.04

1.06

1.08

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 9

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

0.000

0.002

0.004

0.006

0.008

0.010

0.012

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

1_Baseline

2_Pre_Con

3_264_Hrs_UHAST

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

THB

TM

Confidential and Proprietary 10

Offset (10 bit) - Oroya2X (240 g)Variability Chart for Offset (10 bit)

Offset (10 bit)

-50

-40

-30

-20

-10

0

10

20

30

40

50

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 11

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

0

2

4

6

8

10

12

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

SelfTest (10 bit) - Oroya2X (240 g)Variability Chart for SelfTest (10 bit)

SelfTest (10 bit)

0

10

20

30

40

50

60

70

80

90

100

110

120

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 12

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

-0.1

0.0

0.1

0.2

0.3

0.4

0.5

0.6

0.7

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Sensitivity (10 bit - LSB/g) - Oroya2X (240 g)Variability Chart for Sensitivity (10 bit LSB/g)

Sensitivity (10 bit LSB/g)

0.92

0.94

0.96

0.98

1

1.02

1.04

1.06

1.08

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 13

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

0.000

0.005

0.010

0.015

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

1_Baseline

2_Pre_Con

3_504_Hrs_THB

4_1008_Hrs_THB

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

HTOL

TM

Confidential and Proprietary 14

Offset (10 bit) - Oroya2X (240 g)Variability Chart for Offset (10 bit)

Offset (10 bit)

-50

-40

-30

-20

-10

0

10

20

30

40

50

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 15

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

-2

0

2

4

6

8

10

12

14

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

SelfTest (10 bit) - Oroya2X (240 g)Variability Chart for SelfTest (10 bit)

SelfTest (10 bit)

0

10

20

30

40

50

60

70

80

90

100

110

120

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 16

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

-0.1

0.0

0.1

0.2

0.3

0.4

0.5

0.6

0.7

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Sensitivity (10 bit - LSB/g) - Oroya2X (240 g)Variability Chart for Sensitivity (10 bit LSB/g)

Sensitivity (10 bit LSB/g)

0.92

0.94

0.96

0.98

1

1.02

1.04

1.06

1.08

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 17

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

-0.002

0.000

0.002

0.004

0.006

0.008

0.010

0.012

0.014

0.016

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

1_Baseline

2_Pre_Con

3_504_Hrs_HTOL

4_1008_Hrs_HTOL

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

HTSL

TM

Confidential and Proprietary 18

Offset (10 bit) - Oroya2X (240 g)Variability Chart for Offset (10 bit)

Offset (10 bit)

-50

-40

-30

-20

-10

0

10

20

30

40

50

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 19

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

-2

0

2

4

6

8

10

12

14

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

SelfTest (10 bit) - Oroya2X (240 g)Variability Chart for SelfTest (10 bit)

SelfTest (10 bit)

0

10

20

30

40

50

60

70

80

90

100

110

120

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 20

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

-0.1

0.0

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Sensitivity (10 bit - LSB/g) - Oroya2X (240 g)Variability Chart for Sensitivity (10 bit LSB/g)

Sensitivity (10 bit LSB/g)

0.92

0.94

0.96

0.98

1

1.02

1.04

1.06

1.08

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 21

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

-0.001

0.000

0.001

0.002

0.003

0.004

0.005

0.006

0.007

0.008

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

1_Baseline

2_504_Hrs_HTSL

3_1008_Hrs_HTSL

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

THS

TM

Confidential and Proprietary 22

Offset (10 bit) - Oroya2X (240 g)Variability Chart for Offset (10 bit)

Offset (10 bit)

-50

-40

-30

-20

-10

0

10

20

30

40

50

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 23

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

-2

0

2

4

6

8

10

12

14

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

SelfTest (10 bit) - Oroya2X (240 g)Variability Chart for SelfTest (10 bit)

SelfTest (10 bit)

0

10

20

30

40

50

60

70

80

90

100

110

120

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 24

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

-0.1

0.0

0.1

0.2

0.3

0.4

0.5

0.6

0.7

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Sensitivity (10 bit - LSB/g) - Oroya2X (240 g)Variability Chart for Sensitivity (10 bit LSB/g)

Sensitivity (10 bit LSB/g)

0.92

0.94

0.96

0.98

1

1.02

1.04

1.06

1.08

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 25

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Std Dev

-0.002

0.000

0.002

0.004

0.006

0.008

0.010

0.012

0.014

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

1_Baseline

2_Pre_Con

3_504_Hrs_THS

4_1008_Hrs_THS

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Drop Test

TM

Confidential and Proprietary 26

Offset (10 bit) - Oroya2X (240 g)Variability Chart for Offset (10 bit)

-50

-40

-30

-20

-10

0

10

20

30

40

50

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 27

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

0

2

4

6

8

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

SelfTest (10 bit) - Oroya2X (240 g)Variability Chart for SelfTest (10 bit)

