synthesis of organometallic precursors for wnxcy...
TRANSCRIPT
SYNTHESIS OF ORGANOMETALLIC PRECURSORS FOR WNxCy DEPOSITION AND
DFT STUDY OF GAS PHASE SPECIES IN EQUILIBRIUM WITH CZTSSe
By
ARIJIT KOLEY
A DISSERTATION PRESENTED TO THE GRADUATE SCHOOL
OF THE UNIVERSITY OF FLORIDA IN PARTIAL FULFILLMENT
OF THE REQUIREMENTS FOR THE DEGREE OF
DOCTOR OF PHILOSOPHY
UNIVERSITY OF FLORIDA
2016
© 2016 Arijit Koley
To my family
4
ACKNOWLEDGMENTS
First, I would like to thank Prof. Lisa McElwee-White. From day one she has been a
wonderful mentor. Her extensive knowledge in chemistry and its wide applications added with
her efficiency in learning new science quickly has always amazed me. I thank her for giving me
complete freedom in my research. We had long discussions on solving problems in the research
and what I really appreciated was that, without giving me the solution to the problem she guided
me through it which helped me to become an independent scientist.
I would like to thank my collaborator Prof. Timothy J. Anderson from Department of
Chemical Engineering for helping me understand the engineering aspect of my research. I also
thank his student Christopher O’Donohue for a wonderful collaboration which led to excellent
results.
I would like to thank my committee members Prof. Stephen A. Miller, Prof. Ronald K.
Castellano, Prof. George Christou and Prof. Helena Hagelin-Weaver for their valuable
discussions during my orals and departmental seminars. These discussions have helped me
improve my research.
I would like to thank Prof. Adrian E. Roitberg for helping me get started with the DFT
calculations for my CZTSSe project. I also thank Prof. Daniel R. Talham for his helpful
discussions in the Chemistry of Materials class.
I would like to thank both the present and past members of the McElwee-White group,
Sarah, Joseph, Ciera, Jenny, Randall, Richard, Yung-Chien, Kelsea, Michelle, Duane, Nathan,
Hang, Xiaoming, Chris, Will and Nate. A special thanks to Randall, Richard and Ciera for
mentoring me in when I started my research and Michelle for all her help in completing my
project.
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I would like to extend my thanks to all my professors from my undergraduate and
masters institute. They have always inspired me and provided useful guidance which motivated
me to undergo higher studies.
Finally, I would like to thank my family and friends. First I thank parents and my in-laws
for their constant support, motivation and patience throughout my entire PhD career. A special
thanks goes to my wife Sweta Das and my sister Arpita Koley. They have been the greatest
friends all throughout my life. I also thank my close friends Subhadip Pal, Biswanath Dari,
Debjani Shihi, Tathagata Chowdhury, Amrita Chatterjee and Erika Taretto. They have helped me
a lot during the difficult times of my career.
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TABLE OF CONTENTS
page
ACKNOWLEDGMENTS ...............................................................................................................4
LIST OF TABLES ...........................................................................................................................9
LIST OF FIGURES .......................................................................................................................11
LIST OF ABBREVIATIONS ........................................................................................................15
ABSTRACT ...................................................................................................................................17
CHAPTER
1 INTRODUCTION ..................................................................................................................19
Metal Halides and Carbonyls as Precursors ...........................................................................22 Amido Precursors ...................................................................................................................25
Imido and Hydrazido Precursors ............................................................................................31 Nitrido Precursors ...................................................................................................................39
2 DESIGN AND SYNTHESIS OF WN(NR2)(NRʹ2)(NRʺ
2) PRECURSORS ...........................41
Precursor Design .....................................................................................................................41
WN(NR2)(NiPr2)2 and WN(NR2)2(N
iPr2) ...............................................................................42 X-ray Crystal Structure Determination of 35 .........................................................................44 Design and Synthesis of Volatile Precursors ..........................................................................46
Structural Effects on Precursor Volatility ...............................................................................49 Thermogravimetric Analysis (TGA) of 35 and 36 .................................................................50
Thermolysis of Neat 35 ..........................................................................................................51 Spectroscopic Characterization of Compounds ......................................................................51
Computational Study of the Gas Phase Decomposition of 33 ................................................52 Mass Spectrometry .................................................................................................................54 WNxCy Film Growth from 35 .................................................................................................56 WNxCy Film Composition ......................................................................................................58 WNxCy Film Microstructure ...................................................................................................64
WNxCy Film Surface Roughness ............................................................................................66 WNxCy Film Density Measurements ......................................................................................67
Diffusion Barrier Testing ........................................................................................................69 Conclusion ..............................................................................................................................72 Experimental Section ..............................................................................................................73
General Procedures ..........................................................................................................73 Synthesis of WN(NMe2)(N
iPr2)2 (35) .............................................................................73
Synthesis of WN(NMe2)2(NiPr2) (36) .............................................................................74
General Procedure A .......................................................................................................75 Synthesis of WN(NMe2)(N
iBu2)2 (39) ............................................................................75
7
Synthesis of WN(N(CH2)5)3 (40) ....................................................................................75 Synthesis of WN(N(CH2)6)3 (41) ....................................................................................76 General Procedure B ........................................................................................................76 Synthesis of WN(NEt2)2(N
iPr2) (38) ...............................................................................76
Synthesis of WN(N(CH2)5)2(NiPr2) (42) .........................................................................77
Synthesis of WN(N(CH2)6)2(NiPr2) (43) .........................................................................77
General Procedure C ........................................................................................................78 Synthesis of WN(NEt2)(N
iPr2)2 (37) ...............................................................................78 Synthesis of WN(N(CH2)5)(N
iPr2)2 (45) .........................................................................78
Synthesis of WN(N(CH2)6)(NiPr2)2 (46) .........................................................................79
General Procedure D .......................................................................................................79 Synthesis of WN(NMe2)(N
iPr2)(NiBu2) (49) ..................................................................80
Synthesis of WN(NEt2)(NiPr2)(N
iBu2) (50) ....................................................................80 Synthesis of WN(N(CH2)5)(N
iPr2)(NiBu2) (51) ..............................................................81
Synthesis of WN(N(CH2)6)(NiPr2)(N
iBu2) (52) ..............................................................81
Diffusion Barrier Testing ................................................................................................82 DFT Calculations .............................................................................................................82
Thermolysis of 35 ............................................................................................................83 Crystallographic Structure Determination for 35 ............................................................84
3 CZTSSe: AN OVERVIEW ....................................................................................................85
Photovoltaics ...........................................................................................................................85 Silicon ..............................................................................................................................85
Dye-Sensitized Solar Cells ..............................................................................................86
Perovskites .......................................................................................................................86
Organic Photovoltaics .....................................................................................................87 CIGS, CdTe and CZTSSe ................................................................................................88
Deposition of CZTSSe ............................................................................................................89 Sputtering ........................................................................................................................89 Co-evaporation ................................................................................................................89
Pure Solution ...................................................................................................................90 Nanoparticle Based Deposition .......................................................................................90
Particle-Solution Deposition ...........................................................................................91 Computational Study ..............................................................................................................91
4 DFT STUDY OF GAS PHASE SPECIES IN EQUILIBRIUM WITH CZTSSe ..................94
Computational Methods ..........................................................................................................94
Sulfur Allotropes ....................................................................................................................96 Metal Sulfides .........................................................................................................................99 Metal Selenides .....................................................................................................................107 Bimetallic and Tetrametallic Clusters from Copper, Zinc and Tin ......................................111 Conclusion ............................................................................................................................114
Experimental Section ............................................................................................................114
8
APPENDIX
A NMR SPECTRA OF 35 AND 37 .........................................................................................116
B CRYSTALLOGRAPHIC DATA .........................................................................................118
Crystallographic Data for 35 ................................................................................................118
C COMPUTATIONAL DATA ................................................................................................150
Cartesian Coordinates for the Decomposition Pathway of 35 ..............................................150 Cartesian Coordinates for the Decomposition Pathway of 34 ..............................................168 Cartesian Coordinates for Cu2S and SnS2 ............................................................................184
Cartesian Coordinates for SnSe2 ...........................................................................................185 Cartesian Coordinates for Cu3Sn and Cu3Zn ........................................................................185
LIST OF REFERENCES .............................................................................................................187
BIOGRAPHICAL SKETCH .......................................................................................................196
9
LIST OF TABLES
Table page
2-1 Selected bond lengths (Å) and angles (°) for 35 ................................................................46
2-2 Sublimation conditions, symmetry and compound recovery for 33-47 and 49-52............49
2-3 Selected m/z values from the mass spectra of 33-45 and 45-50. .......................................55
4-1 DFT calculations for S4 (B3LYP/6-31G*) and comparison with literaturea. .....................96
4-2 Calculations for allotropes of sulfur (B3LYP/6-31G*) ......................................................98
4-3 Comparison of enthalpy, entropy, and Gibbs energy of formation of gaseous species
at 298.15 K.a .....................................................................................................................100
4-4 Comparison of enthalpy, entropy, and Gibbs energy of formation of gaseous species
at 670.00 K.a .....................................................................................................................101
4-5 Comparison of enthalpy, entropy, and Gibbs energy of formation of gaseous species
at 3000.00 K.a ...................................................................................................................102
4-6 Comparison of enthalpy, entropy, and Gibbs energy of formation of gaseous species
at 298.15 K.a .....................................................................................................................108
4-7 Comparison of enthalpy, entropy, and Gibbs energy of formation of gaseous species
at 3000.00 K.a ...................................................................................................................109
4-8 Comparison of enthalpy, entropy, and Gibbs energy of formation of gaseous species
at 298.15 K.a .....................................................................................................................113
4-9 Comparison of enthalpy, entropy, and Gibbs energy of formation of gaseous species
at 3000.00 K.a ...................................................................................................................113
B-1 Crystal data and structure refinement for 35 ....................................................................118
B-2 Atomic coordinates (x 104) and equivalent isotropic displacement parameters (Å2 x
103) for 35. U(eq) is defined as one third of the trace of the orthogonalized Uij
tensor. ...............................................................................................................................120
B-3 Bond lengths (Å) and angles (°) for 35 ............................................................................122
B-4 Anisotropic displacement parameters (Å2 x 103) for 35. The anisotropic displacement
factor exponent takes the form: -2π2[ h2 a*2U11 + ... + 2 h k a* b* U12. ........................144
B-5 Hydrogen coordinates (x 104) and isotropic displacement parameters (Å2 x 10 3) for
35......................................................................................................................................146
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C-1 Optimized Cartesian coordinates of the GS in the decomposition pathway of 35. .........150
C-2 Optimized Cartesian coordinates for TS in the decomposition pathway of 35. ..............152
C-3 Optimized Cartesian coordinates for INT1 in the decomposition pathway of 35. ..........155
C-4 Optimized Cartesian coordinates for INT2 in the decomposition pathway of 35. ..........158
C-5 Optimized Cartesian coordinates for INT3 in the decomposition pathway of 35. ..........162
C-6 Optimized Cartesian coordinates for iPr2NH in the decomposition pathway of 35. .......167
C-7 Optimized Cartesian coordinates for the GS in the decomposition pathway of 34. ........168
C-8 Optimized Cartesian coordinates for TS1 in the decomposition pathway of 34. ............170
C-9 Optimized Cartesian coordinates for INT1 in the decomposition pathway of 34. ..........173
C-10 Optimized Cartesian coordinates for TS2 in the decomposition pathway of 34. ............175
C-11 Optimized Cartesian coordinates for INT2 in the decomposition pathway of 34. ..........179
C-12 Optimized Cartesian coordinates for Et2NH in the decomposition pathway of 34. ........183
C-13 Optimized Cartesian coordinates for Cu2S using M06L/LANL2DZ ..............................184
C-14 Optimized Cartesian coordinates for SnS2 using B3LYP/LANL2DZ ............................185
C-15 Optimized Cartesian coordinates for SnSe2 using B3LYP/LANL2DZ ...........................185
C-16 Optimized Cartesian coordinates for SnSe2 using M06L/LANL2DZ .............................185
C-17 Optimized Cartesian coordinates for Cu3Sn using B3LYP/LANL2DZ ..........................185
C-18 Optimized Cartesian coordinates for Cu3Sn using M06L/LANL2DZ ............................186
C-19 Optimized Cartesian coordinates for Cu3Zn using M06L/LANL2DZ ...........................186
11
LIST OF FIGURES
Figure page
1-1 PVD methods. A) Evaporation and B) Sputtering. ............................................................19
1-2 Representation of conformality in coverage of features. ...................................................20
1-3 Schematic diagram of CVD procedure. .............................................................................21
1-4 Reaction of metal chlorides with nitrogen and hydrogen. .................................................23
1-5 Reaction of TiCl4 with ammonia. ......................................................................................23
1-6 Formation of TiCl4•nNH3. .................................................................................................23
1-7 Reaction of TiCl4 with HMDS. ..........................................................................................24
1-8 Formation of W2N from WF6 and ammonia. .....................................................................25
1-9 Possible metallacycles from the intermediate Ti(NMeEt)2. ..............................................27
1-10 Tantalum precursors 3 and 4. .............................................................................................30
1-11 Formation of imido complexes from 5. .............................................................................31
1-12 Group IV bridging imido precursors..................................................................................32
1-13 Structure of 10....................................................................................................................33
1-14 Single source niobium precursors 11-14............................................................................34
1-15 Single source tantalum precursors 15-18. ..........................................................................34
1-16 Single source molybdenum precursors 19-23. ...................................................................35
1-17 Single source tungsten imido precursors 24-26. ................................................................36
1-18 Activation energy (Ea) for film growth vs N-C BDE. .......................................................37
1-19 Bridging imido and guanidinato tungsten precursors 27-29. .............................................37
1-20 Titanium hydrazido complexes, 30 and 31. .......................................................................38
1-21 Tungsten hydrazido precursor 32.......................................................................................39
1-22 Low temperature WNxCy deposition from 33. ...................................................................40
12
2-1 Arrhenius plot of growth rate (G) for films deposited with 33 depicting the two well-
defined growth regimes......................................................................................................42
2-2 Synthesis of 35-38..............................................................................................................43
2-3 Displacement ellipsoids drawing of 35 (molecule A is shown); ellipsoids are drawn
at 50% probability. .............................................................................................................45
2-4 Synthesis of 39-41..............................................................................................................47
2-5 Synthesis of 42-47..............................................................................................................47
2-6 Synthesis of 48 and 38. ......................................................................................................48
2-7 Synthesis of 49-52..............................................................................................................48
2-9 Thermolysis of 35. .............................................................................................................51
2-10 Decomposition pathway for 35. .........................................................................................53
2-11 Decomposition pathway for 34. .........................................................................................54
2-12 Growth kinetics comparing ln(G), where G is growth rate, versus inverse
temperature for films deposited from 33-35. The illustrated error bars are
representative of thickness measurements near the center of the substrate for multiple
samples and measurements. ...............................................................................................57
2-13 Evolution of the W 4f, N 1s, C 1s, and O 1s peaks with deposition temperature using
35. Relevant and nominal material BEs112 are superimposed onto the plots by a stick
pattern. ...............................................................................................................................59
2-14 Influence of precursor structure on the percentage of Nx-W, Ox-W, and Cx-W,
according to XPS peak deconvolution. ..............................................................................61
2-15 Elemental composition for films deposited from 33-35 at various deposition
temperatures, according to XPS. Note differences in concentration scale. .......................63
2-16 A) Grazing Incidence X-ray Diffraction (GIXD) patterns taken for films deposited
using compounds 34 and 35. B) Typical crystallographic planes for relevant
materials with respect to their preferred structures and according to their relative
intensities. ..........................................................................................................................65
2-17 Average surface RMS roughness for films deposited from 33-35. ...................................67
2-18 Correlation between deposition temperature and measured film density for
precursors 33-35.................................................................................................................68
2-19 XRD Patterns for as-deposited and post-annealed Cu/WNxCy/Si material stacks. ...........69
13
2-20 A) Plan-view image of etch-pit test for post-annealed Cu/WNxCy/Si stack at lower
magnification, B) plan-view image of etch-pit test for post-annealed Cu/WNxCy/Si
stack at higher magnification and C) plan-view image of etch-pit test for as-
deposited Cu/ WNxCy/Si stack, and D) image of failed post-annealed Cu/ WNxCy/Si
stack for comparison purposes. ..........................................................................................70
2-21 HRTEM image clearly showing smooth and distinct boundaries for a post-annealed
Cu/WNxCy/Si sample grown from 35. ...............................................................................71
2-22 A schematic of the etch-pit test. .........................................................................................82
3-1 Abundance of photovoltaic elements on earth’s crust. ......................................................88
3-2 Conventional unit cells for Kesterite structures. ................................................................92
4-1 Comparison between Thermocalc and DFT data for sulfur allotropes. .............................99
4-2 Optimized structures for Cu2S (M06L/LANL2DZ) and SnS2 (B3LYP/LANL2DZ). .....100
4-3 Enthalpy of formation of gaseous species as calculated from the SGTE SSUB4
database compared to the energies calculated from DFT at 298.15, 670.00 and
3000.00 K. ........................................................................................................................104
4-4 Entropy of formation of gaseous species as calculated from the SGTE SSUB4
database compared to the energies calculated from DFT at 298.15, 670.00 and
3000.00 K. ........................................................................................................................105
4-5 Gibbs energy of formation of gaseous species as calculated from the SGTE SSUB4
database compared to the energies calculated from DFT at 298.15, 670.00 and
3000.00 K. ........................................................................................................................106
4-6 Optimized geometry for SnSe2 with B3LYP (A) and M06L(B) .....................................107
4-7 Enthalpy of formation of gaseous species as calculated from the SGTE SSUB4
database compared to the energies calculated from DFT at 298.15 and 3000.00 K........110
4-8 Entropy of formation of gaseous species as calculated from the SGTE SSUB4
database compared to the energies calculated from DFT at 298.15 and 3000.00 K........110
4-9 Gibbs free energy of formation of gaseous species as calculated from the SGTE
SSUB4 database compared to the energies calculated from DFT at 298.15 and
3000.00 K .........................................................................................................................111
4-10 Optimized structures for Cu3Sn (A-M06L/LANL2DZ, B-B3LYP/LANL2DZ) and
Cu3Zn (C). ........................................................................................................................112
A-1 1H NMR of 35 (benzene-d6). ...........................................................................................116
A-2 gHMBC spectrum of 35 (benzene-d6). ............................................................................116
14
A-3 Variable temperature 1H NMR spectra for 35 (toluene-d8). ............................................117
A-4 Variable temperature 1H NMR spectra for 37 (toluene-d8). ............................................117
15
LIST OF ABBREVIATIONS
4PP
AACVD
AFM
ALD
APCVD
BDE
CALPHAD
CVD
DFT
DTA
ECP
FWHM
gHMBC
GIXD
HMDS
HOMO
HRTEM
ITO
LPCVD
LUMO
MOCVD
PV
PVD
QMS
4 Point Probe
Aerosol Assisted Chemical Vapor Deposition
Atomic Force Microscopy
Atomic Layer Deposition
Atmospheric Pressure Chemical Vapor Deposition
Bond Dissociation Energy
Computer Coupling of Phase Diagrams and Thermochemistry
Chemical Vapor Deposition
Density Functional Theory
Differential Thermal Analysis
Electron Core Potential
Full-Width-Half-Max
Gradient Heteronuclear Multiple Bond Coherence
Grazing Incidence X-ray Diffraction
Hexamethyldisilazane
Highest Occupied Molecular Orbital
High Resolution Transmission Electron Microscope
Indium Tin Oxide
Low Pressure Chemical Vapor Deposition
Lowest Unoccupied Molecular Orbital
Metal-Organic Chemical Vapor Deposition
Photovoltaics
Physical Vapor Deposition
Quadrupole Mass Spectrometer
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RDS
RMS
SEM
SGTE
STP
TGA
VASP
XPS
XRR
Rate Determining Step
Root-Mean-Squared
Scanning Electron Microscope
Scientific Group Thermodata Europe
Standard Temperature and Pressure
Thermogravimetric Analysis
Vienna Ab initio Simulation Package
X-Ray Photoelectron Spectroscopy
X-ray Reflectivity
17
Abstract of Dissertation Presented to the Graduate School
of the University of Florida in Partial Fulfillment of the
Requirements for the Degree of Doctor of Philosophy
SYNTHESIS OF ORGANOMETALLIC PRECURSORS FOR WNxCy DEPOSITION AND
DFT STUDY OF GAS PHASE SPECIES IN EQUILIBRIUM WITH CZTSSe
By
Arijit Koley
August 2016
Chair: Lisa McElwee-White
Major: Chemistry
WNxCy is known to be an excellent candidate as a Cu diffusion barrier in the
semiconductor industry. The tungsten nitride complex WN(NMe2)3 has been proven to be a
remarkable precursor for Aerosol Assisted Chemical Vapor Deposition (AACVD), which
involves volatilization by formation of aerosols from precursor solutions, to give WNxCy.
WNxCy films are obtained at temperatures as low as 125 ºC, which is important given the thermal
sensitivity of some chip components during processing. However, at low temperatures
WN(NMe2)3 was found to produce WNxCy films with low growth rates and high surface
roughness. Therefore, WN(NEt2)3 and WN(NMe2)(NiPr2)2 were synthesized through
transamination of WN(NMe2)3 with secondary amines and were found to address the
shortcomings of WN(NMe2)3. The precursors WN(NMe2)3, WN(NEt2)3 and WN(NMe2)(NiPr2)2
afforded films of thickness 30 nm, 5.5 nm and 5 nm, respectively, which passed tests as copper
diffusion barriers.
Atomic Layer Deposition (ALD) and other conventional CVD rely on evaporation of
liquid precursors or sublimation of solids, thus requiring precursors with high volatility. In order
18
to test the viability of this series of precursors for ALD, 17 precursors of the type WN(NR2)3 [R2
= combinations of Me, Et, iPr, iBu, piperidine, azepane] were prepared by transamination under
various conditions and evaluation of their volatility indicated that reduced symmetry was a major
contributor to the volatility.
CZTSSe (CuZnSnSSe) is one of the candidate materials for photovoltaic technology.
Recently it has gained interest as an earth abundant and eco-friendly material. The
thermochemistry for this material has not been studied thoroughly. The thermochemical data for
the possible gaseous binary species in equilibrium with the condensed phases of CZTSSe were
assessed by DFT using the Gaussian 09 package. Since thermochemical data for this material
derived from different models are scattered across the literature, computational results were
compared to existing databases (SGTE) as benchmarks to evaluate our methods in preparation
for calculation of unknown species. The DFT functionals B3LYP and M06L in conjunction with
the basis set LANL2DZ were used for calculations and compared to the values from the SGTE
database.
19
CHAPTER 1
INTRODUCTION
With the decreasing size of electronic devices, the importance of feature size in integrated
circuits (IC) is increasing rapidly. In modern IC, copper performs better as an interconnect
material than aluminum because the former has better conductivity and fewer electromigration
problems.1 Processing integrated circuits involves moderately high temperatures and in absence
of barrier materials Cu has a tendency to diffuse into the Si layer forming copper silicides.2 This
property results in the degradation of the copper-silicon boundary leading to the malfunctioning
of the electronic devices. Therefore, a diffusion barrier is required between the copper and
silicon layers.1 A good diffusion barrier should be able to prevent diffusion, maintain a good
adhesion with both Cu and Si without reacting with them and be prepared at the lowest possible
temperature.
A) B)
Figure 1-1. PVD methods. A) Evaporation and B) Sputtering.
These diffusion barriers can be prepared primarily in two ways: Physical Vapor
Deposition (PVD) and Chemical Vapor Deposition (CVD). There are two basic methods in
which PVD operates. One is evaporation (Figure 1-1A), where the target material (in solid or
liquid form) is heated under vacuum to convert it in to the vapor phase which is then transported
and deposited on the surface.3 The other method is known as sputtering (Figure 1-1B),4 where
20
the target material is bombarded with highly energized gaseous ions generated in a magnetron
assisted DC plasma which releases the required moieties from the target material. The ejected
moieties then fly through the plasma and are deposited on the substrate, which is usually placed
on the opposite side of the target material.3
In both the methods of PVD, after the material leaves the target source it is transferred
and deposited in a particular direction (Figure 1-1). Hence deposition procedure in PVD
encounters “line of sight” problems to create “shadows”, leading to non-uniform film growth and
incomplete coverage of substrate materials as shown by the poor barrier layer (grey) in Figure 1-
2.1 If a barrier layer is deposited non-uniformly, when copper is deposited (orange layer in
Figure 1-2) on top of the barrier material (through PVD) it can penetrate into the silicon substrate
as shown in Figure 1-2 for the poor deposition results.
Figure 1-2. Representation of conformality in coverage of features.
In CVD, the film deposition procedure is a surface phenomenon as shown in Figure 1-3.
First the precursors are transported in the vapor phase to the reaction chamber with the help of a
carrier gas. The precursors then either directly adsorb on the heated substrate or undergo gas
phase chemical transformation to an intermediate which then adsorbs on the heated substrate.
The adsorbed species then undergoes surface reaction (due to the generated heat on the substrate)
to transform into the desired material. At this point, any volatile byproducts still attached to the
21
material are desorbed from the surface of the material and removed from reaction chamber by
the carrier gas. The desired material then undergoes nucleation and film growth which results in
the formation of a conformal film on the substrate.5 Since the entire procedure is based on the
concept of adsorption of precursor materials on the substrate, CVD does not encounter the line of
sight problems of PVD and is successful in providing conformal film growth and across the
entire substrate. This CVD method requires precursor to be transported to the vapor phase which
indicates that the precursor have to be sufficiently volatile and thermally stable to be transported
to the reaction chamber without undergoing decomposition.
Figure 1-3. Schematic diagram of CVD procedure.
In AACVD, the precursor molecules are dissolved in a suitable solvent and then the
solution is converted into an aerosol with the help of a nebulizer. These aerosol droplets are
transferred in to the reaction chamber with the help of a carrier gas and deposition occurs in a
similar manner to the conventional CVD methods. An advantage of using AACVD is that
precursors with low volatility can also be used for deposition by dissolving them in an
appropriate solvent.5
22
Another precursor based deposition method is ALD. In ALD, the precursor transportation
is similar to that of CVD methods. Two sets of precursors are introduced into the chamber
sequentially. The first precursor gets adsorbed on the surface and then undergoes surface reaction
to form a single layered thin film. Once the entire substrate surface is covered, all other
byproducts and precursors (not adsorbed on the surface) are purged out of the system. This is
followed by the introduction of the second precursor which forms a single layered film on the
first film in a similar manner. This procedure is a self-limiting process and leaves only a
monolayer of deposited material from each precursor. The precursors required for this process
have to be extremely volatile and also thermally stable.6,7
Transition metal nitrides like TiN, ZrN, HfN, VN, NbN, TaN, CrN, MoN, WN have been
found to be useful in various industries, such as telecommunications, semiconductor, machine
tools and many others.8 TaNx are used in industry as diffusion barriers for IC but they require
another Ta layer with them for adhesion to the copper layer TaN alone does not adhere to copper
effectively. In contrast, WNx and WNxCy have all the properties to serve as diffusion barriers for
copper interconnect systems, including good resistance to Cu migration up to 750 ºC.8
An effective precursor which can provide a good barrier must be sufficiently volatile for
transport in the vapor phase. It should also have minimal toxicity and its synthesis should be as
simple as possible. A brief discussion of precursor design based on the ligand associated with the
metal center follows. The discussion covers evolution of precursors from the commercially
available halogenated and carbonylated metal compounds to the improved all nitrogen
coordinated single source precursors.
Metal Halides and Carbonyls as Precursors
Initially, metal nitrides were deposited in a co-reactant system where the precursors for
metal and nitrogen were different. The sources for metal have been metal halides or metal
23
carbonyls, whereas the source of nitrogen varied between nitrogen, ammonia, and primary or
secondary amines. Depending on the deposition procedure, sometimes hydrogen gas or zinc
pulses were used as co-reactants.
An early approach was using metal chlorides with nitrogen and hydrogen as co-reactants
as shown in Figure 1-4.9-11 The deposition for all the metal nitrides required temperatures higher
than 1000 °C to obtain significant growth rates at atmospheric pressure. High temperatures were
required because N2 is an unreactive source for reaction with metal chlorides. When deposition
was carried out by using TiCl4 and replacing the source of nitrogen with ammonia, TiN films
were obtained at 310 °C, with significant growths at 400 and 450 °C as shown in Figure 1-5.12
Figure 1-4. Reaction of metal chlorides with nitrogen and hydrogen.
Figure 1-5. Reaction of TiCl4 with ammonia.
Initial studies on the deposition of TiN using TiCl4 and NH3 indicated that the adduct
(TiCl4•nNH3) forms in the gas phase at room temperature, as shown in Figure 1-6.12 The number
of coordinated ammonia molecules depended on the temperature.12 Winter et al. reported
TiCl4(NH3)2 as a single source precursor for the deposition of TiN where they obtained good
quality films in the temperature range 475-600 °C.13 Similar deposition results were obtained
from TiCl4•nNH3 as those obtained from TiCl4 and NH3, indicating that the formation of the
adduct TiCl4•nNH3 was the first step in the deposition of TiN from TiCl4 and ammonia.
Figure 1-6. Formation of TiCl4•nNH3.
24
H2 has been used previously as a carrier gas for the deposition of TiN from TiCl4 and
ammonia. In order to understand the role of H2 in the deposition it was replaced by Ar, N2 and
He as carrier gases with TiCl4 and NH3, but similar TiN films were observed.12,14 Montree et al.
performed kinetic studies on the deposition using the same precursors and confirmed that H2
does not affect the film growth.14
The next attempt to decrease precursor deposition temperature was using substituted
amines instead of ammonia. Use of HMDS had a small effect on the deposition temperature of
TiN (Figure 1-7) from TiCl4, where films with higher growth rate were obtained at 300 °C.15
There was a huge decrease in deposition temperature when a similar strategy was applied for
APCVD of NbN and TaN from NbCl5 and TaCl5 respectively.16 When deposition of NbN was
performed using HMDS instead of ammonia, the deposition temperature decreased from 1000 °C
to 400 °C.16,17 A similar strategy for TaN resulted in decrease of deposition temperature from
900 °C to 550 °C.16,18 These results indicated that the formation of trimethylsilyl chloride played
a pivotal role in the decrease in deposition temperature.
Figure 1-7. Reaction of TiCl4 with HMDS.
Several approaches were made to improve the metal source by comparing different metal
halides and by replacing metal halides with metal carbonyls. Titanium tetraiodide was used
based on the concept that Ti-I bond strength (310 kJ/mol) is weaker than that of Ti-Cl (494
kJ/mol), but there was not a significant decrease in deposition temperature (430 °C vs 450 °C).19
The BDE is associated with the homolytic cleavage of the bond, whereas the reactions involved
in treating titanium halides and ammonia are all two electron process. When tantalum
pentabromide (Ta-Br bond strength = 120 kJ/mol) was used instead of tantalum pentachloride
25
(Ta-Cl bond strength = 172 kJ/mol), a decrease in deposition temperature to 425 °C was
obtained.20 For tungsten nitride, tungsten hexachloride was replaced with tungsten hexafluoride
due to the latter’s higher volatility and lower reduction temperature with H2 at ca. 300 °C to
achieve a deposition temperature of 450 °C as shown in Figure 1-8.21
Figure 1-8. Formation of W2N from WF6 and ammonia.
