2011 Proceedings - Annual

Reliability and Maintainability

Symposium

(RAMS 2011)

Lake Buena Vista, Florida, USA

24 - 27 January 2011

4 IEEE IEEE Catalog Number: CFPllRAM-PRT

ISBN: 978-1-4244-8857-5

Table of Contents

Session 01C

2011RM0171

Bayesian Planning of Optimal Step-Stress Accelerated Life Test (1)Tao Yuan, Ohio University (United States); Xi Liu, Ohio University (United States)

2011RM0174

Degradation test plan for Wiener degradation processes (7)Julien Baussaron, RENAULT (France); Paul Schimmerling, RENAULT (France); Leo Gerville-

Reache, University ofBordeaux (France); Mihaela Barreau-Guerin, LASQUO (France)

2011RM0102

Reliability Growth Test Design; Connecting Math to Physics (13)Milena Krasich, Raytheon (USA)

2011RM0291

Pseudo-conju gated prior distribution for parametric ALT model (20)

Voiculescu Sorin, Bombardier Aerospace (Canada); Guerin Fabrice, LASQUO- University of

Angers, FRANCE. (FRANCE)

Session 01D

2011RM0024

Reliability Prognostics for Electronics via Built-in Diagnostic Tools (N/A)

Tongdan Jin, Texas State University (United States)

2011RM0078

Modelling Fault Propagation in Phased Mission Systems using Petri Nets (26)Rasa Remenyte-Prescott, University ofNottingham (UK); John Andrews, University of

Nottingham (UK)

2011RM0085

Condition Recognition of Complex System Based on Multifractal Analysis (32)

Yanqing Lui, State Key Laboratoryfor Manufacturing Systems Engineering, Xi'an Jiaotong

University, Xi'an, Shaanxi, China (China); Jianmin Gao, Manufacturing Quality and Systems

Engineering Institute, School ofMechanical Engineering, Xi'an Jiaotong University (China);

Jiang Hongquan, School ofMechanical Engineering, State Key Laboratoryfor ManufacturingSystem Engineering (China); Kun Chen, Xi'an Jiaotong University (China)

2011RM0031

Improving Software and System R&M with Better Error Processing (38)Nathaniel Ozarin, The Omnicon Group Inc. (United States)

Session 02C

2011RM0218

Mastering safety and reliability in a Model Based process (44)Robin Cressent, ENSI Bourges (France); vincent idasiak, prisme (france); frederic kratz, prismeensi de bourges (France); Pierre David, Heudiasyc (France)

2011RM0292

A Spreadsheet Tool for Managing Probabilistic Risk Assessment Data (50)

Gary Epstein, LockheedMartin Space Systems (usa); Michael Heckwolf, Reliability, Lockheed

Martin Space Systems (USA)

2011RM0113

Mitigating technical risks by creative problem solving approaches (56)Alexandra Ottong, Fraunhofer-Institutefor Production Technology IPT (Germany); Robert

Schmitt, WZL, RWTHAachen University (Germany); Hans Gut, MAN Turbo AG Schweiz

(Switzerland)

2011RM0089

AVAILABILITY GROWTH. MODELLING AND ASSESSMENT. (62)

ZigmundBluvband, ALD (Israel); Sergey Porotsky, ALD Software (Israel)

Session 02D

2011RM0037

Quantifying the Value of Risk-Mitigation Measures for Launch Vehicles (67)Elisabeth Morse, Valador, Inc. (United States); Joseph Fragola, Valador, Inc. (United States)

2011RM0064

Surviving the Lead Reliability Engineer Role in High Unit Value Projects (74)Reinaldo Perez, Jet Propulsion Laboratory (USA)

2011RM0076

Developing the Stockpile Reliability Program Plan for a New Missile (80)Eric Hunt, US Army Aviation and Missile Research, Development and Engineering Center

(USA)

2011RM0225

Creating an Expert System Risk Assessment Tool for Precursor Analysis (86)Anthony Hall, Information Systems Laboratories (USA)

Session 04C

2011RM0026

Reliability of Multi-State Systems subject to Competing Failures (90)LiudongXing, University ofMassachusetts Dartmouth (United States); Gregory Levitin, Israel

Electric Corporation; University ofElectronic Science and Technology ofChina (Israel)

