MIXED SIGNAL TEST SYSTEM

www.itest.fr

Front side

Back side

New CPU BE718 with 4 interfaces :- RS232 & RS422 Lan- GPIB- Ethernet 10/100M TCP/IP- USB 2,0And improved recording capabilities...

A MODULAR TEST SYSTEM ...

The BILT system is supplied as a 19"/4U chassis, with 13 modular positions. The 'Tiny' table-top version offers 8 positions.

The most popular modules supply high-performance power at low and medium wattages (up to 120W). A complete range of supplementary modules is also available, which can be used for temperature control and measurement, pattern generation, relay commands, micro-ammeter measurement, etc.

Bilt can meet any requirements involving a large number of power or measurement channels.

High quality monitoring

Stress monitoring, equipment testing and characterization of components: just a few of the many areas where monitoring reliability is critical.

Bilt guarantees quality signal generation and accurate feedback measurements and offers numerous ways of memorising and plotting measurement changes over time. The accuracy of Bilt's multi-range power modules is close to that of a multimeter, over a wide operating range stretching from, for instance, 4µA to 4A for the same module, with typical precision of 0.05% in the actual range of amperage!

Using either EasyStress, our PC software designed for stress testing (burn-in or life-test), or your GPIB(or LAN or USB...)/SCPI system, you can control your signals in real time and view plots of your changing parameters in a simple and reliable way.

A secured signal

The Bilt system guarantees the security not only of connected components or equipment, but also of the system itself.

What happens when the mains power supply is turned on or is interrupted, whether deliberately or by accident, is always under control. Therefore, the power modules have output short-circuit relays which guarantee that there are absolutely no output spikes during these phases. In addition, in the event of a mains power cut-off, an emergency supply system enables the planned shutdown sequence to take place and the hour and date to be saved in non-volatile memory.

Most sources also offer protection from overvoltage, in the form of an ultra-fast circuit which instantaneously protects both the source and the output from accidental overvoltage. A special device also provides effective protection for the user when working with high voltage sources.

From a software perspective the modules provide a predetermined rise and fall time, programmable measurement thresholds which can be used to shut down groups of modules, potential power supply sequencing, etc.

Primary power supplyDimensioned according to the application

CPURS232/422 – GPIB – TCP/IP – USB Interfaces SCPI Commands Modules settings and tests results keep in permanent memory

13 modular positions

Operational adaptability and flexibility

The 13 modular positions, the wide variety of products in the catalog and the wide operating range of most modules are key factors behind the system's flexibility. However, each test bench is specific. The structure of our company and the way in which our products have been designed enable us to quickly respond to any request for a new study or to adapt an existing module for a particular application. This in fact has already led to the development of specialised modules for laser diode testing, battery charging and discharging, brownout detection and measurement, specific serial protocol management, etc.

Concerning the software, the easy-to-use SCPI language means that an integrator can use the Bilt instruments in standard environments such as Vee®, LabView®, etc.For component testing, our software products allow for various configurations with built-in flexibility. Accordingly, EasyStress can control stress tests via an array of Bilt racks, whereas EasyReport can plot component characteristics with Excel® spreadsheets. In addition, iTest is developing special user-friendly software to enable on-site industrial stress tests.

Distributed control

Bilt software is designed around the group principle. Whether for controlling a piece of equipment, a component or a set of components, the modules are linked together to facilitate coordination and test sequence monitoring and parameterisation.This approach is reinforced by using EasyStress software for stress testing: the hierarchical organization into Session/Chassis/Group provides an easy-to-read display for systems which may contain as many as several hundred modules. Different sessions may be declared, each focusing on a particular type of test (burn-in boards, components or items of tested equipment). The corresponding group configuration can then easily be saved, copied, propagated, etc. The same structure also allows for easy control of synchronized start/stop sequences and retrieval of test results (history, memory plot) for a group, a chassis or an entire test session.

The PC here is only used as a terminal, with the entire test being controlled and memorised by the chassis CPUs. The test is thus protected from any PC crashes or mains power failures.

TYPICAL STRUCTURE OF A STRESS TEST BENCH:

Network

Data from chassis to the PC:Real time status Log and memory files at end of test.

Componentsequipments,

burnin board...

Data from the PC to the chassis Start configuration Start/stop control

Chamber or unit for stressing components(Oven, heating/cooling socket, vibrating chamber…)

Bilt rack CPU with clock and memory save Monitors autonomouslythe groups of instruments and their memories.