Tungsten nitride (WN) was also deposited through ALD using WF6 and ammonia as co-
reactants at 600 °C.22 When triethylborane was added to this deposition process as a co-reactant,
the deposition temperature drastically decreased to 313 °C.23 When diborane was used as an
additional reducing agent, the deposition temperature decreased to 200 °C.24 When a different
tungsten source, such as tungsten hexacarbonyl, WN films were formed with ammonia at 200
°C.25 In W(CO)6 the weaker tungsten-carbonyl covalent bonds dissociate easily upon heating
whereas for tungsten halides a nucleophile is required to break the tungsten halogen bonds.25
The most concerning problem with these coreactant systems was the byproducts. Figures
1-4, 1-5 and 1-8 show the formation of HCl or HF. HCl is hazardous to stainless steel process
equipment instruments and HF is harmful for silicon wafers. When carbonylated precursors are
used they produce carbon monoxide, which is also toxic. Figure 1-6 indicates that there is a
coordination complex formed in the beginning for dual source precursors, when the precursors
have empty co-ordination site. Therefore, optimal precursors should be halogen and carbon
monoxide free to eradicate the byproduct problem.
Amido Precursors
The approach to halogen free precursors started with using metal amido precursors and
ammonia as a coreactant. This design was initiated with the use of dialkylamido metal
26
complexes. Using amido metal complexes, deposition of metal (Group IV, V and VI) nitrides
were observed in the temperature range of 150-350 °C.8 TiN, ZrN, HfN, VN, NbN and MoN
were obtained by reacting Ti(NMe2)4,26-28 Zr(NMe2)4,
29 Hf(NMe2)4,29 V(NMe2)4,
30 Nb(NEt2)430
and Mo(NMe2)4,30,31 respectively, with ammonia. All the metal complexes here contain a set of
homoleptic ligands. Initial deposition studies from Ti(NMe2)4, Zr(NMe2)4 and Nb(NEt2)5 were
found to produce films with small quantities of carbon contamination.32 A comparative study of
film deposition from different metal amido precursors is discussed below.
An initial comparison has been done using precursors where the dialkylamido ligands on
the metal center have been varied. TiN films were produced from Ti(NMeEt)433 and Ti(NEt2)4.
34
Ti(NMeEt)4 was found to produce films with 18 % carbon content with respect to 30 % for
Ti(NEt2)4. This change was attributed to the homolytic bond dissociation of titanium and the
dialkylamido ligand to form a dialkylamido radical fragment. It was proposed that this radical
then undergoes fragmentation to form ethylene (identified in QMS as a component of
decomposition from Ti(NMeEt)4) and MeNH radical fragment, then the MeNH fragment further
decomposes to give one equivalent of amorphous carbon. Similar decomposition pathway from
Ti(NEt2)4 would result in 2 equivalent of amorphous carbon from each EtNH fragment.33
Although ethylene was found in the NIST database for the mass spectrum of
diethylamine, the database for mass spectrum of methylethylamine did not show the formation of
any ethylene, indicating that the ethylene was probably formed from a different fragment. There
is a possibility that a titanium metallacycle is formed through β-hydride elimination during the
decomposition of the precursor, as shown in Figure 1-9, and the ethylene is formed from the
fragment of N-alkyl dissociation. It is reported in literature that C-H activation for methyl group
is more favorable compared to the ethyl group due to sterics.35,36 Hence metallacycle 1 is favored
27
over 2, which could then lead to N-ethyl bond dissociation and formation of ethyl radical,
followed by the formation of ethylene. The possibility of β-hydride elimination and formation of
a metallacycle from Ti(NMe2)4 was supported through a recent density functional study using
M06L/LANL2DZ where this approach was found to be energetically more favorable than other
pathways.37 Formation of these metallacycles would also explain the carbon content in the films.
The carbon content of films produced from Ti(NMe2)4 was found to be around 10%. The
dimethylamido ligand fragments formed from Ti(NMe2)4 were not believed to be associated with
the surface reaction, leading to low carbon contamination in the films.34
Figure 1-9. Possible metallacycles from the intermediate Ti(NMeEt)2.
Films produced from Ti(NMeEt)4 had a high activation energy of 1 eV (23 kcal/mol)33
with respect to 18.5 kcal/mol for Ti(NMe2)433,34
and 15.2 kcal/mol for Ti(NEt2)4.34 Deposition
temperatures for Ti(NMeEt)4 and Ti(NEt2)4 were higher than Ti(NMe2)4, likely due to the
increasing steric bulk experienced during the formation of the metallacycle as shown in Figure 1-
9 compared to Ti(NMe2)4.34
With the precursor tBuTi(NMe2)3, where one dialkylamide ligand was replaced with a
tert-butyl group, the deposition temperature was found to be 300 °C, similar to the parent
precursor.38,39 All other film properties, such as carbon and hydrogen content in the films and the
growth rate, were also found to be similar for the films grown from both precursors.38 The
percentage of carbon incorporation was about 29% for films grown from tBuTi(NMe2)3 at 300
°C with respect to 32% for films grown from Ti(NMe2)4 at 350 °C.39 This similarity of carbon
28
incorporation could be attributed to the fact that both the precursors may undergo β-hydride
elimination to form a similar metallacycle during decomposition. It must also be noted that the
amount of titanium bound carbon was found to be similar in films deposited from Ti(NMe2)4 and
Ti(NEt2)439 which is consistent with both the precursors undergoing decomposition through a
similar transition state. The carbon in the deposits which are not metal bound could be formed
from the fragmentation of alkyl ligands, as shown in Figure 1-9.
Titanium precursors containing cyclic ligands have also been tested to determine whether
β-hydride elimination is one of the deposition pathways. Ti(N(CH2)4)4 and Ti(N(CH2)5)4 were
the two precursors used for this experiment. It was found that there was high carbon content in
the films, but the amount of titanium bound carbon was minimal. Because of the carbon being
part of a ring, formation of a titanium metallacycle would be unfavorable. The high carbon
content was probably due to the homolytic cleavage of the cyclic amido ligand from titanium
leading to the formation of the cyclic amido radical.39 This study indicated that precursors
containing ligands that prohibit metallacycle formation should result in minimum metal-bound
carbon in films. Synthesis of titanium precursors with bulky ligands (diisopropylamido and di-
tert-butylamido) surrounding the metal center was unsuccessful due to the steric conjestion
around the titanium.39
A comparison of titanium, zirconium, and hafnium nitride films produced from
Ti(NMe2)4, Zr(NEt2)4, and Hf(NEt2)4, respectively using ammonia as a co-reactant has been
done.28 Zirconium and hafnium precursors deposited films in the temperature range 200-400 °C,
whereas the titanium precursor deposited titanium nitride films at 150-450 °C. Hydrogen content
of the films from Ti(NMe2)4 was a high 33% at 150 °C, but it decreased to 10% at 400 °C.
Similarly, the hydrogen contents of the films derived from Zr(NEt2)4 and Hf(NEt2)4 were 38%
29
and 50% at 200 °C respectively, which decreased to 10.6% and 18.5% at 300 °C. The hydrogen
found in the films could be attributed to the M=NH (M=Ti, Zr and Hf) formation during the
ammonolysis of the precursors.28 The higher atomic sizes of Zr and Hf in Zr(NEt2)4 and
Hf(NEt2)4 favor ammonolysis with respect to titanium, which could explain the higher
percentage of hydrogen found in their films. At higher deposition temperatures, M=NH is
probably converted to MN which leads to the decrease in hydrogen content in all the films.
A similar study was also performed with the group V homoleptic metal-amido
complexes, V(NMe2)4, Nb(NEt2)4, Nb(NMe2)5 and Ta(NMe2)5 with ammonia as a co-reactant.40
Films produced from these precursors also exhibited similar trends of hydrogen content to those
from group IV metal amido complexes, with higher percentages of hydrogen content in Nb and
Ta compared to V.28 The growth rates for niobium and tantalum complexes were found to be
higher than those of vanadium precursors. This trend was probably due to the larger size of
niobium and tantalum, which favors ammonolysis, over vanadium. All the films deposited had
either minimal or no carbon and oxygen incorporation in the films.
Heteroleptic metal-amido complexes have also been used as precursors for the deposition
of metal nitrides. Both polymeric [Ti(NMe2)2(N3)2]n and monomeric Ti(NMe2)2(N3)2(py)2
precursors were synthesized for the deposition of TiN.41 It was observed that both the precursors
generated TiN films at substrate temperatures of 300-400 °C. However, the polymeric precursor
did not produce any film until the precursor temperature reached 90 °C at around 5 10-10 Torr
pressure, whereas the monomeric precursor produced films at precursor temperatures 25-90 °C
under same pressure conditions. This observation is probably due to the low volatility of
polymeric precursors with respect to the monomeric precursors.42,43 [Ti(NMe2)2(N3)2]n produced
films with higher carbon content than the Ti(NMe2)2(N3)2(py)2.41 Ti(NMe2)2(N3)2(py)2 was
30
found to produce films with carbon content of about 10% which is lower than Ti(NMe2)4,41
likely due to the decrease in the number of dialkylamido ligands in Ti(NMe2)2(N3)2(py)2.
Heteroleptic metal amido complexes of tantalum have also been used for deposition
studies. Complex 3 (Figure 1-10), containing chelating ligand, has been used for deposition of
tantalum nitrides through chemical vapor deposition.44 Complex 3 had similar thermal stability
compared to Ta(NMe2)5. Increasing the ring size of the chelating ligand and the size of the alkyl
group on the nitrogen of the chelating ligand improved the thermal stability and volatility of the
precursor. These complexes were found to have 20 °C higher onset temperature of
decomposition in TGA with respect to Ta(NMe2)5. The authors therefore chose complex 3 for
comparison of film growth with Ta(NMe2)5. However, there was an increase in deposition
temperature to 500 °C for 3 with respect to 150 °C for Ta(NMe2)5. The N/Ta ratio was found to
be around 0.9-1.3 for 3, which was similar to Ta(NMe2)5.44 Complex 4 (Figure 1-10) was
synthesized and used as a precursor for the deposition of tantalum nitride films at 340 °C.45
Films produced from 4 with ammonia as a co-reactant had no traces of carbon and oxygen.
These contaminants were also not observed when Ti(N(CH2)4)4 and Ti(N(CH2)5)4 were used for
deposition of titanium nitrides.39 The N/Ta ratio for the films from 4 was around 1.5, which was
higher than that obtained from 3 and Ta(NMe2)5.
Figure 1-10. Tantalum precursors 3 and 4.
31
Study of the deposition pathways from the metal amido precursors M(NMe2)4 (M=Ti, Zr)
started with the proposal that the dialkylamido ligands are cleaved from the metal one by one.32
However, a solution phase study was conducted46 using precursors M(NMe2)4 (M=Ti, Zr), which
indicated the formation of a metal imido complex [(M=NH)2]x during ammonolysis as an
intermediate.30 Films produced from the metal imido complex [Ti(NtBu)(NMe2)2]2, showed
similar deposition results, indicating that the metal imido bond formation is one of the
intermediates to TiN deposition.39
Figure 1-11. Formation of imido complexes from 5.
A subsequent attempt to deposit TiN from a single source precursor involved the use of
precursor 5, which was designed to test mixed halogen and amide ligands on titanium (Figure 1-
11). Deposition of TiN from 5 was observed at 500 °C.47 Through mass spectrometry (electron
impact 70 eV), they observed formation of dimeric (6) and monomeric (7) titanium imido
complexes (Figure 1-11) after heating complex 5 at temperatures of 190-240 °C. Appearance of
6 and 7 as fragments from 5 served as evidence for the formation of a metal-imido intermediate
during the decomposition of metal-amido precursors.
Imido and Hydrazido Precursors
The metal imido intermediate in Figure 1-11 suggested precursors containing M=N bond,
such as imido and hydrazido complexes, could serve as single source precursors. Bridging
titanium imido complex 8 (Figure 1-12) has been reported to generate films with similar percent
composition of elements compared to those obtained from Ti(NMe2)4.39 The similar bridging
32
imido complex 9 (Figure 1-12) containing a silylimido ligand was synthesized for the deposition
of metal nitrides. However, deposition from 9 mostly resulted in the formation of metal oxide
films, which was attributed to the leakage in precursor delivery system.48
Figure 1-12. Group IV bridging imido precursors.
A comparative study of film deposition and decomposition pathways for bridging and
terminal imido precursor was required. Mass spectrometric data for [TiCl2(NR)(NH2R)2]3 (where
R=alkyl groups) showed the presence of both monomeric and dimeric imido fragments.49 Here
the m/z value 380 indicated that the dimeric complex probably has a Ti2N2 structure, as shown in
Figure 1-12. Both the monomeric and dimeric fragments would undergo further decomposition
to form the metal nitride thin films.49 A monomeric terminal imido complex such as 10 (Figure
1-13) was found to be a better precursor with respect to tetrameric terminal imido complex
[TiCl2(NtBu)(NH2
tBu)]4. A complete study of the series of titanium precursors 10 (Figure 1-13)
was performed. In the complexes studied both the R groups and the coordinating ligands (L)
around the metal center were varied. When Me2NH was used as a ligand, it was found that only
two amines coordinated, unlike three for other ligands. The complex TiCl2(NtBu)(py)3 was found
to behave differently with respect to Ti(NMe2)4 as it produced TiN films with negligible carbon
contamination.50,51 This behavior was attributed to the fact that the tert-butyl group would
dissociate easily to form the volatile fragment isobutene, which can be lost easily during
33
deposition process. The coordinating ligands are pyridines, which also can dissociate easily from
the precursor and be carried away from the reaction chamber by carrier gas without affecting the
deposition process.51
Figure 1-13. Structure of 10.
A series of Cl3VNR (R= Me, C6H4CH3, tBu) precursors was synthesized to conduct the
depositions of VNxCy.52 Hydrogen as a carrier gas provided VNxCy films at lower temperatures
than nitrogen as a carrier gas. However, when hydrogen was used, HCl was formed as a
byproduct, probably from the σ-bond metathesis between H-H and V-Cl bonds.53,54 Comparison
of deposition from all three precursors indicated that the vanadium tert-butyl imido complex
could only be considered as a precursor for the deposition of VNxCy because it gives films at 500
°C.52 The other two complexes provided films at extremely high temperatures (900-1000 °C).
The high energy demand was probably due to the facile homolytic cleavage of the N-tBu, leading
to the formation of a stable tertiary radical which would transform to the volatile isobutene
fragment. Similar bond cleavage with other complexes would result in the formation of methyl
and aryl radicals, which have much lower stability with respect to the tertiary radical.
A chloride bridging dimeric niobium complex 11 (Figure 1-14) containing terminal imido
bonds, was synthesized for the deposition of NbN at around 600 °C.55 Although the films
contained some carbon contamination, they were found to be devoid of any chloride or silicon
contamination.55 Three new all nitrogen coordinated precursors 12, 13 and 14 were introduced as
potential precursors for the formation of NbN.56 A comparative study of deposition of NbN films
34
from 12 and 14 indicated that unlike 12, 14 did not need an additional reactive gas such as
ammonia to form carbon free films. This property was ascribed to the fact that the bidentate
guanidinate creates a coordinatively saturated environment around the Nb center to prevent β-
hydride elimination, and subsequently prevents the formation of the metal carbon bond during
the deposition process. Control of the Nb:N composition in the films is also easier from 14 as a
single source precursor than in case of 12.56
Figure 1-14. Single source niobium precursors 11-14.
Complex 15 (Figure 1-15) was initially thought to be an intermediate in the
decomposition of Ta(NEt2)5 to TaN. However further study suggested that Ta(NEt2)5 is
converted to 15 at temperatures above 100 °C implying that 15 is the true single source precursor
for the deposition of TaN. This postulate was supported by deposition of TaN films from 15 at
500-600 °C.32,57,58
Figure 1-15. Single source tantalum precursors 15-18.
Complexes 16,59 1760 and 1855 (Figure 1-15) were reported as precursors for the
deposition of TaN by LPCVD. The tert-butyl imido precursors 16 and 17 were found to deposit
35
TaN at lower temperatures (400 and 450 °C respectively), maintaining the trend followed by
tert-butyl imido complexes mentioned previously. Complex 18 produced films at 150 °C by
ALD with hydrazine as a reducing agent.61
Precursor 19 (Figure 1-16) was introduced for the deposition of MoN, where films were
obtained at 250 °C by ALD. A comparative study was performed with two other precursors,
where the methyl groups in 19 were replaced by ethyl (20) and isopropyl (21) groups (Figure 1-
16). DFT and DSC data indicated that the thermal stability of the precursors decreased with
increasing alkyl component. Complex 21 was found to be too thermally unstable for use in
deposition studies. This trend was attributed to the decomposition pathways proposed for the
precursors. DFT studies using B3LYP/LANL2DZ indicated that β-H migration, β-alkyl
migration and metallacyle formation via dialkylamine elimination were energetically more
favorable for bulky alkyl groups. Complex 20 and 21 were found to be stable enough to undergo
deposition to give MoN films by ALD.62,63
Figure 1-16. Single source molybdenum precursors 19-23.
A series of imido-guanidinato and imido-amidinato complexes was reported as potential
precursors for the deposition of MoN, and after comparing TGA and DTA data on all of them,
complex 22 (Figure 1-16) was used for the deposition of MoN by ALD at 500 °C.64,65 Deposition
of MoN was also performed by ALD using complex 23 (Figure 1-16), which contains both
36
nitrogen and sulfur containing ligands. Complex 23 combined with hydrogen plasma produced
Mo2N films at 300 °C.66
Complex 24 (Figure 1-17) was the first single source precursor synthesized for
applications in MOCVD of W2N.67 However, the deposition temperature for good quality films
was as high as 650 °C.67 The precursor 25 (Figure 1-17) was then synthesized for the deposition
of WN through ALD with ammonia being added as a co-reactant. This compound was the first
tungsten imido complex used for ALD. Complex 25 was reported to produce films of
composition WN1.1±0.1 at 250-350 °C by ALD.68
Figure 1-17. Single source tungsten imido precursors 24-26.
Complex 26 (Figure 1-17) was introduced as a single source precursor to deposit WNx
through AACVD at temperatures of 450 °C.69 Depositions were conducted using H2 as a co-
reactant. DFT study using the B3LYP functional combined with a split basis set (LANL2DZ for
metals and 6-31G(d) for non-metals) located a pathway for σ-bond metathesis between W-Cl and
H-H to form HCl (found experimentally) as a byproduct. A comparative study of all three
precursors of type 26 was performed to determine the rate determining step (RDS) of the
decomposition process. It was evident from the trend of the activation energy (Figure 1-18) that
the RDS was the imido nitrogen-carbon bond dissociation, which was supported by the DFT
calculations.53,54
37
Figure 1-18. Activation energy (Ea) for film growth vs N-C BDE.*
Complex 27 (Figure 1-19) was introduced as a new tungsten imido precursors for
LPCVD of WN, where for the first time a bridging imido was used for the deposition of WNx.70
Although the precursor had chloride ligands, the films were devoid of any chlorine
contamination. Oxygen contamination in the films reduced significantly by using ammonia as a
bleed gas instead of nitrogen. No change in carbon contamination was observed on changing the
bleed gas.70
Figure 1-19. Bridging imido and guanidinato tungsten precursors 27-29.
* Reprinted with permission from Bchir, O. J.; Green, K. M.; Ajmera, H. M.; Zapp, E. A.; Anderson, T. J.; Brooks,
B. C.; Reitfort, L. L.; Powell, D. H.; Abboud, K. A.; McElwee-White, L. J. Am. Chem. Soc. 2005, 127, 7825-7833.
38
Two new tungsten-imido-guanidinato complexes 28 and 29 (Figure 1-19) were
introduced as potential precursors for tungsten nitride deposition. However, after conducting
deposition studies it was concluded that they can produce tungsten nitride films only in the
presence of ammonia, ruling out their viability as single source precursors.71
With the evidence that the imido precursors undergo decomposition with the rate
determining dissociation of the imido nitrogen-carbon bond, replacing the nitrogen-carbon bond
with a weaker bond, such as a nitrogen-nitrogen bond, should produce films at lower
temperatures. Therefore, hydrazido complexes were of interest.
Figure 1-20. Titanium hydrazido complexes, 30 and 31.
A series of hydrazido complexes of the types 30 and 31 (Figure 1-20) were reported. The
former produced TiNCl films at 400 °C, whereas the latter deposited material at 600 °C.72
Chloride free titanium nitride films were observed from 30 at temperatures of 475 °C and above.
A comparative study indicated that during the deposition process the feasibility of the reduction
of the titanium center was dependent on the alkyl groups in 30.72
39
Figure 1-21. Tungsten hydrazido precursor 32.
A lower deposition temperature with respect to imido complexes was observed for
tungsten hydrazido complexes as predicted by the previous activation energy study on complex
26. The single source hydrazido complex 32 (Figure 1-21) was designed, and it produced
chloride free WNxCy films at 300 °C by AACVD. This deposition temperature was 150 °C lower
than the imido analogue 26.73 A gas phase Raman study on 32 supported the hypothesis for
precursor design. Fragments from the dissociation of the nitrogen-nitrogen bond in 32 were
observed in gas phase along with the formation of the protonated terminal nitrido bond. These
data were also supported by density functional theory (B3LYP/LANL2DZ) calculations.74
Nitrido Precursors
Evidence from mass spectrometry, Raman studies, and trapped decomposition fragments
has repeatedly implicated the formation of a terminal nitrido complex as an intermediate in the
decomposition pathway of metal imido and hydrazido complexes during deposition of metal
nitrides. Applying the precursor design strategy similar to the hydrazido precursors, use of
terminal nitrido metal complexes as single source precursors for the deposition of metal nitrides
should result in further lowering of deposition temperature.
Complex 33 (Figure 1-22) was prepared as a single source precursor. Deposition from 33
by AACVD formed WNx nanospheres at 75 °C and WNxCy films at 125 °C.75,76 Because any
deposition less than 400 °C is considered “low temperature” deposition, obtaining WNxCy at 125
40
°C was remarkable. The design that makes this possible evolved from the comparative study of
precursors of similar design in which the RDS was identified.
Figure 1-22. Low temperature WNxCy deposition from 33.
Although 33 provides low temperature deposition, its applications in other CVD
processes would be limited by its low volatility and decomposition during sublimation. A
comparative study of various precursors of similar design as 33 is discussed in the following
chapter.
41
CHAPTER 2
DESIGN AND SYNTHESIS OF WN(NR2)(NRʹ2)(NRʺ
2) PRECURSORS
Precursor Design
The manufacture of integrated circuits requires deposition of diffusion barrier material to
prevent the migration of Cu, its incorporation into Si and penetration into high porosity low-κ
dielectrics.†‡ Cu diffusion can increase contact resistances, produce contact layer embrittlement,
promote delamination from low-κ materials and generate energy levels within the bandgap of Si
that act as recombination centers.77 Currently, a physical vapor deposited (PVD) Ta/TaN bilayer
structure is used,78 but with the miniaturization of feature sizes, PVD has been projected to
become inadequate due to conformality issues deriving from the highly directional nature of
deposition. Chemical vapor deposition (CVD) and atomic layer deposition (ALD) are candidates
to succeed PVD technologies. Among materials considered for diffusion barrier applications are
transition metal nitrides and carbonitrides,40,65,79,80 and more recently self-forming barriers (e.g.,
MnSixOy).81-83 WNxCy has been discussed as a possible candidate given its low resistivity,
thermal and mechanical stability, resistance to recrystallization, ease of processing, and adhesion
to and compatibility with current IC materials.8,80
McElwee-White et al. have been using the CVD of WNxCy as a platform to examine
mechanism-based design of single source precursors84,85 featuring tungsten complexes with
nitrogen coordinated ligands such as imido, guanidinate, amidinate, amido, and hydrazido
moieties.84,86 One focus of this work has been lowering the deposition temperature (< 350 °C)87-
† Reprinted with permission from Koley, A.; O’Donohue, C. T.; Nolan, M. M.; McClain, K. R.; Bonsu, R. O.;
Korotkov, R. Y.; Anderson, T. J.; McElwee-White, L. Chem. Mater. 2015, 27, 8326-8336. Copyright (2015)
American Chemical Society
‡ Reprinted with permission from McClain, K. R.; O’Donohue, C.; Koley, A.; Bonsu, R. O.; Abboud, K. A.;
Revelli, J. C.; Anderson, T. J.; McElwee-White, L. J. Am. Chem. Soc. 2014, 136, 1650-1662. Copyright (2014)
American Chemical Society
42
93 to decrease damage to adjoining thermally sensitive dielectric layers94 or contact level
structures.95,96 Identification of cleavage of the N-C bond as the rate-determining step in
deposition of WNxCy from the imido complexes Cl4(CH3CN)WNR (R = Ph, iPr, allyl)97
suggested a precursor design strategy in which the N-C bond was replaced by a weaker N-N
bond. The result was a lowering of the deposition temperatures from the 400-500 °C range
obtained with imido complexes98-100 to the 250-300 °C range observed for the analogous
hydrazido complexes.101 Elimination of that bond by moving to a terminal nitrido ligand instead
of imido or hydazido ligands was the next step in the evolving precursor design.
WN(NR2)(NiPr2)2 and WN(NR2)2(NiPr2)
McElwee-White et al. then reported the design and synthesis of the nitrido complex
WN(NMe2)3 and the resulting CVD of WNx nanospheres75 and WNxCy thin films76 from 33 at
temperatures as low as 75 °C and 125 °C, respectively. However, the growth rate for the films
grown from 33 was found to be low at lower temperatures (Figure 2-1). This discovery indicated
that although we were able to achieve low temperature deposition, high growth rates for film
deposition were yet to be achieved.
Figure 2-1. Arrhenius plot of growth rate (G) for films deposited with 33 depicting the two well-
defined growth regimes.§
§ Reprinted with permission from McClain, K. R.; O’Donohue, C.; Koley, A.; Bonsu, R. O.; Abboud, K. A.;
Revelli, J. C.; Anderson, T. J.; McElwee-White, L. J. Am. Chem. Soc. 2014, 136, 1650-1662.
-1.5
-1.0
-0.5
0.0
0.5
1.0
1.5
2.0
1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6
T (°C)
ln(G
) (Å
/min
ute
)
1000/T (K-1)
150250350450550650 200300
43
Hence we needed to synthesize more precursors of similar design but with wide variety
of ligands and compare the films grown from them. After 33 was synthesized in high yield from
WN(OtBu)3 and Zr(NMe2)4,75 synthesis of other WN(NR2)3 complexes from WN(OtBu)3 was
explored. As expected, the reaction of WN(OtBu)3 with Zr(NEt2)4 in toluene resulted in complete
amide/alkoxide exchange, as observed in the 1H NMR spectra of the product mixture. However,
the product, WN(NEt2)3 (34), could not be isolated by selective crystallization or sublimation.
Transamination from 33 using dialkylamines was chosen as a strategy due to the near
thermoneutrality of the exchange and the relative volatility of the dimethylamine product.
Indeed, reaction of 33 with excess diethylamine (60 equiv) at reflux, either neat or in pentane
solution, for 3 h resulted in complete substitution to produce 34. The crude product was purified
easily by recrystallization from hexamethyldisiloxane, resulting in a high yield (85%) of ana-
lytically pure 34.
WN(NMe2)(NiPr2)2 (35) and WN(NMe2)2(N
iPr2) (36) were obtained by manipulation of
the reaction conditions (Figure 2-2). Transamination of 33 in refluxing diisopropylamine allowed
for the selective synthesis of 35 (Figure 2-3), while conducting the transamination of 33 with
excess diisopropylamine in refluxing pentane solution resulted in selective formation of 36. In
both cases, the product could be purified by recrystallization.
Figure 2-2. Synthesis of 35-38.
44
The remaining dimethylamide groups of 35 and 36 were cleanly replaced by
transamination with excess diethylamine in refluxing benzene or pentane solution to produce
WN(NEt2)(NiPr2)2 (37) and WN(NEt2)2(N
iPr2) (34) respectively. Analytically pure 37 was more
efficiently obtained by sublimation owing to its very high solubility while pure 38 was obtained
by recrystallization from hexamethyldisiloxane.
X-ray Crystal Structure Determination of 35**
Complex 35 was chosen for X-ray structure determination because of its
heterosubstituted sterically crowded ligand environment and temperature dependent NMR
spectra. Variable temperature NMR for 35 (Figure A-3) shows a coalescence of the two
diastereotopic methyl groups at -25 °C and the activation energy barrier calculated from the
spectra was around 52.15 kJ/mol. Crystals suitable for crystallography were grown from
concentrated hexamethyldisiloxane solution at low temperature. The asymmetric unit of 35
consists of the three chemically equivalent but crystallographically independent complexes: A, B
and C (Table 2-1). As seen in Figure 2-3, 35 adopts a distorted tetrahedral geometry. The
average (A, B and C) W-N (W≡N) bond length of 1.683(3) in 35 is very similar to that in 33
[W≡N 1.680(2)] and slightly longer than in WN(N(Ar)iPr)366 (Ar = 3,5-C6H3Me2) [W≡N
1.669(5)]. As in 33,63 the W-Namide bond lengths of 35 are shorter [W-Navg. 1.953(4)] than in
WN(N(Ar)iPr)3 (Ar = 3,5-C6H3Me2) [W-N(Ar)iPr 1.972(3)], a result consistent with the stronger
donor (σ, π) character of –NR2 (R = Me, iPr)67 versus -N(Ar)iPr (Ar = 3,5-C6H3Me2). The total
bond angles around N2/N3/N4 in 35 are consistent with sp2 hybridization [359.9(3), 360.0(3) and
360.1(4)° respectively], and the amide planes of 35 are parallel to the W≡N axis, allowing π
** X-ray structure determination was carried out by Dr. Khalil Abboud, Department of Chemistry, University of
Florida.
45
donation into the W based dx2
-y2
and dxy orbitals. A distortion towards trigonal pyramidal
geometry is observed in 35, evidenced by the contraction [{N≡W-N}vg., 105.15(16)°] and
expansion [{N-W- N}avg., 113.42(15)°] of bond angles around W. As in 35, this is caused by
steric repulsion between the more bulky amide groups and a tendency for low overlap between
fully occupied bonding orbitals.
Figure 2-3. Displacement ellipsoids drawing of 35 (molecule A is shown); ellipsoids are drawn
at 50% probability.