2011RM0029

Reliability Growth Planning for Discrete-Use Systems (97)J. Brian Hall, U.S. Army Test and Evaluation Command (United States)

2011RM0243

Assessing Multi-Layered Social Networks using Reliability Models (103)Kellie Schneider, Univeristy ofArkansas (USA); Chase Rainwater, University ofArkansas

(USA); EdPohl, University ofArkansas (United States)

2011RM0284

System Reliability Models with Stress Covariates for Changing Load Profiles (108)AkiraHada, Rutgers University (USA); David Coit, Rutgers University (USA); MarkAgnello,US Navy (USA); Keith Megow, US Navy (USA)

Session 05C

2011RM0143

System Reliability Assessment as Components Undergo AcceleratedTesting (N/A)WeiLuo, National University ofDefense Technology (China); Chun hua Zhang, National

University ofDefense Technology (China); Xun Chen, National University ofDefense

Technology (China); Yuan-yuan Tan, National University ofDefense Technology (China)

2011RM0280

Reliability Assessments of HCPV Trackers (115)Jon Elerath, SolFocus (USA)

2011RM0175

Practical applications of Structural Reliability for mechanical Eng. (121)Julio Pulido, Ingersoll Rand (USA)

2011RM0147

Optimization of the Test Stress Levels of an APT (N/A)

Jingrui Zhang, (China); XiaoyangLi, Beihang University (China); Tongmin Jiang, Beihang

University (China); Zhengzheng GE, School ofReliabilty and system engneering, Beihang

University (China)

Session 05D

2011RM0129

Equipment Degradation Monitoring for Sustained Reliability (128)Edwin Vijay Kumar, VIZAG STEEL (India); SYAMSUNDARANNAMRAJU,

VISAKHAPATNAMSTEEL PLANT (INDIA); Sanjay Chaturvedi, Indian Institute ofTechnology

(India)

2011RM0193

Sensor Recovery for Robust Multivariate Condition Monitoring (135)Haitao Liao, The University ofTennessee (USA); Jian Sun, University ofTennessee (USA)

2011RM0267

Hybrid Causal Models for System Diagnostics (142)

Chengdong Wang, ASML (USA)

2011RM0194

Impact of Cartridge Performance on Weapon Reliability & Life Cycle Cost (146)

sandy sheng, ATEC (usa)

Session 06C

2011RM0177

Maintenance of wind turbine systems under continuous monitoring (151)

Zhigang Tian, Concordia University (Canada); Tongdan Jin, Texas State University (United

States)

2011RM0141

Mission Need-based System Supportability Objectives Determination (157)

Tailiang Song, Beijing Institute of Technology/University ofMassachusetts Dartmouth (China);

Liudong Xing, University ofMassachusetts Dartmouth (United States)

2011RM0170

Improving City Sustainability - RAMS Applied to Urban Rail Transit (163)Emil Vlad, Thales Rail Signalling Solutions Canada (Canada); Valeriy Tatarnykov, Thales Rail

Signalling Solutions (Canada)

2011RM0095

Developing Competency-Based Engineering Curriculum and Certifications (169)

Patrick Dallosta, Defense Acquisition University (United States)

Session 06D

2011RM0039

An Improved Modular Approach for Dynamic Fault Tree Analysis (175)

Olexandr Yevkin, Dyademlnt. (Canada)

2011RM0061

Designing Reliability Demonstration Testing for Repairable Systems (N/A)

HuairuiGuo, (USA); Haitao Liao, The University ofTennessee (USA); Athanasios

Gerokostopoulos, ReliaSoft (USA); Adamantios Mettas, (USA)

2011RM0188

Repairable System Modeling ofNatural Gas Transmission Networks (180)

James Parks, NiSource (USA); John Cox, NiSource (USA)

2011RM0135

Optimal Design of Repairable k-out-of-n Systems Considering Maintenance (186)Ramin Moghaddass, University ofAlberta (Canada); MIngJZuo, University ofAlberta

(Canada)

Session 07C

2011RM0186

Case Study ~ Risk Management for Medical Devices (Based on ISO 14971) (192)Vaishali Hegde, Philips Respironics (USA)

2011RM0263

Probabilistic Availability Risk Assessments without Simulation (198)Jan Smith, Independent Consultant (USA)

2011RM0073

Green Reliability (205)Mike Silverman, Ops A La Carte (USA)