Group of instruments managing in a consistent way any equipmentcomponent or set of component been tested . Using EasyStress the operator can very easily : - Create a group by associating several modules - Configure modules parameters (current, voltages, etc)- Create sequences between modules (Start/Stop delay)- Program thresholds on measurements to stop the group if necessary.- Create memories for plotting measurement drifts throughout the test duration .- Assign a time limit for the test to the group.;- Consult the time tag log book of starts/stops alarm and mains cut-offs…

PC software designed for stress testing

The 'Cycling' and 'Macros' options enable intermittent or sequential testingfeatures to be added to the software.

Click on left to selectan object

The « list » part givesinformation on the objectclicked on at the right inthe « tree » part

Right click to open thecontextual menureferenced to the objectselected here in this case thegroup.

Module « properties »sheet.Depending on each type of moduleit groups together all of themodule’s configuration parameters.

Memories : For most modules you can declare memoriesof the ROLL and INFINITE type with the “Sample” or“Envelope” options for any kind of measurementINFINITE type memories are automatically compressedwhile keeping when necessary the consistence of theenvelope. You may thus retrieve the plot of ameasurement over 1000 hours with an envelope whosesampling frequency is 1kHz !

The « list » part givesinformation on the objectclicked on at the right inthe « tree » part

Export your curves in the form oftext files which can be easily used byoffice software or copy them in thepress book for directly inserting themin your documents.

BILT & EasyStress: Burn-in/Life-test Applications: Examples:

The system's modularity, at both the equipment and software levels, covers a variety of requirements in terms of size and technical constraints. Three practical examples show how Bilt systems can be applied to component burn-in:

Burn-in test for 3x3 test vehicles, in a micro-oven at three different temperaturesThe test bench consists of three Bilt chassis, a PC running EasyStress, three micro-ovens (from the iTest catalog), wiring and a high-temperature PCB adapted for the component being tested. This system enables the burn-in of different currents to be plotted very precisely. Due to the wide scope of the multi-range Bilt sources and programming flexibility in the software, users can adapt their test benches for each new component at a competitive cost with a short lead time: in most cases, only the printed circuit in the oven needs redesigning, which can either be done internally or subcontracted to iTest.

Without changing the burn-in configuration, the EasyReport software package can plot detailed characteristics for the components at any time during the test. Qualification measurements can thus taken directly on the burn-in test bench, without needing to remove any parts.

Burn-in of production componentsThis system consists of an array of 20 Bilt chassis, each controlling a specially-converted oven which can hold three burn-in boards each accommodating four components. The test simply involves polarizing the components. The order in which the various power supplies come and go is programmed in order not to stress the components during the on/off phases. The system's parameters are initialized using EasyStress but routine use requires dedicated software, developed by iTest and adapted for each customer, which enables on-site industrial production tests using simple, well-established procedures.

This assembly is much more flexible than conventional industrial stress test systems which use a large number of parallel channels. Tests can be offset (one set of boards can be loaded while others are undergoing tests, different components can be tested on the same system, etc), while at the same time offering simple and reliable control and cost-effectiveness.ITest also adapts industrial ovens (such as Héraeus, Despatch, etc), with feed-through slots and stainless steel board trays.

Burn-in of production complex devices/equipmentThis example is of the burn-in of a medical imaging component. 1,800 parts can be stressed simultaneously. They all receive 18 digital signals, at a frequency of 8 MHz, five analog polarisations and three different power voltages. The parts are only connected in parallel in small batches of ten. The test patterns can be easily edited or modified using Excel® (with dedicated files/macros), then reloaded into the generators (BE832/IT832).As a supplement to this test bench and following customer specifications, iTest designed and produced a parametric test bench for the same components, also using a Bilt unit with several power supplies and a pattern generator. The burn-in boards are systematically subjected to this test bench before and after the burn-in test. An E²prom on the boards memorizes the test parameters and stages. The entire test is carried out on-site by the customer's personnel.

BILT: Applications for GPIB/SCPI instruments Examples:

Modular power supply system, easily programmed, for reliable rereading of current and voltage measurements.The advantages of Bilt equipment as GPIB instruments, regularly asserted by Bilt users are as follows: Ease of programming:

('intuitive' SCPI commands).

Highly accurate settings and measurements, makes rereading with a multimeter unnecessary.

The wide range covered by the multi-range sources (for example: a few tens of nA to 4A in ten ranges for the BE510S), provides maximum flexibility.

The ability to secure start/stop operations, by declaring groups of instruments with inter-instrument start/stop delays.

The photograph opposite shows a Bilt unit which has been integrated into the characterization bench of a microwave device, developed in Vee® for space applications. The device, which is extremely expensive, requires

guaranteed coordinated start/stop sequences for its various power supplies, as well as noise-free signals. The software directly uses the Bilt power supply measurements to characterize the current consumed by the microwave equipment.