46
Table 2-1. Selected bond lengths (Å) and angles (°) for 35
Bond Bond Length (Å) Bond Bond Angle (°)
W1A-N1A 1.688(3) N1A-W1A-N2A 105.47(15)
W1B-N1B 1.679(3) N1B-W1B-N2B 106.04(15)
W1C-N1C 1.681(3) N1C-W1C-N2C 104.95(16)
W1A-N2A 1.949(3) N1A-W1A-N3A 104.52(12)
W1B-N2B 1.952(4) N1B-W1B-N3B 104.50(16)
W1C-N2C 1.957(4) N1C-W1C-N3C 104.84(16)
W1A-N3A 1.950(3) N1A-W1A-N4A 105.45(16)
W1B-N3B 1.951(4) N1B-W1B-N4B 106.20(13)
W1C-N3C 1.955(3) N1C-W1C-N4C 106.17(12)
W1A-N4A 1.961(4) N2A-W1A-N3A 113.33(15)
W1B-N4B 1.948(3) N2B-W1B-N3B 110.87(14)
W1C-N4C 1.945(3) N2C-W1C-N3C 111.62(15)
N2A-W1A-N4A 113.65(14)
N2B-W1B-N4B 115.00(14)
N2C-W1C-N4C 115.55(14)
N3A-W1A-N4A 113.29(15)
N3B-W1B-N4B 113.27(14)
N3C-W1C-N4C 112.64(15)
Design and Synthesis of Volatile Precursors
Since volatility of the complexes is important for application in CVD and ALD,84,102 the
vapor-phase transport of these complexes was tested by sublimation. In these studies, 35 and 36
were found to be more volatile than 33 and 34, despite their higher molecular weights (Table 2-
2). The increase in volatility in going from homoleptic ligand sets to heteroleptic ones has been
previously noted and ascribed to perturbation of crystal packing forces by lowered
symmetry.84,103,104 It has also been postulated that steric bulk around the metal center contributes
to volatility by hindering intermolecular interactions. The higher volatility of 35 and 36 led us to
synthesize additional complexes containing heteroleptic sets of ligands, in which the lowered
symmetry is complemented by varying degrees of steric bulk in the dialkylamide ligands.
47
Figure 2-4. Synthesis of 39-41.
The isobutyl derivative 39 was synthesized by refluxing 33 with excess diisobutylamine
in pentane for 12 h (Figure 2-4). Reaction of 33 with excess piperidine or azepane under the
same reaction conditions resulted in replacement of all three NMe2 ligands to afford 40 or 41.
This is most likely due to the smaller cone angles of cyclic secondary amines such as piperidine
(121°) and azepane when compared to diisopropylamine (137°) and diisobutylamine (138°).
Figure 2-5. Synthesis of 42-47.
Compounds 42-47†† were synthesized from 33 in a one pot strategy which takes
advantage of the steric demand of the NiPr2 ligand to limit the extent of substitution in the
presence of excess diisopropylamine (Figure 2-5).
†† Compounds 44 and 47 were synthesized by Michelle M. Nolan.
48
Figure 2-6. Synthesis of 48 and 38.
Attempts to synthesize the asymmetrical complex 48 by controlling the stoichiometry of
less sterically hindered amines were unsuccessful. Reflux of 36 with one-third of an equivalent
of diethylamine in pentane resulted in the formation of a mixture of 48 and 38 (Figure 2-6).
Efforts to separate 48 and 38 through extraction, crystallization or sublimation did not provide a
pure sample of either product.
Figure 2-7. Synthesis of 49-52.
The alternative asymmetrical target complex 49, which contains the more sterically
demanding diisobutylamido ligand in place of the diethylamido ligand of`48 could be prepared
by a one pot synthesis strategy (Figure 2-7) that affords 49 in 50% yield. Further substitutions of
the dimethylamido ligand in 49 could be obtained by reaction with excess diethylamine,
piperidine and azepane in refluxing pentane to obtain 50, 51 and 52 respectively.
49
Structural Effects on Precursor Volatility
The effect of substituent choice on volatility and thermal stability of complexes 35-47
and 49-52 was assessed by sublimation. Complex 39 contains NR2 groups that have a nearly
identical cone angle (138° for NiBu2) to those of 27 (137° for NiPr2)105 but are of higher
molecular weight. Precursor 39 was found to be less volatile than 35 (Table 2-2), suggesting
that, as expected, the lower molecular weight of the isopropyl derivative 35 dominates volatility
when the steric profiles are similar.
Table 2-2. Sublimation conditions, symmetry and compound recovery for 33-47 and 49-52
Complex Ligand(R) Ligand(Rʹ) Ligand(Rʺ) Symmetry Pressure
(mTorr) T (°C)
%
Recovery
33 Me Me Me D3v 150-250 90-105 55
34 Et Et Et D3v 150-250 75-80 55
40 Piperidine Piperidine Piperidine D3v 150-250 70-80 45
41 Azepane Azepane Azepane D3v 150-250 75-85 40
36 Me Me iPr Cs 350-450 65-70 35
38 Et Et iPr Cs 250-350 62-68 30
42 Piperidine Piperidine iPr Cs 150-250 60-70 45
43 Azepane Azepane iPr Cs 150-250 70-80 35
44 nPr nPr iPr Cs 150-250 65-70 55
39 Me iBu iBu Cs 150-250 80-85 40
35 Me iPr iPr Cs 350-450 65-70 40
37 Et iPr iPr Cs 250-350 58-68 30
45 Piperidine iPr iPr Cs 150-250 55-65 40
46 Azepane iPr iPr Cs 150-250 60-65 35
47 nPr iPr iPr Cs 200-300 50-55 35
49 Me iBu iPr C1 150-250 45-55 55
50 Et iBu iPr C1 150-250 40-50 60
51 Piperidine iBu iPr C1 150-250 42-50 50
52 Azepane iBu iPr C1 150-250 42-50 45
Reduced symmetry about the metal center also has the expected effect on precursor
volatility.12, 33, 34 Homoleptic complexes with D3v symmetry (33, 34, 40 and 41) have lower
50
volatilities (as measured by sublimation temperature) compared to heteroleptic complexes with
Cs symmetry (35-39 and 42-47). Among the precursors with Cs symmetry, those with two
diisopropylamido groups have higher steric crowding around the tungsten center, which makes
them more volatile compared to the precursors with one diisopropylamido group. The highest
volatilities were found for the asymmetrical complexes with C1 symmetry (49-52), which all
sublimed at temperatures below 50 °C at 150-200 mTorr. Complex 50 was found to sublime at
room temperature at 150-200 mTorr slowly, where the sublimation was found to be ongoing for
48 h without any decomposition of the crude sample.
Thermogravimetric Analysis (TGA) of 35 and 36
The TGA of 35 (Figure 2-8) is consistent with sublimation of the compound at
approximately 230 °C at atmospheric pressure. This result confirms that complex 35 is
sufficiently stable to survive the reduced pressure sublimation described in Table 2-2. In
contrast, some of the precursors, such as 36, could not be sublimed at atmospheric pressure
because their decomposition temperatures were too low.
Figure 2-8. TGA Plot for 35 and 36.‡‡
‡‡ Reprinted with permission from Koley, A.; O’Donohue, C. T.; Nolan, M. M.; McClain, K. R.; Bonsu, R. O.;
Korotkov, R. Y.; Anderson, T. J.; McElwee-White, L. Chem. Mater. 2015, 27, 8326-8336. Copyright (2015)
American Chemical Society
51
Thermolysis of Neat 35
Thermolysis of 35 was performed to identify the volatile byproducts of its decomposition
and provide information on possible reaction pathways for deposition of WNxCy. To obtain
samples of the pyrolysis products, complex 35 was heated to ~260 °C under 1 atm of argon and
the condensate was collected at –78 °C. A brown black residue was left after thermolysis. GC-EI
MS of the condensate confirmed the presence of the pyrolysis product diisopropylamine. Also
detected in the mass spectra were imine 53, isopropylamine and acetone. The isopropylamine
and acetone are the products of hydrolysis of 53 by adventitious water introduced into the sample
during trapping and handling. (Figure 2-9).
Figure 2-9. Thermolysis of 35.
Spectroscopic Characterization of Compounds
The 1H and 13C NMR spectra of complexes 36, 38, 42-44 and 53 displayed sharp first-
order spectra indicative of unrestricted rotation about all W-Namide bonds, as found in 33. The
NMR spectra of complexes 35, 37, 39-41, 45-47 and 49-52 exhibited diastereotopic methyl
groups on the diisopropylamide ligands. This was evidenced by the appearance of two doublets
in the 1H NMR spectra (Figure A-1). To confirm that the peaks emerge from the two methyl
groups on the same isopropyl and not from methyls on two different isopropyl groups, we
obtained a 2D NMR with 35 in benzene-d6. The gHMBC spectrum (Figure A-2) shows a
coupling between the proton at 1.26 ppm and the carbon at 26.4 ppm with another coupling
between the proton at 1.34 ppm and the carbon at 25.5 ppm. This indicates that the two peaks
arise from the two methyl groups on the same isopropyl moiety.
52
The variable temperature 1H NMR spectra of 35 (Figure A-3) and 37 (Figure A-4)
indicated restricted W-Namide bond rotation at lower temperatures, evidenced by coalescence of
the diastereotopic methyl doublets into a broad singlet. The methyl doublets coalesce at -25 °C
and -5 °C for 35 and 37 respectively.
Computational Study of the Gas Phase Decomposition of 33
A DFT study was carried out to explore possible mechanistic pathways leading to loss of
diisopropylamine, a thermolysis product of 35 (Figure 2-9).§§ For the lowest energy gas phase
pathway that was located (Figure 2-10), the first step was unimolecular β-proton abstraction by
the adjacent amide, which occured via a relatively high energy transition state (ΔG‡ = 40.2
kcal/mol; ΔH‡ = 39.2 kcal/mol). Formation of INT1 was followed by the coordination of another
molecule of 35 to generate the bimetallic INT2 in a slightly exothermic step. Although the
transition state linking INT1 to INT2 could not be located computationally, addition of 35 to the
coordinatively unsaturated INT1 likely has a very low barrier. Likewise, the transition state from
INT2 to INT3 was not located, but loss of diisopropylamine from the sterically crowded INT2 is
also likely to have a moderately low barrier. Attempts to locate pathways in which two
molecules of 35 reacted directly in the gas phase were unsuccessful. The inability to locate a
bimolecular pathway is in contrast to computational results on the less sterically hindered
dimethylamido complex 33,106 for which bimolecular gas phase reaction was preferred over the
unimolecular pathway. In a related pathway involving the decomposition of WN(NEt2)3 (Figure
2-11), the energy barrier for formation of the bimolecular transition state (TS2) and the energy
barrier for the subsequent step involving elimination of amine (INT2) were isoenergetic (ΔΔG =
0.3 kcal/mol).
§§ All DFT studies for decomposition pathways of 34 and 35 were performed by Richard O. Bonsu.
53
Figure 2-10. Decomposition pathway for 35.***
*** Reprinted with permission from Koley, A.; O’Donohue, C. T.; Nolan, M. M.; McClain, K. R.; Bonsu, R. O.;
Korotkov, R. Y.; Anderson, T. J.; McElwee-White, L. Chem. Mater. 2015, 27, 8326-8336. Copyright (2015)
American Chemical Society
54
Figure 2-11. Decomposition pathway for 34.†††
Mass Spectrometry
Since the fragmentation patterns observed during mass spectrometry often correlate well with
observed CVD decomposition pathways,97,107,108 the positive ion CI (chemical ionization) mass
spectra of compounds 35-39, 49, 50, 52 and DART-TOF for 42-47, 51 were obtained (Table 2-
3). For all compounds, the appropriate [M+H]+ ion was observed in high relative abundance,
indicating the moderate stability of these thermally sensitive compounds under the ionization
conditions. All compounds had additional tungsten-containing fragment ions. Some of these
††† Reprinted with permission from Koley, A.; O’Donohue, C. T.; Nolan, M. M.; McClain, K. R.; Bonsu, R. O.;
Korotkov, R. Y.; Anderson, T. J.; McElwee-White, L. Chem. Mater. 2015, 27, 8326-8336. Copyright (2015)
American Chemical Society
49.5
24.4 18.6
GS
INT1
INT248.9
23.1
3.10.0
ΔGΔH
TS2
18.9 16.0
TS1
55
fragments correspond to loss of dialkylamine from monomeric [(M-HNR2)+H]+ and dimeric
[(M2-HNR2)+H]+ species. Heterosubstituted compounds generated fragments corresponding to
loss of both types of dialkylamines from monomeric and dimeric species, but in most cases the
relative abundances of these fragments were very low (<1%). However, the mass spectrum of
compound 36 clearly displayed all four possible fragments {[(M2-HNMe2)+H]+, [(M2-
HNiPr2)+H]+, [(M-HNMe2)+H]+, [(M-HNiPr2)+H]+} with significant relative abundance.
Table 2-3. Selected m/z values from the mass spectra of 33-45 and 45-50.
Compound (MW) Selected Ions (m/z)(Relative Abundance) [Formula]
35 (442) 443(23.4) [M+H]+
36 (386) 728(26) [(M2-HNMe2)+H]+; 672(11) [(M2-HNiPr2)+H]+; 387(96)
[M+H]+; 342(6) [(M-HNMe2)+H]+; 286(2) [(M-HNiPr2)+H]+
37 (470) 471(83) [M+H]+; 398(1) [(M-HNEt2)+H]+; 370(2) [(M-HNiPr2)+H]+
38 (442) 812(1) [(M2-HNEt2)+H]+; 443(15) [M+H]+
39(498) 499(100) [M+H]+; 868(35) [(M2-iBu2NH)+H]+; 953(19) [(M2-
Me2NH)+H]+
40 (448) 449(56) [M+H]+; 364(13) [(M-C5H10NH)+H]+; 812(1) [(M2-
C5H10NH)+H]+
41 (492) 493(100) [M+H]+; 393(2) [(M-C6H12NH)+H]+
42 (466) 467(1) [M+H]+; 847(10) [(M2-C5H10NH)+H]+
43 (494) 495(6) [M+H]+; 890(100) [(M2-iPr2NH)+H]+
44 (498) 499(5) [M+H]+; 896(1) [(M2-iPr2NH)+H]+
45 (482) 483(3) [M+H]+; 965(2) [M2+H]+
46 (496) 497(4) [M+H]+; 893(4) [(M2-iPr2NH)+H]+
47 (498) 499(100) [M+H]+; 896(2) [(M2-iPr2NH)+H]+; 997(97) [M2+H]+
49 (470) 471(62) [M+H]+; 426(19) [(M-Me2NH)+H]+; 812(2) [(M2-iBu2NH)+H]+; 896(2) [(M2-Me2NH)+H]+
50 (498) 426(7) [(M-Et2NH)+H]+; 499(18) [M+H]+; 868(5) [(M2-iBu2NH)+H]+; 896(1) [(M2-
iPr2NH)+H]+
51 (510) 511(100) [M+H]+; 920(30) [(M2-iPr2NH)+H]+; 892(32) [(M2-
iBu2NH)+H]+
52 (524) 525(31) [M+H]+; 920(1) [(M2-iBu2NH)+H]+
56
WNxCy Film Growth from 35
An Arrhenius plot of the film growth kinetics for depositions using 35 (green) presented
in Figure 2-12 dissolved in pyridine (AACVD) showed three growth regimes; a kinetically
limited regime at low temperatures with an apparent activation energy of 0.330 ± 0.016 eV, a
mass transfer limited regime, and a parasitic reaction regime at high temperatures.‡‡‡ As shown
in Figure 2-12, this behavior is different from that observed in depositions using 33 (black) and
34 (red) where only two growth regimes exist: mass transfer limited and parasitic reaction.
Apparently the low temperature surface deposition reactions for 33 and 34 are faster than the
mass transfer rates. Conversely, the observation of a low temperature kinetic limitation using 34
indicates the rate limiting reaction step is slower than the mass transfer rate in the lower
temperature range. The greater steric bulk of 35 (vs. 33 and 34) and the computational evidence
for bimolecular decomposition steps are consistent with a greater kinetic limitation for film
growth from 35 at low temperatures. This kinetic barrier, however, is still small for typical CVD
conditions where apparent activation energies are normally above 0.5 eV.109 It has previously
been argued that the lowest energy pathway for film deposition is most likely the result of
intermolecular interactions between surface bound species or a surface-gas species interaction.
In the mass transfer limited regime, there is a noticeable difference in growth rate among
the precursors with the average growth rate increasing as 33 < 35 < 34. In general, growth rate
temperature dependence under mass transfer limited conditions follows a power law, Tn; where n
is typically 1.7-1.8 for a vertical down flow design.97 Depositions using 33, 34, and 34 exhibit
values of 1.3, 2.1 and 2.0 for n, respectively. A value of 2.1 has been previously reported for a
different precursor in the same reactor.97
‡‡‡ Film deposition and data collection were carried out by Christopher O’Donohue.
57
Figure 2-12. Growth kinetics comparing ln(G), where G is growth rate, versus inverse
temperature for films deposited from 33-35. The illustrated error bars are
representative of thickness measurements near the center of the substrate for multiple
samples and measurements.§§§
At higher deposition temperatures (> 400 °C), the growth rates from 33, 34, and 35
decrease with increasing temperature. This trend is associated commonly with parasitic reactions
resulting in wall deposition upstream of the heated susceptor, premature gas phase reactions,
and/or desorption of surface bound species. The apparent activation energies for this regime are
−0.386 ± 0.008 eV, −0.385 ± 0.009 eV, and −0.200 ± 0.020 eV for 33, 34, and 35, respectively.
Since parasitic reactions decrease the reactant concentration available for deposition and thus
deposition rate, the reported deposition activation energies are negative. It is noted that the mass
transfer to parasitic reaction controlled transition temperatures are similar for each precursor,
suggesting a similar parasitic reaction. Steric control of the parasitic high temperature process is
consistent with the observed trend, where the apparent activation energies for 33 and 34 are
§§§ Reprinted with permission from Koley, A.; O’Donohue, C. T.; Nolan, M. M.; McClain, K. R.; Bonsu, R. O.;
Korotkov, R. Y.; Anderson, T. J.; McElwee-White, L. Chem. Mater. 2015, 27, 8326-8336. Copyright (2015)
American Chemical Society
58
nearly identical, while that of 36 is significantly higher. The A values for methyl and ethyl are
1.74 and 1.75, respectively, while the value for isopropyl is 2.15,110 indicating a much larger
steric profile for the isopropyl substituents in 35 than for the methyl and ethyl substituents in 33
and 34.
WNxCy Film Composition
X-ray photoelectron spectroscopy (XPS) was used to determine elemental composition
and atomic valence states in the films. W, N, C, and O are the only elements evident in the
deposits from 35 within the detection limit of ~1% (Figure 2-13). Similar composition data for
material grown from 33 and 34 were reported previously.106,111
In the XPS data for deposits from 34, the W 4f doublet peak was consistent with
contributions from three separate tungsten compounds, whose nominal binding energies (BEs)
values112 are depicted in the superimposed stick patterns. Although the WNx and WC1-x peaks
were separated by approximately 0.2 eV, they are illustrated as a single WNxCy peak.
In the N XPS, the stick patterns are representative of nominal BEs for WNx and CNx at
397.5 eV and 400.2 eV, respectively; although they are labeled as WNxCy and “Free N” for ease
of illustration. At the deposition temperature of 100 °C the primary N 1s peak contained an
asymmetric tail at higher BEs that could be fitted with a peak at a BE of 400.1 eV, which is
consistent with nitrogen in the form CNx. This suggests that 35 may not fully decompose at 100
°C. At all other deposition temperatures, the only peak present was one located at 397.9 ± 0.2
eV, which is indicative of partially oxidized WNx.
Typical BEs for C 1s peaks from WC1-x reside around 283.5 eV, amorphous C between
284.5 eV and 285.0 eV depending on its nature, and CNx lies at approximately 286.0 eV (Figure
2-13). In the material deposited from 35 at 100 °C, small amounts of CNx (~11%) could be
detected. Spectra from materials deposited at all other deposition temperatures revealed only
59
peaks corresponding to amorphous C (labelled as “Free C”) and carbidic C (i.e., Cx-W). The
average amorphous C content at depositions below 300 °C was 23 ± 1%, whereas from 300-450
°C it was 29 ± 1%, and above 450 °C it increased to 43 ± 1% at 650 °C.
Figure 2-13. Evolution of the W 4f, N 1s, C 1s, and O 1s peaks with deposition temperature
using 35. Relevant and nominal material BEs112 are superimposed onto the plots by a
stick pattern.****
Adventitious nonstoichiometric tungsten oxide (WOx where 2.0 < x < 3.0) was also
detected in the XPS. Although the sub-peaks corresponding to WNxCy were relatively constant
for all deposition temperatures at 32.3 ± 0.1 eV and 34.3 ± 0.1 eV for W 4f7/2 and W 4f5/2,
respectively, the WOx peaks shift from 35.8 ± 0.2 eV and 37.6 ± 0.2 eV (below 250 °C) to 35.0 ±
**** Reprinted with permission from Koley, A.; O’Donohue, C. T.; Nolan, M. M.; McClain, K. R.; Bonsu, R. O.;
Korotkov, R. Y.; Anderson, T. J.; McElwee-White, L. Chem. Mater. 2015, 27, 8326-8336. Copyright (2015)
American Chemical Society
60
0.1 eV and 36.7 ± 0.2 eV (at and above 250 °C) for W 4f7/2 and W 4f5/2 peaks, respectively. This
suggests that higher temperature growth results in adventitious WOx that is less fully oxidized.
Observation of WOx in the W XPS region of films grown using 35 as a precursor can be
corroborated with the O 1s peak (Figure 2-13). The stick patterns represent WOx and “Free O”,
or more specifically adsorbed O2 from the atmosphere, at 530.5 eV and 531.6 eV, respectively.
At low deposition temperatures, the O 1s peak is an average of the two defined values, but as
deposition temperature increases there is a slight shift in peak position toward predominantly
WOx. The average WOx and free O peak positions are fairly constant throughout the full range of
deposition temperatures with average values of 530.7 ± 0.1 eV and 531.9 ± 0.2 eV, respectively.
Figure 2-14 illustrates the percentage of nitridic (i.e., Nx-W), oxidic (i.e., Ox-W), and
carbidic (i.e. Cx-W), and is representative of the respective percentage occupancy of the sub-peak
under the primary elemental peak. Therefore, not only does the W 4f peak become less saturated
with O signal with increasing deposition temperature, but the available signal is of a lower
oxidation state. The elemental composition of the material deposited from 35 is plotted in Figure
2-15 as function of deposition temperature in the range 100 to 650 °C and compared to
compositions measured also by XPS for films deposited from precursors 33 and 34. The
dominant feature of this comparison is the similarity of composition variation with deposition
temperature among the three precursors. This is not surprising given the similar molecular
structure and apparent common rate-determining decomposition reaction. Another feature is that
the W concentration is relatively constant in the middle temperature range but decreases
significantly at both low and high temperature. This pattern is consistent with a tradeoff for O
and C incorporation at lower and higher deposition temperatures, respectively. At the low
temperature limit, 35 may undergo incomplete decomposition and adventitious O incorporation
61
is competitive. At the high temperature limit, premature and aggressive precursor decomposition
become more significant, as does C incorporation from ligand and solvent decomposition. The N
concentration using 35 was relatively constant (range 6% at 100 °C to 14% at 400 °C).
Figure 2-14. Influence of precursor structure on the percentage of Nx-W, Ox-W, and Cx-W,
according to XPS peak deconvolution.††††
Interestingly, depositions using 35 resulted in the lowest N incorporation, whereas
depositions with 33 provided the most. Additionally, depositions using 33 and 35 provided
†††† Reprinted with permission from Koley, A.; O’Donohue, C. T.; Nolan, M. M.; McClain, K. R.; Bonsu, R. O.;
Korotkov, R. Y.; Anderson, T. J.; McElwee-White, L. Chem. Mater. 2015, 27, 8326-8336. Copyright (2015)
American Chemical Society
62
almost entirely nitridic N (i.e., Nx-W), except for the two lowest deposition temperatures where
there was a presence of CNx at approximately 14% and 17%, respectively. These properties are
unlike depositions with 34, which resulted in a minimum CNx presence of approximately 16%,
with an average of 18 ± 3% below 400 °C and 35 ± 2% above 400 °C. This incorporation was
probably because the formation of diethylamine and N-ethylethanimine during the
decomposition of 34 was much more feasible than from decomposition of 33 and 35. This was
due to the less steric hindrance observed during the hydrogen abstraction by the neighboring
diethylamido group for 34 compared to diisopropylamido group for 35.
Figure 2-15 further shows that C incorporation was nearly identical for all films grown
from 33-35, with integration of C becoming prominent above 450 °C. This was most likely the
result of solvent and/or ligand decomposition. It has been documented that pyridine undergoes
surface catalyzed decomposition at similar temperatures.
Figure 2-14 shows, however, that although qualitatively similar to depositions using 33
and 34, the extent of change in amorphous C incorporation with increasing temperature into the
films was less dramatic when using 34. This result was consistent with C incorporation by ligand
degradation in a surface reaction, which would be hindered by the additional steric bulk of 35.
Oxygen was incorporated into the films by two means: during film growth from
adventitious O2 and H2O or post-growth exposure to air. Due to the relatively low density and
amorphous nature of the films, significant in-diffusion of oxygen was likely. Additionally, at
these low growth temperatures, the sticking probability of gas was high and so any background
O-source can be integrated into the film. The average percentage of WOx below 250 °C was 51 ±
4% and increases steadily to almost 90% at 650 °C. It should be noted that although more of the
incorporated O was Ox-W (Figure 2-14), there was less overall O content in the film (Figure 2-
63
15). The decrease in post-growth O was likely from film densification and C stuffing in the film,
both of which would prevent O in-diffusion.
Deconvolution of the O 1s peaks show that depositions from 34 and 35 experience nearly
identical ratios of free O and Ox-W, where-as films deposited from 33 experienced less Ox-W.
Figure 2-15. Elemental composition for films deposited from 33-35 at various deposition
temperatures, according to XPS. Note differences in concentration scale.‡‡‡‡
‡‡‡‡ Reprinted with permission from Koley, A.; O’Donohue, C. T.; Nolan, M. M.; McClain, K. R.; Bonsu, R. O.;
Korotkov, R. Y.; Anderson, T. J.; McElwee-White, L. Chem. Mater. 2015, 27, 8326-8336. Copyright (2015)
American Chemical Society
64
WNxCy Film Microstructure
Control of the film microstructure was important in diffusion barrier applications. An
amorphous barrier was preferable to a polycrystalline barrier due to the low-energy diffusion
pathways that grain boundaries afford.113 According to GIXD measurements (Figure 2-16), films
deposited from 34 and 35 developed crystallinity at 350 °C and 400 °C, respectively (Figure 2-
16b), whereas films grown from 33 were entirely amorphous for all deposition temperatures.
Films deposited below 350 °C and 400 °C for films grown from 34 and 35, respectively, were
entirely amorphous (Figure 2-16). The primary β-WNxCy (i.e., face-centered-cubic structure)
reflections are expected to result from a solid solution of β-WN0.5 and β-WC0.6, which have
proximal reflections, and for that reason are illustrated as a single reflection. The stick pattern
exists at 37.42, 43.12, 65.52, and 75.22 °2θ for the β-WNxCy (111), β-WNxCy (200), β-WNxCy
(220), and β-WNxCy (311) crystallographic planes, respectively. These powder reflections do, in
fact, coincide with both β-WN0.5 and β-WC0.6 solutions. Similarly, the primary WO3 stick pattern
was an amalgamation of reflections for three common WO3 phases; monoclinic, tetragonal, and
cubic. There are, however, no apparent reflections for any phase of WO3, which should improve
the barrier properties (increased structural disorder).
In both cases there was slight preferential texturing for the β-WNxCy (111) plane,
according to the peak prominence, and therefore its position was used to estimate the lattice
parameter and its full-width-half-max (FWHM) was used to estimate the lower limit of the grain
size, via Scherrer’s equation. The slight discrepancy in peak locations (from the standard) are
expected to be from compositional variations in the film, and not lattice strain, due to the highly
disordered nature of the film as evident in the nanocrystalline domain sizes described in the next
section.
65
Figure 2-16. A) Grazing Incidence X-ray Diffraction (GIXD) patterns taken for films deposited
using compounds 34 and 35. B) Typical crystallographic planes for relevant
materials with respect to their preferred structures and according to their relative
intensities.§§§§
Recall, the XPS data indicate that W was bound to C, N, and O. From that analysis it was
expected that those components belong to either a fully integrated WNxCyOz matrix, separate
interspersed matrices such as WNx, WCx, and WOx, or any permutation in between (e.g., WNxCy
and WOx; WNxOy and WCx; WNx and WCxOy). The crystallographic data obtained using GIXD
(Figure 2-16), suggest that WNx, WCx or the solid solution WNxCy phases exist and adopt a face-
centered-cubic structure. Unfortunately, it cannot be stated with confidence that a separate and
distinct WOx phase exists. The data were consistent with formation of a crystalline β-WNxCy
§§§§ Reprinted with permission from Koley, A.; O’Donohue, C. T.; Nolan, M. M.; McClain, K. R.; Bonsu, R. O.;
Korotkov, R. Y.; Anderson, T. J.; McElwee-White, L. Chem. Mater. 2015, 27, 8326-8336. Copyright (2015)
American Chemical Society
66
core phase surrounded by WNxCyOz solid solution, which forms upon air exposure. Therefore,
the lattice parameter of that crystalline phase should lie around the values of β-WNx or β-WCx.
The lattice constants for β-WC0.6 and β-WN0.5 are 4.236 Å and 4.126 Å, respectively. The lattice
parameters for crystalline films grown with 34 and 35 decrease with increasing deposition
temperature and have maximum values of 4.229 Å and 4.215 Å and minimum values of 4.135 Å
and 4.162 Å, respectively. It was expected that β-WNxCy would produce lattice parameter values
between the endpoints of the solid solution tie line.
It has been shown that lattice constants can increase with deposition temperature as a
result of greater incorporation of C into the lattice. Films deposited from 34 and 35 do in fact
contain greater C levels at higher deposition temperatures, however, it was important to note that
the percentage of Cx-W decreases with increasing temperature. Consequently, a decrease in
lattice constant with respect to the β-WC0.6 lattice constant was seen for films grown from both
34 and 35. This was especially true for films grown with 34, where amorphous C became more
fully integrated.
WNxCy Film Surface Roughness
Highly smooth films are desirable for applications in integrated circuit manufacturing as
they promote interlayer adhesion and minimize electron scattering that increases contact
resistances between layers.80,114 Atomic force microscopy (AFM) measurements were performed
to determine the root-mean-squared (RMS) surface roughness (Figure 2-17). Films deposited
using precursors 33-35 resulted in smooth films that exhibited similar RMS roughness trends at
temperatures below 450 °C. Above 450 °C, the deposits from 34 and 35 continued to increase in
roughness as the films became more crystalline, whereas 33 produced smooth amorphous films
throughout the entire deposition temperature range. The average RMS surface roughness below
150 °C was 0.50 nm, 0.58 nm, and 0.58 nm for films grown from 33, 34, and 35, respectively.
