site-specific, cross-sectional imaging of biomaterials and the cell

5
Journal of Physics: Conference Series OPEN ACCESS Site-specific, cross-sectional imaging of biomaterials and the cell/biomaterial interface using focused ion beam/scanning electron microscopy To cite this article: H K Edwards et al 2008 J. Phys.: Conf. Ser. 126 012097 View the article online for updates and enhancements. You may also like Focused ion beam scan routine, dwell time and dose optimizations for submicrometre period planar photonic crystal components and stamps in silicon Wico C L Hopman, Feridun Ay, Wenbin Hu et al. - Liquid Crystal Alignment on Plasma Beam Scanned Alkylsiloxane Self-Assembled Monolayers K. Y. Wu, W. Y. Chen, C.-H. Wang et al. - Recent developments in micromilling using focused ion beam technology Ampere A Tseng - This content was downloaded from IP address 200.46.16.180 on 17/02/2022 at 16:52

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Journal of Physics Conference Series

OPEN ACCESS

Site-specific cross-sectional imaging ofbiomaterials and the cellbiomaterial interfaceusing focused ion beamscanning electronmicroscopyTo cite this article H K Edwards et al 2008 J Phys Conf Ser 126 012097

View the article online for updates and enhancements

You may also likeFocused ion beam scan routine dwell timeand dose optimizations for submicrometreperiod planar photonic crystal componentsand stamps in siliconWico C L Hopman Feridun Ay Wenbin Huet al

-

Liquid Crystal Alignment on Plasma BeamScanned Alkylsiloxane Self-AssembledMonolayersK Y Wu W Y Chen C-H Wang et al

-

Recent developments in micromilling usingfocused ion beam technologyAmpere A Tseng

-

This content was downloaded from IP address 2004616180 on 17022022 at 1652

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Electron Microscopy and Analysis Group Conference 2007 (EMAG 2007) IOP PublishingJournal of Physics Conference Series 126 (2008) 012097 doi1010881742-65961261012097

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Electron Microscopy and Analysis Group Conference 2007 (EMAG 2007) IOP PublishingJournal of Physics Conference Series 126 (2008) 012097 doi1010881742-65961261012097

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Electron Microscopy and Analysis Group Conference 2007 (EMAG 2007) IOP PublishingJournal of Physics Conference Series 126 (2008) 012097 doi1010881742-65961261012097

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Electron Microscopy and Analysis Group Conference 2007 (EMAG 2007) IOP PublishingJournal of Physics Conference Series 126 (2008) 012097 doi1010881742-65961261012097

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Electron Microscopy and Analysis Group Conference 2007 (EMAG 2007) IOP PublishingJournal of Physics Conference Series 126 (2008) 012097 doi1010881742-65961261012097

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Electron Microscopy and Analysis Group Conference 2007 (EMAG 2007) IOP PublishingJournal of Physics Conference Series 126 (2008) 012097 doi1010881742-65961261012097

4

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Electron Microscopy and Analysis Group Conference 2007 (EMAG 2007) IOP PublishingJournal of Physics Conference Series 126 (2008) 012097 doi1010881742-65961261012097

4