2011RM0052

New Approach for Risk Analysis and Management in Medical Engineering (209)Thomas Zentis, Fraunhofer Institutefor Production Technology IPT (Germany); Robert

Schmitt, WZL, RWTHAachen University (Germany)

Session 07D

2011RM0144

Optimal Resurfacing Decisions for Road Maintenance: A POMP Perspective (215)Mariem Zouch, Ecole des Mines de Nantes /IRCCyN (France); Thomas Yeung, Ecole des Mines

de Nantes I IRCCyN (France); Bruno Castanier, Ecole des Mines de Nantes (France)

2011RM0197

Incorporating Repair Information into Maintenance Optimization Models (221)Elizabeth Lorna Wong, Centre for Maintenance Optimization & Reliability Engineering(CANADA); Andrew Jardine, University of Toronto (Canada); Dragan Banjevic, Centrefor

Maintenance Optimization & Reliability Engineering, Department ofMechanical & Industrial

Engineering, University (Canada)

2011RM0200

Data-Driven Approach for Imperfect Maintenance Model Selection (226)Yu Liu, University ofElectronic Science and Technology of China (United States); Hong-Zhong

Huang, University ofElectronic Science and Technology of China (China); Xiaoling Zhang,University ofElectronic Science and Technology ofChina (China)

2011RM0276

Comparison ofhigh-availability automation networks (234)Alban PERONNE, ALSTOM Transport Information Solutions (FRANCE); Pierre Dersin,

ALSTOM Transport Information Solutions (FRANCE)

Session 08C

2011RM0086

An approach to capture system interaction failures of a complex system (240)Manu Augustine, Malaviya National Institute ofTechnology (India); Om Prakash Yadav, North

Dakota State University (USA); Rakesh Jain, Malaviya National Institute ofTechnology (India);Ajay Rathore, Malaviya National Institute of Technology (India)

2011RM0125

A Method of Quantitative Analysis for Dynamic Fault Tree (246)

Zhang Hong-Lin, National University ofDefense Technology (China); Zhang Chun-Yuan,National University ofDefense Technology (China); Liu Dong, Academy ofEquipmentCommand & Technology (China); LiRui, National University ofDefense Technology (China)

2011RM0244

Degradation Analysis of Solar Photovoltaic Modules (252)RongPan, ASU (USA); Joseph Kuitche, ASU (USA); Govindasamy Tamizhmani, ASU (USA)

2011RM0281

Reliability of Wear-out Items in Electric Motors for Spacecraft (257)Jacob Burke, NASA GSFC (USA); John WEvans, NASA GSFC (USA)

Session 08D

2011RM0168

Field damage analysis (FDA) concept: analysis of complex damage causes (264)

Stefan Bracke, University ofWuppertal (Germany); Stephan Holier, Cologne University of

Applied Sciences (Germany)

2011RM0268

Case Study - Post Market Product Monitoring System (271)Vaishali Hegde, Philips Respironics (USA); Krishna Konakanchi, Philips Respironics (USA)

2011RM0213

A novel design of interval prediction for telemetry data (276)Tang Man, Beijing University ofAeronautics andAstronautics (China); Luan Jiahui, Beijing

University ofAeronautics andAstronautics (China); Liu Yalong, Beijing University ofAeronautics andAstronautics (China); Lu Chen, Beijing University ofAeronautics and

Astronautics (China)

2011RM0116

Trend analysis of the power law process with censored data (281)Sharareh Taghipour, Department ofMechanical & Industrial Engineering, University ofToronto (Canada); Dragan Banjevic, Centrefor Maintenance Optimization & ReliabilityEngineering, Department ofMechanical & Industrial Engineering, University (Canada)

Session 08E

2011RM0234

ASSESSING THE LIKELIHOOD OF RARE MEDICAL EVENTS IN ASTRONAUTS (287)Jerry Myers, NASA Glenn Research Center (USA); Beth Lewandowski, NASA Glenn Research

Center (USA); John Brooker, NASA Glenn Research Center (USA); Aaron Weaver, NASA Glenn

Research Center (USA)

2011RM0238

Predicting the Reliability of a Complex Military System of Systems (294)Carol Vesier, Army Test and Evaluation Command (USA); Angelo Christino, Army Test and

Evaluation Command (USA); Brian Hampton, Army Test andEvaluation Command (USA)

