Nanonics RenishawNSOM/Raman Combination12.01.2003

Nanonics NSOM/SPM Systems Are The Only Scanned Probe Microscopes :

Capable Of Being Integrated With• Renishaw Standard microRaman Systems which,

like all microRaman systems, are generally based on upright microscopes which are preferred for their high light throughput

Capable Of Being Used to Obtain: • Patented Shadow NSOM RamanTM & Scattering

NSOM RamanTM Combined with Photon Tunneling Capable Of Being Configured to Be Used Also With: • Infrared Microscopes & SEMs, TEMs & FIBs

WHY?

Nanonics RenishawNSOM/Raman Combination12.01.2003

Probe

Lens

Standard SPM Technologyis not

microRaman, Optical or Electron/Ion Beam Friendly From The Top or Bottom or Both

Sample

Cylindrical Piezo

Nanonics RenishawNSOM/Raman Combination12.01.2003

• >20 mm clear optical axis

• 7 mm thin scanner

• mms of rough scanning and >70 micron of fine scanning in X, Y and Z directions

All Nanonics SPM Technology is microRaman & Optically & Electron/Ion Beam Friendly

The Award Winning

NSOM/SPM-100

ConfocalTM World of

Integrated Imaging

Fiber AFM Probes

3D Flat ScannerTM

1996 Photonics Circle of Excellence Award

Nanonics RenishawNSOM/Raman Combination12.01.2003

Tip & Sample Scanning

3D Flat Scanners

3D Flat Scanning Technology Permits SPM Possibilities Not Previously Achievable

All Nanonics’ Systems have the Hallmark

of a Free Optical or Electron/Ion Optical Axis

They also permit new avenues of flexibility

both in terms of SPM instrumentation and probes

Nanonics RenishawNSOM/Raman Combination12.01.2003

Standard Silicon Cantilevers

Cantilevered Protruding Tip

Optical Fiber Probes

Nanonics’ Provides the Only Systems Completely Compatible with Any Available SPM Sensor

Deep Trench Probe

Cantilevered Nanopipettes for

Gas & Liquid Chemical Delivery

0 V

Cantilevered Multichannel & Multiwire Glass

Probes

70 V

Cantilevered Nanoparticle

Probes

Nanonics RenishawNSOM/Raman Combination12.01.2003

Nanonics Systems are the Only SPMs that Allow for Transparent Integration of The Previously Separate Worlds of Raman and SPM

2002 Photonics Circle of Excellence Award

Nanonics RenishawNSOM/Raman Combination12.01.2003

Renishaw & Nanonics Provides For Full Integration of Instrumentation,

Software & Photonic Signals

What new possibilities does this combination

permit?

Nanonics RenishawNSOM/Raman Combination12.01.2003

Shadow NSOM RamanTM Can Only Be Performed by the Complete Renishaw/Nanonics Integration

•Raman Spectroscopy with CCD detection is ideal for difference spectroscopy•Nanonics has produced AFM sensors with an opaque nanoparticle exposed to the optical axis

•Shadow NSOM Uses the Best Attributes of the Renishaw miroRaman with the Nanometric Positioning Ability of an On line AFM

Lens Lens

Nanonics RenishawNSOM/Raman Combination12.01.2003

Scattering NSOM RamanTM Can Only Be Performed by the Complete Renishaw/Nanonics Integration

• Only the complete integration that Renishaw and Nanonics Provides allows for Evanescent Field NSOM RamanTM

• No fiber connection or software connection allows for such measurements

LensLens

Nanonics RenishawNSOM/Raman Combination12.01.2003

In addition to these New Modalities of NSOM/Raman Only a Fully Integrated Raman/AFM Allows Integrating AFM & Raman Imaging

•Correlate, As in the AFM Image & Spectra Above, Silicon Strain with Topographical Position in a NanoIndentation

•Correlate Carbon Nanotube AFM Topography and Electrical Properties with Raman Signature Bands

•Correlate Protein Pulling with Amide I and Other Vibrational Modes

•Correlate Polymer Elasticity and Other Mechanical Properties with Vibrational Frequency

Nanonics RenishawNSOM/Raman Combination12.01.2003

Viewing the AFM sensor on- line in a

SEM

All Nanonics Platforms Allow The Integration of the Worlds of Electron and Ion Optics

with SPM Another First for Nanonics

Nanonics Sample ScanningObstruction Free

SPM Platform