wafer probing in legnaro/padova e. fioretto laboratori nazionali di legnaro for the lnl-padova spd...
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Wafer probing in Legnaro/PadovaWafer probing in Legnaro/Padova
E. FiorettoE. FiorettoLaboratori Nazionali di LegnaroLaboratori Nazionali di Legnaro
for the for the LNL-Padova SPD Test GroupLNL-Padova SPD Test Group
04/02/2003
E. Fioretto
INFN - LNLSPD Meeting
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Wafer prober locationWafer prober location
SPD Meeting
04/02/2003
E. Fioretto
INFN - LNL
LAE LAE buildingbuilding
Clean Clean roomroom
Probe Probe stationstation
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… … already donealready done
July 2002July 2002
Transfer of the probe station from Padua to Transfer of the probe station from Padua to
LegnaroLegnaro
August 2002August 2002
Chuck upgrade Chuck upgrade → PA150 → PA150 → PA200→ PA200
September 2002September 2002
Tests with the reference chipTests with the reference chip
October 2002October 2002
Contact tests with the Contact tests with the 3 probe card 3 probe card
November 2002November 2002
Contact tests with the ALICE probe cardContact tests with the ALICE probe card + +
DummyDummy
December 2002December 2002
Microscope upgradeMicroscope upgrade
January 2003January 2003
Tests of the Wafer PKVM14TTests of the Wafer PKVM14T
E. Fioretto
INFN - LNL04/02/2002
SPD Meeting
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Microscope upgradeMicroscope upgrade
SPD Meeting
04/02/2003
E. Fioretto
INFN - LNL
The motorization of the microscope and the new EPROM The motorization of the microscope and the new EPROM release for the control unit have been installed last week release for the control unit have been installed last week before Christmas. before Christmas.
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Control software upgradeControl software upgrade
SPD Meeting
04/02/2003
E. Fioretto
INFN - LNL
ProberBench Version 5ProberBench Version 5 WINDOWS 2000WINDOWS 2000
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Contact qualityContact quality
SPD Meeting
04/02/2003
E. Fioretto
INFN - LNL
Needle-printsNeedle-prints
Contact heightContact height
80 80 m below the height of m below the height of first contactfirst contact
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ALICE1LHCb Test ProtocolALICE1LHCb Test Protocol
SPD Meeting
04/02/2003
E. Fioretto
INFN - LNL
Tests carried out on each chip :Tests carried out on each chip :
Current consumptionsCurrent consumptions
JTAG functionalityJTAG functionality
DAC testDAC test
Minimum Threshold (Pre_VTH)Minimum Threshold (Pre_VTH)
Threshold scan of all 8192 pixelsThreshold scan of all 8192 pixels
Probe cardProbe card
MB-cardMB-card
MX
I con
troller
MX
I con
troller
JTA
GJT
AG
Pilot
Pilot
PCPC
VMEVME
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Tests of the Wafer PKVM14TTests of the Wafer PKVM14T
Only 1 dead pixelOnly 1 dead pixel
Pre_VTH = 201Pre_VTH = 201
SPD Meeting
04/02/2003
E. Fioretto
INFN - LNL
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Map of the Wafer PKVM14TMap of the Wafer PKVM14T
SPD Meeting
04/02/2003
E. Fioretto
INFN - LNL
Lot 3Lot 3 Class IClass IClass IIClass IIClass IIIClass III
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Chip classificationChip classification
SPD Meeting
04/02/2003
E. Fioretto
INFN - LNL
Class I - Chips for Bump BondingClass I - Chips for Bump Bonding
JTAG and DAC JTAG and DAC OK OK Mean threshold < 30 mV Mean threshold < 30 mV Pixels missing or defect < 1% (82)Pixels missing or defect < 1% (82)I_anal < 350 mA ; I_dig < 270 mA I_anal < 350 mA ; I_dig < 270 mA
Class III - Chips with major Class III - Chips with major defectsdefectsJTAG and DAC JTAG and DAC not passed not passed Mean threshold not found Mean threshold not found No digital outputNo digital outputI_anal > 350 mA ; I_dig > 270 mAI_anal > 350 mA ; I_dig > 270 mA
Class II - Chips with minor defectsClass II - Chips with minor defectsJTAG and DAC JTAG and DAC OK OK Mean threshold > 30 mV Mean threshold > 30 mV Pixels missing or defect > 1% Pixels missing or defect > 1% (82)(82)One or more columns are missingOne or more columns are missingI_anal < 350 mA ; I_dig < 270 mAI_anal < 350 mA ; I_dig < 270 mA
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Class PopulationClass Population
SPD Meeting
04/02/2003
E. Fioretto
INFN - LNL
Class Population
55%
16%
29%
Class I Class II Class III
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……. more on the Class I. more on the Class I
SPD Meeting
04/02/2003
E. Fioretto
INFN - LNL
79%
7%
2%4%
4% 4%
16 - 21 22 23 24 27 28
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……. more on the Class I. more on the Class I
SPD Meeting
04/02/2003
E. Fioretto
INFN - LNL
Mean NoiseMean Noise
I_digI_dig I_anI_an
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72%
21%
7%
Dead pixels > 1%
Mean Threshold > 30 mV
Dead pixels > 1% and mean Thresh. > 30 mV
……. more on the Class II. more on the Class II
SPD Meeting
04/02/2003
E. Fioretto
INFN - LNLChip 74 Chip 74
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34%
31%
8%
23%
4%
JTAG DAC No current consumption Chip working partially No output
……. more on the Class III. more on the Class III
SPD Meeting
04/02/2003
E. Fioretto
INFN - LNLChip 73Chip 73
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Local Database for the test resultsLocal Database for the test results
SPD Meeting
04/02/2003
E. Fioretto
INFN - LNL
FileMaker ProFileMaker Pro
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What nextWhat next
SPD Meeting
04/02/2003
E. Fioretto
INFN - LNL
Test system validationTest system validation
PetraPetra
Solve the problems related to the use of the Solve the problems related to the use of the
integrated SPD databaseintegrated SPD database
MicheleMichele
New solutions to accelerate the time needed for New solutions to accelerate the time needed for
the chip testthe chip test
Automatic procedure for chip searching Automatic procedure for chip searching
and needle positioningand needle positioning
Next waferNext wafer