lc tracking review at amsterdam 2003.03.31 overview of asian tracking r&d vertex detector...
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LC Tracking Review at Amsterdam2003.03.31
Overview of Asian Tracking R&D
• Vertex Detector• Silicon µ-Strip Intermediate Tracker• Central Tracker - Jet Chamber - Si µ-strip Central Tracker
Hwanbae ParkKyungpook National Univ.
LC Tracking Review at Amsterdam2003.03.31
▣ JLC: Tracker
LC Tracking Review at Amsterdam2003.03.31
▣ Vertex Tracker Working Group
• CCD based Vertex Tracker Group Y. Sugimoto*, A. Miyamoto (KEK) N. Tamura, G. Iwai, K. Fujiwara, H. Takayama (Niigate U.) K. Abe, T. Nagamine (Tohoku U.) T. Aso (Toyama National College of Maritime Technology)
http://www-jlc.kek.jp/subg/svd/
LC Tracking Review at Amsterdam2003.03.31
S/N > 10 @278K
Intrinsic ResolutionIs better than 3 um.
√ operation at near room temperature√ spatial resolution, S/N ratio√ partially thinned wafers√ radiation hardness√ fast readout
▣ R&D Activities: Vertex Tracker
LC Tracking Review at Amsterdam2003.03.31
▣ Intermediate Tracker Working Group
• Silicon Intermediate Tracker Group H. Park* (Kyungpook National U.) I.H. Park (Ewha Womans U.), B.G. Cheon (SKKU) H.J. Kim, J.H. Kang, Y.J. Kwon (Yonsei U.) J.S. Kang (Korea U.), S. Kim, J. Lee (SNU)
76.5cm
18.5cm
LC Tracking Review at Amsterdam2003.03.31
√ linking and reconstruction efficiency (Fast Simulation) √ track momentum resolution (Full Simulation) √ Si PIN diode simulation/design/fabrication √ S/N ratio measurement and beam test
▣ R&D Activities: Intermediate Tracker
Si
Bare Si wafer
Oxidation
N+ (Diffusio
n)
UVMask 1
Photo Lithography
Oxide Etching
Photo-resist Strip
P+ (Implantatio
n)Mask2
UV
Photo Lithography
Photo-resist Strip
Metal deposition
Metal Etching
LC Tracking Review at Amsterdam2003.03.31
▣ Central Tracker Working Group • Jet Chamber Si µ-strip M. Kobayashi*, K. Fujii (KEK) M. Iwasaki*, H. Aihara N. Khalatyan (U. of Tsukuba) (U. of Tokyo) A.M. Bacala (MSU), K. Hoshina (TUAT) T. Abe (Nagoya U.),K. Watanabe (Kogakuin U.)
http://www-jlc.kek.jp/subg/cdc/
LC Tracking Review at Amsterdam2003.03.31
• 4.6 m Test Jet Chamber (6 axial and 10 stereo super layers) √ measurements of wire tensions and positions √ cosmic ray tests with a candidate gas mixtures √ space charge effect measurement √ basic chamber studies with “baby” chamber √ spatial and momentum resolution √ two track separation √ wire material studies √ full CDC detector simulator based on Geant4
▣ R&D Activities: Jet Chamber
LC Tracking Review at Amsterdam2003.03.31
(with NLC detector parameters)√ Full Simulation Study for detector parameter√ reconstruction efficiency√ momentum resolution√ photon background simulation
▣ R&D Activities: Si µ-strip central tracker
- - - #hit1 in central & #VXD hit=5
- - - #hit2 in central & #VXD hit=5- - - #hit3 in central- - - #hit=5 in central
|cos|<0.8
LC Tracking Review at Amsterdam2003.03.31
▣ Summary
□ Vertex Detector - spatial resolution and distortion of thin wafers measured - innermost layer survive more than 3 years under option “A” - radiation damage effect studied□ Intermediate Tracker - fast and full simulation with 5 layers - Si µ-strip R&D proposal submitted (pending)□ Central Tracker - chamber parameters studied with “baby chamber” - track momentum and two track separation - Si µ-strip R&D started (detail simulation studies carried)