introduction to ic-secm - biologic...parallel gold bands (25 μm width, 20 μm pitch) on a glass...
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Introduction to ic-SECM
04/06/14
N. Murer, Ph. D. Scanning probe systems specialist
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Objectives
Provide a better understanding of
1. What the ic-SECM technique is
2. Which information can be obtained
3. What the advantage of ic-SECM over dc-SECM is
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Outline
1. Prerequisite : dc-SECM
2. ic-SECM : measurement method
3. ic-SECM : data
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Outline
1. Prerequisite : dc-SECM
2. ic-SECM : measurement method
3. ic-SECM : data
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1. Prerequisite : dc-SECM
1. A.J. Bard, L. R. Faulkner, Electrochemical Methods, 2nd edition, Wiley & Sons, NYC
UME in bulk solution
UME : Ultra MicroElectrode Definition : « At present, there is no broadly accepted definition of a UME, although there is a general agreement on the essential concept, which is that the electrode is smaller than the scale of the diffusion layer developed in readily achievable experiments.1”
Steady-state response of a disk UME to a Large-Amplitude Potential Step
(Radial and normal)
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Normalized tip current
iT/iT,∞
Normalized electrode – sample distance (d/a)
Negative feedback
Positive feedback
Feedback mode : approach curves
1. A.J. Bard, L. R. Faulkner, Electrochemical Methods, 2nd edition, Wiley & Sons, NYC
1. Prerequisite : dc-SECM
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As the probe is sufficiently close to the surface, the current changes if : . The conductivity of the surface changes . The topology of the surface changes
Insulative surface
Conductive surface
Moving from an insulative to a conductive surface
Moving to a higher surface
Feedback mode : approach curves
Normalized tip current
iT/iT,∞
Normalized electrode – sample distance (d/a)
1. Prerequisite : dc-SECM
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|Current|
Conductive material
Insulative material
Constant height
If both the conductivity and the topography of the substrate change, there is no way to discriminate their contribution to the current. The solution is to keep the electrode to sample distance constant. This can be done using Height Relief but it is using two techniques, two scans and a positional reference is needed. ic-SECM allows to perform constant tip-to-sample distance measurement with the same technique.
No Discrimination between topography and surface effects
Feedback mode : limit
1. Prerequisite : dc-SECM
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Outline
1. Prerequisite : SECM
2. ic-SECM : principles
3. ic-SECM : measurement
4. ic-SECM : data
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ic-SECM
1. The SECM probe is sinusoidally oscillating at a low frequency (tens of Hz) and an amplitude of a fraction (1-4 %) of the SECM electrode radius using a piezoelectric positioner. This amplitude is named Δzbulk.
2. ic-SECM : measurement method
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ic-SECM
1. The SECM probe is sinusoidally oscillating at a low frequency (tens of Hz) and an amplitude of a fraction (1-4 %) of the SECM electrode radius using a piezoelectric positioner. This amplitude is named Δzbulk.
2. The amplitude of the oscillation is recorded by a strain gauge sensor, connected to an amplifier servo/controller for closed operation (measurement and control of the amplitude).
2. ic-SECM : measurement method
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ic-SECM
1. The SECM probe is sinusoidally oscillating at a low frequency (tens of Hz) and an amplitude of a fraction (1-4 %) of the SECM electrode radius using a piezoelectric positioner. This amplitude is named Δzbulk.
2. The amplitude of the oscillation is recorded by a strain gauge sensor, connected to an amplifier servo/controller for closed operation (measurement and control of the amplitude).
3. As the SECM probe approaches and finally intermittently contacts (ic) the surface, the amplitude of the oscillation decreases to a certain percentage of Δzbulk.
2. ic-SECM : measurement method
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ic-SECM
1. The SECM probe is sinusoidally oscillating at a low frequency (tens of Hz) and an amplitude of a fraction (1-4 %) of the SECM electrode radius using a piezoelectric positioner. This amplitude is named Δzbulk.
