Vision-Based MetrologyVision Based Metrology

Vision-Based Metrology History

Vision-Based Metrology refers to the technology using optical sensors and digital image processing hardware and software to: Identify Guide Inspect Measure objects

Vision-Based Metrology History

Vision-Based Metrology inspection systems evolved from the combination of microscopes, cameras and optical comparators

Vision-Based Metrology History Vision-Based Metrology is

extensively used in general industrial applications such as the manufacturing of: Electronics Automotive Aerospace Pharmaceutical Consumer products

Vision-Based Metrology is being utilized in the automatic identification and data collection market as a complementary or alternative technology to traditional laser scanning devices for reading bar codes

Vision-Based Metrology History Early systems were

integrated into packaging lines for optical character recognition and proved to be a reliable way to check the accuracy of product codes and label information.

Today, high-resolution cameras, advances in software and imaging processors, and the availability of powerful, inexpensive compact computers have made vision systems faster and more reliable than ever.

When does a company need a vision system?

Some products require 100-percent product inspection with documented inspection results.

In other cases a vision system may be needed for high production product inspection

Vision systems provide a means of increasing yield-that is, the ratio of good parts to bad parts.

When a serial defect is spotted, the system not only recognizes it but can stop the conveyor and inform the operator of the defect and its magnitude.

The yield factor is particularly important in manufacturing industries that produce large volumes, as in the compact disc and pharmaceutical industries.

Vision-Based Metrology inAutomobile Wrecks

Vision Based Metrology is now being used to focus on the movement of objects along with their deformation

This is being used in many car wreck investigations

Vision-Based Metrology in Automobile Wrecks

Two consecutive images were grabbed from a high speed video sequence

A displacement field of a car at a certain moment is presented

Vision-Based Metrology in Automobile Wrecks

The deformation pattern was obtained from the principle vector analysis.

This analysis allows the representation of the deformation pattern.

Vision-Based Metrology in Weather Patterns

Vision-Based Metrology has also been used to study weather patterns

Flow information from a tornado is able to be extracted for scientists to attempt to learn more about them

ICS/INEX INEX can be traced all the way

back to the early 1900’s when they developed a system called OPTI-Tron which inspected bottle beverages

The OPTI-Tron system would eventually become the OPTISCAN bottle inspector; a worldwide standard in container inspection with thousands of units installed.

The introduction of the company's SuperInspector 1055 became the first commercial machine inspection system to integrate camera and computer technologies

PPT Vision Founded in 1982, PPT

specializes in industrial applications where accuracy, repeatability, high speed and flexibility are important requirements.

They are the world leader in the design and manufacture of completely digital 2D machine vision systems.

PPT's 2D machine vision product line is sold on a global basis to end-users, system integrators, and OEM's

PPT is involved primarily in: Electronics Semiconductor components Automotive Medical devices Pharmaceutical and packaged

goods

Quality Inspection at Work

Polymer Membrane:Note texture defects

Machined Aluminum Bar:Note tool-chatter marks

Stamped Metal Package:Note scratch on grinded surface

Vision System PicturesMissing Fuse

http://www.cranfield.ac.uk/sme/amac/research/metrology/tornado.htmhttp://www.cranfield.ac.uk/sme/amac/research/metrology/carcrush.htmhttp://www.qualitydigest.com/mar98/html/vision.html http://www.rvsi.com/Pages/about.htmhttp://www.inexvision.comhttp://www.pptvision.comhttp://www.visionxinc.com

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