2011RM0016

A Quantitative Approach for Medical Device Health Hazard Analysis (298)Mingxiao Jiang, (United States); Kathy Herzog, (United States); Thomas Pepin, (United States);Mike Baca, (United States)

2011RM0107

Engine Fleet Reliability Data Management Optimization (303)John Gebhard, Rolls-Royce Corporation (United States); Jason Boschert, Rolls-RoyceCorporation (United States)

Session 09C

2011RM0126

AnAPT Data Evaluation Method of SLD Based on Bavesian Theory (N/A)Lizhi Wang, Beihang University (China); Xiaoyang Li, Beihang University (China); Tongmin

Jiang, Beihang University (China); Junbo Wan, Beihang University ( China)

2011RM0204

CSADT Life prediction based on DAD using time series method (309)// wang, Beihang University ( China); XiaoyangLi, Beihang University (China); Tongmin Jiang,

Beihang University (China)

2011RM0270

A Study of Scaling Effect on DRAM Reliability (315)Jin Qin, University ofScience and Technology ofChina (P R China); Mark White, JPL (USA);

Joseph Bernstein, Bar-Ilan University (Israel)

2011RM0162

Optimal Design for Step-Stress Accelerated Degradation Testing Based on D-Optimality (N/A)Zhengzheng GE, School ofReliabilty and system engneering, Beihang University (China);Xiaoyang Li, Beihang University (China); Tongmin Jiang, Beihang University (China); Tingling

Huang, Beihang University (China)

Session 09D

2011RM0121

Allocating Redundancy for Optimal System Reliability and Series MTBF (321)

Meng-Lai Yin, Cal Poly Pomona (USA); John Angus, Claremont Graduate University (USA);

Rafael Arellano, Raytheon Company (USA)

2011RM0181

Software Reliability Model with Bathtub-shaped Fault Detection Rate (327)

Lance Fiondella, University ofConnecticut (USA); Swapna Gokhale, University ofConnecticut

(USA)

2011RM0187

FaRBS; a New PoF Based VLSI Reliability Prediction Method (333)Jin Qin, University ofScience and Technology ofChina (P R China); Hava Avshalom, Motorola

(Israel); Joseph Bernstein, Bar-Ilan University (Israel)

2011RM0206

Condition Diagnosis with Complex network based Time Series Analysis (339)Pan Jiacheng, (China); Jiang Hongquan, School ofMechanical Engineering, State Key

Laboratoryfor Manufacturing System Engineering (China); Jianmin Gao, Manufacturing

Quality and Systems Engineering Institute, School ofMechanical Engineering, XVan JiaotongUniversity (China); Yang Peilin, Mechanical Engineering,State Key Laboratoryfor

Manufacturing System Engineering (China)

Session 11C

2011RM0068

Planning a Reliability Growth Program Utilizing Historical Data (N/A)

Larry Crow, CRR (USA)

2011RM0074

Birnbaum Importance in Solving Component Assignment Problems (345)

XiaoyanZhu, University ofTennessee (United States); Qingzhu Yao, University of Tennessee

(United States); WayKuo, City University ofHong Kong (Hong Kong)

2011RM0067

Special Topics for Consideration in a Design for Reliability Process. (351)

Georgios Sarakakis, ReliaSoft (USA); Athanasios Gerokostopoulos, ReliaSoft (USA);

Adamantios Mettas, (USA)

2011RM0196

Reliability Engineering As a Practical Application to Improving System Performance

Concept to System Retirement (357)Sean Carter, NASA JSC (USA)

— From

Session 11D

2011RM0065

Aviation Safety Analysis Based on Man-Machine-Environment Coupling (363)Jin Tian, (P.R.China); Ting di Zhao, (P.R.China); YangWu, (P.R.China); Xiaoyun Wang,(P.R.China)

2011RM0211

An Optimization Approach for Safety Instrumented Systems Design (370)Konstantin Machleidt, University ofKaiserslautern (Germany); Lothar Liiz, Institute ofAutomatic Control, University ofKaiserslautern (Germany)

2011RM0283

Human Rating of Launch Vehicles: Historical and Potential Future Risk (376)Joseph Fragola, Valador, Inc. (United States); Benjamin Franzini, Valador, Inc. (USA)

2011RM0032

Analyzing Interconnection Design Safety Using Bent Pin Analysis (382)Nathaniel Ozarin, The Omnicon Group Inc. (United States)