67
These values approached that of the underlying Si substrate (0.18 nm) and are highly desirable.
Between 150-450 °C, the average RMS roughness increased to 2.1 ± 0.4 nm, 1.7 ± 0.7 nm, and
1.3 ± 0.2 nm for films grown with 33, 34, and 35 respectively. The slight roughening of films at
intermediate growth temperatures can be explained by an increase in growth rate, which
promotes the propagation of underlying features more quickly. Additionally, incorporation of
amorphous C has been shown to encourage roughening of the film.
Figure 2-17. Average surface RMS roughness for films deposited from 33-35.*****
WNxCy Film Density Measurements
Films deposited from 33-35 were analyzed with X-ray reflectivity (XRR) to determine
film densities with respect to deposition temperature (Figure 2-18). Film densification occured
for all three precursors with increasing deposition temperature, except at 650 °C. This was
typical of CVD growth as crystallinity is enhanced with temperature due to increased bulk and
surface diffusion rates.81,83 For all three precursors, density decreased at 650 °C when large
***** Reprinted with permission from Koley, A.; O’Donohue, C. T.; Nolan, M. M.; McClain, K. R.; Bonsu, R. O.;
Korotkov, R. Y.; Anderson, T. J.; McElwee-White, L. Chem. Mater. 2015, 27, 8326-8336. Copyright (2015)
American Chemical Society
68
amounts of low density amorphous C (2-3 g/cm3)115 were intermixed with the denser WNxCy
films. Density values for bulk fully crystalline WNxCy have been reported at 15.6 g/cm3, whereas
amorphous WNxCy has been reported between 3-13.1 g/cm3.8,84,85 The slightly smaller density
values for films grown from 33-35 can be attributed to significant O incorporation, which
enhances the disorder in the film and prevents crystal packing, in addition to WOx having a
lower average density (7 g/cm3).86 Regardless, it has been reported that film microstructure was
predominantly responsible for inhibition of Cu diffusion in barrier materials and that density is of
secondary importance for the application.87
Figure 2-18. Correlation between deposition temperature and measured film density for
precursors 33-35.†††††
Films deposited below 650 °C have minimum densities of 4.1 g/cm3, 4.2 g/cm3, and 4.2
g/cm3 for films grown from 33, 34, and 35 respectively. Conversely, maximum film densities
were 6.4 g/cm3, 8.0 g/cm3, and 8.8 g/cm3 when using 33, 34, and 35 respectively. Films from 33
††††† Reprinted with permission from Koley, A.; O’Donohue, C. T.; Nolan, M. M.; McClain, K. R.; Bonsu, R. O.;
Korotkov, R. Y.; Anderson, T. J.; McElwee-White, L. Chem. Mater. 2015, 27, 8326-8336. Copyright (2015)
American Chemical Society
69
were the least dense for all deposition temperatures, which reflect upon their highly amorphous
microstructure, whereas 34 produced the densest films for all temperatures but 450 °C.
Diffusion Barrier Testing
The tests of films grown from 33 and 34 as Cu diffusion barriers have been presented
elsewhere.106,111 The integrity of film grown from 35 as a diffusion barrier is discussed here. Thin
WNxCy films (~5 nm thickness) grown from 35 at 150 °C were evaluated by depositing
approximately 100 nm of Cu onto WNxCy film and annealing the Cu/WNxCy/Si stack at 500 °C
for 30 min under N2.
Figure 2-19. XRD Patterns for as-deposited and post-annealed Cu/WNxCy/Si material
stacks.‡‡‡‡‡
An etch-pit test was performed to evaluate Cu diffusion through the barrier. The etch pit
test has greater sensitivity to Cu diffusion than either 4 Point Probe (4PP) or XRD measurements
(Figure 2-19). Figure 2-20 displays SEM plan-view images of etched films on the post-annealed
Cu/WNxCy/Si stacks (Figure 2-20a and 2-20b), the as-deposited Cu/WNxCy/Si stacks (Figure 2-
‡‡‡‡‡ Reprinted with permission from Koley, A.; O’Donohue, C. T.; Nolan, M. M.; McClain, K. R.; Bonsu, R. O.;
Korotkov, R. Y.; Anderson, T. J.; McElwee-White, L. Chem. Mater. 2015, 27, 8326-8336. Copyright (2015)
American Chemical Society
70
10c), and a failed barrier for comparison (Figure 2-20d). In the event of even small scale Cu
diffusion to the surface, micron-sized inverted pyramidal features (appearing as bright rectangles
in Figure 2-20d) would be visible on the surfaces. The lack of inverted pyramidal features in
Figures 2-20a (lower magnification) and 2-20b (higher magnification) was evidence for
successful barrier performance by films deposited from 35.
Figure 2-20. A) Plan-view image of etch-pit test for post-annealed Cu/WNxCy/Si stack at lower
magnification, B) plan-view image of etch-pit test for post-annealed Cu/WNxCy/Si
stack at higher magnification and C) plan-view image of etch-pit test for as-deposited
Cu/ WNxCy/Si stack, and D) image of failed post-annealed Cu/ WNxCy/Si stack for
comparison purposes.§§§§§
To assess the diffusion barrier tests, XRD and four point probe (4PP) measurements were
first performed. Figure 2-19 illustrates the change in crystallinity between the as-deposited
samples and the post-annealed samples with an annealed Cu/Si structure there to highlight peak
positions for Cu3Si.
§§§§§ Reprinted with permission from Koley, A.; O’Donohue, C. T.; Nolan, M. M.; McClain, K. R.; Bonsu, R. O.;
Korotkov, R. Y.; Anderson, T. J.; McElwee-White, L. Chem. Mater. 2015, 27, 8326-8336. Copyright (2015)
American Chemical Society
71
Peaks for Cu (111) and Cu (200) were present at 43.55 and 50.89 °2θ, respectively, for
both as-deposited and post-annealed samples, in addition to a smaller Cu (220) peak at 74.43 °2θ
for the post-annealed sample. Cu (111) is the preferred orientation for barrier applications since
it offers the lowest electrical resistivity and highest electromigration resistance.116 The critical
peaks of Cu3Si (110) and Cu3Si (103) peaks that appeared at 44.77 and 45.35 °2θ, respectively,
in the annealed Cu/Si stack did not appear in either the as-deposited or post-annealed
Cu/WNxCy/Si stacks.
Furthermore, the onset of Cu3Si precipitates can drastically increase the resistivity of the
material stacks upon annealing. The as-deposited and annealed Cu/Si stack had resistivity
measurements of 4.5 ± 0.3 μΩ-cm and 97.3 ± 12.3 μΩ-cm, respectively. In comparison, the
resistivity of the as-deposited and annealed Cu/WNxCy/Si stacks were 5.1 ± 0.2 μΩ-cm and 4.8 ±
0.2 μΩ-cm, respectively. These results were consistent with an intact barrier.
Figure 2-21. HRTEM image clearly showing smooth and distinct boundaries for a post-annealed
Cu/WNxCy/Si sample grown from 35.******
****** Reprinted with permission from Koley, A.; O’Donohue, C. T.; Nolan, M. M.; McClain, K. R.; Bonsu, R. O.;
Korotkov, R. Y.; Anderson, T. J.; McElwee-White, L. Chem. Mater. 2015, 27, 8326-8336. Copyright (2015)
American Chemical Society
72
An additional test for barrier evaluation was to examine the interfaces with a high
resolution transmission electron microscope (HRTEM). Figure 2-21 is a cross-sectional HRTEM
image depicting the well-defined interfaces present in a post-annealed Cu/WNxCy/Si sample.
The single crystal lattice structures of the Si substrate and the polycrystalline Cu film are clearly
visible. The amorphous nature of the native Si oxide (SiO2) and WNxCy films is also evident.
Conclusion
By manipulation of reaction conditions, several compounds of the type
WN(NR2)(NRʹ2)(NRʺ
2) were synthesized. Reduced symmetry and increased steric bulk were
associated with improved volatility, an important property for use of the compounds in
conventional CVD or ALD. Compounds 49-52 would be better choice as precursors for ALD
applications and compound 50 would be the best precursor for that application since it sublimes
without decomposition. Complexes 33-47 would be suitable for AACVD given their lower
volatility compared to 49-52 and decomposition during sublimation. The TGA of 35 was
characteristic of sublimation. WNxCy thin films were successfully deposited at temperatures as
low as 100 °C using AACVD from pyridine solutions of 35 (0.051 M). The effect of ligand
structure on film properties has been ascertained. It was determined that 34 and 35 offer more
desirable film properties for diffusion barrier applications in terms of growth rate, surface
roughness, composition, and density. The integrity of thin films deposited from 35 was evaluated
for inhibition of Cu diffusion by 4PP, XRD, SEM etch-pit test, and HRTEM. Cu (~100
nm)/WNxCy (~5 nm)/Si stacks successfully passed annealing at 500 °C for 30 minutes in N2.
Therefore, 35 was identified as a viable single-source precursor for deposition of WNxCy for Cu
diffusion barrier applications.
73
Experimental Section
General Procedures
Unless otherwise specified, all manipulations were performed under an inert atmosphere
(N2, Ar) using standard Schlenk and glovebox techniques. Toluene was purified using an
MBraun MB-SP solvent purification system and stored over activated 3 Å molecular sieves prior
to use. Benzene-d6 was purchased from Cambridge Isotope Laboratories, Inc. and stored over
activated 3 Å molecular sieves (15% w/v) for several days in an inert atmosphere glove box prior
to use. Anhydrous tert-butanol, pentane and redistilled diisopropylamine were purchased from
Sigma-Aldrich and used as received. Hexamethyldisiloxane and pyridine were purchased from
Sigma-Aldrich or Alfa Aesar and stored over activated 3 Å molecular sieves (15% w/v) for
several days in an inert atmosphere glove box prior to use. Compounds 33 and 34 were prepared
as previously described.106,117 All other chemicals were purchased and used as received. 1H and
13C NMR spectra were obtained using Gemini, Mercury, or VXR 300 MHz spectrometers
(Varian shims/probes; Oxford magnets) using the residual protons of the deuterated solvents as
reference peaks. Mass spectra were obtained with a Thermo Scientific Trace GC DSQ mass
spectrometer using the DIP-CI mode of operation or an Agilent 6200 ESI-TOF mass
spectrometer using DART-TOF mode of operation. Elemental analysis results were attained
from Complete Analysis Laboratories, Inc.
Synthesis of WN(NMe2)(NiPr2)2 (35)
In a 100 mL Schlenk flask, 0.50 g (1.5 mmol) of 33 and 10 mL of diisopropylamine (7.2
g, 71 mmol) were combined to give an orange/red suspension. A reflux condenser was attached
and the mixture was brought to a gentle reflux under argon. After 12 h, solvent was removed
from the dark brown solution under vacuum at room temperature. The crude product was
extracted by stirring with hexamethyldisiloxane (50 mL) for 15 min and filtered through Celite.
74
The filter pad was washed with additional hexamethyldisiloxane (2 × 5 mL). The resulting
brown filtrate was concentrated to saturation and left in the glovebox refrigerator (-15 °C)
overnight. The mother liquor was removed, and the product was dried under vacuum to yield
0.40 g (0.90 mmol) of pure 35 as colorless microcrystals (60%). 1H NMR (C6D6, 300 MHz): δ =
1.29 [d, J = 6 Hz, 12 H, -N(CH(CH3)a(CH3)b)2]; 1.37 [d, J = 6 Hz, 12 H, -N(CH(CH3)a(CH3)b)2];
3.37 [s, 6 H, -N(CH3)2]; 3.45 [m, J = 6.4 Hz, 4 H, -N(CH(CH3)a(CH3)b)2]. 13C NMR (C6D6, 75
MHz): δ = 26.2 [-N(CH(CH3)a(CH3)b)2]; 27.2 [-N(CH(CH3)a(CH3)b)2]; 51.4 [-N(CH3)2]; 52.3 [-
N(CH(CH3)a-(CH3)b)2]. DIP-CI-MS: calcd. for [M + H]+ 443.2368; found 443.2364.
C14H34N4W (442.29): calcd. C 38.02, H 7.75, N 12.67; found C 37.89, H 7.68, N 12.63.
Synthesis of WN(NMe2)2(NiPr2) (36)
In a 100 mL Schlenk flask, 0.25 g (0.76 mmol) of 33 and 60 mL of pentane were
combined to create a white slurry. To the slurry, 3.0 mL of diisopropylamine (2.2 g, 21 mmol)
was added to give an orange/red suspension. A reflux condenser was attached and the mixture
was brought to a gentle reflux under argon. After 12 h, the resulting amber/brown solution was
returned to room temperature and solvent was removed under vacuum. The product was
extracted by stirring with hexamethyldisiloxane (30 mL) for 15 min and filtered through Celite.
The filter pad was washed with additional hexamethyldisiloxane (2 × 5 mL). The resulting
brown filtrate was concentrated to saturation and left in the glovebox refrigerator (-15 °C)
overnight. The mother liquor was removed, and the product was dried under vacuum to yield
0.19 g (0.49 mmol) of pure 36 as colorless microcrystals (65%). 1H NMR (C6D6, 300 MHz): δ =
1.31 [d, J = 6 Hz, 12 H, -N(CH(CH3)2)2]; 3.35 [s, 12 H, -N(CH3)2]; 3.41 [m, J = 6 Hz, 2 H, - N(-
CH(CH3)2)2]. 13C NMR (C6D6, 75 MHz): δ = 26.4 [-N(CH(CH3)2)2]; 51.3 [-N(CH3)2]; 51.9 [-N-
(CH(CH3)2)2]. DIP-CI-MS: calcd. for [M + H]+ 387.1747; found 387.1750. C10H26N4W
(386.19): calcd. C 31.10, H 6.79, N 14.51; found C 30.93, H 6.83, N 14.43.
75
General Procedure A
In a 100 mL Schlenk flask, 0.25 g (0.76 mmol) of 33 and 60 mL of pentane were
combined to create a white slurry. To the slurry, the amine was added in excess to give an
orange/red suspension. A reflux condenser was attached and the mixture was brought to a gentle
reflux under argon. After 12 h, the resulting amber/brown solution was returned to room
temperature and solvent was removed under vacuum. The product was extracted by stirring with
hexamethyldisiloxane (30 mL) for 15 min and filtered through Celite. The filter pad was washed
with additional hexamethyldisiloxane (2 × 5 mL). Solvent was removed from the filtrate to give
a crude solid. Sublimation of the crude product gave pure product.
Synthesis of WN(NMe2)(NiBu2)2 (39)
Compound 39 was synthesized by General Procedure A. The crude product was purified
by sublimation at 150-250 mTorr and 80-85 °C to afford an orange-white solid. Yield: 60%. 1H
NMR (C6D6, 300 MHz): δ 0.95 [dd, J = 6.3 Hz, 24H, −N(CHaHbCH(CH3)c(CH3)d)]; 1.98 [sp, J =
7 Hz, 4H, −N(CHaHbCH(CH3)c(CH3)d)]; 3.40 [s, 6H, −N(CH3)2]; 3.49 [d, J = 6 Hz, 4H,
−N(CHaHbCH(CH3)c(CH3)d)]; 3.55 [d, J = 6.6 Hz, 4H, −N(CHaHbCH(CH3)c(CH3)d)]. 13C NMR
(C6D6, 75 MHz): δ 20.4 [−N(CHaHbCH(CH3)c(CH3)d)]; 20.7 [−N(CHaHbCH(CH3)c(CH3)d)]; 27.1
[−N(CHaHbCH(CH3)c(CH3)d)]; 52.4 [−N(CH3)2]; 66.5 [−N(CHaHbCH(CH3)c(CH3)d)]. DIP-CI-
MS: calcd for [M + H]+ 497.2970; found 497.2950.
Synthesis of WN(N(CH2)5)3 (40)
Compound 40 was synthesized by General Procedure A. The crude product was purified
by sublimation at 150-250 mTorr and 70-80 °C to afford an orange solid. Yield: 60%. 1H NMR
(C6D6, 300 MHz): 1.39 [m, 6H, -NCH2CH2CH2]; 1.47 [m, J 12H, -NCH2CH2CH2]; 3.80 [t, J =
6 Hz, 12H, -NCH2CH2CH2]; 13C NMR (C6D6, 75 MHz): 25.2 [-N(CH2CH2CH2)]; 29.7 [-
76
N(CH2CH2CH2)]; 60.7 [-N(CH2CH2CH2)]. DIPCI-MS calcd. for [M + H]+ 449.2931; found
449.2934.
Synthesis of WN(N(CH2)6)3 (41)
Compound 41 was synthesized by General Procedure A. The crude product was purified
by sublimation at 150-250 mTorr and 75-85 °C to afford an orange solid. Yield: 55%. 1H NMR
(C6D6, 300 MHz): 1.51 [br m 6H, -NCH2CH2CH2]; 1.75 [br m, 12H, -NCH2CH2CH2]; 3.80 [t,
J = 6 Hz, 12H, -NCH2CH2CH2]; 13C NMR (C6D6, 75 MHz): 26.8 [-N(CH2CH2CH2)]; 33.6
[-N(CH2CH2CH2)]; 61.3 [-N(CH2CH2CH2)]. DIPCI-MS calcd. for [M + H]+ 493.2525; found
493.2513.
General Procedure B
In a 200 mL Schlenk flask, 0.50 g (1.5 mmol) of 33 and 80 mL pentane were combined
to form a white slurry. To the slurry, 6.0 mL of diisopropylamine (4.3 g, 43 mmol) was added to
give an orange/red suspension. A reflux condenser was attached and the mixture was brought to
a gentle reflux under Ar. After 12 h, solvent was removed from the amber/brown solution under
vacuum at room temperature. The residue was extracted by stirring with hexamethyldisiloxane
(50 mL) for 15 min and filtered through Celite. The filter pad was washed with additional
hexamethyldisiloxane (2 × 5 mL). Solvent was removed from the resulting brown filtrate under
vacuum to give crude 36. This was dissolved in pentane (60 mL) and amine was added in excess.
A reflux condenser was attached and the mixture was brought to a gentle reflux under Ar. After
12 h, solvent was removed from the dark brown solution under vacuum at room temperature.
Sublimation of the crude residue afforded pure product.
Synthesis of WN(NEt2)2(NiPr2) (38)
Compound 38 was synthesized by General Procedure C. The crude product was purified
by sublimation at 200-300 mTorr and 60-65 °C to afford light amber microcrystalline powder.
77
Yield 50%. 1H NMR (C6D6, 300 MHz): δ = 1.15 [t, J = 7 Hz, 12 H, -N(CH2CH3)2]; 1.34 [d, J = 6
Hz, 12 H, -N(CH(CH3)2)2]; 3.42 [m, J = 6 Hz, 2 H, -(CH(CH3)2)2]; 3.51-3.72 [m, J = 7 Hz, 8 H,
N(CH2CH3)2]. 13C NMR (C6D6, 75 MHz): δ = 17.6 [-N(CH2CH3)]; 26.6 [-N(CH(CH3)2)2]; 51.2
[-N(CH2CH3)2]; 52.7 [-N(CH(CH3)2)2]. DIP-CI-MS: calcd. for [M + H]+ 443.2373; found
443.2366. C14H34N4W (442.29): calcd. C 38.02, H 7.75, N 12.67; found C 37.79, H 7.71, N
12.58.
Synthesis of WN(N(CH2)5)2(NiPr2) (42)
Compound 42 was synthesized by General Procedure B. The crude product was purified
by sublimation at 150-250 mTorr and 60-70 °C to afford orange-white solid. Yield 50%. 1H
NMR (C6D6, 300 MHz): δ 1.30 [br m, 8H, −NCH2CH2CH2]; 1.40 [d, J = 3 Hz, 12H,
−N(CH(CH3)2)2]; 1.47 [br m, 4H, −NCH2CH2CH2]; 3.44 [m, 2H, −N(CH(CH3)2)2]; 3.80 [t, J = 6
Hz, 12H, −NCH2CH2CH2]. 13C NMR (C6D6, 75 MHz): δ 25.2 [−N(CH(CH3)2)2]; 26.4
[−NCH2CH2CH2]; 29.7 [−NCH2CH2CH2]; 51.0 [−N(CH(CH3)2)2]; 60.7 [−NCH2CH2CH2]. MS
(DART-TOF): calcd for [M + H]+ 467.2368; found 467.2346.
Synthesis of WN(N(CH2)6)2(NiPr2) (43)
Compound 43 was synthesized by General Procedure B. The crude product was purified
by sublimation at 15-250 mTorr and 70-80 °C to afford orange-white solid. Yield 50%. 1H
NMR (C6D6, 300 MHz): δ 1.36 [dd, J = 24, 6 Hz, 12H, −N(CH(CH3)2)2]; 1.52 [br m, 8H,
−NCH2CH2CH2]; 1.78 [br m, 4H, −NCH2CH2CH2]; 3.47 [m, J = 6 Hz, 2H, −N(CH(CH3)2)2];
3.81 [t, J = 6 Hz, 12H, −NCH2CH2CH2]. 13C NMR (C6D6, 75 MHz): δ 26.4 [−N(CH(CH3)2)2];
26.8 [−NCH2CH2CH2]; 33.5 [−NCH2CH2CH2]; 50.9 [−N(CH(CH3)2)2]; 61.6 [−NCH2CH2CH2].
MS (DART-TOF): calcd for [M + H]+ 495.2681; found 495.2694.
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General Procedure C
In a 100 mL Schlenk flask, 0.50 g (1.5 mmol) of 33 and 10 mL of diisopropylamine (7.2
g, 71 mmol) were combined to create an orange/red suspension. A reflux condenser was
attached and the mixture was brought to a gentle reflux under Ar. After 12 h, solvent was
removed from the dark brown solution under vacuum at room temperature. The residue was
extracted by stirring with hexamethyldisiloxane (50 mL) for 15 min and filtered through Celite.
The filter pad was washed with additional hexamethyldisiloxane (2 × 5 mL). Solvent was
removed from the resulting brown filtrate under vacuum to give crude 35, which was slurried in
excess amine. A reflux condenser was attached and the mixture was brought to a gentle reflux
under Ar. After 6 h, solvent was removed from the dark brown solution under vacuum at room
temperature. Sublimation of the crude residue afforded pure product.
Synthesis of WN(NEt2)(NiPr2)2 (37)
Compound 37 was synthesized by General Procedure C. The crude product was purified
by sublimation at 200-300 mTorr and 55-65 °C to afford light amber microcrystalline powder.
Yield 50%. 1H NMR (C6D6, 300 MHz): δ = 1.15 [t, J = 7 Hz, 6 H, -N(CH2CH3)2]; 1.26 [d, J = 6
Hz, 12 H, -N(CH(CH3)a(CH3)b)2]; 1.33 [br. d, 12 H, -N(CH(CH3)a(CH3)b)2]; 3.46 [m, J = 6 Hz, 4
H, -N(CH(CH3)a(CH3)b)2]; 3.62 [q, J = 7 Hz, 4 H, -N(CH2CH3)2]. 13C NMR (C6D6, 75 MHz): δ
= 17.2 [-N(CH2CH3)]; 26.8 [-N(CH(CH3)a(CH3)b)2]; 51.4 [-N(CH2CH3)2]; 52.7 [-N(CH(CH3)a-
(CH3)b)2]. DIP-CI-MS: calcd. for [M + H]+ 471.2687; found 471.2705. C16H38N4W (470.35):
calcd. C 40.86, H 8.14, N 11.91; found C 40.78, H 7.99, N 11.76.
Synthesis of WN(N(CH2)5)(NiPr2)2 (45)
Compound 45 was synthesized by General Procedure C. The crude product was purified
by sublimation at 150-250 mTorr and 55-65 °C to afford orange-white solid. Yield 50%. 1H
NMR (C6D6, 300 MHz): δ 1.30 [d, J = 6 Hz, 12H, −N(CH(CH3)a(CH3)b)]; 1.39 [d, J = 6 Hz,
79
12H, −N(CH(CH3)a(CH3)b)]; 1.44–1.49 [m, 6H, −NCH2CH2CH2]; 3.44 [m, J = 6 Hz, 4H,
−N(CH(CH3)a(CH3)b)]; 3.80 [t, J = 6 Hz, 4H, −NCH2CH2CH2]. 13C NMR (C6D6, 75 MHz): δ
25.2 [−N(CH(CH3)a(CH3)b)]; 25.9 [−N(CH(CH3)a(CH3)b)]; 26.6 [−NCH2CH2CH2]; 29.3
[−NCH2CH2CH2]; 51.2 [−N(CH(CH3)a(CH3)b)]; 61.6 [−NCH2CH2CH2]. MS (DART-TOF):
calcd for [M + H]+ 483.2681; found 483.2663.
Synthesis of WN(N(CH2)6)(NiPr2)2 (46)
Compound 46 was synthesized by General Procedure C. The crude product was purified
by sublimation at 150-250 mTorr and 60-65 °C to afford orange-white solid. Yield 50%. 1H
NMR (C6D6, 300 MHz): δ 1.31 [d, J = 6 Hz, 12H, −N(CH(CH3)a(CH3)b)]; 1.39 [d, J = 6 Hz,
12H, −N(CH(CH3)a(CH3)b)]; 1.52 [br m, 6H, −NCH2CH2CH2]; 1.78 [br m, 6H, NCH2CH2CH2];
3.47 [sp, J = 6 Hz, 4H, −N(CH(CH3)a(CH3)b)]; 3.80 [t, J = 6 Hz, 4H, −NCH2CH2CH2]. 13C NMR
(C6D6, 75 MHz): δ 25.3 [−NCH(CH3)a(CH3)b]; 26.4 [−NCH(CH3)a(CH3)b]; 26.8
[−NCH2CH2CH2]; 33.2 [−NCH2CH2CH2]; 51.1 [−NCH(CH3)a(CH3)b]; 61.6 [−NCH2CH2CH2].
MS (DART-TOF): calcd for [M + H]+ 497.2838; found 497.2861.
General Procedure D
In a 200 mL Schlenk flask, 0.50 g (1.3 mmol) of 36 and 80 mL pentane were combined
to form a white slurry. To the slurry, 8.0 mL of diisobutylamine (5.9 g, 46 mmol) was added to
give an orange/red suspension. A reflux condenser was attached and the mixture was brought to
a gentle reflux under Ar. After 12 h, solvent was removed from the amber/brown solution under
vacuum at room temperature. The residue was extracted by stirring with hexamethyldisiloxane
(50 mL) for 15 min and filtered through Celite. The filter pad was washed with additional
hexamethyldisiloxane (2 × 5 mL). Solvent was removed from the resulting brown filtrate under
vacuum to give the crude product. This was dissolved in pentane (60 mL) and the amine was
added in excess. A reflux condenser was attached and the mixture was brought to a gentle reflux
80
under Ar. After 3 h, solvent was removed from the dark brown solution under vacuum at room
temperature. Sublimation of the crude residue afforded pure product.
Synthesis of WN(NMe2)(NiPr2)(NiBu2) (49)
Compound 49 was synthesized by General Procedure D. The crude product was purified
by sublimation at 150-250 mTorr and 45-55 °C to afford orange-white solid. Yield 50%. 1H
NMR (C6D6, 300 MHz): δ 0.91 [d, J = 6 Hz, 6H, −NCH2CH(CH3)a(CH3)b]; 0.99 [d, J = 6 Hz,
6H, −NCH2CH(CH3)a(CH3)b]; 1.28 [d, J = 6 Hz, 12H, −N(CH(CH3)a(CH3)b)]; 1.36 [d, J = 6 Hz,
12H, −N(CH(CH3)a(CH3)b)]; 1.97 [sp, J = 6 Hz, 2H, −NCH2CH(CH3)a(CH3)b]; 3.37 [s, 6H,
−N(CH3)2]; 3.43–3.54 [m, J = 6 Hz, 12H, −N(CH(CH3)a(CH3)b), −NCH2CH(CH3)a(CH3)b];)].
13C NMR (C6D6, 75 MHz): δ 20.1 [−NCH2CH(CH3)a(CH3)b]; 20.8 [−NCH2CH(CH3)a(CH3)b];
25.8 [−N(CH(CH3)a(CH3)b)]; 26.7 [−N(CH(CH3)a(CH3)b)]; 27.2 [−NCH2CH(CH3)a(CH3)b]; 51.0
[−N(CH3)2]; 51.9 [−N(CH(CH3)a(CH3)b)]; 66.2 [−NCH2CH(CH3)a(CH3)b]. DIP-CI-MS: calcd for
[M + H]+ 471.2681; found 471.2690.
Synthesis of WN(NEt2)(NiPr2)(NiBu2) (50)
Compound 50 was synthesized by General Procedure D. The crude product was purified
by sublimation at 150-250 mTorr and 40-50 °C to afford orange-white solid. Yield 45%. 1H
NMR (C6D6, 300 MHz): δ 0.94 [d, J = 6 Hz, 6H, −NCH2CH(CH3)a(CH3)b]; 0.95 [d, J = 6 Hz,
6H, −NCH2CH(CH3)a(CH3)b]; 1.15 [t, J = 6 Hz, 3H, −N(CH2CH3)a(CH2CH3)b]; 1.17 [t, J = 6 Hz,
3H, −N(CH2CH3)a(CH2CH3)b]; 1.31 [d, J = 6 Hz, 6H, −N(CH(CH3)a(CH3)b)]; 1.36 [d, J = 6 Hz,
6H, −N(CH(CH3)a(CH3)b)]; 1.97 [sp, J = 6 Hz, 2H, −NCH2CH(CH3)a(CH3)b]; 3.37–3.67 [m,
10H, −NCH2CH3, −N(CH(CH3)a(CH3)b), −NCH2CH(CH3)a(CH3)b]. 13C NMR (C6D6, 75 MHz): δ
16.5 [−N(CH2(CH3)a)(CH2(CH3)b)]; 16.8 [−N(CH2(CH3)a)(CH2(CH3)b)]; 20.1
[−NCH2CH(CH3)a(CH3)b]; 20.4 [−NCH2CH(CH3)a(CH3)b]; 25.8 [−N(CH(CH3)a(CH3)b)]; 26.3
[−N(CH(CH3)a(CH3)b)]; 27.1 [−NCH2CH(CH3)a(CH3)b]; 50.6 [−N(CH2(CH3)a)(CH2(CH3)b)];
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52.0 [−N(CH(CH3)a(CH3)b)]; 66.2 [−NCH2CH(CH3)a(CH3)b]. DIP-CI-MS: calcd for [M + H]+
499.2994; found 499.2998.
