training ppt16

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E R T LR T L

PRESENTED BY-

K I R T I B H U M B E

0 7 1 9 2 3 1 0 3 1

VERIFICATION OF

QUALITY AND

RELIABILITY OF

SEMICONDUCTOR

DEVICES BY TESTING



1. Introduction

2. About the organization

3. Methodology

4. Materials and their technology

4.1 Tektronix 7854 oscilloscope with waveform calculator

4.2 Semiconductor tester

4.3 TESEC 881-TT/A Spectra discrete semiconductor test system4.4 Fluke true rms digital multimeter 289

4.5 Burn in test

5. Conclusion

TABLE OF CONTENTS



INTRODUCTIONThe central problem or the aim is to test and certify the

quality and reliability of semiconductor devices by testing.

The Quality is verified by electrical measurements on

semiconductor components.

Reliability is checked by several conducting tests which

includes physical factors such as temperature, humidity, time

and power dissipation.

The test facilities are

• Automatic Test Equipments,

• Constant current/Voltage sources,

• Pulse generators,

• Wave processing oscilloscope,

• Multimeters



ORGANIZATION

Services provided by ERTL are-

• CCFC (Consumer care and facility center)• CAG (Computer application group)• Environment lab• System lab• Safety lab• Components lab• Burn in lab

• LCR lab• Audio lab• PCB and laminates• Calibration and standardization



METHODOLOGY

QUALITY

RELIABILITY

TESTING

SCREENING



Materials & Technology 1. TEKTRONIX 7854 Oscilloscope with

Waveform Calculator



Up to 16 waveforms can be stored in memory and up to 9 of them

can be displayed at one time.

The Tektronix 7854 Oscilloscope with Waveform Calculator

combines the feature of a high performance plug-in oscilloscope with

a waveform-oriented dedicated-function digital processor.

A mixed (BOTH) mode is provided to display both the real-time

waveforms and the stored waveforms for comparison or

measurement.

Cursors are provided for the stored waveforms to delimit or

identify portions of the waveform to be measured.

Functions such as WIDTH, RISE, ITRP, etc are cursor-dependent.

Operating Voltage – 115-230 V, 48-440 Hz.



2. SEMICONDUCTOR TESTER



The B&K Model 530 Semiconductor Tester is designed for in-

circuit and out-of-circuit semiconductor testing, with special

features for making additional tests on devices out-of-circuit.

It uses a high-current, low duty-cycle pulse technique to testtransistors in the presence of shunting circuitry.

It has a low-current drive system which enables the user to

identify the terminals of the device in most in-circuit tests and all

out-of-circuit checks.

An exceptional feature is the provision for measurement of the

frequency at which the transistor gain is one or unity.

This is the ft rating for a transistor and is applied to bipolar

devices.



3. TESEC 881-TT/A SPECTRA DISCRETE

SEMICONDUCTOR TEST SYSTEM



The 881-TT/A is a high performance universal test

system for discrete semiconductor devices.

When the tester is interfaced to a high-speed handler

or probe, it performs accurate measurements of

devices at high speed.

Features:-

1.4-digit accuracy.

2.CPU for testing and PC for programming.

3.Multi-user operation.

4.High speed A/D converter for all parameters.



4.Fluke True RMS Digital Multimeter 289



The new 289 is the next generation high performance

industrial logging multimeter designed to solve complex

problems in electronics, plant automation, power

distribution, and electro-mechanical equipment. With the ability to log data and review it graphically on-

screen, we can solve problems faster and help minimize

downtime.

Applications/Features:

1. Saved measurements allows us to name and recall

measurements made in the field2. 100 kHz ac bandwidth

3. Measures up to 10A (20 A for 30 seconds; 10A continuous)

4. Temperature function



5.1 Burn in Boards

5. Burn in Test

Burn-In Test is meant to check the reliability of a device for its

lifetime.

After Burn-In the life of a device is reduced by 1.12 years (Given byrrhenius Equation), but the device is assured of its reliability for the

rest of its life.

The Burn In boards are designed to mount the

semiconductor devices on them and supply as

well as distribute the required current and

voltage to all the mounted devices.



5.2 Programming Plugs

The Programming Plug is

designed to distribute thevoltage and current to all thesemiconductor devices mountedon the Burn-In Board.

The Programming Plug alsoconnects the Burn-In Board to

the Burn-In chamber, where thevoltage and current is applied.



5.3 Burn-In Chamber The Burn-In Boards are placed

inside the Burn-In Chamber allthroughout the Burn-In process.

Rated Voltage and Current isapplied to the Burn-In Chamberand it reaches the Burn-In boardsthrough the Programming Plugs



The highly versatile TEKTRONIX 7854 Oscilloscope andaveform Calculator was studied and several activities were

performed to study various input signals, store them and processthem.

CONCLUSION & RESULTS

Several activities were carried out to test the quality and reliabilityof semiconductor devices.

Their electrical parameters were tested using TESEC Discrete

Test System.

The reliability of semiconductor devices was verified by Burn-In

test, Life Operating test was conducted.



T H A N K Y O UH A N K Y O U

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