weekly group meeting report renjie chen supervisor: prof. shadi a. dayeh

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Weekly Group Meeting Report Renjie Chen Supervisor: Prof. Shadi A. Dayeh

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Page 1: Weekly Group Meeting Report Renjie Chen Supervisor: Prof. Shadi A. Dayeh

Weekly Group Meeting Report

Renjie Chen

Supervisor: Prof. Shadi A. Dayeh

Page 2: Weekly Group Meeting Report Renjie Chen Supervisor: Prof. Shadi A. Dayeh

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Summary

• Starting from early last week, I was working on the Ni-InGaAs diffusion study. There are several problems faced when I start to repeat the process: failure of bonding, HSQ writing condition changes, and Cl-ICP etching condition shift.

• My target was to: (1) Start with 3 set of new samples, make the bonding work

(2) Dose test for Fin writing with HSQ

(3) Modify Cl-ICP etching condition

Page 3: Weekly Group Meeting Report Renjie Chen Supervisor: Prof. Shadi A. Dayeh

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Process of Ni-InGaAs Study

Plan

Anneal Temp Fin Width Time Sequence

220’C20nm, 40nm, 60nm, 80nm,

100nm, 150nm,

200nm, 500nm

10min, 20min, 40min, 60min, 90min,120min

250’C (repeat)

5min, 10min, 20min, 40min, 60min, 90min

280’C2min, 5min, 10min,

20min, 40min, 60minDiffusion

Process

1st EBL - Markers 2nd EBL – Ni lines 3rd EBL – Fin

Page 4: Weekly Group Meeting Report Renjie Chen Supervisor: Prof. Shadi A. Dayeh

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Dose Test for HSQ

• Surface Cleaning: Dip in CD30, 10min• Spin-coating: 6000rpm (2000rpm/s), 60s• Bake: 80’C for 4min • Developing: 80’C (measured to be 50’C) HDMS for 30s

Test parameters:

Recipe

• Writing Dosage: 750, 1000, 1250, 1500, 1750, 2000 uC/cm2

• Directly on InGaAs surface & on Ni lines• One & two layers writing on Ni lines for protection• Room temperature & 80’C developing

Results:

• No much difference of writing on Ni lines or directly on InGaAs• 1750 uC/cm2 is good for one layer writing, 1250 uC/cm2 for 2 layers• Room temperature development gives more residuals • Current resolution of HSQ fin width ~ 28 nm

Page 5: Weekly Group Meeting Report Renjie Chen Supervisor: Prof. Shadi A. Dayeh

750 uC/cm2

1 layer lines on Ni750 uC/cm2

2 layer lines on Ni

1000 uC/cm2

1 layer lines on Ni1000 uC/cm2

2 layer lines on Ni

Page 6: Weekly Group Meeting Report Renjie Chen Supervisor: Prof. Shadi A. Dayeh

1250 uC/cm2

1 layer lines on Ni1250 uC/cm2

2 layer lines on Ni

1500 uC/cm2

1 layer lines on Ni1500 uC/cm2

2 layer lines on Ni

Page 7: Weekly Group Meeting Report Renjie Chen Supervisor: Prof. Shadi A. Dayeh

1750 uC/cm2

1 layer lines on Ni1750 uC/cm2

2 layer lines on Ni

2000 uC/cm2

1 layer lines on Ni2000 uC/cm2

2 layer lines on Ni

Page 8: Weekly Group Meeting Report Renjie Chen Supervisor: Prof. Shadi A. Dayeh

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Cl-ICP Etching

• Chamber Cleaning: 20min O2 plasma at 200W• Etching condition: 4 mTorr, ICP/RIE=230/30 W, Cl2/N2=2/20 sccm• Etching time: 105 s

Recipe

ICP/RIE=230/30 W ICP/RIE=230/50 W

Page 9: Weekly Group Meeting Report Renjie Chen Supervisor: Prof. Shadi A. Dayeh

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Plan

1. Continue to finish the fabrication of the new set of Ni-InGaAs samples

-- EBL writing for Fin layer, followed by InGaAs dry etching and surface smoothing

-- RTA will be perform at two temperature and different time interval for these 12 samples

-- AFM will be used to measure the surface profile of the reacted Ni-InGaAs

-- Measure & plot the nickelide length with different fin width and reaction time

2. For achieving sub-10nm lines with HSQ

-- Mode 6 (lens 5) writing, writing filed will be 60um x 60um

-- dilute HSQ with MIBK

3. Fabricate the new set of neural probe samples with Ti/Ni/Ti/Ni metal stacking

-- Ti/Ni/Ti/Ni = 20/200/30/50 ?

Page 10: Weekly Group Meeting Report Renjie Chen Supervisor: Prof. Shadi A. Dayeh

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Thank you

Q&A