Synthesis of WN(N(CH2)5)(NiPr2)(NiBu2) (51)
Compound 51 was synthesized by General Procedure D. The crude product was purified
by sublimation at 150-250 mTorr and 42-50 °C to afford orange-white solid. Yield 45%. 1H
NMR (C6D6, 300 MHz): δ 1.00 [d, J = 6 Hz, 12H, −NCH2CH(CH3)2]; 1.29–1.46 [m, 18H,
−N(CH(CH3)a(CH3)b), −NCH2CH2CH2]; 1.98 [sp, J = 6 Hz, 2H, −NCH2CH(CH3)2]; 3.44 [m, J =
6 Hz, 2H, −N(CH(CH3)a(CH3)b)]; 3.62 [br m, 4H, −NCH2CH(CH3)a(CH3)b]; 3.80 [t, J = 6 Hz,
4H, −NCH2CH2CH2]. 13C NMR (C6D6, 75 MHz): δ 20.4 [−NCH2CH(CH3)a(CH3)b]; 20.8
[−NCH2CH(CH3)a(CH3)b]; 25.0 [−N(CH(CH3)a(CH3)b)]; 25.2 [−N(CH(CH3)a(CH3)b)]; 27.2
[−NCH2CH(CH3)a(CH3)b]; 27.4 [−NCH2CH2CH2]; 33.5 [−NCH2CH2CH2]; 51.1
[−N(CH(CH3)a(CH3)b)]; 60.7 [−NCH2CH2CH2]; 66.5 [−NCH2CH(CH3)a(CH3)b]. MS (DART-
TOF): calcd for [M + H]+ 511.2995; found 511.2995
Synthesis of WN(N(CH2)6)(NiPr2)(NiBu2) (52)
Compound 53 was synthesized by General Procedure D. The crude product was purified
by sublimation at 150-250 mTorr and 42-50 °C to afford orange-white solid. Yield 45%. 1H
NMR (C6D6, 300 MHz): δ 0.89 [d, J = 6 Hz, 6H, −NCH2CH(CH3)a(CH3)b]; 0.98 [d, J = 6 Hz,
6H, −NCH2CH(CH3)a(CH3)b]; 1.30–1.38 [d, J = 6 Hz, 12H, −N(CH(CH3)a(CH3)b)]; 1.52 [br m,
6H, −NCH2CH2CH2]; 1.78 [br m, 6H, −NCH2CH2CH2]; 1.99 [sp, J = 6 Hz, 2H,
−NCH2CH(CH3)a(CH3)b]; 3.47 [m, 2H, −N(CH(CH3)a(CH3)b)]; 3.60 [br m, 4H,
−NCH2CH(CH3)a(CH3)b]; 3.81 [t, J = 6 Hz, 4H, −NCH2CH2CH2]. 13C NMR (C6D6, 75 MHz): δ
20.3 [−NCH2CH(CH3)a(CH3)b]; 20.8 [−NCH2CH(CH3)a(CH3)b]; 26.4 [−N(CH(CH3)a(CH3)b)];
26.8 [−N(CH(CH3)a(CH3)b)]; 26.9 [−NCH2CH2CH2]; 27.3 [−NCH2CH(CH3)a(CH3)b]; 33.5
82
[−NCH2CH2CH2]; 51.1 [−N(CH(CH3)a(CH3)b)]; 61.6 [−NCH2CH2CH2]; 66.4
[−NCH2CH(CH3)a(CH3)b]. DIP-CI-MS: calcd for [M + H]+ 523.3126; found 523.3127..
Diffusion Barrier Testing
Complex 35 was used to deposit films for testing as a Cu diffusion barrier. A 300 nm of
MOCVD Cu was deposited onto freshly prepared (approximately 5 min of post-growth exposure
to air) WNxCy/Si using (hfac)CuI,II(TMVS). The Cu films were subsequently annealed at a
temperature of 500 °C for 30 min under a flow of 99.999% N2. The annealed Cu/WNxCy/Si
stacks were then analyzed by XRD, SEM, and 4PP. Etch-pit testing was performed by removing
the Cu layer with a dilute nitric acid solution, then removing the barrier with a solution of
NH4OH, H2O2, and H2O in a ratio of 1:1:4 for 10 min, followed by the etching of Cu3Si for 5
seconds with Secco etchant (K2Cr2O7:H2O, 1:1). A schematic is shown in Figure 2-22.
Figure 2-22. A schematic of the etch-pit test.
DFT Calculations
The gas-phase room temperature full optimizations of all molecules were performed
using the DFT functional M06L, as implemented by the Gaussian 09 package.118 Tungsten was
described by the LanL2DZ basis set with additional effective core potential in the LanL2DZ
valence basis. The remaining atoms (N, C and H) were described by the 6-31G* basis set. All
83
geometries were fully optimized without any symmetry restrictions. The ground state (GS) and
intermediate (INT) geometries were optimized as minima, with confirmation by the existence of
zero imaginary frequencies upon calculation of the vibrational frequencies. The optimized
transition states (TS) geometries were identified by the presence of only one negative Eigenvalue
in the Hessian matrix. The thermochemical data (ΔG, ΔH, ΔG‡ and ΔH‡) were obtained within
the rigid-rotator harmonic-oscillation approximation. The optimized structures were visualized
using Chemcraft.119 The Cartesian coordinates for optimized GS, INT and TS structures are
listed in Appendix C (from Table C-1 to Table C-12).
Thermolysis of 35
Compound 35 (0.25 g, 0.565 mmol) was added to a 10 mL round bottom flask attached to
a distillation head, which was then connected to a 10 mL Schlenk flask. Complex 27 was heated
to 300 °C under 1 atm of flowing Ar and all of the gaseous decomposed products from 27 were
trapped in the Schlenk flask at -78 °C (dry ice/acetone). After 4 h, the trapped thermolysis
products were warmed to room temperature and treated with 10 ml of DI water. The solution of
trapped products in DI water was analyzed by GC-EI-MS.
GC-EI-MS was run on a Thermo Scientific Trace DSQ equipped with an EI source, using
a 60 m ATTM-5ms column (Alltech) with a 0.25 mm ID and 0.25 µm film thickness. The
injection port was held at 50 °C, the injection was split 100:1, and 2 µL of sample was injected.
The ion source was held at 150 °C, the EI source was operated at 70 eV and the instrument was
scanned over m/z 25 – 225. Helium was used as the GC carrier gas using a temperature gradient.
The initial temperature was set to 50 °C and held for 2 minutes. The temperature was ramped at
10 °C/minute until it reached 120 °C and held for 1 minute.
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Crystallographic Structure Determination for 35
X-Ray intensity data were collected at 100 K on a Bruker DUO diffractometer using
MoK radiation ( = 0.71073 Å) and an APEXII CCD area detector. Raw data frames were read
by the program SAINT120 and integrated using 3D profiling algorithms. The resulting data were
reduced to produce hkl reflections and their intensities and estimated standard deviations. The
data were corrected for Lorentz and polarization effects and numerical absorption corrections
were applied based on indexed and measured faces. The structure was solved and refined in
SHELXTL6.1, using full-matrix least-squares refinement. The non-H atoms were refined with
anisotropic thermal parameters and all of the H atoms were calculated in idealized positions and
refined riding on their parent atoms. The asymmetric unit consists of three chemically equivalent
but crystallographically independent complexes. The data were checked for higher symmetry but
none were observed. In the final cycle of refinement, 13145 reflections (of which 11193 are
observed with I > 2(I)) were used to refine 545 parameters and the resulting R1, wR2 and S
(goodness of fit) were 2.14%, 3.77% and 0.980, respectively. The refinement was carried out by
minimizing the wR2 function using F2 rather than F values. R1 is calculated to provide a
reference to the conventional R value but its function is not minimized.
85
CHAPTER 3
CZTSSe: AN OVERVIEW
Photovoltaics
Power consumption around the world has been increasing every day. Currently 15 TW of
energy is consumed globally and most of it comes from fossil fuel. These fuels release a huge
amount of CO2 which contributes to global warming.121 So, an alternative to fossil fuel is
required. Solar derived electricity would help meet new demand and replacement of retiring
fossil fuel plants, contribute to powering our transportation system, and bring affordable
electricity to those who now have none. PV provides clean and renewable energy and also are
easy for installation. Using earth abundant materials for PV makes it economical with respect to
the alternate forms of energy.122,123 Here the advantages and drawbacks of different materials that
are candidates materials in the photovoltaic industry are discussed.
Silicon
Silicon is a very well established and well-studied semiconductor material. Therefore, it
has been the first choice of material for photovoltaic applications. However, the extensive use of
silicon in the semiconductor industry makes obtaining it at a low cost a problem for the
photovoltaic industry.123,124 In order to meet the requirements for both industries, different
production methods have been developed. Usually silicon is produced through the Siemens
process.125 Here polysilicon is deposited through the thermal degradation of trichlorosilane. This
process requires high energy because the deposition is done on high purity silicon slim rods,
which are heated to high temperatures. So, low energy technologies, such as fluidized bed
technology, have been reported.126 Here, silane (SiH4) is introduced into the reactor in the
gaseous form along with silicon seed particles and then the gaseous silane decomposes to form
86
silicon on the seed particles. However, this technology has problems with impurities in the
silicon product.
Kerfless silicon wafers technology has also been introduced to reduce the amount of
silicon lost during the production. A large portion of the silicon is lost as silicon dust during the
wire-saw method. Different new methods have been reported to solve this problem.127,128 The
methods described here are known as edge-defined film-fed growth and string ribbon silicon
technology. Both the methods use molten silicon for wafer production. For edge-defined film-fed
growth a graphite die is used to define thickness of silicon sheets, whereas for ribbon silicon
technology temperature resistant wires are pulled through molten silicon to form ribbon of
silicon. This has reduced the silicon loss during its production. However, these methods were
also found to retain impurities.
Use of ultrathin silicon has been reported to meet the silicon deficiency. It has been found
that a 40 µm film can provide the similar efficiency as 100 µm film.129 This performance is
expected to decrease the amount of silicon required to perform as a photovoltaic material.
Dye-Sensitized Solar Cells
In this method light is absorbed by the dye, which then injects an electron to the
conduction band of a semiconductor material. From here the electron is transported through a
nanoparticle to reach the front contact and perform its work. Once the work is done then it
undergoes a redox cycle to regenerate the dye.130 Efficiency of 10 % was achieved from one of
the ruthenium based dye-sensitized solar cell quite early.131 However over the years there has not
been much improvement in the efficiency of these solar cells.130
Perovskites
Perovskites are solid state sensitized solar cells whose basic technology is based on dye-
sensitized solar cells. Perovskites have a general formula of ABX3 (X = oxygen, carbon,
87
nitrogen, and halogen) where the A cation occupies a cubo-octahedral site and the B cation
occupies an octahedral site. For example, in CH3NH3PbI3, the A cation is CH3NH3+ and the B
cation is Pb2+. This structure has been modified to CH3NH3Pb(IxZ1-x) (where Z is either chlorine
or bromine).
Initially, perovskites were used in solution as sensitizers for dye sensitized solar cells.
Later on the solid perovskites were being used for solar cells. These were found to provide
efficiency as high as 10.9 % using CH3NH3PbI2Cl.132 Recently this efficiency has been improved
to 17.9 %.133 It has been projected that with the fine tuning of the material an efficiency in the
range of 20-30 % can be achieved from this material.134
With the immense potential for perovskites as a photovoltaic material one problem still
remains with it. The use of lead is not at all environment friendly. A replacement with a non-
toxic material is required.
Organic Photovoltaics
Organic Photovoltaics work on the donor acceptor theory. When light is incident on a
material, one of the electrons from the HOMO is transferred to the LUMO of the material. This
creates an electron-hole pair. This pair can reside in one molecule or with neighboring
molecules. The basic design for these molecules involve compounds with extensive conjugation
of electrons and good intermolecular interaction through π-π stacking or hydrogen bonding.135
There are certain advantages and disadvantages of using organic photovoltaics. One of
the advantages for these organic photovoltaic devices is that they are ecofriendly. The
disadvantage is that they still have to achieve high power conversion efficiency. The highest
efficiency obtained through organic photovoltaics is 13.2% for a multijunction cell obtained by
88
Heliatek (manufacturer of organic photovoltaics). Given the diversity of organic molecules there
is a possibility of achieving higher efficiency.
CIGS, CdTe and CZTSSe
CIGS (CuInGaSe), CdTe and CZTSSe (CuZnSnSSe) are known to be excellent
candidates for PV materials.122 Recently CIGS and CdTe have been found to produce cells of
efficiency 21.5 % and 21.4 % respectively.136 CdTe was able to achieve 1 GW production
annually in 2009123 and the same feat was achieved by CIGS in 2011.137,138 However, the global
demands in power consumption are increasing every year. In order to meet the required annual
power production demands (15 TW/year), the amount of PV materials used must be increased to
higher levels.123,137
Figure 3-1. Abundance of photovoltaic elements on earth’s crust.
It is important to understand that neither CIGS nor CdTe are manufactured from earth
abundant elements. Figure 3-1 shows that other than copper none of the elements used for the
formation of CIGS and CdTe are earth abundant.139,140 Also the toxicity of CdTe is a concern.
The necessity for earth abundant, nontoxic PV material can be addressed with CZTSSe
0
50
100
150
200
250
300
350
400
450
Cd Cu Ga In S Se Sn Te Zn
Ab
un
dan
ce (
pp
m)
Elements
89
(Kesterite) because it has a band gap similar to CIGS and is composed mostly of earth abundant
(Figure 3-1) and nontoxic elements.122,137 Recently CZTSSe has been reported to provide films
with high efficiency (above 12 %) which makes it a strong competitor for next generation PV
material as compared to CIGS and CdTe.141,142
Deposition of CZTSSe
Different deposition techniques have been applied for the deposition of CZTSSe.
Currently the drawback for CZTSSe is the low efficiency compared to CIGS and CdTe. The
following discussion will provide a short comparative overview between deposition methods and
efficiency achieved from the resulting films.
Sputtering
Sputtering is a vacuum deposition procedure where the target materials are bombarded
with highly energized ions. One of the first deposition of CZTS films was conducted through
sputtering. The resulting material was reported as a candidate for photovoltaics due to its optimal
band gap.143 CZTSSe films of efficiency 5.2 % were obtained by sputtering of metal precursors
followed by sulfo-selenization.144 Films with efficiency around 6.7 % were obtained145 as an
improvement from previous depositions146 due to preferential etching techniques of CZTS
absorber layers. Co-sputtering of different chalcogenides followed by annealing with SnS(g) and
S2(g) resulted in 8 % efficient films.147 Manipulating the SeS2/S weight ratio during the
annealing process of film deposition through sputtering resulted in high efficiency of 12.3 %.148
Co-evaporation
In co-evaporation method multiple precursors are heated thermally under vacuum to
volatilize them followed by deposition on the substrate. Here the precursors must be volatile
enough to be transported to the vapor phase. An advantage to this technique is that the film
composition can be tuned easily by changing the proportions of precursors used. An increase in
90
efficiency from 0.02 % to 5.4 % was observed when the CZTS films were annealed with SnS(g)
and sulfur instead of just sulfur.149 This was attributed to the fact that during the deposition
process of CZTS, a significant amount of Sn was lost. The Sn was then replaced by annealing the
films with SnS(g). A slight improvement of efficiency was observed when Cu2ZnSnSe4 films
produced through co-evaporation showed power conversion efficiency of 9.15 %150 with respect
to 8.4 % for Cu2ZnSnS4.151
Pure Solution
In pure solution deposition, the precursors are dissolved in a solvent and deposited
through a sol-gel method. ITO has been prepared from a solution of SnCl2•2H2O and
alcohol.152,153 Although very economical, one of the disadvantages of this method is that there is
possible contamination from solvents into the films. Films from copper (II) acetate monohydrate,
zinc (II) acetate dihydrate and tin (II) chloride dihydrate with band gap of 1.49 eV showed the
potential for this method in the PV industry.154 However the films showed efficiency lower than
6 % which was much lower with respect to efficiency achieved through other methods.155-160
Recently, higher efficiency has been achieved through spray deposition of water-ethanol based
colloidal inks which has resulted in 8.6 % efficiency161 which increases to 10.8 % on fine tuning
the Sn content in the films.162
Nanoparticle Based Deposition
To avoid the impurities from the solution based approach, nanoparticles of composition
closer to the required material were dissolved in a solution and used for deposition. This method
was based on the concept that the required composition would be achieved with minimum
foreign material from solvents. Initially a 7.2 % efficient CZTSSe film,163 and then a 6.8 %
efficient CZTSSe film doped with germanium were prepared through this process.164 Using
binary and ternary sulfide nanoparticles followed by annealing with selenium resulted in an
91
increase in efficiency to 8.5 % for CZTSSe films.165 By controlling the spatial distribution of
elements specially towards the surface ( Sn rich) of the CZTS material an efficiency of 8.6 %
was achieved.
Particle-Solution Deposition
In this method both particles and solutions of precursors are combined and then spin
coated on a surface. Since it uses a combination of solution and solid particles together it usually
generates a thicker mixture that results in the formation of large grain boundaries as seen in
CIGSSe.166 This method has resulted in the formation of CZTSSe films producing highest
efficiencies. Initially a 10.1 % efficiency was observed from the CZTSSe films167 followed by an
improvement to 11.1 %,168 and recently 12.6 % efficiency was achieved which is the highest
obtained for CZTSSe material.141
There has been a significant development for the earth abundant material CZTSSe in the
past few years compared to other photovoltaic materials.136 However, the maximum efficiency
achieved is still lower than CIGS and CdTe. In order to improve the efficiency, it is important to
understand the thermochemistry of CZTSSe along with the development of new deposition
methods.
Computational Study
Several computational studies have been done on the CZTSSe in order to understand its
structural, electronic and vibrational properties of the material. Some of them have been
compared with the experimental data when possible. Given the complexity of the material,
theoretical calculations have been limited.
Initially, a study of the band gap optimization was done both theoretically (DFT using
PW91)169 and experimentally (UV-Vis absorption spectra). Here, it was observed that the band
92
gap can be tuned by changing the ratio of Se/(S+Se). Although the trends were similar for both
theoretical and experimental methods, the exact value for the exact band gap varied by 1.0 ev.170
To understand the composition dependence of the structural and electronic properties of
CZTSSe density functional HSE was used.171 Here it was stated that increasing the Se content of
the films decreases the band gap of the film. It was also reported that high efficiency was
obtained from those CZTSSe films whose compositions had high Se content in the films.
Figure 3-2. Conventional unit cells for Kesterite structures.††††††
Another DFT study using the PBE functional indicated that changing the anion
distribution along with the S/Se ratio affects the band gap.172 These studies were performed using
†††††† Reprinted with permission from Khare, A.; Himmetoglu, B.; Cococcioni, M.; Aydil, E. S. J. Appl. Phys. 2012,
111, 123704-1-123704-8.
93
different compositions of CZTSSe (Figure 3-2). Raman studies were also performed using DFT,
which provided results that were on par with the experimental values. A DFT study using the
VASP code was performed in order to understand the cation disorder in the CZTSSe material.173
To understand the diffusion of elements of PV materials (CIGSe and CZTSSE) in the
CdS buffer layer, a computational study was conducted. This study was done using the DFT
functional HSE06 and PAW approach as implemented in the VASP code.174
All the calculations presented here have been performed on the solid state CZTSSe
material. The thermochemistry of the gas phase species, which are in equilibrium with the
CZTSSe material, has not been investigated. This study would provide information about the
different chemical species that are likely to be in the gas phase during the active operation of
CZTSSe as a photovoltaic material.
94
CHAPTER 4
DFT STUDY OF GAS PHASE SPECIES IN EQUILIBRIUM WITH CZTSSe
Computational Methods
The goal of this study is predicting the thermodynamics for formation of stable binary
and ternary vapor phase species by Density Functional Theory (DFT) calculations on the
reaction equilibria for formation of certain components of CZTSSe as independent species. Of
particular interest are the nature and possible formation of different metal sulfides, metal
selenides and metal clusters under condition of high temperature degradation of the CZTSSe
composite material. Results from DFT calculations on sulfur allotropes were verified against
CALPHAD data, which also provided access for modelling energetics of condensed phases that
are difficult to derive by DFT. The DFT calculations for each equilibrium system were
performed using two separate Density Functionals B3LYP and M06L, and results from both are
presented. Implementation of the diffuse functionality and the effective core potential (ECP)
were carried out to afford accurate prediction of gas phase energetics involving both main group
and transition metals.
DFT calculations have been done for all possible binary species that can be formed from
CZTSSe. The calculations were used to identify the stable binary molecules which have higher
possibilities of formation among all the different molecules. Therefore, initially some
calculations were done on metal sulfides and selenides as a benchmark and compared with the
SGTE database. SGTE is engaged in critical assessment and compilation of thermodynamic data
for inorganic and metallurgical substances. The method that gave the closest value to the
database was used to do the calculations to complete the database.
95
All possible species were assumed to be in the gas phase. The DFT calculations yielded
thermochemical data at 298.15 K and 1 atm pressure unless otherwise mentioned. The main
objective is to calculate the following for each species:
a) Total Enthalpy
b) Total Free Energy
c) Bond Length
d) Bond Angle (where applicable)
e) Optimized Geometry
The Enthalpy of Formation (ΔH°f) and the Free Energy of Formation (ΔG°
f) were used to
determine which molecules would have the possibility of being present in the gas phase at a
particular temperature and pressure. Bond lengths and the bond angles provided insight into the
nature of the bonding in the molecules.
For non-metals, B3LYP/6-31G* has been used as it applies to all the elements from H to
Kr and also has been used in the literature to give data comparable to the experimental values.175
For molecules containing both metal and non-metal atoms, M06L and B3LYP functionals have
both been used for calculations. In the past, the M06L functional has been found to give accurate
results for organometallic compounds.176-179 The three different metals that will be studied are
copper, zinc and tin, hence the basis set LANL2DZ should serve the purpose for both the metals
and the sulfur.179,180
Equations 4-1 and 4-2 were used to calculate the ΔH°f and ΔG°
f.
ΔH°f(MxSy) = ΔH°
f(MxSy) – x ΔH°f(M) – y ΔH°
f(S) (4-1)
ΔG°f(MxSy) = ΔG°
f(MxSy) – x ΔG°f(M) – y ΔG°
f(S) (4-2)
96
Sulfur Allotropes
Sulfur is known to exist in different allotropic forms S1-8. Therefore, it is important to
optimize each one of them separately with B3LYP/6-31G* to determine the most stable one in
the gas phase and use it for other calculations. Among all the sulfur allotropes, S4 is known to
exist in eight different structural forms (Table 4-1) of which first six are singlet molecules and
the last two are triplet. Initial calculations were done for all the eight S4 structures to obtain the
one with minimum energy, which later would be compared with the different sulfur allotropes.
Table 4-1. DFT calculations for S4 (B3LYP/6-31G*) and comparison with literaturea.
Species
(Symmetry)
Spin
State Structure
ΔH°f
(report
ed)
ΔG°f
(reporte
d)
Ref. for
Reported
Value
ΔH°f
(calculat
ed)
ΔG°f
(calcul
ated)
S4(C
2v)
Singlet
0.0 4.9 183 0.0 -96.2
S4(C
2h)
Singlet
41.9 40.3 183 29.2 -66.6
S4(D
2h)
Singlet
5.6 8.2 183 89.2 -2.4
S4(C
s)
Singlet
61.6 61.0 183 73.8 -21.2
S4(D
2d)
Singlet
79.6 84.0 183 88.8 -4.42
S4(D
3h)
Singlet
106.6 111.3 183 113.9 -22.0
S4(C
2v)
Triplet
50.1 43.0 183 1.8 -102.3
S4(C
2h)
Triplet
88.2 73.7 183 15.2 -89.0
aAll values in kJ/mol
97
Ab initio calculations (G3X(MP2) level) have also been done on all the different S4
structural moieties.181 All the calculations obtained through DFT are based on gas phase species
similar to those obtained in ab initio data, so both computational methods should identify the
same structure as the most stable one. The results have been compared in Table 4-1. The first six
entries are all singlet species and the last two, S4(C
2v) and S
4(C
2h) are in triplet state.
All the values entered in Table 4-1 are with respect to the enthalpy value of S4(C2v) in the
singlet form. DFT calculations give S4(C2v) in the triplet form as the most stable moiety while
the ab initio literature results181 suggests that S4(C2v) in the singlet form is the most stable
structure. DFT value for the enthalpy of formation of S4(C2v) in the singlet state was more
comparable to the reported value than in the triplet state. Ab initio has been known to handle spin
states correctly in the past.182,183 All other sulfur allotropes except S2 would be calculated in
singlet form hence it was decided to compare the singlet form for the final comparison.
The optimized structural parameters for the allotropes of sulfur are represented in Table
4-2. All the enthalpy and free energy values are calculated with respect to that of sulfur atom and
the values give the energy difference per sulfur atom for each allotrope. S7 has shown an
interesting result that it exists as a combination of two S2 and one S3 moiety interacting with each
other. The bond lengths for S7 as mentioned in Table 4-2 indicates that there is definitely an
interaction.
It is widely known that S8 is the most stable isotope in the solid form and it was also
found to be the most stable one among all the different allotropes in the gas phase. Although all
the calculations were done under 1 atm pressure and 298.15 K, S8 was also found to optimize in
the crown form similar to that in the solid state. The calculations were repeated at high
98
temperatures for S8 along with all other calculations for metal sulfides, selenides and metal
clusters. For all calculations at 298.15 K and 1 atm pressure, S8 was used as a source of sulfur.
Table 4-2. Calculations for allotropes of sulfur (B3LYP/6-31G*)
Species Structure
Bond
Length (Å)a
Bond
Length (Å)b
Bond
Angle (º)
ΔH
(kcal mol-1)
ΔG
(kcal mol-1)
S S 0.0 0.0
S2 S=S 1.93 1.89 -400.8 -372.8
S3 1.95 1.91 118.3 -595.4 -533.5
S4
1.94, 2.20 105.7 -825.9 -730.1
S5
2.06
100.3,
91.1
-257.4 -1077.0
S6
2.11 103.1 -1348.5 -1171.9
S7
2.04, 2.17,
2.33
1.99,2.18
110.3,
103.1,
106.9
-1574.8 -1368.6
S8
2.10 2.05 109.1 -1852.3 -1601.6
aDFT results breported values184,185
The results obtained for the allotropes of sulfur through DFT were compared with the
values obtained through Thermocalc (a program used for the preparation of the SGTE database)
to determine whether both follow the same trend in energy values. Figure 4-1 represents a
comparison graph of the Gibbs free energy data for all allotropes with respect to the sulfur atom
between DFT and Thermocalc. The graph shows that both methods of calculation give the same
99
trend of Gibbs free energy. This comparison was done as a proof of concept study to confirm that
results from both methods follow the same trend for known molecules, before calculating
unknown species by DFT.
Figure 4-1. Comparison between Thermocalc and DFT data for sulfur allotropes.
Metal Sulfides
In order to calculate ΔH°f and ΔG°
f for the metal sulfides from equations (4-1) and (4-2)
optimization was done for the sulfides and the metals separately at STP. The sulfides chosen for
this purpose were CuS, Cu2S, ZnS, SnS and SnS2. Among these sulfides CuS, ZnS and SnS are
linear structures hence their optimization did not change their geometry. When Cu2S was
optimized it was expected to give a bent structure. However, it resulted in a three membered ring
(Figure 4-2). Conversely, SnS2 optimized to a linear structure like CO2.
Calculations were done with the two different density functionals, B3LYP and M06L
because when Cu2S was optimized with M06L, and ZnS was optimized with B3LYP, then they
provided results which were more comparable data with the SGTE database than when
-60
-50
-40
-30
-20
-10
0
0 2 4 6 8 10
En
ergy(k
Cal/
mol
ato
m)
Number of S atoms
Gibbs Energy (ΔG0f)of S Species
Thermocalc
DFT
100
optimized with B3LYP and M06L respectively. Therefore, both density functionals were used
for calculations and comparisons. The basis set LANL2DZ was used for all calculations. Since
only one basis set has been used for all calculations from here onwards the two DFT methods
will be differentiated by their density functionals as B3LYP and M06L.
Figure 4-2. Optimized structures for Cu2S (M06L/LANL2DZ) and SnS2 (B3LYP/LANL2DZ).
Table 4-3. Comparison of enthalpy, entropy, and Gibbs energy of formation of gaseous species
at 298.15 K.a
Species CuS SnS ZnS Cu2S SnS2
ΔH: SGTE -6143 -101375 30901 -229553 -58951
ΔH: B3LYP -41659 -129372 37263 -110113 -81922
ΔH: M06L -99276 -156153 -55599 -198972 -108244
ΔS: SGTE 12.230 10.515 11.495 -128.875 0.147
ΔS: B3LYP 9.128 4.213 8.426 -26.681 -14.979
ΔS: M06L 6.683 3.249 7.097 -31.333 1.569
ΔG: SGTE -9790 -104510 27474 -191129 -58995
ΔG: B3LYP -44380 -130628 34750 -102158 -77456
ΔG: M06L -101268 -157122 -57715 -189630 -108 712
aThe units are J/mole-atom for ΔH, ΔG and J/mole-atom/K for ΔS.
101
Results obtained from these calculations were compared with the values from the SGTE
database. Comparisons were done for three different temperatures: 298.15 K, 670 K and 3000K.
The values available in the SGTE database were at 670 K, so this temperature could be used for
benchmarking. To obtain values for a wide range of temperatures, calculations were compared at
298.15 K and 3000 K.
Table 4-4. Comparison of enthalpy, entropy, and Gibbs energy of formation of gaseous species
at 670.00 K.a
Species CuS SnS ZnS Cu2S SnS2
ΔH: SGTE -6744 -103303 30836 -237363 -59991
ΔH: B3LYP -42858 -130682 36030 -110958 -82963
ΔH: M06L -56118 -134279 158646 -141501 -86391
ΔS: SGTE 11.008 6.573 11.018 -145.827 -1.929
ΔS: B3LYP 6.190 1.004 5.943 -147.905 -17.267
ΔS: M06L -130.752 -136.355 -127.966 -148.208 -117.031
ΔG: SGTE -14119 -107707 23454 -139659 -58698
ΔG: B3LYP -47006 -131355 32049 -11862 -71394
ΔG: M06L 31486 -42921 244383 -42202 -7980
aThe units are J/mole-atom for ΔH, ΔG and J/mole-atom/K for ΔS.
At 298.15 K, the calculations (Table 4-3) show that all metal sulfides except ZnS have a
possibility of existence in the gas phase. Based on the Gibbs free energy data (Table 4-3), both
M06L and the SGTE data indicate that among all the metal sulfides Cu2S is the most stable one
at 298.15 K in gas phase. However, B3LYP obtains SnS as the most stable species at 298.15 K.
Free energy values of Cu2S obtained through SGTE and M06L are extremely close whereas the
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values obtained for SnS vary widely for all three systems. B3LYP and SGTE indicate that ZnS
should not be present in the gas phase at 298.15 K. However, M06L indicates the opposite. This
indicates that ZnS gives better results with B3LYP than with M06L.