Session 1 IE

2011RM0212

Modeling Damage in Large/Heavy Electronic Due to Dynamic Loading (388)Ed Habtour, US Army material Systems Analysis Activity (USA)

2011RM0002

The Web-Accessible Repository of Physics-based Models (WARP) (394)

2011RM0180

Environment-Provoked Early Failures of Mass-Produced Complex Electronics (400)David Verbitsky, Aerotek (USA)

2011RM0248

Soft Error Trends and Mitigation Techniques in Memory Devices (407)Charles Slayman, Ops A La Carte (USA)

Session 12C

2011RM0034

Reliability Growth and the Caveats of Averaging: a Centaur Case Study (412)Elisabeth Morse, Valador, Inc. (United States); Joseph Fragola, Valador, Inc. (United States);Blake Putney, Valador, Inc. (United States)

2011RM0124

Reliability Predictions to Support a Design For Reliability Program (419)Lori Bechtold, Boeing (USA)

2011RM0081

Dynamic Fault Tree Analysis based on the structure function (423)Guillaume Merle, LURPA, ENS Cachan (France); Jean-Marc Roussel, LURPA, ENS Cachan

(France); Jean-Jacques Lesage, LURPA, ENS Cachan (France)

2011RM0176

Advanced Models for Software Reliability Prediction (429)Zigmund Bluvband, ALD (Israel); MICHAEL TALMOR, RAFAEL Ltd (ISRAEL); SergeyPorotsky, ALD Software (Israel)

Session 12D

2011RM0269

Integrated Developmental/Operational Testing To Evaluate Reliability (434)Jane Krolewski, RAMDirectorate, Army Evaluation Center, ATEC (USA); Richard Sullivan,RAMDirectorate, AEC, ATEC (USA); Beth Harpel, Manuever Ground Evaluation Directorate,AEQ ATEC (USA)

2011RM0241

Modeling The Gain Due To Maintenance Over Transformer Lifespan (438)

JeanAUPIED, EDF-R&D (France); Anne BARROS, UTT (France); Yacine GUESSOUM, EDF

R&D (France); Antoine Grail, Troyes University ofTechnology (France)

2011RM0275

Reliability and Maintainability in Photovoltaic Inverter Design (444)Janet Ma, Schneider electric (Canada); Spyros Thomas, Schneider electric (canada)

2011RM0098

A Practical Method for Reliability Analysis of Fhased-Mission Systems (449)

SuprasadAmari, Parametric Technology Corporation (USA)

Session 13C

2011RM0036

The Art & Practice of Tracking DFMEA Failure Modes Over Time (455)

Gary Wasserman, Wayne State University (United States)

2011RM0062

Using FMECA to Design Sustainable Products (460)Richard Herman, Raytheon Technical Services Company LLC (USA); Keith Janasak, Raytheon

Space andAirborne Systems (USA)

2011RM0083

Model-driven Automated Software FMEA (466)NealSnooke, Aberystwyth University (UK); Chris Price, Aberystwyth University (UK)

2011RM0133

Risk Assessment Using Design Review Based on Failure Mode (DRBFM) (472)Roland Schmidt, ABB SwitzerlandLtd (Switzerland); Gemot J. Riedel, ABB Switzerland Ltd.

(Switzerland); Klaus Kangas, ABB Oy Drives (Finland)

Session 13D

2011RM0130

Equipment Health Management through Information Fusion for Reliability (478)Edwin Vijay Kumar, VIZAG STEEL (India); Sanjay Chaturvedi, Indian Institute ofTechnology(India)

2011RM0239

Impact of Information on the quality of a Prognostic Indicator (486)Ariane Lorton, EADS (FRANCE); Antoine Grail, Troyes University ofTechnology (France);Mitra Fouladirad, University ofTechnology ofTroyes (France)

2011RM0252

Materiel Availability Modeling and Analysis for a Complex Army System (492)Dennis Anderson, Sandia National Laboratories (USA); Matthew Hoffman, Sandia National

Laboratories (USA); Jeffrey Martin, US Army, CASCOM, Force Development Directorate

(USA); David Gunther, US Army, PEO Integration, Logistics Integration (USA)

2011RM0119

Optimal Spares Analysis for a Networking Systems Manufacturer (498)DanielJacob, PTC (USA); Duane Huffman, PTC (USA); Ryan Crytzer, PTC (USA)

