new testing resources gary varner some resources in hawaii experience from developing integrated...
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New Testing ResourcesGary Varner
Some resources in Hawaii Experience from developing integrated
readout systems
6-OCT-2010 Electronics GPC Review
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ContextAccess to multi-project infrastructure
(radio-neutrino, x-ray FEL, Super KEKB upgrade…)
• Test beamline in Watanabe Hall commissioned this fall• intense flux, ~1ps timing
• Access to an array of high quality test equipment• Expect Hawaii to play an expanded test/characterization role
• ASIC input coupling studies• System timing performance• Integrated detector results
• Key deliverable: papers for students and postdoc
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Bremsstrahlung x-ray source: UH FEL
Target:Thin Cu foil
1 mil
VacuumAl Exit
Window
5 mil10 mil polyethylene
Helium filled transport line
~15”
Air Plas
tic c
over
`Ac
tive
Si
Bulk
Si
1mm 2.4um
300 um
Carr
ier
FR-4
(PCB
)
62.5 mil200 um
First x-rays: September 2010!!!
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FEL = very tight bunch specs ~ 1ps timing probeTarget:Thin Cu foil
1 mil
VacuumAl Exit
Window
5 mil10 mil polyethylene
Helium filled bag/volume
~15”
Air Plas
tic c
over
`Ac
tive
Si
Bulk
Si
1mm2.4um?
300 um
Carr
ier
FR-4
(PCB
)
62.5 mil200 um
Ebeam = 40MeV200mA e-
Macropulse
BaF2
radi
ator
10 mil BaF2
SinglePulse
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Readout for FEL x-ray beamline
Detectors
ASICs
Front-endModule
MasterModule Giga-bit
Fiber links
cPCI crate (control room)
NewcardCPU
X-rays
Master module
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Front-end Electronics studies
J-F Genat, G. Varner, F. Tang, H. FrischNIM A607 (2009) 387-393.
G. Varner and L. RuckmanNIM A602 (2009) 438-445.
1GHz analog bandwidth, 5GSa/s Simulation includes detector response
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Another exampleDetailed input characterization
• ANITA and Askaryan Radio Array (south pole) require high quality RF electronics characterization equipment:
• 8 GHz, high sensitivity Network analyzers
• Noise figure meters• TDR• Fast impulse generators
In addition to piLas and other resources mentioned previously
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SummaryThere is a HUGE amount of firmware and readout
software development work still
• Use overlap with other projects to bring additional resources to bear• Exploit existing capabilities for detailed characterization and insight into ways to improve ASIC/system performance• Both xFEL commissioned and new test equipment since last GP Review