A similar trend is followed at 670.0 K as shown in Table 4-4. None of the calculated
values for ZnS showed favorable existence in the gas phase at 670.0 K. CuS also gave positive
Gibbs free energy of formation value when calculated using M06L functional. However, results
obtained using B3LYP and SGTE provide a negative value and their values are close to each
other even at 298.15 K. So for CuS, B3LYP functional is a comparable mode of calculation for
the gas phase species. Calculated values for SnS2 obtained using B3LYP functional were found
to be more comparable with the SGTE calculated values than when M06L functional was used.
Table 4-5. Comparison of enthalpy, entropy, and Gibbs energy of formation of gaseous species
at 3000.00 K.a
Species CuS SnS ZnS Cu2S SnS2
ΔH: SGTE -13450 -121519 32421 -289816 -71571
ΔH: B3LYP -49999 -137863 28660 -115757 -89398
ΔH: M06L -63430 -141514 136908 -146398 -92947
ΔS: SGTE 6.583 -5.924 13.312 -179.187 -10.137
ΔS: B3LYP 1.325 -3.905 1.046 -26.592 -21.710
ΔS: M06L 0.504 -4.016 -4.851 -34.554 -25.489
ΔG: SGTE -33200 -107747 -7515 247744 -41571
ΔG: B3LYP -53974 -126148 25522 -35982 -24267
ΔG: M06L -64942 -129465 151461 -42736 -16480
aThe units are J/mole-atom for ΔH, ΔG and J/mole-atom/K for ΔS.
Most of the calculated values obtained at 3000 K (Table 4-5) follow the same trend as at
298.15 K and 670.0 K. The SGTE values indicate that ZnS has a negative free energy of
formation whereas both the DFT results indicate the opposite. These results from SGTE are
103
contrasting to the values from previous temperatures. If ZnS is not bound at 670.0 K, then it will
also not be bound at 3000.0 K. Cu2S results at 3000.0 K were different in SGTE, B3LYP and
M06L. Cu2S is known to decompose at 1398 K.186 So SGTE results are probably more accurate
at this high temperature for the solid Cu2S. The negative Gibbs free energy values obtained using
both B3LYP and M06L indicates that at high temperatures Cu2S is expected to be in the gas
species with minimum intermolecular interaction. Comparing all three temperature ranges it can
be said that the B3LYP functional is more comparable with the SGTE database with most
sulfides except for Cu2S at 298.15 K and 670.0 K, where the results are similar to M06L system.
Figure 4-3 indicates that CuS, SnS2 and SnS follow a linear trend for the enthalpy of
formation values for both B3LYP and M06L. At 298.15 K results obtained using B3LYP for all
the metal sulfides except Cu2S were closer to the SGTE values. Cu2S produced comparable
values at 298.15 K when optimized using M06L. Results obtained for ZnS using B3LYP are
closer to the SGTE values. At 670.0 K and 3000.0 K SnS, SnS2 and CuS produced similar trends
and closer values. Results for Cu2S follow the trend using M06L system at room temperature but
not at higher temperatures.
Figure 4-4 shows a similar trend in the entropy of formation for all metal sulfides except
Cu2S at temperatures 298.15 K and 3000.0 K. The entropy of formation should be negative
which was found with both SGTE and DFT. This is mainly because of the decreasing number of
molecules during the formation of these metal sulfides. The structure for SnS2 (Figure 4-2) was
found to be linear whereas the structure for Cu2S (Figure 4-2) was found to be triangular like
cyclopropane. SnS2 has a structure similar to the diatomic metal sulfides which is why all these
molecules except Cu2S have comparable values for ΔS0f as shown in Figure 4-4. The bending
modes of vibration seen for SnS2 would not be seen for the other diatomic molecules. This could
104
be the reason behind the SnS2 values to be slightly different from the other diatomic molecules.
At 670.0 K B3LYP results for all metal sulfides except Cu2S showed comparable results with the
SGTE database. However, values obtained using M06L for all other metal sulfides deviated from
the linear trend. Results at 3000.0 K and 298.15K were similar.
Figure 4-3. Enthalpy of formation of gaseous species as calculated from the SGTE SSUB4
database compared to the energies calculated from DFT at 298.15, 670.00 and
3000.00 K.
105
Figure 4-4. Entropy of formation of gaseous species as calculated from the SGTE SSUB4
database compared to the energies calculated from DFT at 298.15, 670.00 and
3000.00 K.
The Gibbs free energy trend shown in Figure 4-5 indicates similar values from both
B3LYP and M06L for all metal sulfides at 298.15 K and 670.0 K except the results for ZnS
using M06L at 670.0 K. At 3000.0 K the values for SnS, SnS2 and CuS followed the same trend
as SGTE. Results for ZnS using B3LYP were comparable and follow the same trend. However,
results for ZnS from M06L and the values for Cu2S using both B3LYP and M06L deviated
completely from the SGTE trend. One of the reason for these differences in the results could be
106
from the fact that in DFT all the calculated energies correspond to a single molecule formation
with no intermolecular interaction. A lot of the values in the database are obtained
experimentally, which includes intermolecular interaction.
Figure 4-5. Gibbs energy of formation of gaseous species as calculated from the SGTE SSUB4
database compared to the energies calculated from DFT at 298.15, 670.00 and
3000.00 K.
To summarize for the metal sulfides, results from different DFT functionals are closer
with the SGTE values at different temperatures. Based on the metal a particular DFT function
107
can be chosen to calculate the gas phase thermochemical data for a species whose data is not
available in the database. Except Cu2S all other metal sulfides were found to give results from
B3LYP that were closer to the SGTE values. The only distinction of Cu2S with other metal
sulfides was that it has two transition metals in its structure. M06L works excellently with the
transition metals, so it is possible that having two transition metals in Cu2S makes it difficult for
B3LYP to optimize.
Metal Selenides
Calculations for metal selenides were performed based on Equations 4-1 and 4-2, similar
to the metal sulfides. Among the several allotropes of selenium187 Se8, one of the stable
allotropes of selenium was used for calculations maintaining the consistency with the sulfur
allotrope. The density functionals M06L, B3LYP have been used with the basis set LANL2DZ
for comparison, given the preliminary success with metal sulfides. Calculations were done at
temperatures 298.15 K and 3000.0 K. Calculated energy values for the formation of metal
selenides in gas phase as single species are shown below. A comparison between values from
two different DFT functionals is performed.
A) B)
Figure 4-6. Optimized geometry for SnSe2 with B3LYP (A) and M06L(B)
Cu2Se optimized to a geometry similar to Cu2S, with the Cu-Se bond length found to be
about 2.3 Å in Cu2Se with respect to 2.18 Å in Cu2S. However, SnSe2 optimized in two different
108
geometries, bent for B3LYP and linear for M06L (Figure 4-6) at all temperatures when started
with the bent structure (Figure 4-6 A). All other metal selenides optimized to a linear structure
like their sulfide analogues.
Table 4-6. Comparison of enthalpy, entropy, and Gibbs energy of formation of gaseous species
at 298.15 K.a
Species CuSe SnSe ZnSe Cu2Se SnSe2
ΔH: B3LYP -45.80 -124.55 36.10 -110.90 -81.77
ΔH: M06L -58.65 -127.10 134.25 -140.93 -90.63
ΔH: SGTE -19.69 -99.99 43.83 -104.90 n.a.
ΔS: B3LYP 0.008 0.003 0.008 -0.027 -0.036
ΔS: M06L 0.005 0.001 0.007 -0.031 -0.0015
ΔS: SGTE 0.010 0.014 0.012 -0.029 n.a.
ΔG: B3LYP -48.30 -125.50 33.65 -102.83 -111.90
ΔG: M06L -60.30 -127.35 132.05 -131.63 -135.40
ΔG: SGTE -22.81 -104.17 40.26 -96.09 n.a aThe units are kJ/mol-atom for ΔH, ΔG and kJ/mol-atom.K for ΔS.
Results from both functionals and SGTE in Table 4-6 indicate that all the metal selenides
except ZnSe can be present in the gas phase. Both the Gibbs energy of formation and enthalpy of
formation values calculated using density functionals B3LYP and M06L were highly positive,
along with the SGTE values indicating that formation of ZnSe in gas phase at 298.15 K is
energetically disfavored. Based on the Gibbs free energy values obtained using B3LYP, SnSe is
the most stable species followed by SnSe2, Cu2Se, and CuSe, whereas for M06L SnSe2 was
found to be more stable than SnSe followed by Cu2Se and CuSe. There are no data available for
SnSe2 in the SGTE database. Without SnSe2 the trend for increasing Gibbs free energy in SGTE
was similar to that obtained from B3LYP.
Table 4-7 indicated that all the metal selenides except ZnSe have a possibility of
formation in the gas phase. However, B3LYP calculations for SnSe2 indicate that its formation at
3000.0 K is both energetically and entropically disfavored whereas M06L values suggest that it
109
can exist in the gas phase at 3000.00 K. The trend of the different metal selenide species (except
SnSe2) arranged in ascending order of their Gibbs free energy value was found to be same for
values obtained in DFT (B3LYP and M06L) and SGTE. The values indicated that SnSe was the
most stable species followed by CuSe, Cu2Se and ZnSe. This order was different with respect to
the trend seen at 298.15 K. At 298.15 K Cu2Se was found to be more stable than CuSe. The
decrease in the value of Cu2Se with respect to CuSe could be attributed to the high negative
entropy value for the former with respect to the latter. This is due to the higher decrease in the
number of molecules for the formation of Cu2Se than CuSe. At 3000.00 K TΔS value is much
higher than at 298.15 K which results in the low Gibbs free energy value for Cu2Se than CuSe.
Table 4-7. Comparison of enthalpy, entropy, and Gibbs energy of formation of gaseous species
at 3000.00 K.a
Species CuSe SnSe ZnSe Cu2Se SnSe2
ΔH: B3LYP -54.30 -133.10 27.60 -116.63 -89.37
ΔH: M06L -67.20 -135.60 117.90 -146.70 -98.17
ΔH: SGTE -26.30 -119.60 35.40 -112.30 n.a.
ΔS: B3LYP 0.001 -0.004 0.001 -0.032 -0.031
ΔS: M06L -0.002 -0.006 -0.009 -0.036 -0.008
ΔS: SGTE 0.005 -0.002 0.005 -0.0353 n.a.
ΔG: B3LYP -57.30 -120.60 24.80 -20.50 2.40
ΔG: M06L -61.45 -115.95 144.60 -38.20 -75.27
ΔG: SGTE -42.30 -113.40 21.10 -6.40 n.a. aThe units are kJ/mol-atom for ΔH, ΔG and kJ/mol-atom.K for ΔS.
Figure 4-7 indicates that the enthalpy of formation values obtained for CuSe, Cu2Se and
SnSe from B3LYP and M06L functional are closer to the values obtained from the SGTE
database. Similar to ZnS the values obtained for ZnSe using B3LYP functional were closer to the
values from the SGTE database than the values obtained using M06L. Cu2Se values obtained
using both B3LYP and M06L were similar to the SGTE database results unlike CuS which
provided closer results with M06L.
110
Figure 4-7. Enthalpy of formation of gaseous species as calculated from the SGTE SSUB4
database compared to the energies calculated from DFT at 298.15 and 3000.00 K
Entropy of formation values for CuSe, SnSe and ZnSe (Figure 4-8) were found to be
close to 0 J/mol-atom.K similar to that found for their corresponding sulfide species (Figure 4-4).
Similar to Cu2S (Figure 4-4) values obtained for Cu2Se (Figure 4-8) were lower than the other
metal selenides and this is probably due to the larger decrease in the number of molecules during
the formation of Cu2Se. At 3000.00 K the results for Cu2Se from M06L functional were closer to
the SGTE database than those from B3LYP.
Figure 4-8. Entropy of formation of gaseous species as calculated from the SGTE SSUB4
database compared to the energies calculated from DFT at 298.15 and 3000.00 K.
111
Figure 4-9. Gibbs free energy of formation of gaseous species as calculated from the SGTE
SSUB4 database compared to the energies calculated from DFT at 298.15 and
3000.00 K
Gibbs free energy of formation values of CuSe, SnSe and Cu2Se obtained from B3LYP
and M06L functionals were similar to those obtained using SGTE database. Results obtained for
ZnSe (Figure 4-9) using B3LYP functional were closer to the SGTE database compared to the
results obtained using M06L, which is a similar trend as observed for ZnS (Figure 4-6). The
Gibbs free energy values for the metal selenides obtained using B3LYP and M06L at both
298.15 K and 3000.00 K were closer to the SGTE database (Figure 4-9) with respect to the
values obtained for metal sulfides (Figure 4-6).
To summarize, for the metal selenides both the DFT functionals give similar results
compared to the SGTE database. Both DFT and SGTE values give different trends at the two
temperatures. Currently the SGTE database does not have thermodynamic data for the SnSe2 in
gas phase for comparison purposes.
Bimetallic and Tetrametallic Clusters from Copper, Zinc and Tin
The next calculations were performed on the different clusters that are possible from
copper, zinc and tin to find their possibility of existence in gas phase at room temperature. In the
112
beginning simple clusters (clusters containing two different metals) were used for calculations.
DFT functionals M06L and B3LYP combined with basis set LANL2DZ were used for
calculations. Along with diatomic CuZn and CuSn, Cu2Zn optimized as a linear structure.
A) B)
C)
Figure 4-10. Optimized structures for Cu3Sn (A-M06L/LANL2DZ, B-B3LYP/LANL2DZ) and
Cu3Zn (C).
Tetrametallic clusters optimized to give a different structures for both Cu3Sn and Cu3Zn.
Cu3Sn optimized in two different structures from the two different functionals as shown in
Figure 4-10 (A and B). The structure for Cu3Sn as shown in Figure 4-10 (B) is similar to a
tetrahedron moiety reported in literature where the Cu3Sn assumes a tetrahedral structure.188
Cu3Zn optimized to a trigonal planar structure (Figure 4-10 C) irrespective of the functional.
However, the structure obtained for Cu3Zn was also found to be a tetrahedron in literature.189
Table 4-8 indicates all the metal clusters have a possibility of being present in the gas
phase. The negative entropy value could be attributed to the fact that these clusters are formed
from the respective metals in their atomic state in gas phase. This leads to a decrease in the
113
number of entities during the formation of clusters. The Gibbs free energy trend indicates that
Cu3Sn is the most stable species at room temperature.
Table 4-8. Comparison of enthalpy, entropy, and Gibbs energy of formation of gaseous species
at 298.15 K.a
Species CuZn Cu2Zn CuSn Cu3Sn Cu3Zn
ΔH: B3LYP -49.9 -218.6 -178.8 -511.7 -315.0
ΔH: M06L -76.8 -295.4 -206.8 -746.7 -460.6
ΔS: B3LYP -0.068 -0.222 -0.080 -0.269 -0.263
ΔS: M06L -0.069 -0.233 -0.081 -0.314 -0.269
ΔG: B3LYP -29.5 -152.3 -154.9 -431.4 -236.6
ΔG: M06L -55.9 -226.0 -182.7 -653.2 -380.3
aThe units are kJ/mol.
Table 4-9. Comparison of enthalpy, entropy, and Gibbs energy of formation of gaseous species
at 3000.00 K.a
Species CuZn Cu2Zn CuSn Cu3Sn Cu3Zn
ΔH: B3LYP -61.3 -230.3 -190.2 -512.2 -315.6
ΔH: M06L -88.2 -307.1 -218.3 -770.0 -461.4
ΔS: B3LYP -0.078 -0.233 -0.089 -0.270 -0.264
ΔS: M06L -0.079 -0.243 -0.090 -0.334 -0.271
ΔG: B3LYP 172.0 468.4 79.7 299.2 476.8
ΔG: M06L 151.5 422.3 53.9 233.2 351.8
aThe units are kJ/mol.
Table 4-9 shows that the trend for the enthalpy and the entropy values at 3000.0 K were
similar to that at 298.15 K and the values were quite close. However, the Gibbs free energy
114
values in Table 4-9 are completely different with respect to the values at 298.15 K. This was
probably because the entropy values are negative for all species and at high temperatures the
TΔS factor is much higher than the ΔH factor for these alloys. Therefore, at high temperatures
the metal atoms would prefer to be in their atomic state in the gas phase rather than forming a
metal cluster.
Conclusion
Results for different metal sulfides and selenides obtained using both DFT functionals
B3LYP and M06L combined with basis set LANL2DZ were compared to the SGTE database.
DFT results for all metal sulfides and metal selenides using B3LYP /LANL2DZ provided results
closer to the SGTE database compared to the results from M06L/LANL2DZ except for Cu2S.
For species containing Zn, B3LYP/ LANL2DZ was found to give results comparable to the
SGTE database. Thermochemical values for SnSe2 in gas phase is not available in the SGTE
database. Results obtained for SnSe2 can be used to fill the database. Similarly, DFT results for
the metal clusters can also be used to fill the database. Results for metal clusters indicate that
their existence in gas phase at 3000.0 K is energetically not favorable.
Experimental Section
The thermochemical data for the possible gaseous binary species that take part in
equilibrium with the condensed phases of the CZTSSe are assessed by DFT using the Gaussian
09 package.118 For the sulfur allotropes DFT functional B3LYP combined with basis set 6-31G*
used for calculations. For all metal sulfides, metal selenides and metal clusters DFT functionals
B3LYP and M06L combined with basis set LANL2DZ have been used for calculations. The
thermochemical data (ΔG, ΔH and ΔS) were obtained within the rigid-rotator harmonic-
oscillation approximation. The optimized structures were visualized using Chemcraft.119 The
115
Cartesian coordinates for optimized structures are listed in Appendix C (from Table C-13 to
Table C-19).
116
APPENDIX A
NMR SPECTRA OF 35 AND 37
Figure A-1. 1H NMR of 35 (benzene-d6).
Figure A-2. gHMBC spectrum of 35 (benzene-d6).
117
Figure A-3. Variable temperature 1H NMR spectra for 35 (toluene-d8).
Figure A-4. Variable temperature 1H NMR spectra for 37 (toluene-d8).
118
APPENDIX B
CRYSTALLOGRAPHIC DATA
Crystallographic Data for 35
Table B-1. Crystal data and structure refinement for 35
Identification code 33
Empirical formula C14H34N4W
Formula weight 442.30
Temperature 100(2) K
Wavelength 0.71073 Å
Crystal system Orthorhombic
Space group P2(1)2(1)2(1)
Unit cell dimensions a = 15.2965(8) Å α = 90°.
b = 17.931(1) Å β = 90°.
c = 20.8790(11) Å γ = 90°.
Volume 5726.7(5) Å3
Z 12
Density (calculated) 1.539 Mg/m3
Absorption coefficient 6.048 mm-1
F(000) 2640
Crystal size 0.38 x 0.16 x 0.08 mm3
Theta range for data collection 1.50 to 27.50°.
Index ranges -18 ≤ h ≤ 19, -23 ≤ k ≤23, -27 ≤ l ≤ 27
Reflections collected 92465
Independent reflections 13145 [Rint = 0.0524]
Completeness to theta = 27.50° 100.0 %
Absorption correction Integration
Max. and min. transmission 0.6306 and 0.2095
Refinement method Full-matrix least-squares on F2
Data / restraints / parameters 13145 / 0 / 545
Goodness-of-fit on F2 0.980
Final R indices [I>2sigma(I)] R1 = 0.0214, wR2 = 0.0377 [11193]
R indices (all data) R1 = 0.0306, wR2 = 0.0393
Absolute structure parameter 0.497(6)
Largest diff. peak and hole 1.361 and -1.079 e.Å-3
R1 = (||Fo| - |Fc||) / |Fo|
119
wR2 = [w(Fo2 - Fc
2)2] / wFo22]]1/2
S = [w(Fo2 - Fc
2)2] / (n-p)]1/2
w= 1/[2(Fo2)+(m*p)2+n*p], p = [max(Fo
2,0)+ 2* Fc2]/3, m & n are constants
120
Table B-2. Atomic coordinates (x 104) and equivalent isotropic displacement parameters (Å2 x
103) for 35. U(eq) is defined as one third of the trace of the orthogonalized Uij tensor.
x y z U(eq)
W1A 20(1) 3228(1) 85(1) 17(1)
N1A -112(2) 3225(2) -718(1) 22(1)
N2A 1148(2) 3703(2) 235(2) 17(1)
N3A -2(2) 2177(1) 325(1) 24(1)
N4A -973(2) 3796(2) 424(2) 19(1)
C1A 1784(3) 4017(2) -235(2) 25(1)
C2A 2119(3) 3430(2) -694(2) 34(1)
C3A 1357(3) 4678(2) -595(2) 26(1)
C4A 1438(3) 3755(3) 910(2) 22(1)
C5A 1566(3) 4553(3) 1125(2) 38(1)
C6A 2236(3) 3267(3) 1042(2) 43(1)
C7A 65(3) 1945(2) 996(2) 32(1)
C8A -98(3) 1529(2) -94(2) 41(1)
C9A -1678(3) 4182(2) 68(2) 25(1)
C10A -1307(3) 4778(3) -363(2) 29(1)
C11A -2244(3) 3631(3) -298(2) 38(1)
C12A -1028(3) 3855(2) 1130(2) 19(1)
C13A -939(3) 4662(2) 1364(2) 28(1)
C14A -1833(2) 3482(2) 1402(2) 31(1)
W1B -140(1) 3415(1) 3406(1) 15(1)
N1B -96(2) 3516(2) 2608(1) 20(1)
N2B 966(2) 3800(2) 3735(2) 16(1)
N3B -1113(2) 4047(2) 3673(2) 22(1)
N4B -342(2) 2358(2) 3564(1) 17(1)
C1B 1036(3) 3849(2) 4436(2) 19(1)
C2B 1825(3) 3436(3) 4701(2) 32(1)
C3B 977(3) 4649(2) 4680(2) 30(1)
C4B 1685(3) 4154(2) 3375(2) 23(1)
C5B 2097(3) 3606(2) 2909(2) 30(1)
C6B 1393(3) 4869(2) 3035(2) 33(1)
C7B -1384(3) 4079(3) 4344(2) 31(1)
121
Table B-2. Continued
x y z U(eq)
C8B -1662(3) 4528(3) 3282(2) 34(1)
C9B -479(3) 1739(2) 3100(2) 25(1)
C10B -1233(3) 1900(2) 2650(2) 34(1)
C11B 365(3) 1584(2) 2724(2) 34(1)
C12B -398(2) 2138(2) 4241(2) 20(1)
C13B 302(3) 1585(2) 4436(2) 33(1)
C14B -1308(3) 1871(2) 4426(2) 33(1)
W1C 5081(1) 1614(1) 3249(1) 15(1)
N1C 5198(2) 1645(2) 4049(1) 22(1)
N2C 3932(2) 1162(2) 3108(2) 18(1)
N3C 6024(2) 964(2) 2953(2) 21(1)
N4C 5209(2) 2635(2) 2948(1) 16(1)
C1C 3331(3) 837(3) 3587(2) 26(1)
C2C 3779(3) 224(2) 3966(2) 34(1)
C3C 2946(3) 1440(3) 4010(2) 36(1)
C4C 3699(3) 1033(2) 2434(2) 23(1)
C5C 2817(3) 1367(3) 2254(2) 35(1)
C6C 3762(3) 206(2) 2265(2) 31(1)
C7C 6682(3) 583(3) 3336(2) 27(1)
C8C 6150(3) 817(3) 2277(2) 28(1)
C9C 5168(3) 2751(2) 2250(2) 20(1)
C10C 4409(3) 3252(2) 2056(2) 34(1)
C11C 6036(3) 3010(2) 1964(2) 28(1)
C12C 5380(3) 3318(2) 3325(2) 26(1)
C13C 6218(3) 3251(2) 3717(2) 37(1)
C14C 4588(3) 3502(2) 3752(2) 33(1)
122
Table B-3. Bond lengths (Å) and angles (°) for 35
Bond Bond Length (Å) / Bond Angle (°)
W1A-N1A 1.688(3)
W1A-N2A 1.949(3)
W1A-N3A 1.950(3)
W1A-N4A 1.961(4)
N2A-C4A 1.481(5)
N2A-C1A 1.491(5)
N3A-C8A 1.463(4)
N3A-C7A 1.464(4)
N4A-C12A 1.481(5)
N4A-C9A 1.481(5)
C1A-C2A 1.513(5)
C1A-C3A 1.548(6)
C1A-H1AA 1.0000
C2A-H2AA 0.9800‡‡‡‡‡‡
C2A-H2AB 0.9800
C2A-H2AC 0.9800
C3A-H3AA 0.9800
C3A-H3AB 0.9800
C3A-H3AC 0.9800
C4A-C6A 1.528(6)
‡‡‡‡‡‡ The hydrogens were placed arbitrarily so all C-H bond lengths were assumed to be 0.98 Å.
123
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
C4A-H4AA 1.0000
C5A-H5AA 0.9800
C5A-H5AB 0.9800
C5A-H5AC 0.9800
C6A-H6AA 0.9800
C6A-H6AB 0.9800
C6A-H6AC 0.9800
C7A-H7AA 0.9800
C7A-H7AB 0.9800
C7A-H7AC 0.9800
C8A-H8AA 0.9800
C8A-H8AB 0.9800
C8A-H8AC 0.9800
C9A-C10A 1.507(6)
C9A-C11A 1.520(6)
C9A-H9AA 1.0000
C10A-H10G 0.9800
C10A-H10H 0.9800
C10A-H10I 0.9800
C11A-H11G 0.9800
C11A-H11H 0.9800
124
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
C11A-H11I 0.9800
C12A-C14A 1.512(5)
C12A-C13A 1.534(5)
C12A-H12C 1.0000
C13A-H13G 0.9800
C13A-H13H 0.9800
C13A-H13I 0.9800
C14A-H14G 0.9800
C14A-H14H 0.9800
C14A-H14I 0.9800
W1B-N1B 1.679(3)
W1B-N4B 1.948(3)
W1B-N3B 1.951(4)
W1B-N2B 1.952(4)
N2B-C1B 1.472(5)
N2B-C4B 1.475(5)
N3B-C8B 1.455(5)
N3B-C7B 1.463(6)
N4B-C12B 1.471(4)
N4B-C9B 1.489(5)
C1B-C2B 1.520(5)
125
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
C1B-C3B 1.525(5)
C1B-H1BA 1.0000
C2B-H2BA 0.9800
C2B-H2BB 0.9800
C2B-H2BC 0.9800
C3B-H3BA 0.9800
C3B-H3BB 0.9800
C3B-H3BC 0.9800
C4B-C5B 1.520(6)
C4B-C6B 1.531(6)
C4B-H4BA 1.0000
C5B-H5BA 0.9800
C5B-H5BB 0.9800
C5B-H5BC 0.9800
C6B-H6BA 0.9800
C6B-H6BB 0.9800
C6B-H6BC 0.9800
C7B-H7BA 0.9800
C7B-H7BB 0.9800
C7B-H7BC 0.9800
C8B-H8BA 0.9800
126
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
C8B-H8BB 0.9800
C8B-H8BC 0.9800
C9B-C10B 1.515(5)
C9B-C11B 1.536(5)
C9B-H9BA 1.0000
C10B-H10A 0.9800
C10B-H10B 0.9800
C10B-H10C 0.9800
C11B-H11A 0.9800
C11B-H11B 0.9800
C11B-H11C 0.9800
C12B-C13B 1.515(5)
C12B-C14B 1.522(5)
C12B-H12A 1.0000
C13B-H13A 0.9800
C13B-H13B 0.9800
C13B-H13C 0.9800
C14B-H14A 0.9800
C14B-H14B 0.9800
C14B-H14C 0.9800
W1C-N1C 1.681(3)
127
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
W1C-N4C 1.945(3)
W1C-N3C 1.955(3)
W1C-N2C 1.957(4)
N2C-C4C 1.470(5)
N2C-C1C 1.479(5)
N3C-C8C 1.449(5)
N3C-C7C 1.456(5)
N4C-C9C 1.474(4)
N4C-C12C 1.479(4)
C1C-C3C 1.515(6)
C1C-C2C 1.519(6)
C1C-H1CA 1.0000
C2C-H2CA 0.9800
C2C-H2CB 0.9800
C2C-H2CC 0.9800
C3C-H3CA 0.9800
C3C-H3CB 0.9800
C3C-H3CC 0.9800
C4C-C5C 1.524(6)
C4C-C6C 1.527(5)
C4C-H4CA 1.0000
128
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
C5C-H5CA 0.9800
C5C-H5CB 0.9800
C5C-H5CC 0.9800
C6C-H6CA 0.9800
C6C-H6CB 0.9800
C6C-H6CC 0.9800
C7C-H7CA 0.9800
C7C-H7CB 0.9800
C7C-H7CC 0.9800
C8C-H8CA 0.9800
C8C-H8CB 0.9800
C8C-H8CC 0.9800
C9C-C10C 1.523(5)
C9C-C11C 1.529(5)
C9C-H9CA 1.0000
C10C-H10D 0.9800
C10C-H10E 0.9800
C10C-H10F 0.9800
C11C-H11D 0.9800
C11C-H11E 0.9800
C11C-H11F 0.9800
129
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
C12C-C13C 1.527(5)
C12C-C14C 1.540(5)
C12C-H12B 1.0000
C13C-H13D 0.9800
C13C-H13E 0.9800
C13C-H13F 0.9800
C14C-H14D 0.9800
C14C-H14E 0.9800
C14C-H14F 0.9800
N1A-W1A-N2A 105.47(15)
N1A-W1A-N3A 104.52(12)
N2A-W1A-N3A 113.33(15)
N1A-W1A-N4A 105.45(16)
N2A-W1A-N4A 113.65(14)
N3A-W1A-N4A 113.29(15)
C4A-N2A-C1A 114.0(3)
C4A-N2A-W1A 116.4(3)
C1A-N2A-W1A 129.5(3)
C8A-N3A-C7A 110.7(3)
C8A-N3A-W1A 128.0(2)
130
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
C7A-N3A-W1A 121.3(2)
C12A-N4A-C9A 115.2(4)
C12A-N4A-W1A 116.1(3)
C9A-N4A-W1A 128.8(3)
N2A-C1A-C2A 112.0(4)
N2A-C1A-C3A 109.5(3)
C2A-C1A-C3A 111.5(4)
N2A-C1A-H1AA 107.9
C2A-C1A-H1AA 107.9
C3A-C1A-H1AA 107.9
C1A-C2A-H2AA 109.5§§§§§§
C1A-C2A-H2AB 109.5
H2AA-C2A-H2AB 109.5
C1A-C2A-H2AC 109.5
H2AA-C2A-H2AC 109.5
H2AB-C2A-H2AC 109.5
C1A-C3A-H3AA 109.5
C1A-C3A-H3AB 109.5
H3AA-C3A-H3AB 109.5
C1A-C3A-H3AC 109.5
§§§§§§ The hydrogens were placed arbitrarily so all bond angles consisting of hydrogen were assumed to be 109.5°.