0

10

20

30

40

50

60

70

80

90

100

110

120

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 28

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

-0.1

0.0

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Sensitivity (10 bit - LSB/g) - Oroya2X (240 g)Variability Chart for Sensitivity (10 bit LSB/g)

0.92

0.94

0.96

0.98

1

1.02

1.04

1.06

1.08

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 29

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

-0.001

0.000

0.001

0.002

0.003

0.004

0.005

0.006

0.007

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

VVF

TM

Confidential and Proprietary 30

Offset (10 bit) - Oroya2X (240 g)Variability Chart for Offset (10 bit)

-50

-40

-30

-20

-10

0

10

20

30

40

50

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 31

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

0

2

4

6

8

10

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

SelfTest (10 bit) - Oroya2X (240 g)Variability Chart for SelfTest (10 bit)

0

10

20

30

40

50

60

70

80

90

100

110

120

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 32

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

0.0

0.1

0.2

0.3

0.4

0.5

0.6

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Sensitivity (10 bit - LSB/g) - Oroya2X (240 g)Variability Chart for Sensitivity (10 bit LSB/g)

0.92

0.94

0.96

0.98

1

1.02

1.04

1.06

1.08

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 33

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

0.000

0.002

0.004

0.006

0.008

0.010

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Mechanical Shock

(Unpowered)

TM

Confidential and Proprietary 34

(Unpowered)

Offset (10 bit) - Oroya2X (240 g)Variability Chart for Offset (10 bit)

-50

-40

-30

-20

-10

0

10

20

30

40

50

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 35

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

0

2

4

6

8

10

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

SelfTest (10 bit) - Oroya2X (240 g)Variability Chart for SelfTest (10 bit)

0

10

20

30

40

50

60

70

80

90

100

110

120

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 36

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

-0.1

0.0

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Sensitivity (10 bit - LSB/g) - Oroya2X (240 g)Variability Chart for Sensitivity (10 bit LSB/g)

0.92

0.94

0.96

0.98

1

1.02

1.04

1.06

1.08

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

TM

Confidential and Proprietary 37

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

0.000

0.002

0.004

0.006

0.008

0.010

0.012

Test

Amb Cold Hot Amb Cold Hot Amb Cold Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Mechanical Shock

(Powered)

TM

Confidential and Proprietary 38

(Powered)

Offset (10 bit) - Oroya2X (240 g)Variability Chart for Offset (10 bit)

-50

-40

-30

-20

-10

0

10

20

30

40

50

Test

Amb Cold Hot Amb Cold Hot Temp

TM

Confidential and Proprietary 39

Temp

Qual_1 Qual_2 Cell

ASECL Assembly

-1

0

1

2

3

4

5

6

7

8

Test

Amb Cold Hot Amb Cold Hot Temp

Qual_1 Qual_2 Cell

ASECL Assembly

Variability Chart for SelfTest (10 bit)

0

10

20

30

40

50

60

70

80

90

100

110

120

Test

Amb Cold Hot Amb Cold Hot Temp

SelfTest (10 bit) - Oroya2Z (480 g)

TM

Confidential and Proprietary 40

Temp

Qual_1 Qual_2 Cell

ASECL Assembly

-1

0

1

2

3

4

5

6

7

8

Test

Amb Cold Hot Amb Cold Hot Temp

Qual_1 Qual_2 Cell

ASECL Assembly

Sensitivity (10 bit - LSB/g) - Oroya2X (240 g)Variability Chart for Sensitivity (10 bit LSB/g)

0.8

0.85

0.9

0.95

1

1.05

1.1

1.15

1.2

Test

Amb Cold Hot Amb Cold Hot Temp

TM

Confidential and Proprietary 41

Temp

Qual_1 Qual_2 Cell

ASECL Assembly

0.00

0.02

0.04

0.06

0.08

0.10

Test

Amb Cold Hot Amb Cold Hot Temp

Qual_1 Qual_2 Cell

ASECL Assembly

ELFR

TM

Confidential and Proprietary 42

Offset (10 bit) - Oroya2X (240 g)Variability Chart for Offset (10 bit)

-50

-40

-30

-20

-10

0

10

20

30

40

50

Test

Hot Hot Hot TestStep

TM

Confidential and Proprietary 43

TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

-0.5

0.0

0.5

1.0

1.5

2.0

2.5

3.0

3.5

4.0

Test

Hot Hot Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

SelfTest (10 bit) - Oroya2X (240 g)Variability Chart for SelfTest (10 bit)

0

10

20

30

40

50

60

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TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

0.0

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Test

Hot Hot Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

Sensitivity (10 bit - LSB/g) - Oroya2X (240 g)Variability Chart for Sensitivity (10 bit LSB/g)

0.92

0.94

0.96

0.98

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TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

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Test

Hot Hot Hot TestStep

Qual_1 Qual_2 Std Cell

ASECL ATK1 Assembly

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