2. The amplitude of the oscillation is recorded by a strain gauge sensor, connected to an amplifier servo/controller for closed operation (measurement and control of the amplitude).
3. As the SECM probe approaches and finally intermittently contacts (ic) the surface, the amplitude of the oscillation decreases to a certain percentage of Δzbulk.
4. The value of the amplitude for which there is intermittent contact is named Δzic.
2. ic-SECM : measurement method
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ic-SECM
1. The SECM probe is sinusoidally oscillating at a low frequency (tens of Hz) and an amplitude of a fraction (1-4 %) of the SECM electrode radius using a piezoelectric positioner. This amplitude is named Δzbulk.
2. The amplitude of the oscillation is recorded by a strain gauge sensor, connected to an amplifier servo/controller for closed operation (measurement and control of the amplitude).
3. As the SECM probe approaches and finally intermittently contacts (ic) the surface, the amplitude of the oscillation decreases to a certain percentage of Δzbulk.
4. The value of the amplitude for which there is intermittent contact is named Δzic.
5. As a scan is made over the surface, if the probe meets a hill, the measured amplitude Δzmeasured will be lower than Δzic. The piezo takes the probe up such that Δzmeasured = Δzic.
2. ic-SECM : measurement method
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ic-SECM
1. The SECM probe is sinusoidally oscillating at a low frequency (tens of Hz) and an amplitude of a fraction (1-4 %) of the SECM electrode radius using a piezoelectric positioner. This amplitude is named Δzbulk.
2. The amplitude of the oscillation is recorded by a strain gauge sensor, connected to an amplifier servo/controller for closed operation (measurement and control of the amplitude).
3. As the SECM probe approaches and finally intermittently contacts (ic) the surface, the amplitude of the oscillation decreases to a certain percentage of Δzbulk.
4. The value of the amplitude for which there is intermittent contact is named Δzic.
5. As a scan is made over the surface, if the probe meets a hill, the measured amplitude Δzmeasured will be lower than Δzic. The piezo takes the probe up such that Δzmeasured = Δzic.
If the probe meets a valley Δzmeasured > Δzic. The piezo takes the probe down.
2. ic-SECM : measurement method
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ic-SECM
2. ic-SECM : measurement method
With the courtesy of J.-P. Diard
Click on the figure to see the animation.
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ic-SECM : operating mode
1. The approach curves is performed using the strain gauge sensor. Once the intermittent contact is made the actual measurement scan starts.
2. The topography and the current are measured in a single scan.
3. As the probe is vibrating, it is possible to measure dc and ac current magnitudes as well as the phase of the ac current.
3. ic-SECM : data
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ic-SECM : approach curves
2. K. McKelvey, M.A. Edwards, P.R. Unwin, Anal. Chem. 2010, 82, 6334–6337
Amplitude of the oscillation of the tip
Measured and simulated current
Feedback approach curves to conducting, gold (red), and nonconducting, glass (blue), substrates Left: 12.5 μm radius Pt disk electrode oscillated at 70 Hz, Δzic = 145 nm in 0.5 mM FcTMA+. Right: 1 μm radius Pt disk electrode oscillated at 70 Hz, Δzic = 39 nm in 2 mM FcTMA+.
The tip oscillation of 1-4% of the electrode radius does not affect the mass transport of the redox species. The dc current response is still diffusion-limited.
3. ic-SECM : data
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ic-SECM : maps
a) dc current on the forward scan (ic-mode) b) dc mean current on the backward scan with constant tip-sample distance of 1 µm
Parallel gold bands (25 μm width, 20 μm pitch) on a glass microscope slide
The conductive gold bands can be clearly seen. There is more contrast on the ic picture because the probe is closer to the surface.
3. ic-SECM : data
2. K. McKelvey, M.A. Edwards, P.R. Unwin, Anal. Chem. 2010, 82, 6334–6337
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ic-SECM : maps
Parallel gold bands (25 μm width, 20 μm pitch) on a glass microscope slide
c) amplitude of the current oscillation on the forward scan (ic-mode) d) amplitude of the current oscillation on the backward scan with constant tip-sample
distance of 1 µm
They show the same underlying features, but with a greater dynamic range. The ic iac image (panel c) again shows more sensitivity than the constant distance iac image (panel d) because of the closer tip-substrate separation.