131
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
H3AA-C3A-H3AC 109.5
H3AB-C3A-H3AC 109.5
N2A-C4A-C5A 112.4(4)
N2A-C4A-C6A 112.0(3)
C5A-C4A-C6A 112.6(4)
N2A-C4A-H4AA 106.4
C5A-C4A-H4AA 106.4
C6A-C4A-H4AA 106.4
C4A-C5A-H5AA 109.5
C4A-C5A-H5AB 109.5
H5AA-C5A-H5AB 109.5
C4A-C5A-H5AC 109.5
H5AA-C5A-H5AC 109.5
H5AB-C5A-H5AC 109.5
C4A-C6A-H6AA 109.5
C4A-C6A-H6AB 109.5
H6AA-C6A-H6AB 109.5
C4A-C6A-H6AC 109.5
H6AA-C6A-H6AC 109.5
H6AB-C6A-H6AC 109.5
N3A-C7A-H7AA 109.5
132
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
N3A-C7A-H7AB 109.5
H7AA-C7A-H7AB 109.5
N3A-C7A-H7AC 109.5
H7AA-C7A-H7AC 109.5
H7AB-C7A-H7AC 109.5
N3A-C8A-H8AA 109.5
N3A-C8A-H8AB 109.5
H8AA-C8A-H8AB 109.5
N3A-C8A-H8AC 109.5
H8AA-C8A-H8AC 109.5
H8AB-C8A-H8AC 109.5
N4A-C9A-C10A 110.8(4)
N4A-C9A-C11A 111.3(4)
C10A-C9A-C11A 112.1(4)
N4A-C9A-H9AA 107.5
C10A-C9A-H9AA 107.5
C11A-C9A-H9AA 107.5
C9A-C10A-H10G 109.5
C9A-C10A-H10H 109.5
H10G-C10A-H10H 109.5
C9A-C10A-H10I 109.5
133
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
H10G-C10A-H10I 109.5
H10H-C10A-H10I 109.5
C9A-C11A-H11G 109.5
C9A-C11A-H11H 109.5
H11G-C11A-H11H 109.5
C9A-C11A-H11I 109.5
H11G-C11A-H11I 109.5
H11H-C11A-H11I 109.5
N4A-C12A-C14A 112.9(3)
N4A-C12A-C13A 112.3(3)
C14A-C12A-C13A 111.7(4)
N4A-C12A-H12C 106.5
C14A-C12A-H12C 106.5
C13A-C12A-H12C 106.5
C12A-C13A-H13G 109.5
C12A-C13A-H13H 109.5
H13G-C13A-H13H 109.5
C12A-C13A-H13I 109.5
H13G-C13A-H13I 109.5
H13H-C13A-H13I 109.5
C12A-C14A-H14G 109.5
134
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
C12A-C14A-H14H 109.5
H14G-C14A-H14H 109.5
C12A-C14A-H14I 109.5
H14G-C14A-H14I 109.5
H14H-C14A-H14I 109.5
N1B-W1B-N4B 106.20(13)
N1B-W1B-N3B 104.50(16)
N4B-W1B-N3B 113.27(14)
N1B-W1B-N2B 106.04(15)
N4B-W1B-N2B 115.00(14)
N3B-W1B-N2B 110.87(14)
C1B-N2B-C4B 115.3(4)
C1B-N2B-W1B 115.7(3)
C4B-N2B-W1B 128.2(3)
C8B-N3B-C7B 110.5(4)
C8B-N3B-W1B 128.7(3)
C7B-N3B-W1B 120.8(3)
C12B-N4B-C9B 114.7(3)
C12B-N4B-W1B 115.6(2)
C9B-N4B-W1B 129.6(2)
N2B-C1B-C2B 113.0(3)
135
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
N2B-C1B-C3B 112.6(4)
C2B-C1B-C3B 112.6(4)
N2B-C1B-H1BA 106.0
C2B-C1B-H1BA 106.0
C3B-C1B-H1BA 106.0
C1B-C2B-H2BA 109.5
C1B-C2B-H2BB 109.5
H2BA-C2B-H2BB 109.5
C1B-C2B-H2BC 109.5
H2BA-C2B-H2BC 109.5
H2BB-C2B-H2BC 109.5
C1B-C3B-H3BA 109.5
C1B-C3B-H3BB 109.5
H3BA-C3B-H3BB 109.5
C1B-C3B-H3BC 109.5
H3BA-C3B-H3BC 109.5
H3BB-C3B-H3BC 109.5
N2B-C4B-C5B 111.0(4)
N2B-C4B-C6B 112.3(3)
C5B-C4B-C6B 111.4(4)
N2B-C4B-H4BA 107.3
136
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
C5B-C4B-H4BA 107.3
C6B-C4B-H4BA 107.3
C4B-C5B-H5BA 109.5
C4B-C5B-H5BB 109.5
H5BA-C5B-H5BB 109.5
C4B-C5B-H5BC 109.5
H5BA-C5B-H5BC 109.5
H5BB-C5B-H5BC 109.5
C4B-C6B-H6BA 109.5
C4B-C6B-H6BB 109.5
H6BA-C6B-H6BB 109.5
C4B-C6B-H6BC 109.5
H6BA-C6B-H6BC 109.5
H6BB-C6B-H6BC 109.5
N3B-C7B-H7BA 109.5
N3B-C7B-H7BB 109.5
H7BA-C7B-H7BB 109.5
N3B-C7B-H7BC 109.5
H7BA-C7B-H7BC 109.5
H7BB-C7B-H7BC 109.5
N3B-C8B-H8BA 109.5
137
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
N3B-C8B-H8BB 109.5
H8BA-C8B-H8BB 109.5
N3B-C8B-H8BC 109.5
H8BA-C8B-H8BC 109.5
H8BB-C8B-H8BC 109.5
N4B-C9B-C10B 111.6(3)
N4B-C9B-C11B 110.4(3)
C10B-C9B-C11B 111.0(3)
N4B-C9B-H9BA 107.9
C10B-C9B-H9BA 107.9
C11B-C9B-H9BA 107.9
C9B-C10B-H10A 109.5
C9B-C10B-H10B 109.5
H10A-C10B-H10B 109.5
C9B-C10B-H10C 109.5
H10A-C10B-H10C 109.5
H10B-C10B-H10C 109.5
C9B-C11B-H11A 109.5
C9B-C11B-H11B 109.5
H11A-C11B-H11B 109.5
C9B-C11B-H11C 109.5
138
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
H11A-C11B-H11C 109.5
H11B-C11B-H11C 109.5
N4B-C12B-C13B 113.1(3)
N4B-C12B-C14B 112.4(3)
C13B-C12B-C14B 111.8(3)
N4B-C12B-H12A 106.3
C13B-C12B-H12A 106.3
C14B-C12B-H12A 106.3
C12B-C13B-H13A 109.5
C12B-C13B-H13B 109.5
H13A-C13B-H13B 109.5
C12B-C13B-H13C 109.5
H13A-C13B-H13C 109.5
H13B-C13B-H13C 109.5
C12B-C14B-H14A 109.5
C12B-C14B-H14B 109.5
H14A-C14B-H14B 109.5
C12B-C14B-H14C 109.5
H14A-C14B-H14C 109.5
H14B-C14B-H14C 109.5
N1C-W1C-N4C 106.17(12)
139
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
N1C-W1C-N3C 104.84(16)
N4C-W1C-N3C 112.64(15)
N1C-W1C-N2C 104.95(16)
N4C-W1C-N2C 115.55(14)
N3C-W1C-N2C 111.62(15)
C4C-N2C-C1C 115.7(4)
C4C-N2C-W1C 115.3(3)
C1C-N2C-W1C 128.3(3)
C8C-N3C-C7C 111.1(3)
C8C-N3C-W1C 121.0(3)
C7C-N3C-W1C 128.0(3)
C9C-N4C-C12C 114.7(3)
C9C-N4C-W1C 116.6(2)
C12C-N4C-W1C 128.7(2)
N2C-C1C-C3C 110.8(4)
N2C-C1C-C2C 110.9(4)
C3C-C1C-C2C 112.8(4)
N2C-C1C-H1CA 107.3
C3C-C1C-H1CA 107.3
C2C-C1C-H1CA 107.3
C1C-C2C-H2CA 109.5
140
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
C1C-C2C-H2CB 109.5
H2CA-C2C-H2CB 109.5
C1C-C2C-H2CC 109.5
H2CA-C2C-H2CC 109.5
H2CB-C2C-H2CC 109.5
C1C-C3C-H3CA 109.5
C1C-C3C-H3CB 109.5
H3CA-C3C-H3CB 109.5
C1C-C3C-H3CC 109.5
H3CA-C3C-H3CC 109.5
H3CB-C3C-H3CC 109.5
N2C-C4C-C5C 113.0(3)
N2C-C4C-C6C 111.1(4)
C5C-C4C-C6C 112.4(4)
N2C-C4C-H4CA 106.7
C5C-C4C-H4CA 106.7
C6C-C4C-H4CA 106.7
C4C-C5C-H5CA 109.5
C4C-C5C-H5CB 109.5
H5CA-C5C-H5CB 109.5
C4C-C5C-H5CC 109.5
141
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
H5CA-C5C-H5CC 109.5
H5CB-C5C-H5CC 109.5
C4C-C6C-H6CA 109.5
C4C-C6C-H6CB 109.5
H6CA-C6C-H6CB 109.5
C4C-C6C-H6CC 109.5
H6CA-C6C-H6CC 109.5
H6CB-C6C-H6CC 109.5
N3C-C7C-H7CA 109.5
N3C-C7C-H7CB 109.5
H7CA-C7C-H7CB 109.5
N3C-C7C-H7CC 109.5
H7CA-C7C-H7CC 109.5
H7CB-C7C-H7CC 109.5
N3C-C8C-H8CA 109.5
N3C-C8C-H8CB 109.5
H8CA-C8C-H8CB 109.5
N3C-C8C-H8CC 109.5
H8CA-C8C-H8CC 109.5
H8CB-C8C-H8CC 109.5
N4C-C9C-C10C 112.2(3)
142
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
N4C-C9C-C11C 113.1(3)
C10C-C9C-C11C 112.2(3)
N4C-C9C-H9CA 106.2
C10C-C9C-H9CA 106.2
C11C-C9C-H9CA 106.2
C9C-C10C-H10D 109.5
C9C-C10C-H10E 109.5
H10D-C10C-H10E 109.5
C9C-C10C-H10F 109.5
H10D-C10C-H10F 109.5
H10E-C10C-H10F 109.5
C9C-C11C-H11D 109.5
C9C-C11C-H11E 109.5
H11D-C11C-H11E 109.5
C9C-C11C-H11F 109.5
H11D-C11C-H11F 109.5
H11E-C11C-H11F 109.5
N4C-C12C-C13C 111.7(3)
N4C-C12C-C14C 110.3(3)
C13C-C12C-C14C 111.5(3)
N4C-C12C-H12B 107.7
143
Table B-3. Continued
Bond Bond Length (Å) / Bond Angle (°)
C13C-C12C-H12B 107.7
C14C-C12C-H12B 107.7
C12C-C13C-H13D 109.5
C12C-C13C-H13E 109.5
H13D-C13C-H13E 109.5
C12C-C13C-H13F 109.5
H13D-C13C-H13F 109.5
H13E-C13C-H13F 109.5
C12C-C14C-H14D 109.5
C12C-C14C-H14E 109.5
H14D-C14C-H14E 109.5
C12C-C14C-H14F 109.5
H14D-C14C-H14F 109.5
H14E-C14C-H14F 109.5
Symmetry transformations used to generate equivalent atoms
144
Table B-4. Anisotropic displacement parameters (Å2 x 103) for 35. The anisotropic displacement
factor exponent takes the form: -2π2[ h2 a*2U11 + ... + 2 h k a* b* U12.
U11 U22 U33 U23 U13 U12
W1A 21(1) 16(1) 14(1) 1(1) -1(1) -2(1)
N1A 22(2) 21(2) 25(2) -1(1) -2(2) -5(2)
N2A 15(2) 21(2) 16(2) 1(2) 0(2) 0(2)
N3A 37(2) 16(2) 20(2) 2(1) 4(2) -1(2)
N4A 16(2) 27(2) 14(2) 3(2) 0(2) 1(2)
C1A 18(3) 29(3) 26(3) -2(2) -1(2) -5(2)
C2A 35(3) 43(3) 24(3) 7(2) 6(2) 10(3)
C3A 25(3) 23(3) 31(3) 8(2) 5(2) -9(2)
C4A 15(2) 34(3) 18(3) -2(2) 0(2) -2(2)
C5A 32(3) 49(3) 35(3) -10(2) -5(2) -7(3)
C6A 35(3) 73(4) 21(3) 2(2) -2(2) 18(3)
C7A 41(3) 25(2) 30(2) 6(2) 5(2) 1(3)
C8A 67(4) 22(2) 35(3) 0(2) -3(2) -12(3)
C9A 21(3) 25(2) 29(3) 5(2) 2(2) 2(2)
C10A 28(3) 31(3) 26(3) 8(2) -5(2) 7(2)
C11A 33(3) 45(3) 37(3) 11(2) -13(2) -8(2)
C12A 16(2) 21(2) 19(3) 1(2) 0(2) 4(2)
C13A 33(3) 26(3) 26(3) 2(2) 8(2) 5(2)
C14A 26(2) 36(3) 30(3) 4(2) 0(2) -7(2)
W1B 14(1) 16(1) 14(1) 1(1) -1(1) 0(1)
N1B 18(2) 21(2) 22(2) 2(1) -4(2) -1(2)
N2B 13(2) 17(2) 19(2) 0(2) 1(2) -2(2)
N3B 18(2) 23(2) 24(2) 2(2) 1(2) 8(2)
N4B 17(2) 18(2) 15(2) 2(1) 1(1) -1(1)
C1B 20(3) 21(2) 15(2) -2(2) -4(2) 1(2)
C2B 23(2) 43(3) 29(3) 4(2) -4(2) 1(2)
C3B 36(3) 32(3) 23(3) -3(2) 1(2) -5(2)
C4B 16(2) 29(3) 23(3) 1(2) -1(2) -5(2)
C5B 18(2) 41(3) 31(3) 1(2) 6(2) -1(2)
C6B 35(3) 26(3) 37(3) 5(2) 6(2) -9(2)
C7B 24(3) 41(3) 27(3) 1(2) 2(2) 14(2)
C8B 30(3) 42(3) 32(3) 9(2) -1(2) 14(2)
145
Table B-4. Continued
U11 U22 U33 U23 U13 U12
C9B 34(3) 20(3) 22(2) 3(2) 1(2) -4(2)
C10B 42(3) 31(3) 30(3) -8(2) -8(2) -10(2)
C11B 45(3) 31(3) 27(3) -3(2) 5(2) 8(2)
C12B 18(2) 18(2) 24(2) -1(2) 2(2) -1(2)
C13B 40(3) 30(2) 30(2) 1(2) 2(2) 2(2)
C14B 34(3) 35(3) 30(3) 4(2) 8(2) -8(2)
W1C 14(1) 17(1) 14(1) 0(1) 0(1) -1(1)
N1C 22(2) 22(2) 22(2) -1(1) -1(2) 0(2)
N2C 19(2) 20(2) 14(2) -4(2) 0(2) -1(2)
N3C 19(2) 22(2) 21(2) 0(2) 1(2) 8(2)
N4C 20(2) 17(2) 13(2) -4(1) -3(1) -1(2)
C1C 17(2) 34(3) 25(3) 1(2) -1(2) -10(2)
C2C 38(3) 30(3) 35(3) -1(2) 3(2) -14(2)
C3C 21(3) 59(4) 27(3) 1(2) 7(2) 4(3)
C4C 20(3) 26(3) 22(3) -1(2) 0(2) -7(2)
C5C 24(3) 45(3) 36(3) 1(2) -7(2) -3(2)
C6C 27(3) 38(3) 30(3) -10(2) -4(2) -9(2)
C7C 23(3) 30(3) 29(3) 3(2) 1(2) 8(2)
C8C 27(3) 34(3) 22(3) -4(2) 2(2) 14(2)
C9C 20(2) 23(2) 16(2) 2(1) 4(2) 1(2)
C10C 31(3) 47(3) 25(3) 10(2) 0(2) 10(2)
C11C 31(3) 28(3) 24(2) 2(2) 5(2) -5(2)
C12C 37(2) 17(2) 25(3) 2(2) -1(2) 1(2)
C13C 40(3) 32(3) 38(3) -12(2) -5(2) -12(2)
C14C 44(3) 25(2) 28(2) -5(2) 0(2) 11(2)
146
Table B-5. Hydrogen coordinates (x 104) and isotropic displacement parameters (Å2 x 10 3) for
35.
x y z U(eq)
H1AA 2295 4215 11 29
H2AA 2409 3032 -453 51
H2AB 2537 3658 -991 51
H2AC 1628 3221 -936 51
H3AA 1210 5073 -289 39
H3AB 824 4507 -810 39
H3AC 1768 4873 -914 39
H4AA 951 3548 1176 27
H5AA 1050 4848 1010 58
H5AB 2083 4762 913 58
H5AC 1649 4566 1590 58
H6AA 2098 2747 939 64
H6AB 2397 3306 1496 64
H6AC 2726 3435 777 64
H7AA -455 1656 1113 48
H7AB 106 2387 1270 48
H7AC 588 1636 1052 48
H8AA 383 1180 -17 62
H8AB -86 1691 -542 62
H8AC -656 1281 -5 62
H9AA -2060 4435 390 30
H10G -939 5116 -110 43
H10H -1785 5060 -559 43
H10I -953 4544 -699 43
H11G -2498 3270 2 58
H11H -1886 3367 -614 58
H11I -2714 3900 -518 58
H12C -514 3577 1305 22
H13G -448 4902 1144 42
H13H -833 4665 1827 42
H13I -1479 4935 1270 42
H14G -1860 2964 1253 46
147
Table B-5. Continued
x y z U(eq)
H14H -2356 3750 1258 46
H14I -1806 3491 1871 46
H1BA 511 3585 4610 23
H2BA 1837 2928 4528 48
H2BB 1787 3415 5169 48
H2BC 2361 3699 4576 48
H3BA 462 4892 4495 45
H3BB 1504 4923 4555 45
H3BC 926 4646 5148 45
H4BA 2145 4297 3692 27
H5BA 2303 3167 3143 45
H5BB 2592 3845 2692 45
H5BC 1662 3454 2590 45
H6BA 1162 5221 3351 49
H6BB 937 4749 2722 49
H6BC 1894 5093 2815 49
H7BA -1352 4595 4496 46
H7BB -995 3766 4603 46
H7BC -1986 3898 4383 46
H8BA -2276 4389 3339 52
H8BB -1500 4471 2830 52
H8BC -1578 5048 3412 52
H9BA -627 1280 3349 30
H10A -1769 1972 2899 51
H10B -1310 1479 2356 51
H10C -1107 2353 2404 51
H11A 838 1466 3024 51
H11B 523 2027 2474 51
H11C 273 1162 2434 51
H12A -288 2601 4497 24
H13A 875 1770 4300 50
H13B 186 1103 4233 50
148
Table B-5. Continued
x y z U(eq)
H13C 296 1525 4903 50
H14A -1742 2242 4292 50
H14B -1339 1804 4891 50
H14C -1429 1395 4214 50
H1CA 2836 603 3347 31
H2CA 4023 -146 3671 51
H2CB 3353 -18 4249 51
H2CC 4251 439 4224 51
H3CA 2630 1801 3745 54
H3CB 3418 1695 4241 54
H3CC 2542 1214 4319 54
H4CA 4148 1296 2170 27
H5CA 2807 1897 2370 52
H5CB 2351 1104 2484 52
H5CC 2725 1315 1791 52
H6CA 4344 19 2378 47
H6CB 3665 141 1804 47
H6CC 3317 -72 2503 47
H7CA 6629 43 3273 41
H7CB 6593 702 3790 41
H7CC 7266 747 3204 41
H8CA 6737 975 2149 42
H8CB 5714 1094 2028 42
H8CC 6082 282 2195 42
H9CA 5045 2251 2057 24
H10D 3873 3081 2267 52
H10E 4332 3231 1590 52
H10F 4534 3767 2185 52
H11D 6504 2671 2098 42
H11E 6167 3516 2115 42
H11F 5994 3011 1495 42
H12B 5458 3739 3017 32
149
Table B-5. Continued
x y z U(eq)
H13D 6710 3143 3431 55
H13E 6156 2847 4030 55
H13F 6327 3721 3943 55
H14D 4064 3551 3485 49
H14E 4695 3973 3978 49
H14F 4502 3101 4065 49
150
APPENDIX C
COMPUTATIONAL DATA
Cartesian Coordinates for the Decomposition Pathway of 35
Table C-1. Optimized Cartesian coordinates of the GS in the decomposition pathway of 35.
x y z
W 0.035447000 0.548742000 -0.418762000
N -1.668846000 -0.422585000 -0.130429000
N 0.069720000 2.358788000 0.387924000
N 1.625086000 -0.553853000 -0.002960000
N 0.132578000 0.801648000 -2.074659000
C 0.137819000 3.631916000 -0.297015000
H 0.092738000 3.477978000 -1.377227000
C 0.133622000 2.523822000 1.824828000
H 0.057651000 1.556819000 2.343259000
C 1.671079000 -1.027376000 1.391558000
C 2.954319000 -0.696546000 2.144397000
H 0.875937000 -0.452095000 1.906632000
H 2.839320000 -0.941734000 3.207727000
H 3.808287000 -1.273148000 1.770184000
H 3.199070000 0.368740000 2.061101000
C 2.716487000 -0.841703000 -0.954948000
C 3.871374000 0.152942000 -0.845079000
H 2.256857000 -0.675377000 -1.936973000
H 4.553259000 0.035576000 -1.697209000
151
Table C-1. Continued
x y z
H 3.491270000 1.181658000 -0.856304000
H 4.462113000 0.016281000 0.067812000
C -2.463668000 -1.041335000 -1.210060000
C -2.202950000 -2.541763000 -1.343025000
H -2.068241000 -0.578291000 -2.122844000
H -2.629822000 -2.917531000 -2.281775000
H -1.124083000 -2.742274000 -1.360417000
H -2.645855000 -3.124237000 -0.527208000
C -2.112780000 -0.461811000 1.275854000
C -2.578632000 -1.822384000 1.783095000
H -1.204122000 -0.223611000 1.864839000
H -2.750756000 -1.774758000 2.865565000
H -3.522471000 -2.131072000 1.319702000
H -1.834059000 -2.602332000 1.591699000
C 3.217112000 -2.280266000 -0.936276000
H 3.911693000 -2.436213000 -1.770745000
H 3.763102000 -2.526660000 -0.016669000
H 2.392181000 -2.993318000 -1.047308000
C 1.269218000 -2.493958000 1.557993000
H 2.077784000 -3.184219000 1.296309000
H 0.991768000 -2.696607000 2.601019000
152
Table C-1. Continued
x y z
H 0.404947000 -2.723567000 0.922534000
C -3.116399000 0.640582000 1.618805000
H -4.113959000 0.431558000 1.218095000
H -3.213525000 0.745265000 2.707551000
H -2.779499000 1.600695000 1.209394000
C -3.955613000 -0.732888000 -1.172575000
H -4.138866000 0.346266000 -1.127190000
H -4.429560000 -1.115223000 -2.085012000
H -4.468409000 -1.204453000 -0.325057000
H 1.082259000 2.992667000 2.138684000
H -0.689139000 3.160152000 2.194063000
H 1.072062000 4.166928000 -0.053898000
H -0.698686000 4.285854000 0.003616000
Table C-2. Optimized Cartesian coordinates for TS in the decomposition pathway of 35.
x y z
N 1.778550000 -0.596691000 0.168895000
W -0.121492000 0.385928000 -0.274183000
N -0.281905000 2.282982000 0.254729000
N -0.204583000 0.454191000 -1.952594000
N -1.724263000 -0.585868000 0.355418000
H 0.632210000 -1.370012000 0.258187000
153
Table C-2. Continued
x y z
C -3.061655000 -0.598546000 -0.229745000
C -3.984594000 -1.481083000 0.600432000
H -3.012432000 -1.000983000 -1.259107000
H -5.003420000 -1.478875000 0.193520000
H -3.635694000 -2.520531000 0.621163000
H -4.024944000 -1.122085000 1.636776000
C -0.842212000 -1.748734000 0.270243000
C -0.777444000 -2.535445000 1.574217000
H 0.129963000 -3.153006000 1.644378000
H -0.816023000 -1.874309000 2.445194000
H -1.636892000 -3.219158000 1.645185000
C 2.722884000 -0.864442000 -0.933283000
C 2.131684000 -1.818624000 -1.955510000
H 3.581809000 -1.385211000 -0.484153000
H 2.886270000 -2.061440000 -2.712573000
H 1.819546000 -2.756609000 -1.480018000
H 1.267567000 -1.382592000 -2.468482000
C 2.362997000 -0.002498000 1.391606000
C 1.424347000 -0.221286000 2.571262000
H 2.477287000 1.091272000 1.243752000
H 1.730621000 0.387193000 3.429749000
154
Table C-2. Continued
x y z
H 0.379673000 0.038311000 2.348582000
H 1.429353000 -1.275335000 2.873952000
C -0.283840000 3.434210000 -0.626848000
H 0.493667000 4.157835000 -0.331443000
C -0.555828000 2.672892000 1.624949000
H -0.758221000 1.799268000 2.255000000
C 3.734998000 -0.559298000 1.753607000
H 3.705069000 -1.654372000 1.823347000
H 4.512217000 -0.280742000 1.034477000
H 4.039500000 -0.168529000 2.731657000
C 3.228850000 0.418838000 -1.580192000
H 4.000551000 0.206543000 -2.330508000
H 2.404669000 0.943566000 -2.080902000
H 3.666428000 1.098913000 -0.836978000
C -1.069224000 -2.674892000 -0.916883000
H -0.266290000 -3.419906000 -0.983185000
H -2.010799000 -3.236778000 -0.806096000
H -1.100482000 -2.135276000 -1.869360000
C -3.572878000 0.830308000 -0.305665000
H -3.576528000 1.289818000 0.692244000
H -2.936682000 1.441358000 -0.958440000
155
Table C-2. Continued
x y z
H -4.595071000 0.861271000 -0.700753000
H -0.102165000 3.119397000 -1.656839000
H -1.253397000 3.958697000 -0.578731000
H 0.286422000 3.231610000 2.066552000
H -1.446443000 3.321324000 1.669132000
Table C-3. Optimized Cartesian coordinates for INT1 in the decomposition pathway of 35.
x y z
N 1.925638000 -0.613137000 0.277322000
W -0.162564000 0.209948000 -0.306885000
N -0.229879000 2.189530000 0.002431000
N -0.243329000 -0.066069000 -1.970190000
N -1.890296000 -0.399207000 0.463827000
H 1.717215000 -1.438269000 0.845701000
C -3.190363000 -0.443706000 -0.192677000
C -4.206390000 -1.082583000 0.746076000
H -3.127900000 -1.051112000 -1.116214000
H -5.198648000 -1.137143000 0.280385000
H -3.907484000 -2.100621000 1.023821000
H -4.290897000 -0.495811000 1.670035000
C -1.041700000 -1.545835000 0.611611000
C -0.762344000 -1.931196000 2.051569000
156
Table C-3. Continued
x y z
H 0.184120000 -2.488947000 2.165393000
H -0.717880000 -1.049223000 2.702686000
H -1.550229000 -2.590153000 2.458234000
C 2.791360000 -1.097018000 -0.852350000
C 2.125966000 -2.274171000 -1.537691000
H 3.727573000 -1.454870000 -0.397433000
H 2.803700000 -2.691136000 -2.290873000
H 1.895968000 -3.074069000 -0.821163000
H 1.195737000 -1.970575000 -2.030276000
C 2.596221000 0.379534000 1.190785000
C 1.779730000 0.483067000 2.465732000
H 2.555744000 1.343022000 0.661623000
H 2.154680000 1.294685000 3.098281000
H 0.720792000 0.686174000 2.267601000
H 1.833124000 -0.448900000 3.044373000
C -0.094957000 3.200867000 -1.026812000
H 0.721491000 3.906154000 -0.790633000
C -0.599341000 2.783196000 1.268476000
H -0.926248000 2.012829000 1.978746000
C 4.043596000 0.043134000 1.518472000
H 4.131162000 -0.961691000 1.953033000
157
Table C-3. Continued
x y z
H 4.706752000 0.098481000 0.649527000
H 4.420696000 0.754161000 2.261712000
C 3.106787000 0.037749000 -1.806103000
H 3.769117000 -0.320532000 -2.601487000
H 2.186133000 0.410744000 -2.271107000
H 3.613160000 0.872959000 -1.305737000
C -1.310077000 -2.763723000 -0.253742000
H -0.446487000 -3.444013000 -0.246442000
H -2.167955000 -3.353718000 0.118354000
H -1.501080000 -2.501385000 -1.299383000
C -3.601632000 0.965291000 -0.585944000
H -3.631484000 1.615211000 0.299510000
H -2.888610000 1.396657000 -1.299762000
H -4.595755000 0.971601000 -1.049173000
H 0.113523000 2.735250000 -1.993754000
H -1.020217000 3.797019000 -1.115787000
H 0.233806000 3.349326000 1.722996000
H -1.439926000 3.486258000 1.138529000
158
Table C-4. Optimized Cartesian coordinates for INT2 in the decomposition pathway of 35.