Session 14C

2011RM0055

Spare Provisioning for Repairable Systems under Fleet Expansion (502)Loon Ching Tang, Dept oflSyE, National Univ ofSingapore (Singapore); Xiao Liu, National

University ofSingapore (Singapore)

2011RMO013

Lithium Battery Analysis:Probability of Failure Assessment (507)Travis Moebes, SAIC (United States)

2011RM0060

Optimized Acoustic Microscopy Screen for Multilayer Ceramic Capacitors (512)Andrew Kostic, The Aerospace Corporation (USA); Stanley Schwartz, Lockheed Martin SpaceSystems (USA)

2011RM0250

Modeling Science Objectives within a Probabilistic Risk Assessment (516)Clayton Smith, Johns Hopkins University Applied Physics Laboratory (USA); Kristen Fretz,

Johns Hopkins University Applied Physics Laboratory (USA); Melissa Jones, Johns HopkinsUniversity Applied Physics Laboratory (USA); Sanae Kubota, Johns Hopkins University AppliedPhysics Laboratory (USA)

Session 14D

2011RM0112

Achieving Reliability Goals for an EFV LRU through Laboratory Testing (522)NeilLoychik, General Dynamics Land Systems (USA); John Pan, Curtiss Wright Controls

Electronic Systems (USA); Erwin Mercado, Curtiss Wright Controls Electronic Systems (USA)

2011RM0242

Warranty cost optimization in the bidding process and during operation (528)Gisela Lanza, Karlsruhe Institute ofTechnology, wbk Instiute ofProduction Science (Germany);Patrick Werner, Karlsruhe Institute ofTechnology, wbk Institute ofProduction Science

(Germany); Benjamin Behmann, Institute ofProduction Science (wbk)- Karlsruhe Institute of

Technology (KIT) (Germany); Dominic Appel, Karlsruhe Institute of Technology, wbk Institute

ofProduction Science (Germany)

2011RM0203

Reliability Estimate of Mobile Agent System for QoS MANET Applications (533)CHANDREYEE CHOWDHURY, Jadavpur University (India); SARMSTHA NEOGY,

Jadavpur University (India)

2011RM0035

Improvements In Estimating Software Reliability From Growth Test Data (N/A)DavidDwyer, BAE Systems (United States)

Session 99

2011RM0017

Reliability Analysis of Warm Standby Systems using Sequential BDD (539)OlaTannous, University ofMassachusetts Dartmouth (United States); Liudong Xing, UniversityofMassachusetts Dartmouth (United States); Joanne Dugan, (United States)

2011RM0071

A Systematic Fault Root Causes Tracing Method for Process Systems (546)Xinlin Huang, State Key Laboratoryfor Manufacturing Systems Engineering, XVan Jiaotong

University (China); Jianmin Gao, Manufacturing Quality and Systems Engineering Institute,

School ofMechanical Engineering, Xi'an Jiaotong University (China); Jiang Hongquan, School

ofMechanical Engineering,State Key Laboratoryfor Manufacturing System Engineering

(China); Kun Chen, Xi'an Jiaotong University (China)

2011RM0096

PRA as a Design Tool (553)Diana DeMoit, (US)

2011RM0108

Software Reliability Accelerated Testing Method Based on Test Coverage (N/A)

shuanqi wang, Beihang University, China (China); Yumei Wu, Beihang University (China);

Minyan Lu, School ofreliability engineering and system ofBeihang University (China); HaifengLi, Beihang University, China (China)

2011RM0115

Fault Tree Analysis Using Stochastic Logic; A Reliable and High Speed Computing (557)Hananeh Aliee, Amirkabir Univ. ofTech. (IRAN); HamidR. Zarandi, Amirkabir Univ. ofTech.

(IRAN)

2011RM0185

Evaluating down time and maintenance time in communication networks (563)

Tatsuya Matsukawa, Nippon Telegraph and Telephone Corporation (Japan); HiroyukiFunakoshi, Nippon Telegraph and Telephone Corporation (Japan); Kohjun Koshiji, NipponTelegraph and Telephone Corporation (Japan)

Additional Paper

Best Practices Methods for Robust Design for Reliability with Parametric Cost Estimates (569)

E. Andrew Long, Dmitry Tananko