3. ic-SECM : data
2. K. McKelvey, M.A. Edwards, P.R. Unwin, Anal. Chem. 2010, 82, 6334–6337
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ic-SECM : maps
Parallel gold bands (25 μm width, 20 μm pitch) on a glass microscope slide
e) Topography image obtained in the forward scan f) Tilt removed topography
Removing the tilt make the gold bands appear at a height of around 200 nm above the glass slide, which is coherent with lithography. Note that their location is shifted compared to the electrochemical map due to the fact that the side of the glass sheath is touching the sample.
3. ic-SECM : data
2. K. McKelvey, M.A. Edwards, P.R. Unwin, Anal. Chem. 2010, 82, 6334–6337
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ic-SECM : M470 maps
3. ic-SECM : data
Au electrode 5 mm embedded in epoxy resin
Conditions : 15 µm Φ Pt SECM probe. Rg ~10. Distance to surface: in-contact, control by “Intermittent Contact” mode (400 nm vibration at 455 Hz, control point at 80%). Solution: 10 mM KI solution + 100 mM KCl Measurement at 455 kHz (vibration amplitude) over edge of 5mm Φ Au sample DC bias = +0.7 V vs. ref. screen printed Ag/AgCl. Bulk current : 14nA
Sample :
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ic-SECM : M470 maps
3. ic-SECM : data
dc measurement in ic-mode (ic-SECM)
dc measurement in constant height mode (dc-SECM)
ΔImax : 105 nA ΔImax : 4.59 nA
Resin
Au Resin
Au
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ic-SECM : M470 maps
The Au gold electrode can clearly be visualized. Different features can be seen on the Au electrode with the ac current modulus. Topography can also be measured with a resolution of 20 nm.
3. ic-SECM : data
Resin
Au Au
Resin
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Additional remarks
3. ic-SECM : data
ic-SECM is a technique that can only be used so far with hard materials or hard samples. It cannot be used with soft materials such as biological tissues, gels…
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Conclusions
3. ic-SECM : data
. ic-SECM is an SECM module that keeps the probe in a constant proximity to the sample.
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Conclusions
3. ic-SECM : data
. ic-SECM is an SECM module that keeps the probe in a constant proximity to the sample. . The probe intermittently contacts the surface at a constant frequency and amplitude.
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Conclusions
3. ic-SECM : data
. ic-SECM is an SECM module that keeps the probe in a constant proximity to the sample. . The probe intermittently contacts the surface at a constant frequency and amplitude. . The approach curve is performed without the need of mediator.
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Conclusions
3. ic-SECM : data
. ic-SECM is an SECM module that keeps the probe in a constant proximity to the sample. . The probe intermittently contacts the surface at a constant frequency and amplitude. . The approach curve is performed without the need of mediator. . The probe follows the topography of the sample hence the response is only due to surface reactivity changes.
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Conclusions
3. ic-SECM : data
. ic-SECM is an SECM module that keeps the probe in a constant proximity to the sample. . The probe intermittently contacts the surface at a constant frequency and amplitude. . The approach curve is performed without the need of mediator. . The probe follows the topography of the sample hence the response is only due to surface reactivity changes. . The probe is in close proximity to the sample hence, a better contrast is achieved (even the best contrast).
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Conclusions
3. ic-SECM : data
. ic-SECM is an SECM module that keeps the probe in a constant proximity to the sample. . The probe intermittently contacts the surface at a constant frequency and amplitude. . The approach curve is performed without the need of mediator. . The probe follows the topography of the sample hence the response is only due to surface reactivity changes. . The probe is in close proximity to the sample hence, a better contrast is achieved (even the best contrast). . ac current modulus and current phase can provide different information from the sample.
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Thank you for your attention !