x y z
W 1.862516000 -0.421261000 -0.129495000
N 0.943534000 -0.862149000 1.278865000
N 2.549131000 -1.983607000 -1.134281000
N 2.760301000 1.376098000 -0.148742000
N 0.174818000 0.300278000 -1.023450000
W -1.001910000 0.052641000 0.282194000
N -0.986477000 1.026973000 2.032203000
N -2.395612000 1.139579000 -0.652986000
N -1.851150000 -1.719589000 0.180757000
C -2.042446000 0.711343000 2.967712000
H -2.911757000 0.265145000 2.463847000
C 0.157288000 1.585903000 2.706268000
H 0.938688000 1.838497000 1.985753000
C -3.726845000 1.213063000 -0.018976000
C -4.914336000 1.166426000 -0.976543000
H -3.788813000 0.284507000 0.578919000
H -5.840580000 1.089739000 -0.392996000
H -4.990381000 2.078621000 -1.579018000
H -4.870967000 0.308939000 -1.654534000
C -2.077119000 2.031809000 -1.792260000
C -2.535872000 1.475783000 -3.137983000
159
Table C-4. Continued
x y z
H -0.983040000 2.026262000 -1.831346000
H -2.164255000 2.117803000 -3.947204000
H -2.120743000 0.473855000 -3.296866000
H -3.625113000 1.419628000 -3.239585000
C -1.948618000 -2.389710000 1.494135000
C -3.392334000 -2.733984000 1.835902000
H -1.585397000 -1.662701000 2.238980000
H -3.465001000 -3.171996000 2.838887000
H -4.029851000 -1.840621000 1.802471000
H -3.806441000 -3.463329000 1.127374000
C -2.167371000 -2.555275000 -0.989674000
C -3.382136000 -2.017934000 -1.729245000
H -2.431625000 -3.550877000 -0.601433000
H -3.644108000 -2.666145000 -2.574824000
H -4.250715000 -1.951306000 -1.062278000
H -3.180397000 -1.013614000 -2.119141000
C 3.237194000 -1.796399000 -2.394010000
H 3.244949000 -0.736828000 -2.679576000
H 2.732744000 -2.356999000 -3.199169000
C 2.548031000 -3.368369000 -0.722096000
H 2.013846000 -3.485522000 0.225785000
160
Table C-4. Continued
x y z
H 3.578259000 -3.741435000 -0.588540000
C 3.672692000 0.529241000 0.541132000
C 3.861895000 0.746375000 2.028690000
H 4.525673000 1.605805000 2.230137000
H 2.910039000 0.925081000 2.541677000
H 4.326583000 -0.130237000 2.498007000
C 2.567899000 2.777431000 0.175014000
C 3.760403000 3.577929000 -0.342238000
H 2.539916000 2.914084000 1.275309000
H 3.664911000 4.641980000 -0.089323000
H 4.697717000 3.209933000 0.092158000
H 3.838563000 3.485521000 -1.432829000
H 2.065341000 -4.009409000 -1.479856000
H 4.283107000 -2.144502000 -2.343861000
C 1.262743000 3.294921000 -0.404932000
H 1.219121000 3.096725000 -1.483889000
H 0.392162000 2.803259000 0.049226000
H 1.164364000 4.376347000 -0.245351000
C 4.977884000 0.216883000 -0.167155000
H 5.743331000 0.984490000 0.044546000
H 5.396652000 -0.748653000 0.151867000
161
Table C-4. Continued
x y z
H 4.844920000 0.188558000 -1.254788000
C -3.885663000 2.391996000 0.951708000
H -4.238346000 3.293886000 0.440167000
H -4.624051000 2.150224000 1.727757000
H -2.936155000 2.630433000 1.441824000
C -2.492382000 3.487270000 -1.607586000
H -2.147643000 3.883915000 -0.646013000
H -2.032727000 4.091135000 -2.400141000
H -3.576013000 3.643270000 -1.674131000
C -0.967162000 -2.724974000 -1.908623000
H -0.665753000 -1.767243000 -2.351818000
H -0.104542000 -3.109353000 -1.351465000
H -1.198877000 -3.423330000 -2.722746000
C -1.013688000 -3.588612000 1.599279000
H -1.048780000 -4.009481000 2.611211000
H -1.289997000 -4.388892000 0.901145000
H 0.014850000 -3.274676000 1.393423000
H -2.399323000 1.613530000 3.493310000
H -1.696524000 -0.007339000 3.734414000
H -0.125851000 2.497853000 3.257538000
H 0.591061000 0.863542000 3.419569000
162
Table C-5. Optimized Cartesian coordinates for INT3 in the decomposition pathway of 35.
x y z
W 1.418610000 -0.520752000 -0.563087000
N -0.046852000 -1.064468000 -1.405080000
N 2.519806000 0.276834000 -2.038379000
N 3.189968000 1.413730000 0.809715000
N 1.889971000 -1.866736000 0.782909000
H 4.109195000 0.970132000 0.858919000
N 0.186980000 0.724677000 0.443188000
W -1.322164000 0.229958000 -0.421120000
N -2.366080000 -1.449858000 0.148015000
N -2.495235000 1.492143000 0.652120000
N -1.565120000 1.271646000 -2.096514000
C -3.631104000 -1.363395000 0.914652000
C -3.510586000 -1.695151000 2.405899000
H -3.898435000 -0.306957000 0.896037000
H -4.408235000 -1.339694000 2.931354000
H -3.417812000 -2.764173000 2.617995000
H -2.643281000 -1.186043000 2.844409000
C -1.898794000 -2.816472000 -0.219480000
C -2.404509000 -3.239384000 -1.596690000
H -0.813975000 -2.727508000 -0.313576000
H -1.902932000 -4.161141000 -1.922243000
163
Table C-5. Continued
x y z
H -3.484713000 -3.427013000 -1.611014000
H -2.175427000 -2.462319000 -2.335306000
C -3.840936000 1.970239000 0.284299000
C -3.944774000 3.493875000 0.183781000
H -4.529471000 1.653788000 1.089220000
H -4.942693000 3.772291000 -0.178522000
H -3.791914000 3.997495000 1.142573000
H -3.206843000 3.884995000 -0.527158000
C -2.025392000 1.919807000 2.001703000
C -1.177936000 3.188129000 1.924705000
H -1.343958000 1.123683000 2.332358000
H -0.674714000 3.372139000 2.884111000
H -0.404232000 3.049891000 1.161554000
H -1.767769000 4.077716000 1.677999000
C -1.985266000 0.646248000 -3.325701000
H -2.176996000 -0.422218000 -3.171182000
C -1.309104000 2.682204000 -2.231234000
H -1.058091000 3.119405000 -1.257999000
C 2.705244000 1.585345000 2.201542000
C 3.175589000 2.822976000 2.962560000
H 1.606003000 1.611469000 2.127119000
164
Table C-5. Continued
x y z
H 2.764535000 2.794458000 3.980065000
H 4.270032000 2.848954000 3.053436000
H 2.849372000 3.763667000 2.508671000
C 3.337730000 2.600279000 -0.067538000
C 4.560116000 3.474763000 0.214188000
H 3.496780000 2.166337000 -1.061161000
H 4.739233000 4.145181000 -0.636596000
H 4.456060000 4.102622000 1.104512000
H 5.464581000 2.863789000 0.339328000
C 3.928455000 0.124880000 -2.295630000
H 4.479704000 -0.018032000 -1.360607000
C 1.825097000 0.803194000 -3.196845000
H 0.758605000 0.927378000 -2.984573000
C 2.769865000 -2.208748000 -0.278732000
C 2.418283000 -3.441960000 -1.093996000
H 2.757680000 -4.370016000 -0.598909000
H 1.337126000 -3.530209000 -1.263845000
H 2.901622000 -3.416389000 -2.080160000
C 1.240906000 -2.789570000 1.703922000
C 2.296662000 -3.520753000 2.525589000
H 0.681235000 -3.550797000 1.124481000
165
Table C-5. Continued
x y z
H 1.824292000 -4.222947000 3.223621000
H 2.978259000 -4.090760000 1.883894000
H 2.896420000 -2.809702000 3.108969000
C 4.246329000 -2.134479000 0.048696000
H 4.564154000 -2.995188000 0.662330000
H 4.872181000 -2.146053000 -0.853525000
H 4.487730000 -1.229484000 0.623359000
C 0.265037000 -2.036727000 2.590145000
H 0.781455000 -1.246945000 3.151204000
H -0.526086000 -1.564289000 1.996344000
H -0.207904000 -2.714000000 3.313120000
C 3.117980000 0.346641000 2.980127000
H 2.643161000 0.327268000 3.968297000
H 2.845604000 -0.563716000 2.436546000
H 4.207312000 0.340934000 3.141146000
C 2.055541000 3.406058000 -0.165943000
H 2.156242000 4.164583000 -0.952250000
H 1.210678000 2.755783000 -0.414445000
H 1.808468000 3.931478000 0.764684000
C -3.117396000 2.013512000 3.060522000
H -2.650601000 2.170465000 4.040073000
166
Table C-5. Continued
x y z
H -3.811135000 2.847653000 2.898451000
H -3.705473000 1.089798000 3.121153000
C -4.372771000 1.363248000 -1.013226000
H -4.001441000 1.901163000 -1.892170000
H -4.104480000 0.305058000 -1.135410000
H -5.467741000 1.431087000 -1.023833000
C -4.813316000 -2.086174000 0.271034000
H -4.730130000 -3.177796000 0.301928000
H -5.736825000 -1.818477000 0.801823000
H -4.932207000 -1.790618000 -0.778735000
C -2.107840000 -3.933184000 0.798924000
H -1.593114000 -4.829356000 0.426955000
H -1.670914000 -3.688069000 1.772133000
H -3.155684000 -4.212909000 0.955323000
H 1.924913000 0.142625000 -4.077260000
H 2.235675000 1.791323000 -3.474232000
H 4.142789000 -0.740360000 -2.949005000
H 4.334706000 1.020391000 -2.797748000
H -1.214659000 0.733626000 -4.111816000
H -2.910648000 1.109917000 -3.712760000
H -0.475690000 2.886711000 -2.927175000
167
Table C-5. Continued
x y z
H -2.199317000 3.208501000 -2.626417000
Table C-6. Optimized Cartesian coordinates for iPr2NH in the decomposition pathway of 35.
x y z
N 0.103998000 -0.521078000 -0.745204000
H 0.286950000 -0.002939000 -1.602857000
C 1.125721000 -0.167949000 0.240162000
C 1.116732000 1.275234000 0.751405000
H 0.972530000 -0.834964000 1.102359000
H 1.987807000 1.472206000 1.390458000
H 1.153181000 1.986688000 -0.085935000
H 0.222992000 1.503263000 1.342738000
C -1.318089000 -0.392135000 -0.409727000
C -1.911758000 1.010276000 -0.563120000
H -1.839500000 -1.030070000 -1.143140000
H -3.006951000 0.978538000 -0.489717000
H -1.551965000 1.705824000 0.203413000
H -1.662964000 1.438957000 -1.542881000
C 2.478992000 -0.501835000 -0.370910000
H 3.290958000 -0.355054000 0.350708000
H 2.500960000 -1.538453000 -0.721700000
168
Table C-6. Continued
x y z
H 2.687923000 0.148767000 -1.232551000
C -1.608445000 -0.969205000 0.965408000
H -2.689609000 -1.039422000 1.129199000
H -1.180606000 -1.972671000 1.070705000
H -1.198611000 -0.339439000 1.766320000
Cartesian Coordinates for the Decomposition Pathway of 34
Table C-7. Optimized Cartesian coordinates for the GS in the decomposition pathway of 34.
x y z
W -0.067248000 -0.008064000 -0.388760000
N -1.642957000 1.105042000 0.045514000
N 1.671227000 0.819473000 0.061673000
N -0.171659000 -1.838228000 0.347255000
N -0.066992000 -0.217436000 -2.054591000
C 2.852748000 0.891692000 -0.789796000
C 3.396580000 2.292229000 -1.017971000
H 2.589163000 0.433133000 -1.749039000
H 3.646591000 0.262072000 -0.345381000
H 4.238798000 2.264688000 -1.719403000
H 2.623752000 2.947240000 -1.437495000
H 3.761922000 2.747306000 -0.088978000
C 1.846221000 1.332515000 1.420247000
169
Table C-7. Continued
x y z
C 1.387502000 2.771511000 1.608907000
H 2.903890000 1.219496000 1.714308000
H 1.283086000 0.689953000 2.122837000
H 1.456725000 3.072716000 2.661882000
H 1.985243000 3.470218000 1.014869000
H 0.344211000 2.883743000 1.287840000
C 0.016960000 -1.992262000 1.784124000
C 1.411680000 -2.449896000 2.182153000
H -0.738499000 -2.693113000 2.181764000
H -0.199353000 -1.024000000 2.270131000
H 1.523938000 -2.479391000 3.272907000
H 1.621417000 -3.455675000 1.799446000
H 2.170172000 -1.770320000 1.771013000
C -0.135663000 -3.086057000 -0.416293000
C 1.177390000 -3.312493000 -1.147708000
H -0.957400000 -3.073844000 -1.144658000
H -0.339129000 -3.921471000 0.274122000
H 1.163243000 -4.260480000 -1.700048000
H 1.345186000 -2.501647000 -1.866523000
H 2.027916000 -3.331998000 -0.455154000
C -2.655637000 1.599757000 -0.888243000
170
Table C-7. Continued
x y z
C -3.479328000 0.496765000 -1.531379000
H -2.153674000 2.179541000 -1.674017000
H -3.311296000 2.303495000 -0.349251000
H -4.217578000 0.911849000 -2.228815000
H -2.821595000 -0.177333000 -2.093004000
H -4.013770000 -0.098350000 -0.780816000
C -1.985039000 1.256309000 1.454900000
C -3.143460000 0.384137000 1.911937000
H -2.204567000 2.317869000 1.668069000
H -1.090505000 1.018093000 2.058478000
H -3.320696000 0.492170000 2.988959000
H -4.071144000 0.655455000 1.393974000
H -2.936772000 -0.671914000 1.695995000
Table C-8. Optimized Cartesian coordinates for TS1 in the decomposition pathway of 34.
x y z
N 0.443912000 2.004221000 0.078815000
W 0.008708000 -0.085868000 -0.357667000
N -1.806691000 -0.795339000 -0.033645000
N 0.174648000 -0.167704000 -2.026082000
N 1.310936000 -1.400007000 0.361043000
171
Table C-8. Continued
x y z
H 1.462511000 1.091542000 0.313619000
C 1.837406000 -2.549405000 -0.358527000
C 2.994940000 -3.203320000 0.372961000
H 2.150588000 -2.246834000 -1.376620000
H 1.013892000 -3.265440000 -0.484677000
H 3.334435000 -4.101736000 -0.155381000
H 3.850083000 -2.520015000 0.446742000
H 2.705273000 -3.489418000 1.390959000
C 2.155906000 -0.215661000 0.427971000
C 2.808119000 0.015890000 1.778718000
H 2.889886000 -0.179770000 -0.395841000
H 3.228148000 1.027358000 1.869399000
H 2.083320000 -0.128394000 2.588034000
H 3.626081000 -0.697082000 1.948549000
C 0.626403000 2.952789000 -1.019288000
C 1.846596000 2.650452000 -1.864634000
H 0.738542000 3.954205000 -0.569854000
H -0.272695000 2.999027000 -1.658848000
H 1.967411000 3.414856000 -2.639890000
H 2.755924000 2.646724000 -1.249423000
H 1.759329000 1.678411000 -2.361196000
172
Table C-8. Continued
x y z
C -0.298539000 2.536784000 1.212074000
C -0.051993000 1.753026000 2.487404000
H -1.384943000 2.573218000 0.994157000
H 0.008939000 3.583668000 1.373542000
H -0.710605000 2.095838000 3.292906000
H -0.239953000 0.674358000 2.360819000
H 0.986147000 1.860489000 2.819615000
C -2.728765000 -1.292105000 -1.057306000
C -4.097696000 -0.631451000 -1.069033000
H -2.853319000 -2.380314000 -0.914575000
H -2.240373000 -1.151446000 -2.026296000
H -4.658644000 -0.946709000 -1.956658000
H -4.699692000 -0.901427000 -0.194048000
H -4.005129000 0.461113000 -1.096431000
C -2.214490000 -1.096197000 1.343013000
C -3.063021000 -0.025795000 2.015284000
H -1.304454000 -1.263022000 1.942852000
H -2.749264000 -2.061222000 1.347989000
H -3.216278000 -0.265468000 3.074888000
H -2.571050000 0.952709000 1.960417000
H -4.047316000 0.080806000 1.549890000
173
Table C-9. Optimized Cartesian coordinates for INT1 in the decomposition pathway of 34.
x y z
N 1.458719000 1.741576000 0.074687000
W 0.116965000 -0.081230000 -0.323258000
N -1.838247000 0.316145000 -0.148052000
N 0.492323000 -0.346032000 -1.945481000
N 0.303099000 -1.855819000 0.581211000
H 2.069387000 1.461434000 0.844946000
C 0.328132000 -3.130519000 -0.112690000
C 0.747021000 -4.257816000 0.813669000
H 1.009841000 -3.078509000 -0.984181000
H -0.676687000 -3.321079000 -0.516155000
H 0.745541000 -5.222439000 0.291772000
H 1.759852000 -4.086937000 1.200345000
H 0.070544000 -4.329398000 1.673611000
C 1.542313000 -1.196787000 0.829980000
C 1.867484000 -0.864061000 2.267213000
H 2.398768000 -1.612135000 0.273248000
H 2.708110000 -0.154912000 2.346148000
H 1.004884000 -0.411439000 2.779943000
H 2.150219000 -1.750001000 2.858658000
C 2.347770000 2.099694000 -1.065115000
C 3.400714000 1.046755000 -1.313786000
174
Table C-9. Continued
x y z
H 2.815672000 3.072355000 -0.838280000
H 1.707162000 2.230953000 -1.944211000
H 4.079860000 1.381388000 -2.104851000
H 4.003622000 0.865370000 -0.413264000
H 2.940840000 0.103881000 -1.623202000
C 0.669376000 2.906737000 0.544516000
C 0.099346000 2.647521000 1.919175000
H -0.127470000 3.082997000 -0.190550000
H 1.312962000 3.801070000 0.550860000
H -0.521774000 3.485386000 2.250646000
H -0.530213000 1.749197000 1.917139000
H 0.893689000 2.501359000 2.662107000
C -2.754833000 0.485911000 -1.275928000
C -3.735984000 -0.661991000 -1.451554000
H -2.142864000 0.586354000 -2.177738000
H -3.311163000 1.434104000 -1.166138000
H -4.326268000 -0.525322000 -2.364731000
H -3.197988000 -1.614554000 -1.532317000
H -4.441167000 -0.741650000 -0.615194000
C -2.507225000 0.185010000 1.143355000
C -3.383994000 1.370151000 1.516299000
175
Table C-9. Continued
x y z
H -1.734645000 0.030639000 1.913235000
H -3.107220000 -0.740835000 1.163800000
H -3.759406000 1.273542000 2.541445000
H -2.826860000 2.313346000 1.441953000
H -4.254644000 1.452122000 0.854689000
Table C-10. Optimized Cartesian coordinates for TS2 in the decomposition pathway of 34.
x y z
W -1.468998000 0.370679000 -0.286809000
N -0.200253000 0.694177000 -1.438317000
N -2.754645000 -0.861979000 -1.220715000
N -2.366031000 -1.054159000 1.714990000
N -1.958830000 1.957696000 0.800361000
H -3.370636000 -1.170095000 1.586955000
N 0.178962000 -0.128320000 1.016900000
W 1.506537000 0.098824000 -0.105860000
N 2.174970000 1.952249000 -0.481111000
N 3.011972000 -0.388378000 1.106269000
N 1.740434000 -1.434619000 -1.346616000
C 3.604754000 2.240673000 -0.456663000
C 4.087809000 2.789728000 0.875739000
176
Table C-10. Continued
x y z
H 3.833844000 2.960817000 -1.260115000
H 4.177554000 1.336300000 -0.710624000
H 5.156749000 3.037282000 0.842400000
H 3.539484000 3.699976000 1.147459000
H 3.929689000 2.054635000 1.672898000
C 1.376700000 3.120486000 -0.828741000
C 1.353081000 3.385409000 -2.325394000
H 1.762419000 4.002094000 -0.285859000
H 0.354775000 2.959711000 -0.475912000
H 0.763766000 4.281968000 -2.557698000
H 2.362082000 3.540873000 -2.729157000
H 0.901484000 2.529632000 -2.839523000
C 4.303862000 -0.843623000 0.625905000
C 4.686867000 -2.238804000 1.093290000
H 5.090369000 -0.124156000 0.925529000
H 4.282052000 -0.830732000 -0.473757000
H 5.641523000 -2.546509000 0.649406000
H 4.800158000 -2.283791000 2.182815000
H 3.920048000 -2.966785000 0.801470000
C 2.911043000 -0.270197000 2.562482000
C 2.187939000 -1.433111000 3.223442000
177
Table C-10. Continued
x y z
H 2.380205000 0.661988000 2.806071000
H 3.927145000 -0.162013000 2.979705000
H 2.128924000 -1.288702000 4.309740000
H 1.165849000 -1.498262000 2.830536000
H 2.690904000 -2.388255000 3.031103000
C 2.420535000 -1.182676000 -2.607873000
C 3.433711000 -2.257549000 -2.969633000
H 2.925439000 -0.204185000 -2.538573000
H 1.673575000 -1.068401000 -3.415605000
H 3.915926000 -2.037127000 -3.929200000
H 4.213954000 -2.340083000 -2.202460000
H 2.956786000 -3.241587000 -3.058665000
C 0.854007000 -2.589551000 -1.327327000
C 1.170554000 -3.552790000 -0.199198000
H 0.897968000 -3.109310000 -2.298215000
H -0.188654000 -2.235808000 -1.224335000
H 0.427133000 -4.359651000 -0.146283000
H 2.161608000 -4.005279000 -0.329956000
H 1.167275000 -3.020881000 0.762643000
C -2.139366000 -0.371453000 2.999363000
C -2.502784000 -1.155596000 4.247425000
178
Table C-10. Continued
x y z
H -2.700915000 0.569024000 2.946578000
H -1.077448000 -0.092870000 3.012290000
H -2.335492000 -0.544110000 5.142029000
H -3.557342000 -1.462608000 4.249913000
H -1.889481000 -2.059353000 4.354794000
C -1.742019000 -2.388426000 1.604509000
C -2.663551000 -3.548786000 1.926429000
H -0.848227000 -2.392426000 2.241754000
H -1.377183000 -2.500007000 0.572897000
H -2.146968000 -4.505766000 1.781028000
H -3.032853000 -3.519870000 2.958274000
H -3.536179000 -3.550245000 1.258468000
C -4.165876000 -0.926823000 -0.858533000
C -5.125557000 -0.410969000 -1.921249000
H -4.308221000 -0.315755000 0.043508000
H -4.448742000 -1.960420000 -0.580496000
H -6.140773000 -0.338695000 -1.514364000
H -4.818880000 0.586560000 -2.259048000
H -5.170726000 -1.065843000 -2.799021000
C -2.456440000 -1.496821000 -2.503408000
C -2.677451000 -3.002143000 -2.476440000
179
Table C-10. Continued
x y z
H -1.413948000 -1.272784000 -2.753951000
H -3.062766000 -1.050271000 -3.310456000
H -2.375836000 -3.460744000 -3.425802000
H -2.092826000 -3.468516000 -1.670366000
H -3.731417000 -3.258398000 -2.307142000
C -2.752184000 2.073267000 -0.369593000
C -2.504498000 3.195121000 -1.350442000
H -3.832981000 1.893967000 -0.213836000
H -2.855681000 4.167634000 -0.966323000
H -1.439934000 3.296407000 -1.594682000
H -3.034814000 3.009925000 -2.293407000
C -1.372327000 3.051561000 1.533337000
C -2.374816000 3.678241000 2.490402000
H -0.991769000 3.837148000 0.854804000
H -0.501238000 2.665822000 2.084806000
H -1.932978000 4.521815000 3.035272000
H -3.250408000 4.051230000 1.944033000
H -2.731247000 2.944643000 3.223811000
Table C-11. Optimized Cartesian coordinates for INT2 in the decomposition pathway of 34.
x y z
W -1.700647000 0.042307000 -0.002392000
180
Table C-11. Continued
x y z
N -0.597301000 0.163464000 -1.361579000
N -2.749013000 -1.631163000 0.075156000
N -2.360590000 1.722502000 0.807254000
N -0.080439000 -0.049378000 1.215746000
W 1.170374000 0.030010000 -0.066663000
N 1.657366000 1.767753000 -0.918118000
N 2.720325000 0.018473000 1.201983000
N 1.715357000 -1.668880000 -0.926160000
C 3.065801000 2.112650000 -1.081392000
C 3.599077000 3.022811000 0.012687000
H 3.198716000 2.591939000 -2.065976000
H 3.669832000 1.193064000 -1.123994000
H 4.647841000 3.289093000 -0.170226000
H 3.020699000 3.952944000 0.068591000
H 3.534161000 2.530627000 0.989940000
C 0.754359000 2.790687000 -1.431273000
C 0.602839000 2.729096000 -2.942145000
H 1.116383000 3.785209000 -1.117337000
H -0.225943000 2.653044000 -0.964734000
H -0.060335000 3.526295000 -3.301009000
H 1.566932000 2.846021000 -3.453835000
181
Table C-11. Continued
x y z
H 0.171672000 1.764048000 -3.229102000
C 4.065198000 -0.422200000 0.864338000
C 4.647339000 -1.463399000 1.808260000
H 4.744251000 0.452247000 0.826526000
H 4.036652000 -0.837454000 -0.152059000
H 5.635473000 -1.782786000 1.455969000
H 4.771167000 -1.073163000 2.824987000
H 4.001952000 -2.349266000 1.862370000
C 2.608572000 0.594365000 2.548366000
C 2.056948000 -0.374545000 3.580621000
H 1.951004000 1.473852000 2.499842000
H 3.599729000 0.968578000 2.858689000
H 1.983604000 0.109275000 4.562467000
H 1.053724000 -0.698163000 3.283684000
H 2.692091000 -1.261572000 3.685341000
C 2.011156000 -1.567062000 -2.353286000
C 3.345918000 -2.168833000 -2.760398000
H 1.978931000 -0.503724000 -2.636052000
H 1.188043000 -2.043946000 -2.917682000
H 3.518934000 -2.025907000 -3.832904000
H 4.175471000 -1.696181000 -2.218975000
182
Table C-11. Continued
x y z
H 3.387781000 -3.245712000 -2.560896000
C 1.657611000 -3.030789000 -0.426692000
C 1.023971000 -3.147369000 0.942710000
H 2.679536000 -3.452176000 -0.396422000
H 1.099909000 -3.652345000 -1.153526000
H 1.024793000 -4.192739000 1.272783000
H 1.567186000 -2.550524000 1.685484000
H -0.011577000 -2.785560000 0.937423000
C -3.914585000 -1.728887000 0.950164000
C -5.229525000 -1.865010000 0.200127000
H -3.938498000 -0.821837000 1.571938000
H -3.789854000 -2.571087000 1.651391000
H -6.076264000 -1.831575000 0.894823000
H -5.344641000 -1.050066000 -0.524654000
H -5.291685000 -2.813261000 -0.348022000
C -2.573117000 -2.744367000 -0.857775000
C -2.530049000 -4.108967000 -0.189045000
H -1.639103000 -2.565018000 -1.406306000
H -3.379612000 -2.733217000 -1.611015000
H -2.294076000 -4.885719000 -0.925467000
H -1.768454000 -4.142503000 0.599103000
183
Table C-11. Continued
x y z
H -3.492526000 -4.372621000 0.266422000
C -3.263366000 1.495494000 -0.267589000
C -3.260849000 2.430530000 -1.453884000
H -4.281311000 1.210837000 0.047458000
H -3.687549000 3.418027000 -1.210975000
H -2.246220000 2.594805000 -1.841545000
H -3.855995000 2.015456000 -2.276214000
C -1.841241000 3.011940000 1.199922000
C -2.801528000 3.723190000 2.139150000
H -1.652323000 3.654299000 0.320866000
H -0.869348000 2.851103000 1.689960000
H -2.412950000 4.705015000 2.436577000
H -3.774379000 3.876984000 1.655497000
H -2.970732000 3.128476000 3.043731000
Table C-12. Optimized Cartesian coordinates for Et2NH in the decomposition pathway of 34.
x y z
N 0.018477000 -1.012182000 -0.355004000
H -0.122257000 -0.811628000 -1.341918000
C 1.329226000 -0.534764000 0.058437000
C 1.569939000 0.971490000 0.045945000
H 2.069502000 -1.029495000 -0.585322000
184
Table C-12. Continued
x y z
H 1.511687000 -0.920891000 1.072394000
H 2.606917000 1.208885000 0.315158000
H 1.377140000 1.399350000 -0.946902000
H 0.920179000 1.489575000 0.762249000
C -1.113809000 -0.498779000 0.409837000
C -1.780182000 0.751345000 -0.149279000
H -0.764785000 -0.315879000 1.436589000
H -1.872327000 -1.293190000 0.491370000
H -2.648974000 1.045515000 0.453021000
H -1.094037000 1.605119000 -0.190947000
H -2.143435000 0.572161000 -1.170308000
Cartesian Coordinates for Cu2S and SnS2
Table C-13. Optimized Cartesian coordinates for Cu2S using M06L/LANL2DZ
x y z
S -1.343593000 -0.418388000 0.000000000
Cu 0.741293000 -1.073332000 0.000000000
Cu 0.000000000 1.304167000 0.000000000
185
Table C-14. Optimized Cartesian coordinates for SnS2 using B3LYP/LANL2DZ
x y z
Sn -0.000010000 -0.000125000 0.000000000
S 2.258008000 0.000195000 0.000000000
S -2.257979000 0.000195000 0.000000000
Cartesian Coordinates for SnSe2
Table C-15. Optimized Cartesian coordinates for SnSe2 using B3LYP/LANL2DZ
x y z
Sn 0.000000000 1.330905000 0.000000000
Se 1.317182000 -0.978394000 0.000000000
Se -1.317182000 -0.978819000 0.000000000
Table C-16. Optimized Cartesian coordinates for SnSe2 using M06L/LANL2DZ
x y z
Sn 0.000000000 0.000027000 0.000000000
Se 2.389902000 0.063093000 0.000000000
Se -2.389902000 -0.063133000 0.000000000
Cartesian Coordinates for Cu3Sn and Cu3Zn
Table C-17. Optimized Cartesian coordinates for Cu3Sn using B3LYP/LANL2DZ
x y z
Sn 0.000428000 0.000375000 -0.493676000
186
Table C-17. Continued
x y z
Cu -1.666878000 1.677290000 0.283708000
Cu -0.620667000 -2.281345000 0.283543000
Cu 2.286807000 0.603409000 0.283914000
Table C-18. Optimized Cartesian coordinates for Cu3Sn using M06L/LANL2DZ
x y z
Sn 0.077425000 1.121361000 0.050323000
Cu 2.120603000 0.336949000 0.092941000
Cu 0.134676000 1.420167000 0.102516000
Cu 2.119419000 0.176265000 0.096338000
Table C-19. Optimized Cartesian coordinates for Cu3Zn using M06L/LANL2DZ
x y z
Zn -0.486643000 0.000016000 -0.000659000
Cu -2.816502000 -0.000001000 0.000327000
Cu 1.659949000 -1.203326000 0.000178000
Cu 1.659977000 1.203310000 0.000178000
187
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BIOGRAPHICAL SKETCH
Arijit Koley was born in 1986, in West Bengal, India. He has always shown a keen
interest in science. His passion for chemistry started during his high school years because he felt
that in chemistry he can get answers at a molecular level. He followed his thrust in chemistry in
his undergraduate studies at R.K.M.V.C.C. in Kolkata where he learned the basics of chemistry
in a more intense form. He continued his studies by doing a master’s degree at IIT Kharagpur
where he was introduced to the broader aspects of chemistry. Challenging synthesis and wide
applications of organometallic chemistry intrigued him to undergo higher studies. He followed
his interest to pursue a PhD in University of Florida under the supervision of Prof. Lisa
McElwee-White where he synthesized organometallic precursors for applications in
semiconductor industry. He received his PhD from the University of Florida in the summer of
2016.