Pattern generation, protocols, complex interfaces, etcThe photograph opposite shows a serial protocol generation module, used in military/space equipment and developed according to customer specifications.Using the generic BE810 module (processor/FPGA/standard software) as the basic configuration enabled design costs to be limited to software, FPGA core and daughterboards (for conditioning output signals) which were designed specifically for the application. The final module is as much a finished product as any in our catalog, complete with documentation and SCPI commands. Its integration into a GPIB test bench is straightforward. The cost of duplicating the module is much cheaper than that of using a generic GPIB instrument for generating the same protocol. The customer can thus use the same module for numerous internal test benches with LabView®, as well as for an equipment stress test bench, with EasyStress.

More generally, the BE832/IT832 pattern generation assembly provides the test bench integrator with a powerful and flexible tool for generating digital signals up to 100Ms/s.

BILT: special test benches Examples:

Battery charging/discharging, brownout detection/measurement, laser diode testing, etcSome stress test benches require more specific development. In this case, the Bilt products and related software are used as a

basis for designing and producing dedicated test benches. Our flexible development structure and modular products enable us to provide a variety of different test benches. This involves developing specialized modules (refer to battery charging/discharging, brownout detection, etc) or customising EasyStress (refer to the dedicated version for stress testing of contacts or relays). We also do very specific mechanical, electronic and software analyzes, as shown in the photograph opposite, the 'elevator' for the measuring sphere for characterising powerful lasers.

Some of our achievements: Laser diode stress tests and characterisation Contact tests with brownout detection Battery charging/discharging tests …

volt 10curr 10moutput onmeas :curr?→ 6,235e-3

BILTChassis (basic model, without primary power):BN100 13-position Chassis with CPU BE718* (19'' rackmount + Handles)

BN101 13-position Chassis, CPU BE718* and display (19'' rackmount + Handles)

BN105 'Tiny-Bilt' 8-pos Chassis with CPU BE718* and display (19'' rackmount + Handle)(*) : RS232/422 – GPIB – ETHERNET - USB

Standard 110-230VAC primary power kits (extensible up to 900W) :BN091 65W

BN092 130W

BN094 260W

Software:BE021 EasyStress software, open licence agreement for one user

BE024 Sequential testing option for EasyStress

BE030 EasyReport software (alone, without dedicated application)

Options :BE715 Isolated RS232(PC) / Bilt-RS422 network interface (56kbs)

BE717 Isolated USB (PC) / Bilt-RS422 network interface (56kbs / 207kbs)

MAIN MODULESTemperature measurement and control

BE426 Temperature measurement

Temperature measurement on type-K thermocouple from -50°C to 250°CNumerous memorization possibilities

BE4276 channel temperaturecontroller

6 x Temperature measurement on type-K thermocouple from -50°C to 400°C. Numerous memorization possibilities.“All-or-nothing” regulation 24V 1A on each channel.

BE470 Temperature measurement 3 sensor types available: K (up to 400°C), PT100, CTN3KΩ

BE471on-off temperature controller

3 sensor types: K, PT100, CTN3KΩ“All-or-nothing” regulation 24V 4A - control of heating and cooling element

BE474BB474

TEC / PID controller + booster

-50/250°C, 2 sensor types: K, PT100. PID control ±20V 7A for TEC element (or other). Possibility of coupling a “Booster" module (BB474) allowing a second power output (20V 7A), synchronized with the first one.

Relay command

BE433

Relay command with 10 isolated channels plus power

Protected to 200mA with 1A 5V/12V/24V auxiliary isolated power

Multi-channel measurement

BE481

Voltage acquisition, 10 independent channels

4 ranges: ±2V, ±10V, ±50V, ±250V

BE482

BE483

Ground microammeter with 10 independent channels

BE482: 4 ranges ±40µA, ±200µA, ±1mA, ±5mA

BE483: 4 ranges ±100nA, ±500nA, ±2µA, ±10µA

Signal generation

BE810Baseboard / Dedicated digital interface module

Interface board and communication protocol developed according to customer specifications. The BE810 contains a high-speed RISC processor and a large FPGA.

BE842 Pulse generator

4 outputs, 20ns resolution.Output via 100Ω ribbon cable or 50Ω coax. External trigger with Very low jitter.BE817 replacement.

BE832IT832

Pattern generator32 bits + 1 input bit 100 Mech/s/256 kWords

This assembly consists of a control module (BE832) which can operate as many as 6 probe generators (IT832) via a flexible, easy to manipulate cable. The extremely small size of the generators means that they can be installed right where they are to be used, thus guaranteeing the generation of a clear signal. Apart from the pattern memory, sequential programming can include loops, jumps, pauses, etc. Each time a pattern is sampled, the operator can program the expected value of the input bit: 1, 0 or any other value at the time.

