resistivity and seebeck measurements
DESCRIPTION
Resistivity and Seebeck measurements. Daniel Harada August 18 2010. I. Resistivity. R contact. R contact. R sample. R contact. R contact. R sample. Resistivity. Two-point probe. Four-point probe. Measures sample only. Measures sample + contact resistance + probe resistance. - PowerPoint PPT PresentationTRANSCRIPT
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Resistivity and Seebeck measurements
Daniel Harada
August 18 2010
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Resistivity
lAR
l
A
I
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ResistivityTwo-point probe Four-point probe
Measures sample only
I
I
V
I
I
V
Rcontact Rcontact
Rsample
VRcontact Rcontact
Rsample
I
V
I
I
Measures sample + contact resistance + probe resistance
In four-point probe, negligible current flows through the voltmeter, the only voltage drop measured is across Rsample.
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ResistivityTwo-point probe Four-point probe
Measures sample only
Rcontact Rcontact
Rsample
VRcontact Rcontact
Rsample
VMeasures sample + contact resistance + probe resistance
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Collinear Contacts
Typical pellet and contact sizes for collinear contacts
d s
t
D
d = 1 mm
s = 2 mm
t = 1-2 mm
D = 12.7 mm
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Collinear contacts
I
I
V
sIVs 2
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Collinear contacts
I
I
V
s FIVs 2
F corrects for sample thickness, sample diameter, edge effects, and temperature.
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Collinear contacts
For samples thinner than the probe spacing s, F can be written as a product of three independent correction factors.
321 FFFF
•F1 corrects for sample thickness
•F2 corrects for lateral sample dimensions
•F3 corrects for placement of probes near edges
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Collinear contacts
For non-conducting substrates:
For conducting substrates replace sinh with cosh.
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Collinear contacts
F11 is for non-conducting substrates
F22 is for conducting substrates
t/s for pellets ~0.75 - 1 F11 ~0.4 – 0.6
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Collinear contacts
For circular wafers of diameter D:
3)/(3)/(ln)2ln(
)2ln(
2
22
sDsD
F
D/s ~ 6
F2 ~ 0.8
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Collinear contacts
F3 accounts for contacts placed near sample edges
d/s ~ 1.7
F31 ~ 0.9
Parallel:
Perpendicular:
d/s ~ 3
F32 ~ 1
conducting substrates
non-conducting substrates
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Van der Pauw method
Van der Pauw found a method to determine the resistivity of an arbitrarily shaped sample subject to the following conditions:
a) the contacts are at the circumference of the sampleb) the contacts are infinitely small (point contacts)c) the sample has uniform thicknessd) the surface of the sample is singly connected, i.e., the sample does not have isolated holes
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Van der Pauw method
#1
#2 #3
#4
ab
cdcdab I
VR ,
fRR
t22ln
41,2334,12
41,23
34,12
RR
ff
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Van der Pauw method
f must satisfy the relation:
2]/)2exp[ln(arccosh
2ln41,2334.12
41,2334.12 ffRRRR
For symmetric contacts f = 1
34,122lntR
34,12532.4 tR
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Van der Pauw method
The previous equations were formulated assuming that contacts are point contacts. For contacts of finite size d on a circular disc of diameter D with d/D << 1, the percent increase in resistivity per contact can be found:
2
2
2ln41
Dd
van der Pauw, Philips
Research Reports 13 pg. 1-9
for d/D ~ 0.08 Δρ/ρ ~ -0.000559
total change for 4 contacts ~-0.224%
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Porosity Correction
Pressed pellets are generally not going to achieve full theoretical density, and thus will contain non-conducting pores which will increase the measured conductivity. Our cold pressed pellets are typically ~80% of theoretical density.
Two models that are used to correct for porosity are the Bruggeman Effective Media model, and Minimal Solid Area.
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Porosity Correction
The effective media model is discussed by McLachlan, Blaszkiewicz, and Newnham. For a pellet 90% dense or higher, it gives a correction factor of:
ff2311 2/3
where f is the volume fraction of spherical pores. At 90% dense this gives a correction of 0.85.
D. McLachlan, M. Blaszkiewicz, R. Newnham. Electrical Resistivity of Composites. Journal of the American Ceramic Society, 73 (8) 2187-2203 (1990)
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Porosity Correction
The Minimal Solid Area model was presented by Rice. It assumes that fluxes through a medium will be limited by the smallest cross sectional area they pass through. This model gives a correction of:
fbewhere b is a factor that depends on the type of pores contained in the medium.
R. Rice. Evaluation and extension of physical property-porosity models based on minimum solid area. Journal of Materials Science, 31 102-118 (1996)
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Porosity Correction
For spherical pores, b = 3, giving a correction factor of ~0.55 for 80% dense pellets. This model will give reasonable results for pellets ~70% dense and higher.
This is the model that will typically be used as our pellets are not dense enough to use the Bruggeman model.
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Resistivity Summary
Collinear contacts: Van der Pauw contacts:
FIVs 2
F1 ~0.4 – 0.6
F2 ~ 0.8
F3 ~ 0.9
34,12532.4 tR
Contact correction is negligible
All equations and plots taken from Semiconductor Material and Device Characterization Third ed. by D.K. Schroder, unless otherwise noted.
Porosity correction = e-3f
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Seebeck measurements
Thermoelectric effect: When a temperature gradient is maintained across a material, a voltage arises.
Seebeck effect: When two dissimilar conductors are joined together, and their junctions are held at different temperatures, a current flows.
TH TC
V≠0
TH TC
I
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Seebeck measurements
n-type material in thermal equilibrium:
- -- -
--
--
- --
-
nleft = nright
Tleft= Tright
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Seebeck measurements
apply a temperature gradient:
- -- -
--
--
- --
-
nleft > nright
Tleft> Tright
TH TC------ -
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Seebeck measurements
free carriers diffuse from high concentration to low, leaving a net charge:
+ ++ -
--
--
- --
-
nleft = nright
Tleft> Tright
TH TC+
+
E
-- -
-
-
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Seebeck measurements
VS
TH TCdTTSTSV
H
C
T
TCusampleS )()(
)()( CHCusampleS TTSSV
If S(T) does not vary much with temperature, then:
sampleCu SS TVS S
sample
+-
S should be negative for n-type materials