BE841 Sinus generator 30Hz - 30MHz, 50mV- 5Vpp / 50Ω + Synchro

HEATING / COOLING SYSTEMSMultiple heating / cooling systems already developed, for many temperature range, with optionally embedded specific interface...Contact us for any specific request

Programmable DC sources

Bipolar multi-range DC sources with linear regulation:

BE51540V 200mA4 quadrant bipolar source

8W4 voltage ranges: ±5V ,±10V, ±20V, ±40V8 current ranges from 6µA to 200mA(BE510 replacement)

BE51620V 6A 4 quadrantbipolar source

120W2 voltage ranges: ±5V, ±20V9 current ranges from 5µA to 6A(BE510S replacement)

BE517 120V 4A 120W maxunipolar 2 quadrant 120W 2 voltage ranges: +30V, +120V

9 current ranges from ±5µA to ±4A

Bipolar multi-range DC sources:BE524 30V 4A bipolar source 120W 8 current ranges from 5µA to 4A

BE525 60V 2A bipolar source 120W 7 current ranges from 10µA to 2A

BE526 120V 1A bipolar source 120W 7 current ranges from 5µA to 1A

BE527 250V 480mA bipolar source 120W 6 current ranges from 10µA to 480mA

Single-range DC sources*:BE547(546 rempl.)

fast response time15V 12A pos.source 120W BE538P 500V 240mA

positive source 90W

BE534P 30V 4A positive source 120W BE539P 1,1kV 100mA

positive source 80W

BE535P 60V 2A positive source 120W

BE536P 120V 1A positive source 120W

BE537P 250V 480mA positive source 120W

* Negative versions: please contact us.

Inter-module coupling (all the above modules):

BE592 Inter-module coupling for regulating NPN, PNP, MOS-P, MOS-N, FET, etc transistors.

Multi-channel DC sources with linear regulation:BE580 8 grouped channels ±15V 200mA, 2 current ranges (2/200mA), 400mA max total

BE582 6 independent channels ±6V 1A, 4A max total

BE584 6 independent channels ±15V 200mA, 50000 points

Specialised DC sources*:

BE5852 low voltage/strong current channels + signal generator

75 W

Channel 1: 5V/10A, channel 2: 5V/5A, high-speed linear regulation. Auxiliary channel: ±12V/50m. Signal generator with 2 programmable channels/40 MHz as standard and up to five signals, one of which is an optional input/output.

BE561Battery testing

Reversible 50V/1A source

50W 2 voltage ranges: 18V, 50V2 current ranges: 200mA and 1A

BE437Contact testing@ 100mACnt res. : 10 ns

Contact polarisation Brownout detection and measurementMeasurement and plotting of contact resistance stress. BE432 replacement.

BE572 DC source with modulation 110W 16Vdc + 2Vpp / 6A

100Hz-100kHz

* These modules can be adapted to your needs: please contact us!

PULSED SYSTEMSMultiple pulsed benches already developed, up to 200V / 10A, pulse down to 200ns.

Contact us for any specific request

Test of processor, FPGA...

US_P9V1

Itest was founded in Toulouse in 1996, by two engineers from component testing backgrounds. At the time, the company was called Hirex Electronics. The first Bilt unit and BE510 source modules came out in 1997. Since then, more than 200 systems have been installed. In 2002, the company separated from the Hirex group, and changed its name to iTest.

Today, its clients include Alcatel, Atmel, Clemessy, FBH(DE), Infineon(DE), Molex Automotive, Siemens Automotive, Synchrotron SOLEIL, Thalès, Trixell, UMS, UMS-Gmbh(DE), Universita' di Padova(I), Rouen and Bordeaux Universities, Vishay...

iTest, 119, rue de la providence – F31500 TOULOUSE – FRANCE – (33)5 61 54 81 30 (33)5 61 54 81 39 itest@itest.fr

EN55022 Class A relating to EMC emission.EN61000-4-xx relating to EMC immunity.EN61010-1 relating to the low voltage directive.

Metrology and maintenanceFor each new module, Itest develops an automatic testing and calibration program. All the parameters in the module's specification are tested and a detailed report generated. The measurements are made with laboratory instruments which are regularly calibrated by certified companies. Their type, serial number and calibration date are included in the test reports.Itest offers a two-year metrological inspection contract for the Bilt modules. Some of our major customers have successfully implemented their own metrological inspection benches using Bilt DC source modules. However, these programs risk being rather cumbersome, due to the large number of ranges of certain modules.All the Bilt products in the catalogue come with a two-year parts and labour guarantee, when returned to our workshops. A telephone support service is also available for the same period. In addition, iTest offers a contract to extend the guarantee and support service for a further two years